CN110224881B - test system - Google Patents

Abstract

A test system includes a spectrum analyzer, a cable modem terminal system, a first splitter and a second splitter. The first splitter splits the first downlink signal output by the cable modem terminal system into two second downlink signals, and transmits them to the device under test and the spectrum analyzer respectively, so that the spectrum analyzer can obtain the received second downlink signal. The reference received power is compared with the actual received power of the second downlink signal received by the device under test. The second splitter splits the first uplink signal output by the device under test into two second uplink signals, and transmits them to the spectrum analyzer and the cable modem terminal system respectively, so that the spectrum analyzer can obtain the received second uplink signal. The actual transmission power is compared with the reference transmission power of the first uplink signal output by the device under test.

Description

test system

technical field

The present disclosure relates to a test system, and in particular, to a test system for testing modems.

Background technique

In order to strictly control the production quality of the modem, the modem must be certified by the certification unit before mass production. The more important certification items related to hardware include the modem's receiving power, transmission power, anti-interference ability and output signal testing. .

It is known that the testing methods of the certification projects of modems have different test structures according to different certification projects. Therefore, if testers want to test multiple certification projects of modems respectively, it is necessary to spend time and manpower to establish multiple test frameworks. ; In addition, since the same modem can only be tested for one certification item at a time, and cannot be tested for multiple certification items at the same time, it is also time-consuming and labor-intensive to test for multiple certification items; furthermore, When the modem is tested in different test architectures, there will be frequent "plugging and unplugging" actions between the modem and its connected instruments, thereby reducing the life of the instrument connector.

SUMMARY OF THE INVENTION

In view of the above problems, the purpose of the present invention is to provide a testing system, which can solve the problems of time-consuming and labor-consuming and shortening the life of the instrument connector in the testing method of the authentication items of the known modems.

An embodiment of the present disclosure discloses a testing system for testing the receiving and transmitting power of a device under test. The test system includes a spectrum analyzer, a cable modem termination system (cable modem termination system, CMTS), a first splitter and a second splitter. The cable modem termination system is used to output the first downstream signal. The first splitter is coupled to the device under test, the spectrum analyzer and the cable modem terminal system, and is used for splitting the first downlink signal into two second downlink signals with the same power, and transmits the two second downlink signals to the under test respectively. The test device and the spectrum analyzer are used to compare the reference received power of the second downlink signal received by the spectrum analyzer with the actual received power of the second downlink signal received by the device under test to obtain the first test result. The second splitter is coupled to the device under test, the spectrum analyzer and the cable modem termination system, and is used to split the first upstream signal output by the device under test into two second upstream signals with the same power, and divide the two second upstream signals The signal is transmitted to the spectrum analyzer and the cable modem terminal system respectively, so that the actual transmission power of the second uplink signal received by the spectrum analyzer is compared with the reference transmission power of the first uplink signal output by the device under test, and the first uplink signal is obtained. Two test results.

An embodiment of the present disclosure discloses a testing system for testing the receiving and transmitting power of a device under test. The test system includes a spectrum analyzer, a cable modem termination system, an attenuator, an amplifier, a first shunt, and a second shunt. The cable modem termination system is used to output the first downstream signal. The attenuator is coupled to the cable modem termination system for attenuating the power of the first downstream signal. The amplifier is coupled to the attenuator for amplifying the power of the attenuated first downlink signal. The first splitter is coupled to the spectrum analyzer and the amplifier, and is used for splitting the first downlink signal passing through the attenuator and the amplifier into two second downlink signals with the same power, and transmits the two second downlink signals to the The device under test and the spectrum analyzer are used to compare the reference received power of the second downlink signal received by the spectrum analyzer with the actual received power of the second downlink signal received by the device under test to obtain a first test result. The second splitter is coupled to the spectrum analyzer and the attenuator, and is used to split the first upstream signal output by the device under test into two second upstream signals with the same power, and the two second upstream signals are respectively transmitted to the spectrum analyzer The instrument and the attenuator are used to compare the actual transmission power of the second uplink signal received by the spectrum analyzer with the reference transmission power of the first uplink signal output by the device under test to obtain a second test result.

Based on the above technical means, the received power, transmission power and output signal of the device under test can be tested by applying the test system described in this disclosure, so that testers can perform tests for multiple certification projects only by using the test system in this disclosure It does not need to spend time and manpower to establish different test frameworks for different certification projects, thereby solving the shortage of "time-consuming and manpower-consuming" and "reducing the life of instrument joints" of existing test practices.

Description of drawings

FIG. 1 is a schematic structural diagram of a test system and a device under test according to an embodiment of the present disclosure;

2 is a schematic structural diagram of a test system and a device under test according to another embodiment of the present disclosure;

FIG. 3A is a schematic diagram for testing the received power of the device under test according to the test system shown in FIG. 2;

3B is a schematic diagram for testing the transmission power of the device under test according to the test system shown in FIG. 2;

FIG. 3C is a schematic diagram for testing the anti-interference ability of the device under test according to the test system shown in FIG. 2;

3D is a schematic diagram of a first output signal output by the test system shown in FIG. 2 for testing the device under test;

4A is a spectrogram of the first output signal shown in FIG. 3D;

FIG. 4B is a spectrogram of the first frequency band signal shown in FIG. 3D;

FIG. 4C is a spectrogram of the second frequency band signal shown in FIG. 3D;

FIG. 4D is a spectrogram of the second output signal shown in FIG. 3D .

Detailed ways

The following is a detailed description with examples and accompanying drawings to better understand the embodiments of the present disclosure. However, the provided examples are not intended to limit the scope of the present disclosure, and the description of structural operations is not intended to limit the scope of the present disclosure. The order of execution, any structure recombined by the elements, and the resulting device having the same technical effect are all within the scope of the present disclosure.

Please refer to FIG. 1 , which is a schematic structural diagram of a test system 100 and a device under test DUT according to an embodiment of the present disclosure.

The test system 100 includes a spectrum analyzer 110, a cable modem termination system (CMTS) 120, a first splitter SP1 and a second splitter SP2.

The output terminal OT of the cable modem termination system 120 is used for outputting the first downstream signal DS1. In one embodiment, the frequency band of the first downlink signal DS1 may be 5-42 (Mhz).

The first splitter SP1 is coupled between the spectrum analyzer 110 and the output end OT of the cable modem termination system 120, and is used for splitting the first downlink signal DS1 into two second downlink signals DS2 with the same power, and splitting the two second downlink signals DS2. The two downlink signals DS2 are respectively transmitted to the device under test DUT and the spectrum analyzer 110, so that the reference received power of the second downlink signal DS2 received by the spectrum analyzer 110 and the second downlink signal DS2 received by the device under test DUT The actual received power is compared to obtain a first test result, wherein the first test result is a test result of the received power of the device under test DUT.

In one embodiment, the device under test DUT may be a modem, but not limited thereto.

The second splitter SP2 is coupled to the spectrum analyzer 110 and the input terminal IT of the cable modem termination system 120, and is used for splitting the first upstream signal US1 output by the device under test DUT into two second upstream signals US2 with the same power, and The two second uplink signals US2 are respectively transmitted to the input terminal IT of the spectrum analyzer 110 and the cable modem terminal system 120, so that the actual transmission power of the second uplink signal US2 received by the spectrum analyzer 110 is different from that of the device under test DUT. The reference transmission power of the output first uplink signal US1 is compared to obtain a second test result, wherein the second test result is the test result of the transmission power of the device under test DUT. In one embodiment, the frequency band of the first uplink signal DS1 may be 54-1218 (Mhz).

In this way, the test system 100 can generate test results of the received power and the transmission power of the device under test DUT by comparing the reference received power with the actual received power, and by comparing the reference transmit power with the actual transmit power. That is to say, under the framework of the test system 100, the received power and the transmit power of the device under test DUT can be tested.

Please refer to FIG. 2 again, which is a schematic structural diagram of a test system 200 and a device under test DUT according to another embodiment of the present disclosure.

The test system 200 shown in FIG. 2 is substantially the same as the test system 100 shown in FIG. 1 , for example, the spectrum analyzer 110 , the cable modem termination system 120 , the first splitter SP1 and the second splitter SP2 of the test system 200 of FIG. 2 , so it is not repeated here.

Differences between the test system 200 shown in FIG. 2 and the test system 100 shown in FIG. 1 will be described below.

In one embodiment, the test system 200 further includes a power regulator 130 coupled to the cable modem termination system 120, the first splitter SP1 and the second splitter SP2.

Further, the power regulator 130 may further include an attenuator ATT and a first amplifier AMP, the attenuator ATT is coupled to the cable modem termination system 120, and the first amplifier AMP is coupled to the attenuator ATT and the first splitter SP1.

In detail, the attenuator ATT has a first frequency band output end FO1, a second frequency band input end FI2, a first frequency band input end FI1 and a second frequency band output end FO2, and the second frequency band input end FI2 of the attenuator ATT and the first frequency band The output end FO1 is respectively coupled to the output end OT and the input end IT of the cable modem termination system 120, the first frequency band input end FI1 of the attenuator ATT is coupled to the second shunt SP2, and the first amplifier AMP is coupled to the first frequency band of the attenuator ATT. Between the two-band output end FO2 and the first splitter SP1.

It should be noted that the names of the first frequency band output end FO1, the second frequency band input end FI2, the first frequency band input end FI1 and the second frequency band output end FO2 of the attenuator ATT are used for convenience of description, not to limit attenuation. The directionality of each endpoint of the ATT. For example, the first frequency band output end FO1 of the attenuator ATT can also be used as an input end, or the second frequency band input end FI2 of the attenuator ATT can also be used as an output end.

In one embodiment, the testing system 200 further includes a noise generating device 140 and a third shunt SP3 , wherein the third shunt SP3 is coupled to the device under test DUT, the first shunt SP1 and the noise generating device 140 .

Further, the noise generating device 140 may further include a first noise generator 141, a second noise generator 142 and a fourth shunt SP4, wherein the first noise generator 141 and the second noise generator 142 are coupled to the fourth shunt SP4, and the fourth shunt SP4 is coupled to the third shunt SP3.

In one embodiment, the testing system 200 further includes a first duplexer DP1, a second amplifier AMP and a second duplexer DP2.

The first duplexer DP1 has an input end IT, a first frequency band output end FO1 and a second frequency band output end FO2, wherein the input end IT of the first duplexer DP1 is coupled to the device under test DUT through the coupler CP.

One end of the second amplifier AMP is coupled to the second frequency band output end FO2 of the first duplexer DP1.

The second duplexer DP2 has a first frequency band input end FI1, a second frequency band input end FI2 and an output end OT, wherein the first frequency band input end FI1 of the second duplexer DP2 is coupled to the first frequency band of the first duplexer DP1 The frequency band output end FO1, the second frequency band input end FI2 of the second duplexer DP2 is coupled to the other end of the second amplifier AMP, and the output end OT of the second duplexer DP2 is coupled to the spectrum analyzer 110 through the switch SW.

It should be noted that the names of the input end IT, the first frequency band output end FO1 and the second frequency band output end FO2 of the first duplexer DP1 are the same as those of the first frequency band input end FI1 and the second frequency band input end of the second duplexer DP2. The names of the terminal FI2 and the output terminal OT are used for the convenience of description, and are not used to limit the directivity of each terminal of the first duplexer DP1 and the second duplexer DP2. No further description.

In one embodiment, the testing system 200 further includes a third duplexer DP3 and a fourth duplexer DP4.

The third duplexer DP3 has a first frequency band input end FI1, a second frequency band input end FI2 and an output end OT, wherein the first frequency band input end FI1 of the third duplexer DP3 is coupled to the second splitter SP2, and the third dual frequency band input end FI1 is coupled to the second splitter SP2. The second frequency band input end FI2 of the duplexer DP3 is coupled to the first splitter SP1, and the output end OT of the third duplexer DP3 is coupled to the spectrum analyzer 110 through the switch SW.

The fourth duplexer DP4 has an input end IT, a first frequency band output end FO1 and a second frequency band output end FO2, wherein the input end IT of the fourth duplexer DP4 is coupled to the third splitter SP3, and the fourth duplexer DP4 The output terminal FO1 of the first frequency band is coupled to the second splitter SP2, and the output terminal FO2 of the second frequency band of the fourth duplexer DP4 is coupled to the first splitter SP1.

It should be noted that the names of the first frequency band input end FI1, the second frequency band input end FI2 and the output end OT of the third duplexer DP3 are the same as the names of the input end IT, the first frequency band output end FO1 and the output end OT of the fourth duplexer DP4. The names of the output terminal FO2 of the second frequency band are used for convenience of description, and are not used to limit the directivity of each terminal of the third duplexer DP3 and the fourth duplexer DP4. No further description.

In addition, “L” and “H” shown in FIG. 2 respectively represent the end points through which the “first frequency band” and the “second frequency band” can pass, and “L” and “H” are only examples, not for limitation.

Please refer to FIG. 3A , which is a schematic diagram of the test system 200 shown in FIG. 2 for testing the received power of the device under test DUT.

First, the cable modem termination system 120 outputs the first downlink signal DS1, and the first downlink signal DS1 passes through the attenuator ATT and the first amplifier AMP and then transmits it to the first splitter SP1; then, the first splitter SP1 will pass through the attenuator The first downlink signal DS1 of the ATT and the first amplifier AMP is split into two second downlink signals DS2 with the same power.

One of the second downlink signals DS2 is transmitted to the spectrum analyzer 110 through the third duplexer DP3 and the switch SW along the dashed arrow direction, whereby the spectrum analyzer 110 can obtain the received second downlink signal corresponding to the received second downlink signal DS2. Reference received power for signal DS2.

The other of the second downlink signal DS2 is transmitted to the device under test DUT through the fourth duplexer DP4, the third splitter SP3 and the coupler CP along the direction of the solid arrow, whereby the device under test DUT can obtain the corresponding The actual received power of the received second downlink signal DS2.

After the reference received power and the actual received power of the DUT corresponding to the DUT are obtained, the host (not shown) can be analyzed to compare the difference between the reference received power and the actual received power, thereby generating the first test result. For example, when the difference between the reference received power and the actual received power is more than 3dB, it means that the received power of the DUT under test is abnormal, so the first test result is "abnormal received power"; on the contrary, when the reference received power is abnormal When the difference between the power and the actual received power is less than 3dB, it means that the received power of the DUT under test is still within the normal range, so the first test result is "normal received power".

Please refer to FIG. 3B again, which is a schematic diagram for testing the transmission power of the device under test DUT according to the test system 200 shown in FIG. 2 .

First, the device under test DUT outputs a first uplink signal US1, wherein the power of the first uplink signal US1 is the reference transmission power ideally transmitted by the device under test DUT, and the reference transmission power can be obtained from the device under test DUT. Next, the first upstream signal US1 is transmitted to the second splitter SP2 after passing through the third splitter SP3 and the fourth duplexer DP4; and the second splitter SP2 splits the first upstream signal US1 into two second splitters with the same power Upstream signal US2.

After one of the second upstream signals US2 passes through the attenuator ATT along the direction of the solid arrow, the attenuator ATT attenuates the power corresponding to the received second upstream signal US2 to 0 dB and then transmits it to the cable modem termination system 120 to comply with the relevant specification.

The other one of the second uplink signal US2 is transmitted to the spectrum analyzer 110 through the third duplexer DP3 and the switch SW along the direction of the dashed arrow, whereby the spectrum analyzer 110 can obtain the second signal corresponding to the received second signal US2. The actual received power of the upstream signal US2.

After the reference transmission power and the actual transmission power corresponding to the DUT under test are obtained, the difference between the reference transmission power and the actual transmission power can be compared by analyzing the host, thereby generating a second test result. For example, when the difference between the reference received power and the actual received power is more than 2dB, it means that the transmission power of the device under test DUT is abnormal, so the second test result is "transmission power is abnormal"; on the contrary, when the reference transmission power is abnormal When the difference between the power and the actual transmission power is less than 2dB, it means that the transmission power of the DUT under test is still within the normal range, so the second test result is "normal transmission power".

Please refer to FIG. 3C again, which is a schematic diagram of the test system 200 shown in FIG. 2 for testing the anti-interference capability of the device under test DUT.

First, the cable modem termination system 120 outputs the first downlink signal DS1, and the first downlink signal DS1 passes through the attenuator ATT and the amplifier AMP and then transmits it to the first splitter SP1; then, the first splitter SP1 will pass through the attenuator ATT and the amplifier AMP. The first downlink signal DS1 of the amplifier AMP is split into two second downlink signals DS2 with the same power.

One of the second downlink signals DS2 is transmitted to the third splitter SP3 through the fourth duplexer DP4 in the direction of the solid arrow.

The first noise generator 141 generates the first noise signal NS1, and the second noise generator 142 generates the second noise signal NS2. Next, the fourth splitter SP4 combines the first noise signal NS1 and the second noise signal NS2 into a noise signal NS, and transmits the noise signal NS to the third splitter SP3. In some embodiments, the first noise generator 141 and/or the second noise generator 142 may be, for example, a random noise generator, a digital noise generator, a polynomial generator, a Gaussian digital noise generator, or others applicable to the present disclosure File the noise generator of the test system.

The third splitter SP3 combines the received second downlink signal DS2 and the noise signal NS and transmits it to the device under test DUT through the coupler CP.

After the device under test DUT receives the second downlink signal DS2 and the noise signal NS, the host can analyze the situation in which the device under test DUT receives the second downlink signal, thereby generating a third test result. Specifically, when the device under test DUT is affected by the noise signal NS and cannot correctly receive the second downlink signal DS2, so that the device under test DUT cannot be connected to the cable modem termination system 120, or the device under test DUT can be connected to the cable The modem terminal system 120 is connected but cannot exchange packets correctly, which means that the anti-interference ability of the DUT under test is not good, so the third test result is "poor anti-interference ability"; on the contrary, when the DUT under test is not The second downlink signal DS2 can be correctly received due to the influence of the noise signal NS, so that the device under test DUT can be connected with the cable modem termination system 120 and can exchange packets correctly, which means that the anti-interference ability of the device under test DUT is good, so The third test result is "good anti-interference ability".

Please refer to FIG. 3D again, and refer to FIGS. 4A to 4D together. FIG. 3D is a schematic diagram of the first output signal OS1 output by the test system 200 shown in FIG. 2 for testing the device under test DUT. 4A to 4D are spectrum diagrams of the first output signal OS1 , the first frequency band signal FS1 , the second frequency band signal FS2 and the second output signal OS2 shown in FIG. 3D , respectively.

First, the device under test DUT outputs a first output signal OS1, wherein the first output signal OS1 has a first frequency band F1 and a second frequency band F2, as shown in FIG. 4A . The first duplexer DP1 receives the first output signal OS1, and correspondingly outputs the first frequency band signal FS1 and the second frequency band signal FS2 from the first output signal OS1 according to the first frequency band F1 and the second frequency band F2, wherein the first frequency band signal FS1 only has the first frequency band F1, and the second frequency band signal FS2 only has the second frequency band F2, as shown in FIG. 4B and FIG. 4C .

Next, the first frequency band signal FS1 is transmitted to the second duplexer DP2, and the second frequency band signal FS2 is transmitted to the second duplexer DP2 after passing through the second amplifier AMP. It should be noted that the purpose of the second amplifier AMP is to amplify the power of the second frequency band signal FS2 to prevent the power of the second frequency band signal FS2 from being too small to be measured.

The second duplexer DP2 combines the first frequency band signal FS1 and the power-amplified second frequency band signal FS2 to generate a second output signal OS2, as shown in FIG. 4D, and then the second output signal OS2 is transmitted to the spectrum after passing through the switch SW Analyzer 110 .

After the spectrum analyzer 110 receives the second output signal OS2, the analysis host can analyze whether the waveforms of the first frequency band F1 and the second frequency band F2 of the second output signal OS2 are abnormal, thereby generating a fourth test result.

For example, as shown in FIG. 4D , when the waveform of the first frequency band F1 of the second output signal OS2 generates a skirt (not shown), or when the second frequency band F2 of the second output signal OS2 generates harmonics (not shown) shown), it means that when the device under test DUT outputs the first output signal OS1, the first output signal OS1 will affect the operation of other surrounding electrical devices, so the fourth test result is "the first output signal OS1 is abnormal" On the contrary, when the waveform of the first frequency band F1 of the second output signal OS2 does not produce a skirt and the second frequency band F2 has no harmonics, it means that when the device under test DUT outputs the first output signal OS1, the first output signal OS1 will not affect the operation of other surrounding electrical devices, so the fourth test result is "the first output signal OS1 is normal".

In addition, the switch SW shown in FIG. 2 and FIG. 3A to FIG. 3D can be used to switch according to different authentication items. For example, when testing the received power, transmission power or anti-interference ability of the DUT, The switch SW only allows the transmission of signals between the spectrum analyzer 110 and the third duplexer DP3; or, when testing the output signal of the device under test DUT, the switch SW only allows the spectrum analyzer 110 to communicate with the second duplexer The transmission of the signal between the DP2.

In summary, the test system of the present disclosure can be achieved by combining a spectrum analyzer, a cable modem termination system, a first shunt, a second shunt, a noise generating device, a third shunt, a first duplexer, an amplifier, and The second duplexer and other components can be used to test the received power, transmission power, anti-interference ability and output signal of the device under test, so that the tester only needs to use the test system of this disclosure to test for multiple certification items. There is no need to spend time and manpower to establish different test structures for different certification projects, thereby solving the shortage of "time-consuming and manpower-consuming" and "reducing the life of instrument connectors" of known test practices.

Although the present invention has been disclosed above with examples, it is not intended to limit the present invention. Any person of ordinary skill in the technical field can make some changes and modifications without departing from the concept of the present invention and the scope of the claims. Therefore, the protection scope of the present invention shall be subject to what is defined by the claims.

Claims (10)

1. A test system for testing the receive and transmit power of a device under test, the test system comprising:

a spectrum analyzer;

a cable modem terminal system for outputting a first downlink signal;

a first splitter, coupled to the device under test, the spectrum analyzer and the cable modem terminal system, configured to split the first downlink signal into two second downlink signals with the same power, transmit the two second downlink signals to the device under test and the spectrum analyzer, respectively, use the power of the second downlink signal received by the spectrum analyzer as a reference received power, and compare the reference received power with an actual received power of the second downlink signal received by the device under test to obtain a first test result; and

and the second splitter is coupled with the device to be tested, the spectrum analyzer and the cable modem terminal system, and is used for splitting the first uplink signal output by the device to be tested into two second uplink signals with the same power, respectively transmitting the two second uplink signals to the spectrum analyzer and the cable modem terminal system, taking the power of the first uplink signal output by the device to be tested as reference transmission power, and comparing the reference transmission power with the actual transmission power of the second uplink signal received by the spectrum analyzer to obtain a second test result.

2. The test system of claim 1, further comprising:

a power regulator coupled to the cable modem termination system and the second splitter, and configured to regulate power of the second uplink signal output from the second splitter.

3. The test system of claim 1, further comprising:

noise generating means for generating a noise signal; and

and a third splitter, coupled to the device under test and the first splitter, for receiving the noise signal, combining the second downlink signal output by the first splitter with the noise signal, and transmitting the combined signal to the device under test, so as to obtain a third test result according to the condition of the second downlink signal received by the device under test.

4. The test system of claim 3, wherein the noise generating device comprises:

a first noise generator for generating a first noise signal;

a second noise generator for generating a second noise signal; and

a fourth shunt coupled to the first noise generator and the second noise generator and configured to combine the first noise signal and the second noise signal into the noise signal.

5. The test system of claim 3, further comprising:

the first duplexer is used for receiving a first output signal output by the device to be tested, wherein the first output signal comprises a first frequency band signal and a second frequency band signal, and the first duplexer outputs the first frequency band signal and the second frequency band signal respectively;

the amplifier is coupled with the first duplexer and used for amplifying the power of the second frequency band signal; and

a second duplexer, coupled to the spectrum analyzer, for combining the first band signal and the power amplified second band signal to generate a second output signal to the spectrum analyzer, so as to obtain a fourth test result.

6. The test system of claim 1, further comprising:

a third diplexer coupled to the first splitter and the second splitter and configured to transmit the second downlink signal from the first splitter to the spectrum analyzer and to transmit the second uplink signal from the second splitter to the spectrum analyzer; and

and a fourth duplexer coupled to the first splitter and the second splitter, and configured to transmit the second downlink signal from the first splitter to the device under test, and transmit the first uplink signal output by the device under test to the second splitter.

7. A test system for testing the receive and transmit power of a device under test, the test system comprising:

a spectrum analyzer;

a cable modem terminal system for outputting a first downlink signal;

an attenuator, coupled to the cable modem termination system, for attenuating the power of the first downlink signal;

an amplifier coupled to the attenuator for amplifying the power of the first downlink signal with attenuated power;

a first splitter, coupled to the spectrum analyzer and the amplifier, configured to split the first downlink signal passing through the attenuator and the amplifier into two second downlink signals with the same power, transmit the two second downlink signals to the device under test and the spectrum analyzer, respectively, use the power of the second downlink signal received by the spectrum analyzer as a reference received power, and compare the reference received power with an actual received power of the second downlink signal received by the device under test, so as to obtain a first test result; and

and the second splitter is coupled with the spectrum analyzer and the attenuator and is used for splitting the first uplink signal output by the device to be tested into two second uplink signals with the same power, the two second uplink signals are respectively transmitted to the spectrum analyzer and the attenuator, the power of the first uplink signal output by the device to be tested is used as reference transmission power, and the reference transmission power is compared with the actual transmission power of the second uplink signal received by the spectrum analyzer to obtain a second test result.

8. The test system of claim 7, further comprising:

noise generating means for generating a noise signal; and

and a third splitter, coupled to the device under test and the first splitter, for receiving the noise signal, combining the second downlink signal output by the first splitter with the noise signal, and transmitting the combined signal to the device under test, so as to obtain a third test result according to a condition that the device under test receives the corresponding second downlink signal.

9. The test system of claim 8, further comprising:

the first duplexer is used for receiving a first output signal output by the device to be tested, wherein the first output signal comprises a first frequency band signal and a second frequency band signal, and the first duplexer outputs the first frequency band signal and the second frequency band signal respectively;

the amplifier is coupled with the first duplexer and used for amplifying the power of the second frequency band signal; and

a second duplexer, coupled to the spectrum analyzer, for combining the first band signal and the power amplified second band signal to generate a second output signal to the spectrum analyzer, so as to obtain a fourth test result.

10. The test system of claim 7, further comprising:

a third diplexer coupled to the first splitter and the second splitter and configured to transmit the second downlink signal from the first splitter to the spectrum analyzer and to transmit the second uplink signal from the second splitter to the spectrum analyzer; and

and a fourth duplexer coupled to the first splitter and the second splitter, and configured to transmit the second downlink signal from the first splitter to the device under test, and transmit the first uplink signal output by the device under test to the second splitter.

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