CN110045201B - Intelligent door lock test circuit and intelligent door lock test device - Google Patents

Intelligent door lock test circuit and intelligent door lock test device Download PDF

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Publication number
CN110045201B
CN110045201B CN201910287958.6A CN201910287958A CN110045201B CN 110045201 B CN110045201 B CN 110045201B CN 201910287958 A CN201910287958 A CN 201910287958A CN 110045201 B CN110045201 B CN 110045201B
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power supply
door lock
intelligent door
test
module
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CN110045201A (en
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王承富
吴继青
时夏
王伟峰
赖志锋
马倩
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Gree Electric Appliances Inc of Zhuhai
Zhuhai Gree Intelligent Equipment Co Ltd
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Gree Electric Appliances Inc of Zhuhai
Zhuhai Gree Intelligent Equipment Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Lock And Its Accessories (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention provides an intelligent door lock test circuit and an intelligent door lock test device, wherein the intelligent door lock test circuit comprises a power supply conversion module, a test electric test module, an emergency power supply test module and a normal power supply test module; the power supply conversion module is used for converting an input voltage into two paths of output voltages, the first path of output voltage is used for providing a control voltage for the test power supply, emergency power supply and normal power supply test module, and the second path of output voltage is used for providing test power supply, emergency power supply or normal power supply for the intelligent door lock to be tested; the testing electric testing module, the emergency power supply testing module and the normal power supply testing module are respectively used for controlling the on-off of a testing power supply loop, an emergency power supply loop and a normal power supply loop of the intelligent door lock to be tested. The intelligent door lock testing device comprises the intelligent door lock testing circuit. The intelligent door lock test circuit and the intelligent door lock test device can simply and efficiently realize the performance test of the intelligent door lock.

Description

Intelligent door lock test circuit and intelligent door lock test device
Technical Field
The invention relates to the technical field of intelligent testing, in particular to an intelligent door lock testing circuit and an intelligent door lock testing device.
Background
With the development of the intelligent home technology, the intelligent door lock is more and more widely applied. However, in the prior art, a device for testing the intelligent door lock is not provided, and the performance cannot be guaranteed. Among the prior art, whether its assembly has a problem, whether the lock after the assembly can normally be used can not be confirmed at the very first time to intelligent lock after assembly of assembly line is accomplished, and this not only influences the quality of product, has very big hidden danger to the benefit of whole company, the exactness of assembly process, the rationality of product structure function moreover.
Therefore, in order to eliminate the hidden danger that the intelligent door lock cannot be used normally after being assembled, a device capable of testing the performance of the assembled door lock is urgently needed to be provided.
Disclosure of Invention
In view of the above problems, the invention provides an intelligent door lock test circuit and an intelligent door lock test device, which solve the problem that the performance cannot be ensured because no special test device is used for testing the quality of the existing intelligent door lock after the existing intelligent door lock is assembled.
The embodiment of the invention provides an intelligent door lock test circuit, which comprises a power supply conversion module, a test electric test module, an emergency power supply test module and a normal power supply test module;
the power supply conversion module is used for converting an input voltage into two paths of output voltages, wherein a first path of output voltage of the first voltage output end is used for providing control voltage for the test electric test module, the emergency power supply test module and the normal power supply test module, and a second path of output voltage of the second voltage output end is used for providing test power supply, emergency power supply or normal power supply for the intelligent door lock to be tested;
the test electric test module is used for controlling the on-off of a test power supply loop of the intelligent door lock to be tested; the emergency power supply testing module is used for controlling the on-off of an emergency power supply loop of the intelligent door lock to be tested; and the normal power supply testing module is used for controlling the on-off of a normal power supply loop of the intelligent door lock to be tested.
Optionally, the test electrical test module comprises a first switch unit and a first relay control unit;
the input end of the first relay control unit is connected with the first voltage output end through the first switch unit, the output end of the first relay control unit is connected between the second voltage output end of the power supply conversion module and the test power supply input end of the intelligent door lock to be tested, and when the first switch unit is closed, the output end of the first relay control unit is closed, so that the test power supply loop of the intelligent door lock to be tested is switched on.
Optionally, the test electrical test module further comprises a first indicator light connected in parallel across the first relay control unit.
Optionally, the emergency power supply test module includes a second switch unit and a second relay control unit;
the input end of the second relay control unit is connected with the first voltage output end through the second switch unit, the output end of the second relay control unit is connected between the second voltage output end of the power supply conversion module and the emergency power supply input end of the intelligent door lock to be tested, and when the second switch unit is closed, the output end of the second relay control unit is closed, so that the emergency power supply loop of the intelligent door lock to be tested is switched on.
Optionally, the emergency power supply test module further includes a second indicator light connected in parallel to two ends of the second relay control unit.
Optionally, the normal power supply test module includes a third switching unit and a third relay control unit;
the input end of the third relay control unit is connected with the first voltage output end through the third switch unit, the output end of the third relay control unit is connected between the second voltage output end of the power supply conversion module and the normal power supply input end of the intelligent door lock to be tested, and when the third switch unit is closed, the output end of the third relay control unit is closed, so that the normal power supply loop of the intelligent door lock to be tested is conducted.
Optionally, the normal power supply testing module further includes a third indicator light connected in parallel to two ends of the third relay control unit.
Optionally, the intelligent door lock test circuit further includes a circuit protection module and a power supply for providing an input voltage, and the circuit protection module is disposed between the power supply and the power conversion module.
In another aspect of the embodiment of the present invention, an intelligent door lock testing apparatus is further provided, which includes the above-mentioned intelligent door lock testing circuit and a testing structure for installing an intelligent door lock to be tested.
Optionally, the test structure includes an installation panel and a base, the installation panel is fixed on the base, the intelligent door lock to be tested is embedded into the installation panel through a fixing part, and control buttons of each indicator lamp and each switch unit included in the intelligent door lock test circuit are arranged on the base.
Optionally, a second voltage output end of the power conversion module is connected with each power supply input end of the intelligent door lock to be tested through a Typc-C connecting wire.
According to the intelligent door lock test circuit and the intelligent door lock test device provided by the embodiment of the invention, the on-off control of test power supply, emergency power supply and normal power supply of the intelligent door lock to be tested is realized by arranging the test power test module, the emergency power supply test module and the normal power supply test module, so that a user can judge the performance of the intelligent door lock by observing the working state of the intelligent door lock to be tested under different power supply conditions, the performance test of the intelligent door lock is simply and efficiently realized, the problem that the performance cannot be ensured because no special test device is used for performing quality test on the intelligent door lock after the existing intelligent door lock is assembled is solved, and the production quality of the intelligent door lock is effectively improved.
The foregoing description is only an overview of the technical solutions of the present invention, and the embodiments of the present invention are described below in order to make the technical means of the present invention more clearly understood and to make the above and other objects, features, and advantages of the present invention more clearly understandable.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
fig. 1 is a schematic structural diagram of a test structure in an intelligent door lock test device according to an embodiment of the present invention;
fig. 2 is a circuit block diagram of an intelligent door lock test circuit according to an embodiment of the present invention;
fig. 3 is a circuit block diagram of an intelligent door lock testing circuit according to another embodiment of the present invention.
Detailed Description
The present invention will be further described with reference to the following embodiments. Wherein the showings are for the purpose of illustration only and are shown by way of illustration only and not in actual form, and are not to be construed as limiting the present patent; it will be understood by those skilled in the art that certain well-known structures in the drawings and descriptions thereof may be omitted.
In the description of the present invention, it should be understood that if there is an orientation or positional relationship indicated by the terms "upper", "lower", "left", "right", "inner", "outer", etc. based on the orientation or positional relationship shown in the drawings, it is only for convenience of description and simplification of description, but it is not intended to indicate or imply that the device or element referred to must have a specific orientation, be constructed in a specific orientation, and be operated, and therefore, the terms describing the positional relationship in the drawings are only for illustrative purposes and are not to be construed as limiting the present patent.
In addition, unless otherwise specified or limited, it should be noted that, if there are terms such as "mounted," "connected," and the like, they should be interpreted broadly, for example, they may be mechanically connected, electrically connected, or pneumatically connected, or they may be connected internally, directly, or indirectly through an intermediate medium, and those skilled in the art can understand the specific meaning of the terms according to specific situations.
In order to solve the problem that the existing intelligent door lock cannot be guaranteed in performance because no special testing device is used for testing the quality of the intelligent door lock after the intelligent door lock is assembled, the embodiment of the invention provides an intelligent door lock testing device which comprises an intelligent door lock testing circuit and a testing structure used for installing the intelligent door lock to be tested.
Fig. 1 is a schematic structural diagram of a test structure in an intelligent door lock test device according to an embodiment of the present invention. As shown in fig. 1, the test structure includes a mounting panel 10 and a base 20, the mounting panel 10 is fixed on the base 20, the intelligent door lock to be tested is embedded into the mounting panel 10 through a fixing member, and control buttons of each indicator light and each switch unit included in the intelligent door lock test circuit are arranged on the base 20.
In one embodiment, the bottom of the base 20 is further provided with a support column. The intelligent door lock to be tested can be embedded into the installation panel 10 through fixing pieces such as screws. Specifically, the design theory of test structure is based on the size of installation panel 10 and lock body, needs to guarantee that intelligent lock can imbed installation panel 10, can test through intelligent lock test circuit behind with lock embedding installation panel, and this kind of structure has not only satisfied the functional test of lock, but also has satisfied lock mechanical test.
In this embodiment, the power supply output of intelligence lock test circuit can pass through Typc-C connecting wire with each power supply input of the intelligent lock that awaits measuring is connected, need not additionally to increase the power, solves lock power supply demand from the technique.
In this embodiment, each pilot lamp and each switch unit's that intelligent lock test circuit included control button set up in base 20, when a certain lock function test is normal, corresponding pilot lamp can light to this indicates that the test is qualified. The visual button and the full-automatic prompt indicator light are adopted, so that a tester can simply press the button for several times during testing, the operation is easy, and the production cost can be reduced to a great extent. Moreover, the visual button and the full-automatic prompt indicator lamp are arranged, the production line is completely combined, the production rate is improved, and the quality of the product is better controlled.
The testing structure of the intelligent door lock testing device provided by the embodiment of the invention is integrally and fixedly installed with the door lock, the testing structure of the door lock testing device is completely consistent with the actual door lock installation, the installation structure design of the actual door is completed, the operation is simple, the operation efficiency is improved, and the mechanical testing of the door lock is also met from the actual point of view. In addition, the test structure only needs to be capable of being embedded into a door lock, and is simple in structural design, small in size, moderate in weight and low in cost.
Fig. 2 is a circuit block diagram of an intelligent door lock test circuit according to an embodiment of the present invention. As shown in fig. 2, the intelligent door lock testing circuit includes a power conversion module 30, a testing electrical testing module 40, an emergency power supply testing module 50, and a normal power supply testing module 60;
the power conversion module 30 is configured to convert an input voltage of a power supply into two paths of output voltages, which are a first path of output voltage and a second path of output voltage respectively, the first path of output voltage output by a first voltage output end of the power conversion module 30 is used to provide a control voltage for the test power test module 40, the emergency power supply test module 50, and the normal power supply test module 60, and the second path of output voltage of a second voltage output end of the power conversion module 30 is used to provide test power supply, emergency power supply, or normal power supply for the intelligent door lock to be tested;
the test electric test module 40 is used for controlling the on-off of a test power supply loop of the intelligent door lock to be tested; the emergency power supply testing module 50 is used for controlling the on-off of an emergency power supply loop of the intelligent door lock to be tested; and the normal power supply testing module 60 is used for controlling the on-off of a normal power supply loop of the intelligent door lock to be tested.
In one embodiment, the input voltage of the power conversion module 30 is 220V, and 12V and 5V output voltages can be output after conversion. The 12V voltage is used as a first output voltage for driving and controlling the working states of the test electrical test module 40, the emergency power supply test module 50 and the normal power supply test module 60. The 5V voltage is used as a second output voltage for implementing test power supply, emergency power supply or normal power supply to the intelligent door lock to be tested through the control of the test power test module 40, the emergency power supply test module 50 and the normal power supply test module 60.
In this embodiment, as shown in fig. 2, the intelligent door lock testing circuit further includes a circuit protection module 70 and a power supply for providing an input voltage, where the circuit protection module 70 is disposed between the power supply and the power conversion module 30.
Specifically, a main power switch SW2, an emergency STOP switch STOP and a 220V power indicator LED are further disposed between the circuit protection module 70 and the power conversion module 30.
In the present embodiment, as shown in fig. 3, the test electrical test module 40 includes a first switch unit SW2 and a first relay control unit KM 1;
the input end of the first relay control unit KM1 is connected to the first voltage output end, that is, the 12V voltage output end, through the first switch unit SW2, the output end of the first relay control unit KM1 is connected between the second voltage output end, that is, the 5V voltage output end, of the power conversion module 30 and the test power supply input end of the intelligent door lock to be tested, when the first switch unit SW2 is closed, the output end of the first relay control unit KM1 is closed, so that the test power supply loop of the intelligent door lock to be tested is turned on.
Further, the test electrical test module 40 further includes a first indicator light LED1 connected in parallel across the first relay control unit KM 1.
In this embodiment, as shown in fig. 3, the emergency power supply test module 50 includes a second switch unit QS-1 and a second relay control unit KM 2;
the input end of the second relay control unit KM2 is connected to the first voltage output end, that is, the 12V voltage output end, through the second switch unit QS-1, the output end of the second relay control unit KM2 is connected between the second voltage output end, that is, the 5V voltage output end, of the power conversion module 30 and the emergency power supply input end of the intelligent door lock to be tested, and when the second switch unit QS-1 is closed, the output end of the second relay control unit KM2 is closed, so that the emergency power supply loop of the intelligent door lock to be tested is turned on.
Further, the emergency power supply test module 50 further includes a second indicator light LED2 connected in parallel to both ends of the second relay control unit KM 2.
In the present embodiment, as shown in fig. 3, the normal power supply test module 60 includes a third switching unit QS-2 and a third relay control unit KM 3;
the input end of the third relay control unit KM3 is connected to the first voltage output end, that is, the 12V voltage output end, through the third switching unit QS-2, the output end of the third relay control unit KM3 is connected between the second voltage output end, that is, the 5V voltage output end, of the power conversion module 30 and the normal power supply input end of the intelligent door lock to be tested, and when the third switching unit QS-2 is closed, the output end of the third relay control unit KM3 is closed, so that the normal power supply loop of the intelligent door lock to be tested is turned on.
Further, the normal power supply test module 60 further includes a third indicator light LED3 connected in parallel across the third relay control unit KM 3.
Wherein the second switch unit QS-1 and the third switch unit QS-2 may be implemented using "power selection" knob switches.
The working principle of the intelligent door lock test circuit provided by the embodiment of the invention is explained as follows:
1. powering on a 220V power supply;
2. the circuit protection module realizes short circuit, overload and undervoltage protection;
3. the power supply main switch SW2 is turned on, the first switch unit SW2 of the emergency power supply testing module 50 is turned on, the working state of the external lock is observed, the touch panel of the external lock is lightened, three colors are circulated, namely white, red and green, and the playing content is a voice function of indicating that the vein door lock is successfully reset and inputting a 6-10 administrator password, and the test is qualified;
4. an emergency STOP switch STOP for enabling the STOP switch to be used when an output error occurs in the circuit or the power supply fails;
5. the power supply indicator lamp function is used for indicating whether the power supply is normal or not;
6. the power supply conversion module 30 is used for converting a 220V power supply into a 5V power supply and a 12V power supply;
7. the 5V power supply is applied to the power supply of the lock mainboard;
8. after the 'test electricity' switch is realized, the second switch unit QS-1 of the emergency power supply test module 50 is turned on to realize the 'emergency power supply' switch, and at the moment, the working state of the external lock is observed, and the white light is turned on by the touch panel of the external lock.
After the test is finished, the second switch unit QS-1 of the emergency power supply test module 50 is turned off, that is, the power supply selection knob is turned to the middle position, and the detection tool is removed to be connected with the lead of the external lock.
Furthermore, the loudspeaker detection is realized, when the power supply detection is carried out and the Bluetooth detection is connected, the loudspeaker can play voice prompts, whether the volume of the loudspeaker playing meets the requirement or not is noticed during playing, abnormal phenomena such as sound breaking and noise exist in the loudspeaker, and the loudspeaker is tested to be qualified.
When the intelligent door lock to be tested is normally powered on, finger vein module detection can be realized. Specifically, after the finger tips are placed on the intelligent door lock to be tested according to a standard posture, the light can be flashed above the fingers, meanwhile, the door lock can make a sound of 'ding', and a door lock motor can transmit a rotating sound. The door handle is rotated to release the locking state of the door handle, and the test is qualified.
When normal power supply is carried out to the intelligent lock that awaits measuring, can realize that intelligent lock touch pad detects. Specifically, the intelligent door lock touch pad has 12 key positions, the touch pad circulates red, white and green lights all the time when the touch pad is subjected to the previous test, when a user presses a key by using a finger, the touched key position can be changed into white light, after the user presses the 12 key positions, the motor in the tool rotates at the moment, the rotating sound of the motor can be heard, and the test is qualified.
The intelligent door lock testing device provided by the embodiment of the invention completely combines the actual door lock installation angle, can better meet the requirements of a production line, and the Typc-C connecting line is arranged in the external lock testing tool; furthermore, intelligent lock testing arrangement has combined the demand design of production line and product quality completely, and whether this kind of structure not only can test the lock communication aspect and have a problem, but also fine solution the test in the aspect of the lock machinery, fine stop the omission nature of test problem, change the problem point of finding out the assembly anomaly from the angle of quality moreover.
The intelligent door lock testing device provided by the embodiment of the invention adopts button operation and has full-automatic abnormal indication, the button is simple and easy to operate, the operation of a first-line tester on a production line has no potential safety hazard, the operation steps are simple, and the company operation cost is reduced to a great extent; on the other hand lock test fixture has test indicator warning function, and the tester only needs to test according to process flow normally, and if the lock has abnormal problem and will have the suggestion of pilot lamp, in time discern unusual intelligent lock, and then can effectively improve production quality, reduced manufacturing cost.
According to the intelligent door lock test circuit and the intelligent door lock test device provided by the embodiment of the invention, the on-off control of test power supply, emergency power supply and normal power supply of the intelligent door lock to be tested is realized by arranging the test power test module, the emergency power supply test module and the normal power supply test module, so that a user can judge the performance of the intelligent door lock by observing the working state of the intelligent door lock to be tested under different power supply conditions, the performance test of the intelligent door lock is simply and efficiently realized, the problem that the performance cannot be ensured because no special test device is used for performing quality test on the intelligent door lock after the existing intelligent door lock is assembled is solved, and the production quality of the intelligent door lock is effectively improved.
The above embodiments of the present invention are merely for illustration and do not represent the merits of the embodiments.
In the above embodiments of the present invention, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
Those skilled in the art will appreciate that while some embodiments herein include some features included in other embodiments, rather than others, combinations of features of different embodiments are meant to be within the scope of the invention and form different embodiments. For example, in the following claims, any of the claimed embodiments may be used in any combination.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.

Claims (7)

1. An intelligent door lock test circuit is characterized by comprising a power supply conversion module, a test electric test module, an emergency power supply test module and a normal power supply test module;
the power supply conversion module is used for converting an input voltage into two paths of output voltages, wherein a first path of output voltage of the first voltage output end is used for providing control voltage for the test electric test module, the emergency power supply test module and the normal power supply test module, and a second path of output voltage of the second voltage output end is used for providing test power supply, emergency power supply or normal power supply for the intelligent door lock to be tested;
the test electric test module is used for controlling the on-off of a test power supply loop of the intelligent door lock to be tested; the emergency power supply testing module is used for controlling the on-off of an emergency power supply loop of the intelligent door lock to be tested; the normal power supply testing module is used for controlling the on-off of a normal power supply loop of the intelligent door lock to be tested;
the test electrical test module comprises a first switch unit and a first relay control unit;
the input end of the first relay control unit is connected with the first voltage output end through the first switch unit, the output end of the first relay control unit is connected between the second voltage output end of the power supply conversion module and the test power supply input end of the intelligent door lock to be tested, and when the first switch unit is closed, the output end of the first relay control unit is closed, so that a test power supply loop of the intelligent door lock to be tested is conducted;
the test electric test module also comprises a first indicator light connected in parallel at two ends of the first relay control unit;
the emergency power supply test module comprises a second switch unit and a second relay control unit;
the input end of the second relay control unit is connected with the first voltage output end through the second switch unit, the output end of the second relay control unit is connected between the second voltage output end of the power supply conversion module and the emergency power supply input end of the intelligent door lock to be tested, and when the second switch unit is closed, the output end of the second relay control unit is closed, so that the emergency power supply loop of the intelligent door lock to be tested is conducted;
the normal power supply test module comprises a third switch unit and a third relay control unit;
the input end of the third relay control unit is connected with the first voltage output end through the third switch unit, the output end of the third relay control unit is connected between the second voltage output end of the power supply conversion module and the normal power supply input end of the intelligent door lock to be tested, when the third switch unit is closed, the output end of the third relay control unit is closed, so that the normal power supply loop of the intelligent door lock to be tested is conducted, and the second switch unit and the third switch unit are realized by adopting a power supply selection knob switch.
2. The intelligent door lock test circuit of claim 1, wherein the emergency power supply test module further comprises a second indicator light connected in parallel across the second relay control unit.
3. The intelligent door lock test circuit of claim 1, wherein the normal power supply test module further comprises a third indicator light connected in parallel across the third relay control unit.
4. The intelligent door lock test circuit according to any one of claims 1 to 3, further comprising a circuit protection module and a power supply for supplying an input voltage, wherein the circuit protection module is disposed between the power supply and the power conversion module.
5. An intelligent door lock testing device, characterized by comprising the intelligent door lock testing circuit according to any one of claims 1-4 and a testing structure for installing an intelligent door lock to be tested.
6. The intelligent door lock testing device according to claim 5, wherein the testing structure comprises a mounting panel and a base, the mounting panel is fixed on the base, the intelligent door lock to be tested is embedded into the mounting panel through a fixing member, and the control buttons of the indicator lamps and the switch units included in the intelligent door lock testing circuit are arranged on the base.
7. The intelligent door lock testing device according to claim 5, wherein the second voltage output end of the power conversion module is connected to each power supply input end of the intelligent door lock to be tested through a Typc-C connecting line.
CN201910287958.6A 2019-04-11 2019-04-11 Intelligent door lock test circuit and intelligent door lock test device Active CN110045201B (en)

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