CN110286271A - A kind of measuring system, method and the analysis method of dielectric surface charge properties - Google Patents
A kind of measuring system, method and the analysis method of dielectric surface charge properties Download PDFInfo
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- CN110286271A CN110286271A CN201910520545.8A CN201910520545A CN110286271A CN 110286271 A CN110286271 A CN 110286271A CN 201910520545 A CN201910520545 A CN 201910520545A CN 110286271 A CN110286271 A CN 110286271A
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R29/24—Arrangements for measuring quantities of charge
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Abstract
The present invention relates to technical field of electrical measurement, and in particular to a kind of measuring system, method and the analysis method of dielectric surface charge properties.There is the electrode for being set to dielectric surface including power supply;Power supply provides power supply to dielectric by electrode;At least one probe, is set to dielectric surface and is separated by pre-determined distance with electrode;Current curve measuring device with probe connection for measuring the current curve of the setting position corresponding to probe, and is analyzed to obtain charge characteristic current curve;Its charge characteristic includes at least one of charge accumulated and electric-charge-dissipating.By record current from the current curve for being charged to electric discharge, current curve is carried out operation and obtains energy curve, the energy variation for observing dielectric surface of the energy curve on different location carries out analysis to the charge characteristic on dielectric surface using the curve graph of different location and solves the problems, such as that dielectric charge characteristic testing result is not accurate in the prior art.
Description
Technical field
The present invention relates to technical field of electrical measurement, and in particular to a kind of measurement system of dielectric surface charge properties
System, method and analysis method.
Background technique
Insulating materials is widely used in electric system and pulse power field, wherein the accumulation of its surface charge with
Dissipation capability is the important electrology characteristic of one item, can reflect to a certain extent the edge flashing performance of material, resist it is quiet
Electrical property and polarization characteristic.Therefore how accurately and effectively to assess the accumulation of its surface charge and dissipation capability just seems especially heavy
It wants.
In the prior art, pressurization charging is carried out to dielectric by different voltage types, utilizes potential measurement skill
Art carries out charge measurement, the release time of calculated charge and current potential evanishment, the method calculating process to dielectric surface
Complexity, and cannot intuitively obtain result.Further, it is also possible to then be popped one's head in electrostatic by carrying out corona charging to dielectric
Dielectric after touching charging detects the surface potential of dielectric using which and records drafting curve graph, in basis
The curve graph drawn carries out the characteristic evaluation of the accumulation of dielectric surface charge and dissipation capability.Though the method can visual representation
As a result, but by corona charging in the surface potential for removing detection dielectric using electrostatic probe, it can be because electrostatic be popped one's head in and is filled
The potential difference on electric insulating medium surface and generate electric spark, to be damaged to dielectric itself, and operation difficulty is big, endanger
Dangerous coefficient is high.And the prior art is when detecting dielectric surface, is examined to the single position of dielectric
It surveys, therefore the data detected often generate certain error, causes measurement result inaccurate.
Summary of the invention
In view of this, the embodiment of the invention provides a kind of measuring system of dielectric surface charge properties, method and
Analysis method, the testing result to solve the problems, such as existing dielectric charge characteristic be not accurate.
According in a first aspect, being wrapped the embodiment of the invention provides a kind of measuring system of dielectric surface charge properties
It includes:
Power supply has the electrode for being set to dielectric surface;The power supply passes through the electrode to the dielectric
Power supply is provided;
At least one probe, is set to the dielectric surface, and be separated by pre-determined distance with the electrode;
Current curve measuring device is connected with the probe, for measuring the electricity for corresponding to the setting position of the probe
Flow curve, and the current curve is analyzed, to obtain charge characteristic;Wherein, the charge characteristic includes charge accumulated
And at least one of electric-charge-dissipating.
The frequency and magnitude parameters for adjusting power supply apply voltage to the electrode on dielectric surface, are arranged in dielectric
The probe on surface carries out detection record to the electric current on dielectric surface, current curve measuring device is sent into, by analyzing in real time
Electric current records and draws current curve from the variation for being charged to discharge process, and current curve obtained is carried out operation and is obtained
To energy curve, by the energy variation on the dielectric surface known to observation energy curve on different location, to pass through
Analysis is carried out to the charge characteristic on dielectric surface to the curve graph of different location and solves dielectric charge in the prior art
The not accurate problem of Characteristics Detection result.
With reference to first aspect, in first aspect first embodiment, the current curve measuring device includes:
Circuit is connected, for connecting oscillograph and the probe;
The oscillograph, for measuring the current curve for corresponding to the setting position of the probe;
Processor is connect with the oscillograph, special to obtain the charge for analyzing the current curve
Property.
Using oscillograph and probe connection, sensed current signal of popping one's head in, oscillograph forms the detected signal of probe
Current curve, the current curve that processor exports oscillograph are analyzed, and are obtained charge characteristic, are obtained in a manner of simple, intuitive
To measurement result, and it ensure that the integrality of dielectric.
With reference to first aspect, in first aspect second embodiment, the connection circuit includes:
First resistor, both ends are separately connected the probe and ground;
Second resistance, one end and the probe connect, and the other end is connect with the oscillograph.
By connection first resistor and second resistance, by impedance matching, to guarantee by adjusting first resistor and second
Resistance guarantees the precision of measurement.
With reference to first aspect, in first aspect third embodiment, it is separate that the probe is set to the dielectric
The surface of the electrode.
Probe is set to the surface far from current electrode, to prevent generation spark during carrying out power supply power supply from putting
Electricity guarantees test safety.
With reference to first aspect, in the 4th embodiment of first aspect, the measuring device further include:
Cavity, for placing the dielectric;Wherein, the cavity has air inlet and gas outlet, the air inlet
Mouth is for being filled with gas.
With reference to first aspect, in the 5th embodiment of first aspect, the power supply is the pulse power.
It is filled with gas toward inside cavity by increasing cavity, to simulate gas with various to the shadow of dielectric surface charge
It rings.
According to second aspect, the embodiment of the invention provides a kind of measurement method of dielectric surface charge properties, packets
It includes:
On dielectric surface, electrode and at least one probe are set;
Power supply and current curve measuring device are connected with the corresponding electrode and the probe respectively;
The parameter of the power supply is set, while setting for the probe is corresponded to using current curve measuring device measurement
The current curve of seated position, and the current curve is analyzed, to obtain charge characteristic;Wherein, the charge characteristic packet
Include at least one of charge accumulated and electric-charge-dissipating.
It is described to be surveyed using the current curve measuring device in second aspect first embodiment in conjunction with second aspect
Amount corresponded to before the step of current curve of the setting position of the probe, further includes:
The dielectric is placed in cavity;Wherein, the cavity has air inlet and gas outlet;
Gas is filled with into the cavity.
In conjunction with second aspect, in second aspect third embodiment, the gas is N2、SF6And CO2One of.
Multiple probes are set using on dielectric surface, current measurement is carried out to the surface different location of dielectric,
Current curve is depicted as by measured current data, being recorded by the acquired current curve to different location can
The surface and charge relationship of dielectric are assessed, by recording the current curve of different location, it is known that power supply
The relationship of the surface charge of power electrode and dielectric carries out analysis to these relation datas to solve dielectric charge
The not accurate problem of Characteristics Detection result.
According to the third aspect, the embodiment of the invention provides a kind of analysis methods of current curve, comprising:
Obtain current curve;Wherein, the current curve is based on setting when dielectric surface applies voltage in institute
State what the probe on dielectric surface measured;
The current curve is integrated, to obtain charge characteristic curve;Wherein, the rising of the charge characteristic curve
Stage indicates the process of charge accumulated, and the decline stage of the charge characteristic curve indicates the process of electric-charge-dissipating.
Carrying out integral to current curve obtained enables obtained data intuitively to show to be examined on different location
The charge characteristic measured.
Detailed description of the invention
It, below will be to specific in order to illustrate more clearly of the specific embodiment of the invention or technical solution in the prior art
Embodiment or attached drawing needed to be used in the description of the prior art be briefly described, it should be apparent that, it is described below
Attached drawing is some embodiments of the present invention, for those of ordinary skill in the art, before not making the creative labor
It puts, is also possible to obtain other drawings based on these drawings.
Fig. 1 is a kind of schematic block diagram of the measuring system of dielectric surface charge properties according to an embodiment of the present invention;
Fig. 2 is a kind of structural block diagram of the measuring system of dielectric surface charge properties according to an embodiment of the present invention;
Fig. 3 is the measured waveform figure of two kinds of dielectric surface charge properties according to an embodiment of the present invention;
Fig. 4 is a kind of flow chart of the measurement method of dielectric surface charge properties according to an embodiment of the present invention;
Fig. 5 is a kind of part process of the measurement method of dielectric surface charge properties according to an embodiment of the present invention
Figure;
Fig. 6 is a kind of flow chart of the analysis method of current curve according to an embodiment of the present invention;
Fig. 7 is a kind of measuring method flow chart of dielectric surface charge properties according to the preferred embodiment of the invention.
10- power supply;20- dielectric surface;30- probe;40- current curve measuring device;
1- solid dielectric insulation sample;2- high-field electrode;3- distribution probe;4- ground resistance;5- sampling electricity
Resistance;6- coaxial cable;7- oscillograph;8- plastic safety cover;9- air inlet;The gas outlet 10-;11- high-voltage pulse power source.
Specific embodiment
In order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below in conjunction with the embodiment of the present invention
In attached drawing, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described embodiment is
A part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, those skilled in the art are not having
Every other embodiment obtained under the premise of creative work is made, shall fall within the protection scope of the present invention.
As shown in Figure 1, the embodiment of the invention provides a kind of measuring systems of dielectric surface charge properties, comprising:
Power supply 10 has the electrode for being set to dielectric surface 20;The power supply 10 is mentioned by the electrode to the dielectric
For electric energy;At least one probe 30, is set to the dielectric surface 20, and be separated by pre-determined distance with the electrode;Electric current
Curve measurement mechanism 40 is connect with the probe 30, for measuring the current curve for corresponding to the setting position of the probe 30,
And the current curve is analyzed, to obtain charge characteristic;Wherein, the charge characteristic includes charge accumulated and charge
At least one of dissipate.
Specifically, current curve measuring device 40 includes:
Circuit is connected, for connecting oscillograph and the probe 30;
The oscillograph, for measuring the current curve for corresponding to the setting position of the probe 30;
Processor is connect with the oscillograph, special to obtain the charge for analyzing the current curve
Property.
Specifically, connection circuit includes:
First resistor, both ends are separately connected the probe and ground;Wherein first resistor is for adjusting measurement sensitivity.
Second resistance, one end and the probe connect, and the other end is connect with the oscillograph;Wherein second resistance can be
Sampling resistor acquires current signal.
Specifically, probe 30 is set to surface of the dielectric far from the electrode, probe 30 is set to separate
The surface of current electrode guarantees test safety to prevent from generating spark discharge during carrying out power supply power supply.
Specifically, measuring device further include: cavity, for placing the dielectric;Wherein, the cavity has air inlet
Mouth 9 and gas outlet 10, the air inlet is filled with gas toward inside cavity for being filled with gas, by increasing cavity, with simulation
Influence of the gas with various to dielectric surface charge.
Specifically, power supply 10 is the pulse power.
The frequency and magnitude parameters for adjusting power supply 10 apply voltage to the electrode on dielectric surface 20, and setting is being insulated
The electric current on 30 pairs of dielectric surfaces 20 of probe of dielectric surface carries out detection record, is sent into current curve measuring device 40, leads to
It crosses analysis electric current in real time and records and draw current curve from the variation for being charged to discharge process, and current curve obtained
It carries out operation and obtains energy curve, pass through the energy quantitative change on the dielectric surface 20 known to observation energy curve on different location
Change, is solved in the prior art to carry out analysis by charge characteristic of the curve graph to different location to dielectric surface 20
The not accurate problem of dielectric charge characteristic testing result.
As Figure 2-3, including a high-voltage pulse power source 11, solid dielectric insulation sample 1, high-field electrode 2, sampling
Resistance 5, coaxial wire 6 and oscillograph 7 etc..High-field electrode 2 is made of one piece of metal foil on dielectric, while being insulated
There is the metal foil of series of parallel arrangement in the lower surface of medium, and metal foil is connected with sampling resistor 5, and by coaxial cable 6
Line accesses oscillograph 7, plays the record different location function of current.In the rising edge of pulse voltage, power supply carries out dielectric
Charging, is charge accumulated process, that is, charging process, is corona discharge;After charging electricity, the place far from charging electrode
Charge isolated island is formd, discharge current is then recorded by oscillograph 7, is electric-charge-dissipating process.Specific steps are as follows: to solid
Body dielectric sample 1 carries out pulse charge and discharge;Pass through the change of the t at any time of electric current I (t) in one discharge cycle of oscillograph recording
Change relationship;Electric current I (t) is obtained to the relationship of time integral and time t, i.e. ∫ I (t) dt-t;Make the corresponding song of ∫ I (t) dt-t
Line assesses the ability of dielectric surface accumulation and dissipation charge according to curve state.This method can be to solid dielectric insulation
In the realization in situ measurement of nanosecond-musec order, operating process is simple, is not required to for surface different location charge accumulated and dissipation situation
The detection device for wanting complex and expensive, accumulation and dissipation situation to sample surface charge are able to carry out intuitive, effective assessment.Example
Such as: charge and discharge being carried out to two kinds of solid dielectric insulations of polytetrafluoroethylene (PTFE) (PTFE) and epoxy resin (ER), pass through oscillograph recording
The current waveform of four probes.It is illustrated in fig. 3 shown below, (a) and (c) current versus time curve figure is integrated, (b) (d) is obtained
Shown in electricity-time graph (1#-4# respectively represents four different positions, and 1#-4# is gradually distance from high-field electrode).?
(b) in (d) curve graph, curve ascent stage is the cumulative process of electricity or amount of charge, and the decline stage is electricity or charge number
The evanishment of amount.From in (b) (d) curve graph as can be seen that the position 1# from curve raising and lowering trend it is steep, illustrate electricity or
Amount of charge accumulates quickly, but dissipate also quickly;Curve raising and lowering is gentle at the position 4#, illustrates electricity or charge number
It is all very slow to measure cumulative process and evanishment.
The embodiment of the invention provides a kind of preferred embodiments, as shown in Fig. 2, solid dielectric insulation sample to be measured
1, surface is equipped with one piece of metal foil as high-field electrode 2 on it, is equipped with one in the medium lower surface far from high-field electrode
Series metal foil connects ground resistance 4, then reconnects sampling resistor 5 as distributed probe 3, each probe, via
Coaxial wire 6 accesses oscillograph 7.Ground resistance and sampling resistor form impedance matching, and wherein ground resistance determines measurement
Sensitivity.Solid dielectric insulation sample 1 is placed in plastic safety cover 8, and protective cover upper and lower part has 9 He of air inlet
Gas outlet 10 ensure that measurement process can carry out under different atmosphere and different air pressures.By high-voltage pulse power source 11 to solid
Dielectric sample 1 charges.
Optionally, N can be filled in plastic safety cover 82, SF6, CO2Equal gases, can simulate solid dielectric insulation 1 not
With the charge evanishment under atmosphere.
Optionally, pulse excitation is applied to solid insulating material surface 1, it is then different by distribution 3 real-time measurements of probe
Electric current at position changes with time, and finally handles the accumulation and evanishment of Data Summary charge on the surface of the material.With with
Past measuring technique is compared, and this method is able to solve previous measurement method and finishes from pressurization to implementation electrostatic probe measurement process
In (several seconds to more than ten seconds) electric-charge-dissipating the problem of, can be realized non-destructive testing, testing result is more accurate.
Optionally, charge power supply can also be high-voltage DC power supply.
As shown in figure 4, the embodiment of the invention provides a kind of measurement methods of dielectric surface charge properties, comprising:
Electrode and at least one probe is arranged on dielectric surface in S10;On dielectric surface, multiple spies are set
Head surveys the quantity of electric charge of the surface different location of dielectric wherein set probe can be arbitrary arrangement mode
Amount carries out charge measurement by the different location to same dielectric to be measured, accurately can carry out charge to dielectric surface
Specificity analysis.
S11 connects power supply and current curve measuring device with the corresponding electrode and the probe respectively;It is logical
It pops one's head in dielectric surface mount distribution, electric spark caused by preventing because of voltage jump makes test equipment or dielectric
At damage.
S12 is arranged the parameter of the power supply, while corresponding to the probe using current curve measuring device measurement
Setting position current curve, and the current curve is analyzed, to obtain charge characteristic;Wherein, the charge is special
Property includes at least one of charge accumulated and electric-charge-dissipating.The frequency and amplitude of power supply are adjusted, guarantee carrying out
The stabilization of environment in charge characteristic measurement process, guarantees the accuracy of measurement result.
Optionally, the setting of power parameter can be manual setting.
Optionally, current curve measuring device may include oscillograph, also at any time including any electric signal acquisition equipment
The device of waveform is drawn in variation.
Optionally, measurement method used in present embodiment can be a kind of in-situ measuring method, solve previous measurement
Method from pressurization finish to implement electrostatic probe measurement during (several seconds to more than ten seconds) electric-charge-dissipating the problem of, realize it is lossless
Detection, keeps testing result more accurate.And it is easy to operate, equipment is easy to get, can examinations whenever and wherever possible, get rid of to valuableness
The dependence of equipment.
Optionally, as shown in figure 5, corresponding to the setting position of the probe using current curve measuring device measurement
Current curve the step of before, further includes:
The dielectric is placed in cavity by S20;Wherein, the cavity has air inlet and gas outlet;
Gas is filled in S21, Xiang Suoshu cavity.
Optionally, cavity can be plastic safety cover 8.
Optionally, the gas filled in cavity is N2、SF6And CO2One of, it can be used for measuring to different rings
Influence of the gas to dielectric surface charge properties under border.
Multiple probes are set using on dielectric surface, current measurement is carried out to the surface different location of dielectric,
Current curve is depicted as by measured current data, being recorded by the acquired current curve to different location can
The surface and charge relationship of dielectric are assessed, by recording the current curve of different location, it is known that power supply
The relationship of the surface charge of power electrode and dielectric carries out analysis to these relation datas to solve dielectric charge
The not accurate problem of Characteristics Detection result.
As shown in fig. 6, the embodiment of the invention provides a kind of analysis methods of current curve, comprising:
S30 obtains current curve;Wherein, the current curve is when dielectric surface applies voltage based on setting
What the probe on the dielectric surface measured;
Optionally, current curve is obtained, including obtaining the current curve of different insulative dielectric surface and obtaining same insulation
The current curve of different location on medium.
S31 integrates the current curve, to obtain charge characteristic curve;Wherein, the charge characteristic curve
Ascent stage indicates the process of charge accumulated, and the decline stage of the charge characteristic curve indicates the process of electric-charge-dissipating.
Optionally, acquired obtained current curve is integrated, obtains energy time curve, it is different absolutely by analysis
The energy situation of edge medium and same dielectric different location is to obtain the charge characteristic of test dielectric, by dividing
The energy for analysing same dielectric different location obtains the accurate measurements to the dielectric.
As shown in fig. 7, the embodiment of the invention provides a kind of preferred embodiments, comprising:
S40 by solid dielectric insulation surface to be measured alcohol wipe and dries;Guarantee dielectric surface free from admixture, prevents
Spark discharge is only generated in measurement process.
S41 sticks high-field electrode, ground electrode and distributed probe copper foil on the surface of dielectric to be detected, and even
Connect sampling resistor and coaxial line access oscillograph;High-field electrode is set to insulation as the feeder ear of dielectric to be detected and is situated between
At the top of matter, it is sent electric into dielectric surface, distribution probe copper foil is affixed on dielectric bottom, and multiple distributed probes simultaneously wait
Spacing arrangement.
High-voltage pulse power source is applied to dielectric surface to be measured by S42, is applied frequency and is adjusted to 10Hz, amplitude 10KV, and
With the current waveform of the multiple probes of oscillograph recording;High-voltage pulse power source is powered dielectric surface to be detected, wherein
It needs to be configured the frequency and amplitude of power supply.Distribution probe records the dielectric surface of different location respectively
Current waveform.
Wherein, high-voltage pulse power source output pulse signal, recorded electric current of popping one's head in change with pulse signal, record charging
Curent change in discharge process indicates that dielectric surface is in charged state when current signal is by low get higher, works as electric current
Indicate that dielectric surface is in discharge condition when signal becomes low from height, by extracting electricity when synchronization current charging and discharging
Stream signal is analyzed.
S43 calculates dielectric surface charge accumulation to be measured and evanishment;
The electricity of the different location on same dielectric of same period is known using current charge-discharge power information obtained
Lotus accumulation and dissipation status information.
Optionally, integral can be carried out by the waveform recorded and obtains wavy curve, obtained by analyzing a plurality of curve
Accurate charge characteristic.
S44, the groups of operands for repeating S42 draw out the song of current integration and time using oscillograph recorded data
Line relationship assesses the accumulation and evanishment of dielectric charge.
Optionally, it can recorde multi-group data, mean operation carried out to the multi-group data of same probe measurement, obtains mean value
Data (waveform diagram drawn including the use of mean data), carry out integral operation to mean data, to obtain more accurate inspection
Survey result.
Optionally, the data that can be while measuring different insulative medium need to tap one group of electricity from high-voltage pulse power source
Source to another dielectric surface to be measured, charges to another dielectric surface to be detected.By analyze simultaneously it is different to
Dielectric surface is detected, intuitively dielectric can be analyzed, guarantees the accuracy of measurement data result, simplifies data
Analytic process.
Integral operation is carried out using the current waveform recorded, obtains smoothed curve, it can be intuitive by smoothed curve
It solves, charge accumulated and evanishment on dielectric different surfaces, can analyze difference by testing different dielectrics
Dielectric between charge characteristic, selection of the advantageous industrial design to insulating materials, and by same dielectric surface
Difference carries out the charge characteristic that charge characteristic analyzes to obtain accurately dielectric.
So be described in conjunction with the accompanying the embodiment of the present invention, but those skilled in the art can not depart from it is of the invention
Various modifications and variations can be made in the case where spirit and scope, and such modifications and variations are each fallen within to be limited by appended claims
Within the scope of fixed.
Claims (10)
1. a kind of measuring system of dielectric surface charge properties characterized by comprising
Power supply has the electrode for being set to dielectric surface;The power supply is provided by the electrode to the dielectric
Power supply;
At least one probe, is set to the dielectric surface, and be separated by pre-determined distance with the electrode;
Current curve measuring device is connected with the probe, for measuring the electric current song for corresponding to the setting position of the probe
Line, and the current curve is analyzed, to obtain charge characteristic;Wherein, the charge characteristic include charge accumulated and
At least one of electric-charge-dissipating.
2. measuring system according to claim 1, which is characterized in that the current curve measuring device includes:
Circuit is connected, for connecting oscillograph and the probe;
The oscillograph, for measuring the current curve for corresponding to the setting position of the probe;
Processor is connect with the oscillograph, for analyzing the current curve, to obtain the charge characteristic.
3. measuring system according to claim 2, which is characterized in that the connection circuit includes:
First resistor, both ends are separately connected the probe and ground;
Second resistance, one end and the probe connect, and the other end is connect with the oscillograph.
4. measuring system according to claim 1, which is characterized in that the probe is set to the dielectric far from institute
State the surface of electrode.
5. measuring system according to claim 1, which is characterized in that the measuring device further include:
Cavity, for placing the dielectric;Wherein, the cavity has air inlet and gas outlet, and the air inlet is used
In being filled with gas.
6. measuring system according to claim 1, which is characterized in that the power supply is the pulse power.
7. a kind of measurement method of dielectric surface charge properties characterized by comprising
On dielectric surface, electrode and at least one probe are set;
Power supply and current curve measuring device are connected with the corresponding electrode and the probe respectively;
The parameter of the power supply is set, while corresponding to the setting position of the probe using current curve measuring device measurement
The current curve set, and the current curve is analyzed, to obtain charge characteristic;Wherein, the charge characteristic includes electricity
At least one of lotus accumulation and electric-charge-dissipating.
8. measurement method according to claim 7, which is characterized in that described to be measured using the current curve measuring device
Corresponding to the probe setting position current curve the step of before, further includes:
The dielectric is placed in cavity;Wherein, the cavity has air inlet and gas outlet;
Gas is filled with into the cavity.
9. measurement method according to claim 8, which is characterized in that the gas is N2、SF6And CO2One of.
10. a kind of analysis method of current curve characterized by comprising
Obtain current curve;Wherein, the current curve is based on setting when dielectric surface applies voltage described exhausted
What the probe of edge dielectric surface measured;
The current curve is integrated, to obtain charge characteristic curve;Wherein, the ascent stage of the charge characteristic curve
Indicate the process of charge accumulated, the decline stage of the charge characteristic curve indicates the process of electric-charge-dissipating.
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