CN110111835A - A kind of NVMe solid state hard disk IOPS test method, system and device - Google Patents
A kind of NVMe solid state hard disk IOPS test method, system and device Download PDFInfo
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Abstract
This application discloses a kind of NVMe solid state hard disk IOPS test method, system and devices, comprising: S11: according to preset read-write ratio and data block size, the test data of preset time threshold is persistently written at random to solid state hard disk to be measured;S12: the IOPS of solid state hard disk to be measured is recorded;S13: repeating S11, until reaching preset measurement round, using the IOPS for taking turns obtained solid state hard disk to be measured every in measurement window, obtains average IOPS, maximum IOPS, minimum IOPS and IOPS slope;S14: judge whether to meet stable state Rule of judgment;S15: if it is, every IOPS for taking turns obtained solid state hard disk to be measured in record measurement window, obtains the stable state IOPS curve of solid state hard disk to be measured;S16: if not, S11 is returned to, until reaching preset termination round;The application clearly sets stable state Rule of judgment, it is ensured that the accuracy of the stable state IOPS curve of output, meanwhile, without passing through front and back multiple groups test result to determine whether reaching stable state, the testing time is saved, testing efficiency is improved.
Description
Technical field
The present invention relates to solid state hard disk field, in particular to a kind of NVMe solid state hard disk IOPS test method, system and dress
It sets.
Background technique
With the rapid development of information technology, data are in explosive growth, the AHCI/SATA hard disk for many years that come out
(AHCI, Serial ATA Advanced Host Controller Interface, the advanced host interface of serial ATA/advanced
Host controller interface, SATA, Serial ATA, serial port hard disk) it is gradually unable to do what one wishes in performance and in transmission speed, in order to
Sufficiently excavate the performance of PCIe interface (PCIe, peripheral component interconnect express), Intel
Combine more company's exploitations and works out NVMe standard (NVMe, Non-Volatile Memory express), NVMe SSD
(SSD, Solid State Disk, solid state hard disk) improves nearly 6 times than SATA SSD readwrite performance.
Solid state hard disk is in IOPS (Input/Output Operations Per Second, progress per second when stable state
The number of read-write operation) it is the important indicator for embodying solid state hard disk performance, it is but in the prior art, steady without specific solid state hard disk
The judgment criteria of state, when IOPS when to solid state hard disk stable state is measured, it usually needs artificial relatively front and back multiple groups IOPS
Curve, whether to judge the IOPS of solid state hard disk close to stable state, accuracy is low, and low efficiency.
For this reason, it may be necessary to which a kind of IOPS test method of solid state hard disk, improves accuracy and the testing efficiency of test.
Summary of the invention
In view of this, the purpose of the present invention is to provide a kind of NVMe solid state hard disk IOPS test method, system and device,
To improve accuracy and the testing efficiency of test.Its concrete scheme is as follows:
A kind of NVMe solid state hard disk IOPS test method, comprising:
S11: according to preset read-write ratio and data block size, when being persistently written preset at random to solid state hard disk to be measured
Between threshold value test data;Wherein, the solid state hard disk to be measured is to write full data again in the state that storing data is sky
The hard disk of the data of nominal amount, the size of the test data are preset data block size;
S12: the IOPS of the solid state hard disk to be measured is recorded;
S13: repeating S11, until reach preset measurement round, using wheel every in measurement window obtain described in
The IOPS for surveying solid state hard disk obtains average IOPS, maximum IOPS, minimum IOPS and IOPS slope;Wherein, IOPS slope is measurement
The slope of the straight line of every IOPS fitting for taking turns the obtained solid state hard disk to be measured in window;
S14: judging whether that the difference for meeting maximum IOPS and minimum IOPS simultaneously is less than or equal to the 10% of average IOPS, maximum
The difference of IOPS and minimum IOPS subtract one times equal to the measurement round of IOPS slope;
S15: it if it is, recording every IOPS for taking turns the obtained solid state hard disk to be measured in the measurement window, obtains
The stable state IOPS curve of the solid state hard disk to be measured;
S16: if not, S11 is returned to, until reaching preset termination round.
Optionally, the solid state hard disk to be measured is to carry out the sequential write of 128K in the state that storing data is sky, up to
Total writing reaches twice of hard disk of hard-disk capacity.
Optionally, the preset time threshold is one minute.
Optionally, the measurement round is 5 wheels.
Optionally, described according to preset read-write ratio and data block size, it is persistently written at random to solid state hard disk to be measured
The process of the test data of the data block size of preset time threshold, comprising:
A variety of read-write ratios and data block size is respectively set;
Using every kind of read-write ratio and data block size, preset time threshold is persistently written at random to solid state hard disk to be measured
Test data.
Optionally, described using the IOPS for taking turns the obtained solid state hard disk to be measured every in measurement window, it is averaged
The process of IOPS, maximum IOPS, minimum IOPS and IOPS slope, comprising:
It is read and write described in every wheel that ratio and target data block size obtain using in measurement window according to preset target
The IOPS of solid state hard disk to be measured obtains average IOPS, maximum IOPS, minimum IOPS and IOPS slope.
Optionally, the preset read-write ratio includes 100/0 read-write, and 95/5 read-write, 65/35 read-write, 50/50 reads and writes,
35/65 read-write, 5/95 read-write and 0/100 read-write;
The preset data block size includes 1024KiB, 128KiB, 64KiB, 32KiB, 16KiB, 8KiB, 4KiB and
0.5KiB。
Optionally, the target read-write ratio is write for 100%, and the target data block size is 4KiB.
The invention also discloses a kind of NVMe solid state hard disk IOPS test macros, comprising:
Writing module, for persistently being write at random to solid state hard disk to be measured according to preset read-write ratio and data block size
Enter the test data of preset time threshold;Wherein, the solid state hard disk to be measured is in the state that storing data is sky, again
The hard disk of the data of the nominal amount of full data is write, the size of the test data is preset data block size;
Logging modle, for recording the IOPS of the solid state hard disk to be measured;
IOPS computing module calls the write module for repeating, until reaching preset measurement round, utilizes measurement
Every IOPS for taking turns the obtained solid state hard disk to be measured in window, it is oblique to obtain average IOPS, maximum IOPS, minimum IOPS and IOPS
Rate;Wherein, IOPS slope is the slope of the straight line of every IOPS fitting for taking turns the obtained solid state hard disk to be measured in measurement window;
Stable state judgment module, for judging whether that it is average that the difference for meeting maximum IOPS and minimum IOPS simultaneously is less than or equal to
The measurement round that the difference of the 10% of IOPS, maximum IOPS and minimum IOPS are equal to IOPS slope subtracts one times;
Stable state IOPS curve generation module, for when the stable state judgment module determines while meeting maximum IOPS and minimum
The difference of IOPS is less than or equal to the 10% of average IOPS, and the difference of maximum IOPS and minimum IOPS is equal to the measurement wheel of IOPS slope
It is secondary to subtract one times, then every IOPS for taking turns the obtained solid state hard disk to be measured in the measurement window is recorded, is obtained described to be measured solid
The stable state IOPS curve of state hard disk;
Loop module, for determining that the difference for not meeting maximum IOPS and minimum IOPS simultaneously is small when the stable state judgment module
In being equal to the 10% of average IOPS, the difference of maximum IOPS and minimum IOPS subtracts one times equal to the measurement round of IOPS slope,
The write module is then called, until reaching preset termination round.
The invention also discloses a kind of NVMe solid state hard disk IOPS test devices, comprising:
Memory, for storing computer program;
Processor realizes NVMe solid state hard disk IOPS test method as the aforementioned for executing the computer program.
In the present invention, NVMe solid state hard disk IOPS test method, comprising: S11: according to preset read-write ratio and data block
The test data of preset time threshold is persistently written to solid state hard disk to be measured at random for size;Wherein, solid state hard disk to be measured be
In the state that storing data is empty, the hard disk of the data of the nominal amount of full data is write again, the size of test data is default
Data block size;S12: the IOPS of solid state hard disk to be measured is recorded;S13: repeating S11, until reaching preset measurement wheel
It is secondary, using the IOPS for taking turns obtained solid state hard disk to be measured every in measurement window, obtain average IOPS, maximum IOPS, minimum IOPS
With IOPS slope;Wherein, IOPS slope is the straight line of every IOPS fitting for taking turns obtained solid state hard disk to be measured in measurement window
Slope;S14: judging whether that the difference for meeting maximum IOPS and minimum IOPS simultaneously is less than or equal to the 10% of average IOPS, maximum
The difference of IOPS and minimum IOPS subtract one times equal to the measurement round of IOPS slope;S15: if it is, every in record measurement window
The IOPS for taking turns obtained solid state hard disk to be measured, obtains the stable state IOPS curve of solid state hard disk to be measured;S16: if not, S11 is returned,
Until reaching preset termination round.
The present invention clearly sets stable state Rule of judgment, i.e., meets maximum IOPS simultaneously and the difference of minimum IOPS is less than or equal to
The measurement round that the difference of the 10% of average IOPS, maximum IOPS and minimum IOPS are equal to IOPS slope subtracts one times, it is ensured that exports
Stable state IOPS curve accuracy, meanwhile, without passing through front and back multiple groups test result to determine whether reach stable state, save
Testing time improves testing efficiency.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
The embodiment of invention for those of ordinary skill in the art without creative efforts, can also basis
The attached drawing of offer obtains other attached drawings.
Fig. 1 is a kind of NVMe solid state hard disk IOPS test method flow diagram disclosed by the embodiments of the present invention;
Fig. 2 is a kind of corresponding stable state IOPS curve synoptic diagram of different data block size disclosed by the embodiments of the present invention;
Fig. 3 is a kind of 4KiB disclosed by the embodiments of the present invention, the 100% stable state IOPS curve synoptic diagram write;
Fig. 4 is a kind of NVMe solid state hard disk IOPS test system structure schematic diagram disclosed by the embodiments of the present invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
The embodiment of the invention discloses a kind of NVMe solid state hard disk IOPS test method, shown in Figure 1, this method packets
It includes:
S11: according to preset read-write ratio and data block size, when being persistently written preset at random to solid state hard disk to be measured
Between threshold value test data.
Specifically, first being carried out to solid state hard disk to be measured to avoid the interference for having original residual data in solid state hard disk to be measured
Initialization, the storing data in solid state hard disk to be measured is emptied, for example, by operations such as safety erasing or low-level formattings, with
The data for ensuring not having remaining in solid state hard disk to be measured, avoid data extra on hard disk from impacting test result, into one
Step, when to avoid in solid state hard disk to be measured because of read-write data, the metadata of generation impacts test, writes full data again
Nominal amount data hard disk, the size of test data is preset data block size.
S12: the IOPS of solid state hard disk to be measured is recorded.
Specifically, when every test data that preset time threshold is persistently written at random to solid state hard disk to be measured, record to
IOPS when solid state disk read-write is surveyed, if the test number of preset time threshold is repeatedly persistently written at random to solid state hard disk to be measured
According to, then IOPS when repeatedly solid state disk read-write to be measured is recorded, certainly, if by preset read-write ratio and data block size, point
The test data of preset time threshold is persistently written at random to solid state hard disk to be measured for multiple groups, equally records, for example, shared
10 groups of preset read-write ratios and data block size then record the IOPS of 10 solid state hard disks to be measured.
S13: repeating S11, until reaching preset measurement round, is obtained using wheel every in measurement window to be measured solid
The IOPS of state hard disk obtains average IOPS, maximum IOPS, minimum IOPS and IOPS slope;Wherein, IOPS slope is measurement window
The slope of the straight line of interior every IOPS fitting for taking turns obtained solid state hard disk to be measured;
S14: judging whether that the difference for meeting maximum IOPS and minimum IOPS simultaneously is less than or equal to the 10% of average IOPS, maximum
The difference of IOPS and minimum IOPS subtract one times equal to the measurement round of IOPS slope.
Specifically, the difference for meeting maximum IOPS and minimum IOPS simultaneously is less than or equal to the 10% of average IOPS, maximum
The difference of IOPS and minimum IOPS subtract one times equal to the measurement round of IOPS slope, and the judgement of stable state whether is reached as solid state hard disk
Condition, i.e. MAX (IOPS)-MIN (IOPS)≤Ave (IOPS) * 10%, Slope (IOPS)=(MAX (IOPS)-MIN
(IOPS)) * (measurement round -1), in formula, MAX (IOPS) indicates maximum IOPS, MIN (IOPS) expression minimum IOPS, Ave
(IOPS) indicate that average IOPS, Slope (IOPS) indicate IOPS slope.
Specifically, due to giving accurately stable state Rule of judgment (Rule of judgment of stable state), once meeting can be defeated
Corresponding stable state IOPS curve out, without being tested again, by front and back multiple groups test result to determine whether reaching stable state,
The testing time is saved, testing efficiency is improved.
S15: if it is, every IOPS for taking turns obtained solid state hard disk to be measured in record measurement window, obtains solid-state to be measured
The stable state IOPS curve of hard disk.
Specifically, when meeting above-mentioned stable state Rule of judgment, then record every wheel in current measurement window mouth obtain it is to be measured solid
The IOPS of state hard disk obtains the stable state IOPS curve of solid state hard disk to be measured, certainly, other read-write ratios and data block in order to obtain
The corresponding stable state IOPS curve of size can continue to return to S11, be tested.
S16: if not, S11 is returned to, until reaching preset termination round.
It is understood that still needing to return S11 before not meeting stable state Rule of judgment and continuing to test, until meeting stable state
Rule of judgment, or reach preset termination round, then it can stop testing, it is for preventing solid-state to be measured hard that setting, which terminates round,
Disk failure, is unable to reach stable state for a long time, causes prolonged invalid test.
As it can be seen that the embodiment of the present invention clearly sets stable state Rule of judgment, i.e., meet maximum IOPS and minimum IOPS simultaneously
Difference be less than or equal to the 10% of average IOPS, the difference of maximum IOPS and minimum IOPS subtract one equal to the measurement round of IOPS slope
Times, it is ensured that the accuracy of the stable state IOPS curve of output, meanwhile, without passing through front and back multiple groups test result to determine whether reaching
To stable state, the testing time is saved, improves testing efficiency.
Specifically, solid state hard disk to be measured can be in the state that storing data is sky, progress data block be 128K size
Lasting sequential write, until total writing reaches twice of hard disk of hard-disk capacity, i.e., solid state hard disk to be measured needs before testing
Carry out above-mentioned data writing process, it is to be understood that when hard disc data is filled with, it is subsequent continue covering write, until
Total writing reaches twice of hard-disk capacity.
Wherein, preset time threshold can be one minute, and measurement round can be 5 wheels.
The embodiment of the invention discloses a kind of specific NVMe solid state hard disk IOPS test methods, implement relative to upper one
Example, the present embodiment have made further instruction and optimization to technical solution.It is specific:
Specifically, being normally set up one group of read-write ratio and data block when measuring IOPS stable state curve to solid state hard disk to be measured
Size is written data to solid state hard disk to be measured by repeatedly continuing, obtains multiple groups IOPS value, and then obtain reading corresponding to the group
Ratio and data block size are write, only one group of read-write ratio and data block size, solid state hard disk to be measured reaches steady when due to test
It may need to be repeated as many times before state to be written, stable state can be reached, it, can be with to accelerate the speed that solid state hard disk to be measured enters stable state
Setting multiple groups read and write ratio and data block size is tested.
Specifically, above-mentioned S11 persistently writes at random according to preset read-write ratio and data block size, to solid state hard disk to be measured
The process for entering the test data of the data block size of preset time threshold can specifically include S111 to S112;Wherein,
S111: a variety of read-write ratios and data block size is respectively set.
Specifically, preset multiple groups read-write ratio may include 100/0 read-write, 95/5 read-write, 65/35 read-write, 50/50 is read
It writes, 35/65 read-write, 5/95 read-write and 0/100 read-write;Wherein, above-mentioned numerical value indicates the accounting between read-write, for example, 100/0 reads
The read operation for indicating to execute 100% is write, 35/65 read-write indicates to execute 35% read operation, 65% write operation;Preset data
Block size then may include 1024KiB, 128KiB, 64KiB, 32KiB, 16KiB, 8KiB, 4KiB and 0.5KiB.
S112: every kind of read-write ratio and data block size are utilized, when being persistently written preset at random to solid state hard disk to be measured
Between threshold value test data.
Specifically, 95/5 read-write, 65/35 reads and writes for example, preset multiple groups read-write ratio includes 100/0 read-write, 50/50
Read-write, 35/65 read-write, 5/95 read-write and 0/100 read-write, preset data block size then includes 1024KiB, 128KiB,
64KiB, 32KiB, 16KiB, 8KiB, 4KiB and 0.5KiB, then the combination of every kind of read-write ratio and data block size shares 56 groups
Read-write ratio and data block size, one wheel in need that 56 groups of preset time thresholds are persistently written at random to solid state hard disk to be measured
Test data obtains 56 IOPS, and certainly each IOPS corresponds to one group of read-write ratio and data block size.
Further, when being tested using multiple groups read-write ratio and data block size, measurement window is utilized in above-mentioned S13
Every IOPS for taking turns obtained solid state hard disk to be measured in mouthful, obtains the mistake of average IOPS, maximum IOPS, minimum IOPS and IOPS slope
Journey can specifically include and utilize the every wheel for reading and writing ratio according to preset target in measurement window and target data block size obtains
Solid state hard disk to be measured IOPS, obtain average IOPS, maximum IOPS, minimum IOPS and IOPS slope.
Although specifically, using, multiple groups read and write ratio and data block size is tested, and calculate solid state hard disk to be measured
When whether entering stable state, the solid-state to be measured of every wheel of selected one group preset target read-write ratio and target data block size is still needed to
The IOPS of hard disk obtains the IOPS curve of the group to calculate average IOPS, maximum IOPS, minimum IOPS and IOPS slope, referring to
Shown in Fig. 2, the stable state IOPS curve of different read-write ratios and data block size group needs individually to calculate.
Wherein, shown in Figure 3, it can preferably use target read-write ratio to write for 100%, target data block size is
Judgement group of the 4KiB as the stable state IOPS curve of solid state hard disk to be measured.
Correspondingly, the embodiment of the invention also discloses a kind of NVMe solid state hard disk IOPS test macro, it is shown in Figure 4,
The system includes:
Writing module 11, for continuing at random to solid state hard disk to be measured according to preset read-write ratio and data block size
The test data of preset time threshold is written;Wherein, solid state hard disk to be measured is to write again in the state that storing data is sky
The hard disk of the data of the nominal amount of full data, the size of test data are preset data block size;
Logging modle 12, for recording the IOPS of solid state hard disk to be measured;
IOPS computing module 13 calls writing module for repeating, until reaching preset measurement round, utilizes measurement window
Every IOPS for taking turns obtained solid state hard disk to be measured in mouthful, obtains average IOPS, maximum IOPS, minimum IOPS and IOPS slope;Its
In, IOPS slope is the slope of the straight line of every IOPS fitting for taking turns obtained solid state hard disk to be measured in measurement window;
Stable state judgment module 14, for judging whether that it is average that the difference for meeting maximum IOPS and minimum IOPS simultaneously is less than or equal to
The measurement round that the difference of the 10% of IOPS, maximum IOPS and minimum IOPS are equal to IOPS slope subtracts one times;
Stable state IOPS curve generation module 15, for when stable state judgment module determines while meeting maximum IOPS and minimum
The difference of IOPS is less than or equal to the 10% of average IOPS, and the measurement round that the difference of maximum IOPS and minimum IOPS is equal to IOPS slope subtracts
One times, then every IOPS for taking turns obtained solid state hard disk to be measured in measurement window is recorded, the stable state IOPS of solid state hard disk to be measured is obtained
Curve;
Loop module 16, for determining that the difference for not meeting maximum IOPS and minimum IOPS simultaneously is less than when stable state judgment module
Equal to the 10% of average IOPS, the difference of maximum IOPS and minimum IOPS subtracts one times equal to the measurement round of IOPS slope, then calls
Writing module, until reaching preset termination round.
In addition, the embodiment of the invention also discloses a kind of NVMe solid state hard disk IOPS test devices, comprising:
Memory, for storing computer program;
Processor realizes NVMe solid state hard disk IOPS test method as the aforementioned for executing computer program.
Finally, it is to be noted that, herein, relational terms such as first and second and the like be used merely to by
One entity or operation are distinguished with another entity or operation, without necessarily requiring or implying these entities or operation
Between there are any actual relationship or orders.Moreover, the terms "include", "comprise" or its any other variant meaning
Covering non-exclusive inclusion, so that the process, method, article or equipment for including a series of elements not only includes that
A little elements, but also including other elements that are not explicitly listed, or further include for this process, method, article or
The intrinsic element of equipment.In the absence of more restrictions, the element limited by sentence "including a ...", is not arranged
Except there is also other identical elements in the process, method, article or apparatus that includes the element.
Professional further appreciates that, unit described in conjunction with the examples disclosed in the embodiments of the present disclosure
And algorithm steps, can be realized with electronic hardware, computer software, or a combination of the two, in order to clearly demonstrate hardware and
The interchangeability of software generally describes each exemplary composition and step according to function in the above description.These
Function is implemented in hardware or software actually, the specific application and design constraint depending on technical solution.Profession
Technical staff can use different methods to achieve the described function each specific application, but this realization is not answered
Think beyond the scope of this invention.
A kind of NVMe solid state hard disk IOPS test method provided by the present invention, system and device have been carried out in detail above
It introduces, used herein a specific example illustrates the principle and implementation of the invention, the explanation of above embodiments
It is merely used to help understand method and its core concept of the invention;At the same time, for those skilled in the art, according to this
The thought of invention, there will be changes in the specific implementation manner and application range, in conclusion the content of the present specification is not answered
It is interpreted as limitation of the present invention.
Claims (10)
1. a kind of NVMe solid state hard disk IOPS test method characterized by comprising
S11: according to preset read-write ratio and data block size, preset time threshold is persistently written at random to solid state hard disk to be measured
The test data of value;Wherein, the solid state hard disk to be measured is to write the specified of full data again in the state that storing data is sky
The hard disk of the data of size, the size of the test data are preset data block size;
S12: the IOPS of the solid state hard disk to be measured is recorded;
S13: repeating S11, until reaching preset measurement round, is obtained using wheel every in measurement window described to be measured solid
The IOPS of state hard disk obtains average IOPS, maximum IOPS, minimum IOPS and IOPS slope;Wherein, IOPS slope is measurement window
The slope of the straight line of interior every IOPS fitting for taking turns the obtained solid state hard disk to be measured;
S14: judge whether that the difference for meeting maximum IOPS and minimum IOPS simultaneously is less than or equal to the 10% of average IOPS, maximum IOPS
The measurement round for being equal to IOPS slope with the difference of minimum IOPS subtracts one times;
S15: it if it is, recording every IOPS for taking turns the obtained solid state hard disk to be measured in the measurement window, obtains described
The stable state IOPS curve of solid state hard disk to be measured;
S16: if not, S11 is returned to, until reaching preset termination round.
2. NVMe solid state hard disk IOPS test method according to claim 1, which is characterized in that the solid state hard disk to be measured
To carry out the sequential write of 128K in the state that storing data is sky, until total writing reaches the hard of twice of hard-disk capacity
Disk.
3. NVMe solid state hard disk IOPS test method according to claim 2, which is characterized in that the preset time threshold
Value is one minute.
4. NVMe solid state hard disk IOPS test method according to claim 3, which is characterized in that the measurement round is 5
Wheel.
5. NVMe solid state hard disk IOPS test method according to any one of claims 1 to 4, which is characterized in that described to press
According to preset read-write ratio and data block size, the number of preset time threshold is persistently written at random to solid state hard disk to be measured
According to the process of the test data of block size, comprising:
A variety of read-write ratios and data block size is respectively set;
Using every kind of read-write ratio and data block size, the survey of preset time threshold is persistently written at random to solid state hard disk to be measured
Try data.
6. NVMe solid state hard disk IOPS test method according to claim 5, which is characterized in that described to utilize measurement window
It is interior it is every take turns the obtained IOPS of the solid state hard disk to be measured, obtain average IOPS, maximum IOPS, minimum IOPS and IOPS slope
Process, comprising:
Utilize the described to be measured of the every wheel obtained in measurement window according to preset target read-write ratio and target data block size
The IOPS of solid state hard disk obtains average IOPS, maximum IOPS, minimum IOPS and IOPS slope.
7. NVMe solid state hard disk IOPS test method according to claim 5, which is characterized in that the preset read-write ratio
Example includes 100/0 read-write, 95/5 read-write, 65/35 read-write, 50/50 read-write, 35/65 read-write, 5/95 read-write and 0/100 read-write;
The preset data block size includes 1024KiB, 128KiB, 64KiB, 32KiB, 16KiB, 8KiB, 4KiB and
0.5KiB。
8. NVMe solid state hard disk IOPS test method according to claim 7, which is characterized in that the target reads and writes ratio
It is write for 100%, the target data block size is 4KiB.
9. a kind of NVMe solid state hard disk IOPS test macro characterized by comprising
Writing module, for according to preset read-write ratio and data block size, persistently write-in to be pre- at random to solid state hard disk to be measured
If time threshold test data;Wherein, the solid state hard disk to be measured is to write again full in the state that storing data is sky
The hard disk of the data of the nominal amount of data, the size of the test data are preset data block size;
Logging modle, for recording the IOPS of the solid state hard disk to be measured;
IOPS computing module calls the write module for repeating, until reaching preset measurement round, utilizes measurement window
Interior every IOPS for taking turns the obtained solid state hard disk to be measured, obtains average IOPS, maximum IOPS, minimum IOPS and IOPS slope;
Wherein, IOPS slope is the slope of the straight line of every IOPS fitting for taking turns the obtained solid state hard disk to be measured in measurement window;
Stable state judgment module, for judging whether that the difference for meeting maximum IOPS and minimum IOPS simultaneously is less than or equal to average IOPS's
The difference of 10%, maximum IOPS and minimum IOPS subtract one times equal to the measurement round of IOPS slope;
Stable state IOPS curve generation module, for when the stable state judgment module determines while meeting maximum IOPS and minimum IOPS
Difference be less than or equal to the 10% of average IOPS, the difference of maximum IOPS and minimum IOPS subtract equal to the measurement round of IOPS slope
One times, then every IOPS for taking turns the obtained solid state hard disk to be measured in the measurement window is recorded, it is hard to obtain the solid-state to be measured
The stable state IOPS curve of disk;
Loop module, for determining that the difference for not meeting maximum IOPS and minimum IOPS simultaneously is less than when the stable state judgment module
In the 10% of average IOPS, the difference of maximum IOPS and minimum IOPS subtracts one times equal to the measurement round of IOPS slope, then adjusts
With the write module, until reaching preset termination round.
10. a kind of NVMe solid state hard disk IOPS test device characterized by comprising
Memory, for storing computer program;
Processor realizes NVMe solid state hard disk as described in any one of claim 1 to 7 for executing the computer program
IOPS test method.
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111666184A (en) * | 2020-06-29 | 2020-09-15 | 腾讯科技(深圳)有限公司 | Solid state drive SSD hard disk test method and device and electronic equipment |
CN113010362A (en) * | 2019-12-19 | 2021-06-22 | 中国信息通信研究院 | Method and device for determining energy efficiency grade of storage equipment |
CN113868052A (en) * | 2021-09-18 | 2021-12-31 | 苏州浪潮智能科技有限公司 | IOPS test method, device and storage medium based on PID algorithm |
CN115951088A (en) * | 2023-03-10 | 2023-04-11 | 南京华盾电力信息安全测评有限公司 | Wind turbine generator anemograph abnormity analysis method |
CN116705140A (en) * | 2023-08-02 | 2023-09-05 | 江苏华存电子科技有限公司 | Temperature reliability test method and test platform for enterprise-level solid state disk |
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Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9753987B1 (en) * | 2013-04-25 | 2017-09-05 | EMC IP Holding Company LLC | Identifying groups of similar data portions |
US9760392B1 (en) * | 2015-08-31 | 2017-09-12 | Veritas Technologies Llc | Adaptive throttling in hybrid storage environments |
CN107545927A (en) * | 2017-08-25 | 2018-01-05 | 郑州云海信息技术有限公司 | A kind of SSD automatic performance method of testings realized based on fio |
CN109086176A (en) * | 2018-07-26 | 2018-12-25 | 郑州云海信息技术有限公司 | A kind of SSD steady-state method of test, device, equipment and storage medium based on FIO |
CN109346122A (en) * | 2018-10-15 | 2019-02-15 | 郑州云海信息技术有限公司 | The test method and device of solid state hard disk performance |
CN109448778A (en) * | 2018-11-06 | 2019-03-08 | 郑州云海信息技术有限公司 | A kind of solid state hard disk performance test methods, system, device and readable storage medium storing program for executing |
CN109471762A (en) * | 2018-10-30 | 2019-03-15 | 新华三技术有限公司 | Solid-state hard disk SSD performance test methods and device |
-
2019
- 2019-04-18 CN CN201910313349.3A patent/CN110111835B/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9753987B1 (en) * | 2013-04-25 | 2017-09-05 | EMC IP Holding Company LLC | Identifying groups of similar data portions |
US9760392B1 (en) * | 2015-08-31 | 2017-09-12 | Veritas Technologies Llc | Adaptive throttling in hybrid storage environments |
CN107545927A (en) * | 2017-08-25 | 2018-01-05 | 郑州云海信息技术有限公司 | A kind of SSD automatic performance method of testings realized based on fio |
CN109086176A (en) * | 2018-07-26 | 2018-12-25 | 郑州云海信息技术有限公司 | A kind of SSD steady-state method of test, device, equipment and storage medium based on FIO |
CN109346122A (en) * | 2018-10-15 | 2019-02-15 | 郑州云海信息技术有限公司 | The test method and device of solid state hard disk performance |
CN109471762A (en) * | 2018-10-30 | 2019-03-15 | 新华三技术有限公司 | Solid-state hard disk SSD performance test methods and device |
CN109448778A (en) * | 2018-11-06 | 2019-03-08 | 郑州云海信息技术有限公司 | A kind of solid state hard disk performance test methods, system, device and readable storage medium storing program for executing |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113010362A (en) * | 2019-12-19 | 2021-06-22 | 中国信息通信研究院 | Method and device for determining energy efficiency grade of storage equipment |
CN113010362B (en) * | 2019-12-19 | 2022-05-06 | 中国信息通信研究院 | Method and device for determining energy efficiency grade of storage equipment |
CN111666184A (en) * | 2020-06-29 | 2020-09-15 | 腾讯科技(深圳)有限公司 | Solid state drive SSD hard disk test method and device and electronic equipment |
CN113868052A (en) * | 2021-09-18 | 2021-12-31 | 苏州浪潮智能科技有限公司 | IOPS test method, device and storage medium based on PID algorithm |
CN113868052B (en) * | 2021-09-18 | 2023-07-18 | 苏州浪潮智能科技有限公司 | IOPS (input/output) testing method and device based on PID (proportion integration differentiation) algorithm and storage medium |
CN115951088A (en) * | 2023-03-10 | 2023-04-11 | 南京华盾电力信息安全测评有限公司 | Wind turbine generator anemograph abnormity analysis method |
CN115951088B (en) * | 2023-03-10 | 2023-08-25 | 南京南自华盾数字技术有限公司 | Wind turbine anemometer anomaly analysis method |
CN116705140A (en) * | 2023-08-02 | 2023-09-05 | 江苏华存电子科技有限公司 | Temperature reliability test method and test platform for enterprise-level solid state disk |
CN116893940A (en) * | 2023-09-08 | 2023-10-17 | 江苏华存电子科技有限公司 | Method and system for testing consistency of enterprise-level solid state disk array performance |
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