CN109900363A - A kind of object infrared measurement of temperature method and apparatus based on contours extract - Google Patents
A kind of object infrared measurement of temperature method and apparatus based on contours extract Download PDFInfo
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- 238000000034 method Methods 0.000 title claims abstract description 41
- 239000000284 extract Substances 0.000 title claims abstract description 36
- 238000005259 measurement Methods 0.000 title claims abstract description 28
- 238000000605 extraction Methods 0.000 claims abstract description 17
- 239000011159 matrix material Substances 0.000 claims abstract description 17
- 230000002596 correlated effect Effects 0.000 claims abstract description 8
- 238000012545 processing Methods 0.000 claims description 11
- 238000009529 body temperature measurement Methods 0.000 claims description 6
- 230000000875 corresponding effect Effects 0.000 claims description 6
- 238000004590 computer program Methods 0.000 claims description 3
- 230000002708 enhancing effect Effects 0.000 claims description 3
- 238000010191 image analysis Methods 0.000 abstract description 3
- 238000004458 analytical method Methods 0.000 description 4
- 230000009466 transformation Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000013475 authorization Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000002329 infrared spectrum Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/13—Edge detection
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/181—Segmentation; Edge detection involving edge growing; involving edge linking
Abstract
The present invention relates to art of image analysis, especially a kind of object infrared measurement of temperature method and apparatus based on contours extract.Object is detected according to infrared measurement of temperature equipment, obtains Temperature Distribution dot matrix；Image outline extraction is carried out, at least two profiles in entire infrared image are obtained；Some pixel is chosen in entire infrared image, the innermost layer profile comprising the pixel is determined according to the pixel chosen, which is objective contour；Obtain the correlated temperature data of the infrared image in objective contour.By carrying out image outline extraction to Temperature Distribution dot matrix, obtain at least two profiles, using the innermost layer profile comprising certain pixel as objective contour, it avoids the useless pixel in part and the phenomenon that pixel that in profile or part is useful is placed in except profile is entered by frame, improve the displaying precision of Temperature Distribution details in infrared measurement of temperature.
Description
Technical field
The present invention relates to art of image analysis, especially a kind of object infrared measurement of temperature method and dress based on contours extract
It sets.
Background technique
With application of the infrared temperature-test technology in evaluating status of electric power, assessment accuracy how is effectively improved, at
For emphasis concerned by people.In infrared measurement of temperature image, the temperature distribution information of heating region has weight to evaluating status of electric power
The reference value wanted, in infared spectrum, the detailed information of Temperature Distribution is abundanter, and it is bigger to obtain reference value to status assessment,
It therefore, include more temperature as much as possible during image is shown how in the case where infrared temperature resolution ratio is certain
Distribution detailed information is the emphasis of infrared spectrum processing.
In power equipment infrared measurement of temperature image analysis, relies on rectangle frame manually is carried out to image-region of interest at present
Label, program analyze the temperature information in rectangle frame, but because rectangle frame cannot need to pay close attention to area completely with equipment
The profile in domain agrees with, and the pixel (temperature spot) for causing part useless is set to by the pixel (temperature spot) that frame enters or part is useful
Except box, impact analysis result.Moreover, disclosing one in the Chinese patent document that Authorization Notice No. is CN105277282B
Kind temperature checking method, wherein be related to the setting means of a temperature region to be measured, directly by most bright or most dark region
Be set as temperature region to be measured, similarly there is the above problem in the division mode of this temperature region to be measured, can not completely with need
It wants the profile of region-of-interest to agree with, i.e., can not mutually agree with target area, the pixel (temperature spot) for causing part useless is drawn
It assigns to the useful pixel (temperature spot) of temperature region to be measured or part to be placed in except temperature region to be measured, impact analysis knot
Fruit.
Summary of the invention
The object infrared measurement of temperature method and apparatus based on contours extract that the object of the present invention is to provide a kind of, to solve
Existing profile division methods cannot need the profile for paying close attention to thermometric region to agree with object completely, lead to the picture that part is useless
Vegetarian refreshments enters the pixel that in profile or part is useful by frame and is placed in except profile, causes asking for biggish temperature detection error
Topic.
In order to realize infrared measurement of temperature, solving existing profile division methods cannot need to pay close attention to temperature measuring area completely with object
The profile in domain agrees with, the pixel for causing part useless by frame enter the pixel that in profile or part is useful be placed in profile it
Outside, the problem of causing biggish temperature detection error.The present invention provides a kind of object infrared measurement of temperature side based on contours extract
Method, comprising the following steps:
(1) object is detected according to infrared measurement of temperature equipment, obtains Temperature Distribution dot matrix；
(2) image outline extraction is carried out, at least two profiles in entire infrared image are obtained；
(3) some pixel is chosen in entire infrared image, is determined according to the pixel chosen comprising the pixel
The innermost layer profile of point, which is objective contour；
(4) correlated temperature data of the infrared image in objective contour is obtained.
Beneficial effect is, by carrying out image outline extraction to Temperature Distribution dot matrix, to obtain at least two profiles, will include
The innermost layer profile of certain pixel avoids that the useless pixel in part is entered in profile by frame or part is useful as objective contour
Pixel the phenomenon that being placed in except profile, improve the displaying precision of Temperature Distribution details in infrared measurement of temperature, and calculate
Pay close attention to the Temperature Distribution major parameter in area equipment profile, it will help power equipment operation maintenance personnel is according to image
The temperature distribution information reflected carries out more accurately assessment and judgement to status of electric power.
Further, for the ease of and quickly carry out image outline extraction, between step (1) and (2) also following steps:
Image grayscale processing is carried out to the temperature data of Temperature Distribution dot matrix, obtains corresponding gray value；In step (2), according to gray scale
Value carries out image outline extraction, to obtain at least two profiles.
Further, in order to be accurately obtained image outline, in step (2), the process that image outline extracts includes:
1) threshold value that binaryzation is calculated according to profiling temperatures, obtains contours extract operator；
2) by contours extract operator, Binarization methods is carried out, at least two profiles are obtained.
Further, in order to accurately obtain the temperature data in objective contour, in step (4), the temperature in objective contour
The acquisition process of data includes: first to carry out linear transformation to gray value again in objective contour, is increased using algorithm for image enhancement
The contrast of pixel in strong profile, then processing obtains the related data of Temperature Distribution in objective contour.
The present invention by a kind of object infrared temperature measurement apparatus based on contours extract, including memory, processor and
The computer program that can be run in memory and on a processor is stored, the processor is realized following when executing described program
Step:
(1) object is detected according to infrared measurement of temperature equipment, obtains Temperature Distribution dot matrix；
(2) image outline extraction is carried out, at least two profiles in entire infrared image are obtained；
(3) the innermost layer wheel comprising the pixel is determined according to some pixel chosen in entire infrared image
Exterior feature, which is objective contour；
(4) correlated temperature data for obtaining the infrared image in objective contour, by carrying out image to Temperature Distribution dot matrix
Contours extract obtains at least two profiles, using the innermost layer profile comprising certain pixel as objective contour, avoid part without
Pixel enters the phenomenon that pixel that in profile or part is useful is placed in except profile by frame, improves in infrared measurement of temperature
The displaying precision of Temperature Distribution details, and the Temperature Distribution major parameter paid close attention in area equipment profile is calculated,
It is more quasi- to status of electric power progress to will be helpful to the temperature distribution information that power equipment operation maintenance personnel reflects according to image
True assessment and judgement.
Further, for the ease of and quickly carry out image outline extraction, the step of the device between (1) and (2) also
Following steps: image grayscale processing is carried out to the temperature data of Temperature Distribution dot matrix, obtains corresponding gray value；In step (2),
Image outline extraction is carried out according to gray value, to obtain at least two profiles.
Further, in order to be accurately obtained image outline, the step of the device in (2), process packet that image outline extracts
It includes:
1) threshold value that binaryzation is calculated according to profiling temperatures, obtains contours extract operator；
2) by contours extract operator, Binarization methods is carried out, at least two profiles are obtained.
Further, in order to accurately obtain the temperature data in objective contour, the step of the device in (4), objective contour
The acquisition process of interior temperature data includes: first to carry out linear transformation to gray value again in objective contour, is increased using image
Strong algorithms enhance the contrast of pixel in profile, and then processing obtains the related data of Temperature Distribution in objective contour.
Detailed description of the invention
Fig. 1 is a kind of main flow chart of object infrared measurement of temperature method based on contours extract of the invention；
Fig. 2 is the process of contouring process in a kind of object infrared measurement of temperature method based on contours extract of the invention
Figure.
Specific embodiment
Embodiment of the method
The present invention will be further described in detail with reference to the accompanying drawing, and object therein is by taking power equipment as an example,
Certainly, which is not limited to power equipment, is also possible to other equipment or object that need to carry out infrared measurement of temperature.
The present invention provides a kind of object infrared measurement of temperature method based on contours extract, as shown in Figure 1, including following step
It is rapid:
(1) object is detected according to infrared measurement of temperature equipment, obtains Temperature Distribution dot matrix.
(2) image outline extraction is carried out, at least two profiles in entire infrared image are obtained.
(3) some pixel is chosen in entire infrared image, is determined according to the pixel chosen comprising the pixel
The innermost layer profile of point, which is objective contour.
(4) correlated temperature data of the infrared image in objective contour is obtained.
Temperature Distribution point can be obtained in conjunction with existing algorithm and technology in (1)-step (4) through the above steps
Battle array, and then carry out image outline extraction and avoid part finally using the innermost layer profile comprising certain pixel as objective contour
Useless pixel enters the phenomenon that pixel that in profile or part is useful is placed in except profile by frame.
Wherein, the operation that some pixel is chosen in entire infrared image can be artificially, be also possible to pass through it
He chooses means.The present invention uses the pixel according to analysis personnel selection, extracts the profile of the innermost layer comprising pixel
As objective contour, wherein the outline data is the pixel coordinate of one group of closure.
For the process in above method step, concrete implementation process is as follows:
1, object is detected according to infrared measurement of temperature equipment, obtains Temperature Distribution dot matrix.
2, image grayscale processing is carried out to the temperature data of Temperature Distribution dot matrix, obtains corresponding gray value.
3, image outline extraction is carried out according to gray value, obtains at least two profiles in entire infrared image.
In order to be accurately obtained image outline, as shown in Fig. 2, the process that image outline extracts includes:
1) threshold value that binaryzation is calculated according to profiling temperatures, obtains contours extract operator；
2) by contours extract operator, Binarization methods is carried out, at least two profiles are obtained.
Specific Binarization methods and contouring process are as follows:
The first step successively calculates the gray value and itself gray value of the pixel of the pixel of 8 neighborhoods around pixel
Difference absolute value；
Second step, if 8 absolute values are respectively less than binarization threshold, which is set to 255, other feelings
Condition, the pixel gray value are set to 0 (as profile point)；
Third step, after completing all pixels point binaryzation, the pixel that retrieval gray value is 0, as profile point set；
4th step obtains more than two closure edge profiles using edge closure technology.
4, some pixel is chosen in entire infrared image, is determined according to the pixel chosen comprising the pixel
Innermost layer profile, which is objective contour.
According to the target pixel points coordinate of analysis personnel selection, first is retrieved from inside to outside centered on the pixel
Closure edge, the pixel which is included are objective contour pixel point set.
5, the correlated temperature data of the infrared image in objective contour is obtained.
The acquisition process of temperature data in objective contour includes: first to carry out linearly to gray value again in objective contour
Transformation, using the contrast of pixel in algorithm for image enhancement enhancing profile, then processing obtains Temperature Distribution in objective contour
Related data be included by profile pixel and infrared temperature distribution dot matrix in corresponding coordinate point original temperature value pair
It should get up, obtain the major parameter of Temperature Distribution in objective contour.
Installation practice
The present invention by a kind of object infrared temperature measurement apparatus based on contours extract, including memory, processor and
The computer program that can be run in memory and on a processor is stored, processor performs the steps of when executing program
(1) object is detected according to infrared measurement of temperature equipment, obtains Temperature Distribution dot matrix；
(2) image outline extraction is carried out, at least two profiles in entire infrared image are obtained；
(3) the innermost layer wheel comprising the pixel is determined according to some pixel chosen in entire infrared image
Exterior feature, which is objective contour；
(4) correlated temperature data of the infrared image in objective contour is obtained.
The step of specific each section, is illustrated in above method embodiment, and details are not described herein.
Specific embodiment of the present invention is presented above, but the present invention is not limited to described embodiment.
The technological means in above-described embodiment is converted by the way of being readily apparent that those skilled in the art, is replaced,
Modification, and play the role of with the present invention in relevant art means it is essentially identical, realization goal of the invention it is also essentially identical,
The technical solution formed in this way is to be finely adjusted to be formed to above-described embodiment, and this technical solution still falls within protection of the invention
In range.
Claims (8)
1. a kind of object infrared measurement of temperature method based on contours extract, which comprises the following steps:
(1) object is detected according to infrared measurement of temperature equipment, obtains Temperature Distribution dot matrix；
(2) image outline extraction is carried out, at least two profiles in entire infrared image are obtained；
(3) some pixel is chosen in entire infrared image, is determined according to the pixel chosen comprising the pixel
Innermost layer profile, which is objective contour；
(4) correlated temperature data of the infrared image in objective contour is obtained.
2. the object infrared measurement of temperature method according to claim 1 based on contours extract, which is characterized in that step (1)
(2) there are also following steps between: carrying out image grayscale processing to the temperature data of Temperature Distribution dot matrix, obtains corresponding gray scale
Value；In step (2), image outline extraction is carried out according to gray value, to obtain at least two profiles.
3. the object infrared measurement of temperature method according to claim 2 based on contours extract, which is characterized in that step (2)
In, the process that image outline extracts includes:
1) threshold value that binaryzation is calculated according to profiling temperatures, obtains contours extract operator；
2) by contours extract operator, Binarization methods is carried out, at least two profiles are obtained.
4. the object infrared measurement of temperature method according to claim 2 or 3 based on contours extract, which is characterized in that step
(4) in, the acquisition process of the temperature data in objective contour includes: first linearly to be become to gray value again in objective contour
It changes, using the contrast of pixel in algorithm for image enhancement enhancing profile, then processing obtains Temperature Distribution in objective contour
Related data.
5. a kind of object infrared temperature measurement apparatus based on contours extract, including memory, processor and it is stored in memory
In and the computer program that can run on a processor, which is characterized in that the processor is realized following when executing described program
Step:
(1) object is detected according to infrared measurement of temperature equipment, obtains Temperature Distribution dot matrix；
(2) image outline extraction is carried out, at least two profiles in entire infrared image are obtained；
(3) the innermost layer profile comprising the pixel is determined according to some pixel chosen in entire infrared image,
The innermost layer profile is objective contour；
(4) correlated temperature data of the infrared image in objective contour is obtained.
6. the object infrared temperature measurement apparatus according to claim 5 based on contours extract, which is characterized in that step (1)
(2) there are also following steps between: carrying out image grayscale processing to the temperature data of Temperature Distribution dot matrix, obtains corresponding gray scale
Value；In step (2), image outline extraction is carried out according to gray value, to obtain at least two profiles.
7. the object infrared temperature measurement apparatus according to claim 6 based on contours extract, which is characterized in that step (2)
In, the process that image outline extracts includes:
1) threshold value that binaryzation is calculated according to profiling temperatures, obtains contours extract operator；
2) by contours extract operator, Binarization methods is carried out, at least two profiles are obtained.
8. the object infrared temperature measurement apparatus according to claim 6 or 7 based on contours extract, which is characterized in that step
(4) in, the acquisition process of the temperature data in objective contour includes: first linearly to be become to gray value again in objective contour
It changes, using the contrast of pixel in algorithm for image enhancement enhancing profile, then processing obtains Temperature Distribution in objective contour
Related data.
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| CN201910001911.9A CN109900363A (en) | 2019-01-02 | 2019-01-02 | A kind of object infrared measurement of temperature method and apparatus based on contours extract |
| PCT/CN2019/128769 WO2020140826A1 (en) | 2019-01-02 | 2019-12-26 | Infrared temperature sensing method employing contour extraction for target object, device, and storage medium |
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Application publication date: 20190618 |