CN110553592A - Method for measuring sag of advanced TFT (thin film transistor) substrate glass - Google Patents
Method for measuring sag of advanced TFT (thin film transistor) substrate glass Download PDFInfo
- Publication number
- CN110553592A CN110553592A CN201910823853.8A CN201910823853A CN110553592A CN 110553592 A CN110553592 A CN 110553592A CN 201910823853 A CN201910823853 A CN 201910823853A CN 110553592 A CN110553592 A CN 110553592A
- Authority
- CN
- China
- Prior art keywords
- glass
- measuring
- tft substrate
- sag
- substrate glass
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000011521 glass Substances 0.000 title claims abstract description 53
- 239000000758 substrate Substances 0.000 title claims abstract description 29
- 238000000034 method Methods 0.000 title claims abstract description 15
- 239000010409 thin film Substances 0.000 title description 2
- 238000012360 testing method Methods 0.000 claims abstract description 20
- 238000005259 measurement Methods 0.000 abstract description 6
- 229910000831 Steel Inorganic materials 0.000 description 5
- 239000010959 steel Substances 0.000 description 5
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000007665 sagging Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
the invention discloses a method for measuring the glass sag of a high-generation TFT substrate, which comprises the following steps of S1, taking a TFT substrate glass sample to be measured, S2, pasting a light shading strip along the center line of the bottom surface of the TFT substrate glass sample, S3, placing the TFT substrate glass sample on a test bracket, S4, placing a laser range finder on a test platform, measuring the vertical distance from the test platform to the lowest point of the TFT substrate glass sample by using the laser range finder, wherein the vertical distance H min is the substrate glass sag = H 0 -H min -H 1, H 0 in the formula is the height of the test bracket, H 1 is the thickness of the light shading strip, measuring the glass sag by using the laser range finder, a measuring mechanism is not in contact with the glass surface, so that the measuring mechanism is prevented from being in contact with the glass in the measuring process, the laser range finder can move on the measurement platform, the data in the center of the glass can also be measured, and the accuracy of.
Description
Technical Field
the invention relates to the technical field of glass detection, in particular to a method for measuring the glass sag of a high-generation TFT substrate.
Background
The TFT substrate glass has large glass specification and thin glass thickness, so that the glass inevitably sags in the production and processing processes, and if the glass sags, the downstream customer production line is easily blocked, so the sag measurement of the glass must be strictly controlled according to the customer requirements.
The distance H between the lowest point of the glass and the measuring platform is measured by using a steel plate ruler, the minimum value H min is measured, the height of glass brackets on two sides is H 0, and the glass sag is H 0 -Hmin, and the prior method has the following defects:
Firstly, the steel plate ruler is used for measuring, because glass is contacted, glass shaking is easy to generate, and the measurement is inaccurate.
And secondly, only data on two sides of the glass can be measured by using a steel plate ruler, and the middle of the glass cannot be measured.
And thirdly, the minimum scale is 0.5mm when the steel plate ruler is used for measuring, and the precision is not high.
And fourthly, measuring by using a steel plate ruler, wherein artificial estimation errors exist due to contact.
Disclosure of Invention
The invention aims to provide a method for measuring the glass sag of an advanced TFT substrate, which can reduce human errors and improve the accuracy of sag measurement.
the technical scheme adopted by the invention for solving the technical problems is as follows:
A method for measuring the glass sag of an advanced TFT substrate comprises the following steps:
s1, taking a TFT substrate glass sample to be measured;
S2, pasting a shading strip along the center line of the bottom surface of the TFT substrate glass sample;
s3, placing the TFT substrate glass sample on a test support;
S4, placing a laser range finder on the test platform, and measuring the vertical distance H min from the test platform to the lowest point of the TFT substrate glass sample by using the laser range finder, wherein the glass sag of the substrate is = H 0 -H min -H 1, H 0 in the formula is the height of the test bracket, and H 1 is the thickness of the shading strip.
Furthermore, the shading strip adopts a black sticky note.
The invention has the beneficial effects that:
Firstly, a laser range finder is used for measuring the glass sag, and a measuring mechanism does not contact the surface of glass, so that the shaking interference caused by the fact that the measuring mechanism contacts the glass in the measuring process is avoided, and the test result is interfered.
the laser range finder can move on the measuring platform, measures at multiple points, takes the minimum value, is not limited to measuring data on two side edges of the glass, and can also measure data in the center of the glass, so that the measuring accuracy is ensured.
and thirdly, measuring the glass sag by using a laser range finder, wherein the highest precision of the laser tester can reach 1 micrometer, and the test precision is improved.
And fourthly, measuring the glass sag by using a laser range finder without artificial estimation of the last bit, and avoiding subjective misdetection.
drawings
The invention is further illustrated with reference to the following figures and examples:
FIG. 1 is a schematic view of the present invention;
Fig. 2 is a bottom view of step S2 of the present invention.
Detailed Description
As shown in fig. 1, the present invention provides a method for measuring glass sagging of advanced TFT substrate, comprising the following steps:
s1, taking a TFT substrate glass sample 1 to be measured;
s2, as shown in fig. 2, attaching a light shielding strip 2 along the center line of the bottom surface of the TFT substrate glass sample 1; the shading strip 2 is preferably a black sticky note;
S3, placing the test support 3 on the test platform 4, and placing the TFT substrate glass sample 1 on the test support 3;
S4, placing the laser range finder 5 on the test platform 4, measuring the vertical distance H min from the test platform 4 to the lowest point of the TFT substrate glass sample 1 by using the laser range finder 5, moving the laser range finder 5 along the shading strip 2 during measurement, and taking the minimum value by multi-point measurement;
The glass sag of the TFT substrate = H 0 -H min -H 1, wherein H 0 is the height of the test support, and H 1 is the thickness of the light-shielding strip.
the foregoing is merely a preferred embodiment of the invention and is not intended to limit the invention in any manner; those skilled in the art can make numerous possible variations and modifications to the present teachings, or modify equivalent embodiments to equivalent variations, without departing from the scope of the present teachings, using the methods and techniques disclosed above. Therefore, any simple modification, equivalent replacement, equivalent change and modification made to the above embodiments according to the technical essence of the present invention are still within the scope of the protection of the technical solution of the present invention.
Claims (2)
1. A method for measuring the glass sag of an advanced TFT substrate is characterized by comprising the following steps:
S1, taking a TFT substrate glass sample to be measured;
s2, pasting a shading strip along the center line of the bottom surface of the TFT substrate glass sample;
S3, placing the TFT substrate glass sample on a test support;
S4, placing a laser range finder on the test platform, and measuring the vertical distance H min from the test platform to the lowest point of the TFT substrate glass sample by using the laser range finder, wherein the glass sag of the substrate is = H 0 -H min -H 1, H 0 in the formula is the height of the test bracket, and H 1 is the thickness of the shading strip.
2. The method according to claim 1, wherein the light-shielding strip is a black sticky note.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910823853.8A CN110553592A (en) | 2019-09-02 | 2019-09-02 | Method for measuring sag of advanced TFT (thin film transistor) substrate glass |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910823853.8A CN110553592A (en) | 2019-09-02 | 2019-09-02 | Method for measuring sag of advanced TFT (thin film transistor) substrate glass |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN110553592A true CN110553592A (en) | 2019-12-10 |
Family
ID=68738816
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910823853.8A Pending CN110553592A (en) | 2019-09-02 | 2019-09-02 | Method for measuring sag of advanced TFT (thin film transistor) substrate glass |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110553592A (en) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1985148A (en) * | 2004-07-14 | 2007-06-20 | 坦格拉斯有限公司 | Method for measuring the sagging of a glass panel |
| CN102589445A (en) * | 2012-03-05 | 2012-07-18 | 南京三埃工控股份有限公司 | Sag detection method and device of belt |
| CN203534535U (en) * | 2013-10-31 | 2014-04-09 | 东旭集团有限公司 | Glass sheet droop automatic measuring device |
| CN104215195A (en) * | 2014-09-23 | 2014-12-17 | 苏州精创光学仪器有限公司 | Glass panel automatic warping degree measurement instrument |
-
2019
- 2019-09-02 CN CN201910823853.8A patent/CN110553592A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1985148A (en) * | 2004-07-14 | 2007-06-20 | 坦格拉斯有限公司 | Method for measuring the sagging of a glass panel |
| CN102589445A (en) * | 2012-03-05 | 2012-07-18 | 南京三埃工控股份有限公司 | Sag detection method and device of belt |
| CN203534535U (en) * | 2013-10-31 | 2014-04-09 | 东旭集团有限公司 | Glass sheet droop automatic measuring device |
| CN104215195A (en) * | 2014-09-23 | 2014-12-17 | 苏州精创光学仪器有限公司 | Glass panel automatic warping degree measurement instrument |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20191210 |