CN110488086A - The power measurement method and system of burst pulse - Google Patents

Abstract

Embodiments of the present application provide a narrow pulse power measurement method and system, the narrow pulse power measurement method is applied to a narrow pulse power measurement system, the system includes: an acquisition unit, a peak hold circuit, a microcontroller, the acquisition unit and The peak hold circuit is connected, and the peak hold circuit is connected with the microcontroller. The method includes: the acquisition unit acquires a first power signal of a narrow pulse, and the first power signal is a radio frequency power signal; the acquisition unit converts the first power signal into a first voltage signal of a narrow pulse; the peak hold circuit outputs the signal according to the first voltage signal The second voltage signal, the pulse width of the second voltage signal is greater than the pulse width of the first voltage signal; the microcontroller samples the second voltage signal to obtain voltage sampling data; the microcontroller calculates and obtains the first power according to the voltage sampling data The corresponding power measurement result of the signal.

Description

Narrow pulse power measurement method and system

technical field

The present application relates to the field of signal detection, in particular, to a narrow pulse power measurement method and system.

Background technique

With the application of high-power microwave technology in high-energy particle accelerators, plasma heating, high-power radar and other fields, people have put forward higher and higher requirements for high-power microwave measurement technology.

However, high-power microwaves usually have the characteristics of high peak power and narrow pulse width, which have high requirements for processors. For example, for a narrow pulse signal on the order of nanoseconds, because the pulse width is too narrow, it is usually necessary to select a dedicated high-speed analog-to-digital conversion chip for sampling. Through a high-precision dedicated processor or FPGA (Field Programmable Gata Array, the Programmable gate array) can process narrow pulse signals.

Contents of the invention

The purpose of the embodiments of the present application is to provide a narrow pulse power measurement method and system to improve the problem in the prior art that it is difficult to use a general processor to detect narrow pulse signals.

In the first aspect, an embodiment of the present application provides a narrow pulse power measurement method, which is applied to a narrow pulse power measurement system. The system includes: an acquisition unit, a peak hold circuit, and a microcontroller. The acquisition unit and the The peak hold circuit is connected, and the peak hold circuit is connected with the microcontroller;

The methods include:

The collection unit collects a first power signal, and the first power signal is a narrow pulse radio frequency power signal;

The acquisition unit converts the first power signal into a narrow pulse first voltage signal;

The peak hold circuit outputs a second voltage signal according to the first voltage signal, and the pulse width of the second voltage signal is greater than the pulse width of the first voltage signal;

The microcontroller samples the second voltage signal to obtain voltage sampling data;

The microcontroller calculates and obtains a power measurement result corresponding to the first power signal according to the voltage sampling data.

Through the above method, the first power signal with a narrow pulse can be converted into a second voltage signal with a larger pulse width through the acquisition unit and the peak hold circuit. The microcontroller can sample the second voltage signal with a larger pulse width, and calculate the power measurement result based on the sampling result. The power measurement result corresponds to the first power signal, so that the narrow pulse power small signal can be realized indirect measurement. The above method can be applied to general-purpose microcontrollers and general-purpose microprocessors, and reduces the high-performance requirements of traditional solutions for processors. For general-purpose microcontrollers and general-purpose microprocessors using the above method, even if the working sampling frequency of the device itself cannot meet the frequency of the narrow pulse signal, the power measurement for the narrow pulse and small signal can also be realized.

With reference to the first aspect, in a possible design, the microcontroller samples the second voltage signal to obtain voltage sampling data, including:

The built-in converter of the microcontroller samples the second voltage signal to obtain a voltage sampling array as the voltage sampling data.

Through the above implementation manner, the microcontroller itself can realize the sampling of the second voltage signal without using an external high-precision analog-to-digital converter for data conversion, which reduces the complexity of the system structure.

With reference to the first aspect, in a possible design, the voltage sampling data includes multiple voltage values corresponding to multiple sampling points of the second voltage signal, and the microcontroller calculates according to the voltage sampling data to obtain A power measurement result corresponding to the first power signal, including:

The microcontroller screens out valid sampling points among the multiple sampling points according to the multiple voltage values in the voltage sampling data, and calculates an effective average voltage value corresponding to the valid sampling points;

The microcontroller calculates and obtains a power value corresponding to the effective average voltage value according to the effective average voltage value and a preset fitting correspondence relationship as a power measurement result corresponding to the first power signal.

Through the above implementation, the effective sampling point can be screened out according to the second voltage signal, and the effective average voltage value can be calculated based on the voltage of the effective sampling point, and then the power corresponding to the effective average voltage value can be determined according to the set fitting correspondence relationship value, as the power measurement result corresponding to the first power signal. In this way, the power corresponding to the first power signal with a narrow pulse can be determined according to the second voltage signal with a larger pulse width, which reduces the high performance requirements for the microcontroller and has a better market application prospect.

With reference to the first aspect, in a possible design, there are at least two paths of the first power signal, and the at least two paths of the first power signal include an output power signal and a reflected power signal of the device under test;

The microcontroller calculates and obtains a power measurement result corresponding to the first power signal according to the voltage sampling data, including:

The microcontroller calculates the output power value according to the voltage sampling data corresponding to the output power signal;

The microcontroller calculates the reflected power value according to the voltage sampling data corresponding to the reflected power signal;

The microcontroller calculates a standing wave ratio according to the output power value and the reflected power value, and the standing wave ratio is used as a power measurement result corresponding to the output power signal and the reflected power signal.

Through the above implementation, the microcontroller can perform power measurement on at least two channels of unknown narrow pulse signals. When the output power signal and reflected power signal of the device under test exist in at least two signals, the microcontroller can calculate the output power value corresponding to the output power signal and the reflected power value corresponding to the reflected power signal, and based on the output power value , Calculate the standing wave ratio from the reflected power value. Through the calculation of the standing wave ratio, it is helpful for the user to make feedback adjustments to the device under test that has output the output power signal or output the reflected power signal according to the calculated standing wave ratio.

With reference to the first aspect, in a possible design, the acquisition unit includes a wave detector, and the acquisition unit converts the first power signal into a narrow pulse first voltage signal, including:

The wave detector detects the first power signal to obtain the first voltage signal of a narrow pulse.

In the above implementation process, the first narrow-pulse power signal can be converted into the first narrow-pulse voltage signal by the wave detector, thereby realizing the conversion from the power signal to the voltage signal.

With reference to the first aspect, in a possible design, the acquisition unit includes a detector and an operational amplifier, and the acquisition unit converts the first power signal into a narrow pulse first voltage signal, including:

The detector detects the first power signal to obtain a first detection signal of a narrow pulse;

The operational amplifier performs operational amplification on the first detection signal to obtain the first voltage signal of a narrow pulse.

In the above implementation process, the conversion of the power signal to the voltage signal can be realized through the wave detector, and the operational amplifier can perform operational amplification on the small voltage signal, so that the subsequent circuit can recognize the voltage signal with a wider range and stronger signal. to make signal acquisition easier.

With reference to the first aspect, in a possible design, the peak hold circuit includes a transconductance amplifier, a diode, a hold capacitor, and a voltage buffer, and the peak hold circuit outputs a second voltage signal according to the first voltage signal, include:

The transconductance amplifier outputs a charging signal according to the first voltage signal, and the charging signal is used to control the diode to be turned on to charge the holding capacitor, or to control the diode to be turned off to make the holding capacitor The voltage output by the capacitor remains unchanged;

The voltage buffer outputs a second voltage signal according to the signal output by the holding capacitor.

In the above implementation process, the transconductance amplifier can control the diode to be turned on or off according to the change of the first voltage signal, the signal output by the holding capacitor will change according to the change of the diode, and the voltage buffer can couple the signal output by the holding capacitor into the second For two-voltage signals, the above-mentioned peak hold circuit can realize the extension of the pulse width.

In the second aspect, the embodiment of the present application provides a narrow pulse power measurement system, the system includes: an acquisition unit, a peak hold circuit, and a microcontroller;

The acquisition unit is connected to the peak hold circuit, and the peak hold circuit is connected to the microcontroller;

The acquisition unit is configured to acquire a first power signal, and the first power signal is a radio frequency power signal of a narrow pulse;

The acquisition unit is further configured to convert the first power signal into a narrow pulse first voltage signal;

The peak hold circuit is configured to output a second voltage signal according to the first voltage signal, and the pulse width of the second voltage signal is greater than the pulse width of the first voltage signal;

The microcontroller is configured to sample the second voltage signal to obtain voltage sampling data;

The microcontroller is further configured to calculate and obtain a power measurement result corresponding to the first power signal according to the voltage sampling data.

The above-mentioned narrow pulse power measurement system can implement the method provided in the aforementioned first aspect, even if the working sampling frequency of the microcontroller itself cannot meet the frequency of the narrow pulse signal, it can also complete the measurement of the narrow pulse power small signal.

With reference to the second aspect, in a possible design, the acquisition unit includes a detector;

The detector is used to detect the first power signal to obtain the first voltage signal.

In this way, the narrow-pulse first power signal can be converted into the narrow-pulse first voltage signal by the wave detector, thereby realizing the conversion from the power signal to the voltage signal.

With reference to the second aspect, in a possible design, the system includes at least two acquisition lines;

Any one of the at least two acquisition lines includes: the acquisition unit and a peak hold circuit connected to the acquisition unit;

The at least two acquisition lines are used to transmit at least two second voltage signals to the microcontroller;

The microcontroller is configured to calculate and obtain at least two sets of power values according to the at least two channels of second voltage signals.

Through the above implementation manner, power measurement can be performed on multiple channels of unknown narrow pulse signals, and the efficiency of measuring small signals with unknown narrow pulse powers is improved.

In order to make the above objects, features and advantages of the present application more comprehensible, the following specific embodiments are described in detail in conjunction with the accompanying drawings.

Description of drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present application, the accompanying drawings that need to be used in the embodiments of the present application will be briefly introduced below. It should be understood that the following drawings only show some embodiments of the present application, so It should not be regarded as a limitation on the scope, and those skilled in the art can also obtain other related drawings according to these drawings without creative work.

FIG. 1 is a schematic diagram of a narrow pulse power measurement system provided by an embodiment of the present application.

FIG. 2 is a schematic diagram of a signal conversion process provided by an embodiment of the present application.

Fig. 3 is a schematic diagram of a narrow pulse power measurement system in an example provided by the embodiment of the present application.

FIG. 4 is a flow chart of a narrow pulse power measurement method provided by an embodiment of the present application.

FIG. 5 is a schematic diagram of voltage sampling in an example provided by the embodiment of the present application.

Icons: 10-power measurement system; 100-acquisition unit; A-detector; B1-operational amplifier; 200-peak hold circuit; B2-transconductance amplifier; B3-voltage buffer; I-constant current source; D-diode ; C-hold capacitor; 300-microcontroller.

Detailed ways

The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application.

Please refer to FIG. 1 . FIG. 1 is a schematic diagram of a narrow pulse power measurement system 10 provided by an embodiment of the present application. For ease of description, the narrow pulse power measurement system 10 is simply referred to as the power measurement system 10 in the introduction of the subsequent part.

Wherein, the narrow pulse power measurement system 10 can measure an unknown power signal, and the unknown power signal may be a narrow pulse signal output by a coupler coupled with the device under test.

The narrow pulse signal may represent a signal with a pulse-width (Pulse-Width, pulse width, pulse width for short) of the order of nanoseconds or even lower than the order of nanoseconds.

Devices under test may be wideband amplifiers, power sources, and other devices capable of outputting narrow pulse power signals.

Taking the device under test as a power source as an example, the power source can be coupled with two couplers, the signal output by one of the two couplers may be a forward signal, and the signal output by the other coupler may be is a reverse signal. The forward signal indicates the output power signal, and the forward signal is usually a useful signal; the reverse signal indicates the reflected power signal, which means the signal reflected by other connecting lines or other equipment, and is usually absorbed by the load.

Forward signals and reverse signals are directional. The specific collection positions of the forward signal and the reverse signal are different, but no matter whether it is a narrow pulse forward signal or a narrow pulse reverse signal, it can be used as the first power signal in any embodiment of the present application.

As shown in FIG. 1 , the narrow pulse power measurement system 10 provided by the embodiment of the present application may include an acquisition unit 100 , a peak hold circuit 200 , and a microcontroller 300 .

The acquisition unit 100 is connected to a peak hold circuit 200 , and the peak hold circuit 200 is connected to a microcontroller 300 .

The collection unit 100 is configured to collect a first power signal of a narrow pulse, and convert the first power signal into a first voltage signal of a narrow pulse, where the first power signal is a radio frequency power signal.

The peak hold circuit 200 is configured to output a second voltage signal according to the first voltage signal, and the pulse width of the second voltage signal is greater than the pulse width of the first voltage signal.

The microcontroller 300 is configured to sample the second voltage signal to obtain voltage sampling data.

The microcontroller 300 is further configured to calculate a power measurement result corresponding to the first power signal according to the voltage sampling data.

Wherein, the terminal indicated by "IN" in FIG. 2 or FIG. 3 can be used to access the first power signal, and the first power signal is an unknown radio frequency coupling power small signal.

In an example, the pulse width of the first power signal may be on the order of nanoseconds.

After the first power signal is converted by the acquisition unit 100, the first power signal is converted into a first voltage signal, and the magnitude of the pulse width of the first voltage signal is the same as that of the first power signal.

As shown in FIG. 2 , after the first voltage signal is converted by the peak hold circuit 200 , the first voltage signal with a narrow pulse is converted into a second voltage signal with a larger pulse width.

In an example, the pulse width of the second voltage signal may be on the order of microseconds.

As an implementation, after obtaining the second voltage signal with a larger pulse width, the microcontroller 300 can collect the second voltage signal to obtain voltage sampling data, and then calculate a power value based on the voltage sampling data, the power value as the power measurement corresponding to the first power signal.

Wherein, for each first power signal input during each measurement process, the microcontroller 300 may calculate a power value as a power measurement result of the first power signal. After updating the first power signal, the microcontroller 300 may calculate a new power value as a power measurement result corresponding to the updated first power signal.

For the power measurement system 10 of the above-mentioned narrow pulse, even if the sampling frequency of the microcontroller 300 is low, the working sampling frequency of the microcontroller 300 itself cannot meet the frequency of the first power signal, and the signal made by the sampling unit to the first power signal The conversion and the pulse width extension performed by the peak hold circuit 200 can convert the unknown small signal with narrow pulse power into a voltage signal with a larger pulse width. Then the microcontroller 300 may perform sampling based on the voltage signal with a larger pulse width, and calculate a power measurement result corresponding to the first power signal according to the voltage sampling data. In this way, a general-purpose microcontroller 300 or a general-purpose processor can also complete the measurement of a narrow pulse power small signal, without the need for a high-speed, high-precision special-purpose processor or FPGA (Field Programmable Gata Array, Field Programmable Gate Array) array) for power measurements. Wherein, the general-purpose processor or the general-purpose microcontroller 300 refers to a processor or a controller whose working sampling frequency is difficult to meet the frequency of the first power signal, so that the first power signal cannot be directly measured.

Usually, if you want to use a high-performance dedicated processor chip or FPGA and other processors to build a measurement system, you will face relatively complicated peripheral circuit design, but if you use the narrow pulse power measurement system 10 provided by the embodiment of the present application measurement, the structure of the measurement system can be simplified.

Optionally, as shown in FIG. 3 , the acquisition unit 100 may include a detector A and an operational amplifier B1.

The detector A is connected to the operational amplifier B1 , and the operational amplifier B1 is connected to the peak hold circuit 200 .

The detector A is configured to detect the first power signal to obtain a first detection signal of a narrow pulse. The first detection signal is a voltage signal.

The operational amplifier B1 is used for operationally amplifying the first detection signal to obtain a first voltage signal, and transmitting the first voltage signal to the peak hold circuit 200 .

In an example, the operational amplifier B1 may be a differential amplifier, configured to differentially amplify the first detection signal to obtain the first voltage signal.

If the first power signal is a forward signal, the detector A can be used for forward detection, and if the first power signal is a reverse signal, the detector A can be used for reverse detection.

As an implementation manner, the detector A may be an envelope/peak detector A, which is used to perform envelope detection on a narrow pulse signal.

In one example, detector A can be an envelope/peak detector A model ADL5511. The operational amplifier B1 can use an amplifier with a model number of LMH6612MA to realize the operational amplification function.

In this way, the conversion of the power signal to the voltage signal can be realized through the detector A, and the small voltage signal can be operationally amplified through the operational amplifier B1, so that the subsequent circuit can recognize the voltage signal with a wider range and stronger signal. Signal acquisition can be performed more easily.

In other embodiments, the operational amplifier B1 may have multiple stages, so as to realize the function of multi-stage amplification.

Optionally, if the signal output by the detector A is sufficient for subsequent circuits to identify, the operational amplifier B1 can be omitted.

In the case where the operational amplifier B1 is omitted, the detector A can be used to detect the first power signal to obtain the first voltage signal. In this way, the detector A can convert the narrow-pulse first power signal into the narrow-pulse first voltage signal, thereby realizing the conversion from the power signal to the voltage signal.

Optionally, the peak hold circuit 200 may include a transconductance amplifier B2, a diode D, a holding capacitor C, and a voltage buffer B3.

One input terminal of the transconductance amplifier B2 is connected to the output terminal of the acquisition unit 100 , the output terminal of the transconductance amplifier B2 is connected to the anode of the diode D, and the cathode of the diode D is connected to the holding capacitor C. The holding capacitor C is also connected to the input terminal of the voltage buffer B3, and the output terminal of the voltage buffer B3 is connected to the microcontroller 300, and the output signal of the voltage buffer B3 can be fed back to the other input terminal of the transconductance amplifier B2.

Wherein, the transconductance amplifier B2 can convert the voltage difference between the first voltage signal and the second voltage signal, and the output signal of the transconductance amplifier B2 is a current signal. The constant current source I connected to the transconductance amplifier B2 in FIG. 3 is used to provide a static loop for the transconductance amplifier B2.

If the second voltage signal is smaller than the first voltage signal, the current signal output by the transconductance amplifier B2 charges the storage capacitor C through the diode D. If the second voltage signal is greater than or equal to the first voltage signal, the diode D is turned off, and the voltage on the holding capacitor C remains unchanged. The voltage buffer B3 can collect the signal change on the holding capacitor C.

Through the peak hold circuit 200, the pulse width of the narrow pulse first voltage signal can be extended and held for a period of time to obtain a second voltage signal with a larger pulse width, so as to facilitate sampling processing by using a general-purpose low-rate analog-to-digital converter .

The low-speed analog-to-digital converter may be a built-in converter of microcontroller 300 or an external converter.

Optionally, in order to make the response speed of the narrow pulse peak hold faster, when selecting devices to build the peak hold circuit 200, the delay of the transconductance amplifier B2, diode D, and voltage buffer B3 can be reduced as much as possible, and the bandwidth Larger transconductance amplifier B2 and voltage buffer B3. In an example, the peak hold circuit 200 can be constructed by using an operational amplifier with a bandwidth of hundreds of megabytes.

In one example, the peak hold circuit 200 can be implemented using an integrated chip modeled as OPA615. The OPA615 chip includes an operational transconductance amplifier B2, a voltage buffer B3 and a concurrent switch circuit. When the switch is enabled, the transconductance The output current of the amplifier B2 is large, which can quickly charge the holding capacitor C. When the switch is turned off, the turn-off resistance is large, so that the charge on the holding capacitor C can be kept as unchanged as possible. The peak hold circuit 200 in this example can realize the signal peak hold of nanosecond pulse width, so that the sampling interface of the subsequent microcontroller 300 can collect effective signals, so that the power measurement system 10 can measure various unknown narrow pulse power The signal is measured, and the measurement reliability is guaranteed.

Among them, the diode D has a great influence on the parameters of the power measurement system 10, because there is a time difference between the diode D being turned on and off, there is a reverse leakage current, and the greater the reverse leakage current, the greater the droop rate of the circuit. Considering this factor, the peak hold circuit 200 can be constructed by using a diode D with small forward voltage, fast switching time, recovery period and small junction capacitance, such as but not limited to a Schottky diode D.

Optionally, the power measurement system 10 may include at least two collection lines, which can be used to collect narrow pulse signals of different devices under test, or can be used to collect multiple narrow pulse signals of the same device under test.

Wherein, any one of the at least two collection lines may be used for power measurement of the output power signal of a device under test, or may be used for measuring the reflected power signal of the device under test, or may be used for The incident power signal of another device under test is measured, and the narrow pulse incident power signal can be used as the above-mentioned first power signal.

Any one of the at least two acquisition lines may include: an acquisition unit 100 and a peak hold circuit 200 connected to the acquisition unit 100 , and an output terminal of the peak hold circuit 200 in any acquisition line is connected to a microcontroller 300 .

As an implementation manner, the at least two acquisition lines are used to transmit at least two second voltage signals to the microcontroller 300 . The microcontroller 300 is used to calculate and obtain at least two sets of power values according to at least two channels of second voltage signals.

Wherein, a set of power values corresponds to one collection line. The number of power values in each group of power values is related to the number of updates of the actually input first power signal, and the number of power values in each group of power values may be one or multiple.

By setting the narrow pulse power measurement system 10 with at least two acquisition lines, it is possible to perform power measurement on multiple unknown narrow pulse signals, which improves the measurement efficiency of unknown narrow pulse power small signals.

Optionally, if the first power signal collected in the at least two collection lines includes one output power signal and one reflection power signal corresponding to the output power signal, then there are at least two collection units in the at least two collection lines The 100 respectively collects two first power signals, one of the two first power signals is an output power signal, and the other signal is a reflected power signal.

The two acquisition units 100 respectively used to collect the output power signal and the reflected power signal are connected to two peak hold circuits 200, and the two peak hold circuits 200 are respectively used to output the forward second voltage signal corresponding to the output power signal, An inverted second voltage signal corresponding to the reflected power signal. The two input terminals of the microcontroller 300 can respectively perform voltage sampling on the forward second voltage signal and the reverse second voltage signal, and calculate the output power value corresponding to the output power signal and the reflected power signal according to the sampling results. Corresponding reflected power value. The output power value can be used as a power measurement result corresponding to the output power signal, and the reflected power value can be used as a power measurement result corresponding to the reflected power signal.

In the case of calculating the output power value and the reflected power value, the microcontroller 300 can be used to calculate the standing wave ratio according to the output power value and the reflected power value, and the standing wave ratio is used as the power measurement result corresponding to the output power signal and the reflected power signal . Through the calculation and configuration of the standing wave ratio, it is helpful for the user to perform feedback adjustment on the device under test that outputs the output power signal or the reflected power signal according to the calculated standing wave ratio. The above scheme has a good market application prospect.

Based on the same inventive concept, the embodiment of the present application also provides a narrow pulse power measurement method applicable to the aforementioned narrow pulse power measurement system 10 . The narrow pulse power measurement method can be implemented by the aforementioned power measurement system 10 .

Please refer to FIG. 4 . FIG. 4 is a flowchart of a narrow pulse power measurement method provided by an embodiment of the present application.

As shown in FIG. 4, the narrow pulse power measurement method may include steps S21-S25.

S21: The collection unit 100 collects a first power signal, where the first power signal is a radio frequency power signal of a narrow pulse.

S22: The acquisition unit 100 converts the first power signal into a first voltage signal of a narrow pulse.

S23: The peak hold circuit 200 outputs a second voltage signal according to the first voltage signal, and the pulse width of the second voltage signal is greater than the pulse width of the first voltage signal.

S24: The microcontroller 300 samples the second voltage signal to obtain voltage sampling data.

S25: The microcontroller 300 calculates and obtains a power measurement result corresponding to the first power signal according to the voltage sampling data.

Through the above method, the first power signal with a narrow pulse can be converted into a second voltage signal with a larger pulse width by the acquisition unit 100 and the peak hold circuit 200 . The microcontroller 300 can sample the second voltage signal with a larger pulse width, and calculate the power measurement result based on the sampling result, so as to realize the indirect measurement of the narrow pulse power small signal. Wherein, the power measurement result corresponds to the first power signal.

The above method can be applied to general-purpose microcontrollers 300 and general-purpose microprocessors, which reduces the high-performance requirements of traditional solutions for processors. Even though the working sampling frequency of the microcontroller 300 is low, the power measurement of the narrow pulse and small signal can be realized. Wherein, the general-purpose microcontroller 300 and the general-purpose microprocessor refer to controllers and processors whose working sampling frequency of the device itself cannot meet the frequency of the narrow pulse signal.

As an implementation manner, the microcontroller 300 in the embodiment of the present application may be a microsecond-level processor.

Optionally, for the above S24, it may specifically include: the built-in converter of the microcontroller 300 samples the second voltage signal to obtain a voltage sample array as the voltage sample data.

Since the pulse width of the second voltage signal is extended, even if the sampling frequency of the built-in analog-to-digital converter of microcontroller 300 is low, it can meet the sampling requirements of the second voltage signal, reducing the need for external high-speed analog-to-digital converters. Converter dependencies. The microcontroller 300 itself can realize the sampling of the second voltage signal, and does not need an external high-precision analog-to-digital converter for data conversion, which can simplify the system structure.

Optionally, the voltage sampling data may include multiple voltage values corresponding to multiple sampling points of the second voltage signal, and the above S25 may include: S251-S252.

S251: The microcontroller 300 screens out valid sampling points among the multiple sampling points according to multiple voltage values in the voltage sampling data, and calculates an effective average voltage value corresponding to the valid sampling points.

S252: The microcontroller 300 calculates and obtains a power value corresponding to the effective average voltage value according to the effective average voltage value and a preset fitting correspondence relationship, as a power measurement result corresponding to the first power signal.

As an implementation, the analog-to-digital conversion port of the microcontroller 300 can collect the second voltage signal, and after the analog-to-digital conversion, voltage sampling data including multiple voltage values can be obtained, and each of the multiple voltage values A voltage value corresponds to a sampling point.

After obtaining multiple voltage values corresponding to multiple sampling points, an effective voltage value can be selected from the multiple voltage values, and the sampling point corresponding to the effective voltage value is an effective sampling point.

The number of effective voltage values is related to the actually input first power signal, and for multiple effective voltage values determined each time, the multiple effective voltage values may be the same or different.

Wherein, the effective voltage value may be a voltage value greater than a set threshold. The set threshold may be a voltage threshold of 0, 0.1, 0.2, 0.5, 0.8 or the like.

After the effective voltage value or effective sampling point is determined, all effective voltage values in a measurement process are averaged to obtain an effective average voltage value V corresponding to the first power signal. According to the effective average voltage value V and the preset matching relationship, the power value corresponding to the effective average voltage value V can be determined as the power measurement result of the first power signal.

Wherein, the fitting corresponding relationship may be presented in the form of a fitting curve, may also be presented in the form of a fitting expression, and may also be presented in the form of a data table.

The fitting correspondence relationship can be determined according to the actual acquisition unit, and the fitting correspondence relationship of the acquisition unit is fixed. After the acquisition unit is calibrated, the fitting correspondence relationship corresponding to the acquisition unit can be determined. For example, each detector corresponds to a fixed fitting curve or fitting expression, which can be used as a fitting correspondence.

As an implementation manner, if the fitting correspondence is expressed as a fitting curve, the abscissa of the fitting curve may be voltage, and the ordinate may be power. By substituting the calculated effective average voltage V into the fitting curve, the power value corresponding to the effective average voltage V can be determined according to the fitting curve as the power measurement result corresponding to the first power signal.

If you want to measure the power of multiple first power signals, you can obtain multiple sets of sampling data through multiple acquisition lines, and calculate multiple effective average voltage values. Each effective average voltage value can correspond to a first power signal. A plurality of power measurement results corresponding to the plurality of first power signals may be determined based on a preset fitting correspondence relationship.

In an example, as shown in FIG. 5 , n sampling points may be randomly selected according to the signal period T of the second voltage signal to obtain n voltage values respectively corresponding to the n sampling points. The n sampling points may correspond to sampling data of multiple signal periods T. n is an integer greater than zero.

Wherein, the number of sampling points selected in each signal period T may be the same.

Taking FIG. 5 as an example, n voltage values of n sampling points are obtained by sampling in FIG. 5 . Among the n sampling points, the voltage values corresponding to the 2nd, 3rd, 7th, 8th...n sampling points are effective voltage values, and the 2nd, 3rd, 7th, 8th...n sampling points are valid sampling points , and the remaining sampling points are recorded as invalid sampling points. After averaging all the effective voltage values corresponding to the effective sampling points of the 2nd, 3rd, 7th, 8th...n sampling points, an effective average voltage value V corresponding to the n sampling points can be obtained. A power value can be determined according to the effective average voltage value V and the preset fitting correspondence relationship as a power measurement result of the first power signal.

In this way, the effective sampling point can be determined according to the second voltage signal, and the effective average voltage value can be calculated based on the voltage of the effective sampling point, and then the power value corresponding to the effective average voltage value can be determined according to the set fitting correspondence relationship, as A power measurement corresponding to the first power signal. In this way, the power corresponding to the first power signal with a smaller pulse width can be determined according to the second voltage signal with a larger pulse width, which reduces the high performance requirements for the microcontroller 300 and has a better market application prospect.

Optionally, there may be at least two first power signals, and the at least two first power signals may include an output power signal and a reflected power signal of the device under test. The collection positions of the output power signal and the reflected power signal are different. The above S25 may specifically include: S253-S255.

S253: The microcontroller 300 calculates the output power value according to the voltage sampling data corresponding to the output power signal.

S254: The microcontroller 300 calculates the reflected power value according to the voltage sampling data corresponding to the reflected power signal.

S255: The microcontroller 300 calculates a standing wave ratio according to the output power value and the reflected power value, and the standing wave ratio is used as a power measurement result corresponding to the output power signal and the reflected power signal.

The calculation order of the above S253 and S254 can be exchanged, for example, S253 and S254 can be executed at the same time, S253 can be executed first, and then S254 can be executed, or S254 can be executed first, and then S253 can be executed.

It should be noted that the corresponding output power signal and reflected power signal need to correspond in signal acquisition time. For example, two lines can be used to simultaneously collect output power signal and reflected power signal to obtain two sets of voltage sampling data. Ensure that the calculated output power value and reflected power value correspond to each other in time.

Optionally, if each of the at least two first power signals is a forward narrow pulse signal, the microcontroller 300 can calculate at least two output power values. If each of the at least two first power signals is an inverted narrow pulse signal, the microcontroller 300 can calculate at least two reflected power values.

Through the above implementation method, the microcontroller 300 can perform power measurement on at least two channels of unknown narrow pulse signals. When there is a set of output power signals and reflected power signals corresponding to each other in at least two signals, the microcontroller 300 can calculate the output power value corresponding to the output power signal and the reflected power value corresponding to the reflected power signal, and based on the output The standing wave ratio is calculated from the power value and reflected power value. Through the calculation of the standing wave ratio, it is helpful for the user to feedback and control the device under test that outputs the output power signal according to the calculated standing wave ratio.

As an implementation manner, the acquisition unit 100 may include a wave detector A, and the above S22 may include: the wave detector A detects the first power signal to obtain a narrow pulse first voltage signal.

In this way, the detector A can convert the narrow-pulse first power signal into the narrow-pulse first voltage signal, thereby realizing the conversion from the power signal to the voltage signal.

As another implementation, the acquisition unit 100 may include a detector A and an operational amplifier B1, and the above S22 may include: the detector A detects the first power signal to obtain the first detection signal; the operational amplifier B1 detects the first power signal Operational amplification is performed to obtain a first voltage signal of a narrow pulse.

In this way, the conversion of the power signal to the voltage signal can be realized through the detector A, and the small voltage signal can be operationally amplified through the operational amplifier B1, so that the subsequent circuit can identify a voltage signal with a wider range and a stronger signal.

Optionally, the peak hold circuit 200 may include a transconductance amplifier B2, a diode D, a holding capacitor C, and a voltage buffer B3, and the above S23 may include S231-S232.

S231: The transconductance amplifier B2 outputs a charging signal according to the first voltage signal, and the charging signal is used to control the diode D to be turned on to charge the holding capacitor C, or to control the diode D to be turned off so that the voltage output by the holding capacitor C remains unchanged .

S232: The voltage buffer B3 outputs the second voltage signal according to the signal output by the holding capacitor C.

In this way, the transconductance amplifier B2 can be used to control the diode D to turn on or off according to the change of the first voltage signal, and the signal output by the holding capacitor C will change according to the change of the diode D, and the holding capacitor C can be output through the voltage buffer B3 The signal coupled to the second voltage signal, the above-mentioned peak hold circuit can realize the extension of the pulse width.

For more details about the narrow pulse power measurement method provided by the embodiment of the present application, reference may be made to the relevant description in the aforementioned power measurement system 10 , which will not be repeated here.

In the embodiments provided in this application, it should be understood that the disclosed methods may be implemented in other ways. The above-described embodiments are only illustrative. For example, the division of units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into Another system, or some features may be ignored, or not implemented. In another point, the mutual coupling or direct coupling or communication connection may be through some communication interfaces, and the indirect coupling or communication connection of devices or units may be in electrical, mechanical or other forms.

In addition, the units described as separate components may or may not be physically separated, and some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

In this document, relational terms such as first and second etc. are used only to distinguish one entity or operation from another without necessarily requiring or implying any such relationship between these entities or operations. Actual relationship or sequence.

The above are only examples of the present application, and are not intended to limit the scope of protection of the present application. For those skilled in the art, various modifications and changes may be made to the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of this application shall be included within the protection scope of this application.

Claims (10)

1. A power measurement method of narrow pulse, it is characterized in that, is applied to the power measurement system of narrow pulse, and described system comprises: acquisition unit, peak hold circuit, microcontroller, described acquisition unit and described peak hold circuit connected, the peak hold circuit is connected with the microcontroller; The methods include: The collection unit collects a first power signal, and the first power signal is a narrow pulse radio frequency power signal; The acquisition unit converts the first power signal into a narrow pulse first voltage signal; The peak hold circuit outputs a second voltage signal according to the first voltage signal, and the pulse width of the second voltage signal is greater than the pulse width of the first voltage signal; The microcontroller samples the second voltage signal to obtain voltage sampling data; The microcontroller calculates and obtains a power measurement result corresponding to the first power signal according to the voltage sampling data. 2. The method according to claim 1, wherein the microcontroller samples the second voltage signal to obtain voltage sampling data, comprising: The built-in converter of the microcontroller samples the second voltage signal to obtain a voltage sampling array as the voltage sampling data. 3. The method according to claim 1, wherein the voltage sampling data includes a plurality of voltage values corresponding to a plurality of sampling points of the second voltage signal, and the microcontroller according to the voltage sampling data Calculate and obtain a power measurement result corresponding to the first power signal, including: The microcontroller screens out valid sampling points among the multiple sampling points according to the multiple voltage values in the voltage sampling data, and calculates an effective average voltage value corresponding to the valid sampling points; The microcontroller calculates and obtains a power value corresponding to the effective average voltage value according to the effective average voltage value and a preset fitting correspondence relationship as a power measurement result corresponding to the first power signal. 4. The method according to claim 1, wherein the first power signal has at least two paths, and at least two paths of the first power signal include an output power signal and a reflected power signal of the device under test; The microcontroller calculates and obtains a power measurement result corresponding to the first power signal according to the voltage sampling data, including: The microcontroller calculates the output power value according to the voltage sampling data corresponding to the output power signal; The microcontroller calculates the reflected power value according to the voltage sampling data corresponding to the reflected power signal; The microcontroller calculates a standing wave ratio according to the output power value and the reflected power value, and the standing wave ratio is used as a power measurement result corresponding to the output power signal and the reflected power signal. 5. The method according to claim 1, wherein the acquisition unit comprises a wave detector, and the acquisition unit converts the first power signal into a first voltage signal of a narrow pulse, comprising: The wave detector detects the first power signal to obtain the first voltage signal of a narrow pulse. 6. The method according to claim 1, wherein the acquisition unit comprises a detector and an operational amplifier, and the acquisition unit converts the first power signal into a first voltage signal of a narrow pulse, comprising: The detector detects the first power signal to obtain a first detection signal of a narrow pulse; The operational amplifier performs operational amplification on the first detection signal to obtain the first voltage signal of a narrow pulse. 7. The method according to claim 1, wherein the peak hold circuit comprises a transconductance amplifier, a diode, a hold capacitor, and a voltage buffer, and the peak hold circuit outputs a second voltage according to the first voltage signal Signals, including: The transconductance amplifier outputs a charging signal according to the first voltage signal, and the charging signal is used to control the diode to be turned on to charge the holding capacitor, or to control the diode to be turned off to make the holding capacitor The voltage output by the capacitor remains unchanged; The voltage buffer outputs a second voltage signal according to the signal output by the holding capacitor. 8. A power measurement system of a narrow pulse, characterized in that the system comprises: an acquisition unit, a peak hold circuit, and a microcontroller; The acquisition unit is connected to the peak hold circuit, and the peak hold circuit is connected to the microcontroller; The acquisition unit is configured to acquire a first power signal, and the first power signal is a radio frequency power signal of a narrow pulse; The acquisition unit is further configured to convert the first power signal into a narrow pulse first voltage signal; The peak hold circuit is configured to output a second voltage signal according to the first voltage signal, and the pulse width of the second voltage signal is greater than the pulse width of the first voltage signal; The microcontroller is configured to sample the second voltage signal to obtain voltage sampling data; The microcontroller is further configured to calculate and obtain a power measurement result corresponding to the first power signal according to the voltage sampling data. 9. The system according to claim 8, wherein the acquisition unit comprises a wave detector; The detector is used to detect the first power signal to obtain the first voltage signal. 10. The system of claim 8, wherein: The system includes at least two acquisition lines; Any one of the at least two acquisition lines includes: the acquisition unit and a peak hold circuit connected to the acquisition unit; The at least two acquisition lines are used to transmit at least two second voltage signals to the microcontroller; The microcontroller is configured to calculate and obtain at least two sets of power values according to the at least two channels of second voltage signals.