CN110018931A - TPM test device and method - Google Patents

TPM test device and method Download PDF

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Publication number
CN110018931A
CN110018931A CN201810019179.3A CN201810019179A CN110018931A CN 110018931 A CN110018931 A CN 110018931A CN 201810019179 A CN201810019179 A CN 201810019179A CN 110018931 A CN110018931 A CN 110018931A
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China
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mentioned
test
tpm
microcontroller
memory cell
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CN201810019179.3A
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Chinese (zh)
Inventor
张凯铭
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Mitac Computer Shunde Ltd
Shencloud Technology Co Ltd
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Mitac Computer Shunde Ltd
Shencloud Technology Co Ltd
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Priority to CN201810019179.3A priority Critical patent/CN110018931A/en
Publication of CN110018931A publication Critical patent/CN110018931A/en
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273Test methods

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)

Abstract

The present invention provides a kind of TPM test device and method, is suitable for one TPM of test, including microcontroller and memory cell.Memory cell stores test instruction and the normal condition echo message corresponding to test instruction.Microcontroller is connected to TPM through SPI interface communications, and sends test instruction to TPM.When TPM receives the test instruction of microcontroller, passback test echo message.The test echo message that microcontroller is returned TPM is compared with the normal condition echo message that memory cell stores, to judge whether TPM is abnormal.

Description

TPM test device and method
Technical field
The invention relates to a kind of test device and methods, especially for detecting the survey of trusted platform module (TPM) Try device and method.
Background technique
In general, trusted platform module (TPM;Trusted Platform Module) be set to computer installation or In server unit, to provide the basic security correlation function of computer installation or server unit.Trusted platform module (hereinafter referred to as TPM) is a kind of independent key that generates with the device or element that carry out the encrypting and decrypting of data, can effectively be avoided The data of computer installation or server unit is accessed by illegal user.
Currently, TPM needs to be mounted on the function survey that can carry out TPM itself on computer installation or server unit Examination, and in order to test TPM still must by computer installation or server unit booting and by operating system (OS) starting after, Cai Nengtou The firmware for crossing operating system is linked up and is tested with TPM.If need to continue to test other TPM, it is still necessary to by computer installation Or server unit shutdown, it reinstalls and is switched on the switching on and shutting down tested, repeatedly after TPM again and waits operating system Starting quite expends the time.Therefore, existing test mode is quite unfavorable for the test of a large amount of TPM, and efficiency is also poor.
Summary of the invention
The technical problem to be solved by the present invention is to be to provide a kind of TPM test device and method for improving testing efficiency.
In order to solve the above technical problems, a kind of TPM test device, is suitable for one TPM of test, comprising: a microcontroller, thoroughly It crosses SPI interface communications and is connected to above-mentioned TPM, and send a selected test instruction to above-mentioned TPM;And a memory cell, tool There are above-mentioned selected test instruction and the normal condition echo message corresponding to above-mentioned selected test instruction, wherein when above-mentioned TPM receives when stating selected test instruction of above-mentioned microcontroller, one test echo message of passback, wherein above-mentioned microcontroller The above-mentioned normal condition echo message of above-mentioned test echo message and above-mentioned memory cell that above-mentioned TPM is returned is compared It is right, to judge whether above-mentioned TPM is abnormal.
Preferably, when the above-mentioned normal shape of the above-mentioned TPM above-mentioned test echo message returned and above-mentioned memory cell State echo message is identical, and above-mentioned microcontroller generates a test normal signal.In addition, working as the above-mentioned test that above-mentioned TPM is returned Echo message is not identical as the above-mentioned normal condition echo message of above-mentioned memory cell, and it is different that above-mentioned microcontroller generates a test Regular signal.
Preferably, TPM test device further includes a network communication unit, connects via network and a remote monitoring main-machine communication It connects, wherein above-mentioned microcontroller penetrates above-mentioned network communication unit for above-mentioned test normal signal or above-mentioned test abnormal signal It is sent to said distal ends monitoring host computer, and said distal ends monitoring host computer accordingly shows a proper testing result or an abnormality test As a result.
Preferably, above-mentioned memory cell has plural number test instruction, and above-mentioned microcontroller more reads the version of above-mentioned TPM This, and selected according to the version of above-mentioned TPM the one of above-mentioned test instruction as above-mentioned selected test instruction.
Then, in order to solve the above technical problems, a kind of TPM test method, is suitable for one TPM of test, comprising: micro- through one Controller sends a selected test instruction to above-mentioned TPM via SPI interface communications;Above-mentioned TPM receives above-mentioned microcontroller When above-mentioned selected test instructs, according to one test echo message of above-mentioned test instruction passback to above-mentioned microcontroller;And it is above-mentioned Microcontroller compares above-mentioned test echo message with a normal condition echo message of corresponding to above-mentioned selected test instruction It is right, to judge whether above-mentioned TPM is abnormal, wherein above-mentioned selected test instructs and corresponding to the upper of above-mentioned selected test instruction Normal condition echo message is stated to be stored in the accessible memory cell of above-mentioned microcontroller.
Preferably, TPM test method further includes: when the above-mentioned test echo message and above-mentioned storage that above-mentioned TPM is returned When the above-mentioned normal condition echo message of device unit is identical, above-mentioned microcontroller generates a test normal signal.In addition, when above-mentioned When the above-mentioned normal condition echo message of above-mentioned test echo message and above-mentioned memory cell that TPM is returned is not identical, on It states microcontroller and generates a test abnormal signal.
Preferably, TPM test method further includes: above-mentioned microcontroller is normal by above-mentioned test through a network communication unit Signal or above-mentioned test abnormal signal are sent to a remote monitoring host;And said distal ends monitoring host computer is accordingly shown one just Normal test result or an abnormality test result.
Preferably, above-mentioned memory cell has plural number test instruction, and above-mentioned TPM test method further includes: above-mentioned micro- Controller detects the version of above-mentioned TPM;And above-mentioned microcontroller is selected according to the version of above-mentioned TPM from above-mentioned memory cell The one of above-mentioned test instruction is as above-mentioned selected test instruction.
Compared to the prior art, TPM test device and method of the present invention, can by the setting of TPM test device of the present invention It is directed through the interface SPI to test TPM, without each TPM is set to corresponding service one by one respectively respectively On device, not only save the cost of test fixture, more greatly reduce over have to wait for server booting time with And the puzzlement of server firmware cooperation, the efficiency of test trusted platform module (TPM) is increased significantly.
[Detailed description of the invention]
Fig. 1 is the schematic diagram of TPM test device of the present invention.
Fig. 2 is the operation workflow figure of TPM test method of the present invention.
[specific embodiment]
Refering to Figure 1, TPM test device 100 of the present invention includes memory cell 102, microcontroller 104 and network Communication unit 106.The microcontroller 104 of TPM test device 100 penetrates spi bus (Serial Peripheral Interface Bus) it is communicated to connect with trusted platform module 200 (hereinafter referred to as TPM 200), to be tested.Microcontroller 104 are communicated through network communication unit 106 with remote monitoring host 300, for example, in microcontroller 104 to TPM After 200 tests, microcontroller 104 can pass through network communication unit 106 and transmit the signal for being relevant to test result to distally Monitoring host computer 300, and remote monitoring host 300 can correspondingly output test result be supplied to scene operator perform an analysis. In some embodiments, remote monitoring host 300 can be field data monitoring system (SFCS).
In some embodiments, memory cell 102 stores plural number test instruction, and each test instruction corresponds respectively to not Same TPM version (for example, TPM 1.0, TPM 1.2 and TPM 2.0 etc.), in addition, memory cell 102 also stores each survey The corresponding normal condition echo message of examination instruction.
In some embodiments, when microcontroller 104 tests TPM 200, microcontroller 104 can first judge The version of TPM 200, the test that then microcontroller 104 then chooses the version of corresponding TPM 200 from memory cell 102 refer to It enables, and the test is directly transmitted with the interface SPI and is instructed to TPM 200.
Finally, the normal condition echo message that microcontroller 104 compares the storage of memory cell 102 again is returned with TPM 200 The test echo message of biography, judges whether TPM 200 operates exception whereby.
Specifically, when microcontroller 104 judges the test echo message and memory cell 102 that TPM 200 is returned Corresponding normal condition echo message is identical, and microcontroller 104 then generates test normal signal, to indicate its test result It is normal.For example, the test normal signal is sent to remote monitoring host through network communication unit 106 by microcontroller 104 300, and remote monitoring host 300 then accordingly shows proper testing result (for example, single through display according to test normal signal Member is shown the normal information of TPM or is given a green light using LED and indicated).
On the other hand, when microcontroller 104 judges the test echo message and memory cell 102 that TPM 200 is returned Corresponding normal condition echo message is not identical, and microcontroller 104 can then generate test according to the abnormal project of test Abnormal signal, to indicate that its test result is abnormal.For example, microcontroller 104 penetrates network communication unit 106 for the test Abnormal signal is sent to remote monitoring host 300, and remote monitoring host 300 can then analyze the test abnormal signal and accordingly Show abnormality test result (for example, showing the information of specific project exception in TPM through display unit or utilizing LED azarin Lamp indicates).In further embodiments, also display unit or LED light can be set in TPM test device 100 to show test As a result.
It please refers to shown in Fig. 1 and Fig. 2, TPM test method of the present invention then can be saturating after TPM test device 100 powers on It crosses spi bus and TPM 200 is communicated to connect, in step S202, the microcontroller 104 of TPM test device 100 detects TPM 200 version.For example, reading instruction to TPM 200 through spi bus transmission version.And when TPM 200 receives version reading After instruction fetch, then return about itself version information to TPM test device 100 microcontroller 104.
In step S204, microcontroller 104 is chosen according to the version of the TPM 200 judged from memory cell 102 The normal condition echo message of the test instruction of the corresponding version and corresponding test instruction.It will be understood that memory list The normal condition echo message stored in advance in member 102 is that TPM should be returned when receiving test instruction in normal state Information.Then in step S206, selected test instruction is sent to TPM 200 through spi bus by microcontroller 104. And after TPM 200 receives test instruction, then it can be instructed according to test and generate test echo message to be back to TPM test The microcontroller 104 of device 100.
Then, in step S208, microcontroller 104 then compares the test echo message that TPM 200 is returned and storage Whether the normal condition echo message stored by device unit 106 is identical.If it is different, then continuing step S210, microcontroller 104 is saturating The transmission test abnormal signal of network communication unit 106 is crossed to remote monitoring host 300, and continues step S214.Conversely, then continuing Step S212, the transmission of microcontroller 104 transmission of network communication unit 106 test normal signal to remote monitoring host 300, and after Continuous step S216.
Finally, remote monitoring host 300 then corresponds to the test that the microcontroller 104 is transmitted to be believed extremely in step S214 Number display abnormality test as a result, with notify scene operator do corresponding disposition.On the other hand, in step S216, distal end Monitoring host computer 300 then corresponds to the test normal signal that the microcontroller 104 is transmitted and shows proper testing result.
In conclusion TPM test device of the present invention and method, it can be direct by the setting of TPM test device 100 of the present invention TPM 200 is tested through the interface SPI, without each TPM 200 is set to corresponding clothes one by one respectively respectively It is engaged on device, not only saves the cost of test fixture, more greatly reduce over the time for having to wait for server booting And the puzzlement of server firmware cooperation, the efficiency of test trusted platform module (TPM) is increased significantly.
The above description is merely a specific embodiment, but scope of protection of the present invention is not limited thereto, any Those familiar with the art in the technical scope disclosed by the present invention, can easily think of the change or the replacement, and should all contain Lid is within protection scope of the present invention.Therefore, protection scope of the present invention should be subject to the protection scope in claims.

Claims (10)

1. a kind of TPM test device is suitable for one TPM of test characterized by comprising
One microcontroller is connected to above-mentioned TPM through SPI interface communications, and sends a selected test instruction to above-mentioned TPM;
One memory cell, the normal condition with above-mentioned selected test instruction and corresponding to above-mentioned selected test instruction are returned Information is answered,
When above-mentioned TPM receives the above-mentioned selected test instruction of above-mentioned microcontroller, one test echo message of passback is above-mentioned micro- The above-mentioned normal condition echo message of above-mentioned test echo message and above-mentioned memory cell that controller is returned above-mentioned TPM It is compared, to judge whether above-mentioned TPM is abnormal.
2. TPM test device according to claim 1, which is characterized in that when the above-mentioned test that above-mentioned TPM is returned is responded Information is identical as the above-mentioned normal condition echo message of above-mentioned memory cell, and above-mentioned microcontroller generates the normal letter of a test Number.
3. TPM test device according to claim 2, which is characterized in that when the above-mentioned test that above-mentioned TPM is returned is responded Information is not identical as the above-mentioned normal condition echo message of above-mentioned memory cell, and above-mentioned microcontroller generates the abnormal letter of a test Number.
4. TPM test device according to claim 3, which is characterized in that a network communication unit, it is remote via network and one Monitoring host computer communication connection is held, above-mentioned microcontroller penetrates above-mentioned network communication unit for above-mentioned test normal signal or above-mentioned survey Examination abnormal signal is sent to said distal ends monitoring host computer, and said distal ends monitoring host computer accordingly show a proper testing result or One abnormality test result.
5. TPM test device according to claim 1, which is characterized in that there is above-mentioned memory cell plural number test to refer to It enables, and above-mentioned microcontroller more reads the version of above-mentioned TPM, and selects the one of above-mentioned test instruction according to the version of above-mentioned TPM It is instructed as above-mentioned selected test.
6. a kind of TPM test method is suitable for one TPM of test, which is characterized in that logical via the interface SPI through a microcontroller Believe to above-mentioned TPM and sends a selected test instruction;When above-mentioned TPM receives the above-mentioned selected test instruction of above-mentioned microcontroller When, according to one test echo message of above-mentioned test instruction passback to above-mentioned microcontroller;Above-mentioned microcontroller returns above-mentioned test Information is answered to be compared with a corresponding normal condition echo message to above-mentioned selected test instruction, whether to judge above-mentioned TPM Abnormal, above-mentioned selected test instruction and the above-mentioned normal condition echo message corresponding to above-mentioned selected test instruction are stored in It states in the accessible memory cell of microcontroller.
7. TPM test method according to claim 6, which is characterized in that when the above-mentioned test that above-mentioned TPM is returned is responded When information is identical as the above-mentioned normal condition echo message of above-mentioned memory cell, above-mentioned microcontroller generates the normal letter of a test Number.
8. TPM test method according to claim 7, which is characterized in that when the above-mentioned test that above-mentioned TPM is returned is responded When the above-mentioned normal condition echo message of information and above-mentioned memory cell is not identical, it is abnormal that above-mentioned microcontroller generates a test Signal.
9. TPM test method according to claim 8, which is characterized in that above-mentioned microcontroller penetrates a network communication list Above-mentioned test normal signal or above-mentioned test abnormal signal are sent to a remote monitoring host said distal ends monitoring host computer pair by member Show a proper testing result or an abnormality test result with answering.
10. TPM test method according to claim 6, which is characterized in that there is above-mentioned memory cell plural number test to refer to It enables, above-mentioned TPM test method further includes:
Above-mentioned microcontroller detects the version of above-mentioned TPM;
Above-mentioned microcontroller according to the version of above-mentioned TPM select that above-mentioned test instructs from above-mentioned memory cell one as above-mentioned Selected test instruction.
CN201810019179.3A 2018-01-09 2018-01-09 TPM test device and method Pending CN110018931A (en)

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CN201810019179.3A CN110018931A (en) 2018-01-09 2018-01-09 TPM test device and method

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Citations (7)

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Publication number Priority date Publication date Assignee Title
US20080046898A1 (en) * 2006-08-18 2008-02-21 Fujitsu Limited Method and System for Implementing an External Trusted Platform Module
CN101154176A (en) * 2006-09-25 2008-04-02 佛山市顺德区顺达电脑厂有限公司 Function testing system
CN101493870A (en) * 2008-12-17 2009-07-29 武汉大学 Credible platform module test device
US9003513B1 (en) * 2012-09-11 2015-04-07 Google Inc. Trusted platform module compliance station
CN204856468U (en) * 2015-08-27 2015-12-09 浪潮电子信息产业股份有限公司 Structure based on multiplexing DEBUG card of TPM interface
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US20080046898A1 (en) * 2006-08-18 2008-02-21 Fujitsu Limited Method and System for Implementing an External Trusted Platform Module
CN101154176A (en) * 2006-09-25 2008-04-02 佛山市顺德区顺达电脑厂有限公司 Function testing system
CN101493870A (en) * 2008-12-17 2009-07-29 武汉大学 Credible platform module test device
US9003513B1 (en) * 2012-09-11 2015-04-07 Google Inc. Trusted platform module compliance station
CN204856468U (en) * 2015-08-27 2015-12-09 浪潮电子信息产业股份有限公司 Structure based on multiplexing DEBUG card of TPM interface
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CN106992860A (en) * 2017-05-23 2017-07-28 郑州云海信息技术有限公司 A kind of detection method of server TPM modules

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