CN109900213A - A kind of sensor circuit detecting sun-proof frost thickness - Google Patents
A kind of sensor circuit detecting sun-proof frost thickness Download PDFInfo
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- CN109900213A CN109900213A CN201910204357.4A CN201910204357A CN109900213A CN 109900213 A CN109900213 A CN 109900213A CN 201910204357 A CN201910204357 A CN 201910204357A CN 109900213 A CN109900213 A CN 109900213A
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- circuit
- control circuit
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Abstract
The invention discloses a kind of sensor circuits for detecting sun-proof frost thickness, including UV generation and control circuit, UV Photoelectric Detection and control circuit, micro-current magnification circuit, microprocessor and auxiliary circuit, the UV is generated and control circuit is electrically connected with microprocessor, and is controlled by microprocessor;The UV Photoelectric Detection and control circuit are electrically connected with micro-current magnification circuit, and micro-current magnification circuit is electrically connected with microprocessor;Auxiliary circuit is electrically connected with microprocessor, is powered to entire circuit;Optical filter is connected at the UV generation and control circuit and UV Photoelectric Detection and control circuit.There is the present invention solution user to measure whether suncream is smeared at smearing position when using suncream, and smearing thickness is how many, so that user reaches the advantages of avoiding by ultraviolet ray burn using suncream.
Description
Technical field
The present invention relates to UV detection field of circuit technology, specially a kind of sensor electricity for detecting sun-proof frost thickness
Road.
Background technique
Ultraviolet light refers to the light of sunlight medium wavelength 10 nanometers to 400 nanometers (nm), can be divided into UVA (ultraviolet light,long wave, wavelength
320~400 nanometers, long wave), UVB (280~320 nanometers of wavelength, medium wave), UVC (100~280 nanometers of wavelength, shortwave).UVA
Carcinogenicity is most strong, and sunburn and sunburn effect are 1000 times of UVB.UVC can be obstructed by ozone layer.Ultraviolet light irradiation can allow skin
A large amount of free radicals are generated, the peroxidization of cell membrane is caused, so that melanocyte is generated more melanin, and be up distributed
To horny layer of epidermis, black splotch is caused.Ultraviolet light can be described as causing the greastest element of wrinkle of skin, aging, relaxation and blackspot
It is fierce.
Injury for ultraviolet light to skin, people (are referred to be added to and can obstruct or absorb ultraviolet light by using suncream
Sun-screening agent come reach prevent skin by it is tanned, sunburn cosmetics.) prevent burning for solar ultraviolet, but sometimes
Smear it is uneven or smear it is too thin cause suncream preventive effect be deteriorated even without with these situations are nothings by naked eyes
Method judgement.
Summary of the invention
The purpose of the present invention is to provide a kind of sensor circuits for detecting sun-proof frost thickness, have solution user and are using
Measure whether suncream is smeared at smearing position when suncream, smearing thickness is how many, so that user is reached using suncream
To the advantages of avoiding by ultraviolet ray burn, solving the uneven of suncream smearing or that smears too thin cause suncream to prevent
Effect is deteriorated even without with the problem of can not visually judging.
To achieve the above object, the invention provides the following technical scheme: a kind of sensor circuit for detecting sun-proof frost thickness,
Including UV generate and control circuit, UV Photoelectric Detection and control circuit, micro-current magnification circuit, microprocessor and auxiliary circuit,
The UV is generated and control circuit is electrically connected with microprocessor, and is controlled by microprocessor;The UV Photoelectric Detection and control
Circuit processed is electrically connected with micro-current magnification circuit, and micro-current magnification circuit is electrically connected with microprocessor;Auxiliary circuit and micro process
Device electrical connection, powers to entire circuit;Optical filtering is connected at the UV generation and control circuit and UV Photoelectric Detection and control circuit
Piece.
Preferably, the UV generate and control circuit under control of the microprocessor, UV generate and control circuit in two
Pole pipe is generated and transmitted by the UVB (medium wave erythemal effect ultraviolet light, wavelength 290320nm) of different illumination intensity, passes through optical filter
It is radiated at tested region.
Preferably, the UV Photoelectric Detection and control circuit are made of a highly sensitive UVB receiving sensor, benefit
, according to different intensities of illumination, line is generated when there is UVB light to be radiated in UVB receiving sensor with the photoelectric characteristic of semiconductor
Property variation micro-current.
Preferably, the micro-current magnification circuit using import high-precision, Low-offset drift, low noise operation put
Big device is constituted.
Preferably, the microprocessor uses 8 single-chip microcontrollers of STMicw Electronics, carries 10 moduluses inside single-chip microcontroller
Converter is used for data processing and quantization.
Compared with prior art, beneficial effects of the present invention are as follows: a kind of sensor circuit detecting sun-proof frost thickness, when
After suncream is smeared in skin detection region, by the control of microprocessor, UV is generated and control circuit is constantly with the shape of pulse
Formula generates the UVB light of different illumination intensity, and UV Photoelectric Detection and control circuit, which are received, reflected UVB by suncream separate absorption
Light, and processing is amplified by micro-current magnification circuit, it is sent into microprocessor and carries out calculating the UVB light after isolation in real time
It is compared according to the corresponding measured value of intensity, and with measured value in the case where no smearing suncream, while passing through increase
Optical filter eliminates external visible light to the interference effect of UV Photoelectric Detection and control circuit, and combines the fitting of software algorithm, obtains
The smearing thickness of suncream out.Fast, the high advantage of accuracy with measurement reaction speed.
Detailed description of the invention
Fig. 1 is that circuit module of the invention links schematic diagram;
Fig. 2 is UV generation and control circuit schematic diagram of the invention;
Fig. 3 is UV Photoelectric Detection and control circuit schematic diagram of the invention.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall within the protection scope of the present invention.
In the description of the present invention, it should be noted that term " on ", "lower", "inner", "outside" " front end ", " rear end ",
The orientation or positional relationship of the instructions such as " both ends ", " one end ", " other end " is to be based on the orientation or positional relationship shown in the drawings, only
It is that for the convenience of describing the present invention and simplifying the description, rather than the device or element of indication or suggestion meaning must have specifically
Orientation is constructed and operated in a specific orientation, therefore is not considered as limiting the invention.In addition, term " first ", " the
Two " are used for descriptive purposes only and cannot be understood as indicating or suggesting relative importance.
In the description of the present invention, it should be noted that unless otherwise clearly defined and limited, term " installation " " is set
Be equipped with ", " connection " etc., shall be understood in a broad sense, such as " connection ", may be a fixed connection, may be a detachable connection or one
Connect to body;It can be mechanical connection, be also possible to be electrically connected;It can be directly connected, it can also be indirect by intermediary
It is connected, can be the connection inside two elements.For the ordinary skill in the art, on being understood with concrete condition
State the concrete meaning of term in the present invention.
It please refers to Fig.1 to Fig.3, a kind of embodiment provided by the invention: a kind of sensor circuit detecting sun-proof frost thickness,
Including UV generate and control circuit, UV Photoelectric Detection and control circuit, micro-current magnification circuit, microprocessor and auxiliary circuit,
Optical filter, the diode in UV generation and control circuit are connected at UV generation and control circuit and UV Photoelectric Detection and control circuit
The UVB light of generation is radiated at tested region by optical filter, and optical filter can effectively inhibit visible light to entire measurement detection system
The interference effect of system improves the accuracy of measurement data.UV is generated and control circuit is electrically connected with microprocessor, and by micro process
Device is controlled, and under control of the microprocessor, the diode in UV generation and control circuit generates for UV generation and control circuit
And emit the UVB (medium wave erythemal effect ultraviolet light, wavelength 290320nm) of different illumination intensity, UV Photoelectric Detection and control electricity
Road is made of a highly sensitive UVB receiving sensor, using the photoelectric characteristic of semiconductor, when there is UVB light to be radiated at UVB
In receiving sensor, according to different intensities of illumination, the micro-current of linear change is generated, UV is generated and control circuit selects purple
UV light-emitting diode, the light emitting diode is controlled and microprocessor.By the technical data of the light emitting diode, microprocessor is logical
The mode of extra pulse control controls the generation and transmitting of ultraviolet light.UV Photoelectric Detection and control circuit are selected and above-mentioned UV is generated and
The ultraviolet receiving sensor of light emitting diode co-wavelength used in control circuit.Same controlled and microprocessor.Light emitting diode
The ultraviolet light of sending is irradiated to region to be measured by visible filter, special to the absorption of ultraviolet light or scattering using suncream
Property, the UVB light after reflection is by entering ultraviolet light receiving sensor after visible filter, so that it is big to export corresponding light intensity
Small current value.UV Photoelectric Detection and control circuit are electrically connected with micro-current magnification circuit, and micro-current magnification circuit uses import
In high precision, Low-offset drift, low noise operational amplifier constitute, the electric current generated from UV Photoelectric Detection and control circuit
Be worth it is fainter, microprocessor is directly to be handled and be quantified, then high-precision, Low-offset drift, low noise fortune
It calculates amplifier MAX4238 and I/V conversion and enhanced processing is carried out to weak current, increase stability, the reliability of data acquisition.It is micro-
Current amplification circuit is electrically connected with microprocessor, and microprocessor uses 8 single-chip microcontrollers of STMicw Electronics, and single-chip microcontroller inside is certainly
10 analog-digital converters of band are used for data processing and quantization, and the signal that single-chip microcontroller amplifies amplifying circuit quantifies, while root
According to external instrument (UV LIGHT METER UV340B) analogue measurement, algorithm amendment optimization is carried out.Auxiliary circuit and microprocessor
Electrical connection, auxiliary circuit connect built-in power, power to entire circuit.Working principle: first by using external instrument (UV
LIGHT METER UV340B) it is strong to the illumination of the UVB light of the ultraviolet LED transmitting in UV generation and control circuit
It is P0 that degree initial value, which carries out test quantization light intensity after optical filter, is radiated at the tested region for not smearing suncream by reflection
Data measured is P1 afterwards, is P2 with the reflectance data that UV Photoelectric Detection and control circuit are tested, will by a large amount of detection calibration
Data are stored in microprocessor, similarly continue to test after smearing suncream, and microprocessor carries out data analysis and process, from
And realize the measurement of sun-proof frost thickness.
A specific embodiment presented below:
Embodiment 1
Shown in referring to Fig.1, the present invention provides a kind of sensor circuits for detecting sun-proof frost thickness, including UV is generated and control
Circuit processed, the circuit connection to microprocessor, is controlled by micro process;Simultaneously include UV Photoelectric Detection and control circuit,
The circuit connection will measure small-signal to micro-current magnification circuit, the micro-current magnification circuit connection to microprocessor
It amplifies and send to micro process and carry out processing quantization;Further include auxiliary circuit, provide power supply for system, human-computer interaction phase is provided
Climax circuit etc.;It further include an optical filter, for eliminating the external interference effect to UV photoelectric detective circuit.UV generation circuit
UV LED is selected, the sensor is controlled and microprocessor, as shown in Figure 2.It is micro- by the technical data of the sensor
Processor controls the generation and transmitting of ultraviolet light by pulse controlled mode.UV Photoelectric Detection and control circuit are selected and above-mentioned
The ultraviolet receiving sensor of sensor co-wavelength used in UV generation circuit.Same controlled and microprocessor.Emission sensor hair
Ultraviolet light out is irradiated to region to be measured by visible filter, the absorption or scattering properties using suncream to ultraviolet light,
UVB light after reflection is by entering ultraviolet light receiving sensor after visible filter, to export corresponding light intensity magnitude
Current value, as shown in Figure 3.The weak current of above-mentioned generation, microprocessor is directly to be handled and be quantified, then high
Precision, Low-offset drift, low noise operational amplifier MAX4238 to faint circuit carry out I/V conversion and enhanced processing,
Increase stability, the reliability of data acquisition.Data processing quantifies 8 single-chip microcontrollers that circuit uses STMicw Electronics, inside
10 analog-digital converters are carried, the signal that single-chip microcontroller amplifies amplifying circuit quantifies, while according to external instrument (UV
LIGHT METER UV340B) analogue measurement, carry out algorithm amendment optimization.In order to reach the accuracy of measurement, first by making
With external instrument (UV LIGHT METER UV340B) to the UVB light of the ultraviolet LED transmitting in UV generation circuit
Intensity of illumination initial value carry out test quantization after optical filter light intensity be P0, be radiated at the tested region for not smearing suncream
Data measured is P1 after reflection, is P2 with the reflectance data that UV photoelectric detective circuit is tested, by a large amount of detection calibration,
Data are stored in micro process, similarly continue largely to test after smearing suncream, microprocessor carries out data analysis and place
Reason, to realize the measurement of sun-proof frost thickness.
It is obvious to a person skilled in the art that invention is not limited to the details of the above exemplary embodiments, Er Qie
In the case where without departing substantially from spirit or essential attributes of the invention, the present invention can be realized in other specific forms.Therefore, no matter
From the point of view of which point, the present embodiments are to be considered as illustrative and not restrictive, and the scope of the present invention is by appended power
Benefit requires rather than above description limits, it is intended that all by what is fallen within the meaning and scope of the equivalent elements of the claims
Variation is included within the present invention.Any reference signs in the claims should not be construed as limiting the involved claims.
Claims (5)
1. a kind of sensor circuit for detecting sun-proof frost thickness, including UV is generated and control circuit, UV Photoelectric Detection and control electricity
Road, micro-current magnification circuit, microprocessor and auxiliary circuit, it is characterised in that: the UV generation and control circuit and micro process
Device electrical connection, and controlled by microprocessor;The UV Photoelectric Detection and control circuit are electrically connected with micro-current magnification circuit,
Micro-current magnification circuit is electrically connected with microprocessor;Auxiliary circuit is electrically connected with microprocessor, is powered to entire circuit;The UV
Optical filter is connected at generation and control circuit and UV Photoelectric Detection and control circuit.
2. a kind of sensor circuit for detecting sun-proof frost thickness according to claim 1, it is characterised in that: the UV is generated
And control circuit is under control of the microprocessor, the diode in UV generation and control circuit is generated and transmitted by different illumination intensity
UVB (medium wave erythemal effect ultraviolet light, wavelength 290320nm), tested region is radiated at by optical filter.
3. a kind of sensor circuit for detecting sun-proof frost thickness according to claim 1, it is characterised in that: the UV photoelectricity
Detection and control circuit are made of a highly sensitive UVB receiving sensor, using the photoelectric characteristic of semiconductor, when having
UVB light is radiated in UVB receiving sensor, according to different intensities of illumination, generates the micro-current of linear change.
4. a kind of sensor circuit for detecting sun-proof frost thickness according to claim 1, it is characterised in that: the micro-current
Amplifying circuit using import high-precision, Low-offset drift, low noise operational amplifier constitute.
5. a kind of sensor circuit for detecting sun-proof frost thickness according to claim 1, it is characterised in that: the micro process
Device uses 8 single-chip microcontrollers of STMicw Electronics, carries 10 analog-digital converters inside single-chip microcontroller, is used for data processing and amount
Change.
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CN201910204357.4A CN109900213A (en) | 2019-03-18 | 2019-03-18 | A kind of sensor circuit detecting sun-proof frost thickness |
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CN201910204357.4A CN109900213A (en) | 2019-03-18 | 2019-03-18 | A kind of sensor circuit detecting sun-proof frost thickness |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN114543692A (en) * | 2022-04-27 | 2022-05-27 | 深圳市脉度科技有限公司 | Sunscreen detector, detection device and method |
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WO2015163875A1 (en) * | 2014-04-24 | 2015-10-29 | Halliburton Energy Services, Inc. | Engineering the optical properties of an integrated computational element by ion implantation |
CN105806806A (en) * | 2016-05-12 | 2016-07-27 | 河南省日立信股份有限公司 | TDLAS based escaped ammonia concentration detection device and method |
CN108195317A (en) * | 2017-12-15 | 2018-06-22 | 中国航空工业集团公司成都飞机设计研究所 | A kind of detection method of aircraft intake and exhaust grid cell rib thickness and the depth of parallelism |
CN207717037U (en) * | 2017-11-23 | 2018-08-10 | 淮阴师范学院 | A kind of film thickness detecting device |
CN108693567A (en) * | 2018-07-02 | 2018-10-23 | 南京信息职业技术学院 | A kind of suncream smears detector and its detection method |
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Publication number | Priority date | Publication date | Assignee | Title |
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WO2015163875A1 (en) * | 2014-04-24 | 2015-10-29 | Halliburton Energy Services, Inc. | Engineering the optical properties of an integrated computational element by ion implantation |
CN105806806A (en) * | 2016-05-12 | 2016-07-27 | 河南省日立信股份有限公司 | TDLAS based escaped ammonia concentration detection device and method |
CN207717037U (en) * | 2017-11-23 | 2018-08-10 | 淮阴师范学院 | A kind of film thickness detecting device |
CN108195317A (en) * | 2017-12-15 | 2018-06-22 | 中国航空工业集团公司成都飞机设计研究所 | A kind of detection method of aircraft intake and exhaust grid cell rib thickness and the depth of parallelism |
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Application publication date: 20190618 |