CN110514922A - A kind of system and method detected automatically for distribution terminal - Google Patents
A kind of system and method detected automatically for distribution terminal Download PDFInfo
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- CN110514922A CN110514922A CN201910662427.0A CN201910662427A CN110514922A CN 110514922 A CN110514922 A CN 110514922A CN 201910662427 A CN201910662427 A CN 201910662427A CN 110514922 A CN110514922 A CN 110514922A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The present invention provides a kind of system and method detected automatically for distribution terminal, test host, multiple test cabinets and archival memory including passing through network interconnection, the multiple tested modules for being equipped with slave computer in the test cabinet and being arranged according to different testing requirements, the test host are used to configure the test option of the slave computer, test multiple tested modules using multithreading test mode poll and inquire the operating status of the tested module by the slave computer after detection and be recorded in the archival memory.The present invention completes the test process that distribution terminal is tested module by the technology and means of automation, automatically analyzes test result and saves data, improves automation, the level of IT application of product manufacturing.Also, present invention detection speed is fast, high-efficient, test result is traceable, has configurable and scalability, expands convenient for the function of system.
Description
Technical field
The present invention relates to distribution terminal detection technique field, in particular to a kind of system detected automatically for distribution terminal
And method.
Background technique
In order to guarantee that distribution terminal equipment has higher running quality, to matching in smart grid construction or transformation process
Terminal equipment carries out Function detection before networking to be very important.
For traditional distribution terminal manual debugging mode there are investment personnel are more, debug time is long, and test leakage, erroneous judgement easily occurs
The problems such as, seriously affect quality and the time of delivery of product.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of system and methods detected automatically for distribution terminal, automatically
It completes distribution terminal and is tested module debugging and analysis process, improve automation, the level of IT application of product manufacturing.
In order to solve the above technical problems, the embodiment of the present invention provides a kind of system detected automatically for distribution terminal,
Including test host, multiple test cabinets and the archival memory by network interconnection, it is equipped in the test cabinet
Slave computer and the multiple tested modules being arranged according to different testing requirements, the test host is for configuring the slave computer
Test option, multiple tested modules are tested using multithreading test mode poll and pass through institute after detection
Slave computer is stated to inquire the operating status of the tested module and be recorded in the archival memory.
Preferably, the test machine case includes a power supply slot, a CPU slot, multiple tested module slots and one
A switch boards slot, the power supply slot for installing power supply, the CPU slot for installing CPU board as slave computer,
The tested module slot is used to install tested module according to different testing requirements, and the switch boards slot is for installing switching
Plate.
Preferably, the slave computer is CPU board, UDP communication is run by HDLC interface, for obtaining the tested module
Test result, receive the inquiry of the test host, the test result of the tested module passed to TCP mode described
Host is tested, the switching of the channel HDLC, the switching of the channel USB needed for completing test, the gating control of liquid crystal display data line tri-state gate
With reading data, and provide 3 road DO serve as switching chip select line.
Preferably, the SPI interface of the CPU board is difference form, is turned in the switch boards through difference single-ended converter
For the single-ended SPI signal of 5V；
The switch boards include:
First ADG725 chip, for switching the channel HDLC, chip select line is outputed by the RUN_LED of the CPU board and is served as；
2nd ADG725 chip, for switching the channel USB, chip select line is outputed by the FLASH_LED of the CPU board and is served as；
MAX7301 chip is converted for SPI-GPIO, and the MAX7301 chip for having 28 road I/O, can by every road
It is set as DI or DO, chip select line is outputed by the IO_C of the CPU board and served as.
Preferably, the test cabinet further includes backboard, and multiple 373 latch, 373 lock are provided on the backboard
Storage is used to latch the FPD output of the tested module, and 3.3V signal is switched to 5V signal.
Preferably, the backboard includes multilayer, is equipped with Harding's terminal base, wherein the power supply slot uses 1 × 48 needle
Terminal, the switch boards slot use 2 × 96 needle terminals, and the tested module slot and the CPU slot use 2 × 48 needle ends
Son.
The embodiment of the present invention also provides a kind of method detected automatically for distribution terminal, comprising the following steps:
Slave computer is installed in test cabinet, and multiple tested modules are installed according to different testing requirements；
The test option of the slave computer is configured using test host, multiple institutes are tested using multithreading test mode poll
State tested module；
After detection, the test host inquires the operating status and record of the tested module by the slave computer
In archival memory.
Preferably, the slave computer be CPU board, the test option include: single CPU module energization burn-in test, open into
Intelligent submodule part test and the test of panel module are outputed in intelligent submodule part test.
Preferably, single CPU module energization burn-in test includes: that the test host issues test packet to the bottom
Machine relays to the tested module, and switch test channel, issues test and excitation amount；The tested module receives test
Related hardware functional test is carried out after energizing quantity, and test result is transmitted to the test host by the slave computer；
Opening into the test of intelligent submodule part includes: that the test host driven DA board generates DC voltage, is amplified by power amplifier
After be added to and open into tested module；The test host issues test packet to the slave computer, and the slave computer will by optocoupler
Voltage On state to opening into channel accordingly；The slave computer is opened into status information into the inquiry of tested module to opening, and will be received
Open and be sent to the test host into status information；The test host analyzes simultaneously opening for receiving into status information
Record test result；
Outputing intelligent submodule part test includes: that the test host sends control message to the slave computer, the bottom
Machine outputs the corresponding relay of tested module by communication modes driving；The dynamic of tested module is outputed in the slave computer delay acquisition
Make contact information, and is sent to the test host in the form of message；The test host to the action connection point information of acquisition into
Row is analyzed and outputs test result；
The test of panel module includes: that the test host sends test packet to the slave computer, and the slave computer is sent
Corresponding message is tested module driving corresponding signal lamp or buzzer to panel；It is tested according to the state of signal lamp or buzzer
As a result.
Preferably, the method also includes:
The test host obtains test data by accessing the archival memory；
The test host arranges the test data of acquisition, shows and report output.
The advantageous effects of the above technical solutions of the present invention are as follows:
The present invention is the integrated of collection test host, embedded testing cabinet, archival memory and communication network composition
Intelligent test system completes the test process that distribution terminal is tested module by the technology and means of automation, automatically analyzes survey
Test result and save data, it can be achieved that list CPU module energization burn-in test, open into intelligent submodule part test, output intelligent submodule
Functions, the automatic test results such as part test, the test of panel module, database manipulation are stored in archival memory, conveniently look into
It askes and counts, improve automation, the level of IT application of product manufacturing.
In addition, autorun of the invention is comprehensive, compensating for cannot be to tested module major part function in previous test
The deficiency that energy module is tested, detection speed is fast, high-efficient, test result is traceable.Also, the present invention have it is configurable and
Scalability expands convenient for the function of system.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the system provided in an embodiment of the present invention detected automatically for distribution terminal；
Fig. 2 is the structural schematic diagram that cabinet is tested in the embodiment of the present invention；
Fig. 3 is the structural schematic diagram of switch boards in the embodiment of the present invention；
Fig. 4 is the method flow diagram provided in an embodiment of the present invention detected automatically for distribution terminal.
In figure: 1- test host, 2- test cabinet, 3- archival memory, 201- slave computer, 202- are tested module,
203- power supply slot, 204-CPU slot, 205- are tested module slot, 206- switch boards slot.
Specific embodiment
To keep the technical problem to be solved in the present invention, technical solution and advantage clearer, below in conjunction with attached drawing and tool
Body embodiment is described in detail.
The embodiment of the present invention provides firstly a kind of system detected automatically for distribution terminal, as shown in Figure 1, described
System includes test host 1, multiple test cabinets 2 and the database purchase interconnected by network (Ethernet or wireless network)
Device 3 tests the multiple tested modules 202 for being equipped with slave computer 201 in cabinet 2 and being arranged according to different testing requirements, test
Host 1 be used to configure the test option of slave computer 201, use multithreading test mode poll test multiple tested modules 202, with
And the operating status of tested module 202 is inquired by slave computer 201 after detection and is recorded in archival memory 3.
The present invention is the integrated of collection test host 1, embedded testing cabinet 2, archival memory 3 and communication network composition
Change intelligent test system.It tests in cabinet 2 and arranges hardware device by different test contents, such as output module test: test machine
It include slave computer 201 (CPU board) and tested module 202 in case 2；Open into module test: test cabinet 2 in include slave computer 201,
Tested module 202 and programmable amplifier；Single CPU module energization burn-in test: including technical grade HUB, slave computer in test cabinet 2
201, small signal module, channel switch module and tested module 202 etc..
The present invention passes through the technology of automation and means complete the test process that distribution terminal is tested module 202, automatic to divide
Analysis test result and save data, it can be achieved that list CPU module energization burn-in test, open into intelligent submodule part test, output intelligence
Functions, the automatic test results such as the test of submodule part, the test of panel module, database manipulation are stored in archival memory 3, side
Just it inquires and counts, improve automation, the level of IT application of product manufacturing.
In addition, autorun of the invention is comprehensive, compensating for cannot be to tested module major part function in previous test
The deficiency that energy module is tested, detection speed is fast, high-efficient, test result is traceable.Also, the present invention have it is configurable and
Scalability expands convenient for the function of system.
As one embodiment of the present invention, in addition to testing host 1, other hardware be all placed in one it is compact-sized logical
In electric car.Preferably, an energization vehicle includes ten test cabinets, and every test cabinet 2 is by one piece of slave computer 201 (CPU board)
Manage most ten pieces of tested modules 202.It tests host 1 and uses multithreading measuring technology, while being carried out with every piece of tested module 202
Communication, poll test ten pieces of tested modules 202 of its management.The user for testing host 1 can configure the test choosing of slave computer 201
, input the bar code of tested module 202.Several tested modules 202 after detection, in the test inquiry test cabinet 2 of host 1
Operating status and be recorded in archival memory 3.Commissioning staff can be by test 1 called data storehouse memorizer 3 of host
Detection data, formed detection outline.
Further, as shown in Fig. 2, test cabinet 2 includes a power supply slot 203, CPU slots 204, a multiple quilts
Module slot 205 and a switch boards slot 206 are surveyed, power supply slot 203 is for installing power supply, and CPU slot 204 is for pacifying
It fills CPU board (E01-CPU) and is used as slave computer, be tested module slot 205 and be used to that tested module to be installed according to different testing requirements
(E01-MMI), switch boards slot 206 is for installing switch boards.
Preferably, test cabinet 2 includes backboard, and backboard includes multilayer (being 4 layers in the embodiment of the present invention), is equipped with Harding
Terminal base, wherein power supply slot 203 uses 1 × 48 needle terminal, and switch boards slot 206 uses 2 × 96 needle terminals, is tested module and inserts
Slot 205 and CPU slot 204 use 2 × 48 needle terminals.
Preferably, slave computer 201 (CPU board) runs UDP communication by HDLC interface, for obtaining tested module 202
Test result receives the inquiry of test host 1, and the test result of tested module 202 is passed to test host 1 with TCP mode,
The switching of the channel HDLC, the switching of the channel USB needed for completing test, the control of liquid crystal display data line tri-state gate gating are read with data
It takes, and 3 road DO is provided and serve as switching chip select line.
In embodiments of the present invention, the cooperation of test host 1 can not needed by being tested module 202, and autonomous operation test is patrolled
Volume, test result waits slave computer 201 (CPU board) inquiry.
Preferably, as shown in figure 3, the SPI interface of CPU board is difference form, through difference single-ended converter in switch boards
Switch to the single-ended SPI signal of 5V；
Switch boards specifically include:
First ADG725 chip, for switching the channel HDLC, chip select line is outputed by the RUN_LED of CPU board and is served as；
2nd ADG725 chip, for switching the channel USB, chip select line is outputed by the FLASH_LED of CPU board and is served as；
MAX7301 chip is converted for SPI-GPIO, and for having 28 road I/O, every road can be arranged MAX7301 chip
For DI or DO, chip select line is outputed by the IO_C of the CPU board and is served as.
MAX7301 chip port is allocated as follows: being arranged 16 GPIO to be DI, is read the bus data of FDP0~15；373 gatings
6, line, control 1 is latched, totally 7 are used as DO；Remaining 5 are used as DI, read the position of toggle switch, are used as IP address and set
It sets；485 pulse generating circuits of GPIO control, the GPS for testing MMI plate are inputted；Whole chips are all made of 5V in switch boards
Power supply.
Further, multiple 373 latch are provided on backboard, the FPD that 373 latch are used to latch tested module is defeated
Out, and by 3.3V signal switch to 5V signal.
The present invention has continued to use the test suite of distribution terminal, and makes full use of from ring and the means that connect, reduces warp as far as possible
The circuit of MUX switching.
Correspondingly, the embodiments of the present invention also provide a kind of methods detected automatically for distribution terminal, such as Fig. 4 institute
Show, the described method comprises the following steps:
Slave computer is installed in test cabinet, and multiple tested modules are installed according to different testing requirements；
Multiple tested moulds are tested using the test option of test host configuration slave computer, using multithreading test mode poll
Part；
After detection, test host inquires the operating status of tested module by slave computer and is recorded in database purchase
In device.
Preferably, slave computer is CPU board, and the test option includes: single CPU module energization burn-in test, opens into intelligence
Intelligent submodule part test and the test of panel module are outputed in the test of submodule part.
Specifically, single CPU module energization burn-in test includes: that test host issues test packet to slave computer, then forwards
To tested module, and switch test channel, issue test and excitation amount；Tested module carries out correlation firmly after receiving test and excitation amount
Part functional test, and test result is transmitted to test host by slave computer；
Opening into the test of intelligent submodule part includes: that test host driven DA board generates DC voltage, is added after being amplified by power amplifier
To opening into tested module；It tests host and issues test packet to slave computer, slave computer is by optocoupler by Voltage On state to corresponding
It opens into channel；Slave computer is opened into status information into the inquiry of tested module to opening, and is sent opening for receiving into status information
Test host；Test host analyzes opening of receiving into status information and records test result；
Outputing intelligent submodule part test includes: that test host sends control message to slave computer, and slave computer passes through communication side
Formula drives the corresponding relay for outputing tested module；The action connection point information of tested module is outputed in slave computer delay acquisition, and with
Message form is sent to test host；Test host is analyzed and is outputed test result to the action connection point information of acquisition；
The test of panel module includes: that test host sends test packet to slave computer, and slave computer sends corresponding message to face
Plate is tested module driving corresponding signal lamp or buzzer；Test result is obtained according to the state of signal lamp or buzzer.
Further, the method also includes:
It tests host and test data is obtained by access archival memory；
Test host arranges the test data of acquisition, is shown and report output.
The above is a preferred embodiment of the present invention, it is noted that for those skilled in the art
For, without departing from the principles of the present invention, several improvements and modifications can also be made, these improvements and modifications
It should be regarded as protection scope of the present invention.
Claims (10)
1. a kind of system detected automatically for distribution terminal, which is characterized in that including passing through the test host of network interconnection, more
A test cabinet and archival memory are equipped with slave computer in the test cabinet and are set according to different testing requirements
The multiple tested modules set, the test host is for configuring the test option of the slave computer, using multithreading test mode
Poll tests multiple tested modules and inquires the operation of the tested module by the slave computer after detection
State is simultaneously recorded in the archival memory.
2. the system according to claim 1 detected automatically for distribution terminal, which is characterized in that the test machine luggage
A power supply slot, a CPU slot, multiple tested module slots and a switch boards slot, the power supply slot is included to be used for
Power supply is installed, for installing CPU board as slave computer, the tested module slot is used for according to difference the CPU slot
Testing requirement installs tested module, and the switch boards slot is for installing switch boards.
3. the system according to claim 2 detected automatically for distribution terminal, which is characterized in that the slave computer is
CPU board runs UDP communication by HDLC interface, for obtaining the test result of the tested module, receives the test host
Inquiry, the test result of the tested module is passed into the test host with TCP mode, HDLC needed for completing test
Channel switching, the switching of the channel USB, the control of liquid crystal display data line tri-state gate gating and reading data, and 3 road DO of offer are served as and are cut
Change chip select line.
4. the system according to claim 2 detected automatically for distribution terminal, which is characterized in that the SPI of the CPU board
Interface is difference form, switchs to the single-ended SPI signal of 5V through difference single-ended converter in the switch boards；
The switch boards include:
First ADG725 chip, for switching the channel HDLC, chip select line is outputed by the RUN_LED of the CPU board and is served as；
2nd ADG725 chip, for switching the channel USB, chip select line is outputed by the FLASH_LED of the CPU board and is served as；
MAX7301 chip is converted for SPI-GPIO, and for having 28 road I/O, every road can be arranged the MAX7301 chip
For DI or DO, chip select line is outputed by the IO_C of the CPU board and is served as.
5. the system according to claim 2 detected automatically for distribution terminal, which is characterized in that the test cabinet is also
Including backboard, multiple 373 latch are provided on the backboard, 373 latch is used to latch the FPD of the tested module
Output, and 3.3V signal is switched into 5V signal.
6. the system according to claim 5 detected automatically for distribution terminal, which is characterized in that the backboard includes more
Layer, is equipped with Harding's terminal base, wherein the power supply slot uses 1 × 48 needle terminal, the switch boards slot uses 2 × 96 needles
Terminal, the tested module slot and the CPU slot use 2 × 48 needle terminals.
7. a kind of method detected automatically for distribution terminal, which comprises the following steps:
Slave computer is installed in test cabinet, and multiple tested modules are installed according to different testing requirements；
The test option of the slave computer is configured using test host, multiple quilts are tested using multithreading test mode poll
Survey module；
After detection, the test host inquires the operating status of the tested module by the slave computer and is recorded in number
According in storehouse memorizer.
8. the method according to claim 7 detected automatically for distribution terminal, which is characterized in that the slave computer is
CPU board, the test option include: single CPU module energization burn-in test, open into the test of intelligent submodule part, output intelligent submodule
Part test and the test of panel module.
9. the method according to claim 8 detected automatically for distribution terminal, which is characterized in that
Single CPU module energization burn-in test includes: that the test host issues test packet to the slave computer, relays to institute
Tested module, and switch test channel are stated, test and excitation amount is issued；The tested module carries out phase after receiving test and excitation amount
Hardware capability test is closed, and test result is transmitted to the test host by the slave computer；
Opening into the test of intelligent submodule part includes: that the test host driven DA board generates DC voltage, is added after being amplified by power amplifier
To opening into tested module；The test host issues test packet to the slave computer, and the slave computer passes through optocoupler for voltage
It is switched to and opens accordingly into channel；The slave computer is opened into status information into the inquiry of tested module to opening, and is opened what is received
Enter status information and is sent to the test host；The test host is analyzed and is recorded into status information to opening for receiving
Test result；
Outputing intelligent submodule part test includes: that the test host sends control message to the slave computer, and the slave computer is logical
Cross the corresponding relay that tested module is outputed in communication modes driving；The movement that tested module is outputed in the slave computer delay acquisition connects
Point information, and the test host is sent in the form of message；The test host divides the action connection point information of acquisition
It analyses and outputs test result；
The test of panel module includes: that the test host sends test packet to the slave computer, and the slave computer sends corresponding
Message is tested module driving corresponding signal lamp or buzzer to panel；Test knot is obtained according to the state of signal lamp or buzzer
Fruit.
10. the method detected automatically according to any one of claim 7-9 for distribution terminal, which is characterized in that institute
State method further include:
The test host obtains test data by accessing the archival memory；
The test host arranges the test data of acquisition, shows and report output.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910662427.0A CN110514922B (en) | 2019-07-22 | 2019-07-22 | System and method for automatic detection of power distribution terminal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910662427.0A CN110514922B (en) | 2019-07-22 | 2019-07-22 | System and method for automatic detection of power distribution terminal |
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| Publication Number | Publication Date |
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| CN110514922A true CN110514922A (en) | 2019-11-29 |
| CN110514922B CN110514922B (en) | 2022-03-11 |
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| CN201910662427.0A Active CN110514922B (en) | 2019-07-22 | 2019-07-22 | System and method for automatic detection of power distribution terminal |
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104167815A (en) * | 2014-09-22 | 2014-11-26 | 上海先拓电子有限公司 | Electric equipment field monitoring apparatus |
| KR101505075B1 (en) * | 2013-11-08 | 2015-03-23 | 한전케이디엔주식회사 | Simulator for feeder remote termiinal unit |
| CN105281435A (en) * | 2015-10-21 | 2016-01-27 | 国网山东省电力公司潍坊供电公司 | Intelligent distribution network oriented distribution type fault detection and isolation system and working method |
| CN106291329A (en) * | 2016-08-30 | 2017-01-04 | 南京国电南自电网自动化有限公司 | A kind of have the automatic test system detecting and joining the distant function of a terminal three |
| CN107402332A (en) * | 2016-05-20 | 2017-11-28 | 中国电力科学研究院 | A kind of Intelligent power distribution terminal multi-epitope automatic checkout system and its detection method |
| CN107490735A (en) * | 2017-08-03 | 2017-12-19 | 东莞理工学院 | A kind of power distribution network terminal automatic test approach and test device |
| KR20180062794A (en) * | 2016-12-01 | 2018-06-11 | 한전케이디엔주식회사 | Feeder remote terminal unit |
-
2019
- 2019-07-22 CN CN201910662427.0A patent/CN110514922B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101505075B1 (en) * | 2013-11-08 | 2015-03-23 | 한전케이디엔주식회사 | Simulator for feeder remote termiinal unit |
| CN104167815A (en) * | 2014-09-22 | 2014-11-26 | 上海先拓电子有限公司 | Electric equipment field monitoring apparatus |
| CN105281435A (en) * | 2015-10-21 | 2016-01-27 | 国网山东省电力公司潍坊供电公司 | Intelligent distribution network oriented distribution type fault detection and isolation system and working method |
| CN107402332A (en) * | 2016-05-20 | 2017-11-28 | 中国电力科学研究院 | A kind of Intelligent power distribution terminal multi-epitope automatic checkout system and its detection method |
| CN106291329A (en) * | 2016-08-30 | 2017-01-04 | 南京国电南自电网自动化有限公司 | A kind of have the automatic test system detecting and joining the distant function of a terminal three |
| KR20180062794A (en) * | 2016-12-01 | 2018-06-11 | 한전케이디엔주식회사 | Feeder remote terminal unit |
| CN107490735A (en) * | 2017-08-03 | 2017-12-19 | 东莞理工学院 | A kind of power distribution network terminal automatic test approach and test device |
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| CN110514922B (en) | 2022-03-11 |
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