CN1100998C - Characteristic tester for sensor - Google Patents

Characteristic tester for sensor Download PDF

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Publication number
CN1100998C
CN1100998C CN 98124974 CN98124974A CN1100998C CN 1100998 C CN1100998 C CN 1100998C CN 98124974 CN98124974 CN 98124974 CN 98124974 A CN98124974 A CN 98124974A CN 1100998 C CN1100998 C CN 1100998C
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China
Prior art keywords
emitter
amplifier
output
characteristic
sensor
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Expired - Fee Related
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CN 98124974
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Chinese (zh)
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CN1254847A (en
Inventor
朱光武
梁金宝
王世金
翟应应
张微
孙越强
李宏
黄红锦
吴洪钟
肖锡东
张骅忠
尹秋岩
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National Space Science Center of CAS
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National Space Science Center of CAS
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Priority to CN 98124974 priority Critical patent/CN1100998C/en
Publication of CN1254847A publication Critical patent/CN1254847A/en
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Publication of CN1100998C publication Critical patent/CN1100998C/en
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Expired - Fee Related legal-status Critical Current

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Abstract

The present invention relates to a detection circuit with the characteristic of a sensor, which is a special integrated circuit for space environment and is used for a space environment monitor of various satellites and spacecrafts in China. The embodiment of the present invention is composed of three parts of an amplifier, a rectifying filtering and an emitter-follower output. Input signals are sine waves, pulse waves, or various noise signals, the amplifier part Kv is larger than or equal to 30 times, and the input-output characteristic basically accords with the Vi-Vo characteristic of a germanium discrete device; the emitter follower outputs 0 to 5 V DC electrical level, and the output impedance is smaller than or equal to 2 K omega.

Description

A kind of characteristic tester for sensor
The present invention relates to a kind of characteristic tester for sensor, particularly a kind ofly can reduce component number, can realize the characteristic tester for sensor of measuring ability with monolithic integrated optical circuit.
Space exploration needs low-power consumption, highly reliable, the device that can adapt to various space environments.
Be applied to the characteristic tester for sensor of all kinds of satellites of China and spacecraft space environment monitor aspect at present, general no sensor characteristic detection means or the characteristic tester for sensor that adopts discrete component to form, it has complex structure and the big shortcoming that takes up room.
The objective of the invention is to, a kind of characteristic tester for sensor is provided, it has the few and little advantage that takes up room of components and parts of use.
Another object of the present invention is to, a kind of characteristic tester for sensor is provided, it can be made into integrated circuit.
A kind of characteristic tester for sensor of the present invention comprises emitter follower output, it is characterized in that, wherein also comprises: an amplifier, the input signal of this amplifier are sine wave, pulsating wave or each noise-like signal; One rectifier filer, the input end of this rectifier filer is connected with the output terminal of amplifier; The output terminal of this rectifier filer is connected with the input end of emitter follower output.
Wherein amplifier comprises: a transistor T 1, the base stage of this transistor T 1 is connected to resistance R 1, between the R2, the emitter of T1 is connected with resistance R 4 and ground connection, the collector of T1 is connected with the other end of resistance R 3 and R1, and through capacitor C 1, resistance R 5 is received the base stage of transistor T 2, connecting resistance R6 between the emitter of T2 and the ground, the emitter of T2 is connected with the base stage of transistor T 6, the grounded emitter of T6, the collector of T6 is through diode D2, D1 connects transistor T 3 collectors and T7 base stage, the collector of T6 connects transistor T 8 base stages, transistor T 3 base stages are connected with transistor T 4 base stages, and receive the emitter of transistor T 5 simultaneously, and the T5 base stage is connected with the T4 collector, and be connected with R8 simultaneously, the other end of R8 is connected with the collector of T5, transistor T 3, the emitter of T4 and T7 collector are connected to power Vcc, and the T7 emitter is received resistance R 10 through resistance R 9, resistance R 10 other ends are connected T8 grounded collector with the emitter of transistor T 8.
Wherein rectifier filer comprises: diode D3, the D4 of a serial connection are connected with resistance R 11, resistance R 11 is connected with the base stage of diode D5, resistance R 13 and capacitor C 2 and transistor T 9, diode D5 is through D6 ground connection, and the other end of resistance R 13 is through resistance R 14 ground connection; Resistance R 13 forms the unidirectional FEEDBACK CONTROL of rectifier filer to amplifier through the base stage that resistance R 12 and diode D5 are connected to transistor T 2.
Below in conjunction with accompanying drawing feature of the present invention and structure are carried out an introduction in detail, wherein:
Fig. 1 is the circuit theory diagrams of the embodiment of the invention.
As seen from Figure 1, the present invention includes an amplifier 1, the input signal of this amplifier 1 is sine wave, pulsating wave or each noise-like signal; One rectifier filer 2, the input end of this rectifier filer 2 is connected with the output terminal of amplifier 1; The output terminal of this rectifier filer 2 is connected with the input end of emitter follower output 3.
Embodiment of the invention structure is that pulse signal is through the input of " 2 " end, be connected to the base stage of T1, R1, R2 forms bleeder circuit provides forward bias for T1, the T1 emitter is connected with R4, collector is connected with R3 and R1, forming grounded emitter amplifier with top amplifies as the first order, amplifying signal is exported by collector, through C1, R5 (external) receives the base stage of T2, promptly hold " 1 ", connecting resistance R6 between the emitter of T2 and the common port, signal is through T2, the emitter follower that R6 forms exports the base stage of T6 to, the T6 emitter connects common port, collector connects negative pole and the T8 base stage of D2, the positive pole of D2 is connected with the D1 negative pole, the D1 positive pole is received T3 collector and T7 base stage simultaneously, the T3 base stage is connected with the T4 base stage, and receive the emitter of T5 simultaneously, the T5 base stage is connected with the T4 collector, and be connected with R8 simultaneously, form differential amplifier with top, the other end of R8 is connected T3 with the collector of T5, the emitter of T4 and T7 collector are connected to Vcc, the T7 emitter is connected with R9, the other end of R9 is received R10 and D3 anode, connects and composes backfeed loop by resistance R 7 (external) and " 1 " end simultaneously, and the R10 other end is connected with the T8 emitter, the T8 collector is connected to common port, the D3 negative terminal is connected with the D4 anode, and the D4 negative terminal is connected with R10, and the other end of R10 is connected to the D5 negative terminal, R13 and T9 emitter, the D5 anode is connected with the D6 anode, the D6 negative terminal is connected to common port, the other end of R13 and R14, R12 connects, another termination common port of R14, the R12 other end is connected with the D5 anode, the D5 negative terminal is connected to " 1 " end, and the T9 collector is connected to Vcc, and emitter is connected with R15, the other end of R15 is connected with R16, the other end of R16 is connected to common port, R15, R16 forms bleeder circuit, as output terminal " 6 ".
The present invention is a kind of space environment special IC, is applied to all kinds of satellites of China and spacecraft space environment monitor.Design of the present invention, be fabricated to the universalization of Chinese Space environmental monitor complete machine, seriation, modularization and lay a good foundation.
The embodiment of the invention is exported three parts by amplifier, rectifying and wave-filtering, emitter follower and is formed.Input signal is sinusoidal wave, pulsating wave or each noise-like signal, amplifier section Kv 〉=30 times, and input-output characteristic meets the Vi-Vo characteristic of germanium discrete device substantially, emitter follower output 0-5V DC level, output impedance≤2K Ω.
Embodiment of the invention rectifier filer is a silicon diode, and forms DC level through the RC filter network, and the design of feedback quantity makes small-signal can obtain enough big amplification, and large-signal is had bigger compression, and decay is to guarantee output level≤5V.Penetrate with output stage, adopt dividing potential drop output, to guarantee output voltage≤5V, output impedance≤2K Ω.
One embodiment of the present invention is a monolithic integrated optical circuit, and 8 pin are arranged, the black pottery encapsulation, and model is LT9733.
The present invention is for guaranteeing enough big enlargement factor, two PNP pipes of rectification input stage, the form of employing complex pipe, assurance β 〉=20.The electric current that PNP pipe unit perimeter is born adopts the ratio design of 0.015mA/ μ m, improves the reliability of β characteristic and work, to reduce base self-biasing effect.Penetrate pipe for rectifying and wave-filtering level and output, except that above-mentioned measure, also will add dense phosphorus ring, to improve its large current characteristic with the longitudinal P NP between the level.

Claims (1)

1, the integrated testing circuit of a kind of sensor characteristic comprises an amplifier, a rectifier filer, the input end of this rectifier filer is connected with the output terminal of amplifier, emitter follower output, and the output terminal of this rectifier filer is connected with the input end of emitter follower output, it is characterized in that
Wherein connect between the base stage of the base stage of the transistor T 7 in this amplifier and transistor T 8 and be connected to two diode D2, D1.
CN 98124974 1998-11-25 1998-11-25 Characteristic tester for sensor Expired - Fee Related CN1100998C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 98124974 CN1100998C (en) 1998-11-25 1998-11-25 Characteristic tester for sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 98124974 CN1100998C (en) 1998-11-25 1998-11-25 Characteristic tester for sensor

Publications (2)

Publication Number Publication Date
CN1254847A CN1254847A (en) 2000-05-31
CN1100998C true CN1100998C (en) 2003-02-05

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CN 98124974 Expired - Fee Related CN1100998C (en) 1998-11-25 1998-11-25 Characteristic tester for sensor

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Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103715936B (en) * 2013-12-19 2015-11-04 东文高压电源(天津)有限公司 The amplifying circuit that the bipolarity high-voltage pulse be made up of separate piece exports
CN109696181B (en) * 2018-12-25 2020-10-20 上海航天控制技术研究所 Equivalent detection circuit of MHD angular vibration sensor and correction method of frequency band characteristic of equivalent detection circuit

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