CN110161892B - Static resistance analog circuit - Google Patents
Static resistance analog circuit Download PDFInfo
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- CN110161892B CN110161892B CN201810338429.XA CN201810338429A CN110161892B CN 110161892 B CN110161892 B CN 110161892B CN 201810338429 A CN201810338429 A CN 201810338429A CN 110161892 B CN110161892 B CN 110161892B
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0423—Input/output
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/21—Pc I-O input output
- G05B2219/21014—Interface, module with relays
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Abstract
The invention relates to the technical field of electronics, and discloses a static resistance simulation circuit. Wherein, this analog circuit includes: the static resistance simulation unit is used for simulating the static resistance value of the electronic equipment when an external power supply line is not powered on; the state switching unit is used for switching from being connected with the static resistance simulation unit to being connected with the main equipment simulation unit; and the state switching driving unit is connected with the state switching unit and used for driving the state switching unit to execute switching operation when the external power supply circuit is powered on. Therefore, the static resistance simulation unit and the main equipment simulation unit are relatively isolated in electrical connection, and the problem of overlarge simulation deviation of static resistance is solved.
Description
Technical Field
The invention relates to the technical field of electronics, in particular to a static resistance analog circuit.
Background
The static resistance of the electronic equipment before being electrified is an important parameter of the electrical characteristics of the electronic equipment, and the testing equipment tests the parameter, so that partial fault modes of the electronic equipment can be diagnosed, meanwhile, the static resistance is also an important link for safety check of the equipment before being electrified, and the situation that the equipment is burnt when being electrified in a short-circuit state can be avoided. With the increasing abundance of matching equipment, part of electronic equipment is matched with simulators, such as missile simulators and the like, and can replace missiles to complete the work of test training, testability verification and the like in a matching way. In order to ensure that the test training process is consistent with the formal product, including the check of the static resistor, a static resistor simulation circuit needs to be designed in the simulator to simulate the static resistance value of the formal product.
When the existing simulator simulates the parameters, the following two methods are mainly adopted:
1) the method is not specially designed for resistor simulation, and the static resistance value of the simulator main equipment is directly adopted, but the main equipment of the simulator is inconsistent with a formal product, and the static resistance value is inconsistent;
2) the resistance simulation is simply designed, but the design is not isolated from simulator main equipment, the deviation of the simulated resistance value is large, and meanwhile, when multi-path simulation is carried out, a complex sneak path exists, and the simulated resistance value cannot be effectively controlled.
The resistance value deviation simulated by the two methods is large, the realized test training flows are inconsistent, and the test training effect is influenced. Therefore, a static resistance simulation circuit for an electronic device is needed to meet the system design requirements of an electronic device simulator.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides a static resistance simulation circuit which can solve the problem of large deviation of simulated resistance in the prior art.
The technical solution of the invention is as follows: a static resistance analog circuit, the analog circuit comprising:
the static resistance simulation unit is used for simulating the static resistance value of the electronic equipment when an external power supply line is not powered on;
the state switching unit is used for switching from being connected with the static resistance simulation unit to being connected with the main equipment simulation unit;
and the state switching driving unit is connected with the state switching unit and used for driving the state switching unit to execute switching operation when the external power supply circuit is powered on.
Preferably, the static resistance simulation unit includes a static simulation resistance.
Preferably, the static analog resistance is a variable resistance.
Preferably, the state switching unit includes a relay.
Preferably, the relay is a multi-pole double-throw relay.
Preferably, the relay is a single pole double throw relay.
Preferably, the number of the relays is multiple, and the number of the static resistance simulation units is the same as the number of the relays.
Preferably, the state switching driving unit includes a matching resistor and a driving chip.
Through the technical scheme, the switching of the resistance simulation state and the power supply working state of the electronic equipment can be realized when the electronic equipment is static (namely, an external power supply line is not powered on), so that the static resistance simulation unit and the main equipment simulation unit are relatively isolated on electrical connection, and the problem of overlarge static resistance value simulation deviation is solved.
Drawings
The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention. It is obvious that the drawings in the following description are only some embodiments of the invention, and that for a person skilled in the art, other drawings can be derived from them without inventive effort.
Fig. 1 is a block diagram of a static resistance simulation circuit according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a static resistance simulation circuit according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of an exemplary static resistance simulation circuit according to an embodiment of the present invention;
FIG. 4 is a schematic diagram of another example static resistance simulation circuit provided by embodiments of the present invention; and
fig. 5 is a circuit diagram of an equivalent resistance corresponding to a static resistance simulation circuit when an electronic device is in a static state according to an embodiment of the present invention.
Detailed Description
Specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings. In the following description, for purposes of explanation and not limitation, specific details are set forth in order to provide a thorough understanding of the present invention. However, it will be apparent to one skilled in the art that the present invention may be practiced in other embodiments that depart from these specific details.
It should be noted that, in order to avoid obscuring the present invention with unnecessary details, only the device structures and/or processing steps that are closely related to the scheme according to the present invention are shown in the drawings, and other details that are not so relevant to the present invention are omitted.
Fig. 1 is a block diagram of a static resistance simulation circuit according to an embodiment of the present invention.
The static resistance simulation circuit can be used for static resistance simulation of an electronic device (i.e., static resistance simulation before the electronic device is powered on), for example.
As shown in fig. 1, a static resistance simulation circuit according to an embodiment of the present invention may include:
a static resistance simulation unit 10 (which may also be referred to as a static resistance simulation unit) for simulating a static resistance of the electronic device when the external power supply line is not powered on;
a state switching unit 12 for switching from connection with the static resistance simulation unit 10 to connection with a main device simulation unit 14;
for example, the state switching unit 12 may switch from the static resistance value simulation state to the electronic device power supply state. The master device simulation unit 14 can be used for simulating master devices such as missiles (various missile-borne devices) so as to complete test training, testability verification and the like instead of missile cooperation.
And a state switching driving unit 16, connected to the state switching unit 12, for driving the state switching unit 12 to perform a switching operation when the external power supply line is powered on.
Through the technical scheme, the switching of the resistance simulation state and the power supply working state of the electronic equipment can be realized when the electronic equipment is static (namely, an external power supply line is not powered on), so that the static resistance simulation unit and the main equipment simulation unit are relatively isolated on electrical connection, and the problem of overlarge static resistance value simulation deviation is solved.
For example, the static resistance analog circuit of the invention can be consistent with the external interface of a formal product, and the original external power supply circuit is used for switching the state without additionally increasing a control signal.
When the electronic device is in a static state, namely the external power supply line is not powered on, neither the state switching driving unit nor the state switching unit acts. At the moment, the external power supply line is connected with a static resistance simulation unit which is not crosslinked with the main equipment simulation unit; meanwhile, when the state switching driving unit is in a high-resistance state and is connected in parallel to a power supply line, the influence on resistance value simulation is small.
When the electronic equipment is powered on to work, the state switching driving unit outputs a driving signal to control the state switching unit. At this time, the external power supply line is connected with the main equipment simulation unit, and the power is supplied to the main equipment simulation unit, so that the normal use of the electronic equipment is not influenced.
Fig. 2 is a schematic diagram of a static resistance simulation circuit according to an embodiment of the present invention.
As shown in fig. 2, the static resistance simulation unit 10 may include a static simulation resistor R2 according to an embodiment of the invention.
Wherein, the static analog resistance can be a variable resistance.
Therefore, the corresponding analog resistance value can be obtained by adjusting the resistance value of the variable resistor, and the analog resistance value can be controlled.
Alternatively, the static analog resistance may be a fixed resistance.
For example, the analog resistance value can be controlled by changing the number of the fixed resistors or directly using the fixed resistors corresponding to the resistance value to obtain the corresponding analog resistance value.
According to an embodiment of the present invention, the state-switching driving unit 16 may include a matching resistor R1 and a driving chip U2.
The driver chip U2 may be, for example, an MC1413 chip having multiple interfaces (e.g., interfaces 1, 8, 9, and 16 shown in fig. 2).
According to an embodiment of the present invention, the state switching unit 12 may include a relay.
In fig. 2, the relay may be represented by U2. RU2 is the coil resistance of the relay.
Wherein, the relay can be a multi-pole double-throw relay.
For example, the relay may be a double pole double throw relay. Fig. 3 is a schematic diagram of an exemplary static resistance simulation circuit according to an embodiment of the present invention. As shown in fig. 3, a static resistance simulation circuit employs a double-pole double-throw relay, and each pole can realize a resistance simulation, which is suitable for a situation where the number of analog lines is relatively small.
Alternatively, the relay may be a single pole double throw relay.
For example, the number of the relays (e.g., single pole double throw relays) may be plural, and the number of the static resistance simulation units is the same as the number of the relays. The plurality of relays may be controlled by the state switching drive unit 16.
Fig. 4 is a schematic diagram of another example static resistance simulation circuit according to an embodiment of the present invention. As shown in fig. 4, two single-pole double-throw relays are adopted in the static resistance analog circuit, each single-pole double-throw relay can realize one-way resistance value simulation, and the two single-pole double-throw relays can be controlled by the state switching driving unit 16.
For example, one or more relays may be controlled through multiple interfaces of the MC1413 chip.
It should be understood by those skilled in the art that the above descriptions of the number and types of relays in fig. 3 and 4 are only exemplary and not intended to limit the present invention.
For the two relay setting cases exemplified above, except that the simulated resistance value of the "external power supply line 1" is affected by the "state switching drive circuit" and the simulated resistance value deviates from the design value, the simulated value is the design value since other lines such as the "external power supply line 2" are not associated with the "state switching drive circuit", and accurate simulation can be achieved.
According to an embodiment of the present invention, the state switching driving unit 16 may include a matching resistor and a driving chip.
The driver chip may be, for example, an MC1413 chip, which has a plurality of interfaces via which one or more relays may be controlled.
Fig. 5 is a circuit diagram of an equivalent resistance corresponding to a static resistance simulation circuit when an electronic device is in a static state according to an embodiment of the present invention.
When the device is in a quiescent state, i.e., the external power supply line is not powered, the electrical path of the power supply line can be equivalently a multi-path resistor in parallel, as shown in FIG. 5. In FIG. 5, R1 is a matching resistor, R2 is a static analog resistor, and RU1-1、RU1-9、RU1-16The resistance to ground, R, of the 1 st, 9 th and 16 th interfaces (pins) of the MC1413 chip respectivelyU2Is the coil resistance of the relay.
In one example, one can measure: rU1-112.5K ohm, RU1-9Is infinite, RU1-16Is infinite, RU2About 200-400 ohm.
It can be seen that RU2The proportion of the resistor is small and can be ignored. In addition, under the condition of ensuring that the U1 works normally, the resistance value of R1 can be as large as possible to increase the input impedance thereof and reduce the influence on the static resistance, and when the input voltage is 28 v dc, the resistance value selected by R1 can be 22K ohms. The simulated resistance value can be calculated by the following formula.
According to different design values of the R2 resistor in the circuit, the corresponding analog resistance value can be obtained, so that the analog resistance value can be controlled, as shown in the following table 1, wherein the table 1 shows that the corresponding analog resistance value is generated along with the R2 design value.
TABLE 1 Generation of corresponding simulated resistance values with R2 design values
For example, the following description will be given by describing a static resistance simulation process of a certain vehicle test simulator, two-way control is performed on a state switching drive circuit, and a state switching circuit is built by using two double-pole double-throw relays, so that four-way resistance simulation can be realized, namely positive-negative power supply for main equipment, positive-ground power supply for main equipment, positive-negative power supply for steering engine, and positive-ground power supply for steering engine, is respectively performed, the design values of the adopted simulation resistors and the simulation resistance values realized through actual measurement are shown in the following table 2, and the design values of the simulation resistors and the simulation resistance values realized through actual measurement are shown in the table 2.
TABLE 2 simulation resistance design value and simulation resistance value realized by actual measurement
| Analog channel | Design value (ohm) | Resulting analog resistance (ohm) |
| Master power supply positive-negative | 330 | 324 |
| Master power supply positive-ground | 91K | 90.78K |
| Steering engine power supply positive-negative | 330 | 329 |
| Steering engine power supply positive-ground | 330 | 331 |
As can be seen from table 2, the static resistance simulation circuit according to the present invention well realizes a simulation resistance value.
Features that are described and/or illustrated above with respect to one embodiment may be used in the same way or in a similar way in one or more other embodiments and/or in combination with or instead of the features of the other embodiments.
It should be emphasized that the term "comprises/comprising" when used herein, is taken to specify the presence of stated features, integers, steps or components but does not preclude the presence or addition of one or more other features, integers, steps, components or groups thereof.
The above devices of the present invention may be implemented by hardware, or may be implemented by hardware in combination with software. The present invention relates to a computer-readable program which, when executed by a logic section, enables the logic section to realize the above-described apparatus or constituent section, or to realize the above-described various methods or steps. The present invention also relates to a storage medium such as a hard disk, a magnetic disk, an optical disk, a DVD, a flash memory, or the like, for storing the above program.
The many features and advantages of these embodiments are apparent from the detailed specification, and thus, it is intended by the appended claims to cover all such features and advantages of these embodiments which fall within the true spirit and scope thereof. Further, since numerous modifications and changes will readily occur to those skilled in the art, it is not desired to limit the embodiments of the invention to the exact construction and operation illustrated and described, and accordingly, all suitable modifications and equivalents may be resorted to, falling within the scope thereof.
The invention has not been described in detail and is in part known to those of skill in the art.
Claims (8)
1. A static resistance analog circuit, the analog circuit comprising:
the static resistance simulation unit is used for simulating the static resistance value of the electronic equipment when an external power supply line is not powered on;
the state switching unit is used for switching from being connected with the static resistance simulation unit to being connected with the main equipment simulation unit;
and the state switching driving unit is connected with the state switching unit and used for driving the state switching unit to execute switching operation when the external power supply circuit is powered on.
2. The analog circuit of claim 1, wherein the static resistance analog unit comprises a static analog resistance.
3. The analog circuit of claim 2, wherein the static analog resistance is a variable resistance.
4. An analog circuit as claimed in claim 1, characterized in that the state switching unit comprises a relay.
5. The analog circuit of claim 4, wherein the relay is a multi-pole, double-throw relay.
6. The analog circuit of claim 4, wherein the relay is a single pole double throw relay.
7. The analog circuit according to claim 6, wherein the number of the relays is plural, and the number of the static resistance analog units is the same as the number of the relays.
8. The analog circuit according to any of claims 1-7, wherein the state-switching driving unit comprises a matching resistor and a driving chip.
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| CN201810338429.XA CN110161892B (en) | 2018-04-16 | 2018-04-16 | Static resistance analog circuit |
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| CN110161892B true CN110161892B (en) | 2020-12-25 |
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| CN202548577U (en) * | 2011-11-08 | 2012-11-21 | 北京航空航天大学 | A fault injection breadboard capable of simulating a plurality of faults |
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| CN203950201U (en) * | 2014-07-17 | 2014-11-19 | 意昂神州（北京）科技有限公司 | Automobile electrically-controlled test all-purpose electronic simulator |
| KR20150073238A (en) * | 2013-12-20 | 2015-07-01 | 교통안전공단 | Apparatus for Simulation of Vehicle ECU Diagnosis Device |
| CN205038324U (en) * | 2015-09-30 | 2016-02-17 | 国家电网公司 | The DC load's automatic loading device |
| CN205485465U (en) * | 2016-02-04 | 2016-08-17 | 北京波士顿动力电池有限公司 | Resistance analog circuit |
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2018
- 2018-04-16 CN CN201810338429.XA patent/CN110161892B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202548577U (en) * | 2011-11-08 | 2012-11-21 | 北京航空航天大学 | A fault injection breadboard capable of simulating a plurality of faults |
| CN202748666U (en) * | 2012-07-20 | 2013-02-20 | 北京机电工程研究所 | Comprehensive telesignaling simulator |
| KR20150073238A (en) * | 2013-12-20 | 2015-07-01 | 교통안전공단 | Apparatus for Simulation of Vehicle ECU Diagnosis Device |
| CN203950201U (en) * | 2014-07-17 | 2014-11-19 | 意昂神州（北京）科技有限公司 | Automobile electrically-controlled test all-purpose electronic simulator |
| CN205038324U (en) * | 2015-09-30 | 2016-02-17 | 国家电网公司 | The DC load's automatic loading device |
| CN205485465U (en) * | 2016-02-04 | 2016-08-17 | 北京波士顿动力电池有限公司 | Resistance analog circuit |
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