CN109799473A

CN109799473A - Measurement data calibration method and device for electric system

Info

Publication number: CN109799473A
Application number: CN201910144004.XA
Authority: CN
Inventors: 王飞; 曹祯; 赵吉生; 秦雷鸣
Original assignee: Siemens Power Automation Ltd
Current assignee: Siemens Power Automation Ltd
Priority date: 2019-02-26
Filing date: 2019-02-26
Publication date: 2019-05-24
Anticipated expiration: 2039-02-26
Also published as: CN109799473B

Abstract

The present invention provides the measurement data calibration method and device for electric system, which includes: the raw measurement data for obtaining measuring device and measuring；Acquire the environment temperature of the measuring device local environment；Model and the environment temperature are generated according to preset calibration parameter, obtains target alignment parameter corresponding with the environment temperature, wherein the calibration parameter generates model and created according to the calibration parameter of the measuring device and the corresponding relationship of temperature；The raw measurement data is calibrated according to the target alignment parameter, obtains calibration measurement data.This programme can reduce in temperature fluctuation compared with the cost for carrying out DATA REASONING in overall situation.

Description

Measurement data calibration method and device for electric system

Technical field

The present invention relates to electric power project engineering fields, more particularly, to the measurement data calibration method and dress of electric system It sets.

Background technique

In power engineering field, it is often necessary to being set to work of the temperature fluctuation compared with power equipment or component in overall situation It is detected as state, for example needs to measure the current or voltage of outdoor electric cable during power transmission.Due to open air The range of temperature of environment is wider, and the measurement accuracy of conventional measuring device can change with the change of temperature, therefore It is difficult to obtain accurate and stable measurement data by conventional measuring device in the biggish measurement environment of temperature fluctuation.

Currently, being needed in order to obtain accurate and stable measurement data in the biggish measurement environment of temperature fluctuation Using the precision measurement equipment for all having degree of precision and stability at different temperatures, the component in precision measurement equipment is opposite Component in conventional measuring device has higher performance, and the cost of component increases with the raising of performance, thus accurate Measuring device cost with higher, and then cause in temperature fluctuation compared with the higher cost for carrying out DATA REASONING in overall situation.

Summary of the invention

In view of this, can reduce provided by the present invention for the measurement data calibration method and device of electric system Temperature fluctuation is compared with the cost for carrying out DATA REASONING in overall situation.

In a first aspect, the embodiment of the invention provides a kind of measurement data calibration methods for electric system, comprising:

Obtain the raw measurement data that measuring device is measured；

Acquire the environment temperature of the measuring device local environment；

Model and the environment temperature are generated according to preset calibration parameter, is obtained corresponding with the environment temperature Target alignment parameter, wherein the calibration parameter generates model according to the calibration parameter of the measuring device and pair of temperature It should be related to and create；

The raw measurement data is calibrated according to the target alignment parameter, obtains calibration measurement data.

In the first possible implementation, according in a first aspect, described raw according to preset calibration parameter Further comprise before obtaining target alignment parameter corresponding with the environment temperature at model and the environment temperature:

At least two reference temperatures are chosen from the corresponding temperature change section of the measuring device local environment；

For reference temperature described in each, according to the measuring device under the reference temperature measurement data and true number According to difference, determine the corresponding calibration parameter of the reference temperature；

Generation includes the inquiry tables of data of corresponding relationship between each reference temperature and the corresponding calibration parameter, Wherein, the inquiry tables of data is for inquiring the target alignment parameter corresponding with the environment temperature；

Creation includes that the calibration parameter of the inquiry tables of data generates model.

In the second possible implementation, described from the measuring device according to the first possible implementation Local environment chooses at least two reference temperatures in corresponding temperature change section, comprising:

According to the required precision to the calibration measurement data, determine that reference temperature is distributed granularity；

It is distributed granularity according to the reference temperature, is selected from the corresponding temperature change section of the measuring device local environment At least two reference temperatures are taken, so that the difference of the adjacent reference temperature of any two is corresponding with the distribution granularity.

In the third possible implementation, described from the measuring device according to the first possible implementation Local environment chooses at least two reference temperatures in corresponding temperature change section, comprising:

It is low-temperature range, medium temperature section and high temperature by the corresponding temperature change interval division of the measuring device local environment Section；

At least two are respectively chosen from the low-temperature range, the medium temperature section and the high temperature section respectively with reference to temperature Degree, wherein the difference of the adjacent reference temperature of any two is less than in described in the low-temperature range and the high temperature section The difference of the adjacent reference temperature of middle any two between warm area.

In the fourth possible implementation, according in a first aspect, described raw according to preset calibration parameter Further comprise before obtaining target alignment parameter corresponding with the environment temperature at model and the environment temperature:

According to the measuring device, measurement data and corresponding truthful data, fitting are following based at different temperatures Calculate the formula group of target offset parameter included by the target alignment parameter and target factor parameter；

Wherein, the m_tCharacterization corresponds to the target offset parameter of the environment temperature t；The f_tCharacterization corresponds to The target factor parameter of the environment temperature t；The t_iIts institute when characterizing the measuring device i-th measuring before this Locate the environment temperature of environment；It is describedWith it is describedFor the measuring device, i-th measures and intends characterization before this respectively Two weight coefficients closed out, andIt is describedThe measuring device is characterized for the measuring device I-th measures and calculated offset parameter before this；It is describedCharacterize the measuring device for the measuring device this Preceding i-th measures and calculated figure parameters；The n characterization is greater than or equal to 1 positive integer；

Creation includes that the calibration parameter of the formula group generates model.

In a fifth possible implementation, with reference to first aspect, the first possible implementation, second may Implementation, any one in the third possible implementation and the 4th kind of possible implementation, it is described according to institute It states target alignment parameter to calibrate the raw measurement data, obtains calibration measurement data, comprising:

Obtain the target offset parameter and target factor parameter that the target alignment parameter includes；

The raw measurement data, the target offset parameter and the target factor parameter are substituted into following formula, meter Calculate the calibration measurement data；

M_corrected=(M_original-m_t)·f_t

Wherein, the M_correcteCharacterize the calibration measurement data, the M_originalThe raw measurement data is characterized, The m_tCharacterize the target offset parameter, the f_tCharacterize the target factor parameter.

Second aspect, the embodiment of the invention also provides a kind of measurement data calibrating installations for electric system, comprising:

One data acquisition module, the raw measurement data measured for obtaining measuring device；

One temperature collecting module, for acquiring the environment temperature of the measuring device local environment；

One parameter determination module, for according to preset calibration parameter generation module and the temperature collecting module The collected environment temperature obtains target alignment parameter corresponding with the environment temperature, wherein the calibration parameter Model is generated to be created according to the calibration parameter of the measuring device and the corresponding relationship of temperature；

One data calibration module, the target alignment parameter for being got according to the parameter determination module is to institute It states the raw measurement data that data acquisition module is got to be calibrated, obtains calibration measurement data.

In the first possible implementation method, calibrated according to the measurement data for electric system that second aspect provides Device, which further comprises:

One temperature chooses module, for chosen from the corresponding temperature change section of the measuring device local environment to Few two reference temperatures；

One parameter generation module, for choosing each described reference temperature that module selects for the temperature, According to the difference of measuring device measurement data and truthful data under the reference temperature, the corresponding calibration of the reference temperature is determined Parameter；

One table generation module includes each reference temperature that the temperature chooses that module selects for generating The inquiry tables of data of corresponding relationship between the corresponding calibration parameter determined to the parameter generation module, wherein described to look into Tables of data is ask for inquiring the target alignment parameter corresponding with the environment temperature；

One the first model creation module includes the table generation module inquiry data generated for creating The calibration parameter of table generates model, and the inquiry tables of data is used to obtain the target alignment for the parameter determination module Parameter uses.

In the second possible implementation, electric system is used for according to provided by the first possible implementation Measurement data calibrating installation, the temperature chooses module and includes:

One granularity determines submodule, for the required precision according to the calibration measurement data, determines reference temperature point Cloth granularity；

One the first temperature selects submodule, for determining the reference temperature that submodule is determined according to the granularity It is distributed granularity, chooses at least two reference temperatures from the corresponding temperature change section of the measuring device local environment, so that The difference of the adjacent reference temperature of any two is corresponding with the distribution granularity.

In the third possible implementation, electric system is used for according to provided by the first possible implementation Measurement data calibrating installation, the temperature chooses module and includes:

One temperature range divides submodule, for drawing the corresponding temperature change section of the measuring device local environment It is divided into low-temperature range, medium temperature section and high temperature section；

One second temperature selects submodule, marks off for respectively from temperature range division submodule described low Respectively choose at least two reference temperatures between warm area, in the medium temperature section and the high temperature section, wherein the low-temperature range and The difference of the adjacent reference temperature of any two is less than the adjacent institute of any two in the medium temperature section in the high temperature section State the difference of reference temperature.

In the fourth possible implementation, it is calibrated according to the measurement data for electric system that second aspect provides Device, which further comprises:

One formula fitting module, for according to the measuring device at different temperatures measurement data with it is corresponding very Real data, fitting is as follows for calculating the formula of target offset parameter and target factor parameter included by the target alignment parameter Group；

One the second model creation module includes the formula group of the formula fitting module fits out for creating The calibration parameter generate model.

In a fifth possible implementation, in conjunction with second aspect, the first possible implementation, second of possibility Implementation, any one in the third possible implementation and the 4th kind of possible implementation, the data school Quasi-mode block includes:

One calibration parameter acquisition submodule, for obtaining the target offset parameter and mesh that the target alignment parameter includes Mark figure parameters；

One calibration operation submodule, for obtaining the raw measurement data and the calibration parameter acquisition submodule The target offset parameter got and the target factor parameter substitute into following formula, calculate the calibration measurement data；

M_corrected=(M_original-m_t)·f_t

Wherein, the M_correctedCharacterize the calibration measurement data, the M_originalThe raw measurement data is characterized, The m_tCharacterize the target offset parameter, the f_tCharacterize the target factor parameter.

The third aspect, the embodiment of the invention also provides another measurement data calibrating installation for being used for electric system, packets It includes: at least one processor and at least one processor；

At least one processor, for storing machine readable program；

At least one described processor executes above-mentioned first aspect and first for calling the machine readable program Method provided by the possible implementation of any one of aspect.

Fourth aspect, the embodiment of the invention also provides a kind of computer-readable medium, on the computer-readable medium It is stored with computer instruction, the computer instruction makes the processor execute above-mentioned first aspect when being executed by processor And method provided by any one possible implementation of first aspect.

As shown from the above technical solution, it is created previously according to the corresponding relationship of the calibration parameter of measuring device and temperature opposite The calibration parameter answered generates model, and the environment temperature of measuring device local environment is acquired during measuring device measures Degree, after getting raw measurement data measured by measuring device, according to the calibration parameter that is pre-created generate model and Collected environment temperature obtains target alignment parameter corresponding with environment temperature, and then can be according to target alignment parameter pair Raw measurement data is calibrated, and the calibration measurement data being more nearly with truthful data are obtained.It can be seen that being set according to measurement The environment temperature of standby local environment calibrates the raw measurement data that measuring device is measured, and obtains with truthful data more Close calibration measurement data, due to the precision measurement equipment without using price costly, it is only necessary to which conventional measurement is set It is standby to obtain accurate measurement result at a temperature of varying environment, to reduce in temperature fluctuation compared with being counted in overall situation According to the cost of measurement.

Detailed description of the invention

Fig. 1 is a kind of process of measurement data calibration method for electric system provided by one embodiment of the present invention Figure；

Fig. 2 is the flow chart that a kind of calibration parameter provided by one embodiment of the present invention generates model creation method；

Fig. 3 is the flow chart that another calibration parameter provided by one embodiment of the present invention generates model creation method；

Fig. 4 is a kind of signal of measurement data calibrating installation for electric system provided by one embodiment of the present invention Figure；

Fig. 5 is a kind of survey for electric system including the first model creation module provided by one embodiment of the present invention Measure the schematic diagram of data calibration device；

Fig. 6 is that another kind provided by one embodiment of the present invention includes the first model creation module for electric system The schematic diagram of measurement data calibrating installation；

Fig. 7 be it is provided by one embodiment of the present invention another include the first model creation module for electric system The schematic diagram of measurement data calibrating installation；

Fig. 8 is a kind of survey for electric system including the second model creation module provided by one embodiment of the present invention Measure the schematic diagram of data calibration device；

Fig. 9 is the signal of another measurement data calibrating installation for electric system provided by one embodiment of the present invention Figure；

Figure 10 is that another measurement data calibrating installation for electric system provided by one embodiment of the present invention shows It is intended to.

Reference signs list:

101: obtaining the raw measurement data that measuring device is measured

102: the environment temperature of acquisition measuring device local environment

103: model being generated according to calibration parameter and environment temperature obtains corresponding target alignment parameter

104: raw measurement data being calibrated according to target alignment parameter, obtains calibration measurement data

201: at least two reference temperatures are chosen from temperature change section

202: the corresponding calibration parameter of the reference temperature is determined according to measurement data under reference temperature and the difference of truthful data

203: generation includes the inquiry tables of data of corresponding relationship between each reference temperature and corresponding calibration parameter

204: creation includes the calibration parameter generation model for inquiring tables of data

301: according to measuring device measurement data and truthful data fitting formula group at different temperatures

302: creation includes that the calibration parameter for the formula group being fitted generates model

401: data acquisition module 402: temperature collecting module 403: parameter determination module

404: data calibration module 405: temperature chooses module 406: parameter generation module

407: 408: the first model creation module 409 of table generation module: formula fitting module

410: the second model creation modules 4051: granularity determines that 4052: the first temperature of submodule selects submodule

4053: temperature range divides submodule 4054: second temperature selects submodule 4041: calibration parameter obtains submodule Block

4042: calibration operation submodule 501: memory 502: processor

Specific embodiment

As previously mentioned, currently in order to accurate and stable measurement number can be obtained in the biggish measurement environment of temperature fluctuation According to, need to measure using more accurate measuring device, precision measurement equipment require included various components all have compared with High performance, to guarantee to all have lesser performance inconsistency at different ambient temperatures, and the performance of component is straight in measuring device It connects and determines its cost, thus precision measurement equipment cost with higher, and then DATA REASONING is carried out using precision measurement equipment Higher cost.

In the embodiment of the present invention, the corresponding relationship of calibration parameter and temperature previously according to measuring device creates calibration parameter Model is generated, raw measurement data measured by measuring device is being got and is collecting the environment of measuring device local environment After temperature, model is generated according to calibration parameter and collected environment temperature obtains target alignment corresponding with environment temperature and joins Number, and then accessed raw measurement data is calibrated using target alignment parameter, obtain calibration measurement data.Pass through The environment temperature of conventional measuring device local environment calibrates raw measurement data measured by conventional measuring device, obtains With the lesser calibration measurement data of true value gap, without using expensive precision measurement equipment that can obtain Measurement result with high accuracy and stability is reduced and is counted in the equal biggish measurement environment of temperature fluctuations outdoors According to the cost of measurement.

With reference to the accompanying drawing to the measurement data calibration method and device provided in an embodiment of the present invention for electric system It is described in detail.

As shown in Figure 1, the embodiment of the invention provides a kind of measurement data calibration method for electric system, this method It may comprise steps of:

Step 101: obtaining the raw measurement data that measuring device is measured；

Step 102: the environment temperature of acquisition measuring device local environment；

Step 103: model and environment temperature being generated according to preset calibration parameter, obtained corresponding with environment temperature Target alignment parameter, wherein calibration parameter generate model according to the calibration parameter of measuring device and the corresponding relationship of temperature and Creation；

Step 104: raw measurement data being calibrated according to target alignment parameter, obtains calibration measurement data.

In embodiments of the present invention, the no sequencing of the execution of step 101 and step 102 can first carry out step 101 Step 102 is executed again, step 102 can also be first carried out and execute step 101 again, may also be performed simultaneously step 101 and step certainly Rapid 102, so that the time consistency that the acquisition time and environment temperature of raw measurement data are got, and then can make to obtain Calibration measurement data it is more accurate.

Measurement data calibration method provided in an embodiment of the present invention for electric system, previously according to the school of measuring device Quasi- parameter calibration parameter corresponding with the creation of the corresponding relationship of temperature generates model, during measuring device measures The environment temperature for acquiring measuring device local environment, after getting raw measurement data measured by measuring device, according to The calibration parameter being pre-created generates model and collected environment temperature obtains target alignment ginseng corresponding with environment temperature Number, and then raw measurement data can be calibrated according to target alignment parameter, obtain the school being more nearly with truthful data Measurement data.It can be seen that the original measurement measured according to the environment temperature of measuring device local environment to measuring device Data are calibrated, the calibration measurement data being more nearly with truthful data are obtained, due to without using price costly Precision measurement equipment, it is only necessary to conventional measuring device can obtain accurate measurement result at a temperature of varying environment, thus It reduces in temperature fluctuation compared with the cost for carrying out DATA REASONING in overall situation.

In embodiments of the present invention, during being measured using measuring device to target component to be measured, Ke Yitong When the environment temperature of measuring device local environment is acquired so that the acquisition time of raw measurement data and environment temperature Acquisition time is consistent, and then correct target alignment parameter can be determined according to environment temperature, and guarantee is joined according to target alignment The accuracy that several pairs of raw measurement datas are calibrated reduces the gap between calibration measurement data and truthful data.

In embodiments of the present invention, when obtaining raw measurement data measured by measuring device, setting can be passed through Communication interface on measuring device is connected with measuring device, and then measured by communication interface to obtain measuring device Raw measurement data can also obtain raw measurement data transmitted by measuring device through wireless communication.

In embodiments of the present invention, the raw measurement data that measuring device is measured refers to that measuring device directly detects acquisition Parameter value, such as measuring device be used for measure power cable electric current when, the raw measurement data that measuring device is measured is i.e. The current value directly measured for measuring device.Correspondingly, raw measurement data can be the current value or voltage of power cable Value.

In embodiments of the present invention, measuring device can be used for measuring the parameters such as electric current, voltage in electric system, For example measuring device for measuring to the current or voltage on power transmission line, distribution wire, then measuring device sets for voltage measurement Standby or current measure device.

In embodiments of the present invention, temperature sensor can be set on measuring device, it is former in acquisition measuring device measurement While beginning measurement data, the temperature sensor being set on measuring device can acquire the environment temperature of measuring device local environment Degree, and then the environment temperature of measuring device local environment can be obtained from the temperature sensor being arranged on measuring device.

Optionally, on the basis of the measurement data calibration method shown in Fig. 1 for electric system, step 103 be will acquire To environment temperature input calibration parameter generate model to obtain corresponding target alignment parameter, need to create in advance before this It builds calibration parameter and generates model.It may include inquiry tables of data or formula group that calibration parameter, which generates model, by inquiring data The reference temperature that table includes can determine target alignment parameter corresponding with environment temperature with the corresponding relationship of calibration parameter, lead to Target alignment parameter corresponding with environment temperature can be calculated by crossing formula group.Therefore, model is generated according to calibration parameter Difference including content, creation calibration parameter, which generates model, has the following two kinds mode:

Mode one: creation includes the calibration parameter generation model for inquiring tables of data；

Mode two: creation includes that the calibration parameter of formula group generates model.

The mode for creating calibration parameter generation model to two kinds below is illustrated respectively:

For mode one:

As shown in Fig. 2, it may include walking as follows that creation, which includes the method for inquiring the calibration parameter generation model of tables of data, It is rapid:

Step 201: choosing at least two reference temperatures from the corresponding temperature change section of measuring device local environment；

Step 202: be directed to each reference temperature, according to measuring device under the reference temperature measurement data and true number According to difference, determine the corresponding calibration parameter of the reference temperature；

Step 203: generation includes the inquiry tables of data of corresponding relationship between each reference temperature and respective alignment parameter；

Step 204: creation includes the calibration parameter generation model for inquiring tables of data.

In embodiments of the present invention, temperature change section ring according to locating for measuring device of measuring device local environment The historical temperature data in border determines, for example, can according in historical temperature data temperature minimum point and thermal self-restraint stress come really Determine temperature change section.

In embodiments of the present invention, it is first determined the temperature change section of working environment locating for measuring device, later from true Multiple reference temperatures are chosen in the temperature change section made, measurement under each reference temperature is obtained by way of experiment and is set The difference of standby measurement data and truthful data, and then can be determined according to the difference of the measurement data and truthful data that get each The corresponding calibration parameter of a reference temperature, generate later record have it is corresponding between each reference temperature and corresponding calibration parameter The inquiry tables of data of relationship, final creation include the calibration parameter generation model for being generated inquiry tables of data.

For each reference temperature selected, is taken multiple measurements, obtained by measuring device under the reference temperature Obtain corresponding measurement data and truthful data when measuring each time, wherein measurement data refers to be treated using measuring device The numerical value that target component is measured and measured is surveyed, and truthful data is the real data of object to be measured parameter.For example, joining It examines at 10 DEG C of temperature, using the electric current on measuring device X measurement cable A, current value 1 measured by measuring device X is measurement Data, and measuring actual current value 2 on cable A is truthful data, which can be applied to electricity according to other instruments Electric current on cable A and obtain.

In embodiments of the present invention, truthful data can be measured by the measuring instrument with higher precision, can also be with Truthful data is controlled as variable.Specifically, under the same reference temperature, it can control object to be measured parameter as difference Truthful data, and then measure using measuring device the measurement data of object to be measured parameter under different truthful datas.For example, joining It examines at 10 DEG C of temperature, successively controlling the electric current on cable A is 1A, 2A, 5A and 10A, and measurement is utilized when electric current on cable A is 1A The electric current that equipment X is measured is I1, using the electric current that measuring device X is measured is I2 when electric current is 2A on cable A, on cable A Using the electric current that measuring device X is measured it is I3 when electric current is 5A, is measured when electric current on cable A is 10A using measuring device X Electric current is I4, then the corresponding measurement data of truthful data 1A is I1, and the corresponding measurement data of truthful data 2A is I2, truthful data The corresponding measurement data of 5A is I3, and the corresponding measurement data of truthful data 10A is I4.

In embodiments of the present invention, for each reference temperature selected, obtaining, multiple groups at this temperature are corresponding Measurement data and truthful data after, can determine to calibrate for the measurement data to measuring device under the reference temperature Calibration parameter.And then after getting the corresponding calibration parameter of each reference temperature, to each reference temperature with it is corresponding The corresponding relationship of calibration parameter carries out storage and obtains inquiry tables of data.

Calibration parameter can specifically include offset parameter and figure parameters, i.e., record has each reference in inquiry tables of data The corresponding offset parameter of temperature and a figure parameters, offset parameter and figure parameters are used to carry out raw measurement data Calibration.The concrete form for inquiring tables of data is as shown in table 1 below.It should be noted that offset parameter can be due to measuring device It is deviated caused by itself, unit is consistent with the unit of measurement data；Figure parameters can be number measured by measuring device Proportionate relationship between value and actual value, itself is a proportionality coefficient, specifically can be as shown in table 2.

Table 1

Reference temperature	Calibration parameter
		Reference temperature 1	Offset parameter 1& figure parameters 1
Reference temperature 2	Offset parameter 2& figure parameters 2
		Reference temperature 3	Offset parameter 3& figure parameters 3
Reference temperature 4	Offset parameter 4& figure parameters 4
		……	……

By taking measuring device is current measure device as an example, inquiry tables of data corresponding to the measuring device is as shown in table 2 below.

Table 2

Creation includes after the calibration parameter of inquiry tables of data generates model, collected environment temperature to be inputted and is calibrated After parameter generates model, calibration parameter generates each reference that model will can store in environment temperature and inquiry tables of data automatically Temperature is matched, and determines the object reference temperature to match with environment temperature, later will be corresponding with object reference temperature Standard parameter be determined as target alignment parameter corresponding with environment temperature.

After getting measuring device measurement data detected under different reference temperatures and truthful data, according to institute It obtains measurement data and determines corresponding calibration parameter under each reference temperature with the difference of truthful data, and then by each reference Corresponding relationship storage between temperature and corresponding calibration parameter is into inquiry tables of data.When measuring device detects original measurement After data, target alignment parameter corresponding with the environment temperature of measuring device local environment is inquired from inquiry tables of data, Raw measurement data can be calibrated according to the target alignment parameter got later, so as to easily determine mesh Calibration parameter is marked, and can guarantee the accuracy calibrated to raw measurement data.

It should be noted that in the object reference temperature that inquiry matches with environment temperature from inquiry tables of data, it can Object reference temperature is matched in a manner of through the following two kinds.First way, can will inquiry tables of data in environment temperature Between the smallest reference temperature of difference be determined as object reference temperature, and then joining with target of storing in tables of data will be inquired It examines the corresponding calibration parameter of temperature and is determined as target alignment parameter.The second way, if existed and ring in inquiry tables of data The reference temperature identical with environment temperature is then determined as object reference temperature by the identical reference temperature of border temperature, and then will The calibration parameter corresponding with object reference temperature stored in inquiry tables of data is determined as target alignment parameter；If inquiring number According to reference temperature identical with environment temperature is not present in table, then it will be located at environment temperature two sides and and environment in inquiry tables of data Adjacent two reference temperatures of temperature are determined as object reference temperature, and then by the corresponding two groups of schools of the two object reference temperature The weighted average of quasi- parameter is determined as target alignment parameter corresponding with environment temperature.

Optionally, on the basis of calibration parameter shown in Fig. 2 generates model creation method, step 201 is from measuring device institute When choosing at least two reference temperatures in the corresponding temperature change section of place's environment, can choose from temperature change section has Evenly spaced at least two reference temperature, specifically can choose as follows reference temperature:

According to the required precision to calibration measurement data, determine that reference temperature is distributed granularity, reference temperature is distributed granularity tool Body refers to that difference when selection reference temperature between two neighboring reference temperature, reference temperature are distributed the smaller then selected ginseng of granularity The difference examined in temperature between two reference temperatures is smaller, i.e. the density of selection reference temperature is higher.Determining reference temperature It is distributed after granularity, it can be according to the Temperature Distribution granularity determined from the corresponding temperature change section of measuring device local environment At least two reference temperatures of middle selection, wherein any two neighboring reference temperature at least two selected reference temperatures Difference is corresponding with the distribution granularity determined.

For example, the temperature change section of measuring device local environment is -40 DEG C to 70 DEG C, according to the reference temperature determined It is distributed granularity, every 2 DEG C of selections, one reference temperature up to 70 DEG C since -40 DEG C ing, in addition -40 DEG C and 70 DEG C of two endpoints are total to Select 56 reference temperatures.

In embodiments of the present invention, determine that reference temperature is distributed granularity according to the required precision to calibration measurement data, It is smaller to the more high then reference temperature distribution granularity of the required precision of calibration measurement data, in the identical situation in temperature change section Reference temperature distribution granularity is smaller, and the number for the reference temperature chosen is more, and the number of reference temperature the more, can be matched to The object reference temperature being more nearly with environment temperature, so that more accurate target alignment parameter is obtained, so as to original The accuracy that measurement data is calibrated is higher.

Determine that reference temperature is distributed granularity according to the required precision to calibration measurement data, it is true that reference temperature is distributed granularity The number of reference temperature in inquiry tables of data is determined, the number of reference temperature the more, can determine more accurate target school The the number of quasi- parameter, reference temperature the few, and the time needed for matching target alignment parameter is shorter, so as to according to reality Demand come determine reference temperature be distributed granularity, be suitable for different measurement scenes.

Optionally, on the basis of calibration parameter shown in Fig. 2 generates model creation method, step 201 is from measuring device institute When choosing at least two reference temperatures in the place corresponding temperature change section of environment, can also in the way of non-homogeneous take a little from Reference temperature is chosen in temperature change section, specifically can select as follows reference temperature:

For each measuring device, the corresponding temperature change section of the measuring device local environment be it is fixed, according to The measurement accuracy of the measuring device, can be by the measuring device local environment pair with the change of the measuring device local environment temperature The temperature change interval division answered is low-temperature range, medium temperature section and high temperature section, later from low-temperature range, medium temperature section and height At least two reference temperatures are selected each of between warm area in temperature range, wherein any two chosen from low-temperature range The difference of a neighboring reference temperature is less than the difference from any two neighboring reference temperature of selection middle between middle warm area, while from height The difference of any two neighboring reference temperature of middle selection between warm area is less than the adjacent ginseng of any two from selection middle between middle warm area Examine the difference of temperature.

For example, be directed to a specific measuring device X, the temperature change section of measuring device X local environment for -40 DEG C extremely 70 DEG C, it is divided into low-temperature range by -40 DEG C to -10 DEG C, medium temperature section is divided by -10 DEG C to 30 DEG C, 30 DEG C to 70 DEG C is drawn It is divided into high temperature section.In low-temperature range every 1 DEG C of selection, one reference temperature, 31 reference temperatures can be chosen；In middle warm area Between every 2 DEG C of selections, one reference temperature, 21 reference temperatures can be chosen；A reference is chosen every 1 DEG C in high temperature section Temperature can choose 41 reference temperatures.It is equal to 1 from the difference between any two neighboring reference temperature that low-temperature range is chosen DEG C, it is equal to 2 DEG C from the difference between any two neighboring reference temperature chosen between middle warm area, is chosen from high temperature section any Difference between two neighboring reference temperature is equal to 1 DEG C.

Measuring device can generate biggish error at lower temperatures and higher temperature, but in the environment of moderate temperature Error caused by lower is then smaller, can be thus low-temperature range by the temperature change interval division of measuring device local environment, Medium temperature section and high temperature section, low-temperature range and high temperature section can generate the operating temperature model of large error corresponding to measuring device It encloses, medium temperature section corresponds to the operating temperature range that measuring device generates smaller error.Due to measuring device in low-temperature range and High temperature section can generate the error of increasing when working, therefore can reduce from low-temperature range and high temperature section and choose reference temperature Interval, it is accurate to be calibrated to measuring device in the raw measurement data that low-temperature range or high temperature section are measured with promotion Property.Since the error that measuring device is generated when medium temperature section works is smaller, can increase from selection reference between middle warm area The efficiency of matching target alignment parameter is improved to reduce the total quantity of reference temperature in inquiry tables of data in the interval of temperature.

It should be noted that in above-mentioned each embodiment, the corresponding temperature change section of measuring device local environment is The temperature range for referring to the actually located environment of measuring device, since different measuring device local environments are different, difference measurement is set Standby corresponding temperature change section may be different, even the measuring device of same type and same model, if locating for the two Environment is different, then the corresponding temperature change section of the two may also be different.In addition, the corresponding temperature of measuring device local environment becomes Changing section can determine according to the history temperature record of measuring device local environment, for example, the geographic region of deployment measuring device Y The minimum history temperature in domain is -30 DEG C, and highest history temperature is 40 DEG C, it is determined that the corresponding temperature of measuring device Y local environment Constant interval is -30 DEG C to 40 DEG C.

For mode two:

As shown in figure 3, the method that the calibration parameter that creation includes formula group generates model may include steps of:

Step 301: according to measuring device measurement data and corresponding truthful data at different temperatures, being fitted based on Calculate the formula group of target offset parameter and target factor parameter included by target alignment parameter；

The formula group fitted is as follows:

Wherein, m_tCharacterization corresponds to the target offset parameter of environment temperature t；f_tCharacterization corresponds to the target system of environment temperature t Number parameter；t_iCharacterize the environment temperature of measuring device its local environment when i-th measures before this；WithIt characterizes respectively For measuring device before this i-th measure and the weight coefficient that fits, and Characterize needle To measuring device, i-th is measured and calculated offset parameter before this；For measuring device, i-th carries out characterization before this It measures and calculated figure parameters；N characterization is greater than or equal to 1 positive integer.

In simple terms, m_tBy measuring device, the i value for measuring corresponding offset parameter is obtained before this, f_tIt is set by measurement The value of the corresponding figure parameters of standby i measurement before this obtains, and measuring device is combined repeatedly to measure corresponding offset ginseng before this in this way Several and figure parameters measure corresponding offset parameter and figure parameters, the determined offset parameter of utility when previous to determine The accuracy that raw measurement data is calibrated with figure parameters, so that the calibration measurement data obtained are more accurate.

Step 302: creation includes that the calibration parameter for the formula group being fitted generates model.

In embodiments of the present invention, by measuring device at different temperatures measured measurement data and with measurement number According to corresponding truthful data as sample, the weight coefficient for calculating target offset parameter can be fitted respectivelyWith with In the weight coefficient for calculating target factor parameterIts local environment when collecting measuring device measurement raw measurement data After environment temperature t, the environment temperature t of measuring device its local environment when n times measure before this is obtained_i, and obtain measurement and set For the weight coefficient obtained when n times measure before thisWeight coefficientAnd n times are surveyed before this for measuring device Calculated offset parameter when amountAnd figure parametersThe each value that will acquire later is substituted into above-mentioned formula group and is calculated Out for the target offset parameter m of this measurement of measuring device_tWith target factor parameter f_t.Creation includes above-mentioned formula group After calibration parameter generates model, after environment temperature and raw measurement data input calibration parameter are generated model, calibration ginseng Number, which generates model, can calculate target offset parameter and target factor parameter automatically by above-mentioned formula group.

It, can be with according to measuring device measured raw measurement data and corresponding truthful data at different temperatures Two weight coefficients are fitted, and then can be constructed respectively using the two weight coefficients for calculating target offset parameter and mesh Mark two formula of figure parameters.When measuring device measures raw measurement data and collects the ring of measuring device local environment Offset after the temperature of border, when collected environment temperature and measuring device repeatedly measure before this when by this measurement of measuring device Parameter and figure parameters, which substitute into above-mentioned two formula, can calculate target offset parameter and target factor parameter, and then can be with The raw measurement data that this is measured is calibrated according to calculated target offset parameter and target factor parameter, is obtained Corresponding calibration measurement data.

Formula group is constructed by fitting weight coefficient, can be calculated using formula group for being carried out to raw measurement data The target offset parameter and target factor parameter of calibration.Mesh is obtained relative to by way of inquiring inquiry tables of data Calibration parameter is marked, the tight of target alignment parameter and environment temperature can be guaranteed by calculating target alignment parameter by the formula group of building Lattice are corresponding, help further to promote the accuracy for calibrating the measurement result of measuring device.

Optionally, on the basis of the measurement data calibration method shown in Fig. 1 for electric system, step 104 is according to mesh Mark calibration parameter calibrates raw measurement data, corresponding calibration measurement data is obtained, when target alignment measurement data When including target offset parameter and target factor parameter, specifically school can be carried out to raw measurement data in the following way It is quasi-:

Target offset parameter and target factor parameter included by target alignment parameter are obtained first, later by original measurement Data and the target offset parameter got and target factor parameter substitute into following formula, calculate and raw measurement data phase Corresponding calibration measurement data；

M_corrected=(M_original-m_t)·f_t

In embodiments of the present invention, after determining target alignment parameter corresponding with environment temperature, target school is obtained Target offset parameter and target factor parameter included by quasi- parameter, so by raw measurement data and target offset parameter and Target factor parameter substitutes into above-mentioned formula, can calculate calibration measurement data corresponding with raw measurement data, so that Calibration measurement data are more close with truthful data relative to raw measurement data, and raw measurement data is calibrated in guarantee Convenience and accuracy.

Optionally, the basis provided by above-mentioned each embodiment for the measurement data calibration method of electric system On, be created that calibration parameter generate model after, can according to measuring device using the time to the calibration parameter created Model is generated to be modified.

As measuring device uses the increase of time, generated error can become measuring device at different temperatures Change, and this variation is directed to and more protrudes in temperature fluctuation compared with measuring device used in overall situation, in order to guarantee to original survey The accuracy that amount data are calibrated can pass through after the use time of measuring device reaches preset time threshold Theoretical calculation or the mode of experiment test determine the situation of change of measuring device error at different temperatures, and then can be to before this The calibration parameter of creation generates model and is modified, and guaranteeing can be to measuring device based on revised calibration parameter generation model The raw measurement data measured accurately is corrected.

In embodiments of the present invention, can specifically reacquire measurement data of the measuring device under the reference temperature of part and Truthful data, and then by the measurement data reacquired and truthful data and the measurement data and truthful data that get before this It is compared, model is generated to calibration parameter according to measurement data and the drift condition of truthful data and is modified.Except this it Outside, correction factor relevant to measuring device degree of aging can also be determined using the time according to measuring device, and then utilize The calibration parameter that correction factor generates calibration parameter in the inquiry tables of data that model includes is updated, and is obtained and is utilized amendment The weight coefficient that coefficient generates calibration parameter in the formula group that model includes is updated, and is realized with this raw to calibration parameter At the update of model.

As shown in figure 4, one embodiment of the invention provides a kind of measurement data calibrating installation for electric system, it should Device may include:

One data acquisition module 401, the raw measurement data measured for obtaining measuring device；

One temperature collecting module 402, for acquiring the environment temperature of measuring device local environment；

One parameter determination module 403, for according to preset calibration parameter generation module and temperature collecting module 402 collected environment temperatures obtain target alignment parameter corresponding with environment temperature, wherein calibration parameter generates model It is created according to the corresponding relationship of the calibration parameter of measuring device and temperature；

One data calibration module 404, the target alignment parameter logistic evidence for being got according to parameter determination module 403 It obtains the raw measurement data that module 401 is got to be calibrated, obtains calibration measurement data.

In embodiments of the present invention, data acquisition module 401 can be used for executing the step 101 in above method embodiment, Temperature collecting module 402 can be used for executing the step 102 in above method embodiment, and parameter determination module 403 can be used for executing Step 103 in above method embodiment, data calibration module 404 can be used for executing the step 104 in above method embodiment.

The concrete operation method of measurement data calibrating installation provided in an embodiment of the present invention for electric system and Fig. 1 institute Show measurement data calibration method for electric system based on the same inventive concept, particular content can be found in embodiment of the method Description, details are not described herein.

In embodiments of the present invention, data calibration module is according to the environment temperature of measuring device local environment to measuring device The raw measurement data measured is calibrated, and the calibration measurement data being more nearly with truthful data are obtained, due to without making With the precision measurement equipment of price costly, it is only necessary to which conventional measuring device can obtain accurate at a temperature of varying environment Measurement result, thus reduce temperature fluctuation compared in overall situation carry out DATA REASONING cost.

Optionally, on the basis of the measurement data calibrating installation shown in Fig. 4 for electric system, as shown in figure 5, the use Further comprise in the measurement data calibrating installation of electric system:

One temperature chooses module 405, for chosen from the corresponding temperature change section of measuring device local environment to Few two reference temperatures；

One parameter generation module 406, for choosing each reference temperature that module 405 selects, root for temperature According to the difference of measuring device measurement data and truthful data under the reference temperature, the corresponding calibration parameter of the reference temperature is determined；

One table generation module 407, for generate include temperature choose each reference temperature that selects of module 405 with The inquiry tables of data of corresponding relationship between the respective alignment parameter that parameter generation module 406 determines, wherein inquiry tables of data is used for Inquire target alignment parameter corresponding with environment temperature；

One the first model creation module 408 includes the inquiry tables of data generated of table generation module 407 for creating Calibration parameter generate model, inquiry tables of data be used for for parameter determination module 403 obtain target alignment parameter use.

In embodiments of the present invention, temperature chooses module 405 and can be used for executing the step 201 in above method embodiment, Parameter generation module 406 can be used for executing the step 202 in above method embodiment, and table generation module 407 can be used in execution The step 203 in embodiment of the method is stated, the first model creation module 408 can be used for executing the step in above method embodiment 204。

Optionally, on the basis of the measurement data calibrating installation shown in Fig. 5 for electric system, as shown in fig. 6, temperature Choosing module 405 includes:

One granularity determines submodule 4051, for the required precision according to calibration measurement data, determines reference temperature point Cloth granularity；

One the first temperature selects submodule 4052, for determining reference temperature that submodule 4051 is determined according to granularity It is distributed granularity, at least two reference temperatures are chosen from the corresponding temperature change section of measuring device local environment, so that arbitrarily The difference of two neighboring reference temperature is corresponding with distribution granularity, and then parameter generation module 406 can be directed to the first temperature Select selected each reference temperature taken out of submodule 4052, according to measuring device under the reference temperature measurement data and true The difference of real data determines the corresponding standard parameter of the reference temperature, and table generation module 407 can be generated includes the first temperature Between the respective alignment parameter that the degree selection each reference temperature selected of submodule 4052 and parameter generation module 406 are determined The inquiry tables of data of corresponding relationship.

Optionally, on the basis of the measurement data calibrating installation shown in Fig. 5 for electric system, as shown in fig. 7, temperature Choosing module 405 includes:

One temperature range divides submodule 4053, for drawing the corresponding temperature change section of measuring device local environment It is divided into low-temperature range, medium temperature section and high temperature section；

One second temperature selects submodule 4054, marks off for respectively from temperature range division submodule 4053 low At least two reference temperatures are respectively chosen between warm area, in medium temperature section and high temperature section, wherein are appointed in low-temperature range and high temperature section The difference for two neighboring reference temperature of anticipating is less than the difference of any two neighboring reference temperature in medium temperature section, and then parameter generates Module 406 can exist for selected each reference temperature taken out of second temperature selection submodule 4054 according to measuring device Measurement data determines the corresponding standard parameter of the reference temperature with the difference of truthful data under the reference temperature, and table generation module 407 to can be generated include second temperature each reference temperature for selecting of selection submodule 4054 and parameter generation module 406 The inquiry tables of data of corresponding relationship between the respective alignment parameter determined.

Optionally, on the basis of the measurement data calibrating installation shown in Fig. 4 for electric system, as shown in figure 8, the use Further comprise in the measurement data calibrating installation of electric system:

One formula fitting module 409, for according to measuring device at different temperatures measurement data with it is corresponding very Real data, fitting is as follows for calculating the formula group of target offset parameter and target factor parameter included by target alignment parameter；

Wherein, m_tCharacterization corresponds to the target offset parameter of environment temperature t；f_tCharacterization corresponds to the target system of environment temperature t Number parameter；t_iCharacterize the environment temperature of measuring device its local environment when i-th measures before this；WithIt characterizes respectively For measuring device before this i-th measure and two weight coefficients fitting, and Table Levying measuring device, i-th measures and calculated offset parameter before this for measuring device；Characterization measuring device is directed to I-th measures and calculated figure parameters measuring device before this；N characterization is greater than or equal to 1 positive integer；

One the second model creation module 410 includes formula group that formula fitting module 409 fits for creating Calibration parameter generates model.

In embodiments of the present invention, formula fitting module 409 can be used for executing the step 301 in above method embodiment, Second model creation module 410 can be used for executing the step 302 in above method embodiment.

Optionally, the basis in Fig. 4 into Fig. 8 shown in either figure for the measurement data calibrating installation of electric system On, as shown in figure 9, data calibration module 404 includes:

One calibration parameter acquisition submodule 4041, for from the target alignment parameter that parameter determination module 403 obtains Obtain target offset parameter and target factor parameter；

One calibration operation submodule 4042, raw measurement data for getting data acquisition module 401 and The target offset parameter and target factor parameter that calibration parameter acquisition submodule 4041 is got substitute into following formula, calculate calibration Measurement data；

M_corrected=(M_original-m_t)·f_t

Wherein, M_correctedCharacterize calibration measurement data, M_originalCharacterize raw measurement data, m_tCharacterize target offset ginseng Number, f_tCharacterize target factor parameter.

As shown in Figure 10, one embodiment of the invention provides a kind of measurement data calibrating installation, comprising: at least one is deposited Reservoir 501 and at least one processor 502；

At least one processor 501, for storing machine readable program；

At least one processor 502, for calling the machine readable program stored at least one processor 501, with In:

Obtain the raw measurement data that measuring device is measured；

Acquire the environment temperature of measuring device local environment；

Model and environment temperature are generated according to preset calibration parameter, obtains target corresponding with environment temperature school Quasi- parameter, wherein calibration parameter generates model and created according to the calibration parameter of measuring device and the corresponding relationship of temperature；

Raw measurement data is calibrated according to target alignment parameter, obtains calibration measurement data.

Optionally, processor 502 is by calling the machine readable program stored at least one processor 501, to be used for Model and environment temperature acquisition target alignment parameter corresponding with environment temperature are being generated according to preset calibration parameter Before, further includes:

At least two reference temperatures are chosen from the corresponding temperature change section of measuring device local environment；

For each reference temperature, according to the difference of measuring device measurement data and truthful data under the reference temperature, Determine the corresponding calibration parameter of the reference temperature；

Generation includes the inquiry tables of data of corresponding relationship between each reference temperature and respective alignment parameter, wherein is looked into Tables of data is ask for inquiring target alignment parameter corresponding with environment temperature；

Creation includes the calibration parameter generation model for inquiring tables of data.

Optionally, processor 502 is by calling the machine readable program stored at least one processor 501, to be used for When choosing at least two reference temperatures from the corresponding temperature change section of measuring device local environment, specifically it may is that

According to the required precision to calibration measurement data, determine that reference temperature is distributed granularity；

It is distributed granularity according to reference temperature, chooses at least two from the corresponding temperature change section of measuring device local environment A reference temperature, so that the difference of any two neighboring reference temperature is corresponding with distribution granularity.

Optionally, processor 502 is by calling the machine readable program stored at least one processor 501, to be used for At least two reference temperatures are chosen from the corresponding temperature change section of measuring device local environment, specifically may is that

It is low-temperature range, medium temperature section and high-temperature region by the corresponding temperature change interval division of measuring device local environment Between；

At least two reference temperatures are respectively chosen from low-temperature range, medium temperature section and high temperature section respectively, wherein low-temperature space Between and high temperature section in the difference of any two neighboring reference temperature be less than any two neighboring reference temperature in medium temperature section Difference.

Optionally, processor 502 is by calling the machine readable program stored at least one processor 501, to be used for Generate model and environment temperature according to preset calibration parameter, obtain target alignment parameter corresponding with environment temperature it Before, further includes:

According to measuring device measurement data and corresponding truthful data at different temperatures, fitting is as follows for calculating mesh Mark the formula group of target offset parameter and target factor parameter included by calibration parameter；

Creation includes that the calibration parameter of formula group generates model.

Optionally, processor 502 is by calling the machine readable program stored at least one processor 501, to be used for Raw measurement data is calibrated according to target alignment parameter, calibration measurement data is obtained, specifically may is that

Obtain target offset parameter and target factor parameter that target alignment parameter includes；

Raw measurement data, target offset parameter and target factor parameter are substituted into following formula, calculate calibration measurement number According to；

M_corrected=(M_original-m_t)·f_t

The present invention also provides a kind of computer-readable medium, storage is for being used for machine execution as described herein The instruction of the measurement data calibration method of electric system.Specifically, system or device equipped with storage medium can be provided, Store on the storage medium realize above-described embodiment in any embodiment function software program code, and make the system or The computer (or CPU or MPU) of person's device reads and executes the program code being stored in a storage medium.

In this case, it is real that any one of above-described embodiment can be achieved in the program code itself read from storage medium The function of example is applied, therefore the storage medium of program code and storage program code constitutes a part of the invention.

Storage medium embodiment for providing program code include floppy disk, hard disk, magneto-optic disk, CD (such as CD-ROM, CD-R, CD-RW, DVD-ROM, DVD-RAM, DVD-RW, DVD+RW), tape, non-volatile memory card and ROM.Selectively, Can by communication network from server computer download program code.

Further, it should be apparent that not only can be by executing program code read-out by computer, but also can pass through Operating system for calculating hands- operation etc. is set to complete partly or completely practical operation based on the instruction of program code, thus Realize the function of any one of above-described embodiment embodiment.

Further, it is to be appreciated that the program code read by storage medium is write the expansion board in insertion computer In in set memory or write in the memory being arranged in the expansion module being connected to a computer, be then based on journey The instruction of sequence code makes the CPU etc. being mounted on expansion board or expansion module come execution part and whole practical operations, thus Realize the function of any embodiment in above-described embodiment.

It should be noted that step and module not all in above-mentioned each process and each system construction drawing is all necessary , certain steps or module can be ignored according to the actual needs.Each step execution sequence be not it is fixed, can be according to need It is adjusted.System structure described in the various embodiments described above can be physical structure, be also possible to logical construction, that is, have A little modules may be realized by same physical entity, be realized alternatively, some modules may divide by multiple physical entities, alternatively, can be with It is realized jointly by certain components in multiple autonomous devices.

In the above various embodiments, hardware module mechanically or can be realized electrically.For example, a hardware mould Block may include permanent dedicated circuit or logic (such as special processor, FPGA or ASIC) to complete corresponding operating.Firmly Part module can also include programmable logic or circuit (such as general processor or other programmable processors), can by software into The interim setting of row is to complete corresponding operating.Concrete implementation mode (mechanical system or dedicated permanent circuit or is faced When the circuit that is arranged) can be determined based on cost and temporal consideration.

Detailed displaying and explanation carried out to the present invention above by attached drawing and preferred embodiment, however the present invention is not limited to These embodiments having revealed that, base could be aware that with above-mentioned multiple embodiment those skilled in the art, can combine above-mentioned difference Code audit means in embodiment obtain the more embodiments of the present invention, these embodiments are also within protection scope of the present invention.

Claims

1. being used for the measurement data calibration method of electric system characterized by comprising

Obtain the raw measurement data that measuring device is measured；

Model and the environment temperature are generated according to preset calibration parameter, obtains mesh corresponding with the environment temperature Mark calibration parameter, wherein the calibration parameter generates model according to the calibration parameter pass corresponding with temperature of the measuring device It is and creates；

2. the method according to claim 1, wherein generating model according to preset calibration parameter described Further comprise before obtaining target alignment parameter corresponding with the environment temperature with the environment temperature:

For reference temperature described in each, according to the measuring device under the reference temperature measurement data and truthful data Difference determines the corresponding calibration parameter of the reference temperature；

Generation includes the inquiry tables of data of corresponding relationship between each reference temperature and the corresponding calibration parameter, In, the inquiry tables of data is for inquiring the target alignment parameter corresponding with the environment temperature；

3. according to the method described in claim 2, it is characterized in that, described from the corresponding temperature of the measuring device local environment At least two reference temperatures are chosen in constant interval, comprising:

According to the reference temperature be distributed granularity, from the corresponding temperature change section of the measuring device local environment choose to Few two reference temperatures, so that the difference of the adjacent reference temperature of any two is corresponding with the distribution granularity.

4. according to the method described in claim 2, it is characterized in that, described from the corresponding temperature of the measuring device local environment At least two reference temperatures are chosen in constant interval, comprising:

It is low-temperature range, medium temperature section and high-temperature region by the corresponding temperature change interval division of the measuring device local environment Between；

At least two reference temperatures are respectively chosen from the low-temperature range, the medium temperature section and the high temperature section respectively, In, the difference of the adjacent reference temperature of any two is less than the medium temperature section in the low-temperature range and the high temperature section The difference of the adjacent reference temperature of middle any two.

5. the method according to claim 1, wherein generating model according to preset calibration parameter described Further comprise before obtaining target alignment parameter corresponding with the environment temperature with the environment temperature:

According to the measuring device measurement data and corresponding truthful data at different temperatures, fitting is as follows for calculating institute State the formula group of target offset parameter and target factor parameter included by target alignment parameter；

Wherein, the m_tCharacterization corresponds to the target offset parameter of the environment temperature t；The f_tCharacterization corresponds to described The target factor parameter of environment temperature t；The t_iIts locating ring when characterizing the measuring device i-th measuring before this The environment temperature in border；It is describedWith it is describedFor the measuring device, i-th is measured and is fitted characterization before this respectively Two weight coefficients, andIt is describedCharacterize the measuring device for the measuring device this Preceding i-th measures and calculated offset parameter；It is describedIt characterizes the measuring device and is directed to the measuring device before this I-th measures and calculated figure parameters；The n characterization is greater than or equal to 1 positive integer；

6. according to claim 1 to any method in 5, which is characterized in that described according to the target alignment parameter pair The raw measurement data is calibrated, and calibration measurement data are obtained, comprising:

The raw measurement data, the target offset parameter and the target factor parameter are substituted into following formula, calculate institute State calibration measurement data；

M_corrected=(M_original-m_t)·f_t

Wherein, the M_correctedCharacterize the calibration measurement data, the M_originalThe raw measurement data is characterized, it is described m_tCharacterize the target offset parameter, the f_tCharacterize the target factor parameter.

7. being used for the measurement data calibrating installation of electric system characterized by comprising

One data acquisition module (401), the raw measurement data measured for obtaining measuring device；

One temperature collecting module (402), for acquiring the environment temperature of the measuring device local environment；

One parameter determination module (403), for according to preset calibration parameter generation module and the temperature acquisition mould The collected environment temperature of block (402) obtains target alignment parameter corresponding with the environment temperature, wherein described Calibration parameter generates model and is created according to the calibration parameter of the measuring device and the corresponding relationship of temperature；

One data calibration module (404), the target alignment for being got according to the parameter determination module (403) are joined Several raw measurement datas got to the data acquisition module (401) are calibrated, and calibration measurement data are obtained.

8. device according to claim 7, which is characterized in that further comprise:

One temperature chooses module (405), for choosing from the corresponding temperature change section of the measuring device local environment At least two reference temperatures；

One parameter generation module (406), for choosing each described reference that module (405) select for the temperature Temperature determines that the reference temperature is corresponding according to the difference of measuring device measurement data and truthful data under the reference temperature Calibration parameter；

One table generation module (407) includes each ginseng that the temperature chooses that module (405) select for generating The inquiry tables of data of corresponding relationship between the corresponding calibration parameter that temperature is determined to the parameter generation module (406) is examined, Wherein, the inquiry tables of data is for inquiring the target alignment parameter corresponding with the environment temperature；

One the first model creation module (408) includes to look into described in the table generation module (407) is generated for creating The calibration parameter for asking tables of data generates model, and the inquiry tables of data is used to obtain for the parameter determination module (403) The target alignment parameter uses.

9. device according to claim 8, which is characterized in that the temperature chooses module (405) and includes:

One granularity determines submodule (4051), for the required precision according to the calibration measurement data, determines reference temperature It is distributed granularity；

One the first temperature selects submodule (4052), described for determining that submodule (4051) is determined according to the granularity Reference temperature is distributed granularity, and at least two are chosen from the corresponding temperature change section of the measuring device local environment with reference to temperature Degree, so that the difference of the adjacent reference temperature of any two is corresponding with the distribution granularity.

10. device according to claim 8, which is characterized in that the temperature chooses module (405) and includes:

One temperature range divides submodule (4053), is used for the corresponding temperature change section of the measuring device local environment It is divided into low-temperature range, medium temperature section and high temperature section；

One second temperature selects submodule (4054), marks off for dividing submodule (4053) from the temperature range respectively The low-temperature range, respectively choose at least two reference temperatures in the medium temperature section and the high temperature section, wherein it is described low The difference of the reference temperature adjacent with any two in the high temperature section is less than any two in the medium temperature section between warm area The difference of a adjacent reference temperature.

11. device according to claim 7, which is characterized in that further comprise:

One formula fitting module (409), for according to the measuring device at different temperatures measurement data with it is corresponding Truthful data, fitting is as follows for calculating the public affairs of target offset parameter and target factor parameter included by the target alignment parameter Formula group；

One the second model creation module (410), for create include the formula fitting module (409) fit it is described The calibration parameter of formula group generates model.

12. according to the device any in claim 7 to 11, which is characterized in that data calibration module (404) packet It includes:

One calibration parameter acquisition submodule (4041), for obtain target offset parameter that the target alignment parameter includes and Target factor parameter；

One calibration operation submodule (4042) is used for the raw measurement data and the calibration parameter acquisition submodule (4041) the target offset parameter got and the target factor parameter substitute into following formula, calculate the calibration measurement Data；

M_corrected=(M_original-m_t)·f_t

13. being used for the measurement data calibrating installation of electric system characterized by comprising at least one processor (501) and extremely A few processor (502)；

At least one processor (501), for storing machine readable program；

At least one described processor (502), for calling the machine readable program, perform claim requires any institute in 1 to 6 The method stated.

14. computer-readable medium, which is characterized in that be stored with computer instruction, the meter on the computer-readable medium Calculation machine is instructed when being executed by processor, and the processor perform claim is made to require any method in 1 to 6.