CN110231623A - A kind of quasi-optical light path device detecting plasma properties - Google Patents
A kind of quasi-optical light path device detecting plasma properties Download PDFInfo
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Abstract
The invention discloses a kind of quasi-optical light path devices for detecting plasma properties, comprising: microwave signal source, quasi-optical illumination path, quasi-optical reflected light path, plasma to be measured；Quasi-optical illumination path includes beam expanding lens, spectroscope, variable focus lens package, focus lens group；Quasi-optical reflected light path and quasi-optical illumination path share focus lens group, variable focus lens package, spectroscope, further include reflecting mirror and the face E imaging len；The main detection that can preferably realize plasma property of the present invention, the design of variable focus lens package realize simple, convenient zoom, can continuously adjust the resolution ratio of microwave optics system；When adjusting the resolution ratio of variable focus lens package change microwave optics system, in the case where the wave-front curvature for reaching plasma dignity changes very little, it can be achieved with the requirement of resolution adjustment, it ensure that the matched of this wave-front curvature Yu plasma dignity, reduce the error of measurement, the performance of entire microwave optics system is more preferable.
Description
Technical field
The invention belongs to field of optical detection, and in particular to detect plasma in a kind of microwave reflection imaging diagnosis system
The quasi-optical light path device of property.
Background technique
Controlled nuclear fusion is the important channel that the mankind finally solve energy problem, tokamak device be develop at present it is controlled
A kind of main device of nuclear fusion, however still there is certain difficulty in the property that detect plasma.Microwave reflection at
It is to combine microwave reflection diagnostic techniques and standard as system is one of direct observation state-of-the-art means of plasma turbulence image
What optical imaging concept grew up.The design key of collimator optical system is of Gaussian beam beam size and wave-front curvature
Match, and can be realized continuous vari-focus, reaches requirement of the system to change resolution.
2003, Jeong of South Korea et al. devised heterodyne method electron gyroradiation system, was held in the palm using this systematic survey
The electron temperature of Karma gram plasma, spatial resolution are less than 5cm.The Li Yingliang et al. of domestic southwest physical study institute is used
Electron gyroradiation method measures HL-2A Tokamak Plasma, spatial resolution 3cm.Chinese Academy of Sciences in 2005 etc.
The Ling Bili et al. of gas ions physics Institute measures HT-7 Tokamak Plasma, and spatial resolution is about 2cm.At this
In a little diagnostic systems, spatial resolution is not very high, and resolution ratio is unable to flexible modulation.Also, it is micro- in research at this stage
The microwave wavelength that wave signal source emits needs further to detect plasma properties, it is necessary to higher micro- probably in 8mm
Wave frequency rate.Therefore, it designs a kind of higher frequency, meet requirement and wave-front curvature radius phase of the system to Gaussian beam radius
The collimator optical system matched is critically important.
Summary of the invention
The purpose of the present invention is to provide one kind to be suitable for High power microwavs signal source, can good continuous vari-focus, resolution
Rate high microwave optics system can satisfy design to Gaussian beam beam size, the matching of wave-front curvature radius, systemic resolution
It is required that.
For achieving the above object, this application provides a kind of quasi-optical light path device for detecting plasma properties, institutes
Stating device includes:
Microwave signal source, quasi-optical illumination path, quasi-optical reflected light path, plasma to be measured；Microwave signal source passes through antenna
Millimeter wave is issued in the form of Gaussian beam, is then incident on plasma to be measured and is reflected by quasi-optical illumination path,
The reflected beams reach exploring antenna by quasi-optical reflected light path, and exploring antenna passes through the signal and process that issue to microwave signal source
Signal after reflection carries out mixing and phase demodulation, the phase change of signal is detected, so that it is determined that the property of plasma；Quasi-optical photograph
Penetrating optical path includes: beam expanding lens, spectroscope, variable focus lens package, focus lens group；Incident Gaussian beam is successively passed through beam expanding lens, is divided
Light microscopic, variable focus lens package, focus lens group, which are incident on plasma to be measured, to be reflected；Quasi-optical reflected light path include with it is quasi-optical
The shared focus lens group of illumination path, variable focus lens package, spectroscope, quasi-optical reflected light path further include reflecting mirror and the imaging of the face E
Lens；The reflected beams successively pass through focus lens group, variable focus lens package, spectroscope, reflecting mirror, the face E imaging len；By the face E
Signal after imaging len is irradiated on exploring antenna.
Lens in device are made of polythene material, and the density of polythene material is all larger than 0.93*103kg/m3；
The beam expanding lens plane of incidence is concavees lens, and another side is plane mirror；The spectroscope is made of polytetrafluoroethylene (PTFE), is guaranteed in quasi-optical photograph
It penetrates in optical path, Gaussian beam can be passed through with the loss of very little, and in quasi-optical reflected light path, it is anti-that spectroscope is then equivalent to one side
Penetrate mirror；The variable focus lens package includes four sides lens composition, and using the form of preposition fixed group, the first face lens use two sides all
It is the design of plane mirror, as the fixation lens of lens group, second and the design of fourth face lens convex lens, they pass through joint debugging
Mode carries out zoom, and third face lens use the design of concavees lens, for focusing to quasi-optical light path system；Focus lens group
Including a face concavees lens and a face concavees lens.
Microwave signal source launches Gaussian beam, after expanding via beam expanding lens, carries out zoom and tune by variable focus lens package
Coke is finally focused Gaussian beam by focus lens group, and guaranteeing to reach, the wave beam radius in plasma dignity is enough
Gaussian beam is set to be unlikely to too to disperse under the premise of big, dissipate too many energy.Meanwhile design when make reach etc. from
The wave-front curvature radius of the Gaussian beam of daughter and the radius of curvature of plasma dignity match, and just can guarantee Gaussian beam in this way
Quasi-optical reflected light path can be entered along former quasi-optical optical path after the reflection of plasma dignity, ensured that enough Gauss lights
Reach exploring antenna.The realization of the detection method is that the signal by going out to signal source is mixed with the signal after reflection
And phase demodulation, the phase change of signal is detected, so that it is determined that the property of plasma.
Preferably, the microwave signal source uses 5mm microwave source, is sent out this millimeter wave in the form of Gaussian beam by antenna
Then pass through quasi-optical illumination path out, can be passed through with low-loss, and guarantee there are enough energy when reaching test surface, it can be clear
Clear images in imaging surface.
Preferably, beam expanding lens is placed in the design of the quasi-optical illumination path at distance microwave signal source 30-60GHz, by
It is infinitely great in the Gaussian beam radius of curvature launched by antenna, a plane wave is had been converted into, formula is passed throughω Gauss beam radius, ω0For waist radius, z is axial distance, zcFor confocal parameter, it can be seen that
When with a distance from a tight waist much smaller than it is confocal apart from when, even when wave beam radius becomes when Gaussian beam has propagated great distances
Change still can very little.Variable focus lens package uses preposition fixed group, the mechanical compensation method of double groups of linkage zoom single groups compensation.By same
The resolution ratio for continuously adjusting quasi-optical light path system may be implemented in bis- groups of Zoom lens of Shi Yidong, and this method can be well
Realize the compensation to image planes.Focus lens group uses the combination of concavees lens and convex lens, enables Gaussian beam to need size
Wave beam radius focuses in plasma dignity.
Preferably, the design of the quasi-optical reflected light path is reached based on Gaussian beam by the quasi-optical optical path of irradiation of design
Match when plasma with plasma surface, for the Gaussian beam of reflection along the principle of backtracking, reflection and irradiation are quasi-
The quasi-optical optical path of light optical path common sparing, and quasi-optical optical path is substantially all and is made of lens.Meanwhile their physical height is all poor
Seldom, it can easily be mounted on and be similar in same level, optical center is also easy to align with, and facilitates carry out zooming adjustment.
Preferably, when microwave frequency is equal to the cutoff frequency of critical surface, microwave will reflect, and irradiate wave by measurement
The position that cutoff layer is determined with the phase change of probing wave, by the frequency of microwave it can be concluded that the density point of plasma
Cloth.It implements as follows:
(1) if wave frequency is far longer than the collision frequency of plasma, its folding in the plasma
Penetrating rate and plasma density has following relationship:
Wherein, n is the refractive index of electromagnetic wave in the plasma, and ω is electromagnetism angular frequency, ncFor plasma electron
Density, ωpFor plasma angular frequency, e is electronics, meFor electron mass, ε0For dielectric constant,For incident wave frequency
Rate.
When incident popin rate is equal with plasma frequency, the value of refractive index is zero, so as to find out plasma electricity
Sub- density:
If irradiating plasma using different frequencies, corresponding cutoff layer electron density can be obtained, to obtain
Obtain plasma electron density spatial distribution.
(2) position of the cutoff layer is determined by the phase change of incidence wave and back wave.Phase shift in whole process
It may be expressed as: by geometrical optics approximation method
In formula, φ is phase shift, f0For electromagnetic wave centre frequency, c is the light velocity, and n (R) is local indexes of refraction, R1For plasma
Edge radius, Rc(f0) it is cutoff layer radius.Reflecting layer position is obtained by Abel transformation:
In formula, fcFor plasma frequency,For the time delay of whole process, whereinFor difference frequency.By measuring 0~f0In rangeValue, so that it may obtain the position in reflecting layer.
Microwave signal source launches Gaussian beam in the present apparatus, after expanding via beam expanding lens, is carried out by variable focus lens package
Zoom and focusing are finally focused Gaussian beam by focus lens group, are guaranteeing to reach the wave beam in plasma dignity
Gaussian beam is set to be unlikely to too to disperse under the premise of radius is sufficiently large, dissipate too many energy.Meanwhile making when design
The wave-front curvature radius of Gaussian beam and the radius of curvature of plasma dignity for reaching plasma match, and just can guarantee in this way
Gaussian beam can enter quasi-optical reflected light path along former quasi-optical optical path after the reflection of plasma dignity, ensure that enough
Gauss light reach exploring antenna.
One or more technical solution provided by the present application, has at least the following technical effects or advantages:
Device volume is smaller, and is easily installed, and each optical center of lens is easy to be aligned, and facilitates adjusting.
Microwave optics device has a good zoom capabilities, variable focus lens package using preposition fixed group form, second and the
Four sides lens, which move together, can be carried out zoom, as long as and mobile very little a distance, so that it may have significant, continuous
Resolution ratio variation, this process is easy to accomplish, and after mobile, the optical center of each lens is substantially also held in same horizontal line
On.
In addition, wave-front curvature and plasma dignity are bent when Gaussian beam reaches plasma dignity by this quasi-optical device
Preferably, and after moving variable focus lens package, Curvature Matching is still preferable for rate matching.
Detailed description of the invention
Attached drawing described herein is used to provide to further understand the embodiment of the present invention, constitutes one of the application
Point, do not constitute the restriction to the embodiment of the present invention；
Fig. 1 is the quasi-optical illumination path figure in 5cm resolution ratio collimator optical system of the invention；
In Fig. 1: (1-1) is beam expanding lens；(1-2) is spectroscope；(1-3) is the first zoom lens；(1-4) is the second zoom
Lens -2；(1-5) is third zoom lens；(1-6) is the 4th zoom lens；(1-7) is the first condenser lens；(1-8) is the
Two condenser lenses；Wherein, (1-3)~(1-6) is variable focus lens package, and (1-3) is the preposition fixed lens in variable focus lens package,
(1-4) and (1-6) common joint debugging realizes that zoom, (1-5) are focusing lens；(1-7) and (1-8) forms focus lens group；
Fig. 2 is the quasi-optical reflected light path figure in 5cm resolution ratio collimator optical system of the invention；
In Fig. 2: (2-1)~(2-7) is to share quasi-optical light path part with quasi-optical illumination path, is followed successively by reflecting mirror thereafter
(2-8) is the face E imaging len (2-9)；
Fig. 3 is the quasi-optical illumination path figure in 2cm resolution ratio collimator optical system of the invention；
(3-1)~(3-8) respectively corresponds each quasi-optics mirror in (1-1)~(1-8) in Fig. 3；Fig. 3 and Fig. 1 is resolution ratio
It is different, resolution ratio is changed by movement (1-4) and (1-6), obtains measurement result.
Specific embodiment
To better understand the objects, features and advantages of the present invention, with reference to the accompanying drawing and specific real
Applying mode, the present invention is further described in detail.It should be noted that in the case where not conflicting mutually, the application's
Feature in embodiment and embodiment can be combined with each other.
In the following description, numerous specific details are set forth in order to facilitate a full understanding of the present invention, still, the present invention may be used also
Implemented with being different from the other modes being described herein in range using other, therefore, protection scope of the present invention is not by under
The limitation of specific embodiment disclosed in face.
The embodiment of the present application provides a kind of quasi-optical light path device for detecting plasma properties, and described device includes:
Microwave signal source, quasi-optical illumination path, quasi-optical reflected light path, plasma to be measured；Microwave signal source passes through antenna
Millimeter wave is issued in the form of Gaussian beam, is then incident on plasma to be measured and is reflected by quasi-optical illumination path,
The reflected beams reach exploring antenna by quasi-optical reflected light path, and exploring antenna passes through the signal and process that issue to microwave signal source
Signal after reflection carries out mixing and phase demodulation, the phase change of signal is detected, so that it is determined that the property of plasma；Quasi-optical photograph
Penetrating optical path includes: beam expanding lens, spectroscope, variable focus lens package, focus lens group；Incident Gaussian beam is successively passed through beam expanding lens, is divided
Light microscopic, variable focus lens package, focus lens group, which are incident on plasma to be measured, to be reflected；Quasi-optical reflected light path include with it is quasi-optical
The shared focus lens group of illumination path, variable focus lens package, spectroscope, quasi-optical reflected light path further include reflecting mirror and the imaging of the face E
Lens；The reflected beams successively pass through focus lens group, variable focus lens package, spectroscope, reflecting mirror, the face E imaging len；By the face E
Signal after imaging len is irradiated on exploring antenna.
Wherein, in the embodiment of the present application, the lens in device are made of polythene material, and polythene material is close
Degree is all larger than 0.93*103kg/m3；The beam expanding lens plane of incidence is concavees lens, and another side is plane mirror.
Wherein, in the embodiment of the present application, spectroscope is made of polytetrafluoroethylene (PTFE).
Wherein, in the embodiment of the present application, variable focus lens package includes four sides lens composition, using the shape of preposition fixed group
Formula is followed successively by the first face to fourth face lens along the optical propagation direction of incident Gaussian beam, and the first face lens two sides is plane
Mirror, and the fixation lens as variable focus lens package；Second face and the equal lenticular lens of fourth face lens, the second face and fourth face are saturating
Mirror carries out zoom by way of joint debugging；Third face lens are double concave lens for focusing to quasi-optical light path system, are become
Focus lens group uses by while moving the second face and fourth face lens realize the resolution ratio for continuously adjusting quasi-optical illumination path.
Wherein, in the embodiment of the present application, focus lens group includes successively arranging along the optical propagation direction of incident Gaussian beam
A double concave lens and a double concave lens for column.
Wherein, in the embodiment of the present application, microwave signal source uses 5mm microwave source.
Wherein, in the embodiment of the present application, in the quasi-optical illumination path, distance microwave signal source preset range such as
Beam expanding lens is placed at 35-60GHz.
Wherein, in the embodiment of the present application, when microwave frequency is equal to the cutoff frequency of critical surface, microwave will occur anti-
Penetrate, the position of cutoff layer determined by the phase change of measurement irradiation wave and probing wave, by the frequency of microwave obtain etc. from
The Density Distribution of daughter.
Wherein, in the embodiment of the present application, (1) if wave frequency be greater than plasma collision frequency, electromagnetism
The refractive index of wave in the plasma and plasma density have following relationship:
Wherein, n is the refractive index of electromagnetic wave in the plasma, and ω is electromagnetism angular frequency, ncFor plasma electron
Density, ωpFor plasma angular frequency, e is electronics, meFor electron mass, ε0For dielectric constant,For incident wave frequency
Rate；
When incident popin rate is equal with plasma frequency, the value of refractive index is zero, so as to find out plasma electricity
Sub- density:
Plasma is irradiated using different frequencies, then corresponding cutoff layer electron density can be obtained, to obtain
Plasma electron density spatial distribution；
(2) position of the cutoff layer, the phase shift in whole process are determined by the phase change of incidence wave and back wave
It is indicated by geometrical optics approximation method are as follows:
In formula, φ is phase shift, f0For electromagnetic wave centre frequency, c is the light velocity, and n (R) is local indexes of refraction, R1For plasma
Edge radius, Rc(f0) it is cutoff layer radius；Reflecting layer position is obtained by Abel transformation:
In formula, fcFor plasma frequency,For the time delay of whole process, whereinFor difference frequency；By measuring 0~f0In rangeValue, then can obtain the position in reflecting layer.
Wherein, in the embodiment of the present application, the Gauss of plasma is reached by irradiating quasi-optical optical path based on Gaussian beam
The wave-front curvature radius of light beam and the radius of curvature of plasma dignity match, the object of quasi-optical illumination path and quasi-optical reflected light path
Reason height matches.
As shown in Figure 1, 2, the microwave optics system of plasma properties is detected in microwave reflection imaging diagnosis system, including
Quasi-optical illumination path, quasi-optical reflected light path.Quasi-optical illumination path is by beam expanding lens (1-1), spectroscope (1-2), variable focus lens package
The part such as ((1-3)~(1-6)), focus lens group ((1-7)~(1-8)) design composition.Quasi-optical reflected light path, with quasi-optical irradiation
It is quasi- that optical path shares the part such as focus lens group ((2-1)~(2-2)), variable focus lens package ((2-3)~(2-6)), spectroscope (2-7)
Light optical path and reflecting mirror (2-8) and the face E imaging len (2-9).
In quasi-optical illumination path, since the Gaussian beam radius of curvature launched by antenna is infinitely great, have been converted into
One plane wave, though when Gaussian beam has propagated great distances, wave beam radius change still can very little, therefore first with expanding
Mirror (1-1) expands Gaussian beam, then carries out zoom by variable focus lens package ((1-3)~(1-6)), is joined by two
Modulation focus lens move together, and realization continuously adjusts resolution ratio, finally, via in focus lens group ((1-7)~(1-8))
Two face E condenser lenses be focused, adjust the curvature of Gaussian beam, Gaussian beam beam spot half when guaranteeing to reach plasma dignity
Diameter size is enough, and wave-front curvature matches, and can be returned after reflecting Gaussian beam with former quasi-optical optical path.
In quasi-optical reflected light path, via the common sparing with quasi-optical illumination path, then pass through a face reflecting mirror (2-8)
Keep Gaussian beam propagation direction horizontal, finally passes through the face an E imaging len (2-9), be irradiated to detection array antenna.In addition anti-
Make to be imaged quasi-optical light path part level so that it is convenient to which we install quasi-optical optical path and detection array antenna after penetrating mirror.Pass through mixing
Device and phase discriminator compare incidence wave signal and reflection wave signal, their phase difference are obtained, finally by computer pair
Data are acquired processing and obtain result.
Although preferred embodiments of the present invention have been described, it is created once a person skilled in the art knows basic
Property concept, then additional changes and modifications may be made to these embodiments.So it includes excellent that the following claims are intended to be interpreted as
It selects embodiment and falls into all change and modification of the scope of the invention.
Obviously, various changes and modifications can be made to the invention without departing from essence of the invention by those skilled in the art
Mind and range.In this way, if these modifications and changes of the present invention belongs to the range of the claims in the present invention and its equivalent technologies
Within, then the present invention is also intended to include these modifications and variations.
Claims (10)
1. a kind of quasi-optical light path device for detecting plasma properties, which is characterized in that described device includes:
Microwave signal source, quasi-optical illumination path, quasi-optical reflected light path, plasma to be measured；Microwave signal source will milli by antenna
Metric wave is issued in the form of Gaussian beam, is then incident on plasma to be measured and is reflected by quasi-optical illumination path, is reflected
Light beam reaches exploring antenna by quasi-optical reflected light path, and exploring antenna is by the signal that issues to microwave signal source and by reflecting
Signal afterwards carries out mixing and phase demodulation, the phase change of signal is detected, so that it is determined that the property of plasma；Quasi-optical irradiation light
Road includes: beam expanding lens, spectroscope, variable focus lens package, focus lens group；Incident Gaussian beam successively pass through beam expanding lens, spectroscope,
Variable focus lens package, focus lens group, which are incident on plasma to be measured, to be reflected；Quasi-optical reflected light path includes and quasi-optical irradiation
The shared focus lens group of optical path, variable focus lens package, spectroscope, quasi-optical reflected light path further includes reflecting mirror and the face E imaging len；
The reflected beams successively pass through focus lens group, variable focus lens package, spectroscope, reflecting mirror, the face E imaging len；It is saturating by the imaging of the face E
Signal after mirror is irradiated on exploring antenna.
2. the quasi-optical light path device of detection plasma properties according to claim 1, which is characterized in that saturating in device
Mirror is made of polythene material, and the density of polythene material is all larger than 0.93*103kg/m3；The beam expanding lens plane of incidence is recessed
Mirror, another side are plane mirror.
3. the quasi-optical light path device of detection plasma properties according to claim 1, which is characterized in that spectroscope uses
Polytetrafluoroethylene (PTFE) is made.
4. the quasi-optical light path device of detection plasma properties according to claim 1, which is characterized in that variable focus lens package
It is formed including four sides lens, using the form of preposition fixed group, is followed successively by the first face along the optical propagation direction of incident Gaussian beam
To fourth face lens, the first face lens two sides is plane mirror, and the fixation lens as variable focus lens package；Second face and the 4th
The equal lenticular lens of face lens, the second face and fourth face lens carry out zoom by way of joint debugging；Third face lens are two-sided
For focusing to quasi-optical light path system, variable focus lens package uses to be passed through while moving the second face and fourth face lens concavees lens
Realize the resolution ratio for continuously adjusting quasi-optical illumination path.
5. the quasi-optical light path device of detection plasma properties according to claim 1, which is characterized in that focus lens group
Including the double concave lens and a double concave lens being arranged successively along the optical propagation direction of incident Gaussian beam.
6. the quasi-optical light path device of detection plasma properties according to claim 1, which is characterized in that microwave signal source
Using 5mm microwave source.
7. the quasi-optical light path device of detection plasma properties according to claim 1, which is characterized in that the quasi-optical photograph
It penetrates in optical path, beam expanding lens is placed at distance microwave signal source 30-60GHz.
8. the quasi-optical light path device of detection plasma properties according to claim 1, which is characterized in that work as microwave frequency
Equal to critical surface cutoff frequency when, microwave will reflect, and be determined by the phase change of measurement irradiation wave and probing wave
The position of cutoff layer obtains the Density Distribution of plasma by the frequency of microwave.
9. the quasi-optical light path device of detection plasma properties according to claim 1, it is characterised in that:
(1) if wave frequency be greater than plasma collision frequency, the refractive index of electromagnetic wave in the plasma with etc.
Plasma density has following relationship:
Wherein, n is the refractive index of electromagnetic wave in the plasma, and ω is electromagnetism angular frequency, ncFor plasma electron density,
ωpFor plasma angular frequency, e is electronics, meFor electron mass, ε0For dielectric constant,For incident wave frequency rate；
When incident popin rate is equal with plasma frequency, the value of refractive index is zero, close so as to find out plasma electron
Degree:
Plasma is irradiated using different frequency, then can obtain corresponding cutoff layer electron density, thus obtain etc. from
Daughter electron density spatial distribution；
(2) position of the cutoff layer is determined by the phase change of incidence wave and back wave, the phase shift in whole process passes through
Geometrical optics approximation method indicates are as follows:
In formula, φ is phase shift, f0For electromagnetic wave centre frequency, c is the light velocity, and n (R) is local indexes of refraction, R1For edge plasma
Radius, Rc(f0) it is cutoff layer radius；Reflecting layer position is obtained by Abel transformation:
In formula, fcFor plasma frequency,For the time delay of whole process, whereinFor difference frequency；By measuring 0~f0In rangeValue, then can obtain the position in reflecting layer.
10. the quasi-optical light path device of detection plasma properties according to claim 1, which is characterized in that be based on Gauss
The wave-front curvature radius and the curvature half of plasma dignity that light beam reaches the Gaussian beam of plasma by irradiating quasi-optical optical path
Diameter matches, and quasi-optical illumination path and the physical height of quasi-optical reflected light path match.
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| CN113156428A (en) * | 2021-04-20 | 2021-07-23 | 核工业西南物理研究院 | Imaging optical system for magnetic confinement fusion plasma |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113156428A (en) * | 2021-04-20 | 2021-07-23 | 核工业西南物理研究院 | Imaging optical system for magnetic confinement fusion plasma |
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