CN109918293B - System test method and device, electronic equipment and computer readable storage medium - Google Patents
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Abstract
The disclosure provides a system testing method and device, electronic equipment and storage medium. The system testing method comprises the following steps: responding to a test instruction for system upgrade, and acquiring a current test target; extracting a current test keyword from the current test target; determining a current test index according to the current test keyword; inputting sample data corresponding to the current test index into a system before upgrading to obtain a first index value of the current test index, and inputting the sample data into the system after upgrading to obtain a second index value of the current test index; and determining a test result of the system based on the first index value and the second index value. The present disclosure improves the degree of automation in testing upgrades to data analysis systems.
Description
Technical Field
The present disclosure relates to automated testing tools in testing, and more particularly, to a system testing method, a system testing apparatus, an electronic device, and a computer readable storage medium.
Background
Financial analysis systems are currently in wide use in the financial field. When operating data (e.g., rise and fall curves) of a financial asset (e.g., stock, securities, etc.) is input into a financial analysis system, the financial analysis system can output values of a plurality of indicators, such as values of a holding rate, a rise and fall rate. The financial analysis system is widely used in financial data analysis. In addition, there are many data analysis systems in other industries that output an index value after analysis based on the data to be analyzed.
Data analysis systems often perform code upgrades. After code upgrades, data analysis systems sometimes experience instability, for example, the data analysis results may differ significantly from the previous ones. In this case, a system test is required. The prior art can only pass manual testing, the cost of the manual testing is high, and the influence of the main view is large, so that the manual testing is not accurate enough.
It should be noted that the information disclosed in the above background section is only for enhancing understanding of the background of the present disclosure and thus may include information that does not constitute prior art known to those of ordinary skill in the art.
Disclosure of Invention
The present disclosure provides a system testing method, a system testing apparatus, an electronic device, and a computer-readable storage medium, capable of improving the degree of automation in testing upgrades to a data analysis system.
Other features and advantages of the present disclosure will be apparent from the following detailed description, or may be learned in part by the practice of the disclosure.
According to one aspect of the present disclosure, there is provided a system testing method, comprising: responding to a test instruction for system upgrade, and acquiring a current test target; extracting a current test keyword from the current test target; determining a current test index according to the current test keyword; inputting sample data corresponding to the current test index into a system before upgrading to obtain a first index value of the current test index, and inputting the sample data into the system after upgrading to obtain a second index value of the current test index; and determining a test result of the system based on the first index value and the second index value.
In an exemplary embodiment of the disclosure, the determining the current test index according to the current test keyword includes: searching a test log matched with the current test keyword in a test log library, wherein each test log comprises a history test keyword extracted from a history test target in a history upgrading test and a corresponding history test index designated for the history test target; and determining the current test index according to the searched historical test index in the test log.
In an exemplary embodiment of the present disclosure, the searching the test log library for the test log matching the current test keyword includes: determining the matching degree of the historical test keywords in each test log with the current test keywords aiming at each test log in a test log library; and determining the test log with the matching degree meeting the preset matching degree condition as the test log matched with the current test keyword.
In one exemplary embodiment of the present disclosure, the degree of matching of the historical test keywords in the test log with the current test keywords is equal to the number of keywords in the intersection of the historical test keywords with the current test keywords in the test log divided by the number of keywords in the union of the historical test keywords with the current test keywords in the test log.
In an exemplary embodiment of the present disclosure, the determining, according to the found historical test indexes in the test log, the current test index includes: determining the occurrence times of each historical test index in the searched test log; and determining the historical test index with the occurrence number meeting the preset occurrence number condition as the current test index.
In an exemplary embodiment of the present disclosure, when the current test index is a plurality of, the determining a test result of the system based on the first index value and the second index value includes: determining, for each current test indicator, whether a difference between a first indicator value and a second indicator value of the current test indicator respectively meets a predetermined condition specific to the current test indicator; if the difference between the first index value and the second index value of each current test index meets the preset condition specific to the current test index, the test result is that the test is passed, otherwise, the test result is that the test is not passed.
In an exemplary embodiment of the present disclosure, the predetermined condition is: the difference between the first index value and the second index value of the current test index is less than a predetermined difference threshold value specific to the current test index.
According to one aspect of the present disclosure, there is also provided a system testing apparatus including: the current test target acquisition module is used for responding to the received test instruction for system upgrade to acquire a current test target; the current test keyword extraction module is used for extracting current test keywords from the current test targets; the current test index determining module is used for determining a current test index according to the current test keyword; the sample data operation module is used for inputting the sample data corresponding to the current test index into the system before upgrading to obtain a first index value of the current test index, and inputting the sample data into the system after upgrading to obtain a second index value of the current test index; and the test result determining module is used for determining a test result of the system based on the first index value and the second index value.
In one exemplary embodiment of the present disclosure, the current test index determination module includes: the log searching unit is used for searching test logs matched with the current test keywords in a test log library, and each test log comprises a history test keyword extracted from a history test target in a history upgrading test and a corresponding history test index designated for the history test target; the index determining unit is used for determining the current test index according to the found historical test index in the test log.
In one exemplary embodiment of the present disclosure, the log finding unit includes: the matching degree determining subunit is used for determining the matching degree of the historical test keywords in each test log with the current test keywords in the test log aiming at each test log in the test log library; and the matching judgment subunit is used for determining the test log with the matching degree meeting the preset matching degree condition as the test log matched with the current test keyword.
In one exemplary embodiment of the present disclosure, the degree of matching of the historical test keywords in the test log with the current test keywords is equal to the number of keywords in the intersection of the historical test keywords with the current test keywords in the test log divided by the number of keywords in the union of the historical test keywords with the current test keywords in the test log.
In one exemplary embodiment of the present disclosure, the index determining unit includes: the frequency counting subunit is used for determining the occurrence frequency of each historical test index in the searched test log; and the frequency judging subunit is used for determining the historical test index of which the frequency of occurrence meets the preset frequency of occurrence condition as the current test index.
In an exemplary embodiment of the present disclosure, when the current test index is a plurality of, the test result determining module includes: a condition judgment unit for determining, for each current test index, whether or not differences between first index values and second index values of the current test index respectively satisfy predetermined conditions specific to the current test index; and the test result acquisition unit is used for acquiring a test result if the difference between the first index value and the second index value of each current test index meets the preset condition specific to the current test index, and acquiring a test result if the difference meets the preset condition specific to the current test index, otherwise, acquiring a test result if the difference does not pass.
In an exemplary embodiment of the present disclosure, the above predetermined condition is: the difference between the first index value and the second index value of the current test index is less than a predetermined difference threshold value specific to the current test index.
According to one aspect of the present disclosure, there is provided an electronic device including: a processor; and a memory for storing executable instructions of the processor; wherein the processor is configured to perform the method of any of the above via execution of the executable instructions.
According to one aspect of the present disclosure, there is provided a computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements the method of any one of the above.
Exemplary embodiments of the present disclosure have the following advantageous effects:
In the prior art, the upgrade test of the data analysis system is performed manually, because people can conveniently determine the test index according to the field requirement by combining the test target, and then test the data analysis system according to the test index. In the embodiment of the disclosure, in response to receiving a test instruction for upgrading a system, a current test target is obtained, a current test keyword is extracted from the current test target, and a current test index is determined according to the current test keyword. In this way, the current test index is automatically acquired. According to the current test index, sample data are put into a system before upgrading to obtain a first index value of the current test index, and sample data are put into the system after upgrading to obtain a second index value of the current test index, and a test result of the system is determined based on the first index value and the second index value. The automatic testing device improves the degree of automation of testing the upgrading of the data analysis system and improves the testing efficiency.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the disclosure and together with the description, serve to explain the principles of the disclosure. It will be apparent to those of ordinary skill in the art that the drawings in the following description are merely examples of the disclosure and that other drawings may be derived from them without undue effort.
Fig. 1 schematically shows a flowchart of a system test method in the present exemplary embodiment;
Fig. 2 schematically shows a flowchart of determining a current test index from a current test keyword in the present exemplary embodiment;
FIG. 3 schematically illustrates a flow chart of searching a test log library for a test log matching the current test keyword in the present exemplary embodiment;
Fig. 4 schematically shows a flowchart for determining a current test index according to the found historical test index in the test log in the present exemplary embodiment;
fig. 5 schematically illustrates a flowchart of the determining a test result of the system based on the first index value and the second index value when the current test index is a plurality of current test indexes in the present exemplary embodiment;
Fig. 6 schematically shows a block diagram of a system test apparatus in the present exemplary embodiment;
Fig. 7 schematically shows a hardware configuration diagram of an electronic device for implementing the above method in the present exemplary embodiment;
Fig. 8 schematically shows a computer-readable storage medium for implementing the above-described method in the present exemplary embodiment.
Detailed Description
Example embodiments will now be described more fully with reference to the accompanying drawings. However, the exemplary embodiments may be embodied in many forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of the example embodiments to those skilled in the art. The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.
Financial analysis systems are currently in wide use in the financial field. When operating data (e.g., rise and fall curves) of a financial asset (e.g., stock, securities, etc.) is input into a financial analysis system, the financial analysis system can output values of a plurality of indicators, such as values of a holding rate, a rise and fall rate. The financial analysis system is widely used in financial data analysis. In addition, there are many data analysis systems in other industries that output an index value after analysis based on the data to be analyzed.
Data analysis systems often perform code upgrades. After code upgrades, data analysis systems sometimes experience instability, for example, the data analysis results may differ significantly from the previous ones. In this case, a system test is required. The prior art can only pass manual testing, the cost of the manual testing is high, and the influence of the main view is large, so that the manual testing is not accurate enough. The present disclosure presents a method of automatically testing upgrades to a data analysis system.
The execution subject of the present exemplary embodiment may be a machine that executes an upgrade test of the data analysis system, and may be a device itself that runs the data analysis system, a dedicated test device, or a server. As further described below with reference to FIG. 1, as shown in FIG. 1, the system testing method of the present exemplary embodiment may include the following steps 110-150:
step 110, responding to receiving a test instruction for upgrading the system, and acquiring a current test target;
Step 120, extracting a current test keyword from the current test target;
Step 130, determining a current test index according to the current test keyword;
step 140, inputting sample data corresponding to the current test index into a system before upgrading to obtain a first index value of the current test index, and inputting sample data into a system after upgrading to obtain a second index value of the current test index;
And step 150, determining a test result of the system based on the first index value and the second index value.
These steps are described in detail below.
In step 110, in response to receiving a test instruction for a system upgrade, a current test target is obtained.
System upgrades refer to modifications made to the code of a system to accomplish an increase in system functionality or performance improvement. When the system is upgraded, there is a problem that the performance of the system before and after the upgrade is greatly different, and then the test is required. The test instruction is an instruction for testing. In one embodiment, the test instructions may be manually entered by an administrator. In another embodiment, the test instructions may be supervised by the script of the system itself for changes in its own code, which are automatically issued when a code change, i.e. an upgrade, is detected.
The current test objective refers to the purpose to be achieved by the current test. For example, some test comparisons focus on response speed, and some test comparisons focus on accuracy. In one example, the current test objective may be "whether there is a large change in response speed after an upgrade, and whether it is easy to get stuck". In another example, the current test objective may be "whether there is a large change in the accuracy of the data analysis after the upgrade, whether there is a large change in the security of the data transfer.
In one embodiment, the current test target may be in the test instruction, such that the current test target may be read from the test instruction. In another embodiment, after receiving the test instruction, a request for the current test target needs to be sent to the user, and after receiving the request, the user sends the test target to the test system.
In step 120, a current test keyword is extracted from the current test target.
The current test keyword refers to a word decomposed from the current test target for determining the current test index.
In one embodiment, step 120 may include:
Word segmentation is carried out on the current test target;
extracting words with specific parts of speech from the divided words;
And removing the general words from the extracted words to obtain the current test keywords.
The word segmentation of the current test object can be achieved by means of existing word segmentation techniques. For example, "whether there is a great change in response speed after the update is tested, and whether it is easy to jam" can be classified into "test", "update", "after", "response", "speed", "whether" and the like.
In one embodiment, extracting words of a particular part of speech from the divided words may be accomplished by looking up a part of speech table for each divided word. For example, specific parts of speech are nouns and verbs. "whether there is a great change in response speed after an upgrade is tested, and whether it is easy to seize" after only nouns and verbs remain in the divided words, "test", "upgrade", "response", "speed", "change", "seize".
In one embodiment, the removal of generic words from the extracted words may be accomplished by means of a generic vocabulary. And searching the general word list one by one for each extracted word, judging whether the general word list is in the general word list, and removing if the general word list is in the general word list. The general words "test", "upgrade", "response", "speed", "change", "seize" are removed, and only "response", "speed", "seize" remain.
In step 130, a current test index is determined according to the current test keyword.
The current test index refers to an index of the system output to be measured in the test of the system upgrade. For example, in the case of a concern over system response speed, the current test indicator may be the data analysis occupancy time; in cases where care is taken whether the system is stuck, the current test indicator may be the probability of stuck in the data analysis.
As shown in fig. 2, in one embodiment, step 130 includes:
Step 1301, searching a test log matched with the current test keyword in a test log library, wherein each test log comprises a history test keyword extracted from a history test target in a history upgrading test and a corresponding history test index designated for the history test target;
step 1302, determining a current test index according to the found historical test index in the test log.
The test log library is a database for storing test logs. The test log is generated by: the process of steps 110-120 is performed historically once per test for system upgrades. That is, in response to receiving a test instruction for a historically upgraded system, a historical test target for the upgraded test is obtained; and extracting the historical test keywords from the historical test targets. The historical test target is the target of the pointer to the test that was historically updated. The history test keywords are keywords extracted from the history test targets. Then, the test index for testing required to complete the history test target, i.e., the history test index, is specified empirically for the history test target by an expert. For example, the historical test target may be "whether the response speed after the test upgrade is greatly changed and whether the jam occurs", and the historical test index obtained after the expert determines is the data analysis occupation time and the jam probability. And then, correspondingly storing the extracted historical test keywords and the historical test indexes appointed by the expert for the historical test targets to form a test log.
In one embodiment, as shown in fig. 3, step 1301 may include:
Step 13011, for each test log in the test log library, determining the matching degree of the historical test keywords in the test log and the current test keywords;
Step 13012, determining the test log with the matching degree meeting the preset matching degree condition as the test log matched with the current test keyword.
The matching degree refers to the matching degree of the historical test keyword and the current test keyword. The historical test keywords in one test log can be multiple, the current test keywords can be multiple, and the matching degree is greater as the historical test keywords and the current test keywords overlap. Since the number of overlapping keywords naturally increases if the number of history test keywords and the number of current test keywords are larger, in one embodiment, the matching degree between the history test keywords in the test log and the current test keywords is equal to the number of keywords in the intersection of the history test keywords in the test log and the current test keywords divided by the number of keywords in the union of the history test keywords in the test log and the current test keywords. For example, the historical test keywords in the test log are "response", "speed", "accurate", the current test keyword is "response", "speed", "click", and the intersection of the two is "response", "speed", and there are 2 keywords. The union of the two is "response", "speed", "accurate", "stuck", and there are 4 keywords, 2/4=0.5, and then the matching degree=0.5. The matching degree algorithm has the advantages that the number of the overlapping of the historical test keywords and the current test keywords is considered, and the number of the overlapping of the historical test keywords and the current test keywords is considered, so that the matching degree of the historical test keywords and the current test keywords can be reflected more accurately.
The matching degree condition refers to a condition that the matching degree needs to be satisfied in order to determine that the historical test keyword is matched with the current test keyword.
In one embodiment, the predetermined match condition comprises: the matching degree is the largest.
In another embodiment, the predetermined match condition comprises: the degree of matching exceeds a predetermined degree of matching threshold. Since the degree of matching exceeds a predetermined degree of matching threshold, there may be multiple test logs matching. However, the objectivity of the matching determination can be improved by the way that the matching degree exceeds the preset matching degree threshold value.
The above-mentioned mode of searching for the test log matched with said current test keyword in the test log library does not consider the matching as long as there is a history test keyword matching with current test keyword in the test log, but consider the matching degree, has raised the accuracy of the test log found.
As shown in fig. 4, in one embodiment, step 1302 includes:
Step 13021, determining the occurrence times of each historical test index in the searched test log;
Step 13022, determining the historical test index whose appearance number meets the preset appearance number condition as the current test index.
Since one or more associated historical task test logs matching the current test keyword of the test target have been found in step 1301, there is a historical test index in each test log, so all the historical test indexes in all the found associated historical task test logs can be listed. And determining the occurrence times of each test index in all the searched associated historical task test logs. For example, 3 relevant historical task test logs matched with the current test keyword of the test target are found, wherein the first test log contains test indexes A, B, the second test log contains test indexes B, C, the third test log contains test indexes D, the occurrence number of the test indexes A in all the found test logs is 1, the occurrence number of the test indexes B in all the found test logs is 2, the occurrence number of the test indexes C in all the found test logs is 1, and the occurrence number of the test indexes D in all the found test logs is 1.
In one embodiment, the predetermined number of occurrences condition comprises: the number of occurrences is the largest. In another embodiment, the predetermined number of occurrences condition includes: the number of occurrences exceeds a predetermined number of occurrences threshold.
In step 140, the sample data corresponding to the current test index is put into the system before upgrading to obtain a first index value of the current test index, and the sample data is put into the system after upgrading to obtain a second index value of the current test index.
The sample data refers to data which is put into the data processing system to be tested and is used for analyzing the performance of the data processing system before and after upgrading. In the testing of a financial analysis system, the sample data may be operational data (e.g., a surge graph) of a financial asset (e.g., stock, securities). The index value may be a value of a current test index analyzed according to operation data of the financial asset, such as a holding rate, a rising and falling rate, etc. For example, the current test index is a holding rate, an rising and falling rate, or the like, the first index value is a holding rate, a rising and falling rate, or the like obtained by the system before upgrading, and the second index value is a holding rate, a rising and falling rate, or the like obtained by the system after upgrading. The sample data and the current test index may be corresponding, for example, when the current test index is a holding rate or a rising and falling rate, the sample data may be data information contained in a fluctuation graph corresponding to the holding rate or the rising and falling rate.
In step 150, a test result of the system is determined based on the first index value and the second index value.
As shown in fig. 5, when the current test index is a plurality of current test indexes, step 150 may include:
Step 1501, determining, for each current test index, whether differences between a first index value and a second index value of the current test index respectively satisfy predetermined conditions specific to the current test index;
Step 1502, if the difference between the first index value and the second index value of each current test index meets the predetermined condition specific to the current test index, the test result is that the test is passed, otherwise, the test result is that the test is not passed.
In one embodiment, the predetermined condition is: the difference between the first index value and the second index value of the current test index is less than a predetermined difference threshold value specific to the current test index. The predetermined difference threshold value specific to each current test indicator is different. For example, the predetermined difference threshold value specific to the holding rate and the predetermined difference threshold value specific to the rise and fall rate are certainly not the same, and therefore, it is necessary to consider whether or not the first index value and the second index value of the current test index are both smaller than the predetermined difference threshold value specific to the current test index, respectively. If the difference between the first index value and the second index value of each current test index meets the preset condition specific to the current test index, the test result is that the test is passed, otherwise, the test result is that the test is not passed.
As shown in fig. 6, according to one embodiment of the present disclosure, there is also provided a system testing apparatus including: the current test target obtaining module 610 is configured to obtain a current test target in response to receiving a test instruction for system upgrade; a current test keyword extraction module 620, configured to extract a current test keyword from a current test target; the current test index determining module 630 is configured to determine a current test index according to the current test keyword; the sample data operation module 640 is configured to input sample data corresponding to a current test index into a system before upgrading to obtain a first index value of the current test index, and input sample data into a system after upgrading to obtain a second index value of the current test index; the test result determining module 650 is configured to determine a test result of the system based on the first index value and the second index value.
In one exemplary embodiment of the present disclosure, the current test index determination module may include: the log searching unit is used for searching test logs matched with the current test keywords in the test log library, and each test log comprises a history test keyword extracted from a history test target in a history upgrading test and a corresponding history test index designated for the history test target; the index determining unit is used for determining the current test index according to the found historical test index in the test log.
In one exemplary embodiment of the present disclosure, the log finding unit may include: the matching degree determining subunit is used for determining the matching degree of the historical test keywords in each test log and the current test keywords in the test log aiming at each test log in the test log library; and the matching judgment subunit is used for determining the test log with the matching degree meeting the preset matching degree condition as the test log matched with the current test keyword.
In one exemplary embodiment of the present disclosure, the degree of matching of the historical test keywords and the current test keywords in the test log may be equal to the number of keywords in the intersection of the historical test keywords and the current test keywords in the test log divided by the number of keywords in the union of the historical test keywords and the current test keywords in the test log.
In one exemplary embodiment of the present disclosure, the index determination unit may include: the frequency counting subunit is used for determining the occurrence frequency of each historical test index in the searched test log; and the frequency judging subunit is used for determining the historical test index of which the frequency of occurrence meets the preset frequency of occurrence condition as the current test index.
In an exemplary embodiment of the present disclosure, when the current test index is a plurality of, the test result determining module may include: a condition judgment unit for determining, for each current test index, whether or not differences between first index values and second index values of the current test index respectively satisfy predetermined conditions specific to the current test index; and the test result acquisition unit is used for acquiring a test result if the difference between the first index value and the second index value of each current test index meets the preset condition specific to the current test index, and acquiring a test result if the difference meets the preset condition specific to the current test index, otherwise, acquiring a test result if the difference does not pass.
In an exemplary embodiment of the present disclosure, the predetermined condition may be: the difference between the first index value and the second index value of the current test index is less than a predetermined difference threshold value specific to the current test index.
The specific details of the above modules/units have been described in the corresponding method portion embodiments, and thus are not repeated here.
The exemplary embodiments of the present disclosure also provide an electronic device capable of implementing the above method.
Those skilled in the art will appreciate that the various aspects of the present disclosure may be implemented as a system, method, or program product. Accordingly, various aspects of the disclosure may be embodied in the following forms, namely: an entirely hardware embodiment, an entirely software embodiment (including firmware, micro-code, etc.) or an embodiment combining hardware and software aspects may be referred to herein as a "circuit," module "or" system.
An electronic device 700 according to such an exemplary embodiment of the present disclosure is described below with reference to fig. 7. The electronic device 700 shown in fig. 7 is merely an example and should not be construed to limit the functionality and scope of use of embodiments of the present disclosure in any way.
As shown in fig. 7, the electronic device 700 is embodied in the form of a general purpose computing device. Components of electronic device 700 may include, but are not limited to: the at least one processing unit 710, the at least one storage unit 720, a bus 730 connecting the different system components (including the storage unit 720 and the processing unit 710), and a display unit 740.
Wherein the storage unit stores program code that is executable by the processing unit 710 such that the processing unit 710 performs steps according to various exemplary embodiments of the present disclosure described in the above-described "exemplary methods" section of the present specification. For example, the processing unit 710 may perform the processes shown in fig. 1-5, etc.
The memory unit 720 may include readable media in the form of volatile memory units, such as Random Access Memory (RAM) 721 and/or cache memory 722, and may further include Read Only Memory (ROM) 723.
The storage unit 720 may also include a program/utility 724 having a set (at least one) of program modules 725, such program modules 725 including, but not limited to: an operating system, one or more application programs, other program modules, and program data, each or some combination of which may include an implementation of a network environment.
Bus 730 may be a bus representing one or more of several types of bus structures including a memory unit bus or memory unit controller, a peripheral bus, an accelerated graphics port, a processing unit, or a local bus using any of a variety of bus architectures.
The electronic device 700 may also communicate with one or more external devices 900 (e.g., keyboard, pointing device, bluetooth device, etc.), one or more devices that enable a user to interact with the electronic device 700, and/or any device (e.g., router, modem, etc.) that enables the electronic device 700 to communicate with one or more other computing devices. Such communication may occur through an input/output (I/O) interface 750. Also, electronic device 700 may communicate with one or more networks such as a Local Area Network (LAN), a Wide Area Network (WAN) and/or a public network, such as the Internet, through network adapter 760. As shown, network adapter 760 communicates with other modules of electronic device 700 over bus 730. It should be appreciated that although not shown, other hardware and/or software modules may be used in connection with electronic device 700, including, but not limited to: microcode, device drivers, redundant processing units, external disk drive arrays, RAID systems, tape drives, data backup storage systems, and the like.
From the above description of embodiments, those skilled in the art will readily appreciate that the example embodiments described herein may be implemented in software, or may be implemented in software in combination with the necessary hardware. Thus, the technical solutions according to the embodiments of the present disclosure may be embodied in the form of a software product, which may be stored in a non-volatile storage medium (may be a CD-ROM, a U-disk, a mobile hard disk, etc.) or on a network, including several instructions to cause a computing device (may be a personal computer, a server, a terminal device, or a network device, etc.) to perform the method according to the exemplary embodiments of the present disclosure.
Exemplary embodiments of the present disclosure also provide a computer readable storage medium having stored thereon a program product capable of implementing the method described above in the present specification. In some possible implementations, various aspects of the disclosure may also be implemented in the form of a program product comprising program code for causing a terminal device to carry out the steps according to the various exemplary embodiments of the disclosure as described in the "exemplary methods" section of this specification, when the program product is run on the terminal device.
Referring to fig. 8, a program product 800 for implementing the above-described method according to an exemplary embodiment of the present disclosure is described, which may employ a portable compact disc read only memory (CD-ROM) and include program code, and may be run on a terminal device, such as a personal computer. However, the program product of the present disclosure is not limited thereto, and in this document, a readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
The program product may employ any combination of one or more readable media. The readable medium may be a readable signal medium or a readable storage medium. The readable storage medium can be, for example, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or a combination of any of the foregoing. More specific examples (a non-exhaustive list) of the readable storage medium would include the following: an electrical connection having one or more wires, a portable disk, a hard disk, random Access Memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
The computer readable signal medium may include a data signal propagated in baseband or as part of a carrier wave with readable program code embodied therein. Such a propagated data signal may take any of a variety of forms, including, but not limited to, electro-magnetic, optical, or any suitable combination of the foregoing. A readable signal medium may also be any readable medium that is not a readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device.
Program code embodied on a readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.
Program code for carrying out operations of the present disclosure may be written in any combination of one or more programming languages, including an object oriented programming language such as Java, C++ or the like and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computing device, partly on the user's device, as a stand-alone software package, partly on the user's computing device, partly on a remote computing device, or entirely on the remote computing device or server. In the case of remote computing devices, the remote computing device may be connected to the user computing device through any kind of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or may be connected to an external computing device (e.g., connected via the Internet using an Internet service provider).
Furthermore, the above-described figures are only schematic illustrations of processes included in the method according to the exemplary embodiments of the present disclosure, and are not intended to be limiting. It will be readily appreciated that the processes shown in the above figures do not indicate or limit the temporal order of these processes. In addition, it is also readily understood that these processes may be performed synchronously or asynchronously, for example, among a plurality of modules.
It should be noted that although in the above detailed description several modules or units of a device for action execution are mentioned, such a division is not mandatory. Indeed, the features and functionality of two or more modules or units described above may be embodied in one module or unit in accordance with exemplary embodiments of the present disclosure. Conversely, the features and functions of one module or unit described above may be further divided into a plurality of modules or units to be embodied.
Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure disclosed herein. This application is intended to cover any adaptations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.
It is to be understood that the present disclosure is not limited to the precise arrangements and instrumentalities shown in the drawings, and that various modifications and changes may be effected without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.
Claims (7)
1. A system testing method, comprising:
responding to a test instruction for system upgrade, and acquiring a current test target;
extracting a current test keyword from the current test target, wherein the extracting the current test keyword comprises: word segmentation is carried out on the current test target; extracting words with specific parts of speech from the divided words; removing general words from the extracted words to obtain current test keywords;
determining a current test index according to the current test keyword;
inputting sample data corresponding to the current test index into a system before upgrading to obtain a first index value of the current test index, and inputting the sample data into the system after upgrading to obtain a second index value of the current test index;
Determining a test result of the system based on the first index value and the second index value;
wherein, the determining the current test index according to the current test keyword includes:
Determining the matching degree of the historical test keywords in each test log with the current test keywords aiming at each test log in a test log library; determining test logs with the matching degree meeting the preset matching degree condition as test logs matched with the current test keywords, wherein each test log comprises a history test keyword extracted from a history test target in a history upgrading test and a corresponding history test index designated for the history test target; the matching degree of the historical test keywords in the test log and the current test keywords is equal to the number of keywords in the intersection of the historical test keywords in the test log and the current test keywords divided by the number of keywords in the union of the historical test keywords in the test log and the current test keywords;
And determining the current test index according to the searched historical test index in the test log.
2. The method of claim 1, wherein determining the current test index based on the found historical test index in the test log comprises:
determining the occurrence times of each historical test index in the searched test log;
And determining the historical test index with the occurrence number meeting the preset occurrence number condition as the current test index.
3. The method of claim 1, wherein when the current test index is a plurality, the determining the test result of the system based on the first index value and the second index value comprises:
Determining, for each current test indicator, whether a difference between a first indicator value and a second indicator value of the current test indicator respectively meets a predetermined condition specific to the current test indicator;
If the difference between the first index value and the second index value of each current test index meets the preset condition specific to the current test index, the test result is that the test is passed, otherwise, the test result is that the test is not passed.
4. A method according to claim 3, wherein the predetermined condition is: the difference between the first index value and the second index value of the current test index is less than a predetermined difference threshold value specific to the current test index.
5. A system testing apparatus, comprising:
The current test target acquisition module is used for responding to the received test instruction for system upgrade to acquire a current test target;
The current test keyword extraction module is configured to extract a current test keyword from the current test target, where the extracting the current test keyword includes: word segmentation is carried out on the current test target; extracting words with specific parts of speech from the divided words; removing general words from the extracted words to obtain current test keywords;
The current test index determining module is used for determining a current test index according to the current test keyword;
The sample data operation module is used for inputting the sample data corresponding to the current test index into the system before upgrading to obtain a first index value of the current test index, and inputting the sample data into the system after upgrading to obtain a second index value of the current test index;
the test result determining module is used for determining a test result of the system based on the first index value and the second index value;
Wherein, the determining the current test index according to the current test keyword includes: determining the matching degree of the historical test keywords in each test log with the current test keywords aiming at each test log in a test log library; determining test logs with the matching degree meeting the preset matching degree condition as test logs matched with the current test keywords, wherein each test log comprises a history test keyword extracted from a history test target in a history upgrading test and a corresponding history test index designated for the history test target; the matching degree of the historical test keywords in the test log and the current test keywords is equal to the number of keywords in the intersection of the historical test keywords in the test log and the current test keywords divided by the number of keywords in the union of the historical test keywords in the test log and the current test keywords; and determining the current test index according to the searched historical test index in the test log.
6. An electronic device, comprising:
A processor; and
A memory for storing executable instructions of the processor;
wherein the processor is configured to perform the method of any of claims 1-4 via execution of the executable instructions.
7. A computer readable storage medium, on which a computer program is stored, characterized in that the computer program, when being executed by a processor, implements the method of any of claims 1-4.
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