CN109884036A - A kind of sampling method using microelement in inductive coupling plasma emission spectrograph measurement quartz - Google Patents
A kind of sampling method using microelement in inductive coupling plasma emission spectrograph measurement quartz Download PDFInfo
- Publication number
- CN109884036A CN109884036A CN201910173910.2A CN201910173910A CN109884036A CN 109884036 A CN109884036 A CN 109884036A CN 201910173910 A CN201910173910 A CN 201910173910A CN 109884036 A CN109884036 A CN 109884036A
- Authority
- CN
- China
- Prior art keywords
- quartz
- ptfe
- polytetrafluoroethylene
- microelement
- tungsten
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
The present invention relates to a kind of sampling methods using microelement in inductively coupled plasma emission spectrography measurement quartz.Quartz is placed on self-control tungsten-molybdenum alloy plate, being tapped first with self-control tungsten-molybdenum alloy hammer keeps it broken, the preferably quartzy fragment of sizeable mass ratio is clamped with polytetrafluoroethylene (PTFE) clip again to be put into self-control tungsten grinding alms bowl, then continue to break into pieces and be ground to grinding rod sizeable powdered, finally take appropriate powder sample to be put into polytetrafluoroethylene (PTFE) counteracting tank with polytetrafluoroethylene (PTFE) spoon and carry out the analysis operation of lower step.Detection method sample processing time is short, and test result is accurate, reliable, can more embody the true value of microelement in quartz.
Description
Technical field
The present invention relates to analysis and testing technology fields, are related to a kind of application inductively coupled plasma emission spectrography survey
Determine the sampling method of microelement in quartz.
Background technique
Microelement mainly applies inductive coupling plasma emission spectrograph to be analyzed in quartz at present.Wherein stone
Diamond stone sampling method is broken into pieces after quartz is mainly printed blank sheet of paper package with common A4 with iron hammer, the quartz sand that then will be broken into pieces
It is placed on the sieve of certain mesh number and sieves, the silica flour sieved is put into evaporating dish and is repeatedly rinsed with deionized water, is put into
Drying in oven 4 hours, other analysis operations were carried out afterwards.Since the detection limit of microelement in quartz reaches mg/Kg grades, pole
There is the distortion of result vulnerable to external pollution.
Since the hardness of quartz is 7 and quality is hard, and the hardness of common iron hammer is lower than 7 and quality is soft, thus with
Iron hammer inevitably can occupy iron filings on the surface of quartz sand when tapping, and be difficult letter with this iron filings being adhered to above quartz sand
It is applied alone deionized water to rinse well.
If it is also possible to remaining shredded paper, cannot guarantee that and rinsed well with deionized water inside the quartz sand broken into pieces,
It is more serious to the damage ratio of the conventional elements such as potassium, sodium, it is also difficult to be rinsed well with deionized water.Besides sieve itself is metal
Silk establishment, and sieve itself is also cleared up not completely, and the residual of sample can bring pollution to sample is being analyzed.
Traditional sampling method can seriously affect micro- in Inductively coupled plasma optical emission spectrometer analysis quartz in summary
The authenticity of secondary element result, false testing result serious person are possible to that serious warp can be brought to quartz sand manufacturing enterprise
Ji loss.
Summary of the invention
In view of the deficiencies of the prior art, the present invention provides a kind of application inductively coupled plasma emission spectrographies to measure stone
The sampling method of microelement in diamond stone, to improve reliability, the accuracy of testing result.
The present invention is that technical solution used by solving its technical problem is:
1, a kind of sampling method using micro impurity element in inductive coupling plasma emission spectrograph analysis quartz, packet
Include following steps:
(1) quartz is placed on self-control tungsten-molybdenum alloy plate, being tapped with self-control tungsten-molybdenum alloy hammer keeps it broken;
(2) the preferably quartzy fragment of sizeable mass ratio is clamped with polytetrafluoroethylene (PTFE) clip be put into self-control tungsten grinding alms bowl
In, continue to break into pieces and be ground to grinding rod sizeable powdered;
(3) it takes appropriate powder sample to be put into polytetrafluoroethylene (PTFE) counteracting tank with polytetrafluoroethylene (PTFE) spoon and carries out lower step analysis operation.
2, compared with prior art, the present invention has following clear advantage:
(1) present invention sufficiently analyzes client to the statistics of the normal demand type of quartz microelement, finds to tungsten and two kinds of molybdenum
The no demand of the analysis of element, so not having to consider pollution of the tungsten to sample in sampling process;
(2) quartzy hardness is 7 or so and quality is crisp, and the hardness of tungsten-molybdenum alloy is up to 20 or more and hard, uses tungsten
Alloy is easy to quartz to break into pieces, does not have the surface that tungsten clast is adhered to quartz gravel, so not having to consider tungsten
Influence of the element to test result;
(3) present invention does not have to sieve, avoids pollution of the residual of sieve itself and other samples to sample;
(4) this method does not need to rinse using deionized water, dries without baking oven, so shortening the sample preparation time, reduces
The time of entire testing process, detection efficiency is improved, the probability that external environment pollutes sample is reduced.
Specific embodiment
Following non-limiting embodiments can with a person of ordinary skill in the art will more fully understand the present invention, but not with
Any mode limits the present invention.
Embodiment 1
1,2,3,4, No. 5 each two parts of quartz are taken, a copy of it is placed on iron plate after being wrapped with common A4 printing paper, is struck with iron hammer
It is broken, it pours into sieve and is sieved, the quartz sand of sieving stays on A4 paper, pours into evaporating dish, and baking is put into after being cleaned with deionized water
It is dried in case, following steps are in strict accordance with microelement in laboratory inductive coupling plasma emission spectrograph measurement quartz
Method carry out operation and upper machine analyze, obtain test result 1.Another is handled using this method, first with self-control tungsten hammer certainly
It is knocked open on tungsten plate processed, then knocks high-quality quartz gravel open with one piece of the clamping of polytetrafluoroethylene (PTFE) clip and be put into self-control tungsten conjunction
In gold grinding alms bowl, finally continues to break quartz gravel into pieces with tungsten-molybdenum alloy grinding rod and be ground into the suitable powder of granular size, with
Lower step is carried out in strict accordance with the method for microelement in laboratory inductive coupling plasma emission spectrograph measurement quartz
It operates and upper machine is analyzed, obtain test result 2.The common elements test result comparison that corresponding two kinds of method for making sample analyze is shown in Table 1.
1 quartz sample common elements test data result table of table
Obtain the value of microelement in quartz than the quartz that conventional method obtains using the method for the present invention as can be seen from Table 1
The value of microelement is generally wanted small in stone, it was demonstrated that and detection method sample processing time is short, and test result is accurate, reliable,
The true value of microelement in quartz can more be embodied.
Claims (4)
1. a kind of sampling method using microelement in inductive coupling plasma emission spectrograph measurement quartz, feature
It is to include the following steps:
(1) quartz is placed in alloy sheets, being tapped with alloy hammer keeps it broken;
(2) it is put into grinding alms bowl, is used positioned at the preferable fragment disease of mass ratio in quartz fragment with clip clamping is sizeable
Grinding rod continues to break quartz wedge into pieces and is ground to the suitable powder of granular size;
(3) it takes appropriate quartz powder to be put into polytetrafluoroethylene (PTFE) counteracting tank with spoon, carries out next step analysis step behaviour.
2. the method according to claim 1, which is characterized in that alloy sheets described in step (1) are self-control tungsten-molybdenum alloy
Plate, alloy hammer are that tungsten-molybdenum alloy is hammered into shape.
3. the method according to claim 1, which is characterized in that clip described in step (2) is polytetrafluoroethylene (PTFE) clip,
Grinding alms bowl is that self-control tungsten-molybdenum alloy grinds alms bowl, and grinding rod is tungsten-molybdenum alloy grinding rod.
4. the method according to claim 1, which is characterized in that clip described in step (3) is polytetrafluoroethylene (PTFE) clip.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910173910.2A CN109884036A (en) | 2019-03-08 | 2019-03-08 | A kind of sampling method using microelement in inductive coupling plasma emission spectrograph measurement quartz |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910173910.2A CN109884036A (en) | 2019-03-08 | 2019-03-08 | A kind of sampling method using microelement in inductive coupling plasma emission spectrograph measurement quartz |
Publications (1)
Publication Number | Publication Date |
---|---|
CN109884036A true CN109884036A (en) | 2019-06-14 |
Family
ID=66931254
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201910173910.2A Pending CN109884036A (en) | 2019-03-08 | 2019-03-08 | A kind of sampling method using microelement in inductive coupling plasma emission spectrograph measurement quartz |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN109884036A (en) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101576497A (en) * | 2009-03-06 | 2009-11-11 | 刘征涛 | Plasma emission spectrum detection method of content of platinum, palladium and rhodium in ceramic materials |
CN104062285A (en) * | 2014-07-15 | 2014-09-24 | 南京市产品质量监督检验院 | Determination method for contents of calcium, aluminum and silicon elements in solid surface materials |
CN204038032U (en) * | 2014-07-31 | 2014-12-24 | 中国恩菲工程技术有限公司 | Polysilicon automatic pulverizing packaging facilities |
CN106591715A (en) * | 2016-11-15 | 2017-04-26 | 营口龙辰矿山车辆制造有限公司 | Wear-resisting alloy hammer head and preparation method thereof |
CN108181373A (en) * | 2018-01-02 | 2018-06-19 | 江苏中宜金大分析检测有限公司 | A kind of method of 12 kinds of metallic elements in measure soils and sediments |
CN108940577A (en) * | 2018-03-28 | 2018-12-07 | 滁州方大矿业发展有限公司 | A kind of manufacture craft of the silica flour of ceramic tile |
CN109142018A (en) * | 2018-07-12 | 2019-01-04 | 昆山鸿福泰环保科技有限公司 | A kind of method of the quick measurement containing rhodium content in rhodium material |
-
2019
- 2019-03-08 CN CN201910173910.2A patent/CN109884036A/en active Pending
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101576497A (en) * | 2009-03-06 | 2009-11-11 | 刘征涛 | Plasma emission spectrum detection method of content of platinum, palladium and rhodium in ceramic materials |
CN104062285A (en) * | 2014-07-15 | 2014-09-24 | 南京市产品质量监督检验院 | Determination method for contents of calcium, aluminum and silicon elements in solid surface materials |
CN204038032U (en) * | 2014-07-31 | 2014-12-24 | 中国恩菲工程技术有限公司 | Polysilicon automatic pulverizing packaging facilities |
CN106591715A (en) * | 2016-11-15 | 2017-04-26 | 营口龙辰矿山车辆制造有限公司 | Wear-resisting alloy hammer head and preparation method thereof |
CN108181373A (en) * | 2018-01-02 | 2018-06-19 | 江苏中宜金大分析检测有限公司 | A kind of method of 12 kinds of metallic elements in measure soils and sediments |
CN108940577A (en) * | 2018-03-28 | 2018-12-07 | 滁州方大矿业发展有限公司 | A kind of manufacture craft of the silica flour of ceramic tile |
CN109142018A (en) * | 2018-07-12 | 2019-01-04 | 昆山鸿福泰环保科技有限公司 | A kind of method of the quick measurement containing rhodium content in rhodium material |
Non-Patent Citations (3)
Title |
---|
党陈萍: "脉石英加工4N8标准级髙纯石英试验研究", 《中国优秀博硕士学位论文全文数据库(硕士)工程科技Ⅰ辑》, 15 June 2018 (2018-06-15), pages 1 - 2 * |
蔡明招 主编: "《实用工业分析》", 31 August 1999, 华南理工大学出版社, pages: 32 * |
陈懋弘 等著: "《四川呷村-有热VMS型银多金属矿区矿床模型和成矿预测》", 31 October 2014, 地质出版社, pages: 82 - 85 * |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Taylor et al. | Evaluating the precision of Pb isotope measurement by mass spectrometry | |
Liu et al. | Precise U–Pb zircon dating at a scale of< 5 micron by the CAMECA 1280 SIMS using a Gaussian illumination probe | |
Yang et al. | Precise micrometre-sized Pb-Pb and U-Pb dating with NanoSIMS | |
Georgakopoulou et al. | Development and calibration of a WDXRF routine applied to provenance studies on archaeological ceramics | |
CN109884036A (en) | A kind of sampling method using microelement in inductive coupling plasma emission spectrograph measurement quartz | |
CN109239179A (en) | The measuring method of trace impurity in a kind of high purity aluminium oxide polycrystal material | |
CN109030462A (en) | Different type inclusion area and the quantitatively characterizing method of content in a kind of steel | |
CN113899763A (en) | Method for detecting and analyzing small-size nonmetallic inclusions in steel by using scanning electron microscope | |
Jevremović et al. | Raspberry bushy dwarf virus: A grapevine pathogen in Serbia | |
WO2012051813A1 (en) | Method for determining boron isotopic composition with positive thermal ionization mass spectrometer by static double-collection | |
CN110927195A (en) | Quantitative analysis method for trace phase | |
Malaviarachchi et al. | Electron microprobe dating of Monazites from Sri Lanka: implications on multiple thermal events related to Gondwana | |
von der Handt et al. | Quantitative EPMA of nitrogen in silicate glasses | |
Hu et al. | NanoSIMS imaging method of zircon U-Pb dating | |
Cui et al. | Direct Determination of Trace Iodine in Geological Samples by Solid Sampling Electrothermal Vaporization-Inductively Coupled Plasma Mass Spectrometry | |
CN105486707A (en) | Quantitative fluorescence analysis method for cobalt-based alloy | |
Yuan et al. | Rapid recognition and quantitative analysis of niobium minerals by scanning electron microscopy/energy dispersive X-ray spectroscopy | |
CN114295603A (en) | Method for simultaneously determining contents of multiple elements in aluminum alloy | |
CN106596611A (en) | Analysis method of precipitated phase in high-temperature alloy | |
CN117405466A (en) | Sample preparation method for detecting and analyzing trace metal impurity elements in quartz stone | |
CN114371186B (en) | Method for overcoming particle size effect of alloy element measured by XRF powder tabletting method | |
CN105445221A (en) | NIR (near infrared spectrum) analysis device and method for large-particle material | |
JP2003016989A (en) | Plasma cone for inductively coupled plasma mass spectrometer, and inductively coupled plasma mass spectrometer | |
Xuan et al. | Determination of Trace Elements in Nickel-based High-temperature Alloy by High Resolution Plasma Mass Spectrometry | |
Makishima et al. | Precise measurement of 228 Ra/226 Ra for 226 Ra determination employing total integration and simultaneous 228 Th correction by multicollector ICP-MS using multiple ion counters |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination |