CN110361774B - Device and method for testing time response of X-ray detector - Google Patents
Device and method for testing time response of X-ray detector Download PDFInfo
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- CN110361774B CN110361774B CN201910648733.9A CN201910648733A CN110361774B CN 110361774 B CN110361774 B CN 110361774B CN 201910648733 A CN201910648733 A CN 201910648733A CN 110361774 B CN110361774 B CN 110361774B
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- G01—MEASURING; TESTING
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- G01T7/00—Details of radiation-measuring instruments
- G01T7/005—Details of radiation-measuring instruments calibration techniques
Abstract
The invention discloses a device and a method for testing time response of an X-ray detector, which comprise an X-ray light source, the X-ray detector, a rotating system which is arranged between the X-ray light source and the X-ray detector and is provided with a rotatable mark, an X-ray sensing system for testing the switch and the intensity of X-ray in real time, a high-speed camera system for monitoring the rotating position of the mark, and a data acquisition module for data acquisition and analysis processing, wherein the data acquisition module is electrically connected with the X-ray light source, the X-ray detector, the rotating system, the X-ray sensing system and the high-speed camera system. The device and the test method realize the test from the X-ray exposure to the display of the total delay, can be independent of the system of the X-ray detector, do not depend on the running speed of a computer, and can truly test the delay. In addition, the method can be used for testing parameters related to time delay such as frame jitter and the like. Through expansion, the invention can also be used for testing the time delay information of the X-ray light source.
Description
Technical Field
The invention relates to a device and a method for testing time response of an X-ray detector.
Background
At present, the X-ray delay test is mostly realized by software matched with a detector. For example, after the data sent by the X-ray detector is organized into a frame in the computer memory, the software records the current system time stamp. By counting the timestamps of different frames, the time difference between frames can be counted. However, this method requires a number of calculation instructions to be inserted into the X-ray detector software, and the execution of these instructions takes time, which makes the test error. Meanwhile, because different computers execute the instructions at different times, the time delay calculated on different computers has certain difference.
More troublesome, the method can only test the time difference between frames at the computer end, and cannot test the total delay of the detector from the beginning of X-ray exposure to the display of one frame at the computer. The delay includes the time for the detector to acquire and process the image, the data transmission time from the detector to the computer, the time for the computer software to process the image, the time for the software to finish processing and send to the display card for display, the response time of the display and the like. And accurate acquisition of the total delay is crucial to the design and optimization of the detector.
Disclosure of Invention
In order to solve the above problems, an object of the present invention is to provide an apparatus and a method for testing a time response of an X-ray detector.
In order to achieve the above purposes, the technical scheme provided by the invention is as follows: a device for testing time response of an X-ray detector comprises an X-ray light source, the X-ray detector, a rotating system which is arranged between the X-ray light source and the X-ray detector and is provided with a rotatable mark, an X-ray sensing system for testing the switch and the intensity of the X-ray in real time, a high-speed camera system for monitoring the rotating position of the mark and a data acquisition module for data acquisition and analysis processing, wherein the data acquisition module is electrically connected with the X-ray light source, the X-ray detector, the rotating system, the X-ray sensing system and the high-speed camera system, the rotating axis of the mark in the rotating system is vertical to the detection surface of the X-ray detector, and the detection surface refers to the surface of the X-ray detector for receiving X-ray irradiation. The above-mentioned marks are visible under X-ray and visible light.
Furthermore, the rotating system comprises a motor with adjustable speed, a disc driven by the motor to rotate, and a control module which is electrically connected with the motor and can control the starting, the stopping and the rotating speed of the motor, wherein the control module is electrically connected with the data acquisition module, and the mark is arranged on the circular surface of the disc.
Further, the disk is made of a material that is transparent to X-rays, such as PMMA.
Furthermore, the mark comprises two parts with different shapes, the two parts are distributed on the same diameter of the disc, and the inertia moment from the two parts to the circle center is equal on two sides of the circle center.
Furthermore, the X-ray sensing system comprises a high-speed X-ray sensor which can test the on-off and the intensity of the X-ray in real time, the high-speed X-ray sensor is arranged in the exposure range of the X-ray light source, and the high-speed X-ray sensor is electrically connected with the data acquisition module.
The invention also provides another technical scheme: a test method based on the device for testing the time response of the X-ray detector comprises an extension test, and the time delay test comprises the following steps:
the marker rotates at a specific angular speed, the data acquisition module records the angular speed, and after the X-ray light source is turned on, the X-ray sensing system obtains the moment of the trigger signal of the X-ray light source and the moment of actual exposure of the X-ray and sends the moment to the data acquisition module. After the X-ray source is turned on, the light intensity is gradually increased to work stably, and the time when the X-ray source starts to be stable is the time when the X-ray is actually exposed. The method comprises the steps that a first frame of image collected by an X-ray detector is processed and then displayed on a screen, a data collection module records a position A of a mark in the displayed first frame of image, the data collection module records a position B of the mark in an image collected by a high-speed camera system at the same time when the first frame of image is displayed, the angular difference between the position A and the position B is calculated, and the angular difference is divided by the rotating angular speed of the mark to obtain the time difference from image collection to display of the X-ray detector.
Further, the total delay is obtained by calculating the difference between the time of the trigger signal of the X-ray light source obtained by the X-ray sensing system and the time of the first frame of image acquired by the X-ray detector displayed on the screen, or the difference between the actual exposure time of the X-ray obtained by the X-ray sensing system and the time of the first frame of image acquired by the X-ray detector displayed on the screen.
Further, the test method further comprises a frame rate test, which comprises the following steps:
and increasing the rotation angular speed of the mark from zero, recording the rotation angular speed of the mark by the data acquisition module when the mark position in each image displayed on the screen is the same, wherein the time of one circle of rotation of the mark at the angular speed is the time difference between frames, and the reciprocal of the time difference is the frame frequency.
Still further, the testing method further comprises a frame jitter test comprising the steps of:
in the process of frame frequency test, if the frame frequency is unstable, the mark displayed on the screen swings back and forth at a certain position, the maximum angle of the swing and the rotation angular speed of the mark corresponding to the maximum angle are recorded, and the maximum angle is divided by the angular speed to obtain the maximum frame jitter.
Further, the screen is connected with the X-ray detector in a signal mode, and further, the screen is a computer side screen, and the computer is connected with the X-ray detector.
By adopting the technical scheme, the device and the method for testing the time response of the X-ray detector realize the test from the exposure of the X-ray to the display of the total delay. The device and the method for testing the time response of the X-ray detector can be independent of a system of the X-ray detector, do not depend on the running speed of a computer, and can really test the time delay. In addition, the device and the method for testing the time response of the X-ray detector can also be used for testing parameters related to time delay such as frame jitter and the like. Through expansion, the invention can also be used for testing the time delay information of the X-ray light source.
Drawings
FIG. 1 is a schematic structural diagram of an apparatus for testing a time response of an X-ray detector according to a first embodiment of the present invention;
fig. 2 is a schematic view showing the structure of a disk of the rotating system of fig. 1.
The reference numbers in the figures are:
1. an X-ray detector; 2. a rotation system; 21. marking; 22. a disc; 3. an X-ray sensor system; 4. a data acquisition module; 5. a high-speed camera system; 6. an X-ray source.
Detailed Description
Preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings so that the advantages and features of the invention may be more readily understood by those skilled in the art.
As can be seen from the schematic structural diagrams of fig. 1 to fig. 2, the apparatus for testing the time response of the X-ray detector in this embodiment includes an X-ray light source 6, an X-ray detector 1, a rotation system 2, an X-ray sensing system 3, a high-speed camera system 5, and a data acquisition module 4. The data acquisition module 4 is electrically connected with the X-ray light source 6, the X-ray detector 1, the rotating system 2, the X-ray sensing system 3 and the high-speed camera system 5.
The rotational system 2 is arranged between the X-ray source 6 and the X-ray detector 1 and has a marking 21, which marking 21 is visible under X-ray and visible light. The index 21 is rotatably disposed with its rotation axis perpendicular to the detection surface of the X-ray detector 1, where the detection surface refers to the surface of the X-ray detector that receives the X-ray radiation. The embodiment shows a specific structure of the rotating system 2, which comprises a speed-adjustable motor, a disc 22 driven by the motor to rotate, and a control module electrically connected with the motor and capable of controlling the start, stop and rotating speed of the motor. The control module is electrically connected with the data acquisition module 4 and sends corresponding data signals to the data acquisition module. The rotation axis of the rotating shaft of the disc 22 passes through the center of the disc and is perpendicular to the detecting surface of the X-ray detector 1, the disc 22 is made of a material capable of transmitting X-rays, such as PMMA, and the above-mentioned mark 21 is arranged on the circular surface of the disc 22. In a preferred embodiment, the marker 21 comprises two portions distributed on the same diameter of the disc 22, on either side of the centre of the circle. The two portions are shaped differently to facilitate differentiation under X-rays. The rotational inertia from the two parts to the circle center is equal so as to satisfy the balance when the disk rotates. In operation, the disc 22 is close to the detection surface of the X-ray detector 1 and rotates at a certain speed, and during X-ray exposure, the C light irradiates the surface of the disc 22, and the mark 21 is left on the image collected by the X-ray detector 1.
The X-ray sensing system 3 can test the on-off and the intensity of the X-ray in real time, and specifically, the X-ray sensing system 3 includes a high-speed X-ray sensor capable of testing the on-off and the intensity of the X-ray in real time, the high-speed X-ray sensor is disposed in an exposure range of the X-ray light source 6, and the high-speed X-ray sensor is electrically connected with the data acquisition module 4 and sends a corresponding data signal to the data acquisition module 4. The response speed of the high-speed X-ray sensor can reach nanosecond or even picosecond.
The high speed camera system 5 is used to monitor the rotational position of the marker 21. During testing, the high-speed camera system 5 is arranged beside the rotating system 2.
The data acquisition module 4 can acquire various corresponding data information of the components connected with the data acquisition module and analyze and process the data information.
The embodiment also provides a testing method based on the device for testing the time response of the X-ray detector, the testing method comprises an extension test, and the delay test comprises the following steps:
the rotation system 2 is adjusted so that the markers 21 rotate at a certain angular velocity, which is recorded by the data acquisition module 4. After the X-ray light source 6 is turned on, the X-ray sensing system 3 obtains the time when the X-ray light source 6 triggers the signal and the time when the X-ray actually exposes, and sends the time to the data acquisition module 4. After the X-ray source is turned on, the light intensity is gradually increased to work stably, and the time when the X-ray source starts to be stable is the time when the X-ray is actually exposed. The method comprises the steps that a first frame of image acquired by an X-ray detector 1 is processed and then displayed on a screen, a data acquisition module 4 records a position A of a mark 21 in the displayed first frame of image, the data acquisition module 4 records a position B of the mark 21 in an image acquired by a high-speed camera system 5 at the same time when the first frame of image is displayed, and the time difference from the image acquisition to the display of the X-ray detector 1 is obtained by calculating the angle difference between the position A and the position B and dividing the angle difference by the rotating angular speed of the mark 21.
Further, the total delay is obtained by calculating the difference between the time of the trigger signal of the X-ray light source 6 obtained by the X-ray sensing system 3 and the time of the first frame of image acquired by the X-ray detector 1 displayed on the screen, or the difference between the actual exposure time of the X-ray obtained by the X-ray sensing system 3 and the time of the first frame of image acquired by the X-ray detector 1 displayed on the screen.
Because this test has gathered a plurality of moments, can further analyze a large amount of time delay information, for example:
x-ray detector image acquisition time (integration time): since it takes a certain time for the X-ray detector 1 to collect the image, during which time the mark 21 leaves a track on the X-ray detector 1 image, analyzing the angle of the track can obtain the time for collecting the image, i.e. the track angle is at the rotational angular velocity of the mark 21.
Time difference between synchronization signals of the X-ray detector 1 and the X-ray light source 6: whether the X-ray detector 1 triggers the X-ray source 6 or the X-ray source 6 triggers the X-ray detector 1, the trigger signal can be captured by the data acquisition module 4. By the analysis, the time difference between the synchronization signal and the exposure start timing of the X-ray light source 6 can be obtained.
Response time of the X-ray light source 6: since the X-ray sensing system 4 can accurately obtain the change of the X-ray intensity from 0 to the maximum value, the data such as the rising edge time of the X-ray, the time difference between the enabling signal and the start of outputting the X-ray, and the like can be analyzed.
The test method further comprises a frame frequency test, wherein the frame frequency test comprises the following steps:
the rotation angular speed of the marker 21 is increased from zero, when the position of the marker 21 in each image displayed on the screen is the same, the data acquisition module 4 records the rotation angular speed of the marker 21 at the moment, the time of one rotation of the marker at the angular speed is the time difference between frames, and the reciprocal of the time difference is the frame frequency.
The above test method further comprises a frame jitter test, which comprises the following steps:
in the process of frame frequency test, if the frame frequency is unstable, the mark 21 displayed on the screen swings back and forth at a certain position, the maximum angle of the swing and the rotation angular speed of the mark 21 corresponding to the maximum angle are recorded, and the maximum angle is divided by the angular speed to obtain the maximum frame jitter.
The screen is connected with the X-ray detector in a signal mode, and preferably the screen is a computer side screen, and the computer is connected with the X-ray detector.
The device and the method for testing the time response of the X-ray detector in the embodiment realize the test from the exposure of the X-ray to the display of the total delay. The device and the method for testing the time response of the X-ray detector can be independent of a system of the X-ray detector, do not depend on the running speed of a computer, and can really test the time delay. In addition, the device and the method for testing the time response of the X-ray detector can also be used for testing parameters related to time delay, such as frame jitter and the like. Through expansion, the invention can also be used for testing the time delay information of the X-ray light source.
The above embodiments are merely illustrative of the technical ideas and features of the present invention, and the purpose thereof is to enable those skilled in the art to understand the contents of the present invention and implement the present invention, and not to limit the protection scope of the present invention. All equivalent changes and modifications made according to the spirit of the present invention should be covered within the protection scope of the present invention.
Claims (10)
1. An apparatus for testing the time response of an X-ray detector, comprising: comprises an X-ray light source (6), an X-ray detector (1), a rotating system (2) which is arranged between the X-ray light source (6) and the X-ray detector (1) and is provided with a rotatable mark (21), an X-ray sensing system (3) for testing the switch and the intensity of X-ray in real time, a high-speed camera system (5) for monitoring the rotating position of the mark (21) and a data acquisition module (4) for data acquisition and analysis processing, the data acquisition module (4) is electrically connected with the X-ray light source (6), the X-ray detector (1), the rotating system (2), the X-ray sensing system (3) and the high-speed camera system (5), the rotation axis of the mark (21) is vertical to the detection surface of the X-ray detector (1), and the mark (21) is visible under X-ray and visible light.
2. The apparatus for testing the time response of an X-ray detector according to claim 1, wherein: the rotating system (2) comprises a speed-adjustable motor, a disc (22) driven and rotated by the motor, and a control module which is electrically connected with the motor and can control the motor to start and stop and rotate, the control module is electrically connected with the data acquisition module (4), and the mark (21) is arranged on the circular surface of the disc (22).
3. The apparatus for testing the time response of an X-ray detector according to claim 2, wherein: the disc (22) is made of a material capable of transmitting X-rays.
4. The apparatus for testing the time response of an X-ray detector according to claim 2, wherein: the mark comprises two parts with different shapes, the two parts are distributed on the same diameter of the disc (22), and the moment of inertia from the two parts to the circle center is equal on two sides of the circle center.
5. The apparatus for testing the time response of an X-ray detector according to claim 1, wherein: the X-ray sensing system (3) comprises a high-speed X-ray sensor capable of testing the on-off and the intensity of X-rays in real time, the high-speed X-ray sensor is arranged in the exposure range of the X-ray light source (6), and the high-speed X-ray sensor is electrically connected with the data acquisition module (4).
6. A test method based on the apparatus for testing the time response of an X-ray detector according to any one of claims 1 to 5, characterized in that: the method comprises a delay test, wherein the delay test comprises the following steps:
the marker (21) rotates at a specific angular speed, the data acquisition module (4) records the angular speed, after the X-ray light source (6) is turned on, the X-ray sensing system (3) obtains the time of a trigger signal of the X-ray light source (6) and the time of actual exposure of X-rays and sends the time to the data acquisition module (4), the first frame of image acquired by the X-ray detector (1) is processed and then displayed on a screen, the data acquisition module (4) records the position A of the marker (21) in the displayed first frame of image, the data acquisition module (4) records the position B of the marker (21) in the image acquired by the high-speed camera system (5) at the same time of display of the first frame of image, and the angular speed of the rotation of the marker (21) is divided by the angular difference by calculating the angular difference between the position A and the position B, and obtaining the time difference from the image acquisition of the X-ray detector (1) to the display.
7. The test method of claim 6, wherein: and calculating the difference between the time of the trigger signal of the X-ray light source (6) obtained by the X-ray sensing system (3) and the time of the first frame of image acquired by the X-ray detector (1) displayed on the screen, or the difference between the actual exposure time of the X-ray obtained by the X-ray sensing system (3) and the time of the first frame of image acquired by the X-ray detector (1) displayed on the screen, so as to obtain the total delay.
8. The test method of claim 6, wherein: the method comprises a frame frequency test, wherein the frame frequency test comprises the following steps:
the rotating angular speed of the mark (21) is increased from zero, when the position of the mark (21) in each image displayed on the screen is the same, the data acquisition module (4) records the rotating angular speed of the mark (21) at the moment, the time of one circle of rotation of the mark at the angular speed is the time difference between frames, and the reciprocal of the time difference is the frame frequency.
9. The test method of claim 8, wherein: comprising a frame jitter test comprising the steps of:
in the frame frequency test process, if the frame frequency is unstable, the mark (21) displayed on the screen swings back and forth at a certain position, the maximum angle of the swing and the rotation angular speed of the mark (21) corresponding to the maximum angle are recorded, and the maximum angle is divided by the angular speed to obtain the maximum frame jitter.
10. The test method according to any one of claims 6 to 9, wherein: the screen is in signal connection with the X-ray detector.
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| CN201910648733.9A CN110361774B (en) | 2019-07-18 | 2019-07-18 | Device and method for testing time response of X-ray detector |
| PCT/CN2019/118732 WO2021008041A1 (en) | 2019-07-18 | 2019-11-15 | Apparatus for testing time response of x-ray detector and testing method |
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| CN201910648733.9A CN110361774B (en) | 2019-07-18 | 2019-07-18 | Device and method for testing time response of X-ray detector |
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| CN110361774B (en) * | 2019-07-18 | 2020-10-09 | 江苏康众数字医疗科技股份有限公司 | Device and method for testing time response of X-ray detector |
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| WO2021008041A1 (en) | 2021-01-21 |
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