CN110287194A - A kind of Material Physics data sorting system based on computer big data - Google Patents
A kind of Material Physics data sorting system based on computer big data Download PDFInfo
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- CN110287194A CN110287194A CN201910572270.2A CN201910572270A CN110287194A CN 110287194 A CN110287194 A CN 110287194A CN 201910572270 A CN201910572270 A CN 201910572270A CN 110287194 A CN110287194 A CN 110287194A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F16/00—Information retrieval; Database structures therefor; File system structures therefor
- G06F16/20—Information retrieval; Database structures therefor; File system structures therefor of structured data, e.g. relational data
- G06F16/22—Indexing; Data structures therefor; Storage structures
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F16/00—Information retrieval; Database structures therefor; File system structures therefor
- G06F16/20—Information retrieval; Database structures therefor; File system structures therefor of structured data, e.g. relational data
- G06F16/28—Databases characterised by their database models, e.g. relational or object models
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Abstract
The present invention relates to Material Physics data classification technology fields, and disclose a kind of Material Physics data sorting system based on computer big data, including central processing unit, the input terminal of the central processing unit is electrically connected the output end of information acquisition unit and information feedback unit, the output end of the central processing unit is electrically connected Data Computation Unit, removing module, data classification storage unit and the input terminal for identifying judging unit, and the output end of the Data Computation Unit is electrically connected with data statistics unit.The present invention is by utilizing first information data acquisition module, the second information data acquisition module, third information data acquisition module and the 4th information data acquisition module in information acquisition unit, acquire the material data in every field, data are calculated by central processing unit, are compared after collecting, identify judgement after carry out classification storage again, to simplify the program of Material Physics data classification, improve work efficiency.
Description
Technical field
The present invention relates to Material Physics sorting technique field, specially a kind of Material Physics number based on computer big data
According to categorizing system.
Background technique
The characteristic direction of Material Physics is in Condensed Matter Physics, Semiconductor Physics, electronic material, the fields such as microelectronic component.
It is more demanding to mathematics, the physical basis of student.Training student utilizes the knowledge of physics and material science emphatically, is engaged in basis
Theoretical research or Development of Novel electronic material and microelectronic component technique, the application power and innovation in the directions such as analysis and design
Ability.In computer big data era, how efficiently to handle the data collected and is to improve the essential condition of working efficiency, by
It is more in Material Physics type, therefore data classification program very complicated, raising working efficiency is not utilized.
Summary of the invention
The object of the present invention is to provide a kind of Material Physics data sorting systems based on computer big data, reach
Simplify data classification program, improves the purpose of working efficiency.
To achieve the above object, the invention provides the following technical scheme: a kind of Material Physics based on computer big data
Data sorting system, including central processing unit, the input terminal of the central processing unit be electrically connected information acquisition unit and
The output end of information feedback unit, the output end of the central processing unit be electrically connected Data Computation Unit, removing module,
The input terminal of data classification storage unit and identification judging unit, the output end of the Data Computation Unit are electrically connected with data system
The output end of meter unit, the data statistics unit and identification judging unit is electrically connected with the input terminal of information feedback unit,
The output end of the data classification storage unit is electrically connected with data analysis unit.
Preferably, the information acquisition unit include first information data acquisition module, the second information data acquisition module,
Third information data acquisition module and the 4th information data acquisition module, the first information data acquisition module, the second information
Data acquisition module, third information data acquisition module and the 4th information data acquisition module can connect with the sensor in equipment
It connects.
Preferably, the Data Computation Unit includes data computation module one, data computation module two, data computation module
Three and data computation module four, the data statistics unit include data statistics module one, data statistics module two, data statistics
Module three, data statistics module four, the data computation module one, data computation module two, data computation module three and data
Computing module four respectively with data statistics module one, data statistics module two, data statistics module three and data statistics module four
It corresponds.
Preferably, the identification judging unit includes condensed state material data identification module, the identification of semiconductor material data
Module, electronic material data identification module, microelectronic material data identification module and other materials data identification module, it is described to delete
Except module is corresponding with other materials data identification module.
Preferably, the data classification storage unit includes condensed state material data memory module, semiconductor material data
Memory module, electronic material data memory module and microelectronic element material data memory module.
Preferably, the data analysis unit includes condensed state material data analysis module, the analysis of semiconductor material data
Module, electronic material data analysis module and microelectronic element material data analysis module, the condensed state material data analysis
Module, semiconductor material data analysis module, electronic material data analysis module and microelectronic element material data analysis module
Respectively with condensed state material data memory module, semiconductor material data memory module, electronic material data memory module and micro-
Materials of electronic components data memory module corresponds.
The present invention provides a kind of Material Physics data sorting systems based on computer big data.Have following beneficial to effect
Fruit:
(1), the present invention using the first information data acquisition module in information acquisition unit, the second information data by being adopted
Collect module, third information data acquisition module and the 4th information data acquisition module, acquire the material data in every field, converges
Data are calculated by central processing unit, are compared after collection, identify judgement after carry out classification storage again, to simplify material
The program of physical data classification, improves work efficiency.
(2), undesirable data are deleted by removing module, leave common condensed state material by the present invention
Expect data, semiconductor material data block, electronic material data, microelectronic element material data, improves the accurate of classification work
Property.
(3), the present invention utilizes condensed state material data analysis module, the semiconductor material data point in data analysis unit
Module, electronic material data analysis module and microelectronic element material data analysis module are analysed to the condensed state material number after storage
According to, semiconductor material data, electronic material data, microelectronic element material data analyzed and researched again, in order to next time
Classification and be applied in production and living and work, to contribute for expanding economy.
Detailed description of the invention
Fig. 1 is present system block diagram.
In figure: 1 central processing unit, 2 information acquisition units, 21, first information data acquisition module, 22 second information datas
Acquisition module, 23 third information data acquisition modules, 24 the 4th information data acquisition modules, 3 information feedback units, 4 data meters
Calculate unit, 41 data computation modules one, 42 data computation modules two, 43 data computation modules three, 44 data computation modules four, 5
Removing module, 6 data classification storage units, 61 condensed state material data memory modules, 62 semiconductor material data memory modules,
63 electronic material data memory modules, 64 microelectronic element material data memory modules, 7 identification judging units, 71 condensed state materials
Expect data identification module, 72 semiconductor material data identification modules, 73 electronic material data identification modules, 74 microelectronic material numbers
According to identification module, 75 other materials data identification modules, 8 data statistics units, 81 data statistics modules one, 82 data statistics moulds
Block two, 83 data statistics modules three, 84 data statistics modules four, 9 data analysis units, 91 condensed state material datas analyze mould
Block, 92 semiconductor material data analysis modules, 93 electronic material data analysis modules, 94 microelectronic element material datas analyze mould
Block.
Specific embodiment
As shown in Figure 1, the present invention provides a kind of technical solution: a kind of Material Physics data based on computer big data point
Class system, including central processing unit 1, the input terminal of central processing unit 1 have been electrically connected information acquisition unit 2 and information feedback
The output end of unit 3, the output end of central processing unit 1 have been electrically connected Data Computation Unit 4, removing module 5, data classification
The input terminal of storage unit 6 and identification judging unit 7, the output end of Data Computation Unit 4 are electrically connected with data statistics unit 8,
The output end of data statistics unit 8 and identification judging unit 7 is electrically connected with the input terminal of information feedback unit 3, data classification
The output end of storage unit 6 is electrically connected with data analysis unit 9, and information acquisition unit 2 includes first information data acquisition module
21, the second information data acquisition module 22, third information data acquisition module 23 and the 4th information data acquisition module 24, first
Information data acquisition module 21, the second information data acquisition module 22, third information data acquisition module 23 and the 4th Information Number
It can be connect with the sensor in equipment according to acquisition module 24, Data Computation Unit 4 includes data computation module 1, data meter
Module 2 42, data computation module 3 43 and data computation module 4 44 are calculated, data statistics unit 8 includes data statistics module one
81, data statistics module 2 82, data statistics module 3 83, data statistics module 4 84, data computation module 1, data meter
Calculate module 2 42, data computation module 3 43 and data computation module 4 44 respectively with data statistics module 1, data statistics
Module 2 82, data statistics module 3 83 and data statistics module 4 84 correspond, and identification judging unit 7 includes condensed state material
Expect data identification module 71, semiconductor material data identification module 72, electronic material data identification module 73, microelectronic material number
According to identification module 74 and other materials data identification module 75, removing module 5 is corresponding with other materials data identification module 75, number
It include condensed state material data memory module 61, semiconductor material data memory module 62, electronic material according to classification storage unit 6
Data memory module 63 and microelectronic element material data memory module 64, data analysis unit 9 include condensed state material data
Analysis module 91, semiconductor material data analysis module 92, electronic material data analysis module 93 and microelectronic element material number
According to analysis module 94, condensed state material data analysis module 91, semiconductor material data analysis module 92, electronic material data point
Analyse module 93 and microelectronic element material data analysis module 94 respectively with condensed state material data memory module 61, semiconductor material
Expect that data memory module 62, electronic material data memory module 63 and microelectronic element material data memory module 64 1 are a pair of
It answers.
When in use, first information data acquisition module 21, the second information data acquisition module 22, third information data are adopted
Collect module 23, the 4th information data acquisition module 24 by the material data of sensor collection every field, is then transferred to
Central processor 1, central processing unit 1 utilize the data computation module 1 in Data Computation Unit, data computation module 2 42, number
It is calculated according to the data that computing module 3 43,4 44 pairs of data computation module acquisitions come, is then transferred to data statistics unit
8, data statistics module 1, data statistics module 2 82, data statistics module 3 83,4 84 pairs of data statistics module calculating
As a result statistics integration is carried out, the result of comparison is finally transferred to central processing unit 1, central processing unit 1 by information feedback unit 3
Identification judging unit 7 is recycled, existing database is cooperated, the calculated result come to integration is compared, to distinguish solidifying
Poly- state material data, semiconductor material data, electronic material data, microelectronic element material data, are finally fed back by information again
Unit 3 passes the data of identification back central processing unit 1, and central processing unit 1 recycles data classification storage unit 6 by all data
Classification storage is carried out, last 9 pairs of data classified of data analysis unit again are analyzed again, convenient for preferably using production life
In work, in addition, the application only selects four kinds of materials as an example, which is also applied for other physical materials.
Can to sum up obtain, (1), the present invention by using in information acquisition unit 2 first information data acquisition module 21, the
Two information data acquisition modules 22, third information data acquisition module 23 and the 4th information data acquisition module 24 acquire each
Material data in field, data are calculated by central processing unit 1, are compared after collecting, identify judgement after divide again
Class storage, to simplify the program of Material Physics data classification, improves work efficiency.
(2), undesirable data are deleted by removing module 5, leave common condensed state material by the present invention
Expect data, semiconductor material data block, electronic material data, microelectronic element material data, improves the accurate of classification work
Property.
(3), the present invention utilizes the condensed state material data analysis module 91 in data analysis unit 9, semiconductor material number
According to solidifying after analysis module 92, electronic material data analysis module 93 and 94 pairs of microelectronic element material data analysis module storages
Poly- state material data, semiconductor material data, electronic material data, microelectronic element material data are analyzed and researched again, with
It convenient for classification next time and is applied in production and living and work, to be contributed for expanding economy.
It although an embodiment of the present invention has been shown and described, for the ordinary skill in the art, can be with
A variety of variations, modification, replacement can be carried out to these embodiments without departing from the principles and spirit of the present invention by understanding
And modification, the scope of the present invention is defined by the appended.
Claims (6)
1. a kind of Material Physics data sorting system based on computer big data, including central processing unit (1), feature exists
The defeated of information acquisition unit (2) and information feedback unit (3) is electrically connected in: the input terminal of the central processing unit (1)
Outlet, the output end of the central processing unit (1) have been electrically connected Data Computation Unit (4), removing module (5), data point
Class storage unit (6) and the input terminal for identifying judging unit (7), the output end of the Data Computation Unit (4) are electrically connected with number
Unit (8) according to statistics, the data statistics unit (8) and identify judging unit (7) output end with information feedback unit (3)
Input terminal electrical connection, the output end of the data classification storage unit (6) is electrically connected with data analysis unit (9).
2. a kind of Material Physics data sorting system based on computer big data according to claim 1, feature exist
In: the information acquisition unit (2) include first information data acquisition module (21), the second information data acquisition module (22),
Third information data acquisition module (23) and the 4th information data acquisition module (24), the first information data acquisition module
(21), the second information data acquisition module (22), third information data acquisition module (23) and the 4th information data acquisition module
(24) it can be connect with the sensor in equipment.
3. a kind of Material Physics data sorting system based on computer big data according to claim 1, feature exist
In: the Data Computation Unit (4) includes data computation module one (41), data computation module two (42), data computation module
Three (43) and data computation module four (44), the data statistics unit (8) includes data statistics module one (81), data statistics
Module two (82), data statistics module three (83), data statistics module four (84), the data computation module one (41), data
Computing module two (42), data computation module three (43) and data computation module four (44) respectively with data statistics module one
(81), data statistics module two (82), data statistics module three (83) and data statistics module four (84) correspond.
4. a kind of Material Physics data sorting system based on computer big data according to claim 1, feature exist
In: the identification judging unit (7) includes condensed state material data identification module (71), semiconductor material data identification module
(72), electronic material data identification module (73), microelectronic material data identification module (74) and other materials data identify mould
Block (75), the removing module (5) are corresponding with other materials data identification module (75).
5. a kind of Material Physics data sorting system based on computer big data according to claim 1, feature exist
In: the data classification storage unit (6) includes condensed state material data memory module (61), semiconductor material data storage mould
Block (62), electronic material data memory module (63) and microelectronic element material data memory module (64).
6. a kind of Material Physics data sorting system based on computer big data according to claim 5, feature exist
In: the data analysis unit (9) includes condensed state material data analysis module (91), semiconductor material data analysis module
(92), electronic material data analysis module (93) and microelectronic element material data analysis module (94), the condensed state material
Data analysis module (91), semiconductor material data analysis module (92), electronic material data analysis module (93) and microelectronics
Element material data analysis module (94) stores mould with condensed state material data memory module (61), semiconductor material data respectively
Block (62), electronic material data memory module (63) and microelectronic element material data memory module (64) correspond.
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN115270992A (en) * | 2022-08-19 | 2022-11-01 | 牡丹江师范学院 | Novel material physical data classification method and system |
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CN115270992A (en) * | 2022-08-19 | 2022-11-01 | 牡丹江师范学院 | Novel material physical data classification method and system |
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