CN110262029A - The control device and method of light capture particle - Google Patents
The control device and method of light capture particle Download PDFInfo
- Publication number
- CN110262029A CN110262029A CN201910432244.XA CN201910432244A CN110262029A CN 110262029 A CN110262029 A CN 110262029A CN 201910432244 A CN201910432244 A CN 201910432244A CN 110262029 A CN110262029 A CN 110262029A
- Authority
- CN
- China
- Prior art keywords
- signal
- light
- axis
- module
- feedback control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000002245 particle Substances 0.000 title claims abstract description 70
- 238000000034 method Methods 0.000 title claims abstract description 25
- 239000002105 nanoparticle Substances 0.000 claims abstract description 51
- 238000001816 cooling Methods 0.000 claims abstract description 11
- 238000006073 displacement reaction Methods 0.000 claims description 20
- 230000010287 polarization Effects 0.000 claims description 12
- 238000005259 measurement Methods 0.000 claims description 10
- 238000004891 communication Methods 0.000 claims description 9
- 230000002194 synthesizing effect Effects 0.000 claims description 7
- 238000006243 chemical reaction Methods 0.000 claims description 6
- 210000001747 pupil Anatomy 0.000 claims description 6
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims description 5
- 230000003287 optical effect Effects 0.000 claims description 4
- 238000012790 confirmation Methods 0.000 claims description 3
- 238000001914 filtration Methods 0.000 claims description 3
- 230000005622 photoelectricity Effects 0.000 claims description 3
- 230000008859 change Effects 0.000 claims description 2
- 241000208340 Araliaceae Species 0.000 claims 1
- 235000005035 Panax pseudoginseng ssp. pseudoginseng Nutrition 0.000 claims 1
- 235000003140 Panax quinquefolius Nutrition 0.000 claims 1
- 235000008434 ginseng Nutrition 0.000 claims 1
- 238000005516 engineering process Methods 0.000 abstract description 5
- 230000010355 oscillation Effects 0.000 abstract description 4
- 239000000523 sample Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 230000003111 delayed effect Effects 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 238000012576 optical tweezer Methods 0.000 description 3
- 230000009467 reduction Effects 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 230000001965 increasing effect Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000005192 partition Methods 0.000 description 1
- 239000008188 pellet Substances 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/32—Micromanipulators structurally combined with microscopes
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
A kind of control device of light capture particle, applied to field of photoelectric technology, it include: light capturing unit, digital feedback control unit and host computer, light capturing unit is used to measure the three-dimensional position signal of captured micro-nano particle, and three-dimensional position signal is transferred to digital feedback control unit and host computer, host computer is used for according to three-dimensional position signal, generate feedback control parameters, and feedback control parameters are sent to the digital feedback control unit, digital feedback control unit is used for will be according to three-dimensional position signal, feedback control parameters, target state, feedback control signal is generated to the smooth capturing unit, to carry out feedback control to the smooth capturing unit.The invention also discloses a kind of control method of light capture particle, it can be achieved that vibrating the control of the motion states such as cooling, Oscillation Amplitude, vibration frequency to light capture particle.
Description
Technical field
The present invention relates to field of photoelectric technology more particularly to a kind of control device and methods of light capture particle.
Background technique
Optical tweezer technology or light capture technique apply the particle in light field by focus on light beam and are directed toward photo potential trap center
Intensity gradient power is to realize the capture of micro-nano particle.Light capture technique in liquid since the invention of optical tweezer in 1986
Significant progress progress and extensive practical application are obtained.Utilize the ability of optical tweezer control micro-nano particle, light capture technique quilt
Used in fields such as nanoprocessing, micromechanics assemblings.Simultaneously again since the size for the particle that is captured is usually in micron, nanoscale,
It moves the influence for being particularly susceptible to external environment, is equally used in low force using this characteristic light capture technique and measures, greatly
The fields such as molecule and the research of biomolecule mechanical property.
In recent years, the light capture being different from traditional liquid, vacuum light capture technique are increasingly studied and are closed
Note.Due to the interference around the micro-nano particle that is captured without liquid or air molecule, realizes and be relatively isolated from external environment
Capture, micro-nano particle is able to carry out almost ideal simple harmonic oscillation in photo potential trap.In pole, low force measurement, macroscopic quantum state are ground
Study carefully, many Disciplinary Frontiers such as gravitation wave measurement have research potential outstanding.And the motion state of captured particle is controlled
System is necessary work step before further study.There are several control programs to be suggested, such as based on intensity control
Parameter feedback it is cooling；Cooling based on optical resonator；Cooling etc. based on optical pressure.However in having proposed scheme, greatly
The reduction for all emphasizing the cooling of Particles Moving particle amplitude in other words, lacks the control ability of other motor patterns.Tradition simultaneously
Control device complex and expensive debug it is difficult, it is difficult to switch between different control models.
Summary of the invention
The main purpose of the present invention is to provide a kind of control device and methods of light capture particle, may be implemented to catch light
Obtain the control of the motion states such as particle vibration cooling, Oscillation Amplitude, vibration frequency.
To achieve the above object, first aspect of the embodiment of the present invention provides a kind of control device of light capture particle, comprising:
Light capturing unit, digital feedback control unit and host computer；
The smooth capturing unit, for measuring the three-dimensional position signal of captured micro-nano particle, and by the three-dimensional position
Signal is transferred to the digital feedback control unit and host computer；
The host computer for generating feedback control parameters according to the three-dimensional position signal, and sends the feedback control
Parameter processed gives the digital feedback control unit；
The digital feedback control unit, being used for will be according to the three-dimensional position signal, the feedback control parameters, target
Motion state generates feedback control signal to the smooth capturing unit, to carry out feedback control to the smooth capturing unit.
Further, the smooth capturing unit includes:
Laser 1, rotatable half-wave plate 2, polarization beam splitter prism 3, acousto-optic modulator 4,90:10 beam splitter prism 5, can darkening
Circle 6, rotatable polarizing film 7 expand microscope group 8, are the first vacuum chamber window 9, microcobjective 10, particle dropping feeder 11, aspherical
Mirror 12, the second vacuum chamber window 13, vacuum chamber 14, vacuum pump group 15,30:70 beam splitter prism 16,50:50 beam splitter prism 17, road
Power and influence mirror 18, the first D-shaped mirror 19, the second D-shaped mirror 20, X-axis balance photodetector 21, Y-axis balance photodetector 22, Z axis
Balance photodetector 23；
For emitting laser beams, the laser beam passes through rotatable half-wave plate 2 to laser 1, makes the polarization of the laser beam
It rotates, polarizes postrotational laser beam by polarization beam splitter prism 3 and filter out the laser being parallel on X-axis polarization direction
Beam；
Digital feedback control unit 24 controls the optical power that acousto-optic modulator 4 adjusts the laser beam, is caught with changing to light
Obtain the vibration frequency of micro-nano particle 26；
90:10 beam splitter prism 5, iris ring 6, rotatable polarizing film 7 are for adjusting in the laser beam light intensity lower than the
The light beam of one preset value, to be received by Z axis balance photodetector 23；
The diameter that microscope group 8 is higher than the light beam of the second preset value for adjusting light intensity in the laser beam is expanded, the light is made
The diameter of beam is greater than the rear pupil diameter of microcobjective 10；
The laser beam enters the rear pupil of microcobjective 10 by the first vacuum chamber window 9, focuses by microcobjective 10
Afterwards, the photo potential trap be capable of light and capture micro-nano particle is generated in the near focal point of microcobjective 10；
Particle dropping feeder 11 is used to micro-nano particle 26 being delivered to 10 near focal point of microcobjective, so that 26 quilt of micro-nano particle
Light capture；
Vacuum pump 15 in vacuum chamber 14 for will vacuumize；
Parallel light emergence is become after aspherical mirror 12 by the laser beam that microcobjective 10 focuses again, it is true by second
Light beam is divided into two bundles by 30:70 beam splitter prism 16 after cavity window 13, so that light intensity is put down lower than the light beam of third preset value by Z axis
The photodetector 23 that weighs receives, and the light beam that light intensity is higher than the 4th preset value is divided into two bundles light beam by 50:50 beam splitter prism 17, wherein
It is a branch of be rotated by 90 ° by Dove prism 18 after two light beams are separated from the middle by the first D-shaped mirror 19, the two light beams are equal
It is received by Y-axis balance photodetector 22；Another light beam is separated from the middle into two light beams, two beam by the second D-shaped mirror 20
Light beam is received by X-axis balance photodetector 21；
X-axis balances photodetector 21, Y-axis balance photodetector 22, Z axis balance photodetector 23 and measures micro-nano
The three-dimensional position signal of grain 26, and the three-dimensional position signal is transferred to digital feedback control unit 24 and host computer 25.
Further, the digital feedback control unit includes:
Analog-to-digital conversion module 27, FPGA module 28, D/A converter module 29, host computer communication module 30；
Analog-to-digital conversion module 27 is balanced for X-axis to be balanced photodetector 21, Y-axis balance photodetector 22, Z axis
The three-dimensional position signal that photodetector 23 is sent is converted into digital position signal, and the digital position signal is sent to
FPGA module 28；
Host computer communication module 30, the feedback control parameters for sending host computer 25 are sent to FPGA module 28；
FPGA module 28, for according to the digital position signal, target state and the feedback control parameters, life
Signal is controlled at digital feedback, and sends the digital feedback control signal to D/A converter module 29；
D/A converter module 29 is sent to for digital feedback control signal to be converted into Voltage Feedback control signal
Acousto-optic modulator 4.
Further, the FPGA module 28 includes:
Digital band-pass filter 31, the first time delay module 32, the second time delay module 33, amplitude module 34, frequency measurement module 35,
Uniaxial feedback signal generation module 36, signal synthesizing module 37, output module 38；
Digital band-pass filter 31, for filtering the noise of any axle position shifting signal in three-dimensional position signal；
First time delay module 32, for generating the first signal with the axle position shifting signal with phase；
Second time delay module 33, for generating the second signal with the axial displacement signal phase difference for pi/2；
Amplitude module 34 for when the first signal and the second signal are passed through, generating third signal, and is calculated by light
The current vibration amplitude of the micro-nano particle 26 of capture；
Frequency measurement module 35 for when first signal passes through, generating fourth signal, and calculates the micro-nano captured by light
The current vibration frequency of particle 26；
Uniaxial feedback signal generation module 36, for according to first signal, second signal, third signal, the 4th letter
Number, generate uniaxial feedback signal；
Signal synthesizing module 37, the uniaxial feedback signal for each axis synthesize, and generate digital feedback and control signal；
Output module 38, for digital feedback control signal to be sent to D/A converter module 29.
Further, X-axis balance photodetector 21, Y-axis balance photodetector 22, Z axis balance photodetector 23
Output voltage be proportional to displacement component of the captured micro-nano particle 26 on X-axis, Y-axis, Z axis respectively.
Further, microcobjective 10 and aspherical mirror 12 are mounted in vacuum chamber 14.
Second aspect of the embodiment of the present invention provides a kind of control method of light capture particle, comprising:
Micro-nano particle 26 to be captured is shipped to the near focal point of microcobjective 10 with particle dropping feeder 11；
X-axis, which is observed, by host computer 25 balances photodetector 21, Y-axis balance photodetector 22, Z axis balance photoelectricity spy
The signal output for surveying device 23, until X-axis balance photodetector 21, Y-axis balance photodetector 22, Z axis balance photodetection
When device 23 has the position signal of stable captured micro-nano particle 26 to export, confirmation micro-nano particle 26 is captured by light；
Particle dropping feeder 11 is taken out from vacuum chamber 14, is latched vacuum chamber 14, opens vacuum pump 15, it will be in vacuum chamber 14
Air pressure is evacuated to predetermined vacuum degree；
Adjust the size of adjustable aperture 6, the first D-shaped mirror 19, the second D-shaped mirror 20 position make X-axis balance photodetection
Device 21, Y-axis balance photodetector 22, the noise of Z axis balance 23 output signal of photodetector are minimum；
According to the vibration frequency different on X, Y, Z axis direction of micro-nano particle 26, FPGA is set separately by host computer 25
The band logical frequency of digital band-pass filter 31 inhibits other frequencies to retain the vibration signal on X, Y, Z axis direction in module 28
Noise signal；
The delay parameter of first time delay module 32, the second time delay module 33 is set, so that first on X, Y, Z axis direction prolongs
When module 32 generate with displacement signal with the signal of phase, the second time delay module 33 generates the signal with displacement signal phase difference pi/2.
Further, when micro-nano particle 26 is when the motion state of a certain axis is that vibration is cooling, by micro-nano particle 26 in institute
The amplitude stated on axis is set as 0.
Further, when micro-nano particle 26 is when the motion state of a certain axis is that amplitude locks, by micro-nano particle 26 in institute
The amplitude on axis is stated to be set as being no more than the predetermined fixed value of the particle vibration limit.
It further, can only be in an axis within the same time when the motion state of micro-nano particle 26 is Frequency Locking
Upper application motion state control.
From the embodiments of the present invention it is found that light provided by the invention captures the control device and method of particle, including light
Capturing unit, digital feedback control unit and host computer, light capturing unit are used to measure the three-dimensional position of micro-nano particle to be captured
Signal, and three-dimensional position signal is transferred to digital feedback control unit and host computer, host computer according to three-dimensional position for believing
Number, feedback control parameters are generated, and send feedback control parameters to the digital feedback control unit, digital feedback control unit
For that will generate feedback control signal according to three-dimensional position signal, feedback control parameters, target state and be captured to the light
Unit, to carry out feedback control to the smooth capturing unit, it can be achieved that vibrating cooling, Oscillation Amplitude, vibration to light capture particle
The control of the motion states such as frequency.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention for those skilled in the art without creative efforts, can also basis
These attached drawings obtain other attached drawings.
Fig. 1 is the structural representation that the light that one embodiment of the invention provides captures light capturing unit in the control device of particle
Figure；
Fig. 2 is that the light that provides of one embodiment of the invention captures in the control device of particle digital feedback control unit and upper
The structural schematic diagram of machine；
Fig. 3 be another embodiment of the present invention provides light capture particle control method flow diagram.
Specific embodiment
In order to make the invention's purpose, features and advantages of the invention more obvious and easy to understand, below in conjunction with the present invention
Attached drawing in embodiment, technical scheme in the embodiment of the invention is clearly and completely described, it is clear that described reality
Applying example is only a part of the embodiment of the present invention, and not all embodiments.Based on the embodiments of the present invention, those skilled in the art
Member's every other embodiment obtained without making creative work, shall fall within the protection scope of the present invention.
Fig. 1 and Fig. 2 are please referred to, Fig. 1 is that the light that one embodiment of the invention provides captures light capture in the control device of particle
The structural schematic diagram of unit, Fig. 2 are that the light that one embodiment of the invention provides captures digital feedback control in the control device of particle
The structural schematic diagram of unit and host computer, the device include:
Light capturing unit, digital feedback control unit and host computer；
The smooth capturing unit, for measuring the three-dimensional position signal of micro-nano particle to be captured, and by the three-dimensional position
Signal is transferred to the digital feedback control unit and host computer；
The host computer for generating feedback control parameters according to the three-dimensional position signal, and sends the feedback control
Parameter processed gives the digital feedback control unit；
The digital feedback control unit, being used for will be according to the three-dimensional position signal, the feedback control parameters, target
Motion state generates feedback control signal to the smooth capturing unit, to carry out feedback control to the smooth capturing unit.
It is specifically described below, which includes:
Laser 1, rotatable half-wave plate 2, polarization beam splitter prism 3, acousto-optic modulator 4,90:10 beam splitter prism 5, can darkening
Circle 6, rotatable polarizing film 7 expand microscope group 8, are the first vacuum chamber window 9, microcobjective 10, particle dropping feeder 11, aspherical
Mirror 12, the second vacuum chamber window 13, vacuum chamber 14, vacuum pump group 15,30:70 beam splitter prism 16,50:50 beam splitter prism 17, road
Power and influence mirror 18, the first D-shaped mirror 19, the second D-shaped mirror 20, X-axis balance photodetector 21, Y-axis balance photodetector 22, Z axis
Balance photodetector 23, digital feedback control unit 24, host computer 25, micro-nano particle 26.
In a device, laser 1 launches the laser beam for light capture, and laser beam makes by rotatable half-wave plate 2
The polarization of laser rotates, then is filtered out by a fixed polarization beam splitter prism 3 and be parallel to swashing on X-axis polarization direction
Light component realizes the preliminary control to laser beam power.
Laser passes through acousto-optic modulator 4 later, and acousto-optic modulator 4 can carry out high speed to laser intensity according to modulated signal
Control.Laser is by 90:10 beam splitter prism 5 later, and wherein the light beam of light intensity weaker (being lower than the first preset value) is by can darkening
After light intensity and shape are adjusted to most suitable situation after circle 6, rotatable polarizing film 7, by the one of Z axis balance photodetector 23
A photoelectric probe receives.After the light beam of light intensity relatively strong (being higher than the second preset value) is by expanding microscope group 8, beam diameter is adjusted to
Slightly larger than the rear pupil diameter of microcobjective 10.
Microcobjective 10 and aspherical mirror 12 are mounted in vacuum chamber 14.Vacuum pump 15 can will vacuumize in vacuum chamber 14.
Laser beam enters the rear pupil of microcobjective 10 by the first vacuum chamber window 9, after the focusing of microcobjective 10, in object lens 10
Near focal point generates the photo potential trap for capableing of light capture micro-nano particle.Micro-nano particle 26 is delivered to microcobjective by particle dropping feeder 11
10 near focal points, particle 26 can be captured by photo potential trap.The laser beam focused by microcobjective 10 pass through aspherical mirror 12 after again
Become parallel light emergence.It is weaker (to be lower than by being divided into two bundles laser by 30:70 beam splitter prism 16 after the second vacuum chamber window 13
Third preset value) light pass through Z axis balance photodetector 23 another photoelectric probe receive.It is relatively strong (it is default to be higher than the 4th
Value) light laser is divided into two bundles by 50:50 beam splitter prism 17.Wherein it is a branch of be rotated by 90 ° by Dove prism 18 after by the first D
Shape mirror 19 is separated from the middle into two valve light beams, is received respectively by two photoelectric probes of Y-axis balance photodetector 22.Another beam
Light is separated from the middle into two valve light beams by the second D-shaped mirror 20, is connect respectively by two photoelectric probes of X-axis balance photodetector 21
It receives.
X-axis balances the output voltage of photodetector 21, Y-axis balance photodetector 22, Z axis balance photodetector 23
It is proportional to displacement component of the captured micro-nano particle on X-axis, Y-axis, Z axis respectively.Due to the asymmetry of photo potential trap, micro-nano
Component motion of the grain 26 on X-axis, Y-axis, Z axis is mutually indepedent.Measured three-dimensional position signal is transferred to digital feedback control
Unit 24 and host computer 25.
Digital feedback control unit 24 is by analog-to-digital conversion module 27, FPGA module 28, D/A converter module 29, host computer
Communication module 30 forms.The three-dimensional position signal that detector 21,22,23 is sent first passes around analog-to-digital conversion module 27 and is converted into counting
Word signal.Digitized position signal is passed to FPGA module 28.According to the position letter for the particle 26 that is captured in FPGA module 28
Number, captured particle 26 the case where, the target of motion state control and parameter generate suitable digital feedback control signal and send
To D/A converter module 29.Digital feedback control signal is converted into Voltage Feedback control signal and is sent to by D/A converter module 29
Acousto-optic modulator 4 carries out feedback control to light intensity.Host computer communication module 30 is responsible for the feedback control for sending host computer 25 and is joined
Number transfers to FPGA module 28.
In FPGA module 28, the processing of X-axis displacement signal is considered first.X-axis displacement signal passes through digital band pass first
Noise outside 31 Filtration Goal signal frequency domain of filter.Then pass through the first time delay module 32 and the second time delay module 33.First
The phase that time delay module 32 and the second time delay module 33 change input signal by way of increasing and being additionally delayed, which makes up, to be fed back to
Phase difference caused by road is delayed.First time delay module 32 is generated with X-axis displacement signal with the signal of phase.Second time delay module 33 produces
The raw signal with X-axis displacement signal phase difference pi/2.The signal of first time delay module 32 and the second time delay module 33 passes through amplitude mode
Block 34 calculates the current amplitude of captured particle, and the signal of the first time delay module 32 is calculated by frequency measurement module 35 is caught
The current vibration frequency of particle is obtained, the first time delay module 32, the second time delay module 33, amplitude module 34, frequency measurement module 35 are distinguished
First signal of generation, second signal, third signal, fourth signal enter uniaxial feedback signal generation module 36, according to upper
The target amplitude of the input of machine 25, target frequency generate corresponding uniaxial feedback control signal, and uniaxial feedback control signal can will swash
Light light intensity switches between strong, weak two kinds of light intensity, or whole raising or attenuating laser intensity.Wherein strong, weak two kinds of switchings light intensity
The ratio of light intensity difference and average intensity is modulation depth, and modulation depth is set by host computer 25.Mould is generated in uniaxial feedback signal
In block, it may determine that particle is flat far from or approach according to the signal of the first time delay module 32, the second time delay module 33
Weigh position, it is assumed that we will increase (reduction) particle amplitude, module may require that particle 26 far from when switch to weak (strong) light intensity,
Strong (weak) light intensity is switched to when particle 26 is close.If necessary to which 26 amplitude of particle is locked in target amplitude, target is shaken
Width increaseds or decreases amplitude compared with 34 signal of amplitude module, according to the size of the two.If necessary by the vibration frequency of particle 26
Rate is locked in target frequency, and by target frequency compared with 35 signal of frequency measurement module, practical frequency is less than normal, increases light intensity, actual measurement
Frequency is higher, reduces light intensity.The processing and the treatment process one of above-mentioned X-axis displacement signal of Y-axis displacement signal and Z axis displacement signal
Sample.X, Y, the Z so obtained tri- uniaxial feedback control signals generate a Three dimensions control signal by signal synthesizing module 37,
In signal synthesizing module 37 by the principle that the minority is subordinate to the majority, the control target light to occupy the majority by three uniaxial feedback control signals
It is strong to export Three dimensions control signal for control light intensity.The signal of signal synthesizing module 37 passes through output module 38.Output module 38
The order of diffraction, the diffraction efficiency used according to acousto-optic modulator 4 exports according to target the correctly output digit signals of control light intensity.The signal
It is last transmitted to D/A converter module 29.And light intensity is controlled by acousto-optic modulator 4 and realizes that light captures the control of particle motion state
System.
Optionally, laser 1 can be the continuous light laser of 2W power 1064nm.
Optionally, micro-nano particle 26 can be 165nm diameter silicon oxide pellets.
The device generates feedback control signal using the mode of Digital Signal Processing, and required equipment is simply easy to build reality
It applies.It set by the parameter to digital feedback module, modify and can complete different light capture micro-nano particle movement shapes
State control.
The device can move particle in X, Y, Z axis self-movement when for cooling to light capture particle motion feedback
Equivalent temperature on component is reduced to 100mK or less.
The device, can be by particle in X, Y, Z axis self-movement when for carrying out amplitude locking to light capture particle movement
Amplitude controlling on component is near setting value.The accuracy of control is better than the 1% of target amplitude.
The device, can be by particle in X, Y, Z axis self-movement when for carrying out Frequency Locking to light capture particle movement
Frequency in component on some component motion controls near setting value.The accuracy of frequency control is better than 1Hz.
Referring to Fig. 3, Fig. 3 is the process signal for the control method that the light that another embodiment of the invention provides captures particle
Figure, this method mainly comprise the steps that
S101, the near focal point that micro-nano particle 26 to be captured is shipped to microcobjective 10 with particle dropping feeder 11；
All detectors 21,22,23 power on, and open host computer 25, digital feedback control unit 24, acousto-optic modulator 4.It beats
Laser 1 is opened, laser beam power is adjusted to 200mW by rotatable halfwave plate 2.With particle dropping feeder 11 by micro-nano particle 26 to be captured
It is shipped to the near focal point of microcobjective 10.
S102, X-axis balance photodetector 21, Y-axis balance photodetector 22, Z axis balance are observed by host computer 25
The signal of photodetector 23 exports, until X-axis balance photodetector 21, Y-axis balance photodetector 22, Z axis balance light
When electric explorer 23 has the position signal of stable captured micro-nano particle 26 to export, confirmation micro-nano particle 26 is caught by light
It obtains.
S103, particle dropping feeder 11 is taken out from vacuum chamber 14, be latched vacuum chamber 14, vacuum pump 15 is opened, by vacuum chamber
Air pressure in 14 is evacuated to predetermined vacuum degree；
S104, adjust the size of adjustable aperture 6, the first D-shaped mirror 19, the second D-shaped mirror 20 position make X-axis balance photoelectricity
Detector 21, Y-axis balance photodetector 22, the noise of Z axis balance 23 output signal of photodetector are minimum；
S105, according to the vibration frequency different on X, Y, Z axis direction of micro-nano particle 26, be set separately by host computer 25
The band logical frequency of digital band-pass filter 31 in FPGA module 28 is inhibited other with retaining the vibration signal on X, Y, Z axis direction
The noise signal of frequency；
Vibration frequency of the particle 26 on X, Y, Z axis direction is respectively 124.5kHz, 158.1kHz, 51.7kHz.By upper
Position machine 25 is set in FPGA module 28 by host computer communication module 30, and the digital band-pass filter bandpass center frequency of X-axis is
124.5kHz bandwidth 10kHz；The digital band-pass filter bandpass center frequency of Y-axis is 158.1kHz bandwidth 10kHz；The number of Z axis
Word bandpass filter bandpass center frequency is 51.7kHz bandwidth 10kHz.
S106, the delay parameter that the first time delay module 32, the second time delay module 33 are set, so that on X, Y, Z axis direction
First time delay module 32 is generated with displacement signal with the signal of phase, and the second time delay module 33 generates and displacement signal phase difference pi/2
Signal.
The delay parameter of the 650ns that is always delayed according to feedback loop setting the first time delay module and the second time delay module.It determines
First time delay module of each axis is generated with displacement signal with the signal of phase.Second time delay module generate with displacement signal phase difference π/
2 signal.
The determining amplitude controlling moved to Y-axis is in 0.9V, and the vibration frequency control of Y motion is in 155563Hz.To X and Z axis
Movement cooled down if it is the cooling reduction as far as possible that target amplitude is just set as to 0 namely amplitude of vibration.By upper
It is 0 that X and the target amplitude of Z axis, which is arranged, in machine 25；The target amplitude that Y-axis is arranged is 0.9V, target frequency 155563Hz；Modulation is deep
Degree is set as 0.5%.
In multiple embodiments provided herein, it should be understood that disclosed device and method can pass through it
Its mode is realized.For example, embodiments described above is only schematical, for example, the division of the module, only
A kind of logical function partition, there may be another division manner in actual implementation, for example, multiple module or components can combine or
Person is desirably integrated into another system, or some features can be ignored or not executed.Another point, shown or discussed is mutual
Between coupling or direct-coupling or communication linkage can be through some interfaces, the INDIRECT COUPLING or communication linkage of module can
To be electrically mechanical or other forms.
The module as illustrated by the separation member may or may not be physically separated, aobvious as module
The component shown may or may not be physical module, it can and it is in one place, or may be distributed over multiple
On network module.Some or all of the modules therein can be selected to realize the mesh of this embodiment scheme according to the actual needs
's.
It, can also be in addition, each functional module in each embodiment of the present invention can integrate in a processing module
It is that modules physically exist alone, can also be integrated in two or more modules in a module.Above-mentioned integrated mould
Block both can take the form of hardware realization, can also be realized in the form of software function module.
It should be noted that for the various method embodiments described above, describing for simplicity, therefore, it is stated as a series of
Combination of actions, but those skilled in the art should understand that, the present invention is not limited by the sequence of acts described because
According to the present invention, certain steps can use other sequences or carry out simultaneously.Secondly, those skilled in the art should also know
It knows, the embodiments described in the specification are all preferred embodiments, and related actions and modules might not all be this hair
Necessary to bright.
In the above-described embodiments, it all emphasizes particularly on different fields to the description of each embodiment, there is no the portion being described in detail in some embodiment
Point, it may refer to the associated description of other embodiments.
The above are the control device and methods to light provided by the present invention capture particle, for the general technology of this field
Personnel, thought according to an embodiment of the present invention, there will be changes in the specific implementation manner and application range, to sum up, this
Description should not be construed as limiting the invention.
Claims (10)
1. a kind of control device of light capture particle characterized by comprising
Light capturing unit, digital feedback control unit and host computer；
The smooth capturing unit, for measuring the three-dimensional position signal of captured micro-nano particle, and by the three-dimensional position signal
It is transferred to the digital feedback control unit and host computer；
The host computer for generating feedback control parameters according to the three-dimensional position signal, and sends the feedback control ginseng
Number is to the digital feedback control unit；
The digital feedback control unit, for that will be moved according to the three-dimensional position signal, the feedback control parameters, target
State generates feedback control signal to the smooth capturing unit, to carry out feedback control to the smooth capturing unit.
2. the control device of light according to claim 1 capture particle, which is characterized in that the smooth capturing unit includes:
Laser 1, rotatable half-wave plate 2, polarization beam splitter prism 3, acousto-optic modulator 4,90:10 beam splitter prism 5, iris ring 6,
Rotatable polarizing film 7, expand microscope group 8, the first vacuum chamber window 9, microcobjective 10, particle dropping feeder 11, non-spherical lens 12,
Second vacuum chamber window 13, vacuum chamber 14, vacuum pump group 15,30:70 beam splitter prism 16,50:50 beam splitter prism 17, Dove prism
18, the first D-shaped mirror 19, the second D-shaped mirror 20, X-axis balance photodetector 21, Y-axis balance photodetector 22, Z axis balance light
Electric explorer 23；
For emitting laser beams, the laser beam passes through rotatable half-wave plate 2 to laser 1, and the polarization of the laser beam occurs
Rotation polarizes postrotational laser beam by polarization beam splitter prism 3 and filters out the laser beam being parallel on X-axis polarization direction；
Digital feedback control unit 24 controls acousto-optic modulator 4 and adjusts the optical power of the laser beam, with change captured by light it is micro-
Receive the vibration frequency of particle 26；
90:10 beam splitter prism 5, iris ring 6, rotatable polarizing film 7 are pre- lower than first for adjusting light intensity in the laser beam
If the light beam of value, to be received by Z axis balance photodetector 23；
The diameter that microscope group 8 is higher than the light beam of the second preset value for adjusting light intensity in the laser beam is expanded, the light beam is made
Diameter is greater than the rear pupil diameter of microcobjective 10；
The laser beam enters the rear pupil of microcobjective 10 by the first vacuum chamber window 9, after the focusing of microcobjective 10,
The near focal point of microcobjective 10 generates the photo potential trap for capableing of light capture micro-nano particle；
Particle dropping feeder 11 is used to micro-nano particle 26 being delivered to 10 near focal point of microcobjective, so that micro-nano particle 26 is caught by light
It obtains；
Vacuum pump 15 in vacuum chamber 14 for will vacuumize；
Parallel light emergence is become after aspherical mirror 12 by the laser beam that microcobjective 10 focuses again, passes through the second vacuum chamber
Light beam is divided into two bundles by 30:70 beam splitter prism 16 after window 13, so that light intensity balances light by Z axis lower than the light beam of third preset value
Electric explorer 23 receives, and the light beam that light intensity is higher than the 4th preset value is divided into two bundles light beam by 50:50 beam splitter prism 17, wherein a branch of
Two light beams are separated from the middle by the first D-shaped mirror 19 after being rotated by 90 ° by Dove prism 18, the two light beams are by Y-axis
Photodetector 22 is balanced to receive；Another light beam is separated from the middle into two light beams by the second D-shaped mirror 20, and the two light beams are equal
It is received by X-axis balance photodetector 21；
X-axis balances photodetector 21, Y-axis balance photodetector 22, Z axis balance photodetector 23 and measures micro-nano particle 26
Three-dimensional position signal, and the three-dimensional position signal is transferred to digital feedback control unit 24 and host computer 25.
3. the control device of light capture particle according to claim 2, which is characterized in that the digital feedback control unit
Include:
Analog-to-digital conversion module 27, FPGA module 28, D/A converter module 29, host computer communication module 30；
Analog-to-digital conversion module 27 balances photoelectricity for X-axis to be balanced photodetector 21, Y-axis balance photodetector 22, Z axis
The three-dimensional position signal that detector 23 is sent is converted into digital position signal, and the digital position signal is sent to FPGA mould
Block 28；
Host computer communication module 30, the feedback control parameters for sending host computer 25 are sent to FPGA module 28；
FPGA module 28, for generating number according to the digital position signal, target state and the feedback control parameters
Word feedback control signal, and the digital feedback control signal is sent to D/A converter module 29；
D/A converter module 29 is sent to acousto-optic for digital feedback control signal to be converted into Voltage Feedback control signal
Modulator 4.
4. the control device of light according to claim 3 capture particle, which is characterized in that the FPGA module 28 includes:
Digital band-pass filter 31, the first time delay module 32, the second time delay module 33, amplitude module 34, frequency measurement module 35, single shaft
Feedback signal generation module 36, signal synthesizing module 37, output module 38；
Digital band-pass filter 31, for filtering the noise of any axle position shifting signal in three-dimensional position signal；
First time delay module 32, for generating the first signal with the axle position shifting signal with phase；
Second time delay module 33, for generating the second signal with the axial displacement signal phase difference for pi/2；
Amplitude module 34 for when the first signal and the second signal are passed through, generating third signal, and is calculated and is captured by light
Micro-nano particle 26 current vibration amplitude；
Frequency measurement module 35 for when first signal passes through, generating fourth signal, and calculates the micro-nano particle captured by light
26 current vibration frequency；
Uniaxial feedback signal generation module 36, for according to first signal, second signal, third signal, fourth signal, life
At uniaxial feedback signal；
Signal synthesizing module 37, the uniaxial feedback signal for each axis synthesize, and generate digital feedback and control signal；
Output module 38, for digital feedback control signal to be sent to D/A converter module 29.
5. the control device of light capture particle according to claim 2, which is characterized in that X-axis balance photodetector 21,
The output voltage that Y-axis balance photodetector 22, Z axis balance photodetector 23 is proportional to captured micro-nano particle 26 respectively and exists
X-axis, Y-axis, the displacement component on Z axis.
6. the control device of light capture particle according to claim 2, which is characterized in that microcobjective 10 and aspherical mirror
12 are mounted in vacuum chamber 14.
7. a kind of control method of light capture particle characterized by comprising
Micro-nano particle 26 to be captured is shipped to the near focal point of microcobjective 10 with particle dropping feeder 11；
X-axis, which is observed, by host computer 25 balances photodetector 21, Y-axis balance photodetector 22, Z axis balance photodetector
23 signal output, until X-axis balance photodetector 21, Y-axis balance photodetector 22, Z axis balance photodetector 23
When having the position signal of stable captured micro-nano particle 26 to export, confirmation micro-nano particle 26 is captured by light；
Particle dropping feeder 11 is taken out from vacuum chamber 14, is latched vacuum chamber 14, vacuum pump 15 is opened, by the air pressure in vacuum chamber 14
It is evacuated to predetermined vacuum degree；
Adjust the size of adjustable aperture 6, the first D-shaped mirror 19, the second D-shaped mirror 20 position make X-axis balance photodetector 21,
It is minimum that Y-axis balances photodetector 22, the noise of Z axis balance 23 output signal of photodetector；
According to the vibration frequency different on X, Y, Z axis direction of micro-nano particle 26, FPGA module is set separately by host computer 25
The band logical frequency of digital band-pass filter 31 inhibits making an uproar for other frequencies to retain the vibration signal on X, Y, Z axis direction in 28
Acoustical signal；
The delay parameter of first time delay module 32, the second time delay module 33 is set, so that the first delay mould on X, Y, Z axis direction
Block 32 is generated with displacement signal with the signal of phase, and the second time delay module 33 generates the signal with displacement signal phase difference pi/2.
8. the control method of light capture particle according to claim 7, which is characterized in that when micro-nano particle 26 is in a certain axis
Motion state when being that vibration is cooling, set 0 for the amplitude of micro-nano particle 26 on the shaft.
9. the control method of light capture particle according to claim 7, which is characterized in that when micro-nano particle 26 is in a certain axis
Motion state when being that amplitude locks, set the amplitude of micro-nano particle 26 on the shaft to no more than the particle vibration limit
Predetermined fixed value.
10. the control method of light capture particle according to claim 7, which is characterized in that when the movement of micro-nano particle 26
When state is Frequency Locking, the motion state control of Frequency Locking can only be applied on an axis within the same time.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910432244.XA CN110262029B (en) | 2019-05-22 | 2019-05-22 | Light trapping particle control device and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910432244.XA CN110262029B (en) | 2019-05-22 | 2019-05-22 | Light trapping particle control device and method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110262029A true CN110262029A (en) | 2019-09-20 |
| CN110262029B CN110262029B (en) | 2024-01-05 |
Family
ID=67915172
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910432244.XA Active CN110262029B (en) | 2019-05-22 | 2019-05-22 | Light trapping particle control device and method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110262029B (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111044417A (en) * | 2019-12-11 | 2020-04-21 | 之江实验室 | Device for detecting particle size by using mechanical effect of light and testing method |
| CN111750778A (en) * | 2020-07-01 | 2020-10-09 | 浙江大学 | Particle position detection device based on double-optical-tweezers system and precision improvement method |
| CN111855505A (en) * | 2020-07-07 | 2020-10-30 | 浙江大学 | Microsphere cluster state detection device and detection method applied to vacuum optical trap system |
| CN113380436A (en) * | 2021-04-28 | 2021-09-10 | 浙江大学 | Frequency-adjustable stable rotating device in vacuum optical tweezers system and use method |
| CN114720722A (en) * | 2022-04-06 | 2022-07-08 | 中国人民解放军国防科技大学 | Method and device for stabilizing scale factor of optical suspension acceleration sensor |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102230934A (en) * | 2011-03-30 | 2011-11-02 | 杭州锐光生物技术有限公司 | Method and detector for detecting tumor microsomes by using laser tweezers and micro fluidics |
| CN102645754A (en) * | 2012-04-13 | 2012-08-22 | 北京信息科技大学 | Far-field multiple optical trapping device and method |
| CN103674814A (en) * | 2012-09-13 | 2014-03-26 | 香港城市大学 | Methods and means for manipulating particles |
| CN104216103A (en) * | 2014-09-05 | 2014-12-17 | 华中科技大学 | Micropipe and optical tweezers measurement and control system |
| CN207440383U (en) * | 2017-11-20 | 2018-06-01 | 中国计量大学 | A kind of extended focal depth micro imaging system of combination optical tweezer function |
-
2019
- 2019-05-22 CN CN201910432244.XA patent/CN110262029B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102230934A (en) * | 2011-03-30 | 2011-11-02 | 杭州锐光生物技术有限公司 | Method and detector for detecting tumor microsomes by using laser tweezers and micro fluidics |
| CN102645754A (en) * | 2012-04-13 | 2012-08-22 | 北京信息科技大学 | Far-field multiple optical trapping device and method |
| CN103674814A (en) * | 2012-09-13 | 2014-03-26 | 香港城市大学 | Methods and means for manipulating particles |
| CN104216103A (en) * | 2014-09-05 | 2014-12-17 | 华中科技大学 | Micropipe and optical tweezers measurement and control system |
| CN207440383U (en) * | 2017-11-20 | 2018-06-01 | 中国计量大学 | A kind of extended focal depth micro imaging system of combination optical tweezer function |
Non-Patent Citations (1)
| Title |
|---|
| NIKOLAI KIESEL 等: "Cavity cooling of an optically levitated submicron particle", PHYSICAL REVIEW LETTERS, vol. 110, no. 35, pages 14180, XP055391773, DOI: 10.1073/pnas.1309167110 * |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111044417A (en) * | 2019-12-11 | 2020-04-21 | 之江实验室 | Device for detecting particle size by using mechanical effect of light and testing method |
| CN111750778A (en) * | 2020-07-01 | 2020-10-09 | 浙江大学 | Particle position detection device based on double-optical-tweezers system and precision improvement method |
| CN111750778B (en) * | 2020-07-01 | 2021-04-20 | 浙江大学 | Particle position detection device based on double-optical-tweezers system and precision improvement method |
| CN111855505A (en) * | 2020-07-07 | 2020-10-30 | 浙江大学 | Microsphere cluster state detection device and detection method applied to vacuum optical trap system |
| CN111855505B (en) * | 2020-07-07 | 2021-12-28 | 浙江大学 | Microsphere cluster state detection device and detection method applied to vacuum optical trap system |
| CN113380436A (en) * | 2021-04-28 | 2021-09-10 | 浙江大学 | Frequency-adjustable stable rotating device in vacuum optical tweezers system and use method |
| CN114720722A (en) * | 2022-04-06 | 2022-07-08 | 中国人民解放军国防科技大学 | Method and device for stabilizing scale factor of optical suspension acceleration sensor |
Also Published As
| Publication number | Publication date |
|---|---|
| CN110262029B (en) | 2024-01-05 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110262029A (en) | The control device and method of light capture particle | |
| CN111175969B (en) | Optical tweezers system based on vortex pair light beam | |
| Buunen et al. | Laser–Doppler velocity meter applied to tympanic membrane vibrations in cat | |
| Weisen | The phase contrast method as an imaging diagnostic for plasma density fluctuations | |
| CN108827448B (en) | Vibration and inclination angle measurement system and method based on plane reflector and photoelectric array | |
| JP7381816B2 (en) | Optical levitation angular velocity measurement device and method based on the geometric phase of solid-state atomic spins | |
| CN103869462B (en) | Device for carrying out splicing mirror common-phase control by utilizing cavity ring-down technology | |
| CN210199398U (en) | Control device for light trapping particles | |
| CN107064826B (en) | A kind of nonmagnetic atom microscopic method based on chamber resonance and magnetic aggregated structure | |
| CN111026180B (en) | STM32+ FPGA-based SERF inertia measuring device high-stability laser electric control system | |
| Frigerio et al. | Nested closed-Loop control of Quasi-Static MEMS scanners with large dynamic range | |
| CN103809166B (en) | A kind of Michelson interference type spectral filter resonant frequency locking device and method | |
| CN108267430B (en) | A kind of a wide range of electron-beam excitation fluorescence imaging and spectral measurement device and its method | |
| CN108896192B (en) | Pulse autocorrelation measuring device and method based on single-layer graphene | |
| CN117091510B (en) | Device and method for measuring displacement of suspended transparent medium microsphere | |
| CN106301109B (en) | Circuit for controlling motor and motor control method | |
| van Netten | Laser interferometer microscope for the measurement of nanometer vibrational displacements of a light‐scattering microscopic object | |
| CN110134005B (en) | Composite control system of electromagnetic type scanning grating micro-mirror | |
| Wickramasinghe et al. | Phase imaging with the scanning acoustic microscope | |
| US4707597A (en) | Method and apparatus for acoustic supervision of adjustment operations at optical devices | |
| Frigerio et al. | Efficient phase and quadrature control of a PZT resonant MEMS microscanner with piezoresistive position sensor | |
| CN114111623B (en) | Electric control focusing full-field optical coherence tomography system and method thereof | |
| Keeler et al. | Optically accessible MEMS resonant mass sensor for biological applications | |
| JP2000200922A (en) | Optical signal detecting device and its method | |
| Smeethe et al. | An electronically controlled Fabry-Perot spectrometer |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |