CN110031422A - Head blight screening wheat is carried out using the infrared light of two kinds of specific wavelengths simultaneously - Google Patents

Head blight screening wheat is carried out using the infrared light of two kinds of specific wavelengths simultaneously Download PDF

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Publication number
CN110031422A
CN110031422A CN201910405006.XA CN201910405006A CN110031422A CN 110031422 A CN110031422 A CN 110031422A CN 201910405006 A CN201910405006 A CN 201910405006A CN 110031422 A CN110031422 A CN 110031422A
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China
Prior art keywords
wheat
head blight
infrared light
kinds
specific wavelengths
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CN201910405006.XA
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Chinese (zh)
Inventor
刘伍丰
郑维
何前磊
刘相满
陈建伟
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Henan University of Technology
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Henan University of Technology
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Priority to CN201910405006.XA priority Critical patent/CN110031422A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

The present invention relates to a kind of infrared light stacked systems based on two kinds of specific wavelengths to carry out head blight screening wheat method, previous Measurement for Biotechnique is replaced using photoelectric detecting technology, improve the detection efficiency of head blight wheat, the defect for overcoming Existing methods not detect quickly.Main aspect of the invention is to provide light source using the infrared light stacked system of two kinds of specific wavelengths, it is overlapped using the infrared light of 1152nm and 1248nm wavelength and the light source of screening system is provided, and then the spectral characteristic of prominent head blight wheat, what is be more easier detects head blight wheat;After putting up specific light source, irradiation head blight wheat obtains the spectral information of high-quality wheat Yu head blight wheat with high-quality wheat;The spectral information of high-quality wheat Yu head blight wheat, the difference between comparative spectrum, the threshold interval of setting head blight wheat and the identification of high-quality wheat are analyzed, and then achievees the purpose that identification screening head blight wheat.

Description

Head blight screening wheat is carried out using the infrared light of two kinds of specific wavelengths simultaneously
Technical field
The present invention relates to spectroscopic data processing technology fields, are specifically exactly a kind of light based on two kinds of specific wavelengths Head blight wheat wheat, which is carried out, after spectroscopic data processing after wave is superimposed simultaneously knows method for distinguishing.
Background technique
Head blight is by Asia sickle-like bacteria (Fusarim asiaticum) and Fusarium graminearum (Fusarium Graminearum the worldwide corps diseases of wide-scale distribution, while main grain of the wheat as crops caused by) The generation of food crop, head blight not only causes great loss to the yield of wheat, while can also cause the storage phase of wheat Between it is putrid and deteriorated, therefore the screening of the detection and head blight wheat to wheat scab wheat has become related neck now One of the main contents of domain research.
For at present, the method for carrying out the detection of wheat scab wheat mainly has gas chromatography, high performance liquid chromatography The biochemical methods such as method, thin-layered chromatography, Enzyme-Linked Immunospot.But higher profession is required using appeal method and is known Based on knowing technical ability, while when carrying out the detection of head blight wheat, the time loss needed is very long, manpower and material resources demands It is very big, while being also required to a large amount of time and comparing and can obtain accurate detection effect, actual in use, being difficult It is widely promoted in actual application, while being also extremely difficult to preferable timeliness.
In this year, with the continuous development of spectral imaging technology, this technology can be effectively combined object to be detected Spectral information and image information carry out specific map detection for the infrared light light wave of specific wavelength, with collection of illustrative plates Advantage.It is analyzed by the certain features that the image to object to be detected has under the Infrared irradiation of specific wavelength, into And it can achieve the effect that detect certain objects.The quick nondestructive for being used for object for spectral method of detection this at present is examined Survey, identification and attributional analysis of fruit etc..
In existing technology, some carries out the detection of corn moulding ability using spectral imaging technology, and then improves beautiful Rice does not have the identification accuracy rate of change degree;The detection that rice sheath blight disease is carried out using spectral imaging technology also;Simultaneously also The detection of blueberry sugar content and hardness is carried out using spectral imaging technology.These have all reached preferable effect.
Therefore, the optical characteristics for how utilizing head blight wheat, carries out the screening of head blight wheat, and then it is small to reach raising The purpose of wheat quality is present wheat field technical problem urgently to be solved.
Summary of the invention
The quick, high efficiency that cannot achieve the purpose of the present invention is to solve the prior art, high-accuracy carry out red mould A kind of infrared light spectrum data based on two kinds of specific wavelengths of the defect of sick wheat grain identification, proposition carry out head blight wheat berry Know method for distinguishing.
In order to achieve the above purpose, technical scheme is as follows:
Be detected wheat berry using the Infrared irradiation of specific wavelength: the wavelength of infrared light is 1152nm and 1248nm respectively Light source is overlapped the mixing light source reached;
The reflection spectrum images of to be detected wheat of the acquisition by mixing light source irradiation, are collected simultaneously head blight wheat and high quality wheat The spectral reflectance image of grain;
The spectrogram of high-quality wheat and head blight wheat is analyzed, and then analyzes two kinds of wheats under same illumination light Data characteristics;
Feature of the different wheats under mixing light source irradiation is obtained, the threshold region of wheat identification is established;
Carry out wheat detection, according to characteristic value of the wheat obtained under specific blend illumination, carry out head blight wheat with The high-quality identification and judgement encouraged.
Major part of the invention is to carry out the mixing of light using the infrared light of two kinds of specific wavelengths, experimental 97% can be reached when as a result, carrying out the detection of head blight wheat using the light source that the infrared light of 1152nm and 1248nm wavelength mixes Resolution ratio, therefore this method can effectively and rapidly carry out the identification of the detection of head blight wheat, improve head blight wheat The reliability of detection.
Detailed description of the invention
Fig. 1 is method sequential flowchart of the invention
Fig. 2 is resolution ratio schematic diagram of the head blight wheat under the various wavelength cases of infrared light;
Fig. 3 is resolution ratio schematic diagram of the head blight wheat in two kinds of infrared optical superposition.
Specific embodiment
In order to enable the invention to reach maximum effect, the present invention is illustrated with flow chart and theoretical attached drawing, says It is bright as follows:
Shown in the flow chart implemented such as the invention of Fig. 1, the present invention is a kind of infrared light stacked system based on two kinds of specific wavelengths The step of carrying out head blight screening wheat method, implementing is broadly divided into the following steps:
The first step carries out the infrared optical superposition of two kinds of specific wavelengths, carries out light using the infrared light of 1152nm and 1248nm respectively The superposition in source obtains needing specific light source to be used in the present invention.
Because the infrared light of different wave length carries out when head blight wheat detects with different efficiency, as shown in Fig. 2, providing The infrared light of different wave length carries out the efficiency when detection of head blight wheat.
Through Fig. 2, it can be seen that in the wave-length coverage of infrared light, the detection efficiency of none wavelength can reach 80%, therefore the efficiency for carrying out the head blight wheat detection of monochromatic source will not be very high, and then selects to pass through two kinds of specific wavelengths The mode of light source superposition carries out the detection of head blight wheat.
It can be derived that the light source progress head blight wheat obtained using two kinds of infrared optical superposition of specific wavelength by testing The efficiency of detection can be higher, as shown in Figure 3, it can be seen that the light source that the infrared optical superposition using two kinds of specific wavelengths obtains into When row head blight wheat detects, highest detection efficiency can reach 97% or more.
So the light source that the present invention uses is obtained using the infrared optical superposition of two kinds of specific wavelengths, what is be respectively adopted is red Outer optical wavelength is that the infrared light of 1152nm and 1248nm the two wavelength carries out building for light source.
Second step distinguishes irradiating sample using the light source put up, and sample is divided into high-quality wheat and head blight wheat, and obtains Take the spectral signature information of various wheats.
Third step obtains high-quality wheat with after the spectral signature information of head blight wheat, carries out at noise reduction to spectral information Reason, excludes the interference of noise, keeps the information of spectrum more accurate.
4th step, the difference of spectral information between more high-quality wheat and head blight wheat, first to the spectrum of two kinds of wheats Information carries out numeralization operation, finds out the value interval of two kinds of wheat spectra values, and then summarizes the area of wheat numerical value change Between range the threshold range of head blight screening set, the threshold range is for distinguishing head blight wheat according to data comparison result With high-quality wheat.
5th step starts to identify wheat wheat according to the spectral information threshold range of selected head blight wheat, Judge whether wheat is head blight wheat, identifies the head blight wheat in sample.
Above step is general steps of the invention, is mainly still the selection of light source, originality of the present invention Proposition simultaneously be overlapped using the infrared light of two kinds of specific wavelengths, and then improve head blight wheat detection identification efficiency, The infrared light used is the light source of 1152nm and 1248nm respectively, will test improved efficiency to 97% or more.And then it is able to solve red The not high industry problems of mildew wheat detection efficiency.Above-mentioned step is the principle of the present invention, is not departing from essence of the invention Under the premise of mind and range, the present invention also has various improvement, these changes and improvements both fall within claimed In the range of invention.The present invention claims protection scope defined by appended claims and its equivalent.

Claims (1)

1. carrying out head blight screening wheat method using the infrared light of two kinds of specific wavelengths simultaneously, which is characterized in that including following Step:
Step 1: determining the infrared light of two kinds of specific wavelengths;The infrared light progress that two kinds of specific wavelengths are employed herein is red Mildew screening wheat, the wavelength of the two infrared lights is 1152nm and 1248nm respectively, in the when energy using both infrared lights Enough reach better recognition effect;
Step 2: the usage mode of the infrared light of two kinds of specific wavelengths;The infrared light of two kinds of specific wavelengths is carried out in the present invention Superposition uses, i.e., light source is formed by stacking by the infrared light mixing of 1152nm and 1248nm wavelength, this combination of light sources form, energy The advantage of the infrared light of two kinds of wavelength is enough played, the discrimination of head blight wheat is improved;
Step 3: given threshold range carries out the identification and screening of head blight wheat;The present invention is shone using mixing infrared light light source After penetrating wheat to be screened, the spectral information of wheat is obtained, is determined by comparing the spectrum of high-quality wheat and head blight wheat red mould Disease encourages the threshold range of identification;By comparing the spectroscopic data and threshold data of wheat to be screened, and then determine wheat to be screened Whether grain is head blight wheat.
CN201910405006.XA 2019-05-16 2019-05-16 Head blight screening wheat is carried out using the infrared light of two kinds of specific wavelengths simultaneously Pending CN110031422A (en)

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CN110736750A (en) * 2019-10-28 2020-01-31 安徽大学 wheat scab detection method based on multi-angle field high-definition imaging

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CN110736750A (en) * 2019-10-28 2020-01-31 安徽大学 wheat scab detection method based on multi-angle field high-definition imaging
CN110736750B (en) * 2019-10-28 2022-03-04 安徽大学 Wheat scab detection method based on multi-angle field high-definition imaging

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Application publication date: 20190719