CN109856510B - Method for searching turn-to-turn insulation defect position of dry-type air-core reactor - Google Patents
Method for searching turn-to-turn insulation defect position of dry-type air-core reactor Download PDFInfo
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Abstract
The invention discloses a method for searching turn-to-turn insulation defect positions of a dry-type air-core reactor, which is characterized in that on the basis of following the existing electrical test standard, the test items to be selected next are guided according to the test result of the previous step without depending on a single test form or the whole test result of a single dry reactance device, and the turn-to-turn insulation defect positions are orderly determined step by step according to the search logic of whether the dry reactance whole has the turn-to-turn insulation defect, which encapsulation the defect is located, and the specific position (smoke position) of the defect. Meanwhile, the method is not only suitable for searching the position of the dry resistance single defect, but also meets the requirement of searching a plurality of defect positions in the test process.
Description
Technical Field
The invention relates to the technical field of high voltage and insulation, in particular to a method for searching turn-to-turn insulation defect positions of a dry type air-core reactor.
Background
The dry-type air-core reactor is generally formed by connecting several to more than a dozen of envelopes in parallel, each envelope is formed by winding a plurality of strands of electromagnetic wires in parallel, namely the electrical topology of one dry-type air-core reactor device is a reactance coil with thousands of turns. When a certain number of turns or dozens of turns of coils of the dry-type air-core reactor have insulation defects, it is difficult to judge whether the insulation defects between turns exist in the conventional electrical test currently carried out on site, so that the dry-type air-core reactor equipment is often subjected to fire accidents along with the development and expansion of the equipment insulation defects. After the dry-type air reactor has turn-to-turn short circuit, the current in the short-circuit ring is very large, and can reach several times of the normal operation current under extreme conditions, so that the coil is extremely easy to ignite and self-burn within several seconds. The accident reason caused by the turn-to-turn insulation defect accounts for 90% of the total accident reason of the dry type air-core reactor, and if the turn-to-turn insulation defect cannot be found in time, the adverse effect and the economic loss of the transformer substation caused by the fire accident of the dry type air-core reactor cannot be measured.
The turn-to-turn overvoltage test device based on the high-frequency pulse oscillation method uses the power electronic device IGBT to replace the traditional spherical gap discharge gap, and the safety and the reliability of the device are greatly improved. Therefore, the turn-to-turn overvoltage test is introduced to an electric power field from a laboratory, plays a non-trivial role in diagnosing turn-to-turn insulation defects of the dry-type air reactor on the field, solves the technical problem of on-site diagnosis of the turn-to-turn insulation defects of the dry-type air reactor, and greatly reduces the occurrence of accidents such as fire of the dry-type air reactor.
However, it is far from sufficient to determine whether the dry-type air reactor to be tested has the inter-turn insulation defect only by using the inter-turn overvoltage test device of the high-frequency pulse oscillation method, and only after the specific position of the inter-turn insulation defect is clear, the root cause of the inter-turn insulation defect of the dry-type air reactor can be fundamentally determined by using the disassembling mode of the dry-type air reactor body, so that an effective method for improving the production quality and the running stability of the dry-type air reactor equipment can be provided from the aspects of design, manufacture, operation and maintenance and the like of the dry-type air reactor equipment.
Therefore, a method for searching the position of the turn-to-turn insulation defect of the dry-type air-core reactor is needed to solve the problems in the prior art.
Disclosure of Invention
The invention discloses a method for searching turn-to-turn insulation defect positions of a dry-type air-core reactor, which is characterized by comprising the following steps of:
step 1: performing on-site inter-turn overvoltage test to determine whether the dry type air reactor has inter-turn insulation defect, if the phases of the high-voltage and low-voltage test waveforms are obviously deviated (the judgment criterion given in the GB/T1094.6 graph G.1), indicating that the dry type air reactor to be tested has inter-turn insulation defect, executing the step 2, and if the phases of the high-voltage and low-voltage test waveforms are not deviated, finishing executing the searching method if the dry type air reactor is not defect;
step 2: measuring the dielectric loss value of the dry-type air reactor under the rated current, converting the dielectric loss value measured under the current temperature to 75 ℃ of reference temperature (GB/T1094.6-2011 part 6 of a power transformer, namely the reactor item 7.8.1, the measured value is corrected to be under the rated current and the reference temperature), and comparing the measured value with a factory loss test value to calculate a deviation value;
and step 3: testing the direct current resistance test value of the encapsulating layer, comparing the test value with a design theoretical value, calculating the deviation value of the test value and the design theoretical value, and executing the step 8 if the deviation of the direct current resistance test value of the encapsulating layer is more than +/-5%, otherwise executing the step 4;
and 4, step 4: determining problem encapsulation by using an encapsulation loss test, measuring an encapsulation loss value under a rated current, converting the encapsulation loss value measured at the current temperature to 75 ℃ of a reference temperature (the same as the step 2), comparing the encapsulation loss value with a factory loss test value to calculate a deviation value, and executing a step 8 if the deviation of the encapsulation dielectric loss value is more than +/-5%, or executing a step 5;
and 5: accelerating the deterioration of turn-to-turn insulation by using externally applied current;
step 6: reducing the applied voltage value to zero, measuring the inductance value of the dry-type air-core reactor, comparing the measured inductance value with a factory test value, executing the step 7 if the deviation between the measured inductance value and the factory test value is more than 10%, otherwise executing the step 5;
and 7: measuring the dielectric loss value and the encapsulation loss value of the dry-type air reactor again under the rated current, converting the dielectric loss value and the encapsulation loss value of the dry-type air reactor to 75 ℃ of reference temperature (same as the step 2), comparing the dielectric loss value and the encapsulation loss value of the dry-type air reactor in the step 2 with the encapsulation loss value in the step 4, if no defect exists, executing the step 8, otherwise, judging the encapsulation position where the defect exists, removing the encapsulation with the determined defect problem, and executing the step 5;
and 8: performing a temperature rise test, increasing the external voltage value until the external current value of the dry type air-core reactor cannot be increased, and judging the specific position of the defect according to the infrared thermal imaging temperature distribution diagram and the burning smoke position thereof in the temperature rise test process;
and step 9: and (4) disassembling the problem package, and determining turn-to-turn insulation defects so as to analyze the defect cause of the turn-to-turn insulation defects.
Preferably, the step 1 uses an inter-turn overvoltage test device based on a high-frequency pulse oscillation method to perform the on-site inter-turn overvoltage test.
Preferably, said step 5 rapidly raises the value of the applied voltage, and keeps the value of the test current constant after the value of the applied current is greater than the rated current.
Preferably, the test current value holding time in the step 5 is determined by the severity of turn-to-turn insulation defects of the tested dry-type air reactor, and the more severe the turn-to-turn insulation defects are, the lower the external current value is, and the shorter the application time is.
Preferably, the step 7 further determines whether the overcurrent test accelerates the degradation progress of other small insulation defects, and if other small insulation defects are found, which indicates that the turn-to-turn insulation defect is located at more than one position, the faulty package determined to have defects needs to be removed and the step 5 is executed.
Preferably, in the step 8 of the temperature rise test, the defect position is judged according to the infrared thermal imaging temperature distribution diagram in the test process, the position is a disassembly position determined by disassembling the envelope in the step 9, and in the test process, the spontaneous combustion and smoke generation phenomenon occurs in one of a plurality of resistant envelopes, and the smoke generation position is the specific position of the defect.
The method for searching the turn-to-turn insulation defect position of the dry-type air-core reactor disclosed by the invention has the following beneficial effects:
1. the turn-to-turn overvoltage test based on the high-frequency pulse oscillation method can qualitatively judge whether the dry reactance has turn-to-turn insulation defects, but causes the dry reactance to have the turn-to-turn insulation defects, and relates to various aspects such as improper design of equipment accessories, improper construction installation or welding, stress release in the operation process and the like.
2. The invention provides a method for searching the turn-to-turn insulation defect position of a dry-type air-core reactor by means of turn-to-turn overvoltage, dry reactance loss, direct current resistance of an encapsulating layer, encapsulation loss, overcurrent acceleration, inductance, temperature rise and other test tests and a mode of disassembling a dry reactance equipment body.
3. On the basis of following the existing electrical test standard, the invention guides the next selected test item according to the test result of the previous step without depending on a single test form or depending on the overall test result of a single dry reactance device, and orderly determines the position of the inter-turn insulation defect step by step layer by layer according to the overall existence of the inter-turn insulation defect, the encapsulation of the defect and the search logic of the specific position (smoke position) of the defect. Meanwhile, the method is not only suitable for searching the position of the dry resistance single defect, but also meets the requirement of searching a plurality of defect positions in the test process.
4. Relevant practitioners in the electric power industry can accurately find out the positions of the inter-turn insulation defects of the dry reactor according to the test steps. On the basis, researches on the aspects of equipment design, manufacturing process, material property, modification and the like are better developed, the fire accident caused by the accident occurrence of turn-to-turn insulation defects (due to the lack of the method, the specific cause of the dry-resisting fire is difficult to be determined at present) is cut off from the source, and the basic guarantee is provided for the safe and stable operation of the dry-resisting equipment.
Drawings
FIG. 1 is a flow chart of a method for searching a position of a turn-to-turn insulation defect of a dry-type air-core reactor.
Detailed Description
In order to make the implementation objects, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be described in more detail below with reference to the accompanying drawings in the embodiments of the present invention. In the drawings, the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The described embodiments are only some, but not all embodiments of the invention. The embodiments described below with reference to the drawings are illustrative and intended to be illustrative of the invention and are not to be construed as limiting the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1, the technical method of the method for searching the position of the turn-to-turn insulation defect of the dry-type air-core reactor comprises the following specific steps:
1) and (4) performing an interturn overvoltage test. And (5) qualitatively judging whether the dry reactance has turn-to-turn insulation defects or not. By utilizing a turn-to-turn overvoltage test device based on a high-frequency pulse oscillation method, according to the 6 th part of a GB/T1094.6-2011 power transformer: and (4) carrying out an inter-turn overvoltage test of the measured dry reactance according to the requirements of the reactor, and judging whether the inter-turn overvoltage test has an inter-turn insulation defect. If the phases of high-voltage and low-voltage test waveforms are obviously deviated (according to a judgment criterion given in a GB/T1094.6 graph G.1), indicating that the measured dry reactance has an inter-turn insulation defect, namely the measured dry reactance does not pass the test, determining the defect position by combining the following test; if the phases of the high-voltage test waveform and the low-voltage test waveform do not occur, the dry resistance is free of defects, and the operation can be continued.
2) And (5) dry loss resistance testing. Measuring the dielectric loss value of the test dry reactor under the rated current (recording the environmental temperature during measurement), converting the measured value at the temperature to 75 ℃ of reference temperature, comparing the measured value with the factory loss test value at the 75 ℃ of reference temperature, calculating the deviation value of the measured value and the factory loss test value, and recording the data for later use.
3) And testing the resistance of the encapsulating layer. And (4) searching dry reactive encapsulation with insulation defects by using a layer direct current resistance test mode. And disassembling the electromagnetic wires of the tested dry anti-welding and the upper and lower star arms, encapsulating one by one, and testing the direct current resistance value layer by layer, namely testing the direct current resistance of the encapsulating layer. Comparing the measured values of the direct resistance of each layer with theoretical design values of the direct resistance of each layer, and calculating the deviation value of the measured values of the direct resistance of each layer and the theoretical design values of the direct resistance of each layer to judge the encapsulation position of the problem. And combining the defect searching experience of a plurality of dry resistors, and considering that the encapsulation corresponding to the test value has turn-to-turn insulation defects if the deviation of the direct current resistance value of the common layer is more than +/-5%.
4) And (5) carrying out encapsulation loss test. The problem envelope is determined using an envelope loss test. And (3) encapsulating and measuring the loss (recording the environmental temperature during measurement) one by one under the rated current, converting the measured value at the temperature to 75 ℃ (same as 2), comparing with a factory loss test value at 75 ℃, and calculating the deviation value of the two values to judge the defective encapsulating position. And combining the defect searching experience of multiple dry resistors, and considering that the encapsulation may have turn-to-turn insulation defects if the dielectric loss value deviation of the encapsulation is more than +/-5%. At this time, the DC resistance of the bonding layer can basically determine which package the defect exists.
In addition, after the step 3) test, if the deviation of the DC resistance test value of the layer is large (more than +/-5%), the encapsulation position of the problem can be judged, otherwise, the encapsulation position needs to be judged again by the step 4) test.
If the deviation of the encapsulation dielectric loss value in the step 4) is smaller (not more than +/-5%), the overcurrent test in the step 5) is needed to accelerate the deterioration process of turn-to-turn insulation.
5) The overcurrent accelerates the degradation process. The deterioration of turn-to-turn insulation is accelerated by using the constant current for a long time. The applied voltage value is increased at a fast speed, and the test current value is maintained for a period of time after the applied current value is larger than the rated current. The external current value is recommended to be a rated current value which is 1.1-2.0 times, and multiple test results show that the external current value is determined by the severity of dry resistance defects and is difficult to control to a specific numerical value artificially; the worse the turn-to-turn insulation defect, the lower the external current value, and the shorter the applicable time.
It is worth to be noted that the setting value of the dry-type air-core reactor overcurrent protection is 1.5-2.0 times of the rated current of the dry-type air-core reactor, and the setting value can effectively protect external interphase short circuit and the head and tail end short circuit of the single-phase reactor; that is, in actual operation, an overcurrent surge of 1.5 to 2.0 times the rated current should not cause insulation deterioration problems. Namely: if the electrical parameters of the dry reactance equipment are changed, the dry reactance equipment has defects.
6) And (5) testing the dry-resistance inductance value. Reducing the value of applied voltage to zero, measuring the inductance value of the dry reactor, comparing the values with factory test values, and judging that the overcurrent impact test increases the degradation degree of the original insulation defect if the inductance value shown by the measuring instrument fluctuates all the time and is difficult to stabilize or the measured inductance value is reduced obviously (such as reduced by 10 percent) during the test; accelerated degradation of other small defects may also be promoted, resulting in early exposure of the insulation defects. If the reactance value does not change significantly, repeating step 5) until the reactance value appears as described in step 6).
7) Dry resistance and encapsulation loss were again tested. And measuring the dry reactance and the encapsulation loss value under the rated current, converting the test value to the reference temperature of 75 ℃, comparing the test value with 2) a dry reactance loss test value or 4) an encapsulation loss measured value, judging the encapsulation position (particularly which encapsulation is positioned) where the defect exists by using the deviation value of the dry reactance loss test value and the encapsulation loss measured value, and judging whether the overcurrent test accelerates the degradation progress of other tiny insulation defects.
8) And (4) carrying out a temperature rise test. Increasing the applied voltage value until the applied current value of the dry reactor can not be increased. Since the device loss is already high at this time, the applied current is difficult to rise, so the temperature rise test is carried out under the effect of the maximum current capable of rising (or close to the value). After the test is carried out for a period of time, generally several minutes, the temperature distribution condition of the dry reactor can be tested by means of the depression of an infrared thermal imager, and therefore the defect position is judged according to the infrared thermal imaging temperature distribution diagram. In the test process, the spontaneous combustion and smoke generation phenomena of a certain package of a plurality of resists are required to be considered to be stopped in time to prevent the occurrence of fire accidents, and simultaneously, the defect position can be uniquely determined.
9) And (4) disassembling the problem package and determining the position of the defect. And (3) observing whether the color of the glass fiber insulating layer at the smoking position is changed into gray, brown or dark brown (obviously different from the color of the outer surface of the glass fiber layer) by taking the bus bar at the opposite side of the smoking position in the temperature rise test as a cutting position, wherein the position is just a defect position. And (3) stripping the outer glass fiber insulating layer, observing the states of the glass fiber cloth and the electromagnetic wire inside the glass fiber insulating layer, and observing whether the abnormal conditions such as wetting of the glass fiber cloth, melting and breaking of the electromagnetic wire and the like exist or not so as to further search the cause of the interturn insulation defect of the dry quenching equipment.
10) Repeated searching of a plurality of defect positions. And (5) removing the problem package with the determined defect position, and repeating the steps 5) -9).
In one embodiment, the process of the method for searching the position of the turn-to-turn insulation defect of the dry-type air-core reactor comprises the following steps:
1) and (4) performing an interturn overvoltage test. According to appendix G of GB/T1094.6, 160kV is taken as an applied test voltage value of an interturn overvoltage test, 85kV is taken as a low-voltage calibration test voltage value, and an interturn overvoltage test based on a high-frequency pulse oscillation method is carried out on certain dry reactance. The phases of high-voltage and low-voltage waveforms are obviously deviated, which indicates that the dry reactance has turn-to-turn insulation defects.
2) And (5) dry loss resistance testing. The loss measurement value of a certain dry resistance under rated current is 8.81kW, the factory test value is 7.82kW, and the deviation percentage is 12.7. The loss resistance of the platform stem is obviously increased, and the turn-to-turn insulation defect is proved to exist.
3) And (6) testing direct current resistance. The test result of the overall direct current resistance of a certain dry resistor is not abnormal. Disassembling the electromagnetic wires of the dry resistance welding and the upper and lower star arms, encapsulating one by one, and testing the direct current resistance value layer by layer, wherein the theoretical design value and the actual measurement value of each layer of direct resistance are shown in table 1; in the table, the numbers of the envelopes are 1, 2, 3 and 4 from the inside to the outside, respectively.
TABLE 1 DC resistance test results
In Table 1, the maximum variation in the direct resistance of each of the remaining layers was not more than-5.3%, except that the measurement value of the 1 st layer (innermost layer of the envelope) of the envelope 2 was infinite, and the measurement variation of the 1 st layer of the envelope 1 was-6.1%. Accordingly, the innermost layer of the No. 2 encapsulation is judged to have insulation defects. Package No. 1 is suspected of having insulation defects and requires further test-assisted determination due to the small deviation value.
4) The overcurrent accelerates the degradation process. In order to find out the defect position, a method for accelerating the turn-to-turn insulation degradation by adopting constant current for a long time is adopted. The applied voltage value was increased more rapidly and after the applied current value increased to 200A (about 1.2 times the rated current), the test apparatus tripped. And boosting the voltage again after closing, and the external application test current value cannot be increased to the rated value. The dry-type inductance value of the voltage reduction measurement is reduced by 10% compared with the inductance value of 55mH at the factory, and the reactance value fluctuates all the time during measurement. According to the test phenomenon, the degradation degree of the original insulation defect is presumably increased by overcurrent impact; accelerated degradation of the remaining micro-defects may also be promoted, resulting in early exposure of the insulation defects.
5) And (5) performing loss test for a second time. Loss at rated current was measured to be 37.7kW, a 4.3 fold increase in loss. It is speculated that the dry resist should have a number of small insulation defects, and that over-current testing accelerates the degradation of such defects.
6) And (6) positioning in a temperature rise test. Since the dry resistance loss is high and the applied current is difficult to increase, a temperature rise test was performed under the action of 89A current. After applying current for 3 min, No. 1 package smokes. In order to ensure the safety of the test, the pressure is reduced, and the test is stopped artificially. The infrared thermographic temperature profile shows that a high temperature zone appears at about 15cm of the upper end of the No. 1 package, the maximum temperature is 48.8 ℃, and the temperature distribution accords with the temperature distribution characteristic after turn-to-turn short circuit.
7) And taking the bus bar opposite to the smoking position in the temperature rise test as a cutting position. After the No. 1 encapsulation is disassembled, the position of the visible defect is 15cm away from the upper end of the encapsulation, and after the outer glass fiber insulating layer is stripped, the electromagnetic wires are fused and broken. The inner wall of the No. 1 packaging has a plurality of small gaps which can be seen by naked eyes. Cut to package No. 2 and the insulation layer was dark gray somewhere on the inner wall of the package at a distance of about 30cm from the upper end of the package. After the insulating layer is stripped, the electromagnetic wire and the inner surface of the glass fiber insulating layer have obvious discharge carbonization traces. Moreover, the glass fiber cloth covered by the contact surface is separated from the electromagnetic wire, and the finger touches the glass fiber cloth to have a moist feeling. 3. No. 4 packaging is not abnormal after disassembly.
And by combining the appearance characteristics of the encapsulation and disassembly No. 1 and No. 2, the analysis can show that: in the transverse winding process of the glass fiber yarns, the dry resistance is not easy to be integrated with the glass fiber yarns due to poor wettability of the glass fiber cloth, so that the axial tearing resistance of the dry resistance is insufficient, and the phenomena of cracking of glass fiber insulating layers and stripping of electromagnetic wires occur. Due to the limitation of materials and processes, the inner surface of the envelope gradually cracks in different degrees at multiple positions after dry-type anti-cracking operation, and insulation deterioration is caused after operation is affected with damp, so that the problem of turn-to-turn insulation defects or insulation hidden troubles is caused.
Finally, it should be pointed out that: the above examples are only for illustrating the technical solutions of the present invention, and are not limited thereto. Although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (6)
1. A method for searching a turn-to-turn insulation defect position of a dry-type air-core reactor is characterized by comprising the following steps:
step 1: performing on-site inter-turn overvoltage test to determine whether the dry type air reactor has inter-turn insulation defect, if the phases of the high-voltage test waveform and the low-voltage test waveform are obviously deviated, indicating that the dry type air reactor to be tested has inter-turn insulation defect, executing the step 2, and if the phases of the high-voltage test waveform and the low-voltage test waveform are not deviated, finishing executing the searching method if the dry type air reactor is defect-free;
step 2: measuring the dielectric loss value of the dry-type air-core reactor under the rated current, converting the dielectric loss value measured at the current temperature to 75 ℃ of the reference temperature, and comparing the dielectric loss value with a factory loss test value to calculate a deviation value;
and step 3: testing the direct current resistance test value of the encapsulating layer, comparing the test value with a design theoretical value, calculating the deviation value of the test value and the design theoretical value, and executing the step 8 if the deviation of the direct current resistance test value of the encapsulating layer is more than +/-5%, otherwise executing the step 4;
and 4, step 4: determining problem encapsulation by using an encapsulation loss test, measuring an encapsulation loss value under a rated current, converting the encapsulation loss value measured at the current temperature to 75 ℃ of a reference temperature, comparing the encapsulation loss value with a factory loss test value, and calculating a deviation value, if the deviation of the encapsulation dielectric loss value is more than +/-5%, executing a step 8, otherwise, executing a step 5;
and 5: accelerating the deterioration of turn-to-turn insulation by using externally applied current;
step 6: reducing the applied voltage value to zero, measuring the inductance value of the dry-type air-core reactor, comparing the measured inductance value with a factory test value, executing the step 7 if the deviation between the measured inductance value and the factory test value is more than 10%, otherwise executing the step 5;
and 7: measuring the dielectric loss value and the encapsulation loss value of the dry-type air reactor again under the rated current, converting the dielectric loss value and the encapsulation loss value of the dry-type air reactor to 75 ℃ of reference temperature, and comparing the dielectric loss value of the dry-type air reactor in the step 2 with the encapsulation loss value in the step 4: if the electrical parameters of the dry type air reactor are changed, the dry type air reactor is indicated to have defects, if no defects exist, step 8 is executed, otherwise, the packaging number with the defects is judged, the packaging with the determined defects is removed, and step 5 is executed;
and 8: performing a temperature rise test, increasing the external voltage value until the external current value of the dry type air-core reactor cannot be increased, and judging the specific position of the defect according to the infrared thermal imaging temperature distribution diagram and the burning smoke position thereof in the temperature rise test process;
and step 9: and (4) disassembling the problem package, and determining turn-to-turn insulation defects so as to analyze the defect cause of the turn-to-turn insulation defects.
2. The method for searching the turn-to-turn insulation defect position of the dry-type air-core reactor according to claim 1, wherein the method comprises the following steps: and step 1, performing the on-site inter-turn overvoltage test by using an inter-turn overvoltage test device based on a high-frequency pulse oscillation method.
3. The method for searching the turn-to-turn insulation defect position of the dry-type air-core reactor according to claim 1, wherein the method comprises the following steps: and 5, rapidly increasing the applied voltage value, and keeping the applied current value of the test constant after the applied current value is larger than the rated current, wherein the applied current is 1.1-2.0 times of the rated current value.
4. The method for searching the position of the turn-to-turn insulation defect of the dry-type air-core reactor according to claim 3, wherein the method comprises the following steps: and 5, the retention time of the test current value is determined by the severity of turn-to-turn insulation defects of the tested dry-type air reactor, and the more severe the turn-to-turn insulation defects are, the lower the external current value is, and the shorter the application time is.
5. The method for searching the turn-to-turn insulation defect position of the dry-type air-core reactor according to claim 1, wherein the method comprises the following steps: and 7, judging whether the overcurrent test accelerates the degradation progress of other tiny insulation defects, if other tiny insulation defects are found, indicating that the turn-to-turn insulation defect position is more than one, removing the determined defective encapsulation, and executing the step 5.
6. The method for searching the turn-to-turn insulation defect position of the dry-type air-core reactor according to claim 1, wherein the method comprises the following steps: in the step 8 of the temperature rise test, the defect position is judged according to the infrared thermal imaging temperature distribution diagram in the test process, the position is a disassembly position determined by disassembling the envelope in the step 9, and in the test process, the spontaneous combustion and smoking phenomenon occurs in a certain envelope of a plurality of resistors, and the smoking position is a specific position.
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