CN109870599A - A kind of high low-resistance test device of automatic conversion - Google Patents
A kind of high low-resistance test device of automatic conversion Download PDFInfo
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- CN109870599A CN109870599A CN201910138450.XA CN201910138450A CN109870599A CN 109870599 A CN109870599 A CN 109870599A CN 201910138450 A CN201910138450 A CN 201910138450A CN 109870599 A CN109870599 A CN 109870599A
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- resistance test
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- high low
- automatic conversion
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Abstract
The present invention provides a kind of high low-resistance test devices of automatic conversion, including central control unit；The central control unit connection control relay switch control unit, LCD display unit and resistance test voltage generating unit, resistance test voltage generating unit connects resistance test circuit unit as the power supply of resistance test circuit unit, and the connection of relay switch control unit controls the on-off of branch in resistance test circuit unit；Central control unit connects resistance test circuit unit and receives the result value of resistance test circuit unit, and result value is sent to LCD display unit and is shown.The present invention is based on modular designs, effectively increase the applicability and scalability of system；The operation is stable, high degree of automation, the testing time is short, can effectively promote testing efficiency, reliability and safety.
Description
Technical field
The present invention relates to a kind of high low-resistance test devices of automatic conversion.
Background technique
Currently, high and low resistance test device is opened by resistance test voltage generating unit, resistance test circuit unit, wave band
Control unit, numeral method unit composition are closed, by rotating the generation of wave band switch control low-resistance and high resistant test voltage, and
Tested pilot is accessed into corresponding test circuit.
Existing high and low resistance test device, test method is cumbersome, and reliability is not high, be easy to cause test maloperation；Wave band
The operation repeatedly of switch, reduces the service life of test device, increases maintenance cost.
Summary of the invention
In order to solve the above technical problems, the present invention provides a kind of high low-resistance test device of automatic conversion, the automatic conversion
High low-resistance test device can effectively promote testing efficiency, reliability and safety.
The present invention is achieved by the following technical programs.
The high low-resistance test device of a kind of automatic conversion provided by the invention, including central control unit；The center control
Unit connection control relay switch control unit, LCD display unit and resistance test voltage generating unit, resistance test voltage
Unit connection resistance test circuit unit is generated as the power supply of resistance test circuit unit, the connection of relay switch control unit controls
The on-off of branch in resistance test circuit unit；Central control unit connects resistance test circuit unit and receives resistance test circuit
The result value of unit, and result value is sent to LCD display unit and is shown.
The central control unit is also connected with serial data communication unit, is externally led to by serial data communication unit
Letter.
The resistance test circuit unit is made of switching circuit and resistance test circuit, and resistance test circuit turns for A/D
Parallel operation draws multi-channel test branch, and switching circuit is that the switch control test branch is arranged on each test branch road of extraction
On-off.
Switch in the switching circuit is controlled by relay switch control unit and is opened and closed.
The A/D converter that A/D converter in the resistance test circuit unit is three and half.
The A/D converter is the MAX140 of MAXIM company.
The central control unit is FPGA.
The central control unit is the Virtex-4 series of X C4VSX35 chip of Xilinx company.
The beneficial effects of the present invention are: it is based on modular design, effectively increases the applicability of system and expansible
Property；The operation is stable, high degree of automation, the testing time is short, can effectively promote testing efficiency, reliability and safety.
Detailed description of the invention
Fig. 1 is connection schematic diagram of the invention；
Fig. 2 is the connection schematic diagram of resistance test circuit unit and relay switch control unit in Fig. 1.
Specific embodiment
Be described further below technical solution of the present invention, but claimed range be not limited to it is described.
A kind of high low-resistance test device of automatic conversion as shown in Figure 1, including central control unit；The center control is single
Member connection control relay switch control unit, LCD display unit and resistance test voltage generating unit, resistance test voltage produce
Raw unit connection resistance test circuit unit is the power supply of resistance test circuit unit, relay switch control unit connection control electricity
The on-off of branch in resistance test circuit unit；Central control unit connects resistance test circuit unit and receives resistance test circuit list
The result value of member, and result value is sent to LCD display unit and is shown.
The central control unit is also connected with serial data communication unit, is externally led to by serial data communication unit
Letter.
As shown in Fig. 2, the resistance test circuit unit is made of switching circuit and resistance test circuit, resistance test electricity
Road is that A/D converter draws multi-channel test branch, and switching circuit is that a switch control is arranged on each test branch road of extraction
The on-off of the test branch；Switch in switching circuit is controlled by relay switch control unit and is opened and closed.
Further, the A/D converter that the A/D converter in the resistance test circuit unit is three and half；Specifically,
A/D converter is the MAX140 of MAXIM company.
The central control unit is FPGA；Specifically, central control unit is the Virtex-4 series of Xilinx company
XC4VSX35 chip.
The present invention can send control instruction by serial data communication unit and control to center after booting powers on as a result,
Unit；In measurement process, needing constantly to switch the Measurement channel of measured signal, measured signal is no by access measuring circuit, by
The on off operating mode of corresponding relay switch determines that relay control unit just decides the state of switching on-off.It will be by
It surveys signal and accesses resistance test circuit, test result gives central control unit and carries out processing interpretation, and final result is sent
To LCD screen, display is on a corresponding position.
From the point of view of personnel's work angle, in test process, after measured signal accesses the present apparatus, tester passes through man-machine friendship
Mutual interface carries out test parameter setting, selects low-resistance or high resistant test pattern as needed, and software sends order control output and surveys
It tries voltage to generate, and executes corresponding control program, control relay work, the Measurement channel for being automatically performed measured signal is cut
It changes, acquires, handles, shows test result.
A/D converter is the core of entire resistance test circuit unit, it is one three and half A/D converter, conversion
The MAX140 of device model MAXIM company, the converter use biproduct parting A/D conversion regime, add an automatic zero set rank
Section is with the imbalance of compensating buffer and integrator, and there are one nil products stage by stage to guarantee to transfinite to convert rapid recovery.The conversion
Device, which carries, carries out digital collection to simulation resistance value signal, and the digital signal after acquisition after central control unit is handled, is incited somebody to action again
As a result it is sent to data storage and display unit.
FPGA is the core devices of entire control unit in central control unit, it carry the processing to digital signal with
And the control of peripheral logic.FPGA has selected XC4VSX35 chip in the Virtex-4 series of Xilinx company in the present invention,
The chip has 34560 logic units, 15360 Slices, 192 XtremeDSP Slices, 192 18Kb Block
RAM, 8 DCM, 4 PMCDs, 11 I/O Banks and 448 users can use foot.The hardware resource of the device is fully able to full
The requirement of our systems of foot, and there is certain surplus；PROM has selected the special XCF16PVO48 chip of Xilinx company, main to use
To store FPGA configurator；EEPROM has selected the 24LC32 of MICROCHIP company, which is 32Kbit, mainly
For storing information.
The present invention can execute corresponding control instruction according to different test requests as a result,.After test starting, controller
Corresponding instruction code is executed, is realized to other units such as resistance test voltage generating unit, relay switch control units
Control, and the data of acquisition are handled.
Claims (8)
1. a kind of high low-resistance test device of automatic conversion, including central control unit, it is characterised in that: the central control unit
Connection control relay switch control unit, LCD display unit and resistance test voltage generating unit, resistance test voltage generate
Unit connects resistance test circuit unit as the power supply of resistance test circuit unit, and the connection of relay switch control unit controls resistance
Test the on-off of branch in circuit unit；Central control unit connects resistance test circuit unit and receives resistance test circuit unit
Result value, and result value is sent to LCD display unit and is shown.
2. the high low-resistance test device of automatic conversion as described in claim 1, it is characterised in that: the central control unit also connects
It is connected to serial data communication unit, passes through serial data communication unit correspondence with foreign country.
3. the high low-resistance test device of automatic conversion as described in claim 1, it is characterised in that: the resistance test circuit unit
It is made of switching circuit and resistance test circuit, resistance test circuit is that A/D converter draws multi-channel test branch, switching circuit
For the on-off that the switch control test branch is arranged on each test branch road of extraction.
4. the high low-resistance test device of automatic conversion as claimed in claim 3, it is characterised in that: opening in the switching circuit
It closes, is controlled and opened and closed by relay switch control unit.
5. the high low-resistance test device of automatic conversion as claimed in claim 3, it is characterised in that: the resistance test circuit unit
In A/D converter be three and half A/D converter.
6. the high low-resistance test device of automatic conversion as claimed in claim 5, it is characterised in that: the A/D converter is MAXIM
The MAX140 of company.
7. the high low-resistance test device of automatic conversion as described in claim 1, it is characterised in that: the central control unit is
FPGA。
8. the high low-resistance test device of automatic conversion as claimed in claim 7, it is characterised in that: the central control unit is
The Virtex-4 series of X C4VSX35 chip of Xilinx company.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910138450.XA CN109870599A (en) | 2019-02-25 | 2019-02-25 | A kind of high low-resistance test device of automatic conversion |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910138450.XA CN109870599A (en) | 2019-02-25 | 2019-02-25 | A kind of high low-resistance test device of automatic conversion |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109870599A true CN109870599A (en) | 2019-06-11 |
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ID=66919182
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910138450.XA Pending CN109870599A (en) | 2019-02-25 | 2019-02-25 | A kind of high low-resistance test device of automatic conversion |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202600101U (en) * | 2012-03-20 | 2012-12-12 | 燕山大学 | Insulated wire testing device |
| CN103777111A (en) * | 2014-01-24 | 2014-05-07 | 惠州三星电子有限公司 | Engineering automation short circuit and/or open circuit test method |
| CN104849556A (en) * | 2015-04-23 | 2015-08-19 | 国家电网公司 | Direct current resistance test system for transformer winding |
| CN105890474A (en) * | 2016-04-05 | 2016-08-24 | 贵州航天电子科技有限公司 | Intelligent fuse safety testing device |
-
2019
- 2019-02-25 CN CN201910138450.XA patent/CN109870599A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN202600101U (en) * | 2012-03-20 | 2012-12-12 | 燕山大学 | Insulated wire testing device |
| CN103777111A (en) * | 2014-01-24 | 2014-05-07 | 惠州三星电子有限公司 | Engineering automation short circuit and/or open circuit test method |
| CN104849556A (en) * | 2015-04-23 | 2015-08-19 | 国家电网公司 | Direct current resistance test system for transformer winding |
| CN105890474A (en) * | 2016-04-05 | 2016-08-24 | 贵州航天电子科技有限公司 | Intelligent fuse safety testing device |
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| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
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| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20190611 |
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| RJ01 | Rejection of invention patent application after publication |