CN110146532A - A kind of differentiating method of MX phase and Laves phase for mutually counting - Google Patents

A kind of differentiating method of MX phase and Laves phase for mutually counting Download PDF

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CN110146532A
CN110146532A CN201910479873.8A CN201910479873A CN110146532A CN 110146532 A CN110146532 A CN 110146532A CN 201910479873 A CN201910479873 A CN 201910479873A CN 110146532 A CN110146532 A CN 110146532A
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phase
laves
electrolytic etching
laves phase
sample
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CN110146532B (en
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陆善平
吴栋
李殿中
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Institute of Metal Research of CAS
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2202Preparing specimens therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/225Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
    • G01N23/2251Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]

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Abstract

The differentiating method of the MX phase and Laves phase that the invention discloses a kind of for mutually counting, counted suitable for solidifying state high temperature alloy the area fraction of MX phase and Laves phase, the specific operation process of the differentiating method are as follows: step 1: by polished sample in NaOH aqueous solution electrolytic etching 2s (current density 0.2-0.3A/cm2), the sample after corrosion is cleaned by ultrasonic, heated-air drying is then used;Second step, by sample as being observed under the back-scattered electron mode of scanning electron microscope.Using differentiating method of the invention, MX phase and Laves phase can be distinguished with being apparent, and the statistics of the information such as the size subsequently with respect to phase, distribution, quantity and content can be carried out.This method is easy to operate, and the differentiation effect of phase is good, the differentiation of MX phase and Laves phase suitable for Ni based high-temperature alloy.

Description

A kind of differentiating method of MX phase and Laves phase for mutually counting
Technical field
The present invention relates to the fabric analysis technical fields of alloy material, and in particular to a kind of MX phase for mutually counting and The differentiating method of Laves phase.
Background technique
Ni based high-temperature alloy has excellent high temperature strength and antioxygenic property, be widely used in aerospace, the energy and The critical equipment in the fields such as petrochemical industry manufactures, and Ni based high-temperature alloy weld metal or cast member are often analysed simultaneously in solidification MX carbide (nitride) and Laves intermetallic compound out.In investigation of materials, it is often necessary to quantity, ruler to both phases The information such as very little and distribution are counted.The size of MX phase and Laves phase is generally at 5 microns hereinafter, optical microscopy can not understand Observation.Pass through corrosive agent oxalic acid or CuSO conventional in high temperature alloy4MX phase and Laves after solution corrosion, under scanning electron microscope Phase color is close, can not distinguish well.Further, since MX phase and Laves phase all contain heavy element (such as Nb), even if the two exists It can not still be distinguished under scanning electron microscope back scattering contrast mode.This causes to be stranded to the Information Statistics work of two kinds of phases in high temperature alloy It disturbs.
Summary of the invention
In order to solve when MX phase coexists with Laves phase in Ni based high-temperature alloy, existing microcosmic imaging technique is not easy to The two is carried out to distinguish this technical problem, the MX phase and Laves phase that the purpose of the present invention is to provide a kind of for mutually counting Differentiating method, this is a kind of new corrosion observation method, and this method can make MX phase and laves in electron microscopic tissue Mutually show apparent colouring discrimination, quite convenient for individually for statistical analysis to the quantity of both phases, distribution and size.
To achieve the above object, technical solution of the present invention is as follows:
A kind of differentiating method of MX phase and Laves phase for mutually counting, this method are for solidification state high temperature alloy material Material carries out electrolytic etching as corrosive agent using NaOH aqueous solution, and realizes MX phase and Laves phase by scanning electron microscope Significant differentiation.The differentiating method includes the following steps:
(1) polished nickel base superalloy sample electrolytic etching: is subjected to electrolytic etching, electric current in NaOH aqueous solution Density 0.2-0.3A/cm2, electrolytic etching time 2-8s;The sample after corrosion is cleaned by ultrasonic with alcohol, hot wind after cleaning Drying for standby;
(2) sample after step (1) electrolytic etching is placed in scanning electron microscope to observe, according to color difference MX phase and Laves phase can obviously be distinguished.
During above-mentioned steps (1) electrolytic etching, the concentration of the NaOH aqueous solution is 0.1-0.2g/mL.
In above-mentioned steps (2), sample observation method is the back-scattered electron mode of scanning electron microscope.
The differentiating method suitable under electron scanning micrograph to solidification state Ni based high-temperature alloy MX phase and Laves phase distinguishes.
Advantages of the present invention is as follows:
The method that the present invention is combined using particular etch liquid, caustic solution and scanning electron microscope back-scattered electron mode, simply It is easy, MX can be mutually clearly distinguished with two kinds of Laves, be highly suitable for coexisting in Ni base height in MX with Laves phase When in temperature alloy, applied when statisticalling analyze phase amount, distribution and size.
Detailed description of the invention
Fig. 1 is in comparative example 1 using Ni-Fe based high-temperature alloy weld metal after the electrolytic etching of 10wt.% oxalic acid aqueous solution Secondary electron scanned photograph.
Fig. 2 is that 20g CuSO is used in comparative example 24·5H2O+5ml H2SO4+100ml HCl+100ml H2O solution corrosion The secondary electron scanned photograph of Ni-Fe based high-temperature alloy (weld metal) afterwards.
Fig. 3 is in comparative example 3 using solidification state Ni-Fe based high-temperature alloy (weldering after the electrolytic etching of 10wt.% oxalic acid aqueous solution Stitch metal) back scattering scanned photograph.
Fig. 4 is that 20g NaOH+100ml H is used in comparative example 42State Ni-Fe based high-temperature alloy is solidified after O electrolytic etching The secondary electron scanned photograph of (weld metal).
Fig. 5 is that 20g NaOH+100ml H is used in embodiment 12State Ni-Fe based high-temperature alloy is solidified after O electrolytic etching The back scattering scanned photograph of (weld metal).
Fig. 6 is that 20g NaOH+100ml H is used in embodiment 22State GH4169 high temperature alloy (half is solidified after O electrolytic etching Solid molding) back scattering scanned photograph.
Specific embodiment
The present invention is described in detail below by attached drawing and specific embodiment.
Comparative example 1
Using conventional corrosion agent 10wt.% oxalic acid aqueous solution electrolytic etching 10s (decomposition voltage 5V), it is high to obtain Ni-Fe base The secondary electron of temperature alloy weld metal scans macrograph.It is as shown in Figure 1 the secondary of Ni-Fe based high-temperature alloy weld metal Electron scanning photo, precipitated phase indicated by white and black arrow is respectively Laves phase and MX phase in photo, it is seen that two kinds of phases And it can not obviously distinguish, the subsequent statistics that can not carry out phase.
Comparative example 2
Use conventional Ni (Ni-Fe) based high-temperature alloy corrosive agent Cu2SO4(formula is 20gCuSO to solution4·5H2O+5ml H2SO4+100ml HCl+100ml H2O) chemical attack 15s, the secondary electron for obtaining Ni-Fe based high-temperature alloy weld metal are swept Retouch photo.It is illustrated in figure 2 the secondary electron scanned photograph of Ni-Fe based high-temperature alloy weld metal, can not be divided at all in photo Clear laves phase and MX phase.
Comparative example 3
Using conventional corrosion agent 10wt.% oxalic acid aqueous solution electrolytic etching 10s (decomposition voltage 5V), it is high to obtain Ni-Fe base The scanning macrograph of temperature alloy weld metal.The Ni-Fe based high-temperature alloy weld seam being illustrated in figure 3 under back-scattered electron mode The scanned photograph of metal, it is seen that laves phase and MX phase cannot be distinguished almost without difference in the contrast of the precipitated phase in tissue.
Comparative example 4
Use NaOH aqueous solution (20g NaOH+100ml H2O) electrolytic etching about 2s (corrosion electric current density 0.2- 0.3A/cm2), the secondary electron for obtaining Ni-Fe base weld metal scans macrograph.It is illustrated in figure 4 the conjunction of Ni-Fe base high temperature The secondary electron scanned photograph of golden weld metal, precipitated phase indicated by white and black arrow is respectively Laves phase in photo With MX phase, black in tissue mutually as MX phase, but Laves phase and matrix color are close, it is virtually impossible to recognize.
Embodiment 1
100ml water is placed in beaker at room temperature by the first step, and 20g NaOH is added, is dissolved into utmostly to NaOH.It will throw The good sample of light (the Ni-Fe based high-temperature alloy weld metal of argon tungsten-arc welding built-up welding) electrolytic etching 2s, corrosion electric current density are 0.2-0.3A/cm2, then sample is put into alcohol and is cleaned by ultrasonic, it is spare with hot-air seasoning after cleaning;
The sample of first step electrolytic etching is placed under scanning electron microscopy Electronic Speculum, and is adjusted to backscattered electron by second step Mode carries out structure observation.
As shown in figure 5, observing Ni-Fe based high-temperature alloy weld seam gold using the present embodiment MX and Laves phase differentiating method MX phase (shown in black arrow) is in black in category, and Laves phase (shown in white arrow) is in canescence, and matrix is in dark gray, can be with It is fine to distinguish MX phase and Laves phase.
Embodiment 2
100ml water is placed in beaker at room temperature by the first step, and 20g NaOH is added, is dissolved into utmostly to NaOH.It will throw The good sample of light (semi-solid-state shaping GH4169 high temperature alloy) electrolytic etching 2s, corrosion electric current density 0.2-0.3A/cm2, so Sample is put into alcohol afterwards and is cleaned by ultrasonic, it is spare with hot-air seasoning after cleaning;
The sample of first step electrolytic etching is placed under scanning electron microscopy Electronic Speculum, and is adjusted to backscattered electron by second step Mode carries out structure observation.
As shown in fig. 6, observing the GH4169 high temperature of semi-solid-state shaping using the present embodiment MX and Laves differentiating method Alloy microstructure, MX phase (shown in black arrow) are in black, and Laves phase (shown in white arrow) is in canescence, and matrix is in dark Grey can clearly be debated, and profile is obvious.

Claims (5)

1. a kind of differentiating method of MX phase and Laves phase for mutually counting, it is characterised in that: this method is high for solidification state Temperature alloy material carries out electrolytic etching as corrosive agent using NaOH aqueous solution, and realizes MX phase by scanning electron microscope With the significant differentiation of Laves phase.
2. the differentiating method of the MX phase and Laves phase according to claim 1 for mutually counting, it is characterised in that: the area Point method includes the following steps:
(1) polished nickel base superalloy sample electrolytic etching: is subjected to electrolytic etching, current density in NaOH aqueous solution 0.2-0.3A/cm2, electrolytic etching time 2-10s;The sample after corrosion is cleaned by ultrasonic with alcohol, hot air drying after cleaning It is dry spare;
(2) sample after step (1) electrolytic etching scanning electron microscope is placed in observe, it can according to color difference Obviously distinguish MX phase and Laves phase.
3. the differentiating method of the MX phase and Laves phase according to claim 2 for mutually counting, it is characterised in that: step (1) during electrolytic etching, the concentration of the NaOH aqueous solution is 0.1-0.2g/mL.
4. the differentiating method of the MX phase and Laves phase according to claim 2 for mutually counting, it is characterised in that: step (2) in, sample observation method is the back-scattered electron mode of scanning electron microscope.
5. the differentiating method of the MX phase and Laves phase according to claim 1 for mutually counting, it is characterised in that: the area Point method is suitable for carrying out area with Laves phase to MX phase solidification state Ni based high-temperature alloy under electron scanning micrograph Point.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112649259A (en) * 2020-11-26 2021-04-13 中国科学院金属研究所 Display method of boride in gamma-TiAl-based alloy

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JPS60185136A (en) * 1984-03-02 1985-09-20 Mitsubishi Heavy Ind Ltd Etching method
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112649259A (en) * 2020-11-26 2021-04-13 中国科学院金属研究所 Display method of boride in gamma-TiAl-based alloy

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