CN109828160B - Automatic test system and method based on DSP high-frequency phase shift - Google Patents
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Abstract
The invention discloses an automatic test system and method based on DSP high-frequency phase shift, firstly an external instruction interpretation module (2) decomposes an instruction (A) input by an external instruction input module (1) to form three instructions: a command to perform a high frequency phase shift automatic test (a1), a command to test the Y/Z direction (a2), and an angular offset (A3). When the command (A1) for automatically testing whether the high-frequency phase shift is performed is 1, the angle parameter adjusting module (3) firstly judges the command (A2) for testing the Y/Z direction, and if the command is 1, the high-frequency phase shift in the Y direction is determined according to the angle offset (A3); if it is 0, the high-frequency phase shift in the Z direction is determined from the angular offset (a 3). The angle error storage module (4) stores the angle errors under different high-frequency phase shifts in the Y/Z direction. The high-frequency phase shift selection module (5) compares the stored angular error magnitude, and selects the corresponding high-frequency phase shift as the optimal high-frequency phase shift when the angular error is maximum. The method improves the testing efficiency.
Description
Technical Field
The invention relates to the technical field of testing of high-frequency phase shift, in particular to an automatic testing system and method based on DSP high-frequency phase shift.
Background
At present, high-frequency phase shift testing requires on-line running of a program, offset angles are manually modified, testing efficiency is low, and particularly after software is solidified, manual testing brings risks to program stability and greatly reduces testing efficiency.
Disclosure of Invention
In view of the above technical problems, the present invention provides an automatic testing system and method based on DSP high frequency phase shift to solve the problem of low testing efficiency caused by manual angle modification.
The automatic test system based on DSP high-frequency phase shift comprises: the device comprises an external instruction input module, an external instruction interpretation module, an angle parameter adjusting module, an angle error storage module and a high-frequency phase shift selection module; the external instruction input module inputs an instruction, and the instruction is used for controlling whether to perform automatic test of high-frequency phase shift and test Y/Z direction and angle offset; the external instruction interpretation module decomposes the input instruction of the external instruction input module to form three instructions: whether to carry on the order of the high-frequency phase shift automatic test, order and angle offset of the test Y/Z direction; when the instruction for carrying out the high-frequency phase shift automatic test is 1, carrying out the high-frequency phase shift automatic test; when the command for carrying out the high-frequency phase shift automatic test is 0, the high-frequency phase shift automatic test is not carried out; when the instruction for testing the Y/Z direction is 1, carrying out automatic testing on the high-frequency phase shift in the Y direction; when the instruction for testing the Y/Z direction is 0, carrying out automatic test on the Z-direction high-frequency phase shift; the angle parameter adjusting module determines whether to perform automatic test of high-frequency phase shift, test in Y or Z direction and the degree of current high-frequency phase shift according to the read command of automatic test of high-frequency phase shift, the command of test in Y/Z direction and the angle offset, and performs high-frequency phase shift adjustment; the angle error storage module stores angle errors in different high-frequency phase shifts in the Y/Z direction; and the high-frequency phase shift selection module selects the corresponding high-frequency phase shift as the optimal high-frequency phase shift in the Y/Z direction when the angle error in the Y/Z direction is the maximum value.
The external instruction interpretation module decomposes the instruction input by the external instruction input module, and the process is as follows: the external instruction interpretation module decomposes the instruction input by the external instruction input module into 32-bit integer data, wherein the 8 th bit is an instruction for automatically testing whether to perform high-frequency phase shift; the 7 th bit is an instruction for testing the Y/Z direction; the low 6 bits are angle offset, the angle offset is 6 binary numbers, the angle offset represents 0-35 as effective values, the step is 10 degrees, and the step represents that the high-frequency phase shift traverses 0-350 degrees respectively.
The process of adjusting the angle parameters by the angle parameter adjusting module is as follows: when the command of automatically testing whether the high-frequency phase shift is performed is 0, the angle is not adjusted; when the instruction of automatically testing whether the high-frequency phase shift is performed is 1, the angle parameter adjusting module firstly judges the instruction of testing the Y/Z direction, and if the instruction of testing the Y/Z direction is 1, the high-frequency phase shift of the Y direction is determined according to the angle offset; and if the test Y/Z direction command is 0, determining the high-frequency phase shift in the Z direction according to the angle offset.
The process of storing the angular errors under different high-frequency phase shifts by the angular error storage module is as follows: when the command of automatically testing whether the high-frequency phase shift is performed is 0, the angular error is not stored; and when the command of automatically testing whether the high-frequency phase shift is performed is 1, the angle error storage module stores the angle errors in different high-frequency phase shifts in the Y/Z direction.
The optimal high-frequency phase shift selecting process of the high-frequency phase shift selecting module comprises the following steps: and the high-frequency phase shift selection module compares the angular error of the high-frequency phase shift traversing 0-350 degrees on the premise of unchanging the preset angular deviation, and selects the corresponding high-frequency phase shift as the optimal high-frequency phase shift when the angular error is the maximum value.
The invention also provides an automatic test method of the high-frequency phase shift, which comprises the following steps: inputting an external command, wherein the external command is used for controlling whether to perform automatic test of high-frequency phase shift or not, and testing Y/Z direction and angle offset; second, the external instruction is decomposed to form three instructions: whether to carry on the order of the high-frequency phase shift automatic test, order and angle offset of the test Y/Z direction; when the instruction for carrying out the high-frequency phase shift automatic test is 1, carrying out the high-frequency phase shift automatic test; when the command for carrying out the high-frequency phase shift automatic test is 0, the high-frequency phase shift automatic test is not carried out; when the instruction for testing the Y/Z direction is 1, carrying out automatic testing on the high-frequency phase shift in the Y direction; when the instruction for testing the Y/Z direction is 0, carrying out automatic test on the Z-direction high-frequency phase shift; thirdly, determining whether to perform automatic test of high-frequency phase shift, test in Y or Z direction and the degree of current high-frequency phase shift according to the read command of automatic test of high-frequency phase shift, the command of testing in Y/Z direction and the angle offset, and performing high-frequency phase shift adjustment; fourthly, storing the angle errors under different high-frequency phase shifts in the Y/Z direction; fifthly, selecting the corresponding high-frequency phase shift as the optimal high-frequency phase shift in the Y/Z direction when the angle error in the Y/Z direction is maximum; therefore, the automatic testing process based on the DSP high-frequency phase shift is realized.
In the second step, the process of decomposing the input instruction a is as follows: decomposing an input instruction into 32-bit integer data, wherein the 8 th bit is an instruction for automatically testing whether to perform high-frequency phase shift; the 7 th bit is an instruction for testing the Y/Z direction; the low 6 bits are angle offset, the angle offset is 6 binary numbers, the angle offset represents 0-35 as effective values, the step is 10 degrees, and the step represents that the high-frequency phase shift traverses 0-350 degrees respectively.
In the third step, the process of adjusting the angle parameter is as follows: when the command of automatically testing whether the high-frequency phase shift is performed is 0, the angle is not adjusted; when the instruction of automatically testing whether the high-frequency phase shift is performed is 1, the angle parameter adjusting module firstly judges the instruction of testing the Y/Z direction, and if the instruction of testing the Y/Z direction is 1, the high-frequency phase shift of the Y direction is determined according to the angle offset; and if the test Y/Z direction command is 0, determining the high-frequency phase shift in the Z direction according to the angle offset.
In the fifth step, the process of storing the angular errors of the different high-frequency phase shifts is as follows: when the command of automatically testing whether the high-frequency phase shift is performed is 0, the angular error is not stored; when the instruction of automatically testing whether to perform high-frequency phase shift is 1, the angular error under different high-frequency phase shifts in the Y/Z direction is stored.
In the sixth step, the process of selecting the optimal high-frequency phase shift is as follows: and on the premise that the preset angular deviation is not changed, comparing the angular error of the high-frequency phase shift traversing 0-350 degrees, and selecting the corresponding high-frequency phase shift as the optimal high-frequency phase shift when the angular error is the maximum value.
The invention solves the problem of low testing efficiency caused by manual testing. The invention is applied to a plurality of projects, and has the characteristics of reliability, flexibility, practicability, stable function and good effect.
Drawings
Fig. 1 is a schematic structural diagram of a high-frequency phase shift automatic test system in an automatic test method based on DSP high-frequency phase shift.
Fig. 2 is a process of decomposing the instruction input by the external instruction interpretation module.
1. External instruction input module 2, external instruction interpretation module 3, angle parameter adjustment module 4, angle error storage module 5 and high-frequency phase shift selection module
Detailed Description
The following detailed description of the embodiments of the present invention is made with reference to fig. 1-2.
The automatic test system based on DSP high-frequency phase shift comprises: the device comprises an external instruction input module 1, an external instruction interpretation module 2, an angle parameter adjusting module 3, an angle error storage module 4 and a high-frequency phase shift selection module 5.
The external instruction input module 1 inputs an instruction a, which is used for controlling whether to perform automatic testing of high-frequency phase shift and testing of Y/Z direction and angle offset.
The external instruction interpretation module 2 decomposes the input instruction a of the external instruction input module 1 to form three instructions: a command a1 of whether to perform the high frequency phase shift automatic test, a command a2 of the test Y/Z direction, and an angular offset A3. The external instruction interpretation module 2 decomposes the instruction a input by the external instruction input module 1 into 32-bit integer data, wherein the 8 th bit is an instruction a1 for performing automatic test on high-frequency phase shift; bit 7 is test Y/Z direction instruction A2; the lower 6 bits are angle offset A3, the offset A3 is a 6-bit binary number, which represents 0-35 as effective value, the step is 10 degrees, and represents the high frequency phase shift traversing 0-350 degrees respectively.
When the instruction A1 for carrying out the high-frequency phase shift automatic test is 1, carrying out the high-frequency phase shift automatic test; when the instruction A1 for performing the high-frequency phase shift automatic test is 0, the high-frequency phase shift automatic test is not performed; when the instruction A2 for testing the Y/Z direction is 1, carrying out automatic test on the high-frequency phase shift in the Y direction; and when the instruction A2 for testing the Y/Z direction is 0, the automatic test of the Z-direction high-frequency phase shift is carried out.
The angle parameter adjusting module 3 determines whether to perform the automatic test of the high-frequency phase shift, the test in the Y or Z direction, and the current degree of the high-frequency phase shift according to the interpreted command a1 of the automatic test of the high-frequency phase shift, the command a2 of the test in the Y/Z direction, and the angle offset A3, and performs corresponding phase adjustment. When the command a1 for performing automatic test of high-frequency phase shift is 0, no angle adjustment is performed; when the command a1 for automatically testing whether to perform the high frequency phase shift is 1, the angle parameter adjustment module 3 first determines the command a2 for testing the Y/Z direction, and if the command a2 for testing the Y/Z direction is 1, determines the high frequency phase shift in the Y direction according to the angle offset A3; if the test Y/Z direction command A2 is 0, then the high frequency phase shift in the Z direction is determined based on the angular offset A3.
When the command A1 for automatically testing whether the high-frequency phase shift is performed is 0, the angular error is not stored; when the instruction a1 for performing the automatic test of the high-frequency phase shift is 1, the angular error storage block 4 stores the angular errors at different high-frequency phase shifts in the Y/Z direction.
And the high-frequency phase shift selection module 5 selects the corresponding high-frequency phase shift as the optimal high-frequency phase shift in the Y/Z direction when the maximum value of the angular error in the Y/Z direction is selected. The high-frequency phase shift selection module (5) compares the angular error of the high-frequency phase shift traversing 0-350 degrees on the premise that the preset angular deviation is not changed, and selects the corresponding high-frequency phase shift as the optimal high-frequency phase shift when the maximum value of the angular error is selected.
Examples
The method for testing by using the automatic testing system based on the DSP high-frequency phase shift comprises the following steps:
firstly, constructing an automatic test system of high-frequency phase shift
An automatic test system for high frequency phase shifting, comprising: the device comprises an external instruction input module 1, an external instruction interpretation module 2, an angle parameter adjusting module 3, an angle error storage module 4 and a high-frequency phase shift selection module 5.
And secondly, inputting an instruction A by the external instruction input module 1, wherein the instruction A is used for controlling whether to perform automatic test of high-frequency phase shift and test Y/Z direction and angle offset.
Thirdly, referring to fig. 2, the external instruction interpretation module 2 decomposes the instruction a input by the external instruction input module 1 to form three instructions: a command a1 to perform automatic test of high frequency phase shift, a command a2 to test Y/Z direction, and an angular offset A3. When the instruction A1 is 1, performing automatic test of high-frequency phase shift; the automatic test for high frequency phase shift is not performed when command a1 is 0. When the instruction A2 is 1, carrying out automatic test of high-frequency phase shift in the Y direction; the automatic test of the Z-direction high frequency phase shift is performed with command a2 being 0. The lower 6 bits are angle offset A3, the offset A3 is a 6-bit binary number, which represents 0-35 as effective value, the step is 10 degrees, and represents the high frequency phase shift traversing 0-350 degrees respectively.
Fourthly, the angle parameter adjusting module 3 determines whether to perform automatic test of high frequency phase shift, test in the Y or Z direction and the current degree of high frequency phase shift according to the interpreted commands A1, A2 and A3.
Fifthly, storing the angle error under different high-frequency phase shifts in the Y/Z direction by an angle error storage module 4;
sixthly, the high-frequency phase shift selection module 5 selects the corresponding high-frequency phase shift as the optimal high-frequency phase shift in the Y/Z direction when the maximum value of the angular error in the Y/Z direction is selected;
further, in the second step, the external instruction input module 1 inputs an instruction a for controlling whether to perform an automatic test of high-frequency phase shift, and test Y/Z directions and angular offsets.
Further, in the third step, referring to fig. 2, the specific process of decomposing the instruction a input by the external instruction interpretation module 2 through the external instruction input module 1 is as follows:
the external instruction interpretation module 2 takes the instruction A input by the external instruction input module 1 as 32-bit integer data, the 8 th bit is an instruction A1 for automatically testing whether to perform high-frequency phase shift, and the instruction A1 is 1 for automatically testing the high-frequency phase shift; the automatic test for high frequency phase shift is not performed when command a1 is 0. The 7 th bit is an instruction A2 for testing the Y/Z direction, and when the instruction A2 is 1, the automatic test of the high-frequency phase shift in the Y direction is carried out; the automatic test of the Z-direction high frequency phase shift is performed with command a2 being 0. The lower 6 bits are angle offset A3, the offset A3 is a 6-bit binary number, which represents 0-35 as effective value, the step is 10 degrees, and represents the high frequency phase shift traversing 0-350 degrees respectively.
Further, in the fourth step, the specific process of adjusting the angle parameter is as follows:
when the command a1 for performing the automatic test of whether or not to perform the high-frequency phase shift is 0, the angle adjustment is not performed. When the command a1 for automatically testing whether the high frequency phase shift is performed is 1, the angle parameter adjustment module 3 firstly judges a command a2 for testing the Y/Z direction, and if a2 is 1, determines the high frequency phase shift in the Y direction according to the angle offset A3; if A2 is 0, then the high frequency phase shift in the Z direction is determined from the angular offset A3. The angular offset A3, 0-35 is effective value, the step is 10 degrees, respectively representing the high frequency phase shift traversal 0-350 degrees.
Further, in the fifth step, the specific process of storing the angular errors of the different high-frequency phase shifts is as follows:
when the instruction a1 for performing automatic test of whether to perform high-frequency phase shift is 0, the angular error storage is not performed. When the instruction a1 for performing the automatic test of the high-frequency phase shift is 1, the angular error storage block 4 stores the angular errors at different high-frequency phase shifts in the Y/Z direction.
Further, in the sixth step, the specific process of selecting the optimal high-frequency phase shift is as follows:
and the high-frequency phase shift selection module 5 compares the angular error of the high-frequency phase shift traversing 0-350 degrees on the premise that the preset angular deviation is not changed, and selects the corresponding high-frequency phase shift as the optimal high-frequency phase shift when the angular error is the maximum value.
Therefore, the automatic testing process based on the DSP high-frequency phase shift is realized.
The invention solves the problem of low testing efficiency caused by manual testing. The invention is applied to a plurality of projects, and has the characteristics of reliability, flexibility, practicability, stable function and good effect.
Claims (10)
1. An automatic test system based on DSP high frequency phase shift, characterized in that the automatic test system comprises: the device comprises an external instruction input module (1), an external instruction interpretation module (2), an angle parameter adjusting module (3), an angle error storage module (4) and a high-frequency phase shift selection module (5); wherein the content of the first and second substances,
the external instruction input module (1) inputs an instruction (A), and the instruction (A) is used for controlling whether to perform automatic test of high-frequency phase shift and test Y/Z direction and angle offset;
the external instruction interpretation module (2) decomposes the input instruction (A) of the external instruction input module (1) to form three instructions: a command (A1) for performing a high-frequency phase shift automatic test, a command (A2) for testing the Y/Z direction, and an angle offset (A3); when the instruction (A1) for automatically testing whether to perform high-frequency phase shift is 1, automatically testing the high-frequency phase shift; when the instruction (A1) for automatically testing whether to perform high-frequency phase shift is 0, automatically testing the high-frequency phase shift is not performed; when the instruction (A2) for testing the Y/Z direction is 1, carrying out automatic test on the high-frequency phase shift in the Y direction; when the instruction (A2) for testing the Y/Z direction is 0, the automatic test of the Z-direction high-frequency phase shift is carried out;
the angle parameter adjusting module (3) determines whether to perform automatic test of high-frequency phase shift, test in Y or Z direction and the degree of current high-frequency phase shift according to the read command (A1) of whether to perform automatic test of high-frequency phase shift, the command (A2) of testing Y/Z direction and the angle offset (A3), and performs high-frequency phase shift adjustment;
the angle error storage module (4) stores the angle errors in different high-frequency phase shifts in the Y/Z direction;
and the high-frequency phase shift selection module (5) selects the corresponding high-frequency phase shift as the optimal high-frequency phase shift in the Y/Z direction when the maximum value of the angular error in the Y/Z direction is selected.
2. The DSP high-frequency phase shift-based automatic test system according to claim 1, wherein the external instruction interpretation module (2) decomposes the instruction (A) input by the external instruction input module (1) into:
the external instruction interpretation module (2) decomposes the instruction (A) input by the external instruction input module (1) into 32-bit integer data, wherein the 8 th bit is an instruction (A1) for automatically testing whether to perform high-frequency phase shift; bit 7 is a test Y/Z direction instruction (A2); the lower 6 bits are angle offset (A3), the angle offset (A3) is a 6-bit binary number, which represents 0-35 as effective value, the step is 10 degrees, and represents the high frequency phase shift traversing 0-350 degrees respectively.
3. The DSP high frequency phase shift based automatic test system according to claim 1, wherein the angle parameter adjusting module (3) adjusts the angle parameter by:
when the command (a1) for performing the automatic test of high-frequency phase shift is 0, no angle adjustment is performed; when the command (A1) for automatically testing whether the high-frequency phase shift is performed is 1, the angle parameter adjusting module (3) firstly judges the command (A2) for testing the Y/Z direction, and if the command (A2) for testing the Y/Z direction is 1, the high-frequency phase shift in the Y direction is determined according to the angle offset (A3); if the test Y/Z direction command (A2) is 0, then the high frequency phase shift in the Z direction is determined based on the angular offset (A3).
4. The DSP high frequency phase shift based automatic test system according to claim 1, wherein the angular error storage module (4) stores angular errors under different high frequency phase shifts by:
when the instruction (a1) whether to perform the automatic test of the high frequency phase shift is 0, the angular error storage is not performed; when the instruction (A1) for automatically testing whether to perform high-frequency phase shift is 1, the angular error storage module (4) stores the angular errors in different high-frequency phase shifts in the Y/Z direction.
5. The DSP high frequency phase shift based automatic test system according to claim 1, wherein the process of selecting the optimal high frequency phase shift by the high frequency phase shift selection module (5) is as follows:
and the high-frequency phase shift selection module (5) compares the angular error of the high-frequency phase shift traversing 0-350 degrees on the premise that the preset angular deviation is not changed, and selects the corresponding high-frequency phase shift as the optimal high-frequency phase shift when the angular error is the maximum value.
6. A method for automatic testing of high frequency phase shifts, the method comprising the steps of:
firstly, inputting an external command (A) which is used for controlling whether to carry out automatic test of high-frequency phase shift or not and testing Y/Z direction and angle offset;
second, the external instruction (a) is decomposed to form three instructions: a command (A1) for performing a high-frequency phase shift automatic test, a command (A2) for testing the Y/Z direction, and an angle offset (A3); when the instruction (A1) for automatically testing whether to perform high-frequency phase shift is 1, automatically testing the high-frequency phase shift; when the instruction (A1) for automatically testing whether to perform high-frequency phase shift is 0, automatically testing the high-frequency phase shift is not performed; when the instruction (A2) for testing the Y/Z direction is 1, carrying out automatic test on the high-frequency phase shift in the Y direction; when the instruction (A2) for testing the Y/Z direction is 0, the automatic test of the Z-direction high-frequency phase shift is carried out;
thirdly, determining whether to perform automatic test of high-frequency phase shift, test in Y or Z direction and the degree of current high-frequency phase shift according to the interpreted command (A1) of whether to perform automatic test of high-frequency phase shift, the command (A2) of testing Y/Z direction and the angle offset (A3), and performing high-frequency phase shift adjustment;
fourthly, storing the angle errors under different high-frequency phase shifts in the Y/Z direction;
fifthly, selecting the corresponding high-frequency phase shift as the optimal high-frequency phase shift in the Y/Z direction when the angle error in the Y/Z direction is maximum;
therefore, the automatic testing process based on the DSP high-frequency phase shift is realized.
7. The method of claim 6, wherein in the second step, the input command A is decomposed by:
decomposing an input instruction (A) into 32-bit integer data, wherein the 8 th bit is an instruction (A1) for performing automatic test whether to perform high-frequency phase shift; bit 7 is a test Y/Z direction instruction (A2); the lower 6 bits are angle offset (A3), the angle offset (A3) is a 6-bit binary number, which represents 0-35 as effective value, the step is 10 degrees, and represents the high frequency phase shift traversing 0-350 degrees respectively.
8. The method according to claim 6, wherein in the third step, the process of adjusting the angle parameter is:
when the command (a1) for performing the automatic test of high-frequency phase shift is 0, no angle adjustment is performed; when the command (A1) for automatically testing whether the high-frequency phase shift is performed is 1, firstly, the command (A2) for testing the Y/Z direction is judged, and if the command (A2) for testing the Y/Z direction is 1, the high-frequency phase shift in the Y direction is determined according to the angle offset (A3); if the test Y/Z direction command (A2) is 0, then the high frequency phase shift in the Z direction is determined based on the angular offset (A3).
9. The method of claim 6, wherein in the fifth step, the procedure of storing the angle error of the phase shift of different high frequencies is:
when the instruction (a1) whether to perform the automatic test of the high frequency phase shift is 0, the angular error storage is not performed; when the instruction (a1) whether to perform the automatic test of the high frequency phase shift is 1, the angular errors at different high frequency phase shifts in the Y/Z direction are stored.
10. The method according to claim 6, wherein in the sixth step, the optimal high frequency phase shift is selected by:
and on the premise that the preset angular deviation is not changed, comparing the angular error of the high-frequency phase shift traversing 0-350 degrees, and selecting the corresponding high-frequency phase shift as the optimal high-frequency phase shift when the angular error is the maximum value.
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