CN110160460A - A kind of metal structure deformation measuring device and method based on digital photography - Google Patents

A kind of metal structure deformation measuring device and method based on digital photography Download PDF

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Publication number
CN110160460A
CN110160460A CN201910510693.1A CN201910510693A CN110160460A CN 110160460 A CN110160460 A CN 110160460A CN 201910510693 A CN201910510693 A CN 201910510693A CN 110160460 A CN110160460 A CN 110160460A
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China
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target
light source
film
film target
led area
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CN110160460B (en
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冯晓蕾
谢柳辉
赵明光
杨金龙
赵晨文
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Guangdong Special Equipment Inspection And Research Institute Dongguan Inspection Institute
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Guangdong Special Equipment Inspection And Research Institute Dongguan Inspection Institute
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/16Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

The present invention relates to metal structure deformation measurement technical fields, refer in particular to a kind of metal structure deformation measuring device and method based on digital photography, the present invention devises special target light source target module and reference light source target module, compared to other machine vision metrology technologies, there is stronger environment resistant light interference performance;Horizontal distortion amount can be dynamically measured, using high resolution CMOS camera and sub-pixel positioning algorithm, so that measurement accuracy can reach sub-pix rank;Problem that can be small with effective solution camera fields of view using multiple reflecting mirrors, so that CMOS camera can acquire target light source target module, reference light source target module simultaneously;The camera shake problem due to caused by environment can be effectively eliminated using reference light source target module, the precision of measurement is effectively raised, and the multiple positions of metal component to be measured or specific position can targetedly can be measured by increasing and decreasing, moving target light source target module.

Description

A kind of metal structure deformation measuring device and method based on digital photography
Technical field
The present invention relates to metal structure deformation measurement technical fields, refer in particular to a kind of metal structure based on digital photography Deformation measuring device and method.
Background technique
Being constantly progressive and develop with technology and metal material, the application of metal structure and realizes that scene is more and more, Such as traditional overhead and gantry cranes, derrick crane, contemporary metal structural bridge, metal structure support rail beam and metal structure room Room frame etc..Metal structure by external force or internal force can deformation occurs, once be more than elastic limit, just irrecoverable original state, very To being broken, cause the accident, it is therefore necessary to detect the plastic deformation of large scale structure for example camber, lower amount of deflection, angularity, across The important parameters such as horizontal direction deflection under degree and external force.
In existing metal structure deformation measurement method, common method has instrument measuring method, sensor measurement method, GPS Measurement method etc., instrument measuring method utilize the general measures such as theodolite, total station, level, rangefinder angle and displacement Instrument obtains three-dimensional coordinate, and there are measuring speeds for these methods slowly, can not measure multiple spot, measurement accuracy simultaneously by operator's shadow Ring the problems such as big;Sensor measurement method is currently used LVDT displacement meter, fiber grating, foil gauge etc., these methods need It contacts or is embedded in inside testee with testee, measurement object itself can be interfered;GPS measurement method is non-connects Touch measurement, but volume is big, the number of satellite will affect measurement accuracy, and existing instrument is unable to measure metal knot under dynamic situation Structure horizontal direction deflection.
Summary of the invention
The present invention for problem of the prior art provide one kind can high-precision, it is remote it is non-contact, can be real-time continuous dynamic State, and it is easily installed the metal structure deformation measuring device and method based on digital photography used.
In order to solve the above-mentioned technical problem, the present invention adopts the following technical scheme:
A kind of metal structure deformation measuring device based on digital photography provided by the invention, including host computer, CMOS phase Machine, bracket, target light source target module, reference light source target module, attachment device and power supply unit, the target light source target Module includes the first strong magnets, the first LED area light source and target film target, and the reference light source target module includes second Strong magnets, the second LED area light source and reference film target, the attachment device are fixed on the bracket, the CMOS phase Machine is fixed in the attachment device, and the CMOS camera configuration has zoom lens, and the host computer regulates and controls via network connection The CMOS camera is provided with the first reflecting mirror, the second reflecting mirror, third reflecting mirror and angular displacement platform in the attachment device, First reflecting mirror and the third reflecting mirror are fixedly installed on the angular displacement platform, the second reflecting mirror rotary setting In on the angular displacement platform, it is upper and lower that first reflecting mirror and the third reflecting mirror are respectively arranged at second reflecting mirror Side, said supply unit are used for first LED area light source, the second LED area light source, the CMOS camera and the host computer Power supply, the target film target are pasted on first LED area light source surface, and first strong magnets are pasted on described the The one LED area light source back side, it is described to be pasted on second LED area light source surface, second strong magnets with reference to film target Be pasted on second LED area light source back side, the target light source target module by first strong magnets be pasted on to It surveys on metal component, the reference light source target module is fixed using vice and is placed in ground.
Preferably, first reflecting mirror, second reflecting mirror and the third reflecting mirror are silvered mirror.
Preferably, the target film target and the film target that refers to are provided in round, the target film target Mark and the concentric loop that unlike material is provided with reference to film target, annulus in the middle part of the target film target are set The center point there are two fan-shaped and two fan-shaped central angles in the target film target is set, it is described in the middle part of film target The setting of annulus there are two fan-shaped and two fan-shaped central angles in the center point with reference to film target.
Preferably, the light for the sending that first LED area light source and second LED area light source issue is 1000- 10000K natural light is provided on the light-emitting surface of first LED area light source and on the light-emitting surface of second LED area light source High light transmission PWMA panel.
Preferably, first LED area light source and second LED area light source are disposed as circle, the first LED Area source outer end and second LED area light source outer end are provided with frame, the frame of first LED area light source and described The width of the frame of two LED area light sources is 0.5-2cm, the face of the first LED area light source area and second LED area light source Product is all larger than the area and the area with reference to film target of the target film target, and the target film target fits in It is described to be fitted in the middle part of second LED area light source with reference to film target in the middle part of first LED area light source.
Preferably, the quantity of the target light source target module is multiple.
A kind of metal structure deformation measurement method based on digital photography, steps are as follows:
Step 1: adjustment bracket and angular displacement platform make target light source target module and reference light source target module while locating In in the visual field of COMS camera, and it is imaged as close to the middle position of image;
Step 2: opening the first LED area light source, the focal length and aperture of the zoom lens of CMOS camera are adjusted, acquires target The image of film target module and reference film target module, and image data is passed to host computer by GigE agreement;
Step 3: being split using Threshold Segmentation Algorithm and prior information to image on host computer, it is luxuriant and rich with fragrance to obtain target Woods target module and reference film target module region seek target film target module respectively and refer to film target mould Coordinate (Xbeg_1, Ybeg_1), (Xbeg_2, Ybeg_2) of the block region starting point in original image;
Step 4: designing customized threshold using target film target and with reference to the existing physical size information of film target Value-based algorithm carries out customized Threshold segmentation processing to target film target and with reference to film target region, obtains the target film Target and the pixel edge round with reference to film target outermost, and obtain elliptical horizontal pixel point on the outside of target film target Number xPiXcels, vertical pixel number yPiXcels;
Step 5: the pixel edge justified to the outermost of target film target and reference film target that the 4th step obtains Sub-pixel edge is obtained using sub-pix detection and correcting algorithm, then sub-pixel edge is fitted, it is luxuriant and rich with fragrance to obtain target Woods target and reference film target are in centre coordinate (Xti_1, Yti_1), (Xti_2, the Yti_2) for dividing region, finally (Xbeg_1, Ybeg_1), (Xbeg_2, the Ybeg_2) sought using third step is obtained target film target and refers to film target Centre coordinate (Xi_1, Yi_1), (Xi_2, the Yi_2) being marked in original image;
Step 6: according to xPiXcels, yPiXcels that the 4th step obtains, combining target film target outermost edges circle Physical dimensional parameters and camera parameter, determine horizontal transformation factor kx from image coordinate system to world coordinate system, vertical Transformation factor ky;
Step 7: centre coordinate (Xi_1, the Yi_ of the target film target and reference film target obtained using the 5th step 1), coordinate transform factor kx, ky that (Xi_2, Yi_2) and the 6th step obtain calculates each frame target film target and with reference to luxuriant and rich with fragrance World coordinates (Xwi_1, Ywi_1), (Xwi_2, the Ywi_2) at woods target image center, and seek target film target and reference The undulate quantity (Δ Xwi_1, Δ Ywi_1) at film target image center, (Δ Xwi_2, Δ Ywi_2);
Step 8: the center undulate quantity of target film target image is subtracted the fluctuation with reference to film target image center Amount obtains displacement variable (Δ Xwi, Δ Ywi), then draws out the position with initial position world coordinates difference Δ Xwi, Δ Ywi Move curvilinear motion figure.
Preferably, customized Threshold Segmentation Algorithm described in the 4th step, specific step is as follows, and target film target is arranged The initial threshold of logo image is 0, carries out Threshold segmentation to target film target, then seeks the target film target after threshold value separates Logo image dimension information is compared with the physical size of target film target, when inconsistent, carry out to threshold value plus 1 operates, directly Until when the target film target image dimension information after separation is consistent with the physical size information of target film target, currently Threshold value be final threshold value.
Preferably, the detection of sub-pix described in the 5th step and correcting algorithm obtain sub-pixel edge, fitting, center Specific step is as follows for coordinate, according to the pixel edge for the target film target outermost circle that the 4th step obtains, using spatial moment Method obtains sub-pixel edge, and the systematic error eliminating this method and generating, Zhi Houli are then corrected to pixel edge Ellipse fitting carried out to sub-pix point with least square method, obtain target film target cut zone image coordinate (Xti, Yti), coordinate of the target film target center in original image is finally sought according to (Xbeg, the Ybeg) that third step obtains (Xi,Yi)。
Preferably, the physical size information justified described in the 6th step according to the outermost edges of target film target, Determine transformation factor kx, ky from image coordinate system to world coordinate system, transformation relation are as follows:
Beneficial effects of the present invention:
A kind of metal structure deformation measuring device and method based on digital photography provided by the invention, the present invention with it is existing Technology compare, have following remarkable advantage: devise special target light source target module and reference light source target module, phase Than other machine vision metrology technologies, there is stronger environment resistant light interference performance;Horizontal distortion amount can be dynamically measured, benefit With high resolution CMOS camera and sub-pixel positioning algorithm, so that measurement accuracy can reach sub-pix rank;Utilize multiple reflections Mirror can be small with effective solution camera fields of view problem so that CMOS camera can acquire simultaneously target light source target module, reference Light source target module;The camera shake problem due to caused by environment can be effectively eliminated using reference light source target module, effectively The precision for improving measurement, and can be to the multiple positions of metal component to be measured by increasing and decreasing, moving target light source target module It sets or specific position is targetedly measured.
Detailed description of the invention
Fig. 1 is structure principle chart of the invention.
Fig. 2 is the target light source target modular structure schematic diagram of the invention.
Fig. 3 is the target film target or described with reference to film target front view of the invention.
Fig. 4 is the attachment device structural schematic diagram of the invention.
Fig. 5 is the attachment device light reflection principle figure of the invention.
Appended drawing reference is respectively as follows:
Host computer -- 1, power supply unit -- 2, bracket -- 3, CMOS cameras -- 4, attachment device -- 5, zoom lens -- 6, mesh Mark light source target module -- 7, metal component to be measured -- 8, reference light source target module -- 9, vice -- 10, the first strong magnets -- 11, the first LED area light source -- 12, target film target -- 13, the first reflecting mirror -- 14, the second reflecting mirror -- 15, third reflection Mirror -- 16, angular displacement platform -- 17.
Specific embodiment
For the ease of the understanding of those skilled in the art, the present invention is made further below with reference to embodiment and attached drawing Bright, the content that embodiment refers to not is limitation of the invention.The present invention is described in detail below in conjunction with attached drawing.
As shown in Figs. 1-5, a kind of metal structure deformation measuring device based on digital photography provided by the invention, including it is upper Position machine 1, CMOS camera 4, bracket 3, target light source target module 7, reference light source target module 9, attachment device 5 and power supply unit 2, the target light source target module 7 includes the first strong magnets 11, the first LED area light source 12 and target film target 13, institute Reference light source target module 9 is stated including the second strong magnets, the second LED area light source and refers to film target, the attachment device 5 It is fixed on the bracket 3, the CMOS camera 4 is fixed in the attachment device 5, and the CMOS camera 4 is configured with zoom Camera lens 6, the host computer 1 regulate and control the CMOS camera 4 via network connection, are provided with the first reflection in the attachment device 5 Mirror 14, the second reflecting mirror 15, third reflecting mirror 16 and angular displacement platform 17, first reflecting mirror 14 and the third reflecting mirror 16 It being fixedly installed on the angular displacement platform 17,15 rotary setting of the second reflecting mirror is on the angular displacement platform 17, and described One reflecting mirror 14 and the third reflecting mirror 16 are respectively arranged at 15 top of the second reflecting mirror, lower section, said supply unit 2 For powering to first LED area light source 12, the second LED area light source, the CMOS camera 4 and the host computer 1, the mesh Mark film target 13 is pasted on 12 surface of the first LED area light source, and first strong magnets 11 are pasted on the first LED 12 back side of area source, described to be pasted on second LED area light source surface with reference to film target, second strong magnets are pasted In second LED area light source back side, the target light source target module 7 is pasted on to be measured by first strong magnets 11 On metal component 8, the reference light source target module 9 is fixed using vice 10 and is placed in ground, the present invention and existing skill Art is compared, and is had following remarkable advantage: being devised special target light source target module 7 and reference light source target module 9, compare Other machine vision metrology technologies have stronger environment resistant light interference performance;Horizontal distortion amount can be dynamically measured, is utilized High resolution CMOS camera 4 and sub-pixel positioning algorithm, so that measurement accuracy can reach sub-pix rank;Utilize multiple reflecting mirrors Problem that can be small with effective solution camera fields of view, so that CMOS camera 4 can acquire target light source target module 7, reference simultaneously Light source target module 9;The camera shake problem due to caused by environment can be effectively eliminated using reference light source target module 9, is had The precision for improving measurement of effect, and can be to metal component more than 8 to be measured by increasing and decreasing, moving target light source target module 7 A position or specific position are targetedly measured.
Specifically, in measurement, target light source target module 7 is placed on the position to be measured of metal component 8 to be measured, Reference light source target module 9 is fixed in the shooting visual field of CMOS camera 4, for example, using vice 10 by reference light source target Module 9 is fixed on the ground in the shooting visual field of CMOS camera 4, and height and the side of CMOS camera 4 are adjusted using bracket 3 To adjusting angle displacement platform 17 changes the angle of the second reflecting mirror 15, so that target light source target module 7, reference light source target mould Block 9 is imaged the image that as close to the middle position of image, CMOS camera 4 is acquired and believes in the visual field of CMOS camera 4 Breath is transmitted in host computer 1, and is handled, and by seeking the displacement of 13 module of target film target, passes through jitter elimination Algorithm obtains the deflection of metal component 8 to be measured.
It is described for the reflectivity for guaranteeing the first reflecting mirror 14, the second reflecting mirror 15 and third reflecting mirror 16 in the present embodiment First reflecting mirror 14, second reflecting mirror 15 and the third reflecting mirror 16 are silvered mirror.
In the present embodiment, the target film target 13 and the film target that refers to are provided in round, and the target is luxuriant and rich with fragrance Woods target 13 and the concentric loop that unlike material is provided with reference to film target, 13 middle part of target film target The center point of the setting of annulus there are two fan-shaped and two fan-shaped central angles in the target film target 13, the reference phenanthrene There are two fan-shaped and two fan-shaped central angles in the center point with reference to film target for the setting of annulus in the middle part of woods target.
In the present embodiment, the light that first LED area light source 12 and second LED area light source issue is 1000- 10000K natural light, preferably, the light that first LED area light source 12 and second LED area light source issue be 4000K from Right light is provided with high light transmission on the light-emitting surface of first LED area light source 12 and on the light-emitting surface of second LED area light source PWMA panel.
In the present embodiment, first LED area light source 12 and second LED area light source are disposed as circle, and described One LED area light source, 12 outer end and second LED area light source outer end are provided with frame, the side of first LED area light source 12 The width of frame and the frame of second LED area light source is 0.5-2cm, 12 area of the first LED area light source and described second The area of LED area light source is all larger than the area and the area with reference to film target of the target film target 13, the mesh Mark film target 13 fits in 12 middle part of the first LED area light source, described to fit in the 2nd face LED with reference to film target In the middle part of light source.
In the present embodiment, the quantity of the target light source target module 7 is multiple.
A kind of metal structure deformation measurement method based on digital photography, steps are as follows:
Step 1: adjustment bracket 3 and angular displacement platform 17 make target light source target module 7 and reference light source target module 9 Simultaneously in the visual field in COMS camera, and it is imaged as close to the middle position of image;
Step 2: opening the first LED area light source 12, the focal length and aperture of the zoom lens 6 of CMOS camera 4, acquisition are adjusted 13 module of target film target and image with reference to film target module, and image data is passed to by GigE agreement upper Machine 1;
Step 3: being split using Threshold Segmentation Algorithm and prior information to image on host computer 1, target is obtained 13 module of film target and reference film target module region, seek 13 module of target film target and with reference to the film respectively Coordinate (Xbeg_1, Ybeg_1), (Xbeg_2, Ybeg_2) of the target module region starting point in original image;
Step 4: being designed customized using target film target 13 and with reference to the existing physical size information of film target Thresholding algorithm carries out customized Threshold segmentation processing to target film target 13 and with reference to film target region, obtains target Film target 13 and the pixel edge round with reference to film target outermost, and obtain the 13 elliptical water in outside of target film target Flat pixel number xPiXcels, vertical pixel number yPiXcels;
Step 5: the Pixel-level side justified to the outermost of target film target 13 and reference film target that the 4th step obtains Edge obtains sub-pixel edge using sub-pix detection and correcting algorithm, is then fitted to sub-pixel edge, obtains target Film target 13 and with reference to film target segmentation region centre coordinate (Xti_1, Yti_1), (Xti_2, Yti_2), (Xbeg_1, Ybeg_1), (Xbeg_2, the Ybeg_2) finally sought using third step obtains target film target 13 and reference Centre coordinate (Xi_1, Yi_1), (Xi_2, Yi_2) of the film target in original image;
Step 6: according to xPiXcels, yPiXcels that the 4th step obtains, 13 outermost edges of combining target film target The parameter of round physical dimensional parameters and camera determines the horizontal transformation factor kx from image coordinate system to world coordinate system, erects Straight transformation factor ky;
Step 7: the target film target 13 that is obtained using the 5th step and with reference to film target centre coordinate (Xi_1, Yi_1), coordinate transform factor kx, ky that (Xi_2, Yi_2) and the 6th step obtain calculates each frame target film target 13 and ginseng World coordinates (Xwi_1, Ywi_1), (Xwi_2, the Ywi_2) at film target image center are examined, and seeks target film target 13 With the undulate quantity (Δ Xwi_1, Δ Ywi_1) at reference film target image center, (Δ Xwi_2, Δ Ywi_2);
Step 8: the center undulate quantity of 13 image of target film target is subtracted the fluctuation with reference to film target image center Amount obtains displacement variable (Δ Xwi, Δ Ywi), then draws out the position with initial position world coordinates difference Δ Xwi, Δ Ywi Move curvilinear motion figure.
In the present embodiment, customized Threshold Segmentation Algorithm described in the 4th step, specific step is as follows, and the target film is arranged The initial threshold of 13 image of target is 0, carries out Threshold segmentation to target film target 13, then seeks the target after threshold value separates 13 image dimension information of film target is compared with the physical size of target film target 13, when inconsistent, carries out to threshold value Add 1 operation, the physical size information of target film target 13 image dimension information and target film target 13 after separating Until when consistent, current threshold value is final threshold value.
In the present embodiment, sub-pix described in the 5th step detection and correcting algorithm obtain sub-pixel edge, fitting, in Specific step is as follows for heart coordinate, according to the pixel edge for 13 outermost of the target film target circle that the 4th step obtains, using sky Between Moment Methods, obtain sub-pixel edge, then to pixel edge be corrected eliminate this method generate systematic error, it Ellipse fitting is carried out to sub-pix point using least square method afterwards, obtains target film target 13 in the image coordinate of cut zone (Xti, Yti) finally seeks 13 center of target film target in original image according to (Xbeg, the Ybeg) that third step obtains Coordinate (Xi, Yi).
In the present embodiment, believed described in the 6th step according to the physical size of the outermost edges of target film target 13 circle Breath determines transformation factor kx, ky from image coordinate system to world coordinate system, transformation relation are as follows:
Embodiment two
In the present embodiment, the quantity of the target light source target module 7 have it is multiple, by multiple target light source target modules 7 Be pasted on the different detection positions of mechanism to be detected by strong magnets respectively, can simultaneously multiple metal components 8 to be measured Difference detected, testing principle is the same as example 1, herein not burdensome narration.
The above is only present pre-ferred embodiments, is not intended to limit the present invention in any form, although The present invention is disclosed as above with preferred embodiment, and however, it is not intended to limit the invention, any person skilled in the art, It does not depart within the scope of technical solution of the present invention, when the technology contents using the disclosure above make a little change or are modified to equivalent change The equivalent embodiment of change, but without departing from the technical solutions of the present invention, technology refers to above embodiments according to the present invention Made any simple modification, equivalent change and modification, belong in the range of technical solution of the present invention.

Claims (10)

1. a kind of metal structure deformation measuring device based on digital photography, it is characterised in that: including host computer, CMOS camera, Bracket, target light source target module, reference light source target module, attachment device and power supply unit, the target light source target mould Block includes the first strong magnets, the first LED area light source and target film target, and the reference light source target module includes the last the second Power magnet, the second LED area light source and reference film target, the attachment device are fixed on the bracket, the CMOS camera It is fixed in the attachment device, the CMOS camera configuration has zoom lens, and the host computer regulates and controls institute via network connection CMOS camera is stated, the first reflecting mirror, the second reflecting mirror, third reflecting mirror and angular displacement platform, institute are provided in the attachment device State the first reflecting mirror and the third reflecting mirror be fixedly installed on the angular displacement platform, the second reflecting mirror rotary setting in On the angular displacement platform, first reflecting mirror and the third reflecting mirror be respectively arranged above second reflecting mirror, under Side, said supply unit are used for first LED area light source, the second LED area light source, the CMOS camera and the host computer Power supply, the target film target are pasted on first LED area light source surface, and first strong magnets are pasted on described the The one LED area light source back side, it is described to be pasted on second LED area light source surface, second strong magnets with reference to film target Be pasted on second LED area light source back side, the target light source target module by first strong magnets be pasted on to It surveys on metal component, the reference light source target module is fixed in the shooting visual field of CMOS camera.
2. a kind of metal structure deformation measuring device based on digital photography according to claim 1, it is characterised in that: institute Stating the first reflecting mirror, second reflecting mirror and the third reflecting mirror is silvered mirror.
3. a kind of metal structure deformation measuring device based on digital photography according to claim 1, it is characterised in that: institute It states target film target and the reference film target is provided in round, the target film target and the reference film target It is provided with the concentric loop of unlike material, there are two fan-shaped and two fans for the setting of the annulus in the middle part of the target film target The central angle of shape is in the center point of the target film target, and there are two fans for the setting with reference to the annulus in the middle part of film target Shape and two fan-shaped central angles are in the center point with reference to film target.
4. a kind of metal structure deformation measuring device based on digital photography according to claim 1, it is characterised in that: institute Stating the light that the first LED area light source and second LED area light source issue is 1000-10000K natural light, the first face LED light On the light-emitting surface in source and high light transmission PWMA panel is provided on the light-emitting surface of second LED area light source.
5. a kind of metal structure deformation measuring device based on digital photography according to claim 1, it is characterised in that: institute It states the first LED area light source and second LED area light source is disposed as circle, first LED area light source outer end and described Two LED area light source outer ends are provided with frame, the frame of the frame of first LED area light source and second LED area light source Width be 0.5-2cm, the area of the first LED area light source area and second LED area light source is all larger than the target The area of film target and the area with reference to film target, the target film target fit in the first face LED light It is described to be fitted in the middle part of second LED area light source with reference to film target in the middle part of source.
6. a kind of metal structure deformation measuring device based on digital photography according to claim 1, it is characterised in that: institute It is multiple for stating the quantity of target light source target module.
7. a kind of metal structure deformation measurement method based on digital photography, which is characterized in that steps are as follows:
Step 1: adjustment bracket and angular displacement platform make target light source target module and reference light source target module while being in In the visual field of COMS camera, and it is imaged close to the middle position of image;
Step 2: opening the first LED area light source, the focal length and aperture of the zoom lens of CMOS camera are adjusted, acquires the target film The image of target module and reference film target module, and image data is passed to host computer by GigE agreement;
Step 3: being split using Threshold Segmentation Algorithm and prior information to image on host computer, target film target is obtained It marks module and refers to film target module region, seek target film target module respectively and refer to film target module institute In coordinate (Xbeg_1, Ybeg_1), (Xbeg_2, Ybeg_2) of the area starting point in original image;
Step 4: designing customized threshold value using target film target and with reference to the existing physical size information of film target and calculating Method carries out customized Threshold segmentation processing to target film target and with reference to film target region, obtains target film target The round pixel edge with reference film target outermost, and obtain elliptical horizontal pixel points on the outside of target film target XPiXcels, vertical pixel number yPiXcels;
Step 5: the pixel edge use of the target film target and the outermost circle with reference to film target obtained to the 4th step Sub-pix detection and correcting algorithm obtain sub-pixel edge, are then fitted to sub-pixel edge, obtain target film target Mark and reference film target are finally utilized in centre coordinate (Xti_1, Yti_1), (Xti_2, the Yti_2) of segmentation region (Xbeg_1, Ybeg_1), (Xbeg_2, the Ybeg_2) that third step is sought obtain target film target and exist with reference to film target Centre coordinate (Xi_1, Yi_1), (Xi_2, Yi_2) in original image;
Step 6: according to xPiXcels, yPiXcels that the 4th step obtains, the object of combining target film target outermost edges circle The parameter of dimensional parameters and camera is managed, the horizontal transformation factor kx from image coordinate system to world coordinate system is determined, converts vertically Factor ky;
Step 7: the target film target that is obtained using the 5th step and with reference to film target centre coordinate (Xi_1, Yi_1), Coordinate transform factor kx, ky that (Xi_2, Yi_2) and the 6th step obtain calculates each frame target film target and refers to film target Mark on a map world coordinates (Xwi_1, Ywi_1), (Xwi_2, the Ywi_2) of inconocenter, and seeks target film target and with reference to the film The undulate quantity (Δ Xwi_1, Δ Ywi_1) at target image center, (Δ Xwi_2, Δ Ywi_2);
Step 8: the center undulate quantity of target film target image is subtracted the undulate quantity with reference to film target image center, obtain Displacement variable (Δ Xwi, Δ Ywi) is taken, the displacement curve with initial position world coordinates difference Δ Xwi, Δ Ywi is then drawn out Variation diagram.
8. a kind of metal structure deformation measurement method based on digital photography according to claim 7, it is characterised in that: the Customized Threshold Segmentation Algorithm described in four steps, specific step is as follows, and the initial threshold of setting target film target image is 0, Threshold segmentation is carried out to target film target, then seeks the target film target image dimension information after threshold value separates, with The physical size of target film target is compared, and when inconsistent, carry out to threshold value plus 1 operation, the target after separating are luxuriant and rich with fragrance Until when woods target image dimension information is consistent with the physical size information of target film target, current threshold value is final Threshold value.
9. a kind of metal structure deformation measurement method based on digital photography according to claim 7, it is characterised in that: the The detection of sub-pix described in five steps and correcting algorithm acquisition sub-pixel edge, fitting, specific step is as follows for centre coordinate, root The pixel edge of the target film target outermost circle obtained according to the 4th step obtains sub-pixel side using space Moment Methods Then edge is corrected the systematic error eliminating this method and generating, later using least square method to sub- picture to pixel edge Vegetarian refreshments carries out ellipse fitting, obtains target film target in the image coordinate (Xti, Yti) of cut zone, finally according to third step Obtained (Xbeg, Ybeg) seeks coordinate (Xi, Yi) of the target film target center in original image.
10. a kind of metal structure deformation measurement method based on digital photography according to claim 7, it is characterised in that: Described in 6th step according to the outermost edges of the target film target circle physical size information, determine from image coordinate system to Transformation factor kx, ky of world coordinate system, transformation relation are as follows:
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