CN110224881B - Test system - Google Patents

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Publication number
CN110224881B
CN110224881B CN201811517755.3A CN201811517755A CN110224881B CN 110224881 B CN110224881 B CN 110224881B CN 201811517755 A CN201811517755 A CN 201811517755A CN 110224881 B CN110224881 B CN 110224881B
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signal
splitter
power
spectrum analyzer
test
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CN110224881A (en
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李扬德
林郁璋
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Pegatron Corp
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Pegatron Corp
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/30Monitoring; Testing of propagation channels
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L43/00Arrangements for monitoring or testing data switching networks
    • H04L43/50Testing arrangements

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  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)

Abstract

A test system comprises a spectrum analyzer, a cable modem terminal system, a first splitter and a second splitter. The first splitter splits a first downlink signal output by the cable modem terminal system into two second downlink signals, and the two second downlink signals are respectively transmitted to the device to be tested and the spectrum analyzer, so that the spectrum analyzer obtains the reference receiving power of the received second downlink signal according to the two second downlink signals, and compares the reference receiving power with the actual receiving power of the second downlink signal received by the device to be tested. The second splitter splits the first uplink signal output by the device to be tested into two second uplink signals, and the two second uplink signals are respectively transmitted to the spectrum analyzer and the cable modem terminal system, so that the spectrum analyzer obtains the actual transmission power of the received second uplink signal according to the two second uplink signals, and the actual transmission power of the received second uplink signal is compared with the reference transmission power of the first uplink signal output by the device to be tested.

Description

Test system
Technical Field
The present disclosure relates to a test system, and more particularly, to a test system for testing a modem.
Background
In order to strictly keep the quality of the modem production, the modem must be certified by a certification unit before the modem is produced, wherein the more important certification items related to hardware include the test of the modem's receiving power, transmission power, anti-interference capability and output signal.
As a test method of the certification items of the modem is known to have different test structures according to different certification items, if a tester needs to test a plurality of certification items of the modem, it is necessary to spend time and labor to establish a plurality of test structures; in addition, since the same modem can only test for one certification item at a time, but cannot test for multiple certification items at the same time, it takes time and labor to test for multiple certification items; moreover, when the modem is tested in different test architectures, frequent plugging and unplugging actions are generated between the modem and the connected instrument, thereby reducing the service life of the instrument connector.
Disclosure of Invention
In view of the above problems, it is an object of the present invention to provide a test system that can solve the problems of time and labor consumption and reduced instrument connector life in the test of the authentication items of the known modem.
One embodiment of the present disclosure discloses a test system for testing the receiving and transmitting power of a device under test. The test system comprises a spectrum analyzer, a Cable Modem Termination System (CMTS), a first splitter and a second splitter. The cable modem termination system is configured to output a first downstream signal. The first splitter is coupled to the device under test, the spectrum analyzer and the cable modem terminal system, and is configured to split the first downlink signal into two second downlink signals with the same power, and transmit the two second downlink signals to the device under test and the spectrum analyzer, respectively, so that the reference received power of the second downlink signal received by the spectrum analyzer is compared with the actual received power of the second downlink signal received by the device under test, and a first test result is obtained. The second splitter is coupled to the device to be tested, the spectrum analyzer and the cable modem terminal system, and is used for splitting the first uplink signal output by the device to be tested into two second uplink signals with the same power, and transmitting the two second uplink signals to the spectrum analyzer and the cable modem terminal system respectively, so that the actual transmission power of the second uplink signal received by the spectrum analyzer is compared with the reference transmission power of the first uplink signal output by the device to be tested, and a second test result is obtained.
One embodiment of the present disclosure discloses a test system for testing the receiving and transmitting power of a device under test. The test system comprises a spectrum analyzer, a cable modem terminal system, an attenuator, an amplifier, a first shunt and a second shunt. The cable modem termination system is configured to output a first downstream signal. The attenuator is coupled to the cable modem terminal system and is used for attenuating the power of the first downlink signal. The amplifier is coupled to the attenuator and is used for amplifying the power of the first downlink signal with attenuated power. And the first splitter is coupled with the spectrum analyzer and the amplifier and used for splitting the first downlink signal passing through the attenuator and the amplifier into two second downlink signals with the same power and respectively transmitting the two second downlink signals to the device to be tested and the spectrum analyzer, so that the reference receiving power of the second downlink signal received by the spectrum analyzer is compared with the actual receiving power of the second downlink signal received by the device to be tested to obtain a first test result. The second splitter is coupled to the spectrum analyzer and the attenuator and is configured to split the first uplink signal output by the device under test into two second uplink signals with the same power, and the two second uplink signals are transmitted to the spectrum analyzer and the attenuator, respectively, so that the actual transmission power of the second uplink signal received by the spectrum analyzer is compared with the reference transmission power of the first uplink signal output by the device under test, and a second test result is obtained.
Based on the technical means, the test system of the present disclosure can test the receiving power, the transmission power and the output signal of the device to be tested, so that a tester can test a plurality of certification projects by using the test system of the present disclosure without spending time and manpower to establish different test architectures for different certification projects, thereby solving the defects of "consuming time and manpower" and "reducing the service life of an instrument connector" of the existing test method.
Drawings
FIG. 1 is a block diagram illustrating an architecture of a test system and a device under test according to an embodiment of the present disclosure;
FIG. 2 is a block diagram illustrating an architecture of a test system and a device under test according to another embodiment of the present disclosure;
FIG. 3A is a schematic diagram of the test system of FIG. 2 for testing the received power of a device under test;
FIG. 3B is a schematic diagram of the transmission power used to test the device under test according to the test system shown in FIG. 2;
FIG. 3C is a schematic diagram of the test system of FIG. 2 for testing the immunity of a device under test;
FIG. 3D is a schematic diagram of the test system of FIG. 2 for testing the first output signal output by the device under test;
FIG. 4A is a spectral diagram of the first output signal shown in FIG. 3D;
FIG. 4B is a spectrum diagram of the first frequency band signal shown in FIG. 3D;
FIG. 4C is a spectrum diagram of the second frequency band signal shown in FIG. 3D;
fig. 4D is a spectral diagram of the second output signal shown in fig. 3D.
Detailed Description
The following detailed description of the embodiments of the present disclosure will be provided in conjunction with the accompanying drawings, which are included to provide a further understanding of the invention, and are not intended to limit the scope of the disclosure, as it may be embodied in other specific forms, and the description of the operation of the structures is not intended to limit the order of execution of the structures, and any structures resulting from the rearrangement of elements, which results in a device with equivalent technical effect, is intended to be within the scope of the disclosure.
Fig. 1 is a schematic diagram illustrating a test system 100 and a DUT according to an embodiment of the disclosure.
The test system 100 includes a spectrum analyzer 110, a Cable Modem Termination System (CMTS) 120, a first splitter SP1, and a second splitter SP 2.
The output terminal OT of the cable modem termination system 120 is arranged to output a first downstream signal DS 1. In one embodiment, the frequency band of the first downlink signal DS1 may be 5-42 (Mhz).
The first splitter SP1 is coupled between the spectrum analyzer 110 and the output terminal OT of the cable modem termination system 120, and is used to split the first downlink signal DS1 into two second downlink signals DS2 with the same power, and transmit the two second downlink signals DS2 to the device under test DUT and the spectrum analyzer 110, respectively, so as to compare the reference received power of the second downlink signal DS2 received by the spectrum analyzer 110 with the actual received power of the second downlink signal DS2 received by the device under test DUT, and obtain a first test result, where the first test result is a test result of the received power of the device under test DUT.
In one embodiment, the DUT may be a modem, but is not limited thereto.
The second splitter SP2 is coupled to the spectrum analyzer 110 and the input terminal IT of the cable modem termination system 120, and is used to split the first uplink signal US1 output by the device under test DUT into two second uplink signals US2 with the same power, and transmit the two second uplink signals US2 to the spectrum analyzer 110 and the input terminal IT of the cable modem termination system 120, respectively, so as to compare the actual transmission power of the second uplink signal US2 received by the spectrum analyzer 110 with the reference transmission power of the first uplink signal US1 output by the device under test DUT, and obtain a second test result, where the second test result is a test result of the transmission power of the device under test DUT. In one embodiment, the frequency band of the first uplink signal DS1 may be 54-1218 (Mhz).
Thus, the test system 100 can generate the test result of the reception power and the transmission power of the DUT by comparing the reference reception power and the actual reception power and comparing the reference transmission power and the actual transmission power. That is, under the architecture of the test system 100, the reception power and the transmission power of the DUT can be tested.
Referring to fig. 2, a schematic diagram of a test system 200 and a DUT according to another embodiment of the disclosure is shown.
The test system 200 shown in fig. 2 is substantially the same as the test system 100 shown in fig. 1, such as the spectrum analyzer 110, the cable modem termination system 120, the first splitter SP1 and the second splitter SP2 of the test system 200 shown in fig. 2, and therefore, the description thereof is omitted.
The differences between the test system 200 shown in FIG. 2 as compared to the test system 100 shown in FIG. 1 will be described below.
In one embodiment, the test system 200 further comprises a power regulator 130 coupled to the cable modem termination system 120, the first splitter SP1 and the second splitter SP 2.
Further, the power regulator 130 may further include an attenuator ATT coupled to the cable modem termination system 120 and a first amplifier AMP coupled to the attenuator ATT and the first splitter SP 1.
In detail, the attenuator ATT has a first band output FO1, a second band input FI2, a first band input FI1 and a second band output FO2, the second band input FI2 and the first band output FO1 of the attenuator ATT are respectively coupled to the output OT and the input IT of the cable modem termination system 120, the first band input FI1 of the attenuator ATT is coupled to the second splitter SP2, and the first amplifier AMP is coupled between the second band output FO2 and the first splitter SP1 of the attenuator ATT.
It should be noted that the designations of the first band output FO1, the second band input FI2, the first band input FI1, and the second band output FO2 of the attenuator ATT are used for convenience of description, and are not used to limit the directivity of each end point of the attenuator ATT. For example, the first band output FO1 of the attenuator ATT may be used as an input, or the second band input FI2 of the attenuator ATT may be used as an output.
In one embodiment, the test system 200 further includes a noise generating device 140 and a third shunt SP3, wherein the third shunt SP3 is coupled to the device under test DUT, the first shunt SP1 and the noise generating device 140.
Further, the noise generating device 140 may further include a first noise generator 141, a second noise generator 142 and a fourth shunt SP4, wherein the first noise generator 141 and the second noise generator 142 are coupled to the fourth shunt SP4, and the fourth shunt SP4 is coupled to the third shunt SP 3.
In one embodiment, the test system 200 further includes a first duplexer DP1, a second amplifier AMP, and a second duplexer DP 2.
The first duplexer DP1 has an input terminal IT, a first band output terminal FO1 and a second band output terminal FO2, wherein the input terminal IT of the first duplexer DP1 is coupled to the DUT via the coupler CP.
One end of the second amplifier AMP is coupled to the second band output terminal FO2 of the first duplexer DP 1.
The second duplexer DP2 has a first band input FI1, a second band input FI2 and an output OT, wherein the first band input FI1 of the second duplexer DP2 is coupled to the first band output FO1 of the first duplexer DP1, the second band input FI2 of the second duplexer DP2 is coupled to the other end of the second amplifier AMP, and the output OT of the second duplexer DP2 is coupled to the spectrum analyzer 110 through a switch SW.
IT should be noted that the designations of the input IT, the first band output FO1 and the second band output FO2 of the first duplexer DP1 and the designations of the first band input FI1, the second band input FI2 and the output OT of the second duplexer DP2 are used for convenience of description, and are not used to limit the directionality of each endpoint of the first duplexer DP1 and the second duplexer DP2, and further description is similar to the attenuator ATT, and therefore will not be described herein.
In one embodiment, the test system 200 further includes a third duplexer DP3 and a fourth duplexer DP 4.
The third duplexer DP3 has a first band input FI1, a second band input FI2 and an output OT, wherein the first band input FI1 of the third duplexer DP3 is coupled to the second splitter SP2, the second band input FI2 of the third duplexer DP3 is coupled to the first splitter SP1, and the output OT of the third duplexer DP3 is coupled to the spectrum analyzer 110 via the switch SW.
The fourth duplexer DP4 has an input IT, a first band output FO1 and a second band output FO2, wherein the input IT of the fourth duplexer DP4 is coupled to the third splitter SP3, the first band output FO1 of the fourth duplexer DP4 is coupled to the second splitter SP2, and the second band output FO2 of the fourth duplexer DP4 is coupled to the first splitter SP 1.
IT should be noted that the designations of the first band input end FI1, the second band input end FI2 and the output end OT of the third duplexer DP3 and the designations of the input end IT, the first band output end FO1 and the second band output end FO2 of the fourth duplexer DP4 are used for convenience of description, and are not used to limit the directionality of each end point of the third duplexer DP3 and the fourth duplexer DP4, and further description is similar to that of the attenuator ATT, and therefore not described in detail herein.
In addition, "L" and "H" shown in fig. 2 indicate end points through which the "first frequency band" and the "second frequency band" can pass, respectively, and the "L" and "H" are merely examples and are not intended to be limiting.
Referring to fig. 3A, a schematic diagram of the test system 200 shown in fig. 2 for testing the received power of the DUT is shown.
First, the cable modem termination system 120 outputs a first downlink signal DS1, and the first downlink signal DS1 is transmitted to the first splitter SP1 after passing through the attenuator ATT and the first amplifier AMP; then, the first splitter SP1 splits the first downlink signal DS1 passing through the attenuator ATT and the first amplifier AMP into two second downlink signals DS2 with the same power.
One of the second downstream signals DS2 is transmitted to the spectrum analyzer 110 through the third duplexer DP3 and the switch SW in the direction of the dashed arrow, so that the spectrum analyzer 110 can obtain the reference received power corresponding to the received second downstream signal DS 2.
The other of the second downstream signal DS2 is transmitted to the device under test DUT after passing through the fourth duplexer DP4, the third shunt SP3 and the coupler CP along the direction of the solid arrow, so that the device under test DUT can obtain the actual received power corresponding to the received second downstream signal DS 2.
After the reference received power and the actual received power corresponding to the DUT are obtained, the difference between the reference received power and the actual received power can be compared by an analysis host (not shown), thereby generating a first test result. For example, when the difference between the reference received power and the actual received power is more than 3dB, it indicates that the received power of the DUT is abnormal, and thus the first test result is "the received power is abnormal"; conversely, when the difference between the reference received power and the actual received power is less than 3dB, it indicates that the received power of the DUT still falls within the normal range, and thus the first test result is "received power is normal".
Referring to fig. 3B, a schematic diagram of the transmission power of the test system 200 shown in fig. 2 for testing the DUT is shown.
First, the device under test DUT outputs a first uplink signal US1, wherein the power of the first uplink signal US1 is a reference transmission power that the device under test DUT ideally should transmit, and the reference transmission power can be obtained from the device under test DUT. Then, the first uplink signal US1 passes through the third splitter SP3 and the fourth duplexer DP4 and is transmitted to the second splitter SP 2; and, the second splitter SP2 splits the first uplink signal US1 into two second uplink signals US2 with the same power.
After one of the second uplink signals US2 passes through the attenuator ATT along the direction of the solid arrow, the attenuator ATT attenuates the power corresponding to the received second uplink signal US2 to 0dB and transmits the attenuated power to the cable modem terminal system 120 so as to meet the relevant specification.
The other one of the second upstream signals US2 is transmitted to the spectrum analyzer 110 through the third duplexer DP3 and the switch SW in the direction of the dashed arrow, so that the spectrum analyzer 110 can obtain the actual received power corresponding to the received second upstream signal US 2.
After the reference transmission power and the actual transmission power corresponding to the DUT are obtained, the difference between the reference transmission power and the actual transmission power can be compared by the analysis host to generate a second test result. For example, when the difference between the reference received power and the actual received power is more than 2dB, it indicates that the transmission power of the DUT is abnormal, and thus the second test result is "transmission power is abnormal"; conversely, when the difference between the reference transmission power and the actual transmission power is less than 2dB, it indicates that the transmission power of the DUT still falls within the normal range, and thus the second test result is "normal transmission power".
Referring to fig. 3C, a schematic diagram of the test system 200 shown in fig. 2 is shown for testing the anti-interference capability of the DUT.
First, the cable modem termination system 120 outputs a first downlink signal DS1, and the first downlink signal DS1 is transmitted to the first splitter SP1 after passing through the attenuator ATT and the amplifier AMP; then, the first splitter SP1 splits the first downlink signal DS1 passing through the attenuator ATT and the amplifier AMP into two second downlink signals DS2 with the same power.
One of the second downstream signals DS2 is transmitted to the third splitter SP3 through the fourth duplexer DP4 in the direction of the solid arrow.
The first noise generator 141 generates a first noise signal NS1, and the second noise generator 142 generates a second noise signal NS 2. Then, the fourth shunt SP4 combines the first noise signal NS1 and the second noise signal NS2 into a noise signal NS, and transmits the noise signal NS to the third shunt SP 3. In some embodiments, the first noise generator 141 and/or the second noise generator 142 may be, for example, a random noise generator, a digital noise generator, a polynomial generator, a gaussian digital noise generator, or other noise generators applicable to the test system of the present disclosure.
The third splitter SP3 combines the received second downlink signal DS2 and the noise signal NS, and transmits the combined signal to the DUT through the coupler CP.
After the DUT receives the second downlink signal DS2 and the noise signal NS, the analysis host can analyze the condition that the DUT receives the second downlink signal, and then generate a third test result. Specifically, when the DUT is affected by the noise signal NS and cannot correctly receive the second downlink signal DS2, such that the DUT cannot be connected to the cable modem terminal system 120, or the DUT can be connected to the cable modem terminal system 120 but cannot correctly exchange packets, the interference rejection of the DUT is not good, and thus the third test result is "poor interference rejection"; conversely, when the DUT is not affected by the noise signal NS and can correctly receive the second downlink signal DS2, so that the DUT can be connected to the cable modem terminal system 120 and can correctly exchange packets, the DUT has good interference rejection capability, and thus the third test result is "good interference rejection capability".
Please refer to fig. 3D, and also refer to fig. 4A to 4D. FIG. 3D is a schematic diagram of a first output signal OS1 for testing the output of a device under test DUT in accordance with the test system 200 shown in FIG. 2. Fig. 4A to 4D are frequency spectrums of the first output signal OS1, the first frequency band signal FS1, the second frequency band signal FS2 and the second output signal OS2 shown in fig. 3D, respectively.
First, the device under test DUT outputs a first output signal OS1, wherein the first output signal OS1 has a first frequency band F1 and a second frequency band F2, as shown in fig. 4A. The first duplexer DP1 receives the first output signal OS1, and correspondingly outputs the first output signal OS1 according to the first frequency band F1 and the second frequency band F2 to the first frequency band signal FS1 and the second frequency band signal FS2, wherein the first frequency band signal FS1 only has the first frequency band F1, and the second frequency band signal FS2 only has the second frequency band F2, as shown in fig. 4B and 4C.
Then, the first band signal FS1 is transmitted to the second duplexer DP2, and the second band signal FS2 is transmitted to the second duplexer DP2 after passing through the second amplifier AMP. It should be noted that the purpose of the second amplifier AMP is to amplify the power of the second frequency band signal FS2 to avoid that the power of the second frequency band signal FS2 is too small to be measured.
The second duplexer DP2 combines the first frequency band signal FS1 and the power amplified second frequency band signal FS2 to generate a second output signal OS2, as shown in fig. 4D, and then the second output signal OS2 is transmitted to the spectrum analyzer 110 via the switch SW.
After the spectrum analyzer 110 receives the second output signal OS2, the analysis host may analyze whether the waveforms of the first frequency band F1 and the second frequency band F2 of the second output signal OS2 are abnormal, thereby generating a fourth test result.
For example, as shown in fig. 4D, when the waveform of the first frequency band F1 of the second output signal OS2 generates a skirt (not shown), or when the waveform of the second frequency band F2 of the second output signal OS2 generates a harmonic (not shown), it indicates that when the device under test DUT outputs the first output signal OS1, the first output signal OS1 will affect the operation of other peripheral electrical devices, and thus the fourth test result is "the first output signal OS1 is abnormal"; on the contrary, when the waveform of the first frequency band F1 of the second output signal OS2 is not in the tail and the second frequency band F2 has no harmonics, it indicates that the first output signal OS1 does not affect the operation of other peripheral electrical devices when the device under test DUT outputs the first output signal OS1, and thus the fourth test result is "the first output signal OS1 is normal".
In addition, the switch SW shown in fig. 2 and fig. 3A to fig. 3D can be used for switching according to different authentication items, for example, when the receiving power, the transmitting power or the interference rejection capability of the device under test DUT is tested, the switch SW only allows the transmission of signals between the spectrum analyzer 110 and the third duplexer DP 3; alternatively, the changeover switch SW allows only the transmission of signals between the spectrum analyzer 110 and the second duplexer DP2 when the output signal of the device under test DUT is being tested.
To sum up, the test system of the present disclosure can test the receiving power, the transmission power, the anti-interference capability, and the output signal of the device under test by using the components such as the spectrum analyzer, the cable modem terminal system, the first splitter, the second splitter, the noise generating device, the third splitter, the first duplexer, the amplifier, and the second duplexer, so that the tester can test multiple certification projects only by using the test system of the present disclosure, and does not need to spend time and manpower to establish different test structures for different certification projects, thereby solving the disadvantages of "consuming time and manpower" and "reducing the service life of the instrument connector" of the known test method.
Although the present invention has been described with reference to the above embodiments, it should be understood that the scope of the present invention is not limited to the above embodiments, and that various changes and modifications may be made by those skilled in the art without departing from the spirit and scope of the present invention.

Claims (10)

1. A test system for testing the receive and transmit power of a device under test, the test system comprising:
a spectrum analyzer;
a cable modem terminal system for outputting a first downlink signal;
a first splitter, coupled to the device under test, the spectrum analyzer and the cable modem terminal system, configured to split the first downlink signal into two second downlink signals with the same power, transmit the two second downlink signals to the device under test and the spectrum analyzer, respectively, use the power of the second downlink signal received by the spectrum analyzer as a reference received power, and compare the reference received power with an actual received power of the second downlink signal received by the device under test to obtain a first test result; and
and the second splitter is coupled with the device to be tested, the spectrum analyzer and the cable modem terminal system, and is used for splitting the first uplink signal output by the device to be tested into two second uplink signals with the same power, respectively transmitting the two second uplink signals to the spectrum analyzer and the cable modem terminal system, taking the power of the first uplink signal output by the device to be tested as reference transmission power, and comparing the reference transmission power with the actual transmission power of the second uplink signal received by the spectrum analyzer to obtain a second test result.
2. The test system of claim 1, further comprising:
a power regulator coupled to the cable modem termination system and the second splitter, and configured to regulate power of the second uplink signal output from the second splitter.
3. The test system of claim 1, further comprising:
noise generating means for generating a noise signal; and
and a third splitter, coupled to the device under test and the first splitter, for receiving the noise signal, combining the second downlink signal output by the first splitter with the noise signal, and transmitting the combined signal to the device under test, so as to obtain a third test result according to the condition of the second downlink signal received by the device under test.
4. The test system of claim 3, wherein the noise generating device comprises:
a first noise generator for generating a first noise signal;
a second noise generator for generating a second noise signal; and
a fourth shunt coupled to the first noise generator and the second noise generator and configured to combine the first noise signal and the second noise signal into the noise signal.
5. The test system of claim 3, further comprising:
the first duplexer is used for receiving a first output signal output by the device to be tested, wherein the first output signal comprises a first frequency band signal and a second frequency band signal, and the first duplexer outputs the first frequency band signal and the second frequency band signal respectively;
the amplifier is coupled with the first duplexer and used for amplifying the power of the second frequency band signal; and
a second duplexer, coupled to the spectrum analyzer, for combining the first band signal and the power amplified second band signal to generate a second output signal to the spectrum analyzer, so as to obtain a fourth test result.
6. The test system of claim 1, further comprising:
a third diplexer coupled to the first splitter and the second splitter and configured to transmit the second downlink signal from the first splitter to the spectrum analyzer and to transmit the second uplink signal from the second splitter to the spectrum analyzer; and
and a fourth duplexer coupled to the first splitter and the second splitter, and configured to transmit the second downlink signal from the first splitter to the device under test, and transmit the first uplink signal output by the device under test to the second splitter.
7. A test system for testing the receive and transmit power of a device under test, the test system comprising:
a spectrum analyzer;
a cable modem terminal system for outputting a first downlink signal;
an attenuator, coupled to the cable modem termination system, for attenuating the power of the first downlink signal;
an amplifier coupled to the attenuator for amplifying the power of the first downlink signal with attenuated power;
a first splitter, coupled to the spectrum analyzer and the amplifier, configured to split the first downlink signal passing through the attenuator and the amplifier into two second downlink signals with the same power, transmit the two second downlink signals to the device under test and the spectrum analyzer, respectively, use the power of the second downlink signal received by the spectrum analyzer as a reference received power, and compare the reference received power with an actual received power of the second downlink signal received by the device under test, so as to obtain a first test result; and
and the second splitter is coupled with the spectrum analyzer and the attenuator and is used for splitting the first uplink signal output by the device to be tested into two second uplink signals with the same power, the two second uplink signals are respectively transmitted to the spectrum analyzer and the attenuator, the power of the first uplink signal output by the device to be tested is used as reference transmission power, and the reference transmission power is compared with the actual transmission power of the second uplink signal received by the spectrum analyzer to obtain a second test result.
8. The test system of claim 7, further comprising:
noise generating means for generating a noise signal; and
and a third splitter, coupled to the device under test and the first splitter, for receiving the noise signal, combining the second downlink signal output by the first splitter with the noise signal, and transmitting the combined signal to the device under test, so as to obtain a third test result according to a condition that the device under test receives the corresponding second downlink signal.
9. The test system of claim 8, further comprising:
the first duplexer is used for receiving a first output signal output by the device to be tested, wherein the first output signal comprises a first frequency band signal and a second frequency band signal, and the first duplexer outputs the first frequency band signal and the second frequency band signal respectively;
the amplifier is coupled with the first duplexer and used for amplifying the power of the second frequency band signal; and
a second duplexer, coupled to the spectrum analyzer, for combining the first band signal and the power amplified second band signal to generate a second output signal to the spectrum analyzer, so as to obtain a fourth test result.
10. The test system of claim 7, further comprising:
a third diplexer coupled to the first splitter and the second splitter and configured to transmit the second downlink signal from the first splitter to the spectrum analyzer and to transmit the second uplink signal from the second splitter to the spectrum analyzer; and
and a fourth duplexer coupled to the first splitter and the second splitter, and configured to transmit the second downlink signal from the first splitter to the device under test, and transmit the first uplink signal output by the device under test to the second splitter.
CN201811517755.3A 2018-03-01 2018-12-12 Test system Active CN110224881B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
TW107106860A TWI645693B (en) 2018-03-01 2018-03-01 Testing system
TW107106860 2018-03-01

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