CN109902006A - Automated testing method and device - Google Patents
Automated testing method and device Download PDFInfo
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- CN109902006A CN109902006A CN201910127069.3A CN201910127069A CN109902006A CN 109902006 A CN109902006 A CN 109902006A CN 201910127069 A CN201910127069 A CN 201910127069A CN 109902006 A CN109902006 A CN 109902006A
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Abstract
The invention discloses automated testing methods, comprising: obtains the facility information of Devices to test；According to the facility information, at least one test assignment compatible with the Devices to test is determined；According at least one described test assignment, the Devices to test is tested.Automated testing method and device disclosed by the invention can realize the matching of Devices to test and test assignment, the completion automatic testing process of high efficiency smart by obtaining test assignment compatible with the Devices to test.
Description
Technical field
The present invention relates to fields of automation technology, in particular to automated testing method and device.
Background technique
Automatic test is a kind of process for the behavioral test taking human as driving being converted into machine execution.In general, setting
After having counted test case and having passed through evaluation, test is executed as tester's regulation according to described in test case step by step,
Actual result is obtained compared with expected result.In the process, in order to save manpower, time or hardware resource, test is improved
Efficiency just introduces the concept of automatic test.In the fields such as conventional electronic devices and desktop operating system, automatic test at
For main means of testing and method.
When personal electronic equipments evolve to the Intelligent mobile equipment that smart phone is representative, the number of equipment to be tested
Amount increases substantially, changeless to be tested according to designed testing process, often because repeating a large amount of identical tests
Work and it is time-consuming, or because equipment to be tested occur it is abnormal go back continuance test due to cause danger, it is thus intelligentized to test ten
Divide necessity.
Summary of the invention
The embodiment of the invention provides automated testing methods and device, it is intended to which solution can not achieve intelligence in the prior art
The problem of changing test.In order to which some aspects of the embodiment to disclosure have a basic understanding, it is shown below simple general
It includes.The summarized section is not extensive overview, nor to determine key/critical component or describe the protection of these embodiments
Range.Its sole purpose is that some concepts are presented with simple form, in this, as the preamble of following detailed description.
In a first aspect, the embodiment of the invention provides a kind of automated testing methods, comprising:
Obtain the facility information of Devices to test；
According to the facility information, at least one test assignment compatible with the Devices to test is determined；
According at least one described test assignment, the Devices to test is tested.
Based on the method, as optional first embodiment, the facility information include the Devices to test at least
One is completed test assignment；
According to the facility information, at least one described test assignment compatible with the Devices to test is determined, comprising:
According to it is described at least one be completed test assignment, it is determining to it is described at least one the similar of test assignment is completed
Degree meets at least one described test assignment of similarity preset condition.
Based on the method, as optional second embodiment, the facility information includes the equipment of the Devices to test
Attribute information；
According to the facility information, at least one described test assignment compatible with the Devices to test is determined, comprising:
According to the device attribute information, the determining degree of correlation with the device attribute information meets degree of correlation preset condition
At least one described test assignment.
Based on the method, as optional 3rd embodiment, the facility information includes the equipment of the Devices to test
Attribute information；
According to the facility information, at least one described test assignment compatible with the Devices to test is determined, comprising:
According to the facility information, test equipment is completed for determining at least one to match with the facility information
Test assignment；
According to it is described at least one test equipment has been completed test assignment, determine at least one described test assignment.
Based on the method, as optional fourth embodiment, according at least one described test assignment, to described to be measured
Equipment is tested, comprising:
According at least one described test assignment, the Devices to test is tested and monitored.
The Devices to test is monitored as optional 5th embodiment based on the fourth embodiment, comprising:
The electricity of the Devices to test is monitored；
When monitoring the electricity of the Devices to test lower than power threshold, charge to the Devices to test.
The Devices to test is monitored as optional sixth embodiment based on the fourth embodiment, comprising:
The temperature of the Devices to test is monitored；
When the temperature for monitoring the Devices to test is higher than temperature threshold, temperature control behaviour is carried out to the Devices to test
Make.
The Devices to test is monitored as optional 7th embodiment based on the fourth embodiment, comprising:
The test assignment of the Devices to test is monitored；
When monitoring that the test assignment is not adapted with the Devices to test, the test assignment is terminated.
Second aspect, the embodiment of the invention provides a kind of automatic test devices, comprising:
Module is obtained, for obtaining the facility information of Devices to test；
Processing module, the facility information for being obtained according to the acquisition module, determination and the Devices to test phase
At least one test assignment of adaptation；
Test module, for according to the processing module determine described at least one test assignment, to be measured set to described
It is standby to be tested.
Based on described device, as optional first embodiment, described device further include:
Monitoring modular, for being monitored to the Devices to test.
Automated testing method and device disclosed by the embodiments of the present invention can mutually be fitted by obtaining with the Devices to test
The test assignment matched realizes the matching of Devices to test and test assignment, the completion automatic testing process of high efficiency smart.
It should be understood that above general description and following detailed description be only it is exemplary and explanatory, not
It can the limitation present invention.
Detailed description of the invention
The drawings herein are incorporated into the specification and forms part of this specification, and shows and meets implementation of the invention
Example, and be used to explain the principle of the present invention together with specification.
Fig. 1 is the flow chart of automated testing method in an exemplary embodiment；
Fig. 2 is the flow chart of automated testing method in an exemplary embodiment；
Fig. 3 is the flow chart of automated testing method in an exemplary embodiment；
Fig. 4 is the flow chart of automated testing method in an exemplary embodiment；
Fig. 5 is the electricity trend graph in an exemplary embodiment；
Fig. 6 is the block diagram of automatic test device in an exemplary embodiment.
Specific embodiment
The following description and drawings fully show specific embodiments of the present invention, to enable those skilled in the art to
Practice them.Embodiment only represents possible variation.Unless explicitly requested, otherwise individual components and functionality is optional, and
And the sequence of operation can change.The part of some embodiments and feature can be included in or replace other embodiments
Part and feature.The range of embodiment of the present invention includes the entire scope of claims and the institute of claims
There is obtainable equivalent.Herein, each embodiment can individually or generally be indicated that this is only with term " invention "
It is merely for convenience, and if in fact disclosing the invention more than one, it is not meant to automatically limit the range of the application
For any single invention or inventive concept.Herein, relational terms such as first and second and the like are used only for one
Entity, which is perhaps operated, to be distinguished and exists without requiring or implying between these entities or operation with another entity or operation
Any actual relationship or sequence.Moreover, the terms "include", "comprise" or its any other variant be intended to it is non-exclusive
Property include so that include a series of elements process, method or equipment not only include those elements, but also including
Other elements that are not explicitly listed.Each embodiment herein is described in a progressive manner, and each embodiment stresses
Be the difference from other embodiments, the same or similar parts in each embodiment may refer to each other.
In one exemplary embodiment, automated testing method can be used for intelligent terminal and smart machine, such as intelligence
The mobile intelligent terminals such as mobile phone, tablet computer, portable computer or other various types of smart machines, carry out automation survey
Examination.As shown in Figure 1, comprising:
S101, the facility information for obtaining Devices to test；
S102, according to the facility information, determine at least one test assignment compatible with the Devices to test；
S103, at least one test assignment according to, test the Devices to test.
The facility information of Devices to test may include test history information, illustratively, such as at least one of Devices to test
The information etc. of test assignment is completed；
The facility information of Devices to test can also include device attribute information, and device attribute information may include Devices to test
Hardware information and software information, illustratively, the central processing unit (Central of hardware information such as Devices to test
Processing Unit, CPU), graphics processor (Graphics Processing Unit, GPU), random access memory
Information such as (Random Access Memory, RAM), software information such as operating system (Operating System, OS), driving
The information such as program.
Test assignment may include test case, and test case (Test Case) is worked out for some special objective
One group of test input executes condition and expected results, to test some Program path or to verify whether to meet some specific
Demand.
Test case may include one or more testing procedures, and the logic flow for executing testing procedure.Example
Property, Fig. 2 shows an illustrative test cases, including multiple testing procedures and corresponding logic flow.
Different Devices to test can have different attributes, can also live through different test histories, and the present invention is real
Automated testing method disclosed in example is applied, can be realized to be measured by obtaining test assignment compatible with the Devices to test
The matching of equipment and test assignment, the completion automatic testing process of high efficiency smart.
In one exemplary embodiment, automated testing method can be used for intelligent terminal and smart machine, such as intelligence
The mobile intelligent terminals such as mobile phone, tablet computer, portable computer or other various types of smart machines, carry out automation survey
Examination.As shown in Figure 2, comprising:
Test assignment is completed in S201, at least one for obtaining Devices to test；
S202, according to it is described at least one be completed test assignment, it is determining with it is described at least one test assignment is completed
Similarity meet at least one described test assignment of similarity preset condition.
Test assignment is completed at least one described in S203, basis, tests the Devices to test.
In the present example embodiment, facility information includes that test assignment is completed at least one of Devices to test.
Each test assignment includes two dimensions of task label and task definition, and wherein task definition specifically executes
Block (block) and unit (unit).It is determining with it is described at least one the similarity of test assignment is completed when, can be directly right
Than the similarity rate of the task label of two test assignments, or can also the task definition to two tasks carry out subordinate sentence and
Percent similarity after participle, comparison subordinate sentence and participle.
According to determine similarity mode, similarity preset condition can be similarity rate preset threshold or default threshold
It is worth range, the preset threshold or preset threshold range of the percent similarity after being also possible to subordinate sentence and participle.It can be from meeting phase
In test assignment like degree preset condition, the optimal front three test assignment of ranking is selected, as distributing to equipment to be tested
Test assignment.
In one exemplary embodiment, automated testing method can be used for intelligent terminal and smart machine, such as intelligence
The mobile intelligent terminals such as mobile phone, tablet computer, portable computer or other various types of smart machines, carry out automation survey
Examination.As shown in Figure 3, comprising:
S301, the device attribute information for obtaining the Devices to test；
S302, expired according to the device attribute information of the Devices to test, determination and the degree of correlation of the device attribute information
At least one described test assignment of sufficient degree of correlation preset condition；
S303, at least one test assignment according to, test the Devices to test.
In the present example embodiment, optionally, believed according to test result collection and device attribute that test assignment is completed
Cease training multilayer neural network, obtain device attribute information to test result collection matrix relationship.The device attribute information is
For the input layer matrix X of neural computing, the test result collection is the output layer matrix Y for neural computing.
Then it is conducted again by the chain type of differential, calculates partial differential of the test result to device attribute information of failure, choosing influences to set
For attribute information highest or it is up to the corresponding test assignment of third, as at least one of Devices to test to be distributed to
Test assignment.
Lift a specific application example.
Assuming that there is more test equipment and the test result of test assignment to be completed, test equipment possesses equipment category
Property information 1 be Android version, attribute information 2 is rom version, and attribute information 3 is that bluetooth drives version, and each is completed
Test assignment has score, such as 80 points, and 90 points etc..Three device attribute informations are done into discrete type characteristic processing first
(one hot encoding), is transformed into (000001000), (00010000), and 01 vector as (001000) is stitched together
In conjunction with more test equipment just obtain the input matrix of a m*n, wherein m is that (i.e. more test equipment has been for data volume
Complete the test result collection of test assignment), n is obtained adduction after above-mentioned vector dimension split.N number of hidden layer is set, training
From input X matrix to the neural network of output result Y matrix (M*1), the coefficient matrix of available intermediate hidden layers.Finally ask
Inclined y can obtain the partial derivative (the differential chain type derivation for passing through middle coefficient matrix and activation primitive) of each single item attribute Xi
It is maximum to contribution of which device attribute information to test result.On this basis, if the goals for of test assignment is completed
It is very low, the reason for causing score very low can be calculated automatically, then the relevant test assignment that is completed will be distributed to this reason
Devices to test.
In one exemplary embodiment, automated testing method can be used for intelligent terminal and smart machine, such as intelligence
The mobile intelligent terminals such as mobile phone, tablet computer, portable computer or other various types of smart machines, carry out automation survey
Examination.As shown in Figure 4, comprising:
S401, the device attribute information for obtaining the Devices to test；
S402, according to the device attribute information, determine that at least one to match with the device attribute information has been surveyed
Test assignment is completed in examination equipment；
S403, according to it is described at least one test assignment has been completed in test equipment, determine at least one described test
Task；
S404, at least one test assignment according to, test the Devices to test.
In the present example embodiment, by finding the test equipment to match with the device attribute information of Devices to test
Test assignment is completed, for Devices to test be adapted to test assignment.
Optionally, from presetting database obtain device attribute information and test assignment matching matrix, to the matrix into
Row singular value decomposition dimensionality reduction, calculates the similarity of different test assignments on low-dimensional matrix, and then obtains each test assignment
Predict value matrix, finally to prediction value matrix be boosting, the weighting in result is done to existing positivity label, improve its
Appearance ratio in prediction model.
In three exemplary embodiments shown in Fig. 1 to Fig. 4, give three kinds according to the facility information it is determining with it is described
The mode of at least one compatible test assignment of Devices to test, these three modes represent three kinds of computation models, can also survey
During examination, summation is weighted to these three computation models, is determined to want device under test according to the result of weighted sum
At least one test assignment tested.The linear adduction of weighted sum asks logarithm (log) to sum it up two ways afterwards.
In the either exemplary embodiment shown in Fig. 1 to Fig. 4, at least one test assignment according to, to described
When Devices to test is tested, the Devices to test can be tested and be monitored according at least one described test assignment.
As an alternative embodiment, being monitored to the Devices to test, comprising:
The electricity of the Devices to test is monitored；
When monitoring the electricity of the Devices to test lower than power threshold, charge to the Devices to test.
Optionally, its electricity can be obtained by the debugging tool of Devices to test.For example, Devices to test is if it is Android
System then passes through the data such as the electricity of the available Devices to test of adb order and charging and discharging state.
Optionally, its electricity can also be obtained by the electricity data figure of Devices to test.For example, according to electricity data
Figure, and pass through the electricity of image recognition scheduling algorithm acquisition Devices to test.
Fig. 5 shows the electricity trend graph for obtaining the history information about power of Devices to test and carrying out curve fitting.Such as
The electricity of fruit Devices to test is in normal electricity tendency, then when being lower than 20%, device under test charges, and reaches in electricity
Stop charging when to 100%.If the electricity of Devices to test is in abnormal electricity tendency, started according to setting condition to be measured
Equipment charge.
The exception electricity tendency when typically occurring in the surge of short-term electricity consumption, is more common in game test, video card mode is surveyed
The test etc. under big consumption test, severe service environment under examination, charging situation.Power curve is walked according to abnormal electricity, calculates prison
Differential when survey obtains electric quantity consumption rate, when electric quantity consumption rate is more than given threshold, starts device under test charging.
As another optional embodiment, the Devices to test is monitored, comprising:
The temperature of the Devices to test is monitored；
When the temperature for monitoring the Devices to test is higher than temperature threshold, temperature control behaviour is carried out to the Devices to test
Make.
It can connect temperature sense piece on Devices to test, the temperature number of Devices to test obtained by the temperature sense piece
According to.
When the temperature of Devices to test is higher than temperature threshold, temperature control operation may include that analysis causes temperature to rise
Reason and at least one of the measure for executing reduction temperature.
The several of the temperature control operation are exemplified below:
1, the screen of Devices to test is captured, working condition is recorded；
2, it checks whether to charge, the port of the relay if there is then disconnecting charging；
3, check the active process quantity of Devices to test and the ratio of each process committed memory, close memory accounting it is high and
Non-key process；
4, the part kernel in Devices to test CPU is closed.
Optionally, the citing 1 to 4 can be sequentially executed, and records the temperature change after executed in setting time and deposits
Enter temperature profile, the most apparent measure of simultaneous selection cooling effect is pushed to tester.
After the temperature profile library runs up to certain amount, it can be used for training corresponding deep learning network parameter,
Use device attribute information plus cooling measure as X variable, the result that cools down is used as Y variable, Devices to test appearance in follow-up test
After similar monitoring temperature situation, high temperature reason can be provided immediately directly according to deep learning model parameter, and preferentially for height
Warm reason executes cooling measure.
Further, it when the temperature of Devices to test is higher than the dangerous values of setting, can be surveyed in the interface prompts of Devices to test
Examination personnel stop test assignment shutdown, the port of the relay of charging are simultaneously switched off, if further also passing through smog alarm
Device detects smog, then alarms to tester.
As the third optional embodiment, the Devices to test is monitored, comprising:
The test assignment of the Devices to test is monitored；
When monitoring that the test assignment is not adapted with the Devices to test, the test assignment is terminated.
After distributing same test assignment to large batch of same model Devices to test, obtained test result all indicate it is same
Problem is distributed same test assignment with model Devices to test to other again at this time, can be taken a substantial amount of time, and do not anticipate
Justice.Not being adapted here, which refers to pass through test results monitored and carry out statistics, calculates study, finds the above problem, and terminates and survey
Trial business, or no longer the test assignment is distributed with model Devices to test to other.
Fig. 6 is the block diagram of automatic test device in an exemplary embodiment, and described device includes: to obtain module 61, place
Manage module 62 and test module 63.
Module 61 is obtained, for obtaining the facility information of Devices to test.
Processing module 62, the facility information for being obtained according to the acquisition module 61 are determining to be measured to set with described
At least one standby compatible test assignment.
Test module 63, for according to the processing module 62 determine described at least one test assignment, to it is described to
Measurement equipment is tested.
Automatic test device disclosed in the present exemplary embodiment, can be compatible with the Devices to test by obtaining
Test assignment realizes the matching of Devices to test and test assignment, the completion automatic testing process of high efficiency smart.
Optionally, the modules in automatic test device, can be according to either method shown in Fig. 1 to Fig. 4 above
Process executes operation.
It optionally, can also include monitoring modular in automatic test device, the monitoring modular is used for described to be measured
Equipment is monitored.Likewise, the monitoring modular can carry out electricity, temperature or test according to previously described detection method
The monitoring of task.
It should be understood that the invention is not limited to the process and structure that are described above and are shown in the accompanying drawings,
And various modifications and changes may be made without departing from the scope thereof.The scope of the present invention is limited only by the attached claims.
Claims (10)
1. a kind of automated testing method, comprising:
Obtain the facility information of Devices to test；
According to the facility information, at least one test assignment compatible with the Devices to test is determined；
According at least one described test assignment, the Devices to test is tested.
2. the method as described in claim 1, which is characterized in that the facility information includes at least one of the Devices to test
Test assignment is completed；
According to the facility information, at least one described test assignment compatible with the Devices to test is determined, comprising:
According to it is described at least one be completed test assignment, it is determining with it is described at least one be completed test assignment similarity it is full
At least one described test assignment of sufficient similarity preset condition.
3. the method as described in claim 1, which is characterized in that the facility information includes the device attribute of the Devices to test
Information；
According to the facility information, at least one described test assignment compatible with the Devices to test is determined, comprising:
According to the device attribute information, the determining degree of correlation with the device attribute information meets the institute of degree of correlation preset condition
State at least one test assignment.
4. the method as described in claim 1, which is characterized in that the facility information includes the device attribute of the Devices to test
Information；
According to the facility information, at least one described test assignment compatible with the Devices to test is determined, comprising:
According to the facility information, test is completed in test equipment for determining at least one to match with the facility information
Task；
According to it is described at least one test equipment has been completed test assignment, determine at least one described test assignment.
5. the method as described in claim 1, which is characterized in that according at least one described test assignment, to be measured set to described
It is standby to be tested, comprising:
According at least one described test assignment, the Devices to test is tested and monitored.
6. method as claimed in claim 5, which is characterized in that be monitored to the Devices to test, comprising:
The electricity of the Devices to test is monitored；
When monitoring the electricity of the Devices to test lower than power threshold, charge to the Devices to test.
7. method as claimed in claim 5, which is characterized in that be monitored to the Devices to test, comprising:
The temperature of the Devices to test is monitored；
When the temperature for monitoring the Devices to test is higher than temperature threshold, temperature control operation is carried out to the Devices to test.
8. method as claimed in claim 5, which is characterized in that be monitored to the Devices to test, comprising:
The test assignment of the Devices to test is monitored；
When monitoring that the test assignment is not adapted with the Devices to test, the test assignment is terminated.
9. a kind of automatic test device, comprising:
Module is obtained, for obtaining the facility information of Devices to test；
Processing module, the facility information for being obtained according to the acquisition module, determination are adapted with the Devices to test
At least one test assignment；
Test module, for according to the processing module determine described at least one test assignment, to the Devices to test into
Row test.
10. device as claimed in claim 9, which is characterized in that described device further include:
Monitoring modular, for being monitored to the Devices to test.
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| CN201910127069.3A CN109902006A (en) | 2019-02-20 | 2019-02-20 | Automated testing method and device |
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| CN113342683A (en) * | 2021-06-29 | 2021-09-03 | 深圳前海微众银行股份有限公司 | Test case processing method, device, platform and storage medium |
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Application publication date: 20190618 |