CN110534166A - The method for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter - Google Patents
The method for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter Download PDFInfo
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Abstract
A method of Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter is removed, composite material electromagnetic parameter acquiring technology field is belonged to.The present invention has ignored the distortion of electromagnetic parameter brought by Fabry-P é rot puppet resonance, makes the problem of the result inaccuracy of electromagnetic parameter in existing composite material electromagnetic parameter acquisition process.Including being simulated to composite material to be measured；It is respectively connected to waveguide port at the both ends of analog board layer structure direction, vertical irradiation analog board calculates separately the scattering parameter analogue value for obtaining two kinds of analog boards according to irradiation result；The impedance computation value for obtaining corresponding analog board is calculated again；It calculates again and obtains analog board thickness correction item；It calculates the correction impedance for obtaining composite material to be measured again according to analog board thickness correction item, and then determines the refractive index of composite material to be measured, the electromagnetic parameter for obtaining composite material to be measured is calculated by the correction impedance of composite material to be measured and refractive index.The present invention is used for the electromagnetic parameter of backstepping composite material.
Description
Technical field
The present invention relates to the methods for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter, belong to composite material
Electromagnetic parameter acquiring technology field.
Background technique
Early in the 1970s, Nicolson (NICOLSON) and Ross (ROSS) describe a kind of Transient Technique, use
In the complex permeability and dielectric constant of linear material of the analysis scattering parameter within the scope of 0.4 to 10GHZ.Based on scattering parameter,
Weir (WEIR) proposes similar inversion formula.Therefore, Buddhist nun is also referred to as using scattering parameter (S parameter) inverting electromagnetic parameter
Section's Ademilson-Ross-Weir (NRW) method.Nearly ten years, NRW method has become characterization new structure and material (such as Meta Materials) is macro
See one of most common method of electromagnetic response.In homogenization process, it is commonly encountered two critical issues related with NRW method: one
A is branch's ambiguity of refractive index, and refractive index is an intermediate parameters in retrieving, is not solved uniquely；The other is
Fabry-Perot (Fabry-P é rot) puppet resonance can serious shadow when sample panel is with a thickness of the integral multiple of effective wavelength in plate
Ring frequency dependence parameter.
Compared with Fabry-P é rot puppet resonance, branch's ambiguity of refractive index is receive more and more attention, especially
In Meta Materials field.When being related to Fabry-P é rot puppet resonance, people usually have ignored Fabry-P é rot puppet resonance and are brought
Electromagnetic parameter distortion and eliminate these distortion respective compensation methods.Reason includes following two points: first according to inverting
Formula, as input reflection coefficient S11When being close to 1, equation (1) below can become unstable, while output reflection coefficient S21
It goes to zero, so as to cause the distortion of Fabry-P é rot puppet resonance.When the reflection of the first and second plate interfaces is cancelled out each other
When, i.e., when slab-thickness is the integral multiple of internal effective wavelength half, the distortion of Fabry-P é rot puppet resonance will be generated.However,
Most of Meta Materials are all lossy in interested frequency band.In the case where loss, part electromagnetic energy in the material by
It dissipates, therefore the unstable condition of the equation (1) will not meet simultaneously.Therefore, Fabry-P é rot puppet resonance distortion can lead to
The loss for crossing electromagnetic energy is eased.Secondly, the Lorentz that the electromagnetic parameter of Meta Materials often shows wide frequency ranges is total
Vibration.This shows the value of backstepping parameter, such as the real and imaginary parts of dielectric constant, may change in sizable dynamic range.
Although this variation is easy ignored in Meta Materials characterization, for low-loss dielectric composite material, with NRW inversion method electricity
When magnetic parameter, the distortion that result is homogenized caused by Fabry-P é rot puppet resonance is more significant.
Nicolson-Ross-Weir (NRW) method specifically:
k0Dn=jln { S21/[1-S11(z-1)/(z+1)] }+2m π, (2)
εeff=n/z, μeff=nz, (3)
Wherein, z is impedance, k0For free space wave vector, d is thickness of composite material, and n is refractive index, and m is integer, m
For logarithmic function ln { S21/[1-S11(z-1)/(z+1)] } Branch Index, m difference is corresponding different branch's ambiguity；εeff
For effective dielectric constant, μeffFor equivalent permeability.
In order to eliminate Fabry-P é rot puppet resonance, a kind of compensation method based on non magnetic hypothesis is proposed, especially pair
In the dielectric composite material with periodic arrangement unit.Unfortunately, compensation method introduces in corresponding EFFECTIVE MEDIUM
Error.Under the irradiation of normal incidence plane wave, it can not gradually reproduce scattering parameter identical with true composite material.
Therefore, against the above deficiency, it is desirable to provide a kind of acquisition methods of composite material electromagnetic parameter can remove
The distortion of electromagnetic parameter brought by Fabry-P é rot puppet resonance.
Summary of the invention
For in existing composite material electromagnetic parameter acquisition process, having ignored electricity brought by Fabry-P é rot puppet resonance
The distortion of magnetic parameter, makes the problem of the result inaccuracy of electromagnetic parameter, and the present invention provides one kind and goes Fabry-Perot puppet resonance inverse
The method for pushing away composite material electromagnetic parameter.
A kind of method for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter of the invention, including following step
It is rapid:
Composite material to be measured is simulated, M layers of structural simulation plate and N layers of structural simulation plate are obtained；In two kinds of analog boards
The both ends of layer structure direction are respectively connected to waveguide port, are respectively perpendicular irradiation analog board by simulation plate surface with incident plane wave,
The scattering parameter analogue value for obtaining two kinds of analog boards is calculated separately according to irradiation result；
The impedance computation value for obtaining corresponding analog board is calculated according to the scattering parameter analogue value of two kinds of analog boards；
It is identical according to the impedance computation of two kinds of analog boards value, it calculates and obtains the corresponding analog board of different frequency incident plane wave
Thickness correction item；
Calculate the correction impedance for obtaining composite material to be measured again according to analog board thickness correction item, and then determination is to be measured compound
The refractive index of material is calculated the electromagnetic parameter for obtaining composite material to be measured by the correction impedance of composite material to be measured and refractive index.
The method according to the present invention for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter, it is described to be measured
Composite material is simulated, and the method for obtaining M layers of structural simulation plate and N layers of structural simulation plate includes:
It is modeled using fullwave simulator, obtains composite material model to be measured, include i layers of structure and preset length in model
Free space, i=M or N；Wherein every layer of structure includes the analogue unit of array arrangement, each analogue unit include it is a kind of or
The composite construction that a variety of dielectric materials are constituted；The freely empty of preset length is supplemented respectively at the both ends of analog board layer structure direction
Between, obtain M layers of structural simulation plate and N layers of structural simulation plate, analog board with a thickness of d, d=Mh+2dADOr d=Nh+2dAD, formula
Middle h is the thickness of single layer structure, dADFor the length of the free space.
The method according to the present invention for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter selects the pole TMxy
Change plane wave as incident plane wave and vertical irradiation is carried out to M layers of structural simulation plate and N layers of structural simulation plate.
The method according to the present invention for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter, it is described according to two
The scattering parameter analogue value of kind of analog board, which calculates, to be obtained the impedance computation value of corresponding analog board and includes:
Impedance computation value zi(δ, ω) are as follows:
δ is analog board thickness correction item in formula, and ω is plane of incidence wave frequency rate；S11,iFor the input reflection system of analog board
Number, S21,iFor the output reflection coefficient of analog board；
Wherein:
In formulaFor the input reflection coefficient analogue value of analog board,For the output reflection coefficient analogue value of analog board, k0
For free space wave vector, dADFor the length of the free space.
The method according to the present invention for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter, according to two kinds of moulds
The impedance computation value of quasi- plate is identical, calculates the method packet for obtaining the corresponding analog board thickness correction item of different frequency incident plane wave
It includes:
Analog board thickness correction item δ (ω) are as follows:
δ (ω)=solve [zM(δ,ω)-zN(δ, ω)=0].
The method according to the present invention for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter, further according to acquisition
Analog board thickness correction item δ (ω) and the calculation formula of impedance calculate the correction impedance z of composite material to be measured.
The method according to the present invention for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter, it is described to be measured multiple
The refractive index n of condensation material are as follows:
k0Dn=jln { S21/[1-S11(z-1)/(z+1)]}+2mπ。
The method according to the present invention for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter, by be measured compound
The correction impedance of material and refractive index calculate the electromagnetic parameter for obtaining composite material to be measured:
εeff=n/z, μeff=nz,
ε in formulaeffFor the effective dielectric constant of composite material to be measured, μeffFor the equivalent permeability of composite material to be measured.
The method according to the present invention for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter, it is described to be measured multiple
Condensation material includes two-dimentional mixture or three-dimensional cylinder type medium or super surface.
Beneficial effects of the present invention: the present invention is based on the methods for removing Fabry-P é rot puppet resonance backstepping to obtain composite material
Electromagnetic parameter, and Numerical Validation can be carried out, it was demonstrated that the feasibility of the method for the present invention.The present invention passes through plane of incidence wave measurement
Method introduces analog board thickness correction item, and the electromagnetic parameter obtained is made to be no longer influenced by the width as caused by Fabry-P é rot puppet resonance
Influence with distortion.Meanwhile electromagnetic parameter is also unrelated with the number of plies of composite material, and as frequency converges to quiet close to zero
The estimation of state Rayleigh.The method of the present invention can independently find optimal correction thickness in each frequency of incident plane wave, and
And any information about front or rear frequency point is not needed.Simulation results show, the method for the present invention is in accuracy better than others
The equivalent intrinsic constitutive parameter backstepping method of reciprocity periodical media composite plate, wherein free space wavelength is the unit cell of composite plate
At least 20 times of length.
The principle that the present invention realizes is that the amendment of the equivalent thickness progress by frequency point on super surface is integrated to medium substrate, according to
The rule that macroscopical electromagnetic property does not change with the thickness change of medium in homogenization theory, it is achievable to equivalent thickness by frequency
Point amendment.Firstly, artificially the different medium of the building number of plies integrates super surface period structure；Then, by the auxiliary of full-wave simulation,
Optimal correction value can be obtained by Frequency point by working out least square adaptive algorithm, guarantee different layers of period knots
Structure equivalent electromagnetic property parameters having the same.Finally, it completes to integrate repairing by frequency point for super surface equivalent thickness to medium substrate
Just.
The method of the present invention passes through the equivalent thickness for determining composite panel under each frequency, corrects the resistance of inappropriate definition
Anti-, which is an intermediate parameters being introduced into the retrieving of broadband Fabry-P é rot puppet resonance, thus demonstrates invention
The validity of method.
Detailed description of the invention:
Fig. 1 is the process schematic using the method for the present invention by frequency point amendment composite panel；A is the list of analog board in figure
Layer structure；For M layers of structure, d=Mh+2dAD；For N layers of structure, d=Nh+2dAD；
Fig. 2 is the geometry setting schematic diagram simulated to composite material to be measured；
Fig. 3 is the concrete structure schematic diagram of analog board in the embodiment of the present invention；
Fig. 4 is the impedance z of acquisition and the relation curve of frequency by taking 6 layers of structural simulation plate and 17 layers of structural simulation plate as an example；
λ in figure0Indicate free space wavelength；
Fig. 5 is the effective dielectric constant of 6 layers of structural simulation plate and the graph of relation of frequency；
Fig. 6 is using different inversion methods, i.e., traditional NRW inversion method and method proposed by the present invention, to difference
The composite panel inverting effective dielectric constant ε of the number of plieseffWith the graph of relation of normalized frequency；
When Fig. 7 is plane wave and 17 layers of true medium composite materials interaction, S11Amplitude schematic diagram；
When Fig. 8 is plane wave and 17 layers of true medium composite materials interaction, S11Phase schematic diagram；This method in figure
It indicates to establish model using the effective electromagnetic parameter that the method for the present invention (calibrated altitude changes with frequency) is calculated, after emulation
The S parameter curve arrived, penalty method indicate obtained effective electromagnetic parameter when the calibrated altitude of compensation is fixed value, after emulation
The S parameter curve arrived, composite plate indicate the S parameter curve that composite plate emulates；
When Fig. 9 is plane wave and 17 layers of true medium composite materials interaction, S11Amplitude schematic diagram；
When Figure 10 is plane wave and 17 layers of true medium composite materials interaction, S11Phase schematic diagram.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, those of ordinary skill in the art without creative labor it is obtained it is all its
His embodiment, shall fall within the protection scope of the present invention.
It should be noted that in the absence of conflict, the feature in embodiment and embodiment in the present invention can phase
Mutually combination.
The present invention will be further explained below with reference to the attached drawings and specific examples, but not as the limitation of the invention.
Specific embodiment one, in conjunction with shown in Fig. 1 to Fig. 3, the present invention provides one kind to go Fabry-Perot puppet resonance inverse
The method for pushing away composite material electromagnetic parameter, comprising the following steps:
Composite material to be measured is simulated, M layers of structural simulation plate and N layers of structural simulation plate are obtained；In two kinds of analog boards
The both ends of layer structure direction are respectively connected to waveguide port, are respectively perpendicular irradiation analog board by simulation plate surface with incident plane wave,
The scattering parameter analogue value for obtaining two kinds of analog boards is calculated separately according to irradiation result；
The impedance computation value for obtaining corresponding analog board is calculated according to the scattering parameter analogue value of two kinds of analog boards；
It is identical according to the impedance computation of two kinds of analog boards value, it calculates and obtains the corresponding analog board of different frequency incident plane wave
Thickness correction item；
Calculate the correction impedance for obtaining composite material to be measured again according to analog board thickness correction item, and then determination is to be measured compound
The refractive index of material is calculated the electromagnetic parameter for obtaining composite material to be measured by the correction impedance of composite material to be measured and refractive index.
Waveguide port is set in present embodiment it is in order in the two sides receiving plane wave signal of analog board layer structure direction,
Make plane wave by the waveguide port vertical incidence of side, the waveguide port of two sides can receive signal simultaneously.S11It is exactly a side ports
Transmitting, the ratio between the plane wave energy that same side ports receive；S21Indicate Single port transmitting, the plane wave that another port receives
Energy ratio, S11Also input return loss, S are21Also it is output reflection coefficient.It can measure composite material to be measured by plane wave
Equivalent thickness can introduce analog board thickness correction item based on equivalent thickness, after determining analog board thickness correction item, by analog board
Thickness increases correction term on the basis of original thickness, corrects impedance further according to the THICKNESS CALCULATION after correction.
Irradiation analog board is respectively perpendicular by simulation plate surface with incident plane wave, acquisition two is calculated separately according to irradiation result
The scattering parameter analogue value of kind analog board.
Further, as shown in connection with fig. 3, described that composite material to be measured is simulated, obtain M layers of structural simulation plate and N layers
The method of structural simulation plate includes:
It can be modeled using fullwave simulator CST microwave studio, obtain composite material model to be measured, include i in model
The free space of layer structure and preset length, i=M or N；Wherein every layer of structure includes the analogue unit of array arrangement, In
Infinite period is arranged on the face yoz, and each analogue unit includes the composite construction that one or more dielectric materials are constituted；It is described compound
The outer profile of structure can be the square air box that side length is a, and the dielectric constant of air is 1, due to the method for the present invention pair
The structure of composite plate only requires that the period is 1st/20th of wavelength, therefore for convenience of Modeling Calculation, square can be provided directly as
The volume ratio of the packing material for being ε containing dielectric constant in box, packing material and square box is p, but the present invention is unlimited
In such unit.The free space of preset length is supplemented respectively at the both ends of analog board layer structure direction, obtains M layers of structure
Analog board and N layers of structural simulation plate, analog board with a thickness of d, d=Mh+2dADOr d=Nh+2dAD, h is single layer structure in formula
Thickness, dADFor the length of the free space.When air box side length is a, d=Ma+2 dADOr d=Na+2dAD。
In Fig. 3, d is the overall thickness of analog board, and M and N respectively represent the number of plies of the periodic structure artificially constructed, and δ is mould
Quasi- plate thickness correction term.
In Fig. 3, analog board has N layers in the x direction, and in the direction y, it is made of no counting unit.Select a TMxyPolarization is flat
Surface wave carries out vertical irradiation to analog board.The additional freedom that length is 2a can be supplemented between waveguide port and the boundary of analog board
Space, length 2a can rule of thumb choose.Free space can eliminate the high-order mode that may be scattered from analogue unit.In structure
Waveguide port is accessed at both ends, generates incident plane wave, as the basis for calculating the scattering parameter analogue value.
Further, select TMxy polarization plane wave as incident plane wave to M layers of structural simulation plate and N layers of structural simulation
Plate carries out vertical irradiation.Selected TM wave is transverse magnetic wave, and magnetic field is perpendicular to the direction of propagation.
Further, the scattering parameter analogue value according to two kinds of analog boards calculates the impedometer for obtaining corresponding analog board
Calculation value includes:
Impedance computation value zi(δ, ω) are as follows:
δ is analog board thickness correction item in formula, and ω is plane of incidence wave frequency rate；S11,iFor the input reflection system of analog board
Number, S21,iFor the output reflection coefficient of analog board；
Wherein:
In formulaFor the input reflection coefficient analogue value of analog board,For the output reflection coefficient analogue value of analog board,
k0For free space wave vector, dADFor the length of the free space.
zi(δ, ω) is the function of δ, it is established that the relationship of analog board thickness correction item and impedance.dADLength can choose
For 2a.The evanescent wave of scattering can be eliminated by increasing free space on analog board boundary.
Further, identical according to the impedance computation of two kinds of analog boards value, it calculates and obtains different frequency incident plane wave pair
The method for the analog board thickness correction item answered includes:
Analog board thickness correction item δ (ω) are as follows:
δ (ω)=solve [zM(δ,ω)-zN(δ, ω)=0].
Under normal circumstances, the impedance of different derivative analogue plates is roughly the same, is based on this, can determine the δ of each frequency point, and one
Denier has determined δ, then using withWith the impedance computation formula of form, can count
It calculates and obtains correction impedance z.
Further, it is calculated further according to the analog board thickness correction item δ (ω) of acquisition and the calculation formula of impedance to be measured multiple
The correction impedance z of condensation material.Herein based on the analog board thickness correction item δ (ω) obtained is calculated, the calculating of impedance is used again
Formula, which calculates, obtains correction impedance z as actual impedance.
Further, the refractive index n of the composite material to be measured are as follows:
k0Dn=jln { S21/[1-S11(z-1)/(z+1)]}+2mπ。
Again to d again assignment, make d=d+ δ, can determine refractive index n.
Further, the electromagnetism ginseng for obtaining composite material to be measured is calculated by the correction impedance of composite material to be measured and refractive index
Number:
εeff=n/z, μ eff=nz,
ε in formulaeffFor the effective dielectric constant of composite material to be measured, μeffFor the equivalent permeability of composite material to be measured.
As an example, the composite material to be measured includes two-dimentional mixture or three-dimensional cylinder type medium or super surface.
As an example, the packing material in the square air box that the side length is a can be cylindrical type or ball-shaped.
Packing material in analogue unit of the present invention can also be other forms, when using other shapes, can carry out etc.
Effect, it is equivalent at cylindrical type and ball-shaped.
When integral multiple of the analog board with a thickness of effective wavelength half, work as S11Close to zero and S21When close to 1, simulating
Fabry-P é rot puppet resonance can occur in plate, this will lead to the unstable result of analog board reflection coefficient.The result shows that
The quantity of Fabry-P é rot puppet resonance and position and plate thickness are closely related.As shown in figure 4, the number of plies of analog board is more, it is same
Fabry-P é rot puppet resonance in frequency range is more.It, can since Fabry-P é rot puppet resonance is very sensitive to plate thickness d
It is influenced with intuitively attempting to eliminate these puppets by adjusting d.For reciprocal plate shown in Fig. 3, establish be represented by dashed line it is new
Boundary, the new boundary and natural boundary δ a distance away.The parameter study influenced about δ on Fabry-P é rot puppet resonance is such as
Shown in Fig. 5.As δ increases to a/50 from a/300, Fabry-P é rot puppet resonance becomes Lorentz from Lorentz antiresonance suddenly
Resonance.This means that there may be a δ between the two, it can smooth dispersion plot.Black solid curve (δ=a/140) card
Real this point.However, further investigations have shown that, the δ of this fixation can only remove first Fabry-P é rot puppet resonance,
Very little is influenced on other puppets.The result shows that optimal δ changes with the variation of frequency.At different frequencies, the wavelength of electromagnetic wave
It changes, sensing capability also changes.Electromagnetic wave induction to equivalent plate thickness change with the variation of frequency.
The physical significance of the method for the present invention are as follows: for composite material, the actual (real) thickness d of effective electromagnetic parameter is by incidence
Plane wave is determined that NRW method is also built upon on the hypothesis that incidence wave is uniform plane wave.For composite material, incidence wave
Unequal due to electromagnetic parameter when being applied to composite material, actual incidence wave can not be pure plane wave, produce
Higher hamonic wave is given birth to, the generation of higher hamonic wave will affect the measurement of scattering parameter (i.e. S parameter), and higher hamonic wave has decaying
Characteristic can effectively avoid the influence of higher hamonic wave apart from boundary a small distance δ, to more accurately pass through plane wave
Therefore the wave for coming approximate reflection and transmission can eliminate the influence of Fabry-P é rot puppet resonance.
Specific embodiment: to verify the method for the present invention, a series of composite plates, such as Fig. 3 are simulated in CST microwave studio
It is shown, make composite plate unit having the same, but the number of plies is different.The relative dielectric constant ε of analogue unit packing materialiIt is 10,
Main material (being equivalent to the air box) relative dielectric constant εeIt is 1, packing material volume institute accounting p is 0.3.According to Rayleigh
Formula, the static relative dielectric constant of period composite material are 1.652.In the S parameter for obtaining different layers composite plate in CST.
According to formula:
δ (ω)=solve [zM(δ,ω)-zN(δ, ω)=0] and k0Dn=jln { S21/[1-S11(z-1)/(z+1)]}+
2m π determines correction term δ at each frequency.With determining δ, the inverting of equivalent parameters can be carried out.As shown in fig. 6, this method
The effective dielectric constant ε of extractioneffThere is no Fabry-P é rot puppet resonance, while showing and tradition in the frequency range of consideration
The identical growth trend of NRW method.In addition to Fabry-P é rot puppet resonance portion, the ε of 6 layers of plate of NRW method predictioneffWith
The ε of the method for the present inventioneffUnanimously.The result shows that this method can be from the distortion of the broadband as caused by Fabry-P é rot puppet resonance
Backstepping constitutive parameter.In addition, the backstepping dielectric constant of 2 layers, 6 layers, 10 layers and 17 layers plate mutually coincide, show εeffWith the number of plies
It is unrelated.
Finally, method proposed by the present invention is compared with traditional compensation method, as shown in Figure 7 to 10, pass through
The homogenized model with effective electromagnetic parameter that the method proposed determines can reproduce S ginseng from true dielectric compound
Number, and by compensation method there is the model of effective electromagnetic parameter cannot do so, especially in higher frequency.With frequency
Increase, difference becomes larger.Therefore, the method for the present invention is better than compensation with what is obtained with a thickness of d '=Na+2 δ homogenized model
Method and correlation model with a thickness of d=Na.
In conclusion the present invention can be used for electromagnetic field, electromagnetic material field.The method of the present invention is able to solve Fabry-P é
Influence of the rot puppet resonance to backstepping effective electromagnetic parameter is obtained with accurately obtaining the effective electromagnetic parameter of composite material
Effective dielectric constant be no longer influenced by the influence of the WBD wideband distortion as caused by Fabry-P é rot puppet resonance.
Although describing the present invention herein with reference to specific embodiment, it should be understood that, these realities
Apply the example that example is only principles and applications.It should therefore be understood that can be carried out to exemplary embodiment
Many modifications, and can be designed that other arrangements, without departing from spirit of the invention as defined in the appended claims
And range.It should be understood that different appurtenances can be combined by being different from mode described in original claim
Benefit requires and feature described herein.It will also be appreciated that the feature in conjunction with described in separate embodiments can be used
In other described embodiments.
Claims (9)
1. a kind of method for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter, which is characterized in that including following step
It is rapid:
Composite material to be measured is simulated, M layers of structural simulation plate and N layers of structural simulation plate are obtained；In two kinds of analog board layer knots
The both ends in structure direction are respectively connected to waveguide port, are respectively perpendicular irradiation analog board by simulation plate surface with incident plane wave, according to
Irradiation result calculates separately the scattering parameter analogue value for obtaining two kinds of analog boards；
The impedance computation value for obtaining corresponding analog board is calculated according to the scattering parameter analogue value of two kinds of analog boards；
It is identical according to the impedance computation of two kinds of analog boards value, it calculates and obtains the corresponding simulation plate thickness of different frequency incident plane wave
Correction term；
It calculates the correction impedance for obtaining composite material to be measured again according to analog board thickness correction item, and then determines composite material to be measured
Refractive index, the electromagnetic parameter for obtaining composite material to be measured is calculated by the correction impedance of composite material to be measured and refractive index.
2. the method according to claim 1 for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter, feature
It is, described to simulate to composite material to be measured, the method for obtaining M layers of structural simulation plate and N layers of structural simulation plate includes:
It is modeled using fullwave simulator, obtains composite material model to be measured, include the freedom of i layers of structure and preset length in model
Space, i=M or N；Wherein every layer of structure includes the analogue unit of array arrangement, and each analogue unit includes one or more
The composite construction that dielectric material is constituted；The free space of preset length is supplemented respectively at the both ends of analog board layer structure direction, is obtained
M layers of structural simulation plate and N layers of structural simulation plate, analog board with a thickness of d, d=Mh+2dADOr d=Nh+2dAD, h is in formula
The thickness of single layer structure, dADFor the length of the free space.
3. the method according to claim 2 for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter, feature
It is, TMxy polarization plane wave is selected vertically to be shone as incident plane wave M layers of structural simulation plate and N layers of structural simulation plate
It penetrates.
4. the method according to claim 3 for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter, feature
It is, the impedance computation value that the scattering parameter analogue value according to two kinds of analog boards calculates the corresponding analog board of acquisition includes:
Impedance computation value zi(δ, ω) are as follows:
δ is analog board thickness correction item in formula, and ω is plane of incidence wave frequency rate；S11,iFor the input reflection coefficient of analog board, S21,i
For the output reflection coefficient of analog board；
Wherein:
In formulaFor the input reflection coefficient analogue value of analog board,For the output reflection coefficient analogue value of analog board, k0For certainly
By space wave vector, dADFor the length of the free space.
5. the method according to claim 4 for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter, feature
It is, it is identical according to the impedance computation of two kinds of analog boards value, it calculates and obtains the corresponding simulation plate thickness of different frequency incident plane wave
Degree correction term method include:
Analog board thickness correction item δ (ω) are as follows:
δ (ω)=solve [zM(δ,ω)-zN(δ, ω)=0].
6. the method according to claim 5 for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter, feature
It is, the calculation formula of analog board thickness correction item δ (ω) and impedance further according to acquisition calculate the correction of composite material to be measured
Impedance z.
7. the method according to claim 6 for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter, feature
It is, the refractive index n of the composite material to be measured are as follows:
k0Dn=jln { S21/[1-S11(z-1)/(z+1)]}+2mπ。
8. the method according to claim 7 for removing Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter, feature
It is, the electromagnetic parameter for obtaining composite material to be measured is calculated by the correction impedance of composite material to be measured and refractive index:
εeff=n/z, μeff=nz,
ε in formulaeffFor the effective dielectric constant of composite material to be measured, μeffFor the equivalent permeability of composite material to be measured.
9. the Fabry-Perot puppet resonance backstepping composite material electromagnetic parameter according to any one of claim 1 to 9 of going
Method, which is characterized in that the composite material to be measured includes two-dimentional mixture or three-dimensional cylinder type medium or super surface.
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