CN109687911A - A kind of wavelength monitor structure - Google Patents
A kind of wavelength monitor structure Download PDFInfo
- Publication number
- CN109687911A CN109687911A CN201710976063.4A CN201710976063A CN109687911A CN 109687911 A CN109687911 A CN 109687911A CN 201710976063 A CN201710976063 A CN 201710976063A CN 109687911 A CN109687911 A CN 109687911A
- Authority
- CN
- China
- Prior art keywords
- etalon
- photodetector
- wavelength
- monitor structure
- wavelength monitor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- BJQHLKABXJIVAM-UHFFFAOYSA-N bis(2-ethylhexyl) phthalate Chemical compound CCCCC(CC)COC(=O)C1=CC=CC=C1C(=O)OCC(CC)CCCC BJQHLKABXJIVAM-UHFFFAOYSA-N 0.000 claims abstract description 41
- 230000003595 spectral effect Effects 0.000 claims abstract description 9
- 230000003287 optical effect Effects 0.000 claims abstract description 8
- 238000012544 monitoring process Methods 0.000 claims description 10
- 239000004568 cement Substances 0.000 claims description 3
- 239000000758 substrate Substances 0.000 claims description 3
- 238000004891 communication Methods 0.000 abstract description 2
- 239000013307 optical fiber Substances 0.000 abstract description 2
- 238000011088 calibration curve Methods 0.000 description 5
- 238000009510 drug design Methods 0.000 description 2
- 238000012806 monitoring device Methods 0.000 description 2
- 238000010845 search algorithm Methods 0.000 description 2
- 238000012742 biochemical analysis Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/50—Transmitters
- H04B10/572—Wavelength control
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
- H04B10/0795—Performance monitoring; Measurement of transmission parameters
- H04B10/07955—Monitoring or measuring power
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
- H04B10/075—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal
- H04B10/079—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an in-service signal using measurements of the data signal
- H04B10/0795—Performance monitoring; Measurement of transmission parameters
- H04B10/07957—Monitoring or measuring wavelength
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/50—Transmitters
- H04B10/501—Structural aspects
- H04B10/503—Laser transmitters
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
- H04B10/50—Transmitters
- H04B10/564—Power control
Abstract
The present invention relates to technical field of optical fiber communication, more particularly, to a kind of wavelength monitor structure, it includes collimator, beam splitter, the first etalon, the second etalon, the first photodetector and the second photodetector in optical path, the Free Spectral Range of first etalon is greater than twice of light beam wavelength to be monitored, and the Free Spectral Range of the second etalon is less than light beam wavelength to be monitored；After light beam to be monitored enters collimator collimation, across the first etalon, at least it is divided into two-way using beam splitter, after the first via passes through the second etalon, into the first photodetector, first photodetector converts light into as electric signal and exports the first detectable signal, and another way enters the second photodetector, and the second photodetector converts light into as electric signal and exports the second detectable signal.
Description
Technical field
The present invention relates to technical field of optical fiber communication, more particularly, to a kind of wavelength monitor structure.
Background technique
Tunable laser has tunable wave length, Wavelength stabilized, line width, low noise advantages, and it is logical to be widely used in light
The fields such as letter, biochemical analysis, metering, tunable laser module can also be applied to the fields such as optical sensing.Tunable laser
Generally there are a set of wavelength monitoring device, real-time monitoring laser output wavelength, when there are larger with setting wavelength for output wavelength
When deviation, wavelength monitoring device, which can provide feedback signal to Laser Control System, makes itself and setting so as to adjust output wavelength
Value is consistent.
Summary of the invention
In view of the above-mentioned deficiencies in the prior art, it is an object of the present invention to provide, a kind of design is reasonable, and structure is simple, at low cost
It is honest and clean, wavelength monitor structure with high accuracy.
To achieve the above object, the invention adopts the following technical scheme:
A kind of wavelength monitor structure comprising collimator, beam splitter, the first etalon, the second etalon in optical path,
The Free Spectral Range of one photodetector and the second photodetector, first etalon is greater than light beam wavelength to be monitored
Twice, the Free Spectral Range of the second etalon is less than light beam wavelength to be monitored；
After light beam to be monitored enters collimator collimation, the first etalon is passed through, is at least divided into two-way, the first via using beam splitter
After the second etalon, into the first photodetector, the first photodetector converts light into as electric signal and exports first
Detectable signal, another way enter the second photodetector, and the second photodetector converts light into as electric signal and exports the second spy
Survey signal.
Further, the beam splitter includes the first beam splitting chip and the second beam splitting chip.
Preferably, first etalon is Vernier etalon.
Preferably, second etalon is ultra-thin etalon.
The ultra-thin etalon is directly deepened optical cement by Si and is made a substrate upthrow is thin.
The working principle of wavelength monitor structure of the present invention is as follows:
Before monitoring, the reference beam as reference standard is first injected into collimator, then first that the first photodetector is obtained
Detectable signal is set as the first power curve, while the second detectable signal that the second photodetector is obtained is set as the second function
Rate curve, being then disposed at ordinate respectively is power, and abscissa is to obtain having power curve in the plane of wavelength
The calibration curve figure of peak wavelength and peak period；
When monitoring, light beam to be monitored is made to inject collimator, the first detectable signal that can be obtained from the first photodetector,
And the second detectable signal obtained from the second photodetector is first visited according to second by the search algorithm to calibration curve figure
It surveys power P 2 shown in signal and determines its lateral position in the second power curve in large period T, so that it is determined that power P 2 is the
Rough section in one power curve in the minor cycle determines it further according to the corresponding rough section of power P 1 shown in the first detectable signal
Then lateral position in the first power curve carries out longitudinal accurate inquiry, the higher wavelength value of precision can be obtained, thus
Substantially increase the precision of wavelength monitoring.
The present invention imitates wavelength locking structure by surveying light intensity to survey wavelength using ultra-thin etalon, then feeds back Vernier mark
Quasi- tool reaches the light intensity that required wavelength penetrates to temperature control output, comes so that it be made to cannot be only used for production tunable laser
Real-time monitoring laser output wavelength has to obtain required wavelength with timely adjustment criteria, and can be used for feeding back Vernier mark
The temperature of quasi- tool.The present invention has rational design, and structure is simple, low in cost, and precision is high.
Detailed description of the invention
The present invention is described in further details below in conjunction with the drawings and specific embodiments:
Fig. 1 is the structural schematic diagram of wavelength monitor structure of the present invention；
Fig. 2 is the calibration curve figure of wavelength monitor structure of the present invention.
Specific embodiment
The present invention will be further described in detail with reference to the specific embodiments:
As shown in Fig. 1 or Fig. 2, wavelength monitor structure of the invention comprising collimator 1, beam splitter 2 in optical path,
First etalon 3, the second etalon 4, the first photodetector 5 and the second photodetector 6, first etalon 3 from
It is greater than twice of light beam wavelength to be monitored by spectral region, the Free Spectral Range of the second etalon 4 is less than light beam wave to be monitored
It is long；
After light beam to be monitored enters the collimation of collimator 1, the first etalon 3 is passed through, is at least divided into two-way using beam splitter 2, the
After passing through the second etalon 4 all the way, into the first photodetector 5, the first photodetector 5 is converted light into as electric signal and defeated
First detectable signal out, another way enter the second photodetector 6, and the second photodetector 6 converts light into as electric signal and defeated
Second detectable signal out.
Further, the beam splitter 2 includes the first beam splitting chip 21 and the second beam splitting chip 22.
Preferably, first etalon 3 is Vernier etalon.
Preferably, second etalon 4 is ultra-thin etalon.
The ultra-thin etalon is directly deepened optical cement by Si and is made a substrate upthrow is thin.
The working principle of wavelength monitor structure of the present invention is as follows:
Before monitoring, the reference beam as reference standard is first injected into collimator 1, then that the first photodetector 5 is obtained
One detectable signal is set as the first power curve 7, while setting for the second detectable signal that the second photodetector 6 obtains
Two power curve 8, being then disposed at ordinate respectively is power, and abscissa is to obtain in the plane of wavelength with power
The peak wavelength of curve and the calibration curve figure of peak period；
When monitoring, light beam to be monitored is made to inject collimator 1, the first detection letter that can be obtained from the first photodetector 5
Number, and the second detectable signal obtained from the second photodetector 6, by the search algorithm to calibration curve figure, first according to the
Power P 2 shown in two detectable signals determines its lateral position in the second power curve 8 in large period T, so that it is determined that power P 2
Rough section within the 8 upper minor cycle of the first power curve, further according to the corresponding rough section of power P 1 shown in the first detectable signal
It determines its lateral position in the first power curve 8, then carries out longitudinal accurate inquiry, the higher wavelength of precision can be obtained
Value, to substantially increase the precision of wavelength monitoring.
As shown in Fig. 2, the Free Spectral Range FSR of the first etalon 3 is greater than 60nm, right if C-Band is 30nm
The wavelength value range answered n from λ 1 to λ.
The present invention imitates wavelength locking structure by surveying light intensity to survey wavelength using ultra-thin etalon, then feeds back Vernier mark
Quasi- tool reaches the light intensity that required wavelength penetrates to temperature control output, comes so that it be made to cannot be only used for production tunable laser
Real-time monitoring laser output wavelength has to obtain required wavelength with timely adjustment criteria, and can be used for feeding back Vernier mark
The temperature of quasi- tool.The present invention has rational design, and structure is simple, low in cost, and precision is high.
Above description should not have any restriction to protection scope of the present invention.
Claims (5)
1. a kind of wavelength monitor structure, it is characterised in that: it include collimator in the optical path, beam splitter, the first etalon,
Second etalon, the first photodetector and the second photodetector, the Free Spectral Range of first etalon be greater than to
The Free Spectral Range of twice of monitoring light beam wavelength, the second etalon is less than light beam wavelength to be monitored；
After light beam to be monitored enters collimator collimation, the first etalon is passed through, is at least divided into two-way, the first via using beam splitter
After the second etalon, into the first photodetector, the first photodetector converts light into as electric signal and exports first
Detectable signal, another way enter the second photodetector, and the second photodetector converts light into as electric signal and exports the second spy
Survey signal.
2. a kind of wavelength monitor structure according to claim 1, it is characterised in that: the beam splitter includes the first beam splitting chip
With the second beam splitting chip.
3. a kind of wavelength monitor structure according to claim 1, it is characterised in that: first etalon is Vernier
Etalon.
4. a kind of wavelength monitor structure according to claim 1, it is characterised in that: second etalon is ultra-thin standard
Tool.
5. a kind of wavelength monitor structure according to claim 4, it is characterised in that: the ultra-thin etalon is directly deep by Si
Change optical cement to be made a substrate upthrow is thin.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710976063.4A CN109687911A (en) | 2017-10-19 | 2017-10-19 | A kind of wavelength monitor structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710976063.4A CN109687911A (en) | 2017-10-19 | 2017-10-19 | A kind of wavelength monitor structure |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109687911A true CN109687911A (en) | 2019-04-26 |
Family
ID=66182923
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710976063.4A Pending CN109687911A (en) | 2017-10-19 | 2017-10-19 | A kind of wavelength monitor structure |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109687911A (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5130998A (en) * | 1990-02-21 | 1992-07-14 | Mitsubiski Denki Kaubshiki Kaisha | Laser device with oscillation wavelength control |
| US20020126345A1 (en) * | 1999-07-27 | 2002-09-12 | Green Evan D.H. | Method and apparatus for filtering an optical beam |
| US20020181519A1 (en) * | 2001-05-31 | 2002-12-05 | Altitun Ab | Apparatus and method for controlling the operating wavelength of a laser |
| US20030107746A1 (en) * | 2001-12-11 | 2003-06-12 | Altitun Ab | Robust wavelength locker for control of laser wavelength |
| US20030108072A1 (en) * | 2001-12-11 | 2003-06-12 | Altitun Ab | Method and algorithm for continuous wavelength locking |
| CN1524324A (en) * | 2001-07-06 | 2004-08-25 | ض� | Evaluation and adjustment of laser losses according to voltage across gain medium |
| CN103208739A (en) * | 2012-01-16 | 2013-07-17 | 昂纳信息技术（深圳）有限公司 | Wavelength lock and wavelength locking device with same |
-
2017
- 2017-10-19 CN CN201710976063.4A patent/CN109687911A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5130998A (en) * | 1990-02-21 | 1992-07-14 | Mitsubiski Denki Kaubshiki Kaisha | Laser device with oscillation wavelength control |
| US20020126345A1 (en) * | 1999-07-27 | 2002-09-12 | Green Evan D.H. | Method and apparatus for filtering an optical beam |
| US20020181519A1 (en) * | 2001-05-31 | 2002-12-05 | Altitun Ab | Apparatus and method for controlling the operating wavelength of a laser |
| CN1524324A (en) * | 2001-07-06 | 2004-08-25 | ض� | Evaluation and adjustment of laser losses according to voltage across gain medium |
| US20030107746A1 (en) * | 2001-12-11 | 2003-06-12 | Altitun Ab | Robust wavelength locker for control of laser wavelength |
| US20030108072A1 (en) * | 2001-12-11 | 2003-06-12 | Altitun Ab | Method and algorithm for continuous wavelength locking |
| CN103208739A (en) * | 2012-01-16 | 2013-07-17 | 昂纳信息技术（深圳）有限公司 | Wavelength lock and wavelength locking device with same |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20190426 |
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| RJ01 | Rejection of invention patent application after publication |