CN110286505B - Automatic pin searching method and system applied to AOI (automated optical inspection) test of LCD (liquid Crystal display) white glass - Google Patents
Automatic pin searching method and system applied to AOI (automated optical inspection) test of LCD (liquid Crystal display) white glass Download PDFInfo
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- CN110286505B CN110286505B CN201910517211.5A CN201910517211A CN110286505B CN 110286505 B CN110286505 B CN 110286505B CN 201910517211 A CN201910517211 A CN 201910517211A CN 110286505 B CN110286505 B CN 110286505B
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
Abstract
The invention provides an automatic pin position searching method and system applied to AOI (automated optical inspection) of LCD (liquid crystal display) white glass, comprising the following steps of: the power supply module is connected with a COM pin and an SEG pin of the LCD white glass; respectively supplying power to each pin to generate a plurality of patterns, shooting and recording all the patterns and associating the patterns with corresponding pin positions; selecting an image to compare with all the other images one by one, and dividing the image into two types according to the comparison result; the COM pin and the SEG pin are distinguished according to the two types of images. The automatic identification method can realize automatic search and correct judgment of COM pins and SEG pins of the LCD white glass, and solves the defects of low efficiency and excessive use of clamps and difficult management in the manual connection judgment process.
Description
Technical Field
The invention relates to the field of LCD detection equipment, in particular to an automatic pin position searching method and system applied to AOI (automated optical inspection) of LCD white glass.
Background
The LCD white glass is a component for displaying in electronic equipment, and comprises a glass screen for displaying and pins for connecting, wherein the pins consist of COM pins and SEG pins.
In order to distinguish correct COM pins and SEG pins, the conventional LCD white glass needs to be manually connected one by one due to a plurality of pins on the LCD white glass, and then different pins are detected and distinguished. The number of the clamps used in the way is large, maintenance and management are needed, and the measuring efficiency of workers is low.
Accordingly, the prior art is yet to be improved and developed.
Disclosure of Invention
The technical problem to be solved by the present invention is to provide an automatic pin position searching method and system applied to AOI testing of LCD white glass, which can realize automatic searching and correct judgment of COM pins and SEG pins of LCD white glass, and solve the defects of low efficiency, excessive use of clamps and difficult management in the manual connection judgment process.
The technical scheme adopted by the invention for solving the technical problem is as follows:
an automatic pin searching method applied to an AOI test of LCD white glass comprises the following steps:
the power supply module is connected with a COM pin and an SEG pin of the LCD white glass;
respectively supplying power to each pin to generate a plurality of patterns on the LCD white glass, and shooting and recording the patterns into images associated with the corresponding pin positions;
selecting an image to compare with all the other images one by one, and dividing the image into two types according to the comparison result;
the COM pin and the SEG pin are distinguished according to the two types of images.
Further, before the step of selecting one image to compare with all the other images one by one and dividing the images into two types according to the comparison result, the method further comprises the following steps:
analyzing the image and judging an invalid image according to the image;
and judging an invalid pin according to the invalid image and marking the invalid pin.
Further, the specific steps of selecting one image to compare with all the other images one by one and dividing the images into two types according to the comparison result are as follows:
selecting one image to be compared with the rest images one by one;
judging whether the two compared images have intersection, if so, judging that the compared image and the selected image are the first type of image, and if not, judging that the compared image and the selected image are the second type of image;
and carrying out set classification on the two types of images.
Further, after the step of selecting one image to compare with all the other images one by one and dividing the images into two types according to the comparison result, the method further comprises the following steps:
and (3) parallelly electrifying the pins corresponding to the first type of image to generate a pattern, and shooting the pattern to generate a combined image.
And comparing the images in the second type of image with the combined image in sequence.
If the image in the second type of image is intersected with the merged image, the image is determined to be the first type of image, and if the image in the second type of image is not intersected with the merged image, the image is determined to be the second type of image.
Further, the specific steps of distinguishing the COM pin and the SEG pin according to the two types of images are as follows:
respectively counting the number of the first type images and the number of the second type images;
and judging that the pins corresponding to the image types with large quantity are SEG pins, and the pins corresponding to the image types with small quantity are COM pins.
An automatic pin position searching system applied to AOI (automated optical inspection) of LCD white glass, comprising:
the power supply module is used for connecting a COM pin and an SEG pin of the LCD white glass, and each pin supplies power to enable the LCD white glass to generate various patterns;
a primary photographing module for photographing and recording a pattern as an image associated with a corresponding pin position;
the comparison classification module is used for selecting one image to be compared with the rest images one by one, and dividing the images into two types according to the comparison result;
and the pin position judging module is used for distinguishing the COM pin and the SEG pin according to the two types of images.
And further, the system comprises an invalid pin judging module, wherein the invalid pin judging module is used for analyzing the image and judging an invalid pin position according to the image.
Further, the contrast classification module comprises:
the comparison unit is used for selecting one image to compare with all the other images one by one;
the judging unit is used for judging whether the two compared images have an intersection or not, judging that the compared image and the selected image are the first type of image if the compared image and the selected image have the intersection, and judging that the compared image and the selected image are the second type of image if the compared image and the selected image do not have the intersection;
and the classification unit is used for carrying out set classification on the two types of images.
Further, still including the inspection module, the inspection module is used for verifying whether categorised image is omitted, the inspection module is including:
the inspection image unit is used for electrifying the pins corresponding to the first type of images in parallel to generate patterns, and shooting the patterns to generate combined images;
the inspection and comparison unit is used for sequentially comparing the images in the second type of images with the combined image;
and the checking and judging unit determines that the image is the first type image if the image in the second type image is intersected with the merged image, and determines that the image is the second type image if the image in the second type image is not intersected with the merged image.
Further, the pin position judging module comprises:
the image counting unit is used for respectively counting the number of the first type images and the number of the second type images;
and the pin position judging unit is used for judging that the pins corresponding to the image types with a large number are SEG pins and the pins corresponding to the image types with a small number are COM pins.
The beneficial effect who adopts above-mentioned scheme is: the invention provides a method and a system for automatically searching pins for an AOI (automated optical inspection) test of LCD (liquid crystal display) white glass. And the problem that more clamps are needed due to different specifications of the LCD white glass is solved, so that the storage space is not wasted, the maintenance and management cost is not wasted, and the problem that the measurement efficiency of workers is low is solved.
Drawings
FIG. 1 is a schematic flow chart of an embodiment of the automatic pin position searching method applied to AOI testing of white LCD glass according to the present invention.
FIG. 2 is a flow chart of the preferred embodiment of the method for automatically searching pins for LCD white glass AOI test according to the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer and clearer, the present invention is further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
As shown in fig. 1 and fig. 2, the present invention provides an automatic pin position searching method and system for LCD white glass AOI test, comprising the following steps:
and S100, connecting a power supply module with a COM pin and an SEG pin of the LCD white glass.
In the step of this implementation, the LCD white glass is powered by the power supply module, and the LCD white glass has two types of pins, namely a COM pin and an SEG pin, wherein the two types of pins can be powered on to display different images on the display screen; the SEG pins are understood as column image channels, i.e. a column of images is displayed on the LCD white glass after the SEG pins are energized, so that there is an intersection between the images displayed respectively for the COM pin and the SEG pin. Before the detection, the LCD white glass is firstly powered, so that normal test can be carried out, specifically, each pin is independently connected through a wire and respectively powered, and thus the pin position can be judged one by one according to which form.
And step S200, respectively supplying power to each pin to generate a plurality of patterns on the LCD white glass, and shooting and recording the patterns into images associated with the corresponding pin positions.
Specifically, the two types of pins of the LCD white glass are judged through image comparison, each pin of the LCD white glass is respectively electrified, a pattern is displayed on the LCD white glass after each pin is electrified, the pattern is recorded through photographing, and the photographed image of the pattern generated by the electrified pins is associated with the pins, so that the pins can be conveniently found through the image.
In order to improve the accuracy of the determination, steps S300 and S400 are further included after step S200:
and step S300, analyzing the image and judging an invalid image according to the image.
And step S400, judging invalid pins according to the invalid image and marking the invalid pins.
In the specific process, as some pins of the LCD white glass may be useless pins, namely the number of the pins is standard, but the LCD white glass may not use all the pins according to different models, the pins can be distinguished and marked firstly so as to remove invalid pins later, thus the judgment is more accurate.
After the invalid pin is electrified, no image is generated, so that after the picture is taken, if no image exists in the picture, the pin corresponding to the image is judged to be the invalid pin. The system marks the invalid foot.
And S500, selecting one image to be compared with all the other images one by one, and dividing the images into two types according to the comparison result.
In the specific implementation process, one image is selected to be compared with all the other images one by one, and the compared images can be divided into two types, wherein the two types of images correspond to two pins of the LCD white glass.
The specific step S500 includes the following steps:
step S510, selecting one image to compare with all the other images.
Step S520, judging whether the two compared images have an intersection, if so, judging that the compared image and the selected image are the first type of image, and if not, judging that the compared image and the selected image are the second type of image;
and step S530, carrying out set classification on the two types of images.
In the specific implementation process, any one image is selected, if the selected image is an image generated after the COM pins are electrified, a transverse image is displayed in the image, the image is compared with all the other images one by one, and if the images generated after the other pins are electrified, no intersection exists between the selected image and the compared image, the image corresponding to the compared image is judged to be also the COM pins; and when the images generated after the other pins are electrified generate intersection between the selected image and the comparison image, judging that the comparison image corresponds to the SEG pin, so that the images are divided into two types, namely a first type image with intersection and a second type image without intersection, and after the images are subjected to collection classification, judging that the first type image corresponds to the first type pin and the second type image corresponds to the second type pin.
In order to make the judgment accurate, the image without patterns can be removed, namely, the invalid pin is removed, and then the steps S510-S530 are carried out, so that the inspection process is optimized.
To make the determination more accurate, a detection process may be added after step S500. The detection process comprises the following specific steps:
and S540, conducting parallel connection and electrification on pins corresponding to the first type of images to generate patterns, and shooting the patterns to generate combined images.
And S550, comparing the images in the second type of images with the combined image in sequence.
And S560, if the image in the second type of image is intersected with the merged image, the image is determined to be the first type of image, and if the image in the second type of image is not intersected with the merged image, the image is determined to be the second type of image.
In a specific implementation process, in order to make the judgment more accurate, pins corresponding to one type of image are connected in parallel and then uniformly powered on, the combined pins are preferably the pins corresponding to the first type of image, the LCD white glass generates a combined pattern after the power on, the combined pattern is photographed to obtain a combined image, images in the other type of image are sequentially compared with the combined image, the pins corresponding to the other type of image are preferably the pins corresponding to the second type of image, if the images in the second type of image are intersected with the combined image, the images are determined to be the first type of image, and if the images in the second type of image are not intersected with the combined image, the images are determined to be the second type of image. Therefore, the tested image is checked, and omission or misjudgment is avoided.
And S600, distinguishing a COM pin and an SEG pin according to the two types of images.
Specifically, the associated corresponding feet are found according to the two types of images, and the two types of images respectively correspond to the two types of feet, namely the COM foot and the SEG foot.
Step S600 in this embodiment specifically includes the following steps:
step S610, respectively counting the number of the first type images and the number of the second type images;
step S620 determines that the pins corresponding to the image categories with the large number are SEG pins, and the pins corresponding to the image categories with the small number are COM pins.
In the specific implementation process, the common specification of the LCD white glass is that more COM pins and less SEG pins exist, so that which type of pins belongs to can be judged according to the number of the two types of pins.
Generally, the number of the first-type images and the second-type images is compared, and finally, the image generated after the COM pin is powered on with a small number is determined, and the image generated after the SEG pin is powered on with a large number is determined. When the number of the two types of images is as large, the definition is random. The user can also determine that the image of one type with a large number is the image generated by the COM foot and the image of one type with a small number is the image generated by the SEC foot according to the requirement.
The invention also provides an automatic pin position searching system applied to the AOI test of the LCD white glass, which comprises the following components: the device comprises a power supply module, a primary shooting module, a comparison and classification module and a pin position judgment module; the power supply module is used for connecting a COM pin and an SEG pin of the LCD white glass and respectively supplying power to each pin to enable the LCD white glass to generate various patterns; the primary shooting module is used for shooting and recording the pattern into an image associated with the corresponding pin position; the contrast classification module is used for selecting one image to be contrasted with all the other images one by one, and dividing the images into two types according to the contrast result; the pin position judging module is used for distinguishing a COM pin and an SEG pin according to the two types of images.
In order to accurately judge the pin positions, the automatic pin position searching system further comprises an invalid pin judging module, and the invalid pin judging module is used for analyzing the images and judging the invalid pin positions according to the images.
The comparison and classification module comprises a comparison unit, a judgment unit and a classification unit; the comparison unit is used for selecting one image to compare with all the other images one by one; the judging unit is used for judging whether the two compared images have an intersection or not, judging that the compared image and the selected image are the first type of image if the compared image and the selected image have the intersection, and judging that the compared image and the selected image are the second type of image if the compared image and the selected image do not have the intersection; the classification unit performs set classification on the two types of images.
The system in the embodiment further comprises a checking module, wherein the checking module is used for verifying whether the classified images are omitted or not, and comprises a checking image unit, a checking comparison unit and a checking judgment unit, wherein the checking image unit is used for carrying out parallel connection and electrification on pins corresponding to the first type of images to generate patterns, and shooting the patterns to generate combined images; the inspection and comparison unit is used for sequentially comparing the images in the second type of images with the merged image; the inspection judging unit is used for determining that the image is the first type image if the image in the second type image is intersected with the merged image, and determining that the image is the second type image if the image in the second type image is not intersected with the merged image.
The pin position judging module in the embodiment specifically comprises an image counting unit and a pin position judging unit; the image counting unit is used for respectively counting the number of the first type images and the number of the second type images; the pin position judging unit is used for judging that the pin positions corresponding to the image types with large quantity are SEG pins, and the pin positions corresponding to the image types with small quantity are COM pins.
In summary, the invention provides an automatic pin position searching method and system applied to an AOI test of LCD white glass, which are used for photographing patterns generated after pins are respectively electrified to generate images, and dividing the images into a first type of image and a second type of image through image comparison, so that the pins of the LCD glass are automatically divided into COM pins and SEG pins according to the two types of images, and thus, the pins are not required to be detected and judged manually. And the problem that more clamps are needed due to different specifications of the LCD white glass is solved, so that the storage space is not wasted, the maintenance and management cost is not wasted, and the problem that the measurement efficiency of workers is low is solved.
It is to be understood that the invention is not limited to the examples described above, but that modifications and variations may be effected thereto by those of ordinary skill in the art in light of the foregoing description, and that all such modifications and variations are intended to be within the scope of the invention as defined by the appended claims.
Claims (6)
1. An automatic pin position searching method applied to an AOI test of LCD white glass is characterized by comprising the following steps:
the power supply module is connected with a COM pin and an SEG pin of the LCD white glass;
respectively supplying power to each pin to generate a plurality of patterns on the LCD white glass, and shooting and recording the patterns into images associated with the corresponding pin positions;
selecting an image to compare with all the other images one by one, and dividing the image into two types according to the comparison result;
distinguishing a COM pin and an SEG pin according to the two types of images;
the specific steps of selecting one image to compare with all the other images one by one and dividing the images into two types according to the comparison result are as follows:
selecting one image to be compared with the rest images one by one;
judging whether the two compared images have intersection, if so, judging that the compared image is a first type image, and if not, judging that the compared image is a second type image;
carrying out set classification on the two types of images;
the specific steps of distinguishing the COM pin and the SEG pin according to the two types of images are as follows:
respectively counting the number of the first type images and the number of the second type images;
and judging that the pins corresponding to the image types with large quantity are SEG pins, and the pins corresponding to the image types with small quantity are COM pins.
2. The automatic pin position searching method applied to AOI test of white glass of LCD according to claim 1, wherein the method comprises the following steps: before the step of selecting one image to compare with all the other images one by one and dividing the images into two types according to the comparison result, the method also comprises the following steps:
analyzing the image and judging an invalid image according to the image;
and judging an invalid pin according to the invalid image and marking the invalid pin.
3. The automatic pin position searching method applied to AOI test of white glass of LCD according to claim 1, wherein the method comprises the following steps: after the step of selecting one image to compare with all the other images one by one and dividing the images into two types according to the comparison result, the method also comprises the following steps:
pins corresponding to the first type of images are electrified in parallel to generate patterns, and the patterns are shot to generate combined images;
comparing the images in the second type of images with the combined image in sequence;
and if the images in the second type of images and the merged images have no intersection, the images are determined to be the second type of images.
4. An automatic pin position searching system applied to AOI (automated optical inspection) of LCD (liquid crystal display) white glass is characterized by comprising:
the power supply module is used for connecting a COM pin and an SEG pin of the LCD white glass and supplying power to each pin to generate various patterns on the LCD white glass;
a primary photographing module for photographing and recording a pattern as an image associated with a corresponding pin position;
the comparison classification module is used for selecting one image to be compared with the rest images one by one, and dividing the images into two types according to the comparison result;
the pin position judging module is used for distinguishing a COM pin and an SEG pin according to the two types of images;
the contrast classification module comprises:
the comparison unit is used for selecting one image to compare with all the other images one by one;
the judging unit is used for judging whether the two compared images have an intersection or not, judging that the compared image is a first-class image if the compared image has the intersection with the selected image, and judging that the compared image is a second-class image if the compared image does not have the intersection with the selected image;
the classification unit is used for carrying out set classification on the two types of images;
the pin position judging module comprises:
the image counting unit is used for respectively counting the number of the first type images and the number of the second type images;
and the pin position judging unit is used for judging that the pins corresponding to the image types with a large number are SEG pins and the pins corresponding to the image types with a small number are COM pins.
5. The automatic pin position searching system applied to the AOI test of the white glass of the LCD according to claim 4, further comprising an invalid pin judging module, wherein the invalid pin judging module is used for analyzing the image and judging an invalid pin position according to the image.
6. The automatic pin position searching system for LCD white glass AOI test as claimed in claim 4, further comprising:
a verification module for verifying whether the classified images are missing, said verification module comprising:
the inspection image unit is used for electrifying the pins corresponding to the first type of images in parallel to generate patterns, and shooting the patterns to generate combined images;
the inspection and comparison unit is used for sequentially comparing the images in the second type of images with the combined image;
and the checking and judging unit determines that the image is the second type image if the image in the second type image is intersected with the merged image, and determines that the image is the first type image if the image in the second type image is not intersected with the merged image.
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6008593A (en) * | 1997-02-12 | 1999-12-28 | International Rectifier Corporation | Closed-loop/dimming ballast controller integrated circuits |
| CN1412570A (en) * | 2001-10-17 | 2003-04-23 | 胜华科技股份有限公司 | CGROM detection device and method |
| CN2679786Y (en) * | 2004-01-13 | 2005-02-16 | 烟台荣科电子有限公司 | Control chip of LED panel |
| TW200514977A (en) * | 2003-10-20 | 2005-05-01 | Himax Tech Inc | Apparatus for inspecting leads and method thereof |
| CN1628432A (en) * | 2002-02-07 | 2005-06-15 | 皇家飞利浦电子股份有限公司 | Secure visual message communication method and device |
-
2019
- 2019-06-14 CN CN201910517211.5A patent/CN110286505B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6008593A (en) * | 1997-02-12 | 1999-12-28 | International Rectifier Corporation | Closed-loop/dimming ballast controller integrated circuits |
| CN1412570A (en) * | 2001-10-17 | 2003-04-23 | 胜华科技股份有限公司 | CGROM detection device and method |
| CN1628432A (en) * | 2002-02-07 | 2005-06-15 | 皇家飞利浦电子股份有限公司 | Secure visual message communication method and device |
| TW200514977A (en) * | 2003-10-20 | 2005-05-01 | Himax Tech Inc | Apparatus for inspecting leads and method thereof |
| CN2679786Y (en) * | 2004-01-13 | 2005-02-16 | 烟台荣科电子有限公司 | Control chip of LED panel |
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