CN109724698B - Real-time calibration method for spectral signals of broadband spectrometer - Google Patents

Real-time calibration method for spectral signals of broadband spectrometer Download PDF

Info

Publication number
CN109724698B
CN109724698B CN201910023111.7A CN201910023111A CN109724698B CN 109724698 B CN109724698 B CN 109724698B CN 201910023111 A CN201910023111 A CN 201910023111A CN 109724698 B CN109724698 B CN 109724698B
Authority
CN
China
Prior art keywords
spectral
calibration
light intensity
measurement data
wavelength
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN201910023111.7A
Other languages
Chinese (zh)
Other versions
CN109724698A (en
Inventor
张锴杨
胡明宇
赵浩程
王先培
赵延峰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wuhan University WHU
Original Assignee
Wuhan University WHU
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wuhan University WHU filed Critical Wuhan University WHU
Priority to CN201910023111.7A priority Critical patent/CN109724698B/en
Publication of CN109724698A publication Critical patent/CN109724698A/en
Application granted granted Critical
Publication of CN109724698B publication Critical patent/CN109724698B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

The invention provides a real-time calibration method for a spectrum signal of a broadband spectrometer. Constructing a measurement data point set of the spectral signal, and obtaining a maximum value point set of the spectral signal through a peak searching algorithm; carrying out wavelength calibration by adopting a method of third-order polynomial fitting based on least square; carrying out parameterization on the pixel serial number of the spectral measurement data point by adopting a chord length parameterization method, then carrying out cubic B-spline curve fitting on the parameterized spectral measurement data point, and further carrying out sampling interpolation to finish the work of light intensity calibration; and establishing a corresponding relation between the wavelength and the light intensity according to the wavelength calibration and the light intensity calibration to finish the real-time calibration of the spectrum signal. The invention is suitable for wavelength calibration and light intensity calibration in the calibration process of the broadband spectrometer, and has real-time performance, practicability and higher accuracy.

Description

Real-time calibration method for spectral signals of broadband spectrometer
Technical Field
The invention relates to the technical field of spectrometers, in particular to a real-time calibration method for spectral signals of a broadband spectrometer.
Background
At present, a spectrometer for measuring infrared bands or ultraviolet bands and the like by focusing on a certain band can achieve higher measurement precision, and related research is mature. The research on the broadband micro spectrometer with the measurement range of 200-1100nm is less, most of the broadband micro spectrometers can only achieve resolution with certain precision in ultraviolet or infrared bands, the broadband spectrometers are widely applied, the requirements on the functions and the performances of the spectrometers are always improved due to the development of the modern technology, and the market requirements are increased. The existing broadband spectrometer has two main problems, namely, the spectral range and the resolution ratio have a limiting relationship, so that the uniform and high spectral resolution ratio is difficult to obtain in a wide spectral range; secondly, the spectrum range comprises an ultraviolet band region, and the ultraviolet response sensitivity of the instrument is not high due to the performance of the CCD detector. And a suitable spectral data processing algorithm can effectively improve the two problems.
One of the important factors affecting two problems of spectrometers is the calibration process of the spectra. The spectral calibration is mainly used for researching the corresponding relation between the spectral signal output by each pixel of the CCD and the spectral wavelength and spectral radiant flux to be measured, namely wavelength calibration and light intensity calibration. The functional relation between the pixel serial number and the spectrum wavelength value can be determined by adopting a wavelength calibration algorithm to obtain a wavelength calibration equation of the spectrometer; light intensity scaling refers to fitting light intensities of different wavebands. The applicability of the spectral scaling algorithm will largely determine the accuracy of the final spectrogram.
The spectrum calibration can obtain a smooth and accurate spectrogram and improve the reliability of the spectrometer. The main tasks of spectral calibration are to determine spectral wavelength position and spectral stability, correct wavelength shifts, and determine spectral response functions. The CCD detector outputs response signals corresponding to the pixel serial numbers one by one, and the measured data is displayed, stored and processed by a PC software system to output standard spectrum calibration data. The current main calibration methods comprise a monochrometer method, a standard spectral line method and the like, wherein the monochrometer method continuously outputs monochromatic collimated light and can simultaneously realize wavelength and bandwidth calibration in a wide spectral range; the standard spectral line method can realize the wavelength calibration of a high-resolution linear spectrometer by using a standard spectral line diagram of a sodium lamp or a mercury lamp. The standard spectral line method calibration mostly adopts the algorithms of piecewise fitting, Gaussian fitting and polynomial fitting.
Light intensity scaling studies are relatively rare. At present, the curve fitting method includes polynomial fitting, rbf (radial basis function) curve fitting, Bezier curve fitting, B-spline curve fitting, BP neural network fitting, and the like. The polynomial fitting precision is limited, the B spline curve precision is slightly high, and a BP neural network needs to select a proper network structure, so that the realization is complex. The selection of a calibration algorithm more suitable for spectral analysis is yet to be further investigated.
The traditional calibration method is difficult to find the weak peak position in the broadband complicated spectral line distribution diagram, or the accuracy is improved while the speed is sacrificed, so that the real-time display is difficult to meet. There is therefore a need for a method that can be applied to real-time calibration of broadband spectrometers.
Disclosure of Invention
In order to solve the above technical problems, the present invention provides a real-time calibration method for a spectrum signal of a broadband spectrometer, so as to solve the problem that accurate real-time calibration is difficult to achieve in a wide spectrum range.
The invention adopts the technical scheme that the real-time calibration method for the spectrum signal of the broadband spectrometer mainly comprises three steps, namely peak searching algorithm, wavelength calibration and light intensity calibration. The specific operation steps are as follows:
step 1: constructing a measurement data point set of the spectral signal, and obtaining a maximum value point set of the spectral signal through a peak searching algorithm;
step 2: carrying out wavelength calibration by adopting a method of third-order polynomial fitting based on least square;
and step 3: carrying out parameterization on the pixel serial number of the spectral measurement data point by adopting a chord length parameterization method, then carrying out cubic B-spline curve fitting on the parameterized spectral measurement data point, and further carrying out sampling interpolation to finish the work of light intensity calibration;
and 4, step 4: establishing a corresponding relation between the wavelength and the light intensity according to the wavelength calibration and the light intensity calibration to finish the real-time calibration of the spectrum signal;
preferably, the set of measured data points for constructing the spectrum signal in step 1 is:
collecting the spectrum signal by a broadband spectrometer, and collecting by a CCD camera in the broadband spectrometer to construct a measurement data point set of the spectrum signal:
U={(x0,z0),(x1,z1),...,(xN,zN)}
wherein (x)i,zi) N is the measurement data point of the ith spectral signal, N is the measurement data number of the spectral signal in the measurement data point set of the spectral signal, xiNumber of pixels, z, representing the ith spectral measurement data pointiThe light intensity of the ith spectral measurement data point is represented;
in the step 1, the maximum point set of the spectrum signal obtained by the peak searching algorithm is as follows:
according to a peak finding algorithm, by traversing a set of measured data points of a spectral signalSynthesis of U, sequential comparison of zi-1,zi,zi+1If z is satisfiedi-1<ziAnd z isi>zi+1Namely, the maximum point, the obtained spectrum signal maximum point set, namely the peak position of the spectral line is as follows:
Figure BDA0001941496820000031
wherein the content of the first and second substances,
Figure BDA0001941496820000032
is the K thjThe measurement data point of each spectral signal is the jth spectral signal maximum, M is the number of spectral signal maximum in the set of spectral signal maximum,
Figure BDA0001941496820000033
denotes the K thjThe pixel serial number of the spectral measurement data point is the pixel serial number of the jth spectral signal maximum value point,
Figure BDA0001941496820000034
denotes the K thjThe light intensity of the jth spectral signal maximum value point is the light intensity of the spectral measurement data point.
Preferably, the method of step 2 using least-squares-based third-order polynomial fitting is used for wavelength calibration as follows:
the measurement wave band of the spectrometer is y ∈ [ y >1,y2]Calibrating M characteristic spectral lines of light source in same wave band
Figure BDA00019414968200000318
As a benchmark;
Figure BDA0001941496820000036
the serial number of the pixel which represents the maximum value point of the jth spectral signal,
Figure BDA0001941496820000037
image element sequence for representing jth spectrum signal maximum value pointThe wavelength corresponding to the number is set as a fitting curve
Figure BDA0001941496820000038
Figure BDA0001941496820000039
And
Figure BDA00019414968200000310
the corresponding polynomial equation is:
Figure BDA00019414968200000311
wherein M is the number of the maximum points of the spectrum signal in the maximum point set of the spectrum signal, a0Is the first coefficient of a third-order polynomial, a1A second coefficient of a third-order polynomial, a2A third coefficient of a third order polynomial, a3A fourth coefficient that is a third order polynomial;
processing using least squares, points
Figure BDA00019414968200000312
The deviation of (a) is:
Figure BDA00019414968200000313
the least squares rule being to minimize the sum of squares of deviations
Figure BDA00019414968200000314
Namely, it is
Figure BDA00019414968200000315
To make it possible to
Figure BDA00019414968200000316
At minimum, for the independent variable a0、a1、a2、a3Calculating a partial derivative to make the value of the partial derivative be 0;
Figure BDA00019414968200000317
Figure BDA0001941496820000041
the wavelengths of M characteristic spectral lines of a calibration light source
Figure BDA0001941496820000042
And the pixel serial number of the corresponding spectrum signal maximum value point
Figure BDA0001941496820000043
Substituting the above formula to solve the coefficient solution of least square equation
Figure BDA0001941496820000044
Finally, the fitting formula of the pixel serial number and the wavelength is obtained as follows:
Figure BDA0001941496820000045
the corresponding relation between the serial number of the continuous pixel and the wavelength is obtained as follows:
Figure BDA0001941496820000046
where x ∈ [ x ]0,xN]Is the serial number of the continuous pixel, y belongs to [ y ∈ [)1,y2]Measuring the waveband for a spectrometer;
and (3) according to the step (1) and the step (2), the corresponding relation between the pixel serial number and the wavelength can be obtained, and the wavelength calibration work is completed.
Preferably, the parameterization processing is performed on the pixel sequence numbers of the spectral measurement data points by adopting a chord length parameterization method in the step 3:
pixel serial number x for N +1 spectral measurement data pointsiN, chord length parameterization:
Figure BDA0001941496820000047
wherein x isi-xi-1Is a chord edge vector, tiIs xiParameterized corresponding values;
total chord length of
Figure BDA0001941496820000048
Performing cubic B-spline curve fitting on the parameterized spectral measurement data points in step 3:
the cubic B-spline curve model is established as follows:
Figure BDA0001941496820000049
wherein, q is 0,1*,M*N is less than or equal to the number of nodes, PqTo control the node, Nq,3(t) is a 3-order canonical B-spline basis function, derived according to the recursion formula:
Figure BDA0001941496820000051
control node Pq,q=1,2,...,M*-1 forming a node Matrix _ P having the following inverse equation relationship:
Figure BDA0001941496820000052
(Matrix_NTMatrix_N)Matrix_P=Matrix_R
Figure BDA0001941496820000053
Figure BDA0001941496820000054
Figure BDA0001941496820000055
where i is 1, 2., N-1, and the Matrix _ R is a control node PqVector data matrix of RvIs the light intensity zvThe vector data difference of (a);
computation control node Pq,
Figure BDA0001941496820000058
By a cubic B-spline curve model, i.e. z0=B(0),zNB (1), can give P0
Figure BDA0001941496820000056
Thus, a specific functional expression of a cubic B-spline fitting the curve B (t) can be obtained;
and step 3, further performing sampling interpolation to finish the work of light intensity calibration:
selecting proper sampling number H (H > N) to sample cubic B-spline curve according to requirement to obtain a series of discrete data points
Figure BDA0001941496820000057
Comprises the following steps:
Figure BDA0001941496820000061
wherein L1/H-1 is a sampling interval, and a series of discrete data points are selected to obtain continuous light intensity data
Figure BDA0001941496820000062
As the reference for the light intensity fitting, there are:
Figure BDA0001941496820000063
Figure BDA0001941496820000064
wherein the content of the first and second substances,L'=x N-x0the/H-1 is a serial number x of a continuous pixel, and x belongs to (x)0,xN) Interval of values of (D), connecting discrete data points D in sequencej*J is 0, 1.., H-1, then continuous intensity data z can be obtained, including:
Figure BDA0001941496820000065
thereby completing the light intensity calibration work.
Preferably, the step 4 of establishing the corresponding relationship between the wavelength and the light intensity is as follows:
obtaining the wavelength y corresponding to the serial number x of the continuous pixel according to the wavelength calibration in the step 2, obtaining the light intensity z corresponding to the serial number x of the continuous pixel according to the light intensity calibration in the step 3, and obtaining the light intensity z corresponding to the wavelength y, namely:
(y,z),y∈[y1,y2]
thereby completing the real-time calibration of the spectrum signal.
The invention has the following advantages:
the invention relates to a real-time calibration method for a broadband spectrometer spectral signal, which adopts a peak searching algorithm to obtain the peak position of a spectral line, and the calculation speed can meet the requirement of real-time display and also has better precision; the wavelength calibration adopts a third-order polynomial based on a least square method for fitting, known light source characteristic spectral lines are utilized for once accurate calibration, and the more the calibration light source characteristic spectral lines are, the more uniform the distribution is, the more accurate the calibration result is; the light intensity calibration adopts cubic B-spline curve fitting, not only has the advantages of the Bezier method, but also overcomes the defect that the curve fitting of the Bezier curve is inaccurate under the condition of a complex curve, the cubic B-spline fitting can better reflect the overall trend of the curve, the fitting result is smoother, and the cubic B-spline curve fitting method has a better local fitting effect and is suitable for the light intensity calibration of the spectrum discrete signal.
Drawings
FIG. 1: a peak-finding algorithm flow chart is obtained;
FIG. 2: a wavelength scaling flow chart;
FIG. 3: calibrating a flow chart for light intensity;
FIG. 4: fitting a curve for a least square third-order polynomial of the low-pressure mercury lamp;
FIG. 5: a wavelength calibration evaluation index for least squares third order polynomial fitting;
FIG. 6: data selected for performing a cubic B-spline curve fitting experiment;
FIG. 7: the result of cubic B-spline curve fitting on the data of FIG. 6 when the sampling number is 15;
FIG. 8: the result of cubic B-spline curve fitting on the data of FIG. 6 when the number of samples is 1000;
FIG. 9: the result is obtained by performing cubic B-spline curve fitting on the deuterium lamp spectrum signal;
FIG. 10: is an enlarged partial (spectrum band 590-600nm) spectrum diagram of FIG. 9;
FIG. 11: is the result of a polynomial (twenty-order) fit to the deuterium lamp spectral signal;
FIG. 12: the method of the invention is a flow chart.
Detailed Description
In order to facilitate the understanding and implementation of the present invention for those of ordinary skill in the art, the present invention is further described in detail with reference to the accompanying drawings and examples, it is to be understood that the embodiments described herein are merely illustrative and explanatory of the present invention and are not restrictive thereof.
The following describes an embodiment of the present invention with reference to fig. 1 to 12, specifically:
step 1: constructing a measurement data point set of the spectral signal, and obtaining a maximum value point set of the spectral signal through a peak searching algorithm;
the measurement data point set of the constructed spectrum signal in the step 1 is as follows:
collecting the spectrum signal by a broadband spectrometer, and collecting by a CCD camera in the broadband spectrometer to construct a measurement data point set of the spectrum signal:
U={(x0,z0),(x1,z1),...,(xN,zN)}
wherein (x)i,zi) N is the ith lightMeasurement data points of the spectral signal, N being the number of measurement data points of the spectral signal in the set of measurement data points of the spectral signal, xiNumber of pixels, z, representing the ith spectral measurement data pointiThe light intensity of the ith spectral measurement data point is represented;
in the step 1, the maximum point set of the spectrum signal obtained by the peak searching algorithm is as follows:
according to a peak finding algorithm, z is compared sequentially by traversing a measurement data point set U of the spectrum signali-1,zi,zi+1If z is satisfiedi-1<ziAnd z isi>zi+1Namely, the maximum point, the obtained spectrum signal maximum point set, namely the peak position of the spectral line is as follows:
Figure BDA0001941496820000081
wherein the content of the first and second substances,
Figure BDA0001941496820000082
is the K thjThe measurement data point of each spectral signal is the jth spectral signal maximum, M is the number of spectral signal maximum in the set of spectral signal maximum,
Figure BDA0001941496820000083
denotes the K thjThe pixel serial number of the spectral measurement data point is the pixel serial number of the jth spectral signal maximum value point,
Figure BDA0001941496820000084
denotes the K thjThe light intensity of the jth spectral signal maximum value point is the light intensity of the spectral measurement data point.
Step 2: carrying out wavelength calibration by adopting a method of third-order polynomial fitting based on least square;
and 2, performing wavelength calibration by adopting a least square-based third-order polynomial fitting method as follows:
the measurement wave band of the spectrometer is y ∈ [ y >1,y2]Calibrating M strips of light sources in the same wave bandCharacteristic spectral line
Figure BDA00019414968200000815
As a benchmark;
Figure BDA0001941496820000086
the serial number of the pixel which represents the maximum value point of the jth spectral signal,
Figure BDA0001941496820000087
the wavelength corresponding to the pixel serial number of the jth spectrum signal maximum value point is represented, and a fitting curve is set as
Figure BDA0001941496820000088
Figure BDA0001941496820000089
And
Figure BDA00019414968200000810
the corresponding polynomial equation is:
Figure BDA00019414968200000811
wherein M is the number of the maximum points of the spectrum signal in the maximum point set of the spectrum signal, a0Is the first coefficient of a third-order polynomial, a1A second coefficient of a third-order polynomial, a2A third coefficient of a third order polynomial, a3A fourth coefficient that is a third order polynomial;
processing using least squares, points
Figure BDA00019414968200000812
The deviation of (a) is:
Figure BDA00019414968200000813
the least squares rule being to minimize the sum of squares of deviations
Figure BDA00019414968200000814
Namely, it is
Figure BDA0001941496820000091
To make it possible to
Figure BDA0001941496820000092
At minimum, for the independent variable a0、a1、a2、a3Calculating a partial derivative to make the value of the partial derivative be 0;
Figure BDA0001941496820000093
the wavelengths of M characteristic spectral lines of a calibration light source
Figure BDA0001941496820000094
And the pixel serial number of the corresponding spectrum signal maximum value point
Figure BDA0001941496820000095
Substituting the above formula to solve the coefficient solution of least square equation
Figure BDA0001941496820000096
Finally, the fitting formula of the pixel serial number and the wavelength is obtained as follows:
Figure BDA0001941496820000097
the corresponding relation between the serial number of the continuous pixel and the wavelength is obtained as follows:
Figure BDA0001941496820000098
where x ∈ [ x ]0,xN]Is the serial number of the continuous pixel, y belongs to [ y ∈ [)1,y2]Measuring the waveband for a spectrometer;
and (3) according to the step (1) and the step (2), the corresponding relation between the pixel serial number and the wavelength can be obtained, and the wavelength calibration work is completed.
And step 3: carrying out parameterization on the pixel serial number of the spectral measurement data point by adopting a chord length parameterization method, then carrying out cubic B-spline curve fitting on the parameterized spectral measurement data point, and further carrying out sampling interpolation to finish the work of light intensity calibration;
and 3, carrying out parameterization treatment on the pixel sequence numbers of the spectral measurement data points by adopting a chord length parameterization method:
pixel serial number x for N +1 spectral measurement data pointsiN, chord length parameterization:
Figure BDA0001941496820000099
wherein x isi-xi-1Is a chord edge vector, tiIs xiParameterized corresponding values;
total chord length of
Figure BDA0001941496820000101
Performing cubic B-spline curve fitting on the parameterized spectral measurement data points in step 3:
the cubic B-spline curve model is established as follows:
Figure BDA0001941496820000102
wherein, q is 0,1*,M*N is less than or equal to the number of nodes, PqTo control the node, Nq,3(t) is a 3-order canonical B-spline basis function, derived according to the recursion formula:
Figure BDA0001941496820000103
control node Pq,q=1,2,...,M*-1 forming a node Matrix _ P having the following inverse equation relationship:
Figure BDA0001941496820000107
(Matrix_NTMatrix_N)Matrix_P=Matrix_R
Figure BDA0001941496820000104
Figure BDA0001941496820000105
Figure BDA0001941496820000106
where i is 1, 2., N-1, and the Matrix _ R is a control node PqVector data matrix of RvIs the light intensity zvThe vector data difference of (a);
computation control node Pq,q=1,2,...,M*A value of-1, modeled by a cubic B-spline curve, i.e. z0=B(0),zNB (1), can give P0、PM*Thus, a specific functional expression of a cubic B-spline fitting the curve B (t) can be obtained;
and step 3, further performing sampling interpolation to finish the work of light intensity calibration:
selecting proper sampling number H (H > N) to sample cubic B-spline curve according to requirement to obtain a series of discrete data points
Figure BDA0001941496820000111
Comprises the following steps:
Figure BDA0001941496820000112
wherein L1/H-1 is a sampling interval, and a series of discrete data points are selected to obtain continuous light intensity data
Figure BDA0001941496820000113
As the reference for the light intensity fitting, there are:
Figure BDA0001941496820000114
Figure BDA0001941496820000115
wherein, L' ═ xN-x0/H-1The serial number x, x belongs to (x) of the continuous image element0,xN) Interval of values of (1), connecting discrete data points in sequence
Figure BDA0001941496820000116
Continuous intensity data z can be acquired as follows:
Figure BDA0001941496820000117
thereby completing the light intensity calibration work.
And 4, step 4: establishing a corresponding relation between the wavelength and the light intensity according to the wavelength calibration and the light intensity calibration to finish the real-time calibration of the spectrum signal;
in step 4, the corresponding relationship between the wavelength and the light intensity is established as follows:
obtaining the wavelength y corresponding to the serial number x of the continuous pixel according to the wavelength calibration in the step 2, obtaining the light intensity z corresponding to the serial number x of the continuous pixel according to the light intensity calibration in the step 3, and obtaining the light intensity z corresponding to the wavelength y, namely:
(y,z),y∈[y1,y2]
thereby completing the real-time calibration of the spectrum signal.
The technical scheme of the invention is further specifically explained by using a CCD sensor (2048 pixels) with the model number of ILX554B to collect spectrum signals and a spectrometer to measure a wave band y belonging to the range of 200nm and 1100 nm.
Fig. 1 is a flow chart of a peak finding algorithm, a measurement data point set of a spectrum signal is constructed, and a maximum value point set of the spectrum signal is obtained through the peak finding algorithm.
FIG. 2 is a wavelength calibration flow chart, which determines the functional correspondence between pixel sequence numbers and wavelengths by using least-squares-based third-order polynomial fitting.
FIG. 3 is a light intensity calibration flow chart, wherein a chord length parameterization method is adopted to conduct parameterization on the pixel serial numbers of the spectral measurement data points, then three times of B-spline curve fitting is conducted on the parameterized spectral measurement data points, and further sampling interpolation is conducted to complete the light intensity calibration work.
Fig. 4 is a least squares third-order polynomial fitting curve of the low-pressure mercury lamp. 6 characteristic spectral lines of a low-pressure mercury lamp are selected: 253.65nm, 365.01nm, 404.66nm, 435.84nm, 546.07nm and 576.96nm, and obtaining the pixel sequence numbers of 6 peak values by using a peak searching algorithm on a spectrogram to be marked output by the CCD detector: 121, 357, 441, 508, 745, 813, and finally obtains the fitting result by substituting the equation after the third order fitting. It can be seen from fig. 4 that the fitting effect is excellent and can meet the requirement.
FIG. 5 is a wavelength scaling evaluation index for least squares third order polynomial fitting. The residual sum of squares of each fitting wavelength of the third-order polynomial is 0.049638, the standard error is 0.111398, and the values are all very small and can basically meet the precision requirement. The correlation index is 0.999999, almost approaches to 1, the fitting degree is good, and the third order is obviously superior to the first order and the second order polynomial fitting by comparing the values of the indexes.
FIG. 6 is selected data from a cubic B-spline curve fitting experiment. Fig. 7 shows the results of cubic B-spline curve fitting on the data of fig. 6 when the number of samples is 15, and fig. 8 shows the results of cubic B-spline curve fitting on the data of fig. 6 when the number of samples is 1000. When the number of samples is 15, the result of cubic B-spline curve fitting is shown in fig. 7. When the number of samples is 1000, the fitting result is shown in fig. 8. As can be seen from fig. 7 and 8, the cubic B-spline curve can pass through each measurement point, which is beneficial to ensure the accuracy of the measurement data and change the smoothness of the fitted curve by controlling the sampling number.
Fig. 9 shows the result of cubic B-spline curve fitting on the spectral signal of the deuterium lamp, and fig. 10 shows the enlarged partial (spectral band 590-600nm) spectrum of fig. 9. The fitting correlation index is calculated to be 0.9997, which indicates that the fitting curve has better smoothness. Therefore, cubic B-spline fitting can better reflect the overall trend of the curve, the fitting result is smoother, and the fitting method has a better local fitting effect and is suitable for light intensity fitting of the spectrum discrete signals.
Fig. 11 shows the result of performing polynomial (twenty-order) fitting on the spectral signal of the deuterium lamp, and it can be known from the result that the polynomial fitting is simple to implement, but has limited accuracy, and is not suitable for nonlinear approximation and disordered data containing singular values, i.e. light intensity calibration of a broadband micro spectrometer. Therefore, the cubic B-spline curve is more suitable for being used as a light intensity calibration algorithm of the broadband micro spectrometer.
Through comparison experiments, the real-time calibration method for the spectrum signal of the broadband spectrometer is proved to be suitable for wavelength calibration and light intensity calibration in the calibration process of the broadband spectrometer, and has real-time performance, practicability and higher accuracy.
It should be understood that the above description of the preferred embodiments is given for clarity and not for any purpose of limitation, and that various changes, substitutions and alterations can be made herein without departing from the spirit and scope of the invention as defined by the appended claims.

Claims (4)

1. A real-time calibration method for a spectrum signal of a broadband spectrometer is characterized by comprising the following steps:
step 1: constructing a measurement data point set of the spectral signal, and obtaining a maximum value point set of the spectral signal through a peak searching algorithm;
step 2: carrying out wavelength calibration by adopting a method of third-order polynomial fitting based on least square;
and step 3: carrying out parameterization on the pixel serial number of the spectral measurement data point by adopting a chord length parameterization method, then carrying out cubic B-spline curve fitting on the parameterized spectral measurement data point, and further carrying out sampling interpolation to finish the work of light intensity calibration;
and 4, step 4: establishing a corresponding relation between the wavelength and the light intensity according to the wavelength calibration and the light intensity calibration to finish the real-time calibration of the spectrum signal;
in step 4, the corresponding relationship between the wavelength and the light intensity is established as follows:
obtaining the wavelength y corresponding to the serial number x of the continuous pixel according to the wavelength calibration in the step 2, obtaining the light intensity z corresponding to the serial number x of the continuous pixel according to the light intensity calibration in the step 3, and obtaining the light intensity z corresponding to the wavelength y, namely:
(y,z),y∈[y1,y2]
thereby completing the real-time calibration of the spectrum signal, and y belongs to [ y ∈ [1,y2]Denoted as the spectrometer measurement band.
2. The real-time calibration method for the spectrum signal of the broadband spectrometer according to claim 1, characterized in that: the measurement data point set of the constructed spectrum signal in the step 1 is as follows:
collecting the spectrum signal by a broadband spectrometer, and collecting by a CCD camera in the broadband spectrometer to construct a measurement data point set of the spectrum signal:
U={(x0,z0),(x1,z1),...,(xN,zN)}
wherein (x)i,zi) N is the measurement data point of the ith spectral signal, N is the measurement data number of the spectral signal in the measurement data point set of the spectral signal, xiNumber of pixels, z, representing the ith spectral measurement data pointiThe light intensity of the ith spectral measurement data point is represented;
in the step 1, the maximum point set of the spectrum signal obtained by the peak searching algorithm is as follows:
according to a peak finding algorithm, z is compared sequentially by traversing a measurement data point set U of the spectrum signali-1,zi,zi+1If z is satisfiedi-1<ziAnd z isi>zi+1Namely, the maximum point, the obtained spectrum signal maximum point set, namely the peak position of the spectral line is as follows:
Figure FDA0002422238900000021
wherein the content of the first and second substances,
Figure FDA0002422238900000022
is the K thjThe measurement data point of each spectral signal is the jth spectral signal maximum, M is the number of spectral signal maximum in the set of spectral signal maximum,
Figure FDA0002422238900000023
denotes the K thjThe pixel serial number of the spectral measurement data point is the pixel serial number of the jth spectral signal maximum value point,
Figure FDA0002422238900000024
denotes the K thjThe light intensity of the jth spectral signal maximum value point is the light intensity of the spectral measurement data point.
3. The real-time calibration method for the spectrum signal of the broadband spectrometer according to claim 1, characterized in that: and 2, performing wavelength calibration by adopting a least square-based third-order polynomial fitting method as follows:
the measurement wave band of the spectrometer is y ∈ [ y >1,y2]Calibrating M characteristic spectral lines of light source in same wave band
Figure FDA0002422238900000025
As a benchmark;
Figure FDA0002422238900000026
the serial number of the pixel which represents the maximum value point of the jth spectral signal,
Figure FDA0002422238900000027
the wavelength corresponding to the pixel serial number of the jth spectrum signal maximum value point is represented, and a fitting curve is set as
Figure FDA00024222389000000218
And
Figure FDA00024222389000000210
the corresponding polynomial equation is:
Figure FDA00024222389000000219
wherein M is the number of the maximum points of the spectrum signal in the maximum point set of the spectrum signal, a0Is the first coefficient of a third-order polynomial, a1A second coefficient of a third-order polynomial, a2A third coefficient of a third order polynomial, a3A fourth coefficient that is a third order polynomial;
processing using least squares, points
Figure FDA00024222389000000211
The deviation of (a) is:
Figure FDA00024222389000000212
the least squares rule being to minimize the sum of squares of deviations
Figure FDA00024222389000000213
Namely, it is
Figure FDA00024222389000000214
To make it possible to
Figure FDA00024222389000000215
At minimum, for the independent variable a0、a1、a2、a3Calculating a partial derivative to make the value of the partial derivative be 0;
Figure FDA00024222389000000216
Figure FDA00024222389000000217
Figure FDA0002422238900000031
Figure FDA0002422238900000032
the wavelengths of M characteristic spectral lines of a calibration light source
Figure FDA0002422238900000033
And the pixel serial number of the corresponding spectrum signal maximum value point
Figure FDA0002422238900000034
Substituting the above formula to solve the coefficient solution of least square equation
Figure FDA0002422238900000035
Finally, the fitting formula of the pixel serial number and the wavelength is obtained as follows:
Figure FDA0002422238900000036
the corresponding relation between the serial number of the continuous pixel and the wavelength is obtained as follows:
Figure FDA0002422238900000037
where x ∈ [ x ]0,xN]Is the serial number of the continuous pixel, y belongs to [ y ∈ [)1,y2]Measuring the waveband for a spectrometer;
and (3) according to the step (1) and the step (2), the corresponding relation between the pixel serial number and the wavelength can be obtained, and the wavelength calibration work is completed.
4. The real-time calibration method for the spectrum signal of the broadband spectrometer according to claim 1, characterized in that: and 3, carrying out parameterization treatment on the pixel sequence numbers of the spectral measurement data points by adopting a chord length parameterization method:
pixel serial number x for N +1 spectral measurement data pointsiN, chord length parameterization:
Figure FDA0002422238900000038
wherein x isi-xi-1Is a chord edge vector, tiIs xiParameterized corresponding values;
total chord length of
Figure FDA0002422238900000039
Performing cubic B-spline curve fitting on the parameterized spectral measurement data points in step 3:
the cubic B-spline curve model is established as follows:
Figure FDA00024222389000000310
wherein, q is 0,1*,M*N is less than or equal to the number of nodes, PqTo control the node, Nq,3(t) is a 3-order canonical B-spline basis function, derived according to the recursion formula:
Figure FDA0002422238900000041
control node Pq,q=1,2,...,M*-1 forming a node Matrix _ P having the following inverse equation relationship:
Figure FDA0002422238900000042
(Matrix_NTMatrix_N)Matrix_P=Matrix_R
Figure FDA0002422238900000043
Figure FDA0002422238900000044
Figure FDA0002422238900000045
where i is 1, 2., N-1, and the Matrix _ R is a control node PqVector data matrix of RvIs the light intensity zvThe vector data difference of (a);
computation control node Pq,q=1,2,...,M*A value of-1, modeled by a cubic B-spline curve, i.e. z0=B(0),zNB (1), can give P0、PM*Thus, a specific functional expression of a cubic B-spline fitting the curve B (t) can be obtained;
and step 3, further performing sampling interpolation to finish the work of light intensity calibration:
the cubic B-spline curve is sampled by selecting a proper sampling number H (H □ N) according to the requirement, and a series of discrete data points can be obtained
Figure FDA0002422238900000046
Comprises the following steps:
Figure FDA0002422238900000051
wherein L1/H-1 is a sampling interval, and a series of discrete data points are selected to obtain continuous light intensity data
Figure FDA0002422238900000052
As the reference for the light intensity fitting, there are:
Figure FDA0002422238900000053
Figure FDA0002422238900000054
wherein, L' ═ xN-x0the/H-1 is a serial number x of a continuous pixel, and x belongs to (x)0,xN) Interval of values of (1), connecting discrete data points in sequence
Figure FDA0002422238900000055
Continuous intensity data z can be acquired as follows:
Figure FDA0002422238900000056
thereby completing the light intensity calibration work.
CN201910023111.7A 2019-01-10 2019-01-10 Real-time calibration method for spectral signals of broadband spectrometer Expired - Fee Related CN109724698B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201910023111.7A CN109724698B (en) 2019-01-10 2019-01-10 Real-time calibration method for spectral signals of broadband spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201910023111.7A CN109724698B (en) 2019-01-10 2019-01-10 Real-time calibration method for spectral signals of broadband spectrometer

Publications (2)

Publication Number Publication Date
CN109724698A CN109724698A (en) 2019-05-07
CN109724698B true CN109724698B (en) 2020-05-22

Family

ID=66299683

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201910023111.7A Expired - Fee Related CN109724698B (en) 2019-01-10 2019-01-10 Real-time calibration method for spectral signals of broadband spectrometer

Country Status (1)

Country Link
CN (1) CN109724698B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110487404A (en) * 2019-09-25 2019-11-22 台州市维谱智能科技有限公司 A method of eliminating grating spectrograph Advanced Diffraction influences
CN111721734B (en) * 2020-06-29 2022-12-27 中国科学院合肥物质科学研究院 On-orbit spectrum calibration method for infrared very-high spectral resolution detector for high-resolution five-number satellite
CN112986161A (en) * 2021-05-11 2021-06-18 南京智谱科技有限公司 Online wavelength calibration method and device for water quality monitoring spectrometer
CN113654457A (en) * 2021-07-22 2021-11-16 太原理工大学 Spectrum confocal measuring head wavelength and displacement mapping relation calibration device and fitting method
CN113984208A (en) * 2021-10-26 2022-01-28 重庆川仪自动化股份有限公司 Spectrometer wavelength calibration method, system, medium and electronic terminal

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105222892A (en) * 2015-11-04 2016-01-06 中国电子科技集团公司第四十一研究所 A kind of wavelength scaling method of ultraviolet spectrometer (UVS)
CN105424185A (en) * 2015-11-04 2016-03-23 清华大学 Computer assisted full-waveband spectrometer wavelength calibration method
CN105758434A (en) * 2015-10-12 2016-07-13 北京信息科技大学 FBG reflectance spectrum sensing demodulation method based on linear array InGaAs scanning

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7999933B2 (en) * 2009-08-14 2011-08-16 Princeton Instruments Method for calibrating imaging spectrographs

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105758434A (en) * 2015-10-12 2016-07-13 北京信息科技大学 FBG reflectance spectrum sensing demodulation method based on linear array InGaAs scanning
CN105222892A (en) * 2015-11-04 2016-01-06 中国电子科技集团公司第四十一研究所 A kind of wavelength scaling method of ultraviolet spectrometer (UVS)
CN105424185A (en) * 2015-11-04 2016-03-23 清华大学 Computer assisted full-waveband spectrometer wavelength calibration method

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
微型宽波段光谱仪光学系统设计;尤泽樟 等;《应用光学》;20170930;第38卷(第5期);第740-745页 *

Also Published As

Publication number Publication date
CN109724698A (en) 2019-05-07

Similar Documents

Publication Publication Date Title
CN109724698B (en) Real-time calibration method for spectral signals of broadband spectrometer
EP0560006B1 (en) Standardizing and calibrating a spectrometric instrument
CN108844939B (en) Raman spectrum detection baseline correction method based on asymmetric weighted least square
CN108896499A (en) In conjunction with principal component analysis and the polynomial spectral reflectance recovery method of regularization
JPS60502269A (en) Multi-component quantitative analysis method and device
CN110006829B (en) Micro spectrometer calibration method based on least square method
CN105222892B (en) A kind of wavelength scaling method of ultraviolet spectrometer
CN101750401A (en) Method for automatically correcting laser induced plasma emission spectrum continuous background interference
CN111089661B (en) Temperature rapid extraction method based on laser absorption spectrum
CN111999258B (en) Spectral baseline correction-oriented weighting modeling local optimization method
CN109520941B (en) Response function correction method of on-line spectral measuring instrument
WO2020186844A1 (en) Self-adaptive surface absorption spectrum analysis method and system, storage medium, and device
CN110399646B (en) DFDI instrument model building method for extrasystematic planet detection
CN105004707B (en) The online Raman spectrometer spectrogram standardized method of ccd array
CN106568508B (en) Registration method for correcting wavelength drift of satellite hyperspectral data
JP2003500639A (en) Applicability determination method and system for spectroscopic data combined with continuous recalibration
CN110864808A (en) Fourier transform spectrum detection method based on high-speed sampling
CN112230236A (en) Spectrum confocal displacement sensor distance measurement calculation method, system, device and storage medium
CN111811398A (en) Multi-surface measurement method based on phase shift characteristic polynomial high-precision fitting
US20050280812A1 (en) Numerical data processing dedicated to an integrated microspectrometer
CA2455136C (en) Standardizing and calibrating a spectrometric instrument
Qin et al. Fourier spectral resolution enhancement algorithm based on linear prediction
CN115060631B (en) Self-adaptive particulate matter Raman similarity judging method
CN111256819B (en) Noise reduction method of spectrum instrument
CN111507312A (en) Soil moisture extraction method based on hyperspectral data

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20200522

Termination date: 20210110