CN110537188B - 物体识别装置、物体识别系统以及物体识别方法 - Google Patents

物体识别装置、物体识别系统以及物体识别方法 Download PDF

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CN110537188B
CN110537188B CN201780089469.9A CN201780089469A CN110537188B CN 110537188 B CN110537188 B CN 110537188B CN 201780089469 A CN201780089469 A CN 201780089469A CN 110537188 B CN110537188 B CN 110537188B
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CN110537188A (zh
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孔全
渡边裕树
秋良直人
松原大辅
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Hitachi Ltd
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    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G06V10/776—Validation; Performance evaluation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/213—Feature extraction, e.g. by transforming the feature space; Summarisation; Mappings, e.g. subspace methods
    • G06F18/2132—Feature extraction, e.g. by transforming the feature space; Summarisation; Mappings, e.g. subspace methods based on discrimination criteria, e.g. discriminant analysis
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/217—Validation; Performance evaluation; Active pattern learning techniques
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G06F18/241—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches
    • G06F18/2415—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches based on parametric or probabilistic models, e.g. based on likelihood ratio or false acceptance rate versus a false rejection rate

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CN201780089469.9A 2017-04-12 2017-12-21 物体识别装置、物体识别系统以及物体识别方法 Active CN110537188B (zh)

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JP2017078937A JP6785181B2 (ja) 2017-04-12 2017-04-12 物体認識装置、物体認識システム、及び物体認識方法
JP2017-078937 2017-04-12
PCT/JP2017/045975 WO2018189962A1 (ja) 2017-04-12 2017-12-21 物体認識装置、物体認識システム、及び物体認識方法

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WO2021010985A1 (en) * 2019-07-16 2021-01-21 DOCBOT, Inc. Real-time deployment of machine learning systems
CN112529037A (zh) * 2020-11-06 2021-03-19 重庆恢恢信息技术有限公司 基于大数据分析建筑工地建设优化方法
JP7521682B2 (ja) * 2021-03-03 2024-07-24 日本電気株式会社 情報処理装置、情報処理方法及び記録媒体
JP7675565B2 (ja) * 2021-06-07 2025-05-13 株式会社日立ハイテク 画像認識システム

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CN104412302A (zh) * 2012-06-29 2015-03-11 西科姆株式会社 对象检测装置以及对象检测方法
US20150363667A1 (en) * 2014-05-26 2015-12-17 Kabushiki Kaisha Toshiba Recognition device and method, and computer program product
CN105404848A (zh) * 2014-09-05 2016-03-16 欧姆龙株式会社 识别装置以及识别装置的控制方法

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US7242988B1 (en) * 1991-12-23 2007-07-10 Linda Irene Hoffberg Adaptive pattern recognition based controller apparatus and method and human-factored interface therefore
JP2001014465A (ja) 1999-06-29 2001-01-19 Matsushita Electric Ind Co Ltd 物体認識方法及び物体認識装置
JP3776340B2 (ja) * 2000-09-27 2006-05-17 エムヴイテック・ソフトウェア・ゲーエムベーハー 対象物認識システム及び方法
US6775411B2 (en) * 2002-10-18 2004-08-10 Alan D. Sloan Apparatus and method for image recognition
JP2004337291A (ja) * 2003-05-14 2004-12-02 Konica Minolta Medical & Graphic Inc 画像出力情報設定方法および画像出力情報設定装置ならびに画像出力情報設定プログラム
US7129484B2 (en) * 2004-01-21 2006-10-31 Hitachi Global Storage Technologies Netherlands B.V. Method for pattern recognition in energized charge particle beam wafer/slider inspection/measurement systems in presence of electrical charge
US20070285554A1 (en) * 2005-10-31 2007-12-13 Dor Givon Apparatus method and system for imaging
CN101590825B (zh) * 2009-07-06 2011-08-31 浙江双友物流器械股份有限公司 测力棘轮式捆绑器
US8116547B2 (en) * 2009-12-11 2012-02-14 Aperio Technologies, Inc. Signal to noise ratio in digital pathology image analysis
CN102959551B (zh) * 2011-04-25 2017-02-08 松下电器（美国）知识产权公司 图像处理装置
JP6254836B2 (ja) 2013-11-29 2017-12-27 キヤノン株式会社 画像検索装置、画像検索装置の制御方法およびプログラム
JP6395481B2 (ja) * 2014-07-11 2018-09-26 キヤノン株式会社 画像認識装置、方法及びプログラム

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104412302A (zh) * 2012-06-29 2015-03-11 西科姆株式会社 对象检测装置以及对象检测方法
US20150363667A1 (en) * 2014-05-26 2015-12-17 Kabushiki Kaisha Toshiba Recognition device and method, and computer program product
CN105404848A (zh) * 2014-09-05 2016-03-16 欧姆龙株式会社 识别装置以及识别装置的控制方法

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JP2018180879A (ja) 2018-11-15
DE112017007437T5 (de) 2020-01-09
JP6785181B2 (ja) 2020-11-18
US20200117948A1 (en) 2020-04-16
US10963736B2 (en) 2021-03-30
WO2018189962A1 (ja) 2018-10-18
CN110537188A (zh) 2019-12-03

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