CN110007199A - The voltage tolerance index of solid insulating material determines method, apparatus and intelligent terminal - Google Patents
The voltage tolerance index of solid insulating material determines method, apparatus and intelligent terminal Download PDFInfo
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- CN110007199A CN110007199A CN201910118723.4A CN201910118723A CN110007199A CN 110007199 A CN110007199 A CN 110007199A CN 201910118723 A CN201910118723 A CN 201910118723A CN 110007199 A CN110007199 A CN 110007199A
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- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1263—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation
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Abstract
The present invention provides a kind of voltage tolerance indexes of solid insulating material to determine method, apparatus and intelligent terminal, is related to material property technical field, this method comprises: the damage line based on solid insulating material chooses multiple groups targeted test parameter；Calculate the corresponding voltage tolerance index of every group of targeted test parameter；Calculate separately the error amount between the corresponding voltage tolerance index of every group of targeted test parameter and preset reference voltage tolerance index；The smallest voltage tolerance index of error amount is determined as to the voltage tolerance index of solid insulating material.The present invention can effectively improve the accuracy of the voltage tolerance index of solid insulating material.
Description
Technical field
The present invention relates to material property technical fields, true more particularly, to a kind of voltage tolerance index of solid insulating material
Determine method, apparatus and intelligent terminal.
Background technique
The voltage tolerance index of solid insulating material be reflection insulation under the action of long period electric fields performance change it is important
Parameter, it is therefore desirable to which accurate voltage tolerance index is obtained by measurement.Constant stress method is generallyd use, measurement is different constant
Failure of insulation time t under electric field Eii, using anti-power model t=CE-nVoltage tolerance index using fitting n value as material.
However, this method has the shortcomings that time-consuming, low efficiency, and since test period span is larger, influence material failure because
Element is more, causes data dispersibility also very big.For example, countries in the world unite to the voltage tolerance index of crosslinked polyethylene insulation material
Meter result is differed from 9~20.
In practice frequently with the equivalent voltage tolerance index for obtaining material of stepstress method, this method assumes solid insulation material
Material punctures when accumulated damage amount phase under not same electric field, with certain starting boost voltage, voltage step size and each electricity
Duration off field applies gradually incremental electric field until breakdown is failed, further according to examination as test parameters, to test product
Parameter and out-of-service time are tested, the voltage tolerance index of material is sought using mathematical equivalent method.But this method is passing through test ginseng
Test parameters is voltage tolerance index of certain and different test parameters selection to acquisition when number determines voltage tolerance index
N value result is affected, and the accuracy of obtained n value is to be improved.
Summary of the invention
In view of this, the purpose of the present invention is to provide a kind of voltage tolerance index of solid insulating material determine method,
Device and intelligent terminal can effectively improve the accuracy of the voltage tolerance index of solid insulating material.
To achieve the goals above, technical solution used in the embodiment of the present invention is as follows:
In a first aspect, the voltage tolerance index the embodiment of the invention provides a kind of solid insulating material determines method, it should
Method includes: that the damage line based on solid insulating material chooses multiple groups targeted test parameter；Wherein, damage line characterizes solid
The accumulation electric injury amount of insulating materials and it is applied to the voltage of solid insulating material and the relationship of voltage application time；Targeted test
Parameter is the parameter for designing step stress test to obtain the voltage tolerance index of solid insulating material；Targeted test parameter
Including starting voltage, voltage increment and the voltage application time increment applied to solid insulating material；Calculate every group of targeted test
The corresponding voltage tolerance index of parameter；Calculate separately the corresponding voltage tolerance index of every group of targeted test parameter and preset benchmark
Error amount between voltage tolerance index；The voltage that the smallest voltage tolerance index of error amount is determined as solid insulating material is resistance to
By index.
With reference to first aspect, the embodiment of the invention provides the first possible embodiments of first aspect, wherein
Before damage line based on solid insulating material chooses the step of multiple groups targeted test parameter, the above method further include: obtain
The accumulated damage limiting value of solid insulating material, the preset reference starting voltage to solid insulating material application, preset reference electricity
Press the application time increment of increment and preset reference voltage；Wherein, accumulated damage limiting value DCIt indicates are as follows:
Wherein, k indicates that the variation of preset reference starting voltage reaches corresponding breakdown series when default breakdown voltage, and t is indicated
Preset reference starting voltage changes the time for reaching breakdown voltage, n0For benchmark voltage tolerance index, UbIndicate solid insulating material
Default breakdown voltage；According to accumulated damage limiting value, preset reference starting voltage, preset reference voltage increment and preset reference
The application time increment of voltage, draws the damage line of solid insulating material.
With reference to first aspect, the embodiment of the invention provides second of possible embodiments of first aspect, wherein meter
The step of calculating every group of targeted test parameter corresponding voltage tolerance index, comprising: it is corresponding tired to calculate every group of targeted test parameter
Product damage matrix；Wherein, accumulated damage matrix D indicates are as follows:
Wherein, w indicates that the group number of test parameters, m indicate that each group test parameters repeats the number of test, DwmIndicate w group
The accumulating injuring value that test parameters obtains after repeating test m times；According to accumulated damage matrix, objective function is determined；Wherein, mesh
Scalar functions include the standardization variance of accumulated damage matrix；According to objective function, the corresponding electricity of every group of targeted test parameter is calculated
Press tolerance index.
The possible embodiment of second with reference to first aspect, the embodiment of the invention provides the third of first aspect
Possible embodiment, wherein the step of determining objective function, comprising: according to following formula calculating target function:
Wherein, S (n) indicates the standardization variance of accumulated damage matrix D, and n indicates voltage tolerance index, DijIndicate i-th group
The accumulating injuring value that test parameters obtains after repeating test j times,The sum of each element is flat in expression accumulated damage matrix D
Mean value, Δ t indicate the variable quantity of time, U0Indicate starting voltage, Δ U indicates that starting voltage changes over time the voltage after Δ t
Variable quantity, i indicate that the number of time change Δ t, k indicate that starting voltage variation reaches corresponding breakdown when default breakdown voltage
Series, Δ tendIndicate holding time for breakdown voltage.
The third possible embodiment with reference to first aspect, the embodiment of the invention provides the 4th kind of first aspect
Possible embodiment, wherein according to objective function, calculate the step of the corresponding voltage tolerance index of every group of targeted test parameter
Suddenly, comprising: calculate voltage tolerance index n according to following formula:
Wherein, standardization variance S (n), which is corresponding with standard variance S, indicates change curve S-n with the change curve S-n, λ of n value
Negative second dervative.
The third possible embodiment with reference to first aspect, the embodiment of the invention provides the 5th kind of first aspect
Possible embodiment, wherein the variation delta t Prescribed Properties of time, constraint condition indicate are as follows:
Wherein, DcIndicate the limiting value of accumulating injuring value.
Second aspect, the embodiment of the present invention also provide a kind of voltage tolerance index determining device of solid insulating material, packet
It includes: choosing module, choose multiple groups targeted test parameter for the damage line based on solid insulating material；Wherein, damage line
It characterizes the accumulation electric injury amount of solid insulating material and is applied to the voltage of solid insulating material and the relationship of voltage application time；
Targeted test parameter is the parameter for designing step stress test to obtain the voltage tolerance index of solid insulating material；Target
Test parameters includes starting voltage, voltage increment and the voltage application time increment applied to solid insulating material；Voltage tolerance
Index computing module, for calculating the corresponding voltage tolerance index of every group of targeted test parameter；Error amount computing module, for dividing
The error amount between the corresponding voltage tolerance index of every group of targeted test parameter and preset reference voltage tolerance index is not calculated；
Determining module, for the smallest voltage tolerance index of error amount to be determined as to the voltage tolerance index of solid insulating material.
In conjunction with second aspect, the embodiment of the invention provides the first possible embodiments of second aspect, wherein electricity
Pressure tolerance index computing module is used for: calculating the corresponding accumulated damage matrix of every group of targeted test parameter；Wherein, accumulated damage square
Battle array D is indicated are as follows:
Wherein, w indicates that the group number of test parameters, m indicate that each group test parameters repeats the number of test, DwmIndicate w group
The accumulating injuring value that test parameters obtains after repeating test m times；According to accumulated damage matrix, objective function is determined；Wherein, mesh
Scalar functions include the standardization variance of accumulated damage matrix；According to objective function, the corresponding electricity of every group of targeted test parameter is calculated
Press tolerance index.
The third aspect, the embodiment of the invention provides a kind of intelligent terminals, including processor and memory；It is deposited on memory
Computer program is contained, computer program executes the 5th kind of possibility such as first aspect to first aspect when being run by processor
Any one of embodiment method.
Fourth aspect, the embodiment of the invention provides a kind of computer readable storage medium, computer readable storage mediums
On be stored with computer program, above-mentioned first aspect is executed when computer program is run by processor to the 5th kind of first aspect
The step of method of any one of possible embodiment.
The embodiment of the invention provides a kind of voltage tolerance indexes of solid insulating material to determine method, apparatus and intelligence eventually
End, the damage line based on solid insulating material choose multiple groups targeted test parameter, it is corresponding to calculate every group of targeted test parameter
Voltage tolerance index, and calculate separately the corresponding voltage tolerance index of every group of targeted test parameter and the tolerance of preset reference voltage
Error amount between index, so that the voltage tolerance that the smallest voltage tolerance index of error amount is determined as solid insulating material be referred to
Number.Since the present invention calculates voltage tolerance index by multiple groups targeted test parameter, and it will be resistant to and refer to preset reference voltage
The smallest voltage tolerance index of several error amounts is determined as the voltage tolerance index of solid insulating material, therefore can effectively improve
The accuracy of the voltage tolerance index of solid insulating material.
Other features and advantages of the present invention will illustrate in the following description, also, partly become from specification
It obtains it is clear that understand through the implementation of the invention.The objectives and other advantages of the invention are in specification, claims
And specifically noted structure is achieved and obtained in attached drawing.
To enable the above objects, features and advantages of the present invention to be clearer and more comprehensible, preferred embodiment is cited below particularly, and cooperate
Appended attached drawing, is described in detail below.
Detailed description of the invention
It, below will be to specific in order to illustrate more clearly of the specific embodiment of the invention or technical solution in the prior art
Embodiment or attached drawing needed to be used in the description of the prior art be briefly described, it should be apparent that, it is described below
Attached drawing is some embodiments of the present invention, for those of ordinary skill in the art, before not making the creative labor
It puts, is also possible to obtain other drawings based on these drawings.
Fig. 1 shows a kind of flow chart of the parameter determination method of solid insulating material provided by the embodiment of the present invention；
Fig. 2 shows the processes of the parameter determination method of another kind solid insulating material provided by the embodiment of the present invention
Figure；
Fig. 3 shows a kind of accumulating injuring value and the time of stepstress and constant stress provided by the embodiment of the present invention
Relationship schematic diagram；
Fig. 4 shows voltage and time of a kind of solid insulating material provided by the embodiment of the present invention in loss region
The schematic diagram of relationship；
Fig. 5 shows a kind of standardization side of the accumulated damage matrix of solid insulating material provided by the embodiment of the present invention
The schematic diagram of difference and the relationship of voltage tolerance index；
Fig. 6 shows a kind of accumulation damage of the solid insulating material provided by the embodiment of the present invention under different tests parameter
The schematic diagram of wound value and time relationship；
Fig. 7 shows a kind of solid insulating material accumulated damage under different tests parameter provided by the embodiment of the present invention
The schematic diagram of the relationship of the standardization variance and voltage tolerance index of matrix；
Fig. 8 shows a kind of structural frames of the parameter determining device of solid insulating material provided by the embodiment of the present invention
Figure；
Fig. 9 shows a kind of structural schematic diagram of intelligent terminal provided by the embodiment of the present invention.
Specific embodiment
In order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below in conjunction with attached drawing to the present invention
Technical solution be clearly and completely described, it is clear that described embodiments are some of the embodiments of the present invention, rather than
Whole embodiments.Based on the embodiments of the present invention, those of ordinary skill in the art are not making creative work premise
Under every other embodiment obtained, shall fall within the protection scope of the present invention.
The conventional method actually used at present test parameters when determining voltage tolerance index by test parameters is certain
, and different test parameters chooses being affected to the voltage tolerance index n value result of acquisition, obtained n value it is accurate
Property it is to be improved, be based on this, a kind of voltage tolerance index of solid insulating material provided in an embodiment of the present invention determines method, dress
It sets and intelligent terminal, the accuracy of the voltage tolerance index of solid insulating material can be effectively improved.
For convenient for understanding the present embodiment, first to a kind of solid insulating material disclosed in the embodiment of the present invention
Voltage tolerance index determines that method describes in detail.
A kind of voltage tolerance index of solid insulating material shown in Figure 1 determines the flow chart of method, this method by
The intelligent terminals such as computer execute, method includes the following steps:
Step S102, the damage line based on solid insulating material choose multiple groups targeted test parameter；Wherein, damage line
It characterizes the accumulation electric injury amount of solid insulating material and is applied to the voltage of solid insulating material and the relationship of voltage application time；
Targeted test parameter is the parameter for designing step stress test to obtain the voltage tolerance index of solid insulating material；Target
Test parameters includes starting voltage, voltage increment and the voltage application time increment applied to solid insulating material.
In one embodiment, based on solid insulating material damage line choose multiple groups targeted test parameter it
Before, the accumulated damage limiting value of available solid insulating material, to solid insulating material apply preset reference starting voltage,
The application time increment of preset reference voltage increment and preset reference voltage；Wherein, accumulated damage limiting value DCIt indicates are as follows:
Wherein, k indicates that the variation of preset reference starting voltage reaches corresponding breakdown series when default breakdown voltage, and t is indicated
Preset reference starting voltage changes the time for reaching breakdown voltage, n0For benchmark voltage tolerance index, UbIndicate solid insulating material
Default breakdown voltage；
According to accumulated damage limiting value, preset reference starting voltage, preset reference voltage increment and preset reference voltage
Application time increment draws the damage line of solid insulating material.Multiple groups targeted test parameter is chosen based on the damage line, such as
Every group of the starting voltage applied to solid insulating material is identical with voltage increment, and every group of voltage application time increment is different,
Calculating analysis is carried out by variable of voltage application time increment.
Step S104 calculates the corresponding voltage tolerance index of every group of targeted test parameter.
The corresponding accumulated damage matrix of every group of targeted test parameter is calculated, according to accumulated damage matrix, determines to include accumulation
The objective function for damaging the standardization variance of matrix, can calculate the corresponding voltage of every group of targeted test parameter by objective function
Tolerance index.
Step S106, calculates separately the corresponding voltage tolerance index of every group of targeted test parameter and preset reference voltage is resistance to
By the error amount between index.
Preset reference voltage tolerance index can be to be obtained according to constant stress test method, but this method has consumption
The shortcomings that duration, low efficiency, and since test period span is larger, the factor for influencing material failure is more, and data is caused to be dispersed
Property it is also very big, what is used in practice is less, can be using the voltage tolerance index that this method obtains as analysis foundation.
The smallest voltage tolerance index of error amount is determined as the voltage tolerance index of solid insulating material by step S108.
The corresponding voltage tolerance index of every group of targeted test parameter and the tolerance of preset reference voltage has been obtained by calculation
Error amount between index, the smallest voltage tolerance index of error amount can be used as the voltage tolerance index of solid insulating material,
The voltage tolerance index of the solid insulating material calculated under the test parameters is accurate.
The voltage tolerance index of above-mentioned solid insulating material provided in an embodiment of the present invention determines method, is based on solid insulation
The damage line of material chooses multiple groups targeted test parameter, calculates the corresponding voltage tolerance index of every group of targeted test parameter, and
Calculate separately the error between the corresponding voltage tolerance index of every group of targeted test parameter and preset reference voltage tolerance index
Value, so that the test that the corresponding targeted test parameter of the smallest voltage tolerance index of error amount is determined as solid insulating material be joined
Number.Since the present invention calculates voltage tolerance index by multiple groups targeted test parameter, and it will be resistant to and refer to preset reference voltage
The smallest voltage tolerance index of several error amounts is determined as the voltage tolerance index of solid insulating material, therefore can effectively improve
The accuracy of the voltage tolerance index of solid insulating material.
For ease of understanding, the voltage tolerance index based on another solid insulating material provided in this embodiment is given below
Determine method, a kind of voltage tolerance index of solid insulating material shown in Figure 2 determines the flow chart of method, this method packet
Include following steps:
Step S202, the damage line based on solid insulating material choose multiple groups targeted test parameter；Wherein, damage line
It characterizes the accumulation electric injury amount of solid insulating material and is applied to the voltage of solid insulating material and the relationship of voltage application time；
Targeted test parameter is the parameter for designing step stress test to obtain the voltage tolerance index of solid insulating material；Target
Test parameters includes starting voltage, voltage increment and the voltage application time increment applied to solid insulating material.
The accumulated damage limiting value D of solid insulating materialCIt indicates are as follows:
Wherein, k indicates that the variation of preset reference starting voltage reaches corresponding breakdown series when default breakdown voltage, and t is indicated
Preset reference starting voltage changes the time for reaching breakdown voltage, n0For benchmark voltage tolerance index, UbIndicate solid insulating material
Default breakdown voltage.
Reference voltage tolerance index n0It for empirical value, is obtained according to constant stress test method.As Fig. 3 is illustrated
The schematic diagram of the accumulating injuring value and time relationship of stepstress and constant stress illustrates accumulated damage limiting value in Fig. 3
DC, the area I, the area II and the area III in Fig. 3 are the damage field divided according to voltage and time, constant stress test and step in Fig. 3
The accumulating injuring value changed over time into stress test is respectively positioned on the area II i.e. the same area, indicates stepstress and constant stress
Equivalence it is preferable.
As Fig. 4 illustrates a kind of solid insulating material in the voltage in loss region and the schematic diagram of time relationship, Fig. 4
The area I, the area II and the area III be the damage field divided according to voltage and time, i.e., apply voltage to solid insulating material and send out
Raw breakdown failure selects out-of-service time ta and tb respectively as I with the damage field divided according to breakdown failure in different time
The boundary (such as can choose ta=1 hours, tb=1) in area and the area II and the area II and the area III, two lines of demarcation and D-t
The intercept U of figure ordinatea nAnd Ub n, it calculates according to the following formula:
Ln D=lnt+nln U
Wherein, t is service life of the solid insulating material at constant electric stress U, and n is voltage tolerance index, and D is that insulation is lost
The accumulation electric injury amount reached needed for effect, for given solid insulating material, n and D are constant.
The selection of the preset reference starting voltage of solid insulating material essentially dictates the initial position of D-t curve, such as
The voltage tolerance index in the area II shown in Fig. 4 is obtained, as long as meeting condition Ua n<U0 n<Ub n, then the starting point of D-t curve be
In the region II, D-t curve can be drawn out according to the following formula:
Wherein, D indicates that the accumulating injuring value of step stress test, n indicate the empirical value of voltage tolerance index, U0Indicate pre-
If benchmark starting voltage, Δ t indicates that the application time increment of preset reference voltage, Δ U indicate preset reference voltage increment, i table
Show that the number of time change Δ t, k indicate that the variation of preset reference starting voltage reaches corresponding breakdown grade when default breakdown voltage
Number, Δ tendIndicate holding time for breakdown voltage.
The rate of rise of the curve is codetermined by Δ U and Δ t, in order to make the rate of rise of progressive damage be maintained at one
Suitable rate, can generally choose Δ U is about 5%Ub, Δ t had range of choice, is located in the area II with restrictive curve terminal, Δ t
Range of choice, that is, constraint condition be further elaborated later.
Obviously, D-t curve can also be drawn out according to constant voltage process, according to the similar principle of main puncture mechanism, as long as
The D-t curve-equipartition cloth that constant voltage process and stepstress method are drawn out is in the same damage field, then its test result can recognize
For with certain equivalence.
Damage line needs to meet constraint condition, and constraint condition indicates are as follows:
Wherein, DcIndicate the limiting value of accumulating injuring value.
Step S204 calculates the corresponding accumulated damage matrix of every group of targeted test parameter；Wherein, accumulated damage matrix D table
It is shown as:
Wherein, w indicates that the group number of test parameters, m indicate that each group test parameters repeats the number of test, DwmIndicate w group
The accumulating injuring value that test parameters obtains after repeating test m times.
It is w that above-mentioned accumulated damage matrix D, which is when selecting the test parameters number of combinations of stepstress, and every kind of test parameters repeats
It is obtained after test m times.Each element D in the matrixijCan by calculate step stress test in breakdown series last
The impairment value of grade obtains.The problem of seeking of the voltage tolerance index n of sample is then converted into the optimal solution for seeking a n value, so that D
In each element it is equal, be further translated into using n as unknown number, with the standardization variance S of above-mentioned accumulated damage matrix D
(n) it is objective function, seeks the smallest mathematical optimization problem of objective function.
Step S206 determines objective function according to accumulated damage matrix；Wherein, objective function includes accumulated damage matrix
Standardization variance.
According to following formula calculating target function:
Wherein, S (n) indicates the standardization variance of accumulated damage matrix D, and n indicates voltage tolerance index, DijIndicate i-th group
The accumulating injuring value that test parameters obtains after repeating test j times,The sum of each element is flat in expression accumulated damage matrix D
Mean value, Δ t indicate the variable quantity of time, U0Indicate starting voltage, Δ U indicates that starting voltage changes over time the voltage after Δ t
Variable quantity, i indicate that the number of time change Δ t, k indicate that starting voltage variation reaches corresponding breakdown when default breakdown voltage
Series, Δ tendIndicate holding time for breakdown voltage.
Specifically, the variation delta t Prescribed Properties of time, constraint condition is indicated are as follows:
Wherein, DcIndicate the limiting value of accumulating injuring value.
Step S208 calculates the corresponding voltage tolerance index of every group of targeted test parameter according to objective function.
Voltage tolerance index n is calculated according to following formula:
Wherein, standardization variance S (n), which is corresponding with standard variance S, indicates change curve S-n with the change curve S-n, λ of n value
Negative second dervative.
As Fig. 5 illustrates the standardization variance and voltage tolerance index of a kind of accumulated damage matrix of solid insulating material
Relationship schematic diagram, i.e. the schematic diagram of curve S-n, S (n) have minimum value Smin, the negative second dervative of λ expression change curve S-n
That is the acuity at the Curve Maximization peak, λ is bigger, and extreme value peak is more sharp, namely in this group of test data, that is, above-mentioned targeted test
The uniqueness of n is better in parameter.S in Fig. 5minThe acuity for locating the i.e. Curve Maximization peak corresponding λ is maximum, n conduct at this time
The voltage tolerance index of this group of test data, SminSmaller λ is bigger, and it is more reasonable to represent this group of step stress test parameter setting.
Step S210, calculates separately the corresponding voltage tolerance index of every group of targeted test parameter and preset reference voltage is resistance to
By the error amount between index.
Error amount can be indicated with positive number, if the corresponding voltage tolerance index of targeted test parameter is than preset benchmark electricity
Press tolerance index small 0.2 or big 0.1.
The smallest voltage tolerance index of error amount is determined as the voltage tolerance index of solid insulating material by step S212.
In one embodiment, it is the parameter for determining crosslinked polyethylene insulation material, devises six different parameters
Scheme (A~F) is to carry out step stress test, as shown in table 1.
To simplify the analysis, U in this six groups of test parameters035kV, Δ U is taken to take 2.5kV, emphasis is under each voltage
Hold time the i.e. above-mentioned time variation delta t be variable analyzed.Consider the dispersibility of sample fails, every group of test parameters
Under be repeated 9 times test.A, the Δ t duration value of two different Δ t, A groups of C group selection is short compared with C group；B, D, E expand
The quantity of test sample selects three different Δ t, and wherein the 3 of B group Δ t is short compared with D, E group, and 3 of the selection of E group
Distance is big compared with D group between Δ t；F selects six different Δ t, F groups and E group Δ t to be selected from section [120s, 1200s].
1 step stress test parameter setting of table (Δ U=2.5kV, U0=35kV)
The D-t curve of six groups of test groups can be obtained by bringing the parameter in table 1 into formula (5), as Fig. 6 shows different tests ginseng
The schematic diagram of accumulating injuring value and time relationship under several, i.e., the corresponding D-t curve synoptic diagram of above-mentioned six groups of test parameters of A~F.
As can be seen that two groups of D-t curves of A, B pass through two region I, II in Fig. 6, and tetra- groups of test parameters of C, D, E, F are then merely through II
Region, according to failure mechanism equivalence principle, it is desirable that take the life index in the region II, the selection etc. of tetra- groups of test parameters of C, D, E, F
Effect property is more preferable.
The standardization variance of accumulated damage matrix under different tests parameter and the relationship of voltage tolerance index are shown such as Fig. 7
Schematic diagram, i.e., the schematic diagram of the corresponding S-n curve of above-mentioned six groups of test parameters obtains S further according to S-n curveminAnd λ
Value, and further comparison is done to the superiority of each group test parameters:
2 each group of table tests n, minS (n) and λ
For tetra- groups of samples of C, D, E, F, due to only experienced the area II, for failure mechanism, have preferable equivalent
Property.But due to Δ t quantity and Δ tmax/ΔtminThe difference of value size, so that the calculated result n of four groups of tests still has area
Not.Although E group tests, Δ t suitable with D group in Δ t quantitymax/ΔtminThe range of choice of=10, Δ t are compared with D group covering surface
Greatly, the sharpness parameter lambda of D (n) curve shows the selection uniqueness of its n value well compared with D group also greater than D group test parameters.F group and E
Group Δ tmax/ΔtminIt is worth equal, λ is less than E group, but F group sample dimension is twice of E group, and minS (n) is again smaller than other
Five groups, show that matrix D more meets solving condition, F group result accuracy is more preferable；D group and C group Δ tmax/ΔtminIt is equal, D group Δ
T is more, and minS (n) is also smaller, however the n value of D group is smaller, should due to the presence of sample making and test error
Difference can receive.Comprehensively consider λ and minS (n), F group test result is optimal, the voltage tolerance index n=12.0 actually obtained
It is also the result (n=12.2) of closest constant stress method.
In conclusion the voltage tolerance index of above-mentioned solid insulating material provided in an embodiment of the present invention determines method, lead to
It crosses multiple groups targeted test parameter and calculates voltage tolerance index, and will be the smallest with the error amount of preset reference voltage tolerance index
Voltage tolerance index is determined as the voltage tolerance index of solid insulating material, therefore can effectively improve the electricity of solid insulating material
Press the accuracy of tolerance index.
Voltage tolerance index corresponding to aforesaid solid insulating materials determines method, and it is solid that the embodiment of the invention provides one kind
The voltage tolerance index determining device of body insulating materials, referring to a kind of voltage tolerance index of solid insulating material shown in Fig. 8
The structural block diagram of determining device, the device comprise the following modules:
Module 802 is chosen, chooses multiple groups targeted test parameter for the damage line based on solid insulating material；Wherein,
When the accumulation electric injury amount of damage line characterization solid insulating material applies with the voltage and voltage for being applied to solid insulating material
Between relationship；Targeted test parameter is the voltage tolerance index for designing step stress test to obtain solid insulating material
Parameter；Targeted test parameter includes starting voltage, voltage increment and the voltage application time increment applied to solid insulating material；
Voltage tolerance index computing module 804, for calculating the corresponding voltage tolerance index of every group of targeted test parameter；
Error amount computing module 806, for calculating separately the corresponding voltage tolerance index of every group of targeted test parameter and pre-
If reference voltage tolerance index between error amount；
Determining module 808, the voltage for the smallest voltage tolerance index of error amount to be determined as solid insulating material are resistance to
By index.
The voltage tolerance index determining device of above-mentioned solid insulating material provided in an embodiment of the present invention, passes through multiple groups target
Test parameters calculates voltage tolerance index, and will refer to the smallest voltage tolerance of the error amount of preset reference voltage tolerance index
Number is determined as the voltage tolerance index of solid insulating material, therefore can effectively improve the voltage tolerance index of solid insulating material
Accuracy.
Above-mentioned voltage tolerance index computing module 804 is further used for: calculating the corresponding accumulation of every group of targeted test parameter
Damage matrix；Wherein, accumulated damage matrix D indicates are as follows:
Wherein, w indicates that the group number of test parameters, m indicate that each group test parameters repeats the number of test, DwmIndicate w group
The accumulating injuring value that test parameters obtains after repeating test m times；According to accumulated damage matrix, objective function is determined；Wherein, mesh
Scalar functions include the standardization variance of accumulated damage matrix；According to objective function, the corresponding electricity of every group of targeted test parameter is calculated
Press tolerance index.
The technical effect of device provided by the present embodiment, realization principle and generation is identical with previous embodiment, for letter
It describes, Installation practice part does not refer to place, can refer to corresponding contents in preceding method embodiment.
The embodiment of the invention provides a kind of intelligent terminal, a kind of structural schematic diagram of intelligent terminal shown in Figure 9,
The intelligent terminal includes: processor 90, memory 91, bus 92 and communication interface 93, the processor 90,93 and of communication interface
Memory 91 is connected by bus 92；Processor 90 is for executing the executable module stored in memory 91, such as computer
Program.
Wherein, memory 91 may include high-speed random access memory (RAM, Random Access Memory),
It may further include non-labile memory (non-volatile memory), for example, at least a magnetic disk storage.By extremely
A few communication interface 93 (can be wired or wireless) is realized logical between the system network element and at least one other network element
Letter connection, can be used internet, wide area network, local network, Metropolitan Area Network (MAN) etc..
Bus 92 can be isa bus, pci bus or eisa bus etc..The bus can be divided into address bus, data
Bus, control bus etc..Only to be indicated with a four-headed arrow convenient for indicating, in Fig. 9, it is not intended that an only bus or
A type of bus.
Wherein, memory 91 is for storing program, and the processor 90 executes the journey after receiving and executing instruction
Sequence, method performed by the device that the stream process that aforementioned any embodiment of the embodiment of the present invention discloses defines can be applied to handle
In device 90, or realized by processor 90.
Processor 90 may be a kind of IC chip, the processing capacity with signal.During realization, above-mentioned side
Each step of method can be completed by the integrated logic circuit of the hardware in processor 90 or the instruction of software form.Above-mentioned
Processor 90 can be general processor, including central processing unit (Central Processing Unit, abbreviation CPU), network
Processor (Network Processor, abbreviation NP) etc.；It can also be digital signal processor (Digital Signal
Processing, abbreviation DSP), specific integrated circuit (Application Specific Integrated Circuit, referred to as
ASIC), ready-made programmable gate array (Field-Programmable Gate Array, abbreviation FPGA) or other are programmable
Logical device, discrete gate or transistor logic, discrete hardware components.It may be implemented or execute in the embodiment of the present invention
Disclosed each method, step and logic diagram.General processor can be microprocessor or the processor is also possible to appoint
What conventional processor etc..The step of method in conjunction with disclosed in the embodiment of the present invention, can be embodied directly in hardware decoding processing
Device executes completion, or in decoding processor hardware and software module combination execute completion.Software module can be located at
Machine memory, flash memory, read-only memory, programmable read only memory or electrically erasable programmable memory, register etc. are originally
In the storage medium of field maturation.The storage medium is located at memory 91, and processor 90 reads the information in memory 91, in conjunction with
Its hardware completes the step of above method.
The embodiment of the invention also provides a kind of computer readable storage medium, it is stored on computer readable storage medium
Computer program, when computer program is run by processor the step of the method for any one of execution previous embodiment.
It is apparent to those skilled in the art that for convenience and simplicity of description, the system of foregoing description
Specific work process, can be with reference to the corresponding process in previous embodiment, and details are not described herein.
The voltage tolerance index of solid insulating material provided by the embodiment of the present invention determines method, apparatus and intelligent terminal
Computer program product, the computer readable storage medium including storing program code, the finger that said program code includes
Order can be used for executing previous methods method as described in the examples, and specific implementation can be found in embodiment of the method, and details are not described herein.
It, can be with if the function is realized in the form of SFU software functional unit and when sold or used as an independent product
It is stored in a computer readable storage medium.Based on this understanding, technical solution of the present invention is substantially in other words
The part of the part that contributes to existing technology or the technical solution can be embodied in the form of software products, the meter
Calculation machine software product is stored in a storage medium, including some instructions are used so that a computer equipment (can be a
People's computer, server or network equipment etc.) it performs all or part of the steps of the method described in the various embodiments of the present invention.
And storage medium above-mentioned includes: USB flash disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), arbitrary access
The various media that can store program code such as memory (RAM, Random Access Memory), magnetic or disk.
Finally, it should be noted that embodiment described above, only a specific embodiment of the invention, to illustrate the present invention
Technical solution, rather than its limitations, scope of protection of the present invention is not limited thereto, although with reference to the foregoing embodiments to this hair
It is bright to be described in detail, those skilled in the art should understand that: anyone skilled in the art
In the technical scope disclosed by the present invention, it can still modify to technical solution documented by previous embodiment or can be light
It is readily conceivable that variation or equivalent replacement of some of the technical features；And these modifications, variation or replacement, do not make
The essence of corresponding technical solution is detached from the spirit and scope of technical solution of the embodiment of the present invention, should all cover in protection of the invention
Within the scope of.Therefore, protection scope of the present invention should be based on the protection scope of the described claims.
Claims (10)
1. a kind of voltage tolerance index of solid insulating material determines method characterized by comprising
Damage line based on solid insulating material chooses multiple groups targeted test parameter；Wherein, described in the damage line characterization
The accumulation electric injury amount of solid insulating material and it is applied to the voltage of the solid insulating material and the relationship of voltage application time；
The targeted test parameter is the parameter for designing step stress test to obtain the voltage tolerance index of solid insulating material；
The targeted test parameter includes that starting voltage, voltage increment and the voltage application time applied to the solid insulating material increases
Amount；
The corresponding voltage tolerance index of targeted test parameter described in calculating every group；
The corresponding voltage tolerance index of targeted test parameter described in calculating separately every group and preset reference voltage tolerance index it
Between error amount；
The smallest voltage tolerance index of error amount is determined as to the voltage tolerance index of the solid insulating material.
2. the method according to claim 1, wherein choosing multiple groups in the damage line based on solid insulating material
Before the step of targeted test parameter, the method also includes:
It obtains the accumulated damage limiting value of solid insulating material, originate electricity to the preset reference that the solid insulating material applies
The application time increment of pressure, preset reference voltage increment and the preset reference voltage；Wherein, the accumulated damage limiting value DC
It indicates are as follows:
Wherein, k indicates that the preset reference starting voltage variation reaches corresponding breakdown series when default breakdown voltage, and t is indicated
The preset reference starting voltage variation reaches the time of the breakdown voltage, n0For the reference voltage tolerance index, UbIt indicates
The default breakdown voltage of the solid insulating material；
According to the accumulated damage limiting value, the preset reference starting voltage, the preset reference voltage increment and described pre-
If the application time increment of reference voltage, draws the damage line of solid insulating material.
3. the method according to claim 1, wherein the corresponding electricity of targeted test parameter described in every group of the calculating
The step of pressing tolerance index, comprising:
The corresponding accumulated damage matrix of targeted test parameter described in calculating every group；Wherein, the accumulated damage matrix D indicates are as follows:
Wherein, w indicates that the group number of the test parameters, m indicate that test parameters described in each group repeats the number of test, DwmIndicate the
The accumulating injuring value that the w group test parameters obtains after repeating test m times；
According to the accumulated damage matrix, objective function is determined；Wherein, the objective function includes the accumulated damage matrix
Standardize variance；
According to the objective function, calculate every group described in the corresponding voltage tolerance index of targeted test parameter.
4. according to the method described in claim 3, determining target letter it is characterized in that, described according to the accumulated damage matrix
Several steps, comprising:
According to following formula calculating target function:
Wherein, S (n) indicates the standardization variance of the accumulated damage matrix D, and n indicates the voltage tolerance index, DijIndicate the
The accumulating injuring value that the i group test parameters obtains after repeating test j times,Indicate each in the accumulated damage matrix D
The average value of the sum of element, Δ t indicate the variable quantity of time, U0Indicate the starting voltage, Δ U indicate the starting voltage with
Voltage variety after time change Δ t, i indicate that the number of time change Δ t, k indicate that the starting voltage variation reaches pre-
If corresponding breakdown series, Δ t when breakdown voltageendIndicate holding time for the breakdown voltage.
5. according to the method described in claim 4, it is characterized in that, described according to the objective function, calculate every group described in mesh
The step of marking test parameters corresponding voltage tolerance index, comprising:
Voltage tolerance index n is calculated according to following formula:
Wherein, standardization variance S (n), which is corresponding with standard variance S, indicates that the variation is bent with the change curve S-n, λ of n value
The negative second dervative of line S-n.
6. according to the method described in claim 4, it is characterized in that, the variation delta t Prescribed Properties of the time, it is described about
Beam condition indicates are as follows:
Wherein, DcIndicate the limiting value of the accumulating injuring value.
7. a kind of voltage tolerance index determining device of solid insulating material characterized by comprising
Module is chosen, chooses multiple groups targeted test parameter for the damage line based on solid insulating material；Wherein, the damage
The accumulation electric injury amount that curve characterizes the solid insulating material is applied with the voltage and voltage for being applied to the solid insulating material
Relationship between added-time；The targeted test parameter is resistance to obtain the voltage of solid insulating material for designing step stress test
By the parameter of index；The targeted test parameter include to the solid insulating material apply starting voltage, voltage increment and
Voltage application time increment；
Voltage tolerance index computing module, for the corresponding voltage tolerance index of targeted test parameter described in calculating every group；
Error amount computing module, for the corresponding voltage tolerance index of targeted test parameter described in calculating separately every group and preset
Error amount between reference voltage tolerance index；
Determining module, the voltage for the smallest voltage tolerance index of error amount to be determined as to the solid insulating material, which is resistant to, to be referred to
Number.
8. device according to claim 7, which is characterized in that the voltage tolerance index computing module is used for:
The corresponding accumulated damage matrix of targeted test parameter described in calculating every group；Wherein, the accumulated damage matrix D indicates are as follows:
Wherein, w indicates that the group number of the test parameters, m indicate that test parameters described in each group repeats the number of test, DwmIndicate the
The accumulating injuring value that the w group test parameters obtains after repeating test m times；
According to the accumulated damage matrix, objective function is determined；Wherein, the objective function includes the accumulated damage matrix
Standardize variance；
According to the objective function, calculate every group described in the corresponding voltage tolerance index of targeted test parameter.
9. a kind of intelligent terminal, which is characterized in that including processor and memory；
Computer program is stored on the memory, the computer program executes such as right when being run by the processor
It is required that 1 to 6 described in any item methods.
10. a kind of computer readable storage medium, computer program, feature are stored on the computer readable storage medium
The step of being, the described in any item methods of the claims 1 to 6 executed when the computer program is run by processor.
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