CN110160460A - A kind of metal structure deformation measuring device and method based on digital photography - Google Patents
A kind of metal structure deformation measuring device and method based on digital photography Download PDFInfo
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- CN110160460A CN110160460A CN201910510693.1A CN201910510693A CN110160460A CN 110160460 A CN110160460 A CN 110160460A CN 201910510693 A CN201910510693 A CN 201910510693A CN 110160460 A CN110160460 A CN 110160460A
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- 238000000034 method Methods 0.000 title claims abstract description 22
- 238000006073 displacement reaction Methods 0.000 claims description 21
- 230000011218 segmentation Effects 0.000 claims description 14
- 238000000691 measurement method Methods 0.000 claims description 11
- 230000009466 transformation Effects 0.000 claims description 11
- 238000001514 detection method Methods 0.000 claims description 7
- 230000000007 visual effect Effects 0.000 claims description 7
- 239000003205 fragrance Substances 0.000 claims description 5
- 230000005540 biological transmission Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 claims description 3
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- 230000009897 systematic effect Effects 0.000 claims description 3
- 238000005259 measurement Methods 0.000 abstract description 13
- 238000005516 engineering process Methods 0.000 abstract description 7
- 230000003247 decreasing effect Effects 0.000 abstract description 3
- 230000008859 change Effects 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- YNPNZTXNASCQKK-UHFFFAOYSA-N phenanthrene Chemical compound C1=CC=C2C3=CC=CC=C3C=CC2=C1 YNPNZTXNASCQKK-UHFFFAOYSA-N 0.000 description 2
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- 235000005035 Panax pseudoginseng ssp. pseudoginseng Nutrition 0.000 description 1
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- 230000009286 beneficial effect Effects 0.000 description 1
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- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000011888 foil Substances 0.000 description 1
- 235000008434 ginseng Nutrition 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 239000007769 metal material Substances 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
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Abstract
The present invention relates to metal structure deformation measurement technical fields, refer in particular to a kind of metal structure deformation measuring device and method based on digital photography, the present invention devises special target light source target module and reference light source target module, compared to other machine vision metrology technologies, there is stronger environment resistant light interference performance;Horizontal distortion amount can be dynamically measured, using high resolution CMOS camera and sub-pixel positioning algorithm, so that measurement accuracy can reach sub-pix rank;Problem that can be small with effective solution camera fields of view using multiple reflecting mirrors, so that CMOS camera can acquire target light source target module, reference light source target module simultaneously;The camera shake problem due to caused by environment can be effectively eliminated using reference light source target module, the precision of measurement is effectively raised, and the multiple positions of metal component to be measured or specific position can targetedly can be measured by increasing and decreasing, moving target light source target module.
Description
Technical field
The present invention relates to metal structure deformation measurement technical fields, refer in particular to a kind of metal structure based on digital photography
Deformation measuring device and method.
Background technique
Being constantly progressive and develop with technology and metal material, the application of metal structure and realizes that scene is more and more,
Such as traditional overhead and gantry cranes, derrick crane, contemporary metal structural bridge, metal structure support rail beam and metal structure room
Room frame etc..Metal structure by external force or internal force can deformation occurs, once be more than elastic limit, just irrecoverable original state, very
To being broken, cause the accident, it is therefore necessary to detect the plastic deformation of large scale structure for example camber, lower amount of deflection, angularity, across
The important parameters such as horizontal direction deflection under degree and external force.
In existing metal structure deformation measurement method, common method has instrument measuring method, sensor measurement method, GPS
Measurement method etc., instrument measuring method utilize the general measures such as theodolite, total station, level, rangefinder angle and displacement
Instrument obtains three-dimensional coordinate, and there are measuring speeds for these methods slowly, can not measure multiple spot, measurement accuracy simultaneously by operator's shadow
Ring the problems such as big;Sensor measurement method is currently used LVDT displacement meter, fiber grating, foil gauge etc., these methods need
It contacts or is embedded in inside testee with testee, measurement object itself can be interfered;GPS measurement method is non-connects
Touch measurement, but volume is big, the number of satellite will affect measurement accuracy, and existing instrument is unable to measure metal knot under dynamic situation
Structure horizontal direction deflection.
Summary of the invention
The present invention for problem of the prior art provide one kind can high-precision, it is remote it is non-contact, can be real-time continuous dynamic
State, and it is easily installed the metal structure deformation measuring device and method based on digital photography used.
In order to solve the above-mentioned technical problem, the present invention adopts the following technical scheme:
A kind of metal structure deformation measuring device based on digital photography provided by the invention, including host computer, CMOS phase
Machine, bracket, target light source target module, reference light source target module, attachment device and power supply unit, the target light source target
Module includes the first strong magnets, the first LED area light source and target film target, and the reference light source target module includes second
Strong magnets, the second LED area light source and reference film target, the attachment device are fixed on the bracket, the CMOS phase
Machine is fixed in the attachment device, and the CMOS camera configuration has zoom lens, and the host computer regulates and controls via network connection
The CMOS camera is provided with the first reflecting mirror, the second reflecting mirror, third reflecting mirror and angular displacement platform in the attachment device,
First reflecting mirror and the third reflecting mirror are fixedly installed on the angular displacement platform, the second reflecting mirror rotary setting
In on the angular displacement platform, it is upper and lower that first reflecting mirror and the third reflecting mirror are respectively arranged at second reflecting mirror
Side, said supply unit are used for first LED area light source, the second LED area light source, the CMOS camera and the host computer
Power supply, the target film target are pasted on first LED area light source surface, and first strong magnets are pasted on described the
The one LED area light source back side, it is described to be pasted on second LED area light source surface, second strong magnets with reference to film target
Be pasted on second LED area light source back side, the target light source target module by first strong magnets be pasted on to
It surveys on metal component, the reference light source target module is fixed using vice and is placed in ground.
Preferably, first reflecting mirror, second reflecting mirror and the third reflecting mirror are silvered mirror.
Preferably, the target film target and the film target that refers to are provided in round, the target film target
Mark and the concentric loop that unlike material is provided with reference to film target, annulus in the middle part of the target film target are set
The center point there are two fan-shaped and two fan-shaped central angles in the target film target is set, it is described in the middle part of film target
The setting of annulus there are two fan-shaped and two fan-shaped central angles in the center point with reference to film target.
Preferably, the light for the sending that first LED area light source and second LED area light source issue is 1000-
10000K natural light is provided on the light-emitting surface of first LED area light source and on the light-emitting surface of second LED area light source
High light transmission PWMA panel.
Preferably, first LED area light source and second LED area light source are disposed as circle, the first LED
Area source outer end and second LED area light source outer end are provided with frame, the frame of first LED area light source and described
The width of the frame of two LED area light sources is 0.5-2cm, the face of the first LED area light source area and second LED area light source
Product is all larger than the area and the area with reference to film target of the target film target, and the target film target fits in
It is described to be fitted in the middle part of second LED area light source with reference to film target in the middle part of first LED area light source.
Preferably, the quantity of the target light source target module is multiple.
A kind of metal structure deformation measurement method based on digital photography, steps are as follows:
Step 1: adjustment bracket and angular displacement platform make target light source target module and reference light source target module while locating
In in the visual field of COMS camera, and it is imaged as close to the middle position of image;
Step 2: opening the first LED area light source, the focal length and aperture of the zoom lens of CMOS camera are adjusted, acquires target
The image of film target module and reference film target module, and image data is passed to host computer by GigE agreement;
Step 3: being split using Threshold Segmentation Algorithm and prior information to image on host computer, it is luxuriant and rich with fragrance to obtain target
Woods target module and reference film target module region seek target film target module respectively and refer to film target mould
Coordinate (Xbeg_1, Ybeg_1), (Xbeg_2, Ybeg_2) of the block region starting point in original image;
Step 4: designing customized threshold using target film target and with reference to the existing physical size information of film target
Value-based algorithm carries out customized Threshold segmentation processing to target film target and with reference to film target region, obtains the target film
Target and the pixel edge round with reference to film target outermost, and obtain elliptical horizontal pixel point on the outside of target film target
Number xPiXcels, vertical pixel number yPiXcels;
Step 5: the pixel edge justified to the outermost of target film target and reference film target that the 4th step obtains
Sub-pixel edge is obtained using sub-pix detection and correcting algorithm, then sub-pixel edge is fitted, it is luxuriant and rich with fragrance to obtain target
Woods target and reference film target are in centre coordinate (Xti_1, Yti_1), (Xti_2, the Yti_2) for dividing region, finally
(Xbeg_1, Ybeg_1), (Xbeg_2, the Ybeg_2) sought using third step is obtained target film target and refers to film target
Centre coordinate (Xi_1, Yi_1), (Xi_2, the Yi_2) being marked in original image;
Step 6: according to xPiXcels, yPiXcels that the 4th step obtains, combining target film target outermost edges circle
Physical dimensional parameters and camera parameter, determine horizontal transformation factor kx from image coordinate system to world coordinate system, vertical
Transformation factor ky;
Step 7: centre coordinate (Xi_1, the Yi_ of the target film target and reference film target obtained using the 5th step
1), coordinate transform factor kx, ky that (Xi_2, Yi_2) and the 6th step obtain calculates each frame target film target and with reference to luxuriant and rich with fragrance
World coordinates (Xwi_1, Ywi_1), (Xwi_2, the Ywi_2) at woods target image center, and seek target film target and reference
The undulate quantity (Δ Xwi_1, Δ Ywi_1) at film target image center, (Δ Xwi_2, Δ Ywi_2);
Step 8: the center undulate quantity of target film target image is subtracted the fluctuation with reference to film target image center
Amount obtains displacement variable (Δ Xwi, Δ Ywi), then draws out the position with initial position world coordinates difference Δ Xwi, Δ Ywi
Move curvilinear motion figure.
Preferably, customized Threshold Segmentation Algorithm described in the 4th step, specific step is as follows, and target film target is arranged
The initial threshold of logo image is 0, carries out Threshold segmentation to target film target, then seeks the target film target after threshold value separates
Logo image dimension information is compared with the physical size of target film target, when inconsistent, carry out to threshold value plus 1 operates, directly
Until when the target film target image dimension information after separation is consistent with the physical size information of target film target, currently
Threshold value be final threshold value.
Preferably, the detection of sub-pix described in the 5th step and correcting algorithm obtain sub-pixel edge, fitting, center
Specific step is as follows for coordinate, according to the pixel edge for the target film target outermost circle that the 4th step obtains, using spatial moment
Method obtains sub-pixel edge, and the systematic error eliminating this method and generating, Zhi Houli are then corrected to pixel edge
Ellipse fitting carried out to sub-pix point with least square method, obtain target film target cut zone image coordinate (Xti,
Yti), coordinate of the target film target center in original image is finally sought according to (Xbeg, the Ybeg) that third step obtains
(Xi,Yi)。
Preferably, the physical size information justified described in the 6th step according to the outermost edges of target film target,
Determine transformation factor kx, ky from image coordinate system to world coordinate system, transformation relation are as follows:
Beneficial effects of the present invention:
A kind of metal structure deformation measuring device and method based on digital photography provided by the invention, the present invention with it is existing
Technology compare, have following remarkable advantage: devise special target light source target module and reference light source target module, phase
Than other machine vision metrology technologies, there is stronger environment resistant light interference performance;Horizontal distortion amount can be dynamically measured, benefit
With high resolution CMOS camera and sub-pixel positioning algorithm, so that measurement accuracy can reach sub-pix rank;Utilize multiple reflections
Mirror can be small with effective solution camera fields of view problem so that CMOS camera can acquire simultaneously target light source target module, reference
Light source target module;The camera shake problem due to caused by environment can be effectively eliminated using reference light source target module, effectively
The precision for improving measurement, and can be to the multiple positions of metal component to be measured by increasing and decreasing, moving target light source target module
It sets or specific position is targetedly measured.
Detailed description of the invention
Fig. 1 is structure principle chart of the invention.
Fig. 2 is the target light source target modular structure schematic diagram of the invention.
Fig. 3 is the target film target or described with reference to film target front view of the invention.
Fig. 4 is the attachment device structural schematic diagram of the invention.
Fig. 5 is the attachment device light reflection principle figure of the invention.
Appended drawing reference is respectively as follows:
Host computer -- 1, power supply unit -- 2, bracket -- 3, CMOS cameras -- 4, attachment device -- 5, zoom lens -- 6, mesh
Mark light source target module -- 7, metal component to be measured -- 8, reference light source target module -- 9, vice -- 10, the first strong magnets --
11, the first LED area light source -- 12, target film target -- 13, the first reflecting mirror -- 14, the second reflecting mirror -- 15, third reflection
Mirror -- 16, angular displacement platform -- 17.
Specific embodiment
For the ease of the understanding of those skilled in the art, the present invention is made further below with reference to embodiment and attached drawing
Bright, the content that embodiment refers to not is limitation of the invention.The present invention is described in detail below in conjunction with attached drawing.
As shown in Figs. 1-5, a kind of metal structure deformation measuring device based on digital photography provided by the invention, including it is upper
Position machine 1, CMOS camera 4, bracket 3, target light source target module 7, reference light source target module 9, attachment device 5 and power supply unit
2, the target light source target module 7 includes the first strong magnets 11, the first LED area light source 12 and target film target 13, institute
Reference light source target module 9 is stated including the second strong magnets, the second LED area light source and refers to film target, the attachment device 5
It is fixed on the bracket 3, the CMOS camera 4 is fixed in the attachment device 5, and the CMOS camera 4 is configured with zoom
Camera lens 6, the host computer 1 regulate and control the CMOS camera 4 via network connection, are provided with the first reflection in the attachment device 5
Mirror 14, the second reflecting mirror 15, third reflecting mirror 16 and angular displacement platform 17, first reflecting mirror 14 and the third reflecting mirror 16
It being fixedly installed on the angular displacement platform 17,15 rotary setting of the second reflecting mirror is on the angular displacement platform 17, and described
One reflecting mirror 14 and the third reflecting mirror 16 are respectively arranged at 15 top of the second reflecting mirror, lower section, said supply unit 2
For powering to first LED area light source 12, the second LED area light source, the CMOS camera 4 and the host computer 1, the mesh
Mark film target 13 is pasted on 12 surface of the first LED area light source, and first strong magnets 11 are pasted on the first LED
12 back side of area source, described to be pasted on second LED area light source surface with reference to film target, second strong magnets are pasted
In second LED area light source back side, the target light source target module 7 is pasted on to be measured by first strong magnets 11
On metal component 8, the reference light source target module 9 is fixed using vice 10 and is placed in ground, the present invention and existing skill
Art is compared, and is had following remarkable advantage: being devised special target light source target module 7 and reference light source target module 9, compare
Other machine vision metrology technologies have stronger environment resistant light interference performance;Horizontal distortion amount can be dynamically measured, is utilized
High resolution CMOS camera 4 and sub-pixel positioning algorithm, so that measurement accuracy can reach sub-pix rank;Utilize multiple reflecting mirrors
Problem that can be small with effective solution camera fields of view, so that CMOS camera 4 can acquire target light source target module 7, reference simultaneously
Light source target module 9;The camera shake problem due to caused by environment can be effectively eliminated using reference light source target module 9, is had
The precision for improving measurement of effect, and can be to metal component more than 8 to be measured by increasing and decreasing, moving target light source target module 7
A position or specific position are targetedly measured.
Specifically, in measurement, target light source target module 7 is placed on the position to be measured of metal component 8 to be measured,
Reference light source target module 9 is fixed in the shooting visual field of CMOS camera 4, for example, using vice 10 by reference light source target
Module 9 is fixed on the ground in the shooting visual field of CMOS camera 4, and height and the side of CMOS camera 4 are adjusted using bracket 3
To adjusting angle displacement platform 17 changes the angle of the second reflecting mirror 15, so that target light source target module 7, reference light source target mould
Block 9 is imaged the image that as close to the middle position of image, CMOS camera 4 is acquired and believes in the visual field of CMOS camera 4
Breath is transmitted in host computer 1, and is handled, and by seeking the displacement of 13 module of target film target, passes through jitter elimination
Algorithm obtains the deflection of metal component 8 to be measured.
It is described for the reflectivity for guaranteeing the first reflecting mirror 14, the second reflecting mirror 15 and third reflecting mirror 16 in the present embodiment
First reflecting mirror 14, second reflecting mirror 15 and the third reflecting mirror 16 are silvered mirror.
In the present embodiment, the target film target 13 and the film target that refers to are provided in round, and the target is luxuriant and rich with fragrance
Woods target 13 and the concentric loop that unlike material is provided with reference to film target, 13 middle part of target film target
The center point of the setting of annulus there are two fan-shaped and two fan-shaped central angles in the target film target 13, the reference phenanthrene
There are two fan-shaped and two fan-shaped central angles in the center point with reference to film target for the setting of annulus in the middle part of woods target.
In the present embodiment, the light that first LED area light source 12 and second LED area light source issue is 1000-
10000K natural light, preferably, the light that first LED area light source 12 and second LED area light source issue be 4000K from
Right light is provided with high light transmission on the light-emitting surface of first LED area light source 12 and on the light-emitting surface of second LED area light source
PWMA panel.
In the present embodiment, first LED area light source 12 and second LED area light source are disposed as circle, and described
One LED area light source, 12 outer end and second LED area light source outer end are provided with frame, the side of first LED area light source 12
The width of frame and the frame of second LED area light source is 0.5-2cm, 12 area of the first LED area light source and described second
The area of LED area light source is all larger than the area and the area with reference to film target of the target film target 13, the mesh
Mark film target 13 fits in 12 middle part of the first LED area light source, described to fit in the 2nd face LED with reference to film target
In the middle part of light source.
In the present embodiment, the quantity of the target light source target module 7 is multiple.
A kind of metal structure deformation measurement method based on digital photography, steps are as follows:
Step 1: adjustment bracket 3 and angular displacement platform 17 make target light source target module 7 and reference light source target module 9
Simultaneously in the visual field in COMS camera, and it is imaged as close to the middle position of image;
Step 2: opening the first LED area light source 12, the focal length and aperture of the zoom lens 6 of CMOS camera 4, acquisition are adjusted
13 module of target film target and image with reference to film target module, and image data is passed to by GigE agreement upper
Machine 1;
Step 3: being split using Threshold Segmentation Algorithm and prior information to image on host computer 1, target is obtained
13 module of film target and reference film target module region, seek 13 module of target film target and with reference to the film respectively
Coordinate (Xbeg_1, Ybeg_1), (Xbeg_2, Ybeg_2) of the target module region starting point in original image;
Step 4: being designed customized using target film target 13 and with reference to the existing physical size information of film target
Thresholding algorithm carries out customized Threshold segmentation processing to target film target 13 and with reference to film target region, obtains target
Film target 13 and the pixel edge round with reference to film target outermost, and obtain the 13 elliptical water in outside of target film target
Flat pixel number xPiXcels, vertical pixel number yPiXcels;
Step 5: the Pixel-level side justified to the outermost of target film target 13 and reference film target that the 4th step obtains
Edge obtains sub-pixel edge using sub-pix detection and correcting algorithm, is then fitted to sub-pixel edge, obtains target
Film target 13 and with reference to film target segmentation region centre coordinate (Xti_1, Yti_1), (Xti_2, Yti_2),
(Xbeg_1, Ybeg_1), (Xbeg_2, the Ybeg_2) finally sought using third step obtains target film target 13 and reference
Centre coordinate (Xi_1, Yi_1), (Xi_2, Yi_2) of the film target in original image;
Step 6: according to xPiXcels, yPiXcels that the 4th step obtains, 13 outermost edges of combining target film target
The parameter of round physical dimensional parameters and camera determines the horizontal transformation factor kx from image coordinate system to world coordinate system, erects
Straight transformation factor ky;
Step 7: the target film target 13 that is obtained using the 5th step and with reference to film target centre coordinate (Xi_1,
Yi_1), coordinate transform factor kx, ky that (Xi_2, Yi_2) and the 6th step obtain calculates each frame target film target 13 and ginseng
World coordinates (Xwi_1, Ywi_1), (Xwi_2, the Ywi_2) at film target image center are examined, and seeks target film target 13
With the undulate quantity (Δ Xwi_1, Δ Ywi_1) at reference film target image center, (Δ Xwi_2, Δ Ywi_2);
Step 8: the center undulate quantity of 13 image of target film target is subtracted the fluctuation with reference to film target image center
Amount obtains displacement variable (Δ Xwi, Δ Ywi), then draws out the position with initial position world coordinates difference Δ Xwi, Δ Ywi
Move curvilinear motion figure.
In the present embodiment, customized Threshold Segmentation Algorithm described in the 4th step, specific step is as follows, and the target film is arranged
The initial threshold of 13 image of target is 0, carries out Threshold segmentation to target film target 13, then seeks the target after threshold value separates
13 image dimension information of film target is compared with the physical size of target film target 13, when inconsistent, carries out to threshold value
Add 1 operation, the physical size information of target film target 13 image dimension information and target film target 13 after separating
Until when consistent, current threshold value is final threshold value.
In the present embodiment, sub-pix described in the 5th step detection and correcting algorithm obtain sub-pixel edge, fitting, in
Specific step is as follows for heart coordinate, according to the pixel edge for 13 outermost of the target film target circle that the 4th step obtains, using sky
Between Moment Methods, obtain sub-pixel edge, then to pixel edge be corrected eliminate this method generate systematic error, it
Ellipse fitting is carried out to sub-pix point using least square method afterwards, obtains target film target 13 in the image coordinate of cut zone
(Xti, Yti) finally seeks 13 center of target film target in original image according to (Xbeg, the Ybeg) that third step obtains
Coordinate (Xi, Yi).
In the present embodiment, believed described in the 6th step according to the physical size of the outermost edges of target film target 13 circle
Breath determines transformation factor kx, ky from image coordinate system to world coordinate system, transformation relation are as follows:
Embodiment two
In the present embodiment, the quantity of the target light source target module 7 have it is multiple, by multiple target light source target modules 7
Be pasted on the different detection positions of mechanism to be detected by strong magnets respectively, can simultaneously multiple metal components 8 to be measured
Difference detected, testing principle is the same as example 1, herein not burdensome narration.
The above is only present pre-ferred embodiments, is not intended to limit the present invention in any form, although
The present invention is disclosed as above with preferred embodiment, and however, it is not intended to limit the invention, any person skilled in the art,
It does not depart within the scope of technical solution of the present invention, when the technology contents using the disclosure above make a little change or are modified to equivalent change
The equivalent embodiment of change, but without departing from the technical solutions of the present invention, technology refers to above embodiments according to the present invention
Made any simple modification, equivalent change and modification, belong in the range of technical solution of the present invention.
Claims (10)
1. a kind of metal structure deformation measuring device based on digital photography, it is characterised in that: including host computer, CMOS camera,
Bracket, target light source target module, reference light source target module, attachment device and power supply unit, the target light source target mould
Block includes the first strong magnets, the first LED area light source and target film target, and the reference light source target module includes the last the second
Power magnet, the second LED area light source and reference film target, the attachment device are fixed on the bracket, the CMOS camera
It is fixed in the attachment device, the CMOS camera configuration has zoom lens, and the host computer regulates and controls institute via network connection
CMOS camera is stated, the first reflecting mirror, the second reflecting mirror, third reflecting mirror and angular displacement platform, institute are provided in the attachment device
State the first reflecting mirror and the third reflecting mirror be fixedly installed on the angular displacement platform, the second reflecting mirror rotary setting in
On the angular displacement platform, first reflecting mirror and the third reflecting mirror be respectively arranged above second reflecting mirror, under
Side, said supply unit are used for first LED area light source, the second LED area light source, the CMOS camera and the host computer
Power supply, the target film target are pasted on first LED area light source surface, and first strong magnets are pasted on described the
The one LED area light source back side, it is described to be pasted on second LED area light source surface, second strong magnets with reference to film target
Be pasted on second LED area light source back side, the target light source target module by first strong magnets be pasted on to
It surveys on metal component, the reference light source target module is fixed in the shooting visual field of CMOS camera.
2. a kind of metal structure deformation measuring device based on digital photography according to claim 1, it is characterised in that: institute
Stating the first reflecting mirror, second reflecting mirror and the third reflecting mirror is silvered mirror.
3. a kind of metal structure deformation measuring device based on digital photography according to claim 1, it is characterised in that: institute
It states target film target and the reference film target is provided in round, the target film target and the reference film target
It is provided with the concentric loop of unlike material, there are two fan-shaped and two fans for the setting of the annulus in the middle part of the target film target
The central angle of shape is in the center point of the target film target, and there are two fans for the setting with reference to the annulus in the middle part of film target
Shape and two fan-shaped central angles are in the center point with reference to film target.
4. a kind of metal structure deformation measuring device based on digital photography according to claim 1, it is characterised in that: institute
Stating the light that the first LED area light source and second LED area light source issue is 1000-10000K natural light, the first face LED light
On the light-emitting surface in source and high light transmission PWMA panel is provided on the light-emitting surface of second LED area light source.
5. a kind of metal structure deformation measuring device based on digital photography according to claim 1, it is characterised in that: institute
It states the first LED area light source and second LED area light source is disposed as circle, first LED area light source outer end and described
Two LED area light source outer ends are provided with frame, the frame of the frame of first LED area light source and second LED area light source
Width be 0.5-2cm, the area of the first LED area light source area and second LED area light source is all larger than the target
The area of film target and the area with reference to film target, the target film target fit in the first face LED light
It is described to be fitted in the middle part of second LED area light source with reference to film target in the middle part of source.
6. a kind of metal structure deformation measuring device based on digital photography according to claim 1, it is characterised in that: institute
It is multiple for stating the quantity of target light source target module.
7. a kind of metal structure deformation measurement method based on digital photography, which is characterized in that steps are as follows:
Step 1: adjustment bracket and angular displacement platform make target light source target module and reference light source target module while being in
In the visual field of COMS camera, and it is imaged close to the middle position of image;
Step 2: opening the first LED area light source, the focal length and aperture of the zoom lens of CMOS camera are adjusted, acquires the target film
The image of target module and reference film target module, and image data is passed to host computer by GigE agreement;
Step 3: being split using Threshold Segmentation Algorithm and prior information to image on host computer, target film target is obtained
It marks module and refers to film target module region, seek target film target module respectively and refer to film target module institute
In coordinate (Xbeg_1, Ybeg_1), (Xbeg_2, Ybeg_2) of the area starting point in original image;
Step 4: designing customized threshold value using target film target and with reference to the existing physical size information of film target and calculating
Method carries out customized Threshold segmentation processing to target film target and with reference to film target region, obtains target film target
The round pixel edge with reference film target outermost, and obtain elliptical horizontal pixel points on the outside of target film target
XPiXcels, vertical pixel number yPiXcels;
Step 5: the pixel edge use of the target film target and the outermost circle with reference to film target obtained to the 4th step
Sub-pix detection and correcting algorithm obtain sub-pixel edge, are then fitted to sub-pixel edge, obtain target film target
Mark and reference film target are finally utilized in centre coordinate (Xti_1, Yti_1), (Xti_2, the Yti_2) of segmentation region
(Xbeg_1, Ybeg_1), (Xbeg_2, the Ybeg_2) that third step is sought obtain target film target and exist with reference to film target
Centre coordinate (Xi_1, Yi_1), (Xi_2, Yi_2) in original image;
Step 6: according to xPiXcels, yPiXcels that the 4th step obtains, the object of combining target film target outermost edges circle
The parameter of dimensional parameters and camera is managed, the horizontal transformation factor kx from image coordinate system to world coordinate system is determined, converts vertically
Factor ky;
Step 7: the target film target that is obtained using the 5th step and with reference to film target centre coordinate (Xi_1, Yi_1),
Coordinate transform factor kx, ky that (Xi_2, Yi_2) and the 6th step obtain calculates each frame target film target and refers to film target
Mark on a map world coordinates (Xwi_1, Ywi_1), (Xwi_2, the Ywi_2) of inconocenter, and seeks target film target and with reference to the film
The undulate quantity (Δ Xwi_1, Δ Ywi_1) at target image center, (Δ Xwi_2, Δ Ywi_2);
Step 8: the center undulate quantity of target film target image is subtracted the undulate quantity with reference to film target image center, obtain
Displacement variable (Δ Xwi, Δ Ywi) is taken, the displacement curve with initial position world coordinates difference Δ Xwi, Δ Ywi is then drawn out
Variation diagram.
8. a kind of metal structure deformation measurement method based on digital photography according to claim 7, it is characterised in that: the
Customized Threshold Segmentation Algorithm described in four steps, specific step is as follows, and the initial threshold of setting target film target image is
0, Threshold segmentation is carried out to target film target, then seeks the target film target image dimension information after threshold value separates, with
The physical size of target film target is compared, and when inconsistent, carry out to threshold value plus 1 operation, the target after separating are luxuriant and rich with fragrance
Until when woods target image dimension information is consistent with the physical size information of target film target, current threshold value is final
Threshold value.
9. a kind of metal structure deformation measurement method based on digital photography according to claim 7, it is characterised in that: the
The detection of sub-pix described in five steps and correcting algorithm acquisition sub-pixel edge, fitting, specific step is as follows for centre coordinate, root
The pixel edge of the target film target outermost circle obtained according to the 4th step obtains sub-pixel side using space Moment Methods
Then edge is corrected the systematic error eliminating this method and generating, later using least square method to sub- picture to pixel edge
Vegetarian refreshments carries out ellipse fitting, obtains target film target in the image coordinate (Xti, Yti) of cut zone, finally according to third step
Obtained (Xbeg, Ybeg) seeks coordinate (Xi, Yi) of the target film target center in original image.
10. a kind of metal structure deformation measurement method based on digital photography according to claim 7, it is characterised in that:
Described in 6th step according to the outermost edges of the target film target circle physical size information, determine from image coordinate system to
Transformation factor kx, ky of world coordinate system, transformation relation are as follows:
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114485443A (en) * | 2021-12-31 | 2022-05-13 | 上海市建筑科学研究院有限公司 | Dynamic monitoring method for vertical deformation of large-span spatial structure |
CN116309418A (en) * | 2023-03-09 | 2023-06-23 | 中建铁路投资建设集团有限公司 | Intelligent monitoring method and device for deformation of girder in bridge cantilever construction |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101419061A (en) * | 2008-12-08 | 2009-04-29 | 北京航空航天大学 | Mirror image type structure light vision measuring systems and measurement method |
US20120236320A1 (en) * | 2011-03-14 | 2012-09-20 | Faro Technologies, Inc. | Automatic measurement of dimensional data with a laser tracker |
CN106871787A (en) * | 2017-04-13 | 2017-06-20 | 中国航空工业集团公司北京长城航空测控技术研究所 | Large space line scanning imagery method for three-dimensional measurement |
CN107014293A (en) * | 2017-04-13 | 2017-08-04 | 中国航空工业集团公司北京长城航空测控技术研究所 | A kind of photogrammetric survey method of camera scanning imaging |
CN208155323U (en) * | 2018-04-16 | 2018-11-27 | 西安微普光电技术有限公司 | A kind of more optical axis automated calibration systems |
CN109870279A (en) * | 2017-12-01 | 2019-06-11 | 中国科学院沈阳自动化研究所 | Deflection of bridge span detection system and detection method based on digital image processing techniques |
CN210154537U (en) * | 2019-06-13 | 2020-03-17 | 广东省特种设备检测研究院东莞检测院 | Metal structure deformation measuring device based on digital photography |
-
2019
- 2019-06-13 CN CN201910510693.1A patent/CN110160460B/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101419061A (en) * | 2008-12-08 | 2009-04-29 | 北京航空航天大学 | Mirror image type structure light vision measuring systems and measurement method |
US20120236320A1 (en) * | 2011-03-14 | 2012-09-20 | Faro Technologies, Inc. | Automatic measurement of dimensional data with a laser tracker |
CN106871787A (en) * | 2017-04-13 | 2017-06-20 | 中国航空工业集团公司北京长城航空测控技术研究所 | Large space line scanning imagery method for three-dimensional measurement |
CN107014293A (en) * | 2017-04-13 | 2017-08-04 | 中国航空工业集团公司北京长城航空测控技术研究所 | A kind of photogrammetric survey method of camera scanning imaging |
CN109870279A (en) * | 2017-12-01 | 2019-06-11 | 中国科学院沈阳自动化研究所 | Deflection of bridge span detection system and detection method based on digital image processing techniques |
CN208155323U (en) * | 2018-04-16 | 2018-11-27 | 西安微普光电技术有限公司 | A kind of more optical axis automated calibration systems |
CN210154537U (en) * | 2019-06-13 | 2020-03-17 | 广东省特种设备检测研究院东莞检测院 | Metal structure deformation measuring device based on digital photography |
Non-Patent Citations (1)
Title |
---|
高敏;卞正兰;董作人;叶青;方祖捷;瞿荣辉;: "扫描镜动态性能的自准直检测技术研究", 中国激光, no. 02 * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114485443A (en) * | 2021-12-31 | 2022-05-13 | 上海市建筑科学研究院有限公司 | Dynamic monitoring method for vertical deformation of large-span spatial structure |
CN114485443B (en) * | 2021-12-31 | 2024-02-13 | 上海市建筑科学研究院有限公司 | Dynamic monitoring method for vertical deformation of large-span space structure |
CN116309418A (en) * | 2023-03-09 | 2023-06-23 | 中建铁路投资建设集团有限公司 | Intelligent monitoring method and device for deformation of girder in bridge cantilever construction |
CN116309418B (en) * | 2023-03-09 | 2024-05-07 | 中建铁路投资建设集团有限公司 | Intelligent monitoring method and device for deformation of girder in bridge cantilever construction |
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