CN109633488B - Lamp testing system and lamp testing method - Google Patents
Lamp testing system and lamp testing method Download PDFInfo
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/005—Testing of electric installations on transport means
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- G—PHYSICS
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention discloses a lamp testing system and a lamp testing method, wherein the lamp testing system is used for detecting the luminous performance of a lamp and comprises an initialization module, an environment simulation module, a data acquisition module, a first processing module, a second processing module and a result output module.
Description
Technical Field
The invention relates to the field of electromagnetic compatibility testing of automobile parts, in particular to a lamp testing system and a lamp testing method suitable for electromagnetic compatibility testing.
Background
With the rapid development of the automobile industry, the vehicle-mounted electrical equipment technology has also advanced greatly. Especially light electrical equipment, basically realizes the LED as a luminous main body, and applies a large-current drive circuit and a logic control chip therein. In addition, due to the diversification of the vehicle shapes, the vehicle lamp can change along with the appearance, the inside of the vehicle lamp can adopt a mode of split working of a plurality of PCB boards, if the distribution design is unreasonable, the vehicle lamp can be easily coupled to the external field intensity interference, and the vehicle lamp is abnormal in display or fails. Meanwhile, the vehicle lamp is used as a safety part which is forcibly required by the state and has strict requirements on the normal working state of the vehicle lamp, and the requirement on the electromagnetic compatibility test level is highest.
However, in the current electromagnetic compatibility test, for the test of the light intensity change, a tester needs to observe whether the light emitting state of the tested lamp is normal through the monitoring camera, and finally, the tester gives a conclusion whether the abnormal lamp is generated, so that correct test data cannot be objectively given; and when the lamp to be detected is abnormal in work, the light emitting state of the lamp to be detected cannot be matched with the field intensity and frequency of the electromagnetic field for analysis.
Disclosure of Invention
The invention aims to provide a lamp testing system and a lamp testing method, which are used for solving the technical problems that the manual testing precision is not high and the abnormal luminous state of a tested lamp cannot be matched with the field intensity and the frequency of a corresponding electromagnetic field in the prior art.
In order to achieve the above purpose, the invention provides the following technical scheme:
a lamp testing system is used for detecting the luminous performance of a lamp and is characterized by comprising an initialization module, an environment simulation module, a data acquisition module, a first processing module, a second processing module and a result output module; wherein the content of the first and second substances,
the initialization module is used for setting test acquisition frequency and standard luminous data according to the non-interference working frequency, the non-interference picture data and the non-interference light intensity data of the tested lamp before the test is started;
the first processing module is used for generating magnetic field frequency data and magnetic field strength data which correspond to each other one by one and outputting the magnetic field frequency data and the magnetic field strength data to the environment simulation module and the second processing module in pairs;
the environment simulation module is used for simulating electromagnetic fields with different frequencies and field strengths according to the magnetic field frequency data and the magnetic field strength data so as to interfere the light emitting state of the lamp;
the data acquisition module is used for acquiring real-time image data and real-time light intensity data of the interfered lamp according to the test acquisition frequency, generating real-time light emitting data according to the image data and the real-time light intensity data and outputting the real-time light emitting data to the second processing module;
the second processing module is used for comparing the real-time luminous data with the standard luminous data to screen out abnormal luminous data, and correspondingly storing the abnormal luminous data with the abnormal picture data, the abnormal magnetic field frequency data and the abnormal magnetic field intensity data at the same moment; and critical magnetic field intensity data used for judging abnormal luminous data under any abnormal magnetic field frequency data;
and the result output module is used for statistically outputting the abnormal luminous data, the abnormal picture data, the abnormal magnetic field frequency data and the abnormal magnetic field intensity data to obtain a test result of the lamp.
Specifically, the standard lighting data includes standard light intensity data, standard light color data, and standard lighting area data;
the real-time light emitting data comprises real-time light intensity data, real-time light color data and real-time lighting area data.
Preferably, the lamp testing system further includes a third processing module, where the third processing module is configured to select magnetic field strength data that changes when the abnormal magnetic field frequency data is generated, and output the selected abnormal magnetic field frequency data and the changed magnetic field strength data to the environment simulation module and the second processing module, so that the second processing module determines critical magnetic field strength data that causes abnormal lighting data to appear when the abnormal magnetic field frequency data is selected.
Preferably, the initialization module comprises a data acquisition module initialization unit and a second processing module initialization unit, wherein,
the data acquisition module initialization unit is used for setting the test acquisition frequency of the data acquisition module to be consistent with the interference-free working frequency of the tested car lamp;
and the second processing module initialization unit is used for respectively setting the standard light intensity data, the standard light color data and the standard lighting area data in the second processing module to be consistent with the non-interference light intensity data, the non-interference light color data and the non-interference lighting area data of the tested vehicle lamp.
Preferably, the data acquisition module comprises an image data acquisition unit, a light intensity data acquisition unit and a data integration unit, wherein,
the image data acquisition unit is used for acquiring real-time image data and extracting the real-time photochromic data and the real-time lighting area data according to the real-time image data; the image data acquisition unit further comprises an image memory for storing the real-time image data;
the light intensity data acquisition unit is used for acquiring the real-time light intensity data;
the data integration unit is used for generating real-time light emitting data according to the real-time light color data, the real-time lighting area data and the real-time light intensity data at the same moment and outputting the real-time light emitting data to the second processing module.
Preferably, the second processing module comprises a light intensity processing unit, a light color processing unit and a lighting area processing unit, wherein,
the light intensity processing unit is used for extracting the real-time light intensity data according to the real-time light emitting data, comparing the real-time light intensity data with the standard light intensity data, screening abnormal light intensity data, reading abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal light emitting data and abnormal image data in the image memory at the same moment according to the abnormal light intensity data, and correspondingly storing the abnormal magnetic field frequency data, the abnormal magnetic field intensity data, the abnormal light emitting data and the abnormal image data;
the light color processing unit is used for extracting the real-time light color data according to the real-time light emitting data, comparing the real-time light color data with the standard light color data, screening abnormal light color data, reading abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal light emitting data and abnormal image data in the image memory at the same moment according to the abnormal light color data, and correspondingly storing the abnormal magnetic field frequency data, the abnormal magnetic field intensity data, the abnormal light emitting data and the abnormal image data;
and the lighting area processing unit is used for extracting the real-time lighting area data according to the real-time lighting data, comparing the real-time lighting area data with the standard lighting area data, screening abnormal lighting area data, reading abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal lighting data and abnormal image data in the image memory at the same moment according to the abnormal lighting area data, and correspondingly storing the abnormal magnetic field frequency data, the abnormal magnetic field intensity data, the abnormal lighting data and the abnormal image data.
A lamp testing method is applied to the lamp testing system and used for detecting the light emitting performance of a lamp, and comprises the following steps:
s1, setting a test acquisition frequency and standard luminous data according to the non-interference working frequency, the non-interference picture data and the non-interference light intensity data of the tested lamp before the test;
s2, generating magnetic field frequency data and magnetic field intensity data in one-to-one correspondence by utilizing the first processing module;
s3, simulating electromagnetic fields with different frequencies and field strengths according to the magnetic field frequency data and the magnetic field strength data so as to interfere the light emitting state of the lamp;
s4, collecting real-time image data and real-time light intensity data of the interfered lamp according to the test collection frequency, and generating real-time light emitting data according to the real-time image data and the real-time light intensity data;
s5, comparing the real-time luminous data with the standard luminous data to screen abnormal luminous data, and correspondingly storing the abnormal luminous data with abnormal picture data, abnormal magnetic field frequency data and abnormal magnetic field intensity data at the same moment; judging critical magnetic field intensity data which cause abnormal luminous data under any abnormal magnetic field frequency data;
s6, statistically outputting the abnormal light emitting data, the abnormal picture data, the abnormal magnetic field frequency data and the abnormal magnetic field intensity data to obtain a test result of the lamp.
Specifically, the step S1 includes:
s101, setting the test acquisition frequency of the data acquisition module to be consistent with the interference-free working frequency of the tested car lamp;
and S102, setting the standard light intensity data, the standard light color data and the standard lighting area data in the second processing module to be consistent with the non-interference light intensity data, the non-interference light color data and the non-interference lighting area data of the tested vehicle lamp respectively.
Preferably, the step S4 includes:
s401, acquiring real-time image data, extracting real-time photochromic data and real-time lighting area data according to the real-time image data, and storing the real-time image data into an image memory;
meanwhile, collecting the real-time light intensity data;
s402, generating real-time light emitting data according to the real-time light color data, the real-time lighting area data and the real-time light intensity data at the same moment, and outputting the real-time light emitting data to a second processing module.
Specifically, the step S5 includes:
s501, extracting the real-time light intensity data according to the real-time light emitting data, comparing the real-time light intensity data with the standard light intensity data, screening abnormal light intensity data, reading abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal light emitting data and abnormal image data in the image memory at the same moment according to the abnormal light intensity data, and correspondingly storing the abnormal magnetic field frequency data, the abnormal magnetic field intensity data, the abnormal light emitting data and the abnormal image data;
s502, extracting the real-time light color data according to the real-time light emitting data, comparing the real-time light color data with the standard light color data, screening abnormal light color data, reading abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal light emitting data and abnormal image data in the image memory at the same time according to the abnormal light color data, and correspondingly storing the abnormal magnetic field frequency data, the abnormal magnetic field intensity data, the abnormal light emitting data and the abnormal image data;
s503, extracting the real-time lighting area data according to the real-time lighting data, comparing the real-time lighting area data with the standard lighting area data, screening abnormal lighting area data, reading abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal lighting data and abnormal image data in the image memory at the same moment according to the abnormal lighting area data, and correspondingly storing the abnormal magnetic field frequency data, the abnormal magnetic field intensity data, the abnormal lighting data and the abnormal image data;
s504, selecting the magnetic field intensity data which are generated and changed under any abnormal magnetic field frequency data, and outputting the selected abnormal magnetic field frequency data and the changed magnetic field intensity data to the environment simulation module and the second processing module, so that the second processing module judges the critical magnetic field intensity data which cause abnormal luminous data under the selected abnormal magnetic field frequency data.
Compared with the prior art, the lamp testing system and the lamp testing method provided by the invention have the following beneficial effects:
according to the lamp testing system, before the test is started, the initialization module sets the test acquisition frequency and the standard light-emitting data, the preset test acquisition frequency is consistent with the interference-free working frequency of the tested lamp, other modules can work only in the working period of the tested lamp, the difficulty of subsequent acquisition and comparison is reduced, and whether the working frequency of the tested lamp is abnormal due to electromagnetic interference can be conveniently judged; the standard light-emitting data in the second processing module is preset, so that whether the light-emitting state of the tested lamp is abnormal or not can be conveniently, objectively and accurately compared and analyzed by using the data.
The first processing module generates magnetic field frequency data and magnetic field intensity data which correspond to each other one by one, the magnetic field frequency data are discrete data which grow from zero in a logarithmic function mode and cover all frequency domains of the electromagnetic interference test of the lamp, each magnetic field frequency data is provided with magnetic field intensity data which are output in pairs corresponding to the magnetic field frequency data, the environment simulation module simulates electromagnetic fields with different frequencies and field intensities according to the magnetic field frequency data and the magnetic field intensity data so as to interfere the light emitting state of the lamp, and the first processing module and the environment simulation module are matched for use, so that the controllability and the datamation of a magnetic field environment are realized.
Under the electromagnetic field environment, the data acquisition module acquires real-time image data and real-time light intensity data of the interfered lamp according to a preset test acquisition frequency to generate real-time light emitting data; then, the second processing module compares the received real-time luminous data with preset standard luminous data to screen abnormal luminous data, and correspondingly stores the abnormal luminous data with abnormal picture data, abnormal magnetic field frequency data and abnormal magnetic field intensity data at the same moment, so that the technical problem that the abnormal luminous state of the tested lamp is matched with the field intensity and frequency of a corresponding electromagnetic field is solved, and the relationship between the abnormal luminous state of the lamp and the interference of the electromagnetic field can be accurately and objectively analyzed from the data; the second processing module can also judge critical magnetic field intensity data of abnormal luminous data caused by any abnormal magnetic field frequency data, and in the judging process, the abnormal luminous data, the abnormal picture data, the abnormal magnetic field frequency data and the abnormal magnetic field intensity data at the same moment are correspondingly stored, so that an accurate critical value causing the abnormal luminous state of the lamp can be objectively obtained from the data.
And finally, the result output module correspondingly counts and outputs each abnormal luminous data, the abnormal picture data, the abnormal magnetic field frequency data and the abnormal magnetic field intensity data at the same moment to obtain an accurate lamp test result, and the technical problems that in the prior art, the manual test precision is not high, and the abnormal luminous state of the tested lamp cannot be matched with the field intensity and the frequency of the corresponding electromagnetic field are solved.
The invention also provides a lamp testing method, which adopts the lamp testing system to obtain an accurate lamp testing result and solves the technical problems that the manual testing precision is not high and the abnormal light emitting state of the tested lamp cannot be matched with the field intensity and the frequency of the corresponding electromagnetic field in the prior art.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and not to limit the invention. In the drawings:
fig. 1 is a schematic view of a lamp testing system according to an embodiment of the present invention;
FIG. 2 is a schematic view of a light intensity collecting unit according to an embodiment of the present invention;
fig. 3 is a schematic circuit structure diagram of a light intensity collecting unit according to an embodiment of the present invention;
fig. 4 is a schematic diagram of a lighting area of a lamp to be tested according to an embodiment of the present invention;
fig. 5 is a schematic diagram of a lamp testing method according to an embodiment of the present invention.
1-anechoic chamber, 2-optical fiber;
3-a data acquisition module, 31-a reference voltage unit;
32-a photoelectric conversion unit, 33-a sampling signal adjusting unit;
331-automatic adapter, 34-acquisition unit;
341-micro control unit, 3411-a/D converter;
342-CAN bus.
Detailed Description
In order to make the aforementioned objects, features and advantages of the present invention comprehensible, embodiments accompanied with figures are described in detail below. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Example one
Referring to fig. 1, a lamp testing system according to an embodiment of the present invention is used for detecting a light emitting performance of a lamp, and includes an initialization module, an environment simulation module, a data acquisition module, a first processing module, a second processing module, and a result output module.
The initialization module is connected with and acts on the data acquisition module and the second processing module, and sets test acquisition frequency and standard luminous data according to the non-interference working frequency, the non-interference picture data and the non-interference light intensity data of the tested lamp; the initialization module comprises a data acquisition module initialization unit and a second processing module initialization unit, and the data acquisition module initialization unit is used for setting the test acquisition frequency of the data acquisition module to be consistent with the interference-free working frequency of the tested car lamp; the second processing module initialization unit is used for respectively setting the standard light intensity data, the standard light color data and the standard lighting area data in the second processing module to be consistent with the non-interference light intensity data, the non-interference light color data and the non-interference lighting area data of the tested vehicle lamp.
Before the test is started, the initialization module sets the test acquisition frequency and the standard light-emitting data, the preset test acquisition frequency is consistent with the non-interference working frequency of the tested lamp, other modules can work only in the working period of the tested lamp, the difficulty of subsequent acquisition and comparison is reduced, and whether the working frequency of the tested lamp is abnormal due to electromagnetic interference can be conveniently judged; the standard light-emitting data in the second processing module is preset, so that whether the light-emitting state of the tested lamp is abnormal or not can be conveniently, objectively and accurately compared and analyzed by using the data.
Preferably, the test acquisition frequency and the standard light emitting data can be set by directly calling corresponding non-interference working frequency, non-interference picture data and non-interference light intensity data from a database by the initialization module according to the model of the tested lamp; or the initialization module acquires multiple groups of non-interference image data and light intensity data by using the data acquisition module under the condition of not applying interference to the lamp to be detected, and the initialization module is set after calculating the average value and extracting the non-interference working frequency, the non-interference image data and the non-interference light intensity data.
It should be noted that the standard light-emitting data preset by the initialization module is not necessarily a fixed value, and may also be an interval value meeting the electromagnetic interference error standard of the vehicle lamp; the standard lighting data includes standard light intensity data, standard light color data, and standard lighting area data.
The first processing module is used for generating magnetic field frequency data and magnetic field strength data which correspond to each other one by one and outputting the magnetic field frequency data and the magnetic field strength data to the environment simulation module and the second processing module in pairs; the magnetic field frequency data are discrete data which grow in a logarithmic function form from zero and cover the whole frequency domain of the electromagnetic interference test of the lamp, and each magnetic field frequency data has magnetic field intensity data which are output in pairs corresponding to the magnetic field frequency data.
The environment simulation module simulates electromagnetic fields with different frequencies and field strengths according to the magnetic field frequency data and the magnetic field strength data so as to interfere the light emitting state of the lamp, and the first processing module is matched with the environment simulation module for use, so that the magnetic field environment can be controlled and digitalized.
The data acquisition module acquires real-time image data and real-time light intensity data of the interfered lamp according to a test acquisition frequency preset by the initialization module, generates real-time light emitting data according to the acquired image data and the real-time light intensity data and outputs the real-time light emitting data to the second processing module, wherein the real-time light emitting data comprises the real-time light intensity data, the real-time light color data and the real-time lighting area data.
Preferably, the data acquisition module comprises an image data acquisition unit, a light intensity data acquisition unit and a data integration unit.
The image data acquisition unit is used for acquiring real-time image data and extracting real-time light color data and real-time lighting area data according to the real-time image data; meanwhile, the light intensity data acquisition unit acquires the real-time light intensity data; and then, the data integration unit generates real-time light emitting data according to the real-time light color data, the real-time lighting area data and the real-time light intensity data at the same moment and outputs the real-time light emitting data to the second processing module. Preferably, the data integration unit and the second processing module perform data interaction in a CAN bus mode, so that the data transmission efficiency is improved.
The second processing module is used for comparing the real-time luminous data with the standard luminous data to screen out abnormal luminous data, and correspondingly storing the screened abnormal luminous data with the abnormal picture data, the abnormal magnetic field frequency data and the abnormal magnetic field intensity data at the same moment.
In addition, the second processing module can also be matched with a third processing module, an environment simulation module and a data acquisition module to judge critical magnetic field intensity data of abnormal luminous data under any abnormal magnetic field frequency data.
The second processing module comprises a light intensity processing unit, a light color processing unit and a lighting area processing unit. The light intensity processing unit extracts real-time light intensity data according to the real-time light emitting data, compares the real-time light intensity data with standard light intensity data, screens out abnormal light intensity data, reads abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal light emitting data and abnormal image data in the image memory at the same moment according to each abnormal light intensity data, and correspondingly stores the abnormal magnetic field frequency data, the abnormal magnetic field intensity data, the abnormal light emitting data and the abnormal image data in the image.
The light color processing unit extracts real-time light color data according to the real-time light emitting data, compares the real-time light color data with the standard light color data to screen abnormal light color data, and reads and correspondingly stores abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal light emitting data and abnormal image data in the image memory at the same time according to each abnormal light color data.
And the lighting area processing unit extracts real-time lighting area data according to the real-time lighting data, compares the real-time lighting area data with the standard lighting area data, screens abnormal lighting area data, reads abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal lighting data and abnormal image data at the same moment in the image memory according to the abnormal lighting area data, and correspondingly stores the abnormal magnetic field frequency data, the abnormal magnetic field intensity data, the abnormal lighting data and the abnormal image data at the same moment in the image memory.
It should be noted that, taking the vehicle tail light as an example, please refer to fig. 4, the light-emitting area of the lamp, i.e. the multi-area and multi-shape display in the lighting area range, any one area may be interfered by the electric field, i.e. each area needs to be monitored in the test process; taking a vehicle steering lamp as an example, the working signal of the vehicle steering lamp is a 1.25Hz dynamic signal, and whether functional failure faults of the steering lamp, such as turning off caused by interference rejection, and the like, occur or not needs to be monitored in the test process; at present, in the latest technology, dynamic turn lights are turned on one by one in a form of a 'horse race light', and a fault that a part of areas are turned off or the turn-on logic is incorrect may occur in an anti-interference test; these failures are all realized by judging whether the lighting area data is abnormal.
In addition, the second processing module can also judge whether the working frequency of the vehicle lamp to be tested is abnormal due to the electromagnetic field interference according to the lighting condition (namely lighting area data) of the vehicle lamp to be tested: because the test acquisition frequency is consistent with the non-interference working frequency of the tested car lamp, if the car lamp which should be lighted originally or the car lamp area which should be lighted is not lighted in the test acquisition period, the working frequency of the tested car lamp is judged to be in fault.
Specifically, the third processing module is configured to select any abnormal magnetic field frequency data, generate changed magnetic field strength data under the selected abnormal magnetic field frequency data, and output the selected abnormal magnetic field frequency data and the changed magnetic field strength data to the environment simulation module and the second processing module; the environment simulation module generates a corresponding electromagnetic field according to the selected abnormal magnetic field frequency data and the changed magnetic field intensity data to interfere the light emitting state of the lamp to be detected, then the data acquisition module acquires real-time image data and real-time light intensity data of the interfered lamp in real time, and generates real-time light emitting data according to the acquired image data and the real-time light intensity data and outputs the real-time light emitting data to the second processing module; the second processing module compares the real-time luminous data with the standard luminous data to screen out abnormal luminous data, simultaneously correspondingly stores all the abnormal luminous data screened out under the selected abnormal magnetic field frequency data with the abnormal picture data and the abnormal magnetic field intensity data at the same moment, and then judges the critical magnetic field intensity data which cause the abnormal luminous data under the selected abnormal magnetic field frequency data according to all the screened out abnormal magnetic field intensity data.
By utilizing the lamp testing system provided by the embodiment of the invention, under the electromagnetic field environment simulated by the environment simulation module, the data acquisition module acquires real-time image data and real-time light intensity data of an interfered lamp according to the preset test acquisition frequency to generate real-time luminous data; then, the second processing module compares the received real-time luminous data with preset standard luminous data to screen abnormal luminous data, and correspondingly stores the abnormal luminous data with abnormal picture data, abnormal magnetic field frequency data and abnormal magnetic field intensity data at the same moment, so that the technical problem that the abnormal luminous state of the lamp to be tested is matched with the field intensity and frequency of a corresponding electromagnetic field is solved, and the relation between the abnormal luminous state of the lamp and the electromagnetic field interference can be accurately and objectively analyzed from the data; the second processing module can also judge critical magnetic field intensity data of abnormal luminous data caused by any abnormal magnetic field frequency data, and in the judging process, the abnormal luminous data, the abnormal picture data, the abnormal magnetic field frequency data and the abnormal magnetic field intensity data at the same moment are correspondingly stored, so that an accurate critical value causing the abnormal luminous state of the lamp can be objectively obtained from the data.
The lamp testing system provided by the embodiment of the invention further comprises a result output module, wherein the result output module is used for statistically outputting the abnormal luminous data, the abnormal picture data, the abnormal magnetic field frequency data and the abnormal magnetic field intensity data to obtain the testing result of the lamp. Preferably, the test result is a graph or curve showing the abnormal picture data, the abnormal magnetic field frequency data and the abnormal magnetic field strength data corresponding to the abnormal magnetic field frequency as an independent variable.
Therefore, the result output module correspondingly counts and outputs each abnormal light emitting data, the abnormal picture data, the abnormal magnetic field frequency data and the abnormal magnetic field intensity data at the same moment to obtain an accurate lamp test result, and the technical problems that in the prior art, the manual test precision is not high, and the abnormal light emitting state of the tested lamp cannot be matched with the field intensity and the frequency of the corresponding electromagnetic field are solved.
Because the electromagnetic compatibility test of the lamp is carried out in a darkroom, the light intensity data acquisition unit in the embodiment of the invention can adopt the following scheme:
referring to fig. 3 or fig. 4, the electromagnetic compatibility test is performed in the anechoic chamber 1, the light intensity data acquisition unit in the lamp test system includes a light guide module and a data acquisition module 3, and the light guide module guides the light intensity signal of the lamp to be tested out of the anechoic chamber 1 and transmits the light intensity signal to the data acquisition module 3.
The electromagnetic compatibility test of the lamp is carried out by placing the lamp in an anechoic chamber, while the light intensity data acquisition unit provided by the embodiment is provided with a light guide module which is specially used for leading out the light intensity signal of the lamp to be tested from the anechoic chamber, the light guide module is realized by adopting an optical fiber 2, one end of the optical fiber 2 is fixed on the surface of the lamp to be tested, the other end of the optical fiber 2 penetrates out of a waveguide hole of the anechoic chamber 1 and is connected to a light intensity acquisition interface of the data acquisition module outside the anechoic chamber 1, new electromagnetic interference signals cannot be introduced into the optical fiber 2, the light intensity signal of the lamp to be tested can be completely led out under the condition of not influencing the anti-interference test of the lamp to be tested, and; the number of the optical fibers 2 can be 1, 2 or more, so that multi-channel light intensity signal acquisition is realized, the optical fibers 2 have a larger light intensity input signal range, the sensitive wavelength range (lambda) is 430nm-1010nm, and the human eye identification range is covered. The data acquisition module 3 is arranged outside the anechoic chamber, and the acquisition module 3 comprises a photoelectric conversion unit 32, a sampling signal adjusting unit 33 and an acquisition unit 34 which are electrically connected in sequence.
The photoelectric conversion unit 32 includes a photo-resistor Re connected with the optical fiber 2, specifically, the photo-resistor Re is disposed in the light intensity collection interface, one end of the optical fiber is fixed on the surface of the lamp to be tested in the anechoic chamber 1, the other end of the optical fiber is connected with the light intensity collection interface and attached to the surface of the photo-resistor Re, and the photo-resistor Re converts the light intensity signal derived from the optical fiber 2 into a corresponding analog voltage signal.
Preferably, the photoelectric conversion unit 32 further includes a voltage dividing resistor Rref connected in series with the photoresistor Re, one end of the photoelectric conversion unit 32 is connected to the working voltage VCC, and the other end is grounded, that is, one end of the voltage dividing resistor Rref is connected to the working voltage VCC, the other end is connected to the photoresistor Re, and the end of the photoresistor Re not connected to the voltage dividing resistor Rref is grounded; on the contrary, one end of the photosensitive resistor Re may be connected to the operating voltage VCC, the other end may be connected to the voltage dividing resistor Rref, and the end of the voltage dividing resistor Rref not connected to the photosensitive resistor Re is grounded. The photoresistor Re obtains different resistance values according to the light intensity signal change transmitted by the optical fiber 2, and then the light intensity change of the lamp to be tested can be represented by collecting different analog voltage signals generated on the photoresistor Re.
A sampling signal adjusting unit 33 connected to the rear of the photoelectric conversion unit 32, for amplifying or reducing the analog voltage signal generated by the photoelectric conversion unit 32, and including an operational amplifier U1 and a sixth resistor R6; the positive input terminal of the operational amplifier U1 is coupled between the voltage dividing resistor Rref and the photo resistor Re, the negative input terminal of the operational amplifier U1 is coupled to one terminal of the sixth resistor R6, and the other terminal of the sixth resistor R6 is coupled to the output terminal of the operational amplifier U1. The operational amplifier U1 may be an LM operational amplifier such as LM358, or may be an integrated operational amplifier chip or an operational amplifier circuit that can implement a voltage amplification function. The sampling signal adjusting circuit can automatically identify the optimal light intensity collecting value, and avoid unreasonable sampling values caused by overlarge or overlow light intensity. The sampling signal adjusting unit 33 further includes an automatic adapter 331 for adapting the analog voltage signal to a proper amplification factor so as to obtain a proper collection value as a reference, and it is noted that when the amplification factor is greater than 0 and less than 1, the analog voltage signal is reduced, and the sampling signal adjusting unit is suitable for a lamp with a larger light intensity, such as an automobile headlight, which needs to reduce the light intensity collection value; when the amplification factor is more than 1, the amplification of the analog voltage signal is realized, and the method is suitable for lamps with smaller light intensity, such as atmosphere lamps, needing to amplify light intensity acquisition values; when the amplification factor is equal to 1, the original value of the analog voltage signal is kept unchanged.
The auto adaptor 331 has one end coupled between the operational amplifier U1 and the sixth resistor R6, and the other end coupled to ground.
Specifically, the automatic adapter 331 includes a plurality of sets of adapter circuits connected in parallel, and the adapter circuits are composed of relays and adapter resistors connected in series; the relay is coupled to a control pin of the mcu 341 and controlled by the mcu 341. For example, the auto adaptor 331 of FIG. 2 includes first to fifth relays S1 to S5, first to fifth resistors R1 to R5; one end of the first relay S1 is coupled between the operational amplifier U1 and the 6 th resistor, one end of the first resistor R1 is coupled to the first relay S1, and the other end is coupled to ground. Similarly, the relays S2-S5 are connected to the resistors R2-R5 in the same manner, and the relays S1-S5 are coupled to the control pins of the mcu 341, respectively. Wherein the relay may be replaced by other electronic switches that may be controlled by the micro control unit 341.
The automatic adapter 331, cooperating with the sampling signal adjusting unit 33, is used for adapting the voltage signal to a proper amplification factor, so that the measurement is more accurate; the two modes of the tested lamp need to be detected in the test, wherein one mode is in a working state, namely the lamp is normally on, and the other mode is in an OFF state, namely the lamp is OFF. In the two modes, the voltage value sampled by the photoresistor Re may be too large or too small, so that when the light intensity fluctuation is abnormal, the fluctuation range of the analog voltage signal on the photoresistor Re may be very small. Therefore, when the micro control unit 341 collects a corresponding voltage value, the voltage value is compared with an internal set voltage interval value, if the measured value is judged not to be in the interval, the relay of the automatic adapter 331 is controlled, different resistance values are selected into the discharge circuit, and therefore the amplification factor of the electric signal is automatically matched, so that the micro control unit 341 collects a reasonable voltage value, and the test accuracy is improved.
The acquisition unit 34 is connected behind the signal adjustment unit, and includes a micro control unit 341 and a CAN bus 342, the micro control unit 341 converts the analog voltage signal into a digital signal, the digital signal is the acquired light intensity data, and the light intensity data is output to the data integration unit through the CAN bus 342.
Specifically, the micro control unit 341, i.e. the MCU, is also called a microcomputer or a single chip, and the micro control unit 341 includes an a/D converter 3411 and a CAN bus output interface, where an input pin of the a/D converter 3411 is connected to an output terminal of the operational amplifier U1, and is configured to convert an analog voltage signal into a digital signal, collect a voltage value at a high sampling rate, and after the micro control unit 341 simply processes the digital signal of the voltage value, the CAN bus output interface is connected to the data integration unit through the CAN bus 342. The light of the lamp to be detected is guided out by using the optical fiber, the optical signal is converted into an electric signal, the electric signal is collected and sent to the micro control unit 341 through the high-speed A/D, the control unit 341 transmits the light intensity data to the data integration unit for processing through the form of the CAN bus, the simultaneous collection of multiple paths of signals CAN be realized, the limitation of peripheral equipment is avoided, and the light intensity data is timely output to the data integration unit while the collection rate is ensured. The micro control unit 341 transmits the light intensity data collected by each channel to the data integration unit in a bus form, and the light intensity data CAN be transmitted to the data integration unit in a low-delay multi-channel manner by adopting a CAN bus transmission mode.
Referring to fig. 3 or 4, the light intensity data collecting unit further includes a reference voltage unit, the reference voltage unit includes a diode D1, a three-terminal voltage-stabilizing integrated chip U2, a first capacitor C1, a second capacitor C2, a third capacitor C3, and a fourth capacitor C4; the model of the three-terminal voltage-stabilizing integrated chip U2 is 78XX series, and the preferred model is 7805.
The anode of the diode D1 is coupled to an external 12V power supply, the cathode is coupled to the first pin of the three-terminal regulator ic U2, the anode of the first capacitor C1 is coupled to the cathode of the diode D1, the anode of the second capacitor C2 is coupled to the cathode of the diode D1, the second pin of the three-terminal regulator ic U2 is coupled to ground, and the third pin of the three-terminal regulator ic U2 is coupled to the anode of the third capacitor C3 and the anode of the fourth capacitor C4; and a third pin of the three-terminal voltage-stabilizing integrated chip U2 outputs a working voltage VCC to provide stable working voltage for other subsequent circuit units.
Preferably, the light intensity data acquisition unit is provided with a shell, the shell is used for accommodating and protecting electronic components, and the shell is provided with openings for routing optical fibers and a CAN bus, so that the light intensity data acquisition unit is convenient for signal transmission with the outside; the shell adopts metal material, for example selects iron shell for use, can further reduce electromagnetic interference signal. According to the light intensity data acquisition unit provided by the invention, the light guide module transmits the light intensity signal of the lamp to be detected to the photoelectric conversion unit of the data acquisition module, the light intensity signal led out by the optical fiber is converted into a corresponding analog voltage signal through the photoresistor (Re), the analog voltage signal is amplified by the sampling signal adjustment unit, and finally the analog voltage signal is converted into a digital signal (namely light intensity data) by the micro control unit in the acquisition unit and is output to the data integration unit for the electromagnetic compatibility test through the CAN bus, so that the light intensity information of the lamp to be detected is acquired in the form of light intensity data, the whole light intensity data acquisition unit is prevented from being placed in an anechoic chamber to introduce new electromagnetic interference, the interference of an electromagnetic compatibility test environment on the work of the light intensity data acquisition unit is also avoided, and the acquired light intensity data is more accurate.
Example two
Referring to fig. 5, a lamp testing method provided in an embodiment of the present invention is applied to a lamp testing system in the above embodiment, and is used for detecting a light emitting performance of a lamp, and includes the steps of:
s1, setting a test acquisition frequency and standard luminous data according to the non-interference working frequency, the non-interference picture data and the non-interference light intensity data of the tested lamp before the test;
s2, generating magnetic field frequency data and magnetic field intensity data which correspond to each other one by one;
s3, simulating electromagnetic fields with different frequencies and field strengths according to the magnetic field frequency data and the magnetic field strength data so as to interfere the light emitting state of the lamp;
s4, collecting real-time image data and real-time light intensity data of the interfered lamp according to the test collection frequency, and generating real-time light emitting data according to the real-time image data and the real-time light intensity data;
s5, comparing the real-time luminous data with the standard luminous data to screen out abnormal luminous data, and correspondingly storing the abnormal luminous data with the abnormal picture data, the abnormal magnetic field frequency data and the abnormal magnetic field intensity data at the same moment; judging critical magnetic field intensity data which cause abnormal luminous data under any abnormal magnetic field frequency data;
and S6, statistically outputting the abnormal light emitting data, the abnormal picture data, the abnormal magnetic field frequency data and the abnormal magnetic field intensity data to obtain the test result of the lamp.
Specifically, step S1 includes:
s101, setting the test acquisition frequency of the data acquisition module to be consistent with the interference-free working frequency of the tested car lamp;
and S102, setting the standard light intensity data, the standard light color data and the standard lighting area data in the second processing module to be consistent with the non-interference light intensity data, the non-interference light color data and the non-interference lighting area data of the tested vehicle lamp respectively.
Preferably, step S4 includes:
s401, acquiring real-time image data, extracting real-time photochromic data and real-time lighting area data according to the real-time image data, and storing the real-time image data into an image memory;
meanwhile, collecting real-time light intensity data;
s402, generating real-time light emitting data according to the real-time light color data, the real-time lighting area data and the real-time light intensity data at the same moment, and outputting the real-time light emitting data to the second processing module.
Specifically, step S5 includes:
s501, extracting real-time light intensity data according to the real-time light emitting data, comparing the real-time light intensity data with standard light intensity data, screening abnormal light intensity data, reading abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal light emitting data and abnormal image data in an image memory at the same moment according to the abnormal light intensity data, and correspondingly storing the abnormal magnetic field frequency data, the abnormal magnetic field intensity data, the abnormal light emitting data and the abnormal image data;
s502, extracting real-time light color data according to the real-time light emitting data, comparing the real-time light color data with the standard light color data, screening abnormal light color data, reading abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal light emitting data and abnormal image data in an image memory at the same moment according to the abnormal light color data, and correspondingly storing the abnormal magnetic field frequency data, the abnormal magnetic field intensity data, the abnormal light emitting data and the abnormal image data;
s503, extracting real-time lighting area data according to the real-time lighting data, comparing the real-time lighting area data with standard lighting area data, screening abnormal lighting area data, reading abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal lighting data and abnormal image data in an image memory at the same moment according to the abnormal lighting area data, and correspondingly storing the abnormal lighting area data, the abnormal magnetic field frequency data, the abnormal magnetic field intensity data and the abnormal lighting data;
s504, selecting the magnetic field intensity data which are generated and changed under any abnormal magnetic field frequency data, and outputting the selected abnormal magnetic field frequency data and the changed magnetic field intensity data to the environment simulation module and the second processing module, so that the second processing module judges the critical magnetic field intensity data which cause the abnormal luminous data under the selected abnormal magnetic field frequency data.
In addition, in the lamp testing method provided in the embodiment of the present invention, step S5 further includes:
s505, judging whether the working frequency of the tested car lamp is abnormal due to electromagnetic field interference by using a second processing module according to the lighting area data of the tested car lamp: and in the test acquisition period, if the tested vehicle lamp or the functional area of the tested vehicle lamp is not lighted, judging that the working frequency of the tested vehicle lamp breaks down.
The lamp testing method adopts the lamp testing system to obtain an accurate lamp testing result, and solves the technical problems that in the prior art, the manual testing precision is not high, and the abnormal light emitting state of the tested lamp cannot be matched with the field intensity and the frequency of the corresponding electromagnetic field.
Compared with the prior art, the beneficial effects of the lamp testing method provided by the embodiment of the invention are the same as those of the lamp testing system provided by the first embodiment, and other technical features in the method are the same as those disclosed by the system of the first embodiment, which are not repeated herein.
It will be understood by those skilled in the art that all or part of the steps in the method for implementing the invention may be implemented by hardware instructions related to a program, the program may be stored in a computer-readable storage medium, and when executed, the program includes the steps of the method of the embodiment, and the storage medium may be: ROM/RAM, magnetic disks, optical disks, memory cards, and the like. The above description is only for the specific embodiments of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention, and all the changes or substitutions should be covered within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the appended claims.
Claims (9)
1. A lamp testing system is used for detecting the luminous performance of a lamp and is characterized by comprising an initialization module, an environment simulation module, a data acquisition module, a first processing module, a second processing module, a third processing module and a result output module; wherein the content of the first and second substances,
the initialization module is used for setting test acquisition frequency and standard luminous data according to the non-interference working frequency, the non-interference picture data and the non-interference light intensity data of the tested lamp before the test is started;
the first processing module is used for generating magnetic field frequency data and magnetic field strength data which correspond to each other one by one and outputting the magnetic field frequency data and the magnetic field strength data to the environment simulation module and the second processing module in pairs;
the environment simulation module is used for simulating electromagnetic fields with different frequencies and field strengths according to the magnetic field frequency data and the magnetic field strength data so as to interfere the light emitting state of the lamp;
the data acquisition module is used for acquiring real-time image data and real-time light intensity data of the interfered lamp according to the test acquisition frequency, generating real-time light emitting data according to the image data and the real-time light intensity data and outputting the real-time light emitting data to the second processing module;
the second processing module is used for comparing the real-time luminous data with the standard luminous data to screen out abnormal luminous data, and correspondingly storing the abnormal luminous data with the abnormal picture data, the abnormal magnetic field frequency data and the abnormal magnetic field intensity data at the same moment; and critical magnetic field intensity data used for judging abnormal luminous data under any abnormal magnetic field frequency data;
the third processing module is configured to select magnetic field strength data that changes when the abnormal magnetic field frequency data is generated, and output the selected abnormal magnetic field frequency data and the changed magnetic field strength data to the environment simulation module and the second processing module, where the environment simulation module generates a corresponding electromagnetic field according to the selected abnormal magnetic field frequency data and the changed magnetic field strength data to interfere with a lighting state of the lamp to be tested, so that the second processing module determines critical magnetic field strength data that causes abnormal lighting data when the selected abnormal magnetic field frequency data is generated;
and the result output module is used for statistically outputting the abnormal luminous data, the abnormal picture data, the abnormal magnetic field frequency data and the abnormal magnetic field intensity data to obtain a test result of the lamp.
2. The lamp testing system of claim 1, wherein the standard lighting data comprises standard light intensity data, standard light color data, and standard lit area data;
the real-time light emitting data comprises real-time light intensity data, real-time light color data and real-time lighting area data.
3. The lamp testing system of claim 2, wherein the initialization module comprises a data acquisition module initialization unit and a second processing module initialization unit, wherein,
the data acquisition module initialization unit is used for setting the test acquisition frequency of the data acquisition module to be consistent with the interference-free working frequency of the tested car lamp;
and the second processing module initialization unit is used for respectively setting the standard light intensity data, the standard light color data and the standard lighting area data in the second processing module to be consistent with the non-interference light intensity data, the non-interference light color data and the non-interference lighting area data of the tested vehicle lamp.
4. The lamp testing system of claim 2, wherein said data acquisition module comprises an image data acquisition unit, a light intensity data acquisition unit, and a data integration unit, wherein,
the image data acquisition unit is used for acquiring real-time image data and extracting the real-time photochromic data and the real-time lighting area data according to the real-time image data; the image data acquisition unit further comprises an image memory for storing the real-time image data;
the light intensity data acquisition unit is used for acquiring the real-time light intensity data;
the data integration unit is used for generating real-time light emitting data according to the real-time light color data, the real-time lighting area data and the real-time light intensity data at the same moment and outputting the real-time light emitting data to the second processing module.
5. The lamp testing system of claim 4, wherein the second processing module comprises a light intensity processing unit, a light color processing unit, and a lighting area processing unit, wherein,
the light intensity processing unit is used for extracting the real-time light intensity data according to the real-time light emitting data, comparing the real-time light intensity data with the standard light intensity data, screening abnormal light intensity data, reading abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal light emitting data and abnormal image data in the image memory at the same moment according to the abnormal light intensity data, and correspondingly storing the abnormal magnetic field frequency data, the abnormal magnetic field intensity data, the abnormal light emitting data and the abnormal image data;
the light color processing unit is used for extracting the real-time light color data according to the real-time light emitting data, comparing the real-time light color data with the standard light color data, screening abnormal light color data, reading abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal light emitting data and abnormal image data in the image memory at the same moment according to the abnormal light color data, and correspondingly storing the abnormal magnetic field frequency data, the abnormal magnetic field intensity data, the abnormal light emitting data and the abnormal image data;
and the lighting area processing unit is used for extracting the real-time lighting area data according to the real-time lighting data, comparing the real-time lighting area data with the standard lighting area data, screening abnormal lighting area data, reading abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal lighting data and abnormal image data in the image memory at the same moment according to the abnormal lighting area data, and correspondingly storing the abnormal magnetic field frequency data, the abnormal magnetic field intensity data, the abnormal lighting data and the abnormal image data.
6. A lamp testing method applied to the lamp testing system of any one of claims 1 to 5 for detecting the light emitting performance of a lamp, comprising the steps of:
s1, setting a test acquisition frequency and standard luminous data according to the non-interference working frequency, the non-interference picture data and the non-interference light intensity data of the tested lamp before the test;
s2, generating magnetic field frequency data and magnetic field intensity data in one-to-one correspondence by utilizing the first processing module;
s3, simulating electromagnetic fields with different frequencies and field strengths according to the magnetic field frequency data and the magnetic field strength data so as to interfere the light emitting state of the lamp;
s4, collecting real-time image data and real-time light intensity data of the interfered lamp according to the test collection frequency, and generating real-time light emitting data according to the real-time image data and the real-time light intensity data;
s5, comparing the real-time luminous data with the standard luminous data to screen abnormal luminous data, and correspondingly storing the abnormal luminous data with abnormal picture data, abnormal magnetic field frequency data and abnormal magnetic field intensity data at the same moment; selecting the magnetic field intensity data which changes under any abnormal magnetic field frequency data, generating a corresponding electromagnetic field according to the selected abnormal magnetic field frequency data and the changed magnetic field intensity data to interfere the light emitting state of the tested lamp, and judging critical magnetic field intensity data which cause abnormal light emitting data under any abnormal magnetic field frequency data, wherein the standard light emitting data comprise standard light intensity data, standard light color data and standard lighting area data;
s6, statistically outputting the abnormal light emitting data, the abnormal picture data, the abnormal magnetic field frequency data and the abnormal magnetic field intensity data to obtain a test result of the lamp.
7. The lamp testing method of claim 6, wherein the step S1 comprises:
s101, setting the test acquisition frequency of the data acquisition module to be consistent with the interference-free working frequency of the tested car lamp;
and S102, setting the standard light intensity data, the standard light color data and the standard lighting area data in the second processing module to be consistent with the non-interference light intensity data, the non-interference light color data and the non-interference lighting area data of the tested vehicle lamp respectively.
8. The lamp testing method of claim 6, wherein the step S4 comprises:
s401, acquiring real-time image data, extracting real-time photochromic data and real-time lighting area data according to the real-time image data, and storing the real-time image data into an image memory;
meanwhile, collecting the real-time light intensity data;
s402, generating real-time light emitting data according to the real-time light color data, the real-time lighting area data and the real-time light intensity data at the same moment, and outputting the real-time light emitting data to a second processing module.
9. The lamp testing method of claim 8, wherein the step S5 includes:
s501, extracting the real-time light intensity data according to the real-time light emitting data, comparing the real-time light intensity data with the standard light intensity data, screening abnormal light intensity data, reading abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal light emitting data and abnormal image data in the image memory at the same moment according to the abnormal light intensity data, and correspondingly storing the abnormal magnetic field frequency data, the abnormal magnetic field intensity data, the abnormal light emitting data and the abnormal image data;
s502, extracting the real-time light color data according to the real-time light emitting data, comparing the real-time light color data with the standard light color data, screening abnormal light color data, reading abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal light emitting data and abnormal image data in the image memory at the same time according to the abnormal light color data, and correspondingly storing the abnormal magnetic field frequency data, the abnormal magnetic field intensity data, the abnormal light emitting data and the abnormal image data;
s503, extracting the real-time lighting area data according to the real-time lighting data, comparing the real-time lighting area data with the standard lighting area data, screening abnormal lighting area data, reading abnormal magnetic field frequency data, abnormal magnetic field intensity data, abnormal lighting data and abnormal image data in the image memory at the same moment according to the abnormal lighting area data, and correspondingly storing the abnormal magnetic field frequency data, the abnormal magnetic field intensity data, the abnormal lighting data and the abnormal image data;
s504, selecting the magnetic field intensity data which are generated and changed under any abnormal magnetic field frequency data, and outputting the selected abnormal magnetic field frequency data and the changed magnetic field intensity data to the environment simulation module and the second processing module, so that the second processing module judges the critical magnetic field intensity data which cause abnormal luminous data under the selected abnormal magnetic field frequency data.
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| US7045967B2 (en) * | 2003-07-16 | 2006-05-16 | Taipei Multipower Electronics Co., Ltd. | Multi-lamp actuating facility |
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| US7045967B2 (en) * | 2003-07-16 | 2006-05-16 | Taipei Multipower Electronics Co., Ltd. | Multi-lamp actuating facility |
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