CN110082356A - The visible detection method and device of wire surface defect - Google Patents
The visible detection method and device of wire surface defect Download PDFInfo
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- CN110082356A CN110082356A CN201910320808.0A CN201910320808A CN110082356A CN 110082356 A CN110082356 A CN 110082356A CN 201910320808 A CN201910320808 A CN 201910320808A CN 110082356 A CN110082356 A CN 110082356A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8835—Adjustable illumination, e.g. software adjustable screen
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The present invention relates to technical field of vision detection, refer in particular to the visible detection method and device of a kind of wire surface defect, include the following steps, carry out Image Acquisition to workpiece surface；The fixed test frame of spot defects algorithm is set, the operation of spot defects algorithm is carried out to the image section being located in fixed test frame, specific step is as follows for the spot defects algorithm, and identification is located at the abnormal area in the part workpiece surface image in fixed test frame；Threshold segmentation is carried out to abnormal area and non-abnormal area, obtains the apparent abnormal area that develops the color；Calculate the area figures for the apparent abnormal area that develops the color；The area figures are judged whether within the scope of the figure tolerances of defect area, if the workpiece existing defects if, if defect is not present in the workpiece.Judging result is exported.Cooperation from hardware to software and between hardware and software has carried out innovative optimization, controls use cost well while reaching high quality detection identification defect.
Description
Technical field
The present invention relates to technical field of vision detection, refer in particular to the visible detection method and dress of a kind of wire surface defect
It sets.
Background technique
The characteristics of Machine Vision Detection is the flexibility and the degree of automation for improving production.It is not suitable for manual work some
Dangerous work environment or artificial vision be difficult to the occasion met the requirements, machine in normal service vision substitutes artificial vision；Exist simultaneously
In high-volume industrial processes, manually visual inspection product quality low efficiency and precision is not high, with Machine Vision Detection side
Method can greatly improve the degree of automation of production efficiency and production.And machine vision is easily achieved information integration, is to realize
The basic technology of computer integrated manufacturing system.Vision-based detection is exactly to replace human eye with machine to measure and judge.Vision-based detection is
Refer to that, by machine vision product, image-pickup device is divided to CMOS and two kinds of CCD, will be ingested target and be converted into picture signal,
It sends dedicated image processing system to, according to the information such as pixel distribution and brightness, color, is transformed into digitized signal；Image
System carries out various operations to these signals to extract clarification of objective, and then the equipment at scene is controlled according to the result of differentiation
Movement.It is the valuable mechanism for producing, assembling or pack.It is in detection defect and prevents from faulty goods to be dispensed into disappearing
There is immeasurable value in terms of the function of the person of expense.
As above situation, vision-based detection has huge market value, most crucial in vision-based detection system not to be
Hardware device but algorithm steps, and algorithm steps can be because of testing result requirement, product shape, operating environment situation and design
The appearance of the factors such as the technical capability of personnel or group is multifarious, if core algorithm step design shortcoming, affects a whole set of view
Feel the operational efficiency and running quality of detection device, and the detection algorithm step of wire surface defect in the market is all more multiple
Miscellaneous, use cost is high, is unfavorable for general producer and implements.
Summary of the invention
The technical problem to be solved in the present invention is to provide a kind of algorithm steps are simple, cooperation special parameter and specific shooting
Device layout reaches the vision of the wire surface defect of the analytical judgment result of high quality graphic collection effect and high accuracy
Detection method and device.
In order to solve the above-mentioned technical problem, the present invention adopts the following technical scheme: a kind of vision of wire surface defect is examined
Method and device is surveyed, is included the following steps, step A: Image Acquisition is carried out to workpiece surface；
Step B: the fixed test frame of setting spot defects algorithm is located in fixed test frame in the workpiece surface image of acquisition
Image section carry out the operation of spot defects algorithm, specific step is as follows for the spot defects algorithm,
Step B1: identification is located at the abnormal area in the part workpiece surface image in fixed test frame；
Step B2: Threshold segmentation is carried out to abnormal area and non-abnormal area, obtains the apparent abnormal area that develops the color；
Step B3: the area figures for the apparent abnormal area that develops the color are calculated；
Step B4: judging the area figures whether within the scope of the figure tolerances of defect area, if the workpiece existing defects if,
Defect is not present if the workpiece not if；
Step C: judging result is exported.
Preferably, in the step B2, the threshold value for carrying out Threshold segmentation is 100 to 155.
Preferably, in the step B2, the threshold value for carrying out Threshold segmentation is 126.
Preferably, in the step B3, the formula for calculating the area figures for the apparent abnormal area that develops the color is as follows: pixel
Precision * pixel precision * pixel number=area figures.
Preferably, in the step B4, the figure tolerances range of defect area is 0.01 to 0.5 square millimeter.
Preferably, in the step A, the industrial phase of 300 to 6,000,000 pixels is used when to workpiece surface progress Image Acquisition
The tight shot of 12 to 25 millimeters of machine collocation, the tight shot are located at the surface of workpiece, hanging down between tight shot and workpiece
Straight spacing distance is 180 to 230 millimeters.
Preferably, it in the step A, is taken when carrying out Image Acquisition to workpiece surface using the industrial camera of 5,000,000 pixels
With 16 millimeters of tight shot, which is located at the surface of workpiece, the perpendicular separation between tight shot and workpiece away from
From being 200 millimeters.
Preferably, in the step A, it is irradiated in two upper sides of workpiece using two white strip sources,
Angle between the light-emitting surface and horizontal plane of this two white strip sources is 36 to 50 degree, between two white strip sources
Horizontal interval distance be 160 to 230 millimeters, the perpendicular separation distance between this two white strip sources and workpiece for 78 to
120 millimeters.
Preferably, in the step A, it is irradiated in two upper sides of workpiece using two white strip sources,
Angle between the light-emitting surface and horizontal plane of this two white strip sources is 44 degree, the water between two white strip sources
Flat spacing distance is 100 millimeters, and the perpendicular separation distance between this two white strip sources and workpiece is 95 millimeters.
The beneficial effects of the present invention are: the visible detection method and device of a kind of wire surface defect are provided, in reality
In the application process of border, the wire rod workpiece of strip is moved to industrial camera and the lower section of tight shot carries out Image Acquisition, to work
The mutual cooperation of industry camera, tight shot and strip source has carried out the effectively optimizing i.e. selection of relevant parameter and mutual
Location arrangements make it that can shoot the workpiece surface image of high quality, fixed test frame are arranged, only to the line in fixed test frame
Material surface image part carries out detecting the accuracy that effective lift pins detect wire rod, cooperates the spot defects of optimization to detect and calculates
Method, efficient real new defects detection recognition effect, the cooperation from hardware to software and between hardware and software are created
The optimization of new property controls use cost while reaching high quality detection identification defect well.
Detailed description of the invention
Fig. 1 is the step functional block diagram of the visible detection method of wire surface defect of the present invention.
Fig. 2 is the step functional block diagram of spot defects algorithm in the present invention.
Fig. 3 is the positional diagram of industrial camera, tight shot, strip source and workpiece in the present invention.
Specific embodiment
For the ease of the understanding of those skilled in the art, below with reference to embodiment, the present invention is further illustrated, real
The content that the mode of applying refers to not is limitation of the invention.
As shown in Figure 1 to Figure 3, a kind of visible detection method and device of wire surface defect, include the following steps, step
A: Image Acquisition is carried out to 4 surface of workpiece, is taken when carrying out Image Acquisition to 4 surface of workpiece using the industrial camera 1 of 5,000,000 pixels
With 16 millimeters of tight shot 2, which is located at the surface of workpiece 4, between vertical between tight shot 2 and workpiece 4
Gauge is irradiated it in two upper sides of workpiece 4 from being 200 millimeters, using two white strip sources 3, two whites
Angle between the light-emitting surface and horizontal plane of strip source 3 is 44 degree, the horizontal interval between two white strip sources 3 away from
From being 100 millimeters, the perpendicular separation distance between this two white strip sources 3 and workpiece 4 is 95 millimeters；
Step B: setting spot defects algorithm fixed test frame, in 4 surface image of workpiece of acquisition be located at fixed test frame
Interior image section carries out the operation of spot defects algorithm, and specific step is as follows for the spot defects algorithm,
Step B1: identification is located at the abnormal area in 4 surface image of part workpiece in fixed test frame；
Step B2: Threshold segmentation is carried out to abnormal area and non-abnormal area, obtains the apparent abnormal area that develops the color, carries out threshold value
The threshold value of segmentation is 126；
Step B3: calculating the area figures for the apparent abnormal area that develops the color, and calculates the area figures for the apparent abnormal area that develops the color
Formula it is as follows: pixel precision * pixel precision * pixel number=area figures；
Step B4: judge the area figures whether within the scope of the figure tolerances of defect area, the figure tolerances model of defect area
Enclosing is 0.01 to 0.5 square millimeter, if 4 existing defects of workpiece if, if defect is not present in the workpiece 4；
Step C: judging result is exported.
The visible detection method and device of the wire surface defect of the present embodiment, in actual application, strip
Wire rod workpiece 4 is moved to industrial camera 1 and the lower section of tight shot 2 carries out Image Acquisition, to industrial camera 1,2 and of tight shot
The mutual cooperation of strip source has carried out the selection and mutual location arrangements of the i.e. relevant parameter of effectively optimizing, clap it can
Take out 4 surface image of workpiece of high quality, fixed test frame be set, only to the wire surface image section in fixed test frame into
Row detects the accuracy that effective lift pins detect wire rod, cooperates the spot defects detection algorithm of optimization, efficient real new defect
Recognition effect is detected, the cooperation from hardware to software and between hardware and software has carried out innovative optimization, reaches high
Quality testing controls use cost while identifying defect well.
Camera type selecting: the design parameter of image collecting device selects the industrial camera 1 of 5,000,000 pixels, theoretical precision=view
Wild max/ resolution ratio max=112/2448=0.0458 mm/pixel；
Camera lens type selecting: selecting the tight shot 2 of 16mm, compatible having a size of 2/3 "；It can be in one-time detection workpiece 4 within sweep of the eye
A length of 100mm；
Light source type selecting: by being shot using different types of pair of workpiece 4, the experimental results showed that white strip source is to work
Part 4 is shot, and the profile that is presented, shape, size and other effects are more preferably.And it can be by the scraping article on 4 surface of workpiece, cut
It is imaged as white, it is made to be imaged as black degree of forming a sharp contrast with qualified product, conducive to the processing and analysis of software.
Since workpiece 4 is that entire volume charging cable carries out defects detection, workpiece 4 carries out learning position without template, therefore uses
Fixed test frame detects 4 defect of workpiece, is identified by spot defects algorithm to 4 surface defect of workpiece, to workpiece 4
Defect and background color carry out different threshold values (threshold value=126) and handle, and in threshold value=126, charging cable surface scratch is imaged as white,
It forms a sharp contrast with non-defective unit position for black, conducive to the analysis and processing of algorithm software.According to the result setting after threshold value
The judgement of minimal spot area.
Minimal spot area formula=pixel precision * pixel precision * number of pixels, the pixel precision in the formula are
The speck area margin of tolerance is arranged are as follows: 0.01mm2 < spot in theoretical precision i.e. 0.0458 mm/pixel in above-mentioned camera type selecting
Point area < 0.5mm2；
Use condition algorithm carries out condition limitation to speck area, this sample precision range is ± 0.05mm；
Software processing result is shown by interface numerical value.
In the description of the present invention, it should be noted that " laterally (X) ", " vertical if any term " center " for the noun of locality
To (Y) ", " vertical (Z) " " length ", " width ", " thickness ", "upper", "lower", "front", "rear", "left", "right", "vertical", " water
It is flat ", "top", "bottom", "inner", "outside", " clockwise ", the indicating positions such as " counterclockwise " and positional relationship be based on the figure
Orientation or positional relationship, be merely for convenience of narration the present invention and simplify description, rather than the device of indication or suggestion meaning or
Element must have a particular orientation, be constructed and be operated with particular orientation, should not be understood as limiting specific protection model of the invention
It encloses.
In addition, being used for description purposes only if any term " first ", " second ", it is not understood to indicate or imply relatively heavy
The property wanted or the quantity for implicitly indicating technical characteristic." first " is defined as a result, " second " feature can be expressed or implicit include
One or more this feature, in the present description, " several " are meant that two or more, unless otherwise clearly having
The restriction of body.
In the present invention, except as otherwise clear stipulaties and restriction, should make if any term " assembling ", " connected ", " connection " term
Broad sense goes to understand, for example, it may be being fixedly connected, may be a detachable connection, or be integrally connected；It is also possible to mechanical connect
It connects；It can be directly connected, be also possible to be connected by intermediary, can be and be connected inside two elements.For ability
For the those of ordinary skill of domain, the concrete meaning of above-mentioned term in the present invention can be understood as the case may be.
Several embodiments of the invention above described embodiment only expresses, the description thereof is more specific and detailed, but simultaneously
Limitations on the scope of the patent of the present invention therefore cannot be interpreted as.It should be pointed out that for those of ordinary skill in the art
For, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to guarantor of the invention
Protect range.Therefore, the scope of protection of the patent of the invention shall be subject to the appended claims.
Claims (9)
1. the visible detection method and device of wire surface defect, it is characterised in that: include the following steps,
Step A: Image Acquisition is carried out to workpiece (4) surface；
Step B: setting spot defects algorithm fixed test frame, in workpiece (4) surface image of acquisition be located at fixed test
Image section in frame carries out the operation of spot defects algorithm, and specific step is as follows for the spot defects algorithm,
Step B1: identification is located at the abnormal area in part workpiece (4) surface image in fixed test frame；
Step B2: Threshold segmentation is carried out to abnormal area and non-abnormal area, obtains the apparent abnormal area that develops the color；
Step B3: the area figures for the apparent abnormal area that develops the color are calculated；
Step B4: the area figures are judged whether within the scope of the figure tolerances of defect area, if there are scarce for the workpiece (4) if
It falls into, defect is not present if the workpiece (4) not if；
Step C: judging result is exported.
2. the visible detection method and device of wire surface defect according to claim 1, it is characterised in that: the step
In B2, the threshold value for carrying out Threshold segmentation is 100 to 155.
3. the visible detection method and device of wire surface defect according to claim 1, it is characterised in that: the step
In B2, the threshold value for carrying out Threshold segmentation is 126.
4. the visible detection method and device of wire surface defect according to claim 1, it is characterised in that: the step
In B3, the formula for calculating the area figures for the apparent abnormal area that develops the color is as follows: pixel precision * pixel precision * pixel
Number=area figures.
5. the visible detection method and device of wire surface defect according to claim 1, it is characterised in that: the step
In B4, the figure tolerances range of defect area is 0.01 to 0.5 square millimeter.
6. the visible detection method and device of wire surface defect according to claim 1, it is characterised in that: the step
In A, arranged in pairs or groups 12 to 25 millimeters when carrying out Image Acquisition to workpiece (4) surface using the industrial camera (1) of 300 to 6,000,000 pixels
Tight shot (2), which is located at the surface of workpiece (4), vertical between tight shot (2) and workpiece (4)
Spacing distance is 180 to 230 millimeters.
7. the visible detection method and device of wire surface defect according to claim 1, it is characterised in that: the step
In A, the tight shot of 16 millimeters of industrial camera (1) collocation of 5,000,000 pixels is used when to workpiece (4) surface progress Image Acquisition
(2), which is located at the surface of workpiece (4), and the perpendicular separation distance between tight shot (2) and workpiece (4) is
200 millimeters.
8. the visible detection method and device of wire surface defect according to claim 1, it is characterised in that: the step
In A, it is irradiated in two upper sides of workpiece (4) using two white strip sources (3), this two white strip sources
(3) the angle between light-emitting surface and horizontal plane is 36 to 50 degree, the horizontal interval between two white strip sources (3) away from
From being 160 to 230 millimeters, the perpendicular separation distance between this two white strip sources (3) and workpiece (4) is 78 to 120 millis
Rice.
9. the visible detection method and device of wire surface defect according to claim 1, it is characterised in that: the step
In A, it is irradiated in two upper sides of workpiece (4) using two white strip sources (3), this two white strip sources
(3) the angle between light-emitting surface and horizontal plane is 44 degree, and the horizontal interval distance between two white strip sources (3) is
100 millimeters, the perpendicular separation distance between this two white strip sources (3) and workpiece (4) is 95 millimeters.
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| CN201910320808.0A CN110082356A (en) | 2019-04-20 | 2019-04-20 | The visible detection method and device of wire surface defect |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN112489021A (en) * | 2020-12-01 | 2021-03-12 | 江苏科技大学 | Visual inspection method for surface defects of large-capacity plastic barrel |
| CN114463327A (en) * | 2022-04-08 | 2022-05-10 | 深圳市睿阳精视科技有限公司 | Multi-shooting imaging detection equipment and method for watermark defect of electronic product lining package |
| CN117589780A (en) * | 2024-01-19 | 2024-02-23 | 深圳市汇众智慧科技有限公司 | Wire visual detection system and detection method |
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Application publication date: 20190802 |