CN109828248B - Method for analyzing influence of angular deformation of satellite-borne microwave remote sensing instrument on visual vector - Google Patents
Method for analyzing influence of angular deformation of satellite-borne microwave remote sensing instrument on visual vector Download PDFInfo
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Abstract
The invention provides a method for analyzing the influence of angular deformation of a satellite-borne microwave remote sensing instrument on a view vector, which comprises the following steps: solving a visual vector cluster of the outermost end pointing to the detection target under different rotation scanning angles of the instrument, converting the visual vector cluster into a satellite system, calculating an X pointing angle and a Y pointing angle of the visual vector cluster in the satellite system, and defining the sensitivity of the visual vector with respect to angle deformation as follows: and calculating the ratio of the included angle deviation between the actual central view vector and the nominal central view vector to the angle deformation, calculating the change of the angle deformation sensitivity along with the rotation scanning angle, and representing the influence of the angle deformation on the direction of the view vector by using an angle deformation sensitivity curve. The method provided by the invention is suitable for the microwave remote sensing instrument containing various components such as a plane reflecting surface, a rotating paraboloid reflecting surface, a rotating hyperboloid reflecting surface and the like, and can be used for quantitatively analyzing the influence of the angle deformation of each light path component on the view vector of the microwave remote sensing instrument.
Description
Technical Field
The invention relates to a method for analyzing the influence of deformation of a remote sensing instrument on an observation visual vector, in particular to a method for analyzing the influence of angular deformation of a light path component of a satellite-borne microwave remote sensing instrument on the visual vector.
Background
The image navigation registration is a key index influencing the quality of meteorological satellite remote sensing image products, and directly reflects the spatial correspondence between the remote sensing image information and the target. The method has important functions on quantitative application of meteorological satellite service image product positioning, such as accurate positioning of regional complex conditions, accurate tracking of severe weather, generation of cloud picture animation and the like.
The satellite platform attitude direction, the orbit fixed point position, the thermal environment and the mechanical environment have long-period and short-period changes, so that the instrument sight deviates from the nominal direction, and the corresponding relation between the image pixel and the geographic position deviates. The attitude pointing change of the satellite platform can be compensated or corrected after being accurately measured by an on-satellite attitude sensor; track set point position changes can be compensated or corrected for after measurement by the ground station. The on-orbit deformation mechanism of the satellite platform and the instrument caused by the factors such as the thermal environment, the mechanical environment and the like is complex, the deformation of each part is difficult to directly and accurately measure, and the influence of the deformation of different assemblies on the image is different. Therefore, remote sensing satellite manufacturers in various countries design corresponding compensation schemes aiming at the imaging characteristics of remote sensing instruments, such as the GOES series in the United states, the Electro-L in Russia, the Hiwari-8 in Japan, and the Fengyun four meteorological satellite in MTG China in Europe.
However, none of the above satellite payloads have microwave remote sensing instruments. As an important component of a weather forecasting system in China and even in the global future, the China is the first to deploy the stationary orbit microwave remote sensing satellite. Wherein the microwave detector is the primary load. Because the microwave detection frequency range of the static orbit expands towards high frequency, in order to meet the requirement of spatial resolution, the aperture of the antenna reflecting surface is far larger than that of a conventional antenna, the size of a rocket fairing is limited, and the antenna needs to be folded firstly and then unfolded after being in orbit to complete deployment. The unfolding action may cause the relative angles and positions of the reflective surfaces of the microwaves to deviate from nominal. Secondly, when the satellite is in orbit, the flexible vibration of the deployment mechanism causes the angle and position of the reflecting surface to deviate from the nominal values. Different from the optical remote sensing satellite, the reflecting surface of the microwave remote sensing antenna is composed of a plane reflecting surface and a curved surface reflecting surface. The displacement of the plane reflecting surface does not change the reflecting direction of the light path, so that the optical remote sensing star does not need to model the displacement error of the reflecting surface. And the displacement of the curved reflecting surface directly causes the change of the direction of the light path, so that the direction of the earth observation visual vector is changed, and therefore, the displacement error of the reflecting surface cannot be ignored in the microwave remote sensing satellite light path modeling. And finally, compared with an optical remote sensing satellite, the microwave remote sensing satellite has more reflecting surfaces, and the visual vector enters the imaging system after being subjected to multiple reflections.
In summary, it can be known from various factors that most of the study objects of the current satellite image positioning and registration study considering instrument deformation are optical remote sensing instruments. Compared with an optical remote sensing instrument, the microwave remote sensing instrument is more complex in light path modeling and has certain particularity. In order to realize high-precision image positioning of the microwave remote sensing instrument, the influence mode and the size of the angle deformation of the optical path component on the ground observation visual vector need to be analyzed according to the structural characteristics of the microwave remote sensing instrument.
After retrieval:
the NOAA research report (1989, number N90-13422) written by j.l. fiorello et al introduces the concept and principle of image positioning and registration, and proposes a method for obtaining instrument deformation parameters by observing stars through an optical instrument, but the method is not suitable for microwave remote sensing instruments.
In the Rooibos research on stationary meteorological satellite imaging navigation registration (2017), the Proc paper of Luwang, a Fengyun four-number radiation imager was used as a research object to perform image navigation registration research. Aiming at the problem of on-orbit deformation of a remote sensing instrument caused by factors such as thermal environment, stress and the like, a dual-model modeling method is provided. The influence of mechanical deformation on the view vector is described in detail by using a physical model, and an equivalent model is used as a compensation algorithm. But the method is only effective for optical remote sensing instruments with plane mirror scanning reflection imaging.
The invention patent CN104764443A discloses a method for constructing a tight imaging geometric model of an optical remote sensing satellite image by using internal and external orientation elements of a satellite camera. But the method is not suitable for microwave remote sensing instruments.
The manual press, the non-contact press and the press are listed in the book "high resolution SAR-GEC image tight imaging geometric model and the application research" of the fifth phase (2009) of the survey and drawing report ", and the method for constructing the SAR image GEC product tight imaging geometric model is proposed. However, the method simplifies modeling of internal distortion of the instrument and cannot sufficiently describe deformation of the scanning type microwave imaging instrument.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide a method for analyzing the influence of angular deformation of a satellite-borne microwave remote sensing instrument on a view vector.
The invention provides a method for analyzing the influence of angular deformation of a satellite-borne microwave remote sensing instrument on a view vector, which comprises any one or more of the following steps:
parameters in the optical path model of the instrument are divided into: angle deformation parameters, rotational scan angles and structural parameters;
for each rotary scanning angle, substituting the angular deformation parameter and the structural parameter to be analyzed into the light path model, and solving the projection of the apparent vector cluster of the instrument pointing to the detection target under the current rotary scanning angle on the satellite system, wherein the structural parameter is zero; calculating an X pointing angle and a Y pointing angle of the view vector cluster to represent the pointing direction of the view vector cluster in the satellite system;
converting the view vector cluster into a system of the satellite body, and calculating an X pointing angle and a Y pointing angle of the view vector cluster in the satellite body;
calculating the variation curves of the X pointing angle sensitivity and the Y pointing angle sensitivity of the angle deformation parameters along with the rotation scanning angle;
and calculating and counting the intersection area and the union area of the actual beam and the nominal beam, and calculating a variation curve of the vergence along with the rotation scanning angle.
Preferably, the optical path model output instrument points to the apparent vector cluster of the detection target;
the visual vector cluster pointing to the detection target of the instrument is a set of sight unit vectors which are emitted from a main reflecting surface after a beam boundary visual vector and a beam center visual vector which are equidistantly arranged on a beam-3 dB envelope asymptotic surface emitted from a feed source are reflected by each reflecting surface of an antenna.
Preferably, the X pointing angle is an included angle between a + Z axis of the satellite system and a projection vector of a view vector on a YZ plane of the satellite system, and when the view vector is along the + X axis direction, the X pointing angle is positive;
the Y pointing angle is an included angle between a + Z axis of the satellite system and a projection vector of a view vector on an XZ plane of the satellite system, and the Y pointing angle is positive when the view vector is along the + Y axis direction;
the calculation formula is as follows:
wherein the content of the first and second substances,
denotes the X pointing angle, theta denotes the Y pointing angle wherein,
denotes the X pointing angle, theta denotes the Y pointing angle, X1Projection of a vector X representing a cluster of view vectors on the X-axis of the system in the satellite, X2Projection of a vector X representing a cluster of view vectors on the y-axis of the system in the satellite, X3The projection of a vector X representing a view vector cluster on the z-axis of the system in the satellite represents a set.
Preferably, the sensitivity of the view vector with respect to angular deformation is defined as a ratio of a deviation of a Y pointing angle between an actual central view vector and a nominal central view vector to an angular deformation amount, or a ratio of a deviation of an X pointing angle to an angular deformation amount, and the influence of angular deformation on the pointing direction of the view vector is characterized by a variation curve of the sensitivity of angular deformation with a rotation scanning angle:
wherein α represents a rotational scan angle; Δ β represents an angular deformation amount of the reflecting surface; Φ () represents the X pointing angle sensitivity; Θ () represents the Y pointing angle sensitivity;
respectively representing an X pointing angle after deformation and an X pointing angle before deformation;
representing the amount of change in the X pointing angle before and after deformation; theta (),
respectively representing a Y pointing angle after deformation and a Y pointing angle before deformation; Δ θ () represents the amount of change in the Y pointing angle before and after the deformation.
Preferably, the vergence V (α) is defined as the ratio of the intersection of the footprint areas to the union of the footprint areas between the actual beam and the nominal beam, and the influence of angular deformation on the microwave energy focusing degree is characterized by the variation curve of the vergence with the rotation scan angle:
s (α) represents the footprint of the actual beam;
representing the footprint of the nominal beam.
sI(α) represents the intersection of the footprint areas of the actual beam and the nominal beam, sJAnd (alpha) represents the union of the actual beam and the footprint of the nominal beam.
According to the present invention, a computer-readable storage medium is provided, in which a computer program is stored, which, when being executed by a processor, carries out the steps of the method as described above.
Compared with the prior art, the invention has the following beneficial effects:
the invention provides a method for analyzing the influence of angular deformation of a satellite-borne microwave remote sensing instrument on a view vector, wherein an established light path model is suitable for the satellite-borne microwave remote sensing instrument containing various components such as a curved surface reflecting surface, a plane reflecting surface, a rotary scanning mechanism and the like. The influence of the angular deformation of any light path component on the visual vector of the satellite-borne microwave remote sensing instrument can be quantitatively analyzed.
Drawings
Other features, objects and advantages of the invention will become more apparent upon reading of the detailed description of non-limiting embodiments with reference to the following drawings:
FIG. 1 is a flow chart of a light path modeling method of a satellite-borne microwave remote sensing instrument.
Fig. 2 is a schematic view of an outgoing beam and a central outgoing sight line of a feed source.
FIG. 3 is a schematic diagram of an internal optical path of a certain satellite-borne microwave remote sensing instrument.
Fig. 4 is a schematic diagram of the X-pointing angle and the Y-pointing angle of the view vector.
Fig. 5 is a schematic diagram of the direction of a beam in a satellite system when a certain angle of distortion exists in a certain satellite-borne microwave remote sensing instrument.
FIG. 6 is a schematic diagram of an X-directional angle sensitivity curve and a Y-directional angle sensitivity curve of a certain satellite-borne microwave remote sensing instrument for earth observation visual direction quantity relative to a certain angle deformation quantity.
Fig. 7 is a schematic diagram of the intersection of the actual beam cross-section and the nominal beam cross-section.
Fig. 8 is a diagram illustrating a union of an actual beam cross section and a nominal beam cross section.
Detailed Description
The present invention will be described in detail with reference to specific examples. The following examples will assist those skilled in the art in further understanding the invention, but are not intended to limit the invention in any way. It should be noted that it would be obvious to those skilled in the art that various changes and modifications can be made without departing from the spirit of the invention. All falling within the scope of the present invention.
As shown in fig. 1 to 7, a method for analyzing influence of angular deformation of an optical path component on a view vector of a stationary orbit space-borne microwave remote sensing instrument according to a preferred embodiment of the present invention includes the following steps:
and (1) dividing the light path model parameters of the satellite-borne microwave remote sensing instrument into angle deformation parameters, a rotation scanning angle and other structural parameters.
The structure of a certain stationary orbit satellite-borne microwave remote sensing instrument of the embodiment is shown in fig. 3.
Wherein the fast-scan mirror is a plane reflecting surface, and the nominal fast-scan mirror is fixedly connected with a coordinate system and rotates by an Euler angle according to an XY rotation sequence
θbThen translated along the axis of the rotated fixed coordinate system ZbbAnd obtaining a fixed connection coordinate system of the actual fast-sweeping mirror.
The second fast-sweeping mirror is a plane reflecting surface, and the second nominal fast-sweeping mirror is fixedly connected with a coordinate system and rotates by an Euler angle according to an XY rotation sequence
θcThen translated along the axis Zc of the rotated fixed coordinate systemcAnd obtaining the actual fast-scanning mirror two fixed connection coordinate system.
The second secondary reflection is a plane reflection surface, and the nominal second secondary reflection is fixedly connected with a coordinate system and rotates by Euler angle according to XY rotation sequence
θdThen translated z along the rotated fixed coordinate system ZddAnd obtaining an actual second auxiliary reverse fixed connection coordinate system.
The first pair of inversions is a rotating hyperboloid reflecting surface, and the nominal first pair of inversions is fixedly connected with a coordinate system and rotates by Euler angle according to XY rotation sequence
θeThen translated x along the rotated fixed coordinate systeme,ye,zeAnd obtaining an actual first auxiliary reverse fixed connection coordinate system.
The main reflecting surface is a paraboloid of revolution reflecting surface, and the nominal main reflection is fixedly connected with a coordinate systemRotating Euler angle according to XY rotation sequence
θfThen translated x along the rotated fixed coordinate systemf,yf,zfAnd obtaining an actual main and reverse fixed connection coordinate system.
Parameters in the light path model are divided into:
1) parameters of angular deformation, including
θb,
θc,
θd,
θd,
θe,
θf；
2) A rotational scan angle α;
3) other structural parameters.
And (2) substituting the deformation parameters of the angle to be analyzed into a light path model by making the deformation parameters of the angle to be analyzed small and the other deformation parameters zero, and solving the sight vector cluster of the outermost end of the instrument pointing to the detection target.
It is not assumed that the angular deformation parameter to be analyzed is θfLet θfOther deformation parameters are zero (being small). Substitution into light path model f (theta)fAnd (2) solving the view vector cluster { X } of the outermost end of the instrument pointing to the detection target.
And (3) changing the rotation scanning angle, substituting the rotation scanning angle into the light path model, and solving the view vector cluster under different rotation scanning angles.
For the present embodiment, the effective observation range of the rotational scan angle is 0 to 120 °, and the magnitude of the rotational scan angle is changed within this range, and substituted into the optical path model f (θ)fα), solving cluster of view vectors { X (θ) at different rotational scan anglesf＝,α)},0≤α≤120°。
And (4) converting the view vector cluster into a system of the satellite body, and calculating the X pointing angle and the Y pointing angle of the view vector cluster in the satellite body.
Wherein:
represents the X pointing angle; θ represents the Y pointing angle. The results are shown in FIG. 4.
And (5) calculating the variation curves of the X pointing angle sensitivity and the Y pointing angle sensitivity of the angular deformation parameters along with the rotation scanning angle.
Deviation of central view vector X pointing angle
Divided by the amount of angular deformation thetafObtaining a deformation parameter theta with respect to the main reflecting surfacefSensitivity of X pointing angle of
As shown in fig. 5.
Center view vector Y pointing angle deviation theta (alpha) divided by angle deformation thetafObtaining a deformation parameter theta with respect to the main reflecting surfacefX pointing angle sensitivity θ (α) ═ θ (α)/. As shown in fig. 5.
And (6) calculating and counting the intersection area and the union area of the actual beam and the nominal beam, and resolving a variation curve of the vergence along with the rotation scanning angle.
As shown in figures 7 and 8 of the drawings,respectively counting the intersection areas of the actual beams and the nominal beams
Union area of actual beam and nominal beam
Thereby obtaining a parameter theta corresponding to the angular deformationfThe vergence curve V (alpha) sI(α)/sJ(α)。
The light path model established by the invention is suitable for microwave remote sensing instruments containing various components such as a rotating paraboloid reflecting surface, a rotating hyperboloid reflecting surface, a plane reflecting surface, a rotating shaft system and the like. The influence on the visual vector under the angular deformation of the light path component of the satellite-borne microwave remote sensing instrument in various configurations can be quantitatively analyzed.
The foregoing description of specific embodiments of the present invention has been presented. It is to be understood that the present invention is not limited to the specific embodiments described above, and that various changes or modifications may be made by one skilled in the art within the scope of the appended claims without departing from the spirit of the invention. The embodiments and features of the embodiments of the present application may be combined with each other arbitrarily without conflict.
Claims (4)
1. A method for analyzing influence of angular deformation of a satellite-borne microwave remote sensing instrument on a view vector is characterized by comprising the following steps:
parameters in the optical path model of the instrument are divided into: angle deformation parameters, rotational scan angles and structural parameters;
for each rotary scanning angle, substituting the angular deformation parameter and the structural parameter to be analyzed into the light path model, and solving the projection of the apparent vector cluster of the instrument pointing to the detection target under the current rotary scanning angle on the satellite system, wherein the structural parameter is zero; calculating an X pointing angle and a Y pointing angle of the view vector cluster to represent the pointing direction of the view vector cluster in the satellite system;
calculating an X pointing angle and a Y pointing angle of the view vector cluster in the satellite body;
calculating the variation curves of the X pointing angle sensitivity and the Y pointing angle sensitivity of the angle deformation parameters along with the rotation scanning angle;
the X pointing angle sensitivity is the ratio of the deviation of the X pointing angle between the actual central view vector and the nominal central view vector to the angular deformation;
the Y-direction angle sensitivity is the ratio of the deviation of the Y-direction angle between the actual central view vector and the nominal central view vector to the angle deformation;
calculating and counting the intersection area and the union area of the actual beam and the nominal beam, and resolving a variation curve of the vergence along with the rotation scanning angle;
defining the vergence V (alpha) as the ratio of the intersection of the footprint areas between the actual beam and the nominal beam to the union of the footprint areas, and representing the influence of the angular deformation on the microwave energy focusing degree by the variation curve of the vergence along with the rotation scanning angle:
s (α) represents the footprint of the actual beam;
representing the footprint area of the nominal beam;
sI(α) represents the intersection of the footprint areas of the actual beam and the nominal beam, sJAnd (alpha) represents the union of the actual beam and the footprint of the nominal beam.
2. The method for analyzing the influence of angular deformation of the satellite-borne microwave remote sensing instrument on the visual vector according to claim 1, wherein the light path model output instrument points to the visual vector cluster of the detection target;
the visual vector cluster pointing to the detection target of the instrument is a set of sight unit vectors which are emitted from a main reflecting surface after a beam boundary visual vector and a beam center visual vector which are equidistantly arranged on a beam-3 dB envelope asymptotic surface emitted from a feed source are reflected by each reflecting surface of an antenna.
3. The method for analyzing the influence of angular deformation of the satellite-borne microwave remote sensing instrument on the view vector according to claim 1, wherein the X pointing angle is an included angle between a + Z axis of a satellite body system and a projection vector of a view vector on an XZ plane of the satellite body system, and when the view vector is along the + X axis direction, the X pointing angle is positive;
the Y pointing angle is an included angle between a + Z axis of the satellite system and a projection vector of a visual vector on a YZ plane of the satellite system, and when the visual vector is along the + Y axis direction, the Y pointing angle is positive;
the calculation formula is as follows:
wherein the content of the first and second substances,
denotes the X pointing angle, theta denotes the Y pointing angle, X1Projection of a vector X representing a cluster of view vectors on the X-axis of the system in the satellite, X2Projection of a vector X representing a cluster of view vectors on the y-axis of the system in the satellite, X3The projection of a vector X representing a view vector cluster on the z-axis of the system in the satellite represents a set.
4. The method for analyzing the influence of angular deformation of the satellite-borne microwave remote sensing instrument on the angular vector according to claim 1, wherein the sensitivity of the view vector to the angular deformation is defined as the ratio of the deviation of the Y pointing angle between the view vector at the actual center and the view vector at the nominal center to the angular deformation, or the ratio of the deviation of the X pointing angle to the angular deformation, and the influence of the angular deformation on the pointing direction of the view vector is represented by the variation curve of the sensitivity of the angular deformation along with the rotation scanning angle:
wherein α represents a rotational scan angle; Δ β represents an angular deformation amount of the reflecting surface; Φ () represents the X pointing angle sensitivity; Θ () represents the Y pointing angle sensitivity;
respectively representing an X pointing angle after deformation and an X pointing angle before deformation;
representing the amount of change in the X pointing angle before and after deformation; theta (),
respectively representing a Y pointing angle after deformation and a Y pointing angle before deformation; Δ θ () represents the amount of change in the Y pointing angle before and after the deformation.
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| CN111103001B (en) * | 2020-01-21 | 2021-06-22 | 上海航天测控通信研究所 | Motion scanning device and method for stationary track microwave radiometer |
| CN111427000A (en) * | 2020-03-19 | 2020-07-17 | 上海卫星工程研究所 | Target view vector determination method suitable for pointing of ground survey station antenna to satellite |
| CN113063440B (en) * | 2021-02-26 | 2022-12-27 | 上海卫星工程研究所 | Full-physical simulation test method and system for image positioning and registration of stationary orbit microwave detection satellite |
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