CN110211053A - Quick precise phase matching process for three-dimensional measurement - Google Patents
Quick precise phase matching process for three-dimensional measurement Download PDFInfo
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- 238000000034 method Methods 0.000 title claims abstract description 36
- 238000005259 measurement Methods 0.000 title claims abstract description 24
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- 238000010587 phase diagram Methods 0.000 claims description 6
- 235000013399 edible fruits Nutrition 0.000 claims description 3
- 238000009499 grossing Methods 0.000 claims 1
- 230000010363 phase shift Effects 0.000 claims 1
- 238000005516 engineering process Methods 0.000 description 4
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- 235000009508 confectionery Nutrition 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G06T5/70—
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- G06T5/90—
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/11—Region-based segmentation
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/136—Segmentation; Edge detection involving thresholding
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/194—Segmentation; Edge detection involving foreground-background segmentation
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20228—Disparity calculation for image-based rendering
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- Computer Vision & Pattern Recognition (AREA)
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- Image Processing (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
The present invention provides a kind of quick precise phase matching process for three-dimensional measurement, comprising: obtains accurate target area；Using weighted interpolation method, three-dimensional correction is carried out to left and right phase, obtains the parallax of sub-pix；Flash removed and isolated point are removed using parallax filter；It is smoothed using surface of the Gaussian filter to three-dimensional reconstruction.Provided by the present invention for the quick precise phase matching process of three-dimensional measurement, reconstruction regions and point cloud can be quickly and accurately obtained, there is preferable precision to the measurement of complex target.
Description
Technical field
The present invention relates to field of optical measuring technologies, in particular to are used for the quick precise phase match party of three-dimensional measurement
Method.
Background technique
Optical three-dimensional measurement technology is quickly grown in recent years.Stereo matching is the important link for guaranteeing measuring system precision.
There are many methods of the Stereo matching based on feature, the Stereo matching based on region, Stereo matching based on phase.As DLP is thrown
The development of shadow machine, phase measuring profilometer (PMP) become one of most widely used technology, have measurement accuracy height, measurement speed
Spend fast advantage.Traditional matching based on phase is used for global search or polarity equation.However, these methods are time-consuming and precision
It is low.
Summary of the invention
The purpose of the present invention is to provide the quick precise phase matching process for three-dimensional measurement, to solve to be based on phase
Method of the matching for global search or polarity equation be time-consuming and problem that precision is low.
In order to solve the above-mentioned technical problem, the technical scheme is that providing a kind of quick essence for three-dimensional measurement
True phase matching method, comprising: obtain accurate target area；Using weighted interpolation method, three-dimensional school is carried out to left and right phase
Just, the parallax of sub-pix is obtained；Flash removed and isolated point are removed using parallax filter；Using Gaussian filter to three-dimensional reconstruction
Surface is smoothed.
Further, accurate target area is obtained using four-stepped switching policy.
Further, after three-dimensional correction, two row images of left and right are parallel to pole outside line, one, the constituency point in the phase diagram of the left side
(xL,yL), the point of corresponding the right phase diagram is (xR,yR), yREqual to yLIf the phase value on the left side isIt is corresponding
The right phase value meet equationIt obtains key point (i, j) and (i+1, j), it is horizontal
Coordinate isThe key point is used around point
In two factors of coordinates computed are as follows:
Ordinate is accordingly
Sub-pix parallax is
Para_x=xR-i′；Para_y=yR-j
Further, judge isolated point with one 5 × 5 template, selected from effective subject area point (i,
J), pixel ((i-2, j-2), (i-1, j-2) ... (i+1, j+2), (i+2, j+2)) determines the characteristic of point (i, j), such as fruit dot
((i+m, j+n)) is that effectively, aggregate-value increases by 1, then accumulates to effective parallaxes of these points, obtains being averaged for parallax
Value, if aggregate-value is greater than 10, and the difference between the parallax and average value of institute's reconnaissance then retains the point less than 2, and otherwise deleting should
Point；Parallax is eliminated using linear interpolation, spacing is extracted, parallax line is divided into different parts, when section length is less than 10,
Using linear interpolation method, it is assumed that cross-sectional length n, the value of two endpoints are para (0) and para (n-1), the view at this interval
Difference is defined as:
By aforesaid operations, burr and isolated point on parallax are removed.
Further, a cloud is smoothed using Gaussian filter, obtains matched line being divided into difference
The section of section is used from three directions having a size of 5 pixels, the one-dimensional Gauss that standard deviation is 0.8 pixel in each interval
Filter.
Provided by the present invention for the quick precise phase matching process of three-dimensional measurement, reconstruction can be quickly and accurately obtained
Region and point cloud, have preferable precision to the measurement of complex target.
Detailed description of the invention
Invention is described further with reference to the accompanying drawing:
Fig. 1 is that the process step of the quick precise phase matching process provided in an embodiment of the present invention for three-dimensional measurement shows
It is intended to.
Fig. 2 a is the image of the candy strip of camera provided in an embodiment of the present invention shooting；
Fig. 2 b is the package phase provided in an embodiment of the present invention obtained using four-stepped switching policy；
Fig. 2 c is intensity image provided in an embodiment of the present invention；
Fig. 2 d is co-occurrence mask provided in an embodiment of the present invention；
Fig. 2 e is intensity mask provided in an embodiment of the present invention；
Fig. 2 f is the foreground area of segmentation provided in an embodiment of the present invention.
Specific embodiment
The quick precise phase proposed by the present invention for three-dimensional measurement is matched below in conjunction with the drawings and specific embodiments
Method is described in further detail.According to following explanation and claims, advantages and features of the invention will be become apparent from.It needs
Bright, attached drawing is all made of very simplified form and using non-accurate ratio, only conveniently, lucidly to aid in illustrating
The purpose of the embodiment of the present invention.
Core of the invention thought is, provided by the present invention for the quick precise phase matching process of three-dimensional measurement,
Reconstruction regions and point cloud can be quickly and accurately obtained, there is preferable precision to the measurement of complex target.
Fig. 1 is that the process step of the quick precise phase matching process provided in an embodiment of the present invention for three-dimensional measurement shows
It is intended to.Referring to Fig.1, a kind of quick precise phase matching process for three-dimensional measurement is provided, comprising the following steps:
S11, accurate target area is obtained；
S12, the parallax of sub-pix is obtained to left and right phase progress three-dimensional correction using weighted interpolation method；
S13, flash removed and isolated point are removed using parallax filter；
S14, it is smoothed using surface of the Gaussian filter to three-dimensional reconstruction.
Using four-stepped switching policy, the intensity of stripe pattern is
I1(x, y)=Ia(x,y)+Im(x,y)cos(φ(x,y))
I2(x, y)=Ia(x,y)+Im(x,y)cos(φ(x,y)+π/2)
I3(x, y)=Ia(x,y)+Im(x,y)cos(φ(x,y)+π)
I4(x, y)=Ia(x,y)+Im(x,y)cos(φ(x,y)+3π/2) (1)
Ia(x, y) indicates the intensity of environment light, Im(x, y) indicates modulate intensity, and φ (x, y) is expansion phase, from formula
(1) in, Ia(x, y) and Im(x, y) can be described as:
Ia(x, y)=(I1+I2+I3+I4)/4
Im(x, y)=(((I4-I2)^2+(I1-I3)^2)^0.5)/2 (2)
Co-occurrence matrix is defined asCijIt indicates in ImIn there is i value and in IaIn have j
The sum of all pixels of value, PijIt is probability value.Fig. 2 is the co-occurrence matrix provided in an embodiment of the present invention based on environment light modulation.Reference
Fig. 2, (s, t) are the threshold values (R1, R2, R3 and R4) that matrix is divided into four quadrants.In biggish modulation and environment illumination intensity
Under, phase value is more accurate.In order to obtain optimal threshold, we it is ensured that equation (4) minimum value.
QR1,QR2,QR3And QR4It is defined as follows:
QR1(s, t)=PR1/(s+1)(t+1)0≤i≤s,0≤j≤t
QR2(s, t)=PR2/(t+1)(L1-s-1)s+1≤i≤L1-1,0≤j≤t
QR3(s, t)=PR3/(L2-t-1)(s+1)0≤i≤s,t+1≤j≤L2-1
QR4(s, t)=PR2/(L1-s-1)(L2-t-1)s+1≤i≤L1-1,t+1≤j≤L2-1 (5)
When threshold value (s, t) is sought, a symbiosis mask can establish for image segmentation.
OTSU algorithm is applied in intensity image IaIntensity mask value Mask is obtained in (x, y)ia.If co-occurrence matrix and intensity
Mask is true, then subject area is effective.Fig. 2 a is the image of the candy strip of camera provided in an embodiment of the present invention shooting；Figure
2b is the package phase provided in an embodiment of the present invention obtained using four-stepped switching policy.Fig. 2 c is intensity provided in an embodiment of the present invention
Image.Referring to Fig. 2 c, the intensity image shown in figure can be calculated with equation (2)；Fig. 2 d is provided in an embodiment of the present invention total
Existing mask.It can be obtained by equation (6) referring to Fig. 2 d co-occurrence mask；Fig. 2 e is intensity mask provided in an embodiment of the present invention.
Referring to Fig. 2 e, intensity mask is obtained using OTSU method on intensity image；Fig. 2 f is segmentation provided in an embodiment of the present invention
The advantages of foreground area, reference Fig. 2 f, this method combines two kinds of masks, provide an accurate target area.
After three-dimensional correction, two row images of left and right are parallel to pole outside line.When we choose a point in the phase diagram of the left side
(xL,yL), the point of corresponding the right phase diagram is (xR,yR).Because of the reason of three-dimensional correction, yREqual to yL.In this case,
yRIt is to fix a pixel.Fig. 3 is provided in an embodiment of the present invention for obtaining the template of subpixel coordinates.Referring to shown in Fig. 3,
If the phase value on the left side isCorresponding the right phase value meets equation (7),
Based on this equation, our available key points (i, j) and (i+1, j).Corresponding abscissa can be asked by formula (8)
?.
The point that surround based on key point can be used for coordinates computed.The two factors are defined as:
Corresponding ordinate can be obtained by equation (11).
Sub-pix parallax can be obtained by equation (12)
Para_x=xR-i′；Para_y=yR-j (12)
Filtering parallax, there are two steps.One is removal isolated points, and another kind is smooth disparity.Firstly, we are with one 5
× 5 template judges isolated point.A point (i, j) is selected from effective subject area.Pixel ((i-2, j-2), (i-
1, j-2) ... (i+1, j+2), (i+2, j+2)) determine the characteristic of point (i, j).If fruit dot ((i+m, j+n)) is effectively, to add up
Value increases by 1.Then effective parallax of these points is accumulated.The average value of our available parallaxes.If aggregate-value is big
Difference in 10, and between the parallax and average value of institute's reconnaissance then retains the point, otherwise deletes the point less than 2.Second, using line
Property interpolation eliminates parallax.Spacing is extracted, parallax line is divided into different parts.When section length is less than 10, using line
Property interpolation method.Assuming that cross-sectional length is n, the value of two endpoints is para (0) and para (n-1).The parallax value at this interval can
With is defined as:
By this operation, the burr and isolated point on parallax are removed.
After obtaining accurate parallax, three-dimensional point cloud can be calculated by calibrating parameters.Using Gaussian filter pair
Point cloud is smoothed.The section that matched line is divided into different sections is obtained.In each interval, make from three directions
With having a size of 5 pixels, the one-dimensional Gaussian filter that standard deviation is 0.8 pixel.After that, the surface for putting cloud is more smooth.
A kind of quick fine matching method based on absolute phase figure provided by the invention.Object mask can reduce reconstruction
Noise spot and runing time.A kind of new weighted interpolation method introduces accurate sub-pix view in abscissa and ordinate
Difference.Flash removed and isolated point are removed using parallax and point cloud filter, obtains accurate surface.Measurement of this method to complex target
With preferable precision.
Obviously, those skilled in the art can carry out various changes and deformation without departing from essence of the invention to the present invention
Mind and range.In this way, if these modifications and changes of the present invention belongs to the range of the claims in the present invention and its equivalent technologies
Within, then the present invention is also intended to include these modifications and variations.
Claims (5)
1. a kind of quick precise phase matching process for three-dimensional measurement characterized by comprising
Obtain accurate target area；
Using weighted interpolation method, three-dimensional correction is carried out to left and right phase, obtains the parallax of sub-pix；
Flash removed and isolated point are removed using parallax filter；
It is smoothed using surface of the Gaussian filter to three-dimensional reconstruction.
2. being used for the quick precise phase matching process of three-dimensional measurement as described in claim 1, which is characterized in that use four steps
Phase shift method obtains accurate target area.
3. being used for the quick precise phase matching process of three-dimensional measurement as described in claim 1, which is characterized in that three-dimensional correction
Afterwards, two row images of left and right are parallel to pole outside line, one, the constituency point (x in the phase diagram of the left sideL,yL), corresponding the right phase diagram
Point is (xR,yR), yREqual to yLIf the phase value on the left side isCorresponding the right phase value meets equationIt obtains key point (i, j) and (i+1, j), abscissa isThe key point is sat around point for calculating
Mark two factors are as follows:
Ordinate is accordingly
Sub-pix parallax is
Para_x=xR-i′；Para_y=yR-j 。
4. being used for the quick precise phase matching process of three-dimensional measurement as described in claim 1, which is characterized in that with one 5
× 5 template judges isolated point, and a point (i, j), pixel ((i-2, j-2), (i- are selected from effective subject area
1, j-2) ... (i+1, j+2), (i+2, j+2)) characteristic that determines point (i, j), as fruit dot ((i+m, j+n)) be it is effective, add up
Value increases by 1, then accumulates to effective parallax of these points, obtains the average value of parallax, if aggregate-value is greater than 10, and institute
Difference between the parallax and average value of reconnaissance then retains the point, otherwise deletes the point less than 2；Parallax is eliminated using linear interpolation,
Spacing is extracted, parallax line is divided into different parts, when section length is less than 10, using linear interpolation method, it is assumed that section
Length is n, and the value of two endpoints is para (0) and para (n-1), the parallax value at this interval is defined as:
By aforesaid operations, burr and isolated point on parallax are removed.
5. being used for the quick precise phase matching process of three-dimensional measurement as described in claim 1, which is characterized in that use Gauss
Smoothing filter is smoothed a cloud, obtains the section that matched line is divided into different sections, in each interval, from
Three directions are used having a size of 5 pixels, the one-dimensional Gaussian filter that standard deviation is 0.8 pixel.
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| WO2022147670A1 (en) * | 2021-01-06 | 2022-07-14 | Jiangsu Jitri Micro-Nano Automation Institute Co., Ltd | Automatic exposure selection method for high dynamic range 3d optical measurements |
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