CN110322071B - Random layout method for sampling points of round barn grain surface - Google Patents
Random layout method for sampling points of round barn grain surface Download PDFInfo
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Abstract
The invention relates to a method for randomly arranging sampling points on a round grain surface, which comprises the first step of randomly determining a sampling point coordinate (X) on an X axis 0 ,Y 0 ),X 0 =1+RAND()*[(2R‑1)‑1],Y 0 =0, second step, with (X) 0 ,Y 0 ) The central point of the first square grid with the side length of 2a is expanded to the periphery of the square grid by other square grids with the side length of 2a, and the coordinates (X) of four corners of the square grid i ,Y i,j ) And coordinates of center point of square grid (X) in i ,Y i, j in ) Is the sampling point coordinate. In the first step, the coordinate of the first sampling point is randomly generated through a random function RAND (), advance prediction cannot be carried out, and then other square grids with the side length of 2a are expanded to the periphery of the square grid by taking the point as the central point of the first square grid with the side length of 2a, so that the coordinate values of other corresponding sampling points can be obtained.
Description
Technical Field
The invention relates to a random layout method of sampling points of round bin grain surfaces in the field of grain pile sampling.
Background
Grain storage is a key point influencing the safety of the people and the society, wherein the room type storehouse and the silo are common grain storage storehouses. The sampling is an important link of quality spot check work in grain storage, and sampling of a representative sample is the question of objectively and accurately evaluating grain quality conditions. If the sample picked up by the skewer is not representative and authentic, the detection result loses meaning.
In the prior art, according to corresponding standards, different sampling modes are provided for different bin types, for example, when sampling is performed for round bins with circular cross sections such as shallow round bins, brick round bins and vertical silos, the positions of sampling points given by the existing sampling layout method are relatively fixed and have poor randomness, so that an inherent blind area of the sampling is formed in the bins, the blind area can shield real information of stored grains, the possible approximate positions of the sampling points in the prior art can be presumed for a grain storage party, and the sampling points can be presumed to cause the grain storage party to possibly falsify and deal with sampling work. For example, in the current sampling mode, a grain storage place may use a cylinder with a radius of one meter in an area where a sampling point may appear, the cylinder is filled with grains with better quality, and other areas have no grains or grains with poorer quality, so as to deal with corresponding sampling work, which causes meaningless sampling work and great loss to countries and people.
Disclosure of Invention
The invention aims to provide a random layout method for round granary grain sampling points with unpredictable sampling point positions.
In order to solve the technical problems, the technical scheme of the invention is as follows:
a method for randomly arranging sampling points on the grain surface of a silo comprises the steps of setting the grain storage radius of the silo to be R (meters), establishing a coordinate system by taking a certain position of the silo wall in the silo as a coordinate origin, wherein an axis which starts from the coordinate origin and passes through the center of the silo is an X axis, RAND () is a random function on 0,1,
the method comprises a first step of randomly determining a sampling point coordinate (X) on an X-axis 0 ,Y 0 ),
X 0 =1+RAND()*[(2R-1)-1]
Y 0 =0
Second step with (X) 0 ,Y 0 ) The central point of the first square grid with the side length of 2a is expanded to the periphery of the square grid by other square grids with the side length of 2a, and the coordinates (X) of four corners of the square grid i ,Y i,j ) And coordinates of center point of square grid (X) in i ,Y i, j in ) Is the coordinate of the sampling point, and is the sampling point coordinate,
X i =X 0 +i*a i=±1、±3、…、±2n+1,n∈N;
Y i,j =Y 0 +j*a j=±1、±3、…、±2n+1,n∈N;
(X i +R) 2 +Y i,j 2 ≤(R-1) 2 ;
X in i =X 0 +i*a i=0、±2、…、±2n,n∈N;
Y i, j in =Y 0 +j*a j=0、±2、…、±2n,n∈N;
(X in i +R) 2 +Y i, j in 2 ≤(R-1) 2
N represents a positive integer, and N represents a positive integer,
in the above formula, a = (R-1)/K, and K =1.95 for a silo with a grain storage amount of not more than 2000 tons, and K =2 for a silo with a grain storage amount of more than 2000 tons.
For the round bin with grain storage quantity less than or equal to 2000 tons, the number S of the sampling points is 6-8, and for the round bin with grain storage quantity greater than 2000 tons, the number S of the sampling points is 12-15.
The number of the sampling point coordinates which are generated in the first step and the second step and are positioned in the circular bin is P, if P is larger than or equal to S, S sampling points are selected from the sampling points generated in the first step and the second step; if P < S, obtaining spare sampling points (Xt, yt) with the number of S-P by the following formula
X t =1+RAND()*[(2R-1)-1]
Y t =1+RAND()*[(2R-1)-1]
(X t +R) 2 +Y t 2 ≤(R-1 )2
t=1、2、…、10。
The invention has the beneficial effects that: the invention is characterized in that: in the first step, the coordinate of the first sampling point is randomly generated through a random function RAND (), advance prediction cannot be carried out, then the point is taken as the central point of the square grid with the first side length of 2a, other square grids with the side lengths of 2a are expanded to the periphery of the square grid, the coordinate values of other corresponding sampling points can be obtained, and by utilizing the randomness of the random function, sampling point coordinates cannot be predicted in advance by sampling workers or grain depositors, so that the grain depositors cannot cheat in advance to deal with sampling work, and the sampling work can be guaranteed to be really and effectively carried out.
Drawings
FIG. 1 is a plot of first generated sample points in an embodiment of the invention;
FIG. 2 is a plot of the second generated sampling point in an embodiment of the invention;
FIG. 3 is a plot of the sample points produced a third time in an example of the invention;
fig. 4 is the coordinate values of ten spare skewer points randomly generated for the first time.
Detailed Description
An embodiment of a random layout method of sampling points on the grain surface of a silo is shown in figures 1-3, the grain storage radius of the silo is R (meter), a coordinate system is established by taking a certain position of the silo wall in the silo as a coordinate origin, wherein an axis from the coordinate origin through the center of the silo is an X axis, RAND () is a random function on 0,1,
the method comprises a first step of randomly determining a sampling point coordinate (X) on an X-axis 0 ,Y 0 ),
X 0 =1+RAND()*[(2R-1)-1]
Y 0 =0
Second step with (X) 0 ,Y 0 ) The central point of the first square grid with the side length of 2a is expanded to the periphery of the square grid by other square grids with the side length of 2a, and the coordinates (X) of four corners of the square grid i ,Y i,j ) And coordinates of center point of square grid (X) in i ,Y i, j in ) Is the coordinate of the sampling point, and is the sampling point coordinate,
X i =X 0 +i*a i=±1、±3、…、±2n+1,n∈N;
Y i,j =Y 0 +j*a j=±1、±3、…、±2n+1,n∈N;
(X i +R) 2 +Y i,j 2 ≤(R-1) 2 ;
X in i =X 0 +i*a i=0、±2、…、±2n,n∈N;
Y i, j in =Y 0 +j*a j=0、±2、…、±2n,n∈N;
(X in i +R) 2 +Y i, j in 2 ≤(R-1) 2
N represents a positive integer, and N represents a positive integer,
in the above formula, a = (R-1)/K, and K =1.95 for a silo with a grain storage amount of not more than 2000 tons, and K =2 for a silo with a grain storage amount of more than 2000 tons.
For the round bin with grain storage quantity less than or equal to 2000 tons, the number S of the sampling points is 7, and for the round bin with grain storage quantity greater than 2000 tons, the number S of the sampling points is 13.
The number of the sampling point coordinates which are generated in the first step and the second step and are positioned in the circular bin is P, if P is larger than or equal to S, S sampling points are selected from the sampling points generated in the first step and the second step; if P is less than S, the spare sampling points (Xt, yt) with the number of S-P are obtained by the following formula
X t =1+RAND()*[(2R-1)-1]
Y t =1+RAND()*[(2R-1)-1]
(X t +R) 2 +Y t 2 ≤(R-1) 2
t=1、2、…、10。
In the above formulaSince the radius R of the log bin to be sampled is determined, the stock amount of the log bin to be sampled is also determined, and thus the value K, i.e., the value a, is determined, the first sampling point coordinate (X) is generated using the randomness of the random function RAND () 0 ,Y 0 ) The sampling point coordinate is used as the central point of the first square grid, other square grids are extended to the periphery of the square grids, the sampling point coordinate is formed by the four corner coordinates and the central point coordinate of each square grid, when the sampling device is used, a CPU burnt with the program or calculation software programmed with the program can be used, such as an excel table, only the radius of a circular bin is required to be input on site, so that a group of sampling point coordinates can be obtained, different times of input can obtain different sampling point coordinates even if the same circular bin radius value is input, therefore, only after a sampling worker obtains the sampling point coordinates on site, the grain depositor knows which beam surfaces of the points need to be subjected to sampling inspection, even if the grain depositor takes the program in advance, the sampling point generating coordinates are different each time, the sampling point generating coordinates almost cover the whole beam surfaces possibly, the sampling point generating coordinates cannot be different in advance, the sampling range can not be cheated in advance, and even if the sampling worker takes the sampling point generating coordinates in advance, the sampling point generating coordinates are different in advance, the sampling point generating coordinates are almost different, the whole beam surfaces can be covered with the result that the sampling point generating coordinates can be subjected to sampling range can be subjected to sampling, and the sampling structure can be guessed, and the significance of random sampling point can be ensured. The coordinate value unit of the sampling point in the invention is meter.
Taking the grain bin with the radius of 20 meters as an example, the sampling coordinates generated for the first time are shown in figure 1, wherein the item 1 represents a round bin, and the item 2 represents (X) 0 ,Y 0 ) A first square grid (the square is not true and is not true) generated for the center, and other square grids are expanded to the periphery by taking the first square grid 2 as the center, wherein the other square grids can be called as a peripheral square grid 3, and the coordinates (X) of the four corners of the peripheral square grid i ,Y i,j ) And center coordinate (X) in i ,Y i, j in ) That is, other sampling point coordinates, as can be seen from fig. 3, only 8 valid sampling points actually falling into the cylindrical bin are available, and therefore pass through X t =1+RAND()*[(2R-1)-1]
Y t =1+RAND()*[(2R-1)-1]Ten spare random sampling points can be randomly generated, 5 sampling point coordinates can be arbitrarily taken from the ten spare random sampling points, and 13 sampling points can be formed by the 8 sampling point coordinates. The randomly generated ten spare random sample point coordinates are shown in fig. 4, and the spare sample point coordinate values in fig. 4 are in meters.
The second time the radius is 20 meters, the generated sampling coordinates are as shown in fig. 2: eight effective sampling point coordinates are generated in the circular bin, and five standby sampling points (X) are generated t ,Y t )。
When the radius is input for the third time to 20 meters, a new set of coordinate values is generated as shown in fig. 3: through the calculation formula of the first step and the second step, only four effective sampling points fall into the circular bin, and 9 spare sampling point coordinates need to be generated at the moment. In other embodiments of the invention: the number S of the sampling points can be 6 or 8 for the round bin with the grain storage amount less than or equal to 2000 tons, and the number S of the sampling points is 12 or 15 for the round bin with the grain storage amount more than 2000 tons.
Claims (3)
1. A method for randomly arranging sampling points of round grain flour is characterized by comprising the following steps: the grain storage radius of the silo is R (meter), a coordinate system is established by taking a certain position of the silo wall in the silo as a coordinate origin, wherein an axis from the coordinate origin to the center of the silo is an X axis, RAND () is a random function on [0,1],
the method comprises a first step of randomly determining a sampling point coordinate (X) on an X-axis 0 ,Y 0 ),
X 0 =1+RAND()*[(2R-1)-1]
Y 0 =0
Second step with (X) 0 ,Y 0 ) The central point of the first square grid with the side length of 2a is extended to the periphery of the square grid, other square grids with the side length of 2a are extended, and the coordinates (X) of the four corners of the square grid i ,Y i,j ) And coordinates of the center point of the square grid (X) in i ,Y i, j in ) Is the coordinate of the sampling point, and is the sampling point coordinate,
X i =X 0 +i*a i=±1、±3、…、±2n+1,n∈N;
Y i,j =Y 0 +j*a j=±1、±3、…、±2n+1,n∈N;
(X i +R) 2 +Y i,j 2 ≤(R-1) 2 ;
X in i =X 0 +i*a i=0、±2、…、±2n,n∈N;
Y i, j in =Y 0 +j*a j=0、±2、…、±2n,n∈N;
(X in i +R) 2 +Y in i, j are 2 ≤(R-1) 2
N represents a positive integer, and N represents a positive integer,
in the above formula, a = (R-1)/K, K =1.95 for a silo with grain storage amount less than or equal to 2000 tons, and K =2 for a silo with grain storage amount greater than 2000 tons.
2. The method of random placement of silo-grain sampling points of claim 1 wherein: for the round bin with grain storage quantity less than or equal to 2000 tons, the number S of the sampling points is 6-8, and for the round bin with grain storage quantity greater than 2000 tons, the number S of the sampling points is 12-15.
3. The method of random placement of silo-grain sampling points of claim 2 wherein: the number of the sampling point coordinates which are generated in the first step and the second step and are positioned in the circular bin is P, if P is larger than or equal to S, S sampling points are selected from the sampling points generated in the first step and the second step; if P < S, obtaining S-P number of spare sampling points (X) by the following formula t ,Y t )
X t =1+RAND()*[(2R-1)-1]
Y t =1+RAND()*[(2R-1)-1]
(X t +R) 2 +Y t 2 ≤(R-1) 2
t=1、2、…、10。
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