CN109620172A - A kind of measurement of encephalic temperature, calculation method and measuring device - Google Patents
A kind of measurement of encephalic temperature, calculation method and measuring device Download PDFInfo
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- CN109620172A CN109620172A CN201910110525.3A CN201910110525A CN109620172A CN 109620172 A CN109620172 A CN 109620172A CN 201910110525 A CN201910110525 A CN 201910110525A CN 109620172 A CN109620172 A CN 109620172A
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/01—Measuring temperature of body parts ; Diagnostic temperature sensing, e.g. for malignant or inflamed tissue
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/68—Arrangements of detecting, measuring or recording means, e.g. sensors, in relation to patient
- A61B5/6846—Arrangements of detecting, measuring or recording means, e.g. sensors, in relation to patient specially adapted to be brought in contact with an internal body part, i.e. invasive
- A61B5/6867—Arrangements of detecting, measuring or recording means, e.g. sensors, in relation to patient specially adapted to be brought in contact with an internal body part, i.e. invasive specially adapted to be attached or implanted in a specific body part
- A61B5/6868—Brain
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Abstract
The invention discloses a kind of measurements of encephalic temperature, calculation method and measuring device, because the thermistor of each model is at temperature T0, the resistance value R0 and characteristic value B of thermistor are labeled with error range, in batch production process, need error existing for resistance value R0 and characteristic value B in view of each thermistor, the present invention is calibrated by the resistance value to the thermistor at a temperature of T0, and it is recorded by the way of calibrating resistance, pass through correction formula: Rx=Rt1* (R0/Rf) calibrates measured value, i.e. by the corresponding relationship curve of Tx and Rx: Rx=R0*eB*(1/Tx‑1/T0), under conditions of the Rx of survey, show that more accurate Tx, Tx are encephalic temperature.The problem of present invention solves in the prior art, realizes the problem that manufacturing cost existing for the device of encephalic temperature measurement is high, measurement accuracy is low and apparatus structure is complicated by thermistor.
Description
Technical field
The invention belongs to encephalic technical field of temperature measurement more particularly to a kind of measurements of encephalic temperature, calculation method and survey
Measure device.
Background technique
Currently, the micro temperature sensor that can be put into encephalic in hospital application is mainly made using miniature thermistor
Temp probe, by temp probe measure encephalic temperature variation, exist in the prior art, the thermistor of each model,
Databook can be all shown under temperature T0, the resistance value R0 and characteristic value B of thermistor, and resistance value R0 and characteristic value B are equal
The thermistor being labeled under error range, that is, same model needs in batch production process in view of thermistor
Resistance value R0 and characteristic value B existing for error, generally ideally, i.e. by the corresponding relationship curve of Tx and Rx:
Rx=R0*eB*(1/Tx-1/T0)
By measuring Rx, obtain corresponding Tx, but when R0, B deviation are very big, Tx will error it is very big, it is above-mentioned various
Cause the measurement accuracy of temp probe low, in order to improve temp probe to the measurement accuracy of the temperature of encephalic, then must use spy
Different material or the thermistor of special processing process manufacture, which increase the acquisition costs of encephalic temperature.
It in the prior art, is generally only that the temperature collection circuit of temp probe is optimized and calibrated, it can not be effective gram
The problem that thermistor performance number is inconsistent in temp probe is taken, is caused existing by thermistor realization encephalic temperature measurement
Device there is a problem of that manufacturing cost is high, measurement accuracy is low and apparatus structure is complicated.
Summary of the invention
The present invention provides a kind of measurement of encephalic temperature, calculation method and measuring devices, to solve to pass through in the prior art
Thermistor is realized that manufacturing cost existing for the device of encephalic temperature measurement is high, measurement accuracy is low and apparatus structure is complicated and is asked
Topic.
For this purpose, according in a first aspect, the embodiment of the invention discloses a kind of measurements of encephalic temperature, calculation method, comprising:
It obtains for measuring initial resistivity value R0 and characteristic value B of the thermistor of encephalic temperature in test temperature T0；
The thermistor is measured in test temperature T0 by measuring circuit module, the actual resistance Rt and ginseng of the thermistor
Examine the resistance value Rf of resistance；Actual resistance Rt and the reference by micro-control unit MCU module to the thermistor
After the resistance value Rf of resistance carries out numerical value relatively, initial alignment is carried out to the thermistor, adjusts the electricity of the reference resistance
Resistance value Rf is equal with the actual resistance Rt of the thermistor；Under the conditions of unknown temperatures Tx, surveyed by measuring circuit module
Measure the resistance value Rt1 of the thermistor；Pass through the correction formula of thermistor: Rx=Rt1* (R0/Rf), is calculated described
The correction value Rx of the resistance value Rt1 of thermistor；Pass through the calculating of the correction value Rx and the thermistor of the thermistor
Formula: Rx=R0*eB*(1/Tx-1/T0)Obtain the actual temperature value of the unknown temperatures Tx.
Optionally, initial alignment, calibration are carried out to the thermistor by adjusting the resistance value Rf of the reference resistance
The reference resistance after success, resistance value Rf immobilize.
Optionally, the test temperature T0 is the temperature of any value.
Optionally, the test temperature T0 is 37 degrees Celsius or 25 degrees Celsius.
Optionally, the initial resistivity value R0 and characteristic value B of the thermistor are nominal value.
According to second aspect, the embodiment of the invention provides a kind of encephalic temperature measuring devices, comprising:
Temp probe module, it is interior to be equipped with thermistor, for measuring encephalic temperature；Reference circuit module, it is interior to be equipped with reference
Resistance, for carrying out initial alignment to the thermistor；Thermistor resistance value-temperature enquiry module, for obtaining the heat
The quick resistance initial resistivity value corresponding in any temperature and characteristic value；Measuring circuit module, for measuring the temperature-sensitive electricity
Resistance is in any temperature, the actual resistance of the thermistor and the resistance value of reference resistance；Micro-control unit MCU module,
It is analyzed for the measurement result to the measuring circuit module；Storage and display module, for the measuring circuit mould
The measurement result of block is stored and is shown.
Optionally, the measuring circuit module includes: constant current source unit, for electric to the thermistor and the reference
Resistance loads constant electric current；Analog switch unit, the electric current for switching the constant current source unit load target；Voltage measurement list
Member, for measuring the voltage of the thermistor and the reference resistance.
Optionally, it is set in the temp probe module or is separately provided in the reference circuit module.
According to the third aspect, the present invention provides a kind of computer installation, including processor, processor is for executing storage
The method that the computer program stored in device realizes above-mentioned first aspect any one.
According to fourth aspect, the present invention provides a kind of computer readable storage mediums, are stored thereon with computer program,
Processor is for executing the method that the computer program stored in storage medium realizes above-mentioned first aspect any one.
In conclusion compared with prior art, the invention has the following advantages: the present invention has abandoned in the prior art
The method for optimizing and calibrating by the measuring circuit module to encephalic temperature measuring device, is obtaining for measuring encephalic
After initial resistivity value R0 and characteristic value B of the thermistor of temperature in test temperature T0, be provided with reference circuit module and
The resistance value Rf of reference resistance in the actual resistance Rt and reference circuit module of the thermistor is obtained when test temperature T0,
By micro-control unit MCU module to the resistance value Rf of the actual resistance Rt of the thermistor and the reference resistance into
Line number value relatively after, adjust the resistance value Rf of the reference resistance, keep it equal with the actual resistance Rt of the thermistor,
Initial alignment is carried out to the thermistor, the thermistor is obtained at unknown temperatures Tx by measuring circuit module
Resistance value Rt1 simultaneously obtains correction value Rx by correction formula, obtains unknown temperatures Tx by the correction value Rx and calculation formula,
The unknown temperatures Tx is considered as encephalic temperature, and by the above method, the present invention is solved in the prior art, passes through thermistor
Realize the problem that manufacturing cost existing for the device of encephalic temperature measurement is high, measurement accuracy is low and apparatus structure is complicated.
Detailed description of the invention
It, below will be to specific in order to illustrate more clearly of the specific embodiment of the invention or technical solution in the prior art
Embodiment or attached drawing needed to be used in the description of the prior art be briefly described, it should be apparent that, it is described below
Attached drawing is some embodiments of the present invention, for those of ordinary skill in the art, before not making the creative labor
It puts, is also possible to obtain other drawings based on these drawings.
Fig. 1 is the flow chart of a kind of encephalic temperature measurement disclosed by the embodiments of the present invention, calculation method；
Fig. 2 is a kind of block schematic illustration of encephalic temperature measuring device disclosed by the embodiments of the present invention.
Specific embodiment
Technical solution of the present invention is clearly and completely described below in conjunction with attached drawing, it is clear that described implementation
Example is a part of the embodiment of the present invention, instead of all the embodiments.Based on the embodiments of the present invention, ordinary skill
Personnel's every other embodiment obtained without making creative work, shall fall within the protection scope of the present invention.
Present embodiment discloses a kind of measurements of encephalic temperature, calculation method, please refer to Fig. 1 and Fig. 2, and Fig. 1 is of the invention real
The flow chart of a kind of measurement of encephalic temperature disclosed in example, calculation method is applied, Fig. 2 is a kind of encephalic temperature disclosed by the embodiments of the present invention
The block schematic illustration of measuring device is spent, a kind of encephalic temperature measurement of the embodiment of the present invention, calculating side available in conjunction with Fig. 1
Method comprising following steps:
Step S101: it obtains for measuring initial resistivity value of the thermistor 221 of encephalic temperature in test temperature T0
R0 and characteristic value B.
In a particular embodiment, the initial resistivity value R0 and characteristic value B of the thermistor 221 are nominal value and error rate
In allowed band of the invention.
Step S102: the thermistor 221 is measured in test temperature T0 by measuring circuit module 24, the temperature-sensitive
The actual resistance Rt of the resistance 221 and resistance value Rf of reference resistance 231.
In the specific implementation process, the sequencing of step S101 and step S102 are not limited.
Step S103: by micro-control unit MCU module 26 to the actual resistance Rt of the thermistor 221 and described
After the resistance value Rf of reference resistance 231 carries out numerical value relatively, initial alignment is carried out to the thermistor 221, adjusts the ginseng
The resistance value Rf for examining resistance 231 is equal with the actual resistance Rt of the thermistor 221.
In a particular embodiment, the thermistor 221 is carried out by adjusting the resistance value Rf of the reference resistance 231
Initial alignment, i.e., after the resistance value Rf of the described reference resistance 231 is equal with the actual resistance Rt of the thermistor 221, depending on
To demarcate successfully, the reference resistance 231 after demarcating successfully, resistance value Rf immobilizes.
Step S104: under the conditions of unknown temperatures Tx, the electricity of the thermistor 221 is measured by measuring circuit module 24
Resistance value Rt1.
In a particular embodiment, test temperature T0 is set 37 degrees Celsius or 25 degrees Celsius by the present invention, meanwhile, the examination
Testing temperature T0 also can be the temperature of any value, wherein it should be noted that the specific value of test temperature T0 need to be converted to open
You are calculated literary unit.
It should be noted that the encephalic that the unknown temperatures Tx is patient waits for testing temperature.
Step S105: passing through the correction formula of thermistor 221: Rx=Rt1* (R0/Rf), and the temperature-sensitive electricity is calculated
The correction value Rx of the resistance value Rt1 of resistance 221.
Step S106: pass through the correction value Rx of the thermistor 221 and the calculation formula of the thermistor 221: Rx
=R0*eB*(1/T1-1/T0)Obtain the actual temperature value of the unknown temperatures Tx.
It should be noted that the calculation formula of the thermistor 221:
Rx=R0*eB*(1/Tx-1/T0)
It is those skilled in the art according to the principle that the prior art can obtain, is no longer done herein for calculation formula superfluous
It states.
In a particular embodiment, all calculation formula can instantaneously be obtained a result by computer, measure the temperature-sensitive
After the resistance value Rt1 of resistance 211, the specific value of unknown temperatures Tx can be obtained, achievees the purpose that measure patient's encephalic temperature.
The present embodiment also discloses a kind of encephalic temperature measuring device 20, referring to FIG. 2, the encephalic temperature measuring device
20 include:
Temp probe module 22, it is interior to be equipped with thermistor 221, for measuring encephalic temperature；Reference circuit module 23, inside sets
There is reference resistance 231, for carrying out initial alignment to the thermistor 221；Thermistor resistance value-temperature enquiry module 21,
For obtaining the thermistor 221 initial resistivity value and characteristic value corresponding in any temperature；Measuring circuit module 24,
For measuring the thermistor 221 in any temperature, the actual resistance and reference resistance 231 of the thermistor 221
Resistance value；Micro-control unit MCU module 26 is analyzed for the measurement result to the measuring circuit module 24；Storage
With display module 25, is stored and shown for the measurement result to the measuring circuit module 24.
In a particular embodiment, the measuring circuit module 24 includes:
Constant current source unit 242, for loading constant electric current to the thermistor 221 and the reference resistance 231；Mould
Quasi- switch unit 241, the electric current for switching the constant current source unit 242 load target；Voltage measurement unit 243, for surveying
Measure the voltage of the thermistor 221 and the reference resistance 231.
It should be noted that being set in the temp probe module 22 or being separately provided in the reference circuit module 24.
In a particular embodiment, the constant current source unit 242 loads the electricity of a values constant to the thermistor 221
Stream, while the thermistor 221 and the reference resistance 231 are obtained in constant current by the voltage measurement unit 243
In the case of voltage value the reality of Ohm's law you can get it the thermistor 221 and the reference resistance 231 is passed through with this
Border resistance value.
In a particular embodiment, the analog switch unit 241, the electric current for switching the constant current source unit 242 add
Target is carried, in the initial alignment stage to the thermistor 221, the analog switch unit 241 selects the temperature respectively
Probe module 22 and the reference circuit module 23, in the amendment stage to the thermistor 221, the reference circuit module
23 functions are completed, then 241 single choice of analog switch unit selects the temp probe module 22.
In a particular embodiment, the micro-control unit MCU module 26 obtains the measuring circuit module 24 in test temperature
It spends under T0, the actual resistance Rt of the thermistor 221 measured and the resistance value Rf of the reference resistance 231 pass through
Compare numerical values recited, it is equal with the resistance value Rt of the thermistor 221 come the resistance value Rf that adjusts the reference resistance 231,
As initial alignment usually takes test temperature T0 to be 37 degrees Celsius and be converted into the calculating of Kelvin's unit.
In a particular embodiment, the thermistor resistance value-loading of temperature enquiry module 21 has the thermistor 221
The characteristic curve table of comparisons and resistance value-temperature specification book, can obtain initial resistance value and the initial characteristic values under any test temperature.
In addition, also providing a kind of computer installation in the embodiment of the present invention, processor, which passes through, executes the computer instruction,
To realize following methods:
It obtains for measuring initial resistivity value R0 and characteristic value of the thermistor 221 of encephalic temperature in test temperature T0
B；The thermistor 221 is measured in test temperature T0 by measuring circuit module 24, the practical electricity of the thermistor 221
The resistance value Rf of resistance value Rt and reference resistance 231；By micro-control unit MCU module 26 to the reality of the thermistor 221
After the resistance value Rf of resistance value Rt and the reference resistance 231 carries out numerical value relatively, the thermistor 221 is initially marked
Fixed, the resistance value Rf for adjusting the reference resistance 231 is equal with the actual resistance Rt of the thermistor 221；In unknown temperature
It spends under the conditions of Tx, the resistance value Rt1 of the thermistor 221 is measured by measuring circuit module 24；Pass through thermistor 221
Correction formula: the correction value Rx of the resistance value Rt1 of the thermistor 221 is calculated in Rx=Rt1* (R0/Rf)；Pass through institute
State the correction value Rx of thermistor 221 and the calculation formula of the thermistor 221: Rx=R0*eB*(1/Tx-1/T0)It obtains described
The actual temperature value of unknown temperatures Tx.
It is that can lead to it will be understood by those skilled in the art that realizing all or part of the process in above-described embodiment method
Computer program is crossed to instruct relevant hardware and complete, the program can be stored in a computer-readable storage medium
In, the program is when being executed, it may include such as the process of the embodiment of above-mentioned each method.Wherein, the storage medium can be magnetic
Dish, CD, read-only memory (ROM) or random access memory (RAM) etc..Computer processor is situated between for executing storage
The computer program stored in matter realizes following methods:
It obtains for measuring initial resistivity value R0 and characteristic value of the thermistor 221 of encephalic temperature in test temperature T0
B；The thermistor 221 is measured in test temperature T0 by measuring circuit module 24, the practical electricity of the thermistor 221
The resistance value Rf of resistance value Rt and reference resistance 231；By micro-control unit MCU module 26 to the reality of the thermistor 221
After the resistance value Rf of resistance value Rt and the reference resistance 231 carries out numerical value relatively, the thermistor 221 is initially marked
Fixed, the resistance value Rf for adjusting the reference resistance 231 is equal with the actual resistance Rt of the thermistor 221；In unknown temperature
It spends under the conditions of Tx, the resistance value Rt1 of the thermistor 221 is measured by measuring circuit module 24；Pass through thermistor 221
Correction formula: the correction value Rx of the resistance value Rt1 of the thermistor 221 is calculated in Rx=Rt1* (R0/Rf)；Pass through institute
State the correction value Rx of thermistor 221 and the calculation formula of the thermistor 221: Rx=R0*eB*(1/Tx-1/T0)It obtains described
The actual temperature value of unknown temperatures Tx.
The present invention abandoned carried out in the prior art by the measuring circuit module 24 to encephalic temperature measuring device 20 it is excellent
The method changed and calibrated, is obtaining initial resistance of the thermistor 221 for measuring encephalic temperature in test temperature T0 when
After value R0 and characteristic value B, it is provided with reference circuit module 23 and obtains the reality of the thermistor 221 in test temperature T0
The resistance value Rf of reference resistance 231 in resistance value Rt and reference circuit module 23 is passing through 26 pairs of institutes of micro-control unit MCU module
After the resistance value Rf of the actual resistance Rt and the reference resistance 231 that state thermistor 221 carry out numerical value relatively, described in adjustment
The resistance value Rf of reference resistance 231 keeps it equal with the actual resistance Rt of the thermistor 221, i.e., to the temperature-sensitive electricity
Resistance 221 carries out initial alignment, obtains resistance value of the thermistor 221 at unknown temperatures Tx by measuring circuit module 24
Rt1 simultaneously obtains correction value Rx by correction formula, obtains unknown temperatures Tx by the correction value Rx and calculation formula, it is described not
Know that temperature Tx is considered as encephalic temperature, by the above method, the present invention is solved in the prior art, real by thermistor 221
The problem that manufacturing cost is high, measurement accuracy is low and apparatus structure is complicated existing for the device of existing encephalic temperature measurement.
What has been described above is only an embodiment of the present invention, and the common sense such as well known specific structure and characteristic are not made herein in scheme
Excessive description.It, without departing from the structure of the invention, can be with it should be pointed out that for those skilled in the art
Make several modifications and improvements.These also should be considered as protection scope of the present invention, these all will not influence what the present invention was implemented
Effect and patent practicability.The scope of protection required by this application should be based on the content of the claims, in specification
The records such as specific embodiment can be used for explaining the content of claim.
Claims (10)
1. a kind of encephalic temperature measurement, calculation method characterized by comprising
It obtains for measuring initial resistivity value R0 and characteristic value B of the thermistor of encephalic temperature in test temperature T0；
The thermistor is measured in test temperature T0 by measuring circuit module, the actual resistance Rt of the thermistor
With the resistance value Rf of reference resistance；
By micro-control unit MCU module to the actual resistance Rt of the thermistor and the resistance value Rf of the reference resistance
Carry out numerical value relatively after, to the thermistor carry out initial alignment, adjust the reference resistance resistance value Rf and the heat
The actual resistance Rt of quick resistance is equal；
Under the conditions of unknown temperatures Tx, the resistance value Rt1 of the thermistor is measured by measuring circuit module；
Pass through the correction formula of thermistor: Rx=Rt1* (R0/Rf) is calculated the resistance value Rt1's of the thermistor
Correction value Rx；
Pass through the correction value Rx of the thermistor and the calculation formula of the thermistor:
Rx=R0*eB*(1/Tx-1/T0)
Obtain the actual temperature value of the unknown temperatures Tx.
2. a kind of encephalic temperature measurement as described in claim 1, calculation method, which is characterized in that by adjusting the reference
The resistance value Rf of resistance carries out initial alignment to the thermistor, the reference resistance after demarcating successfully, resistance value Rf
It immobilizes.
3. a kind of encephalic temperature measurement as described in claim 1, calculation method, which is characterized in that the test temperature T0 is
The temperature of any value.
4. a kind of encephalic temperature measurement as described in claim 1, calculation method, which is characterized in that the test temperature T0 is
37 degrees Celsius or 25 degrees Celsius.
5. a kind of encephalic temperature measurement as described in claim 1, calculation method, which is characterized in that at the beginning of the thermistor
Beginning resistance value R0 and characteristic value B are nominal value.
6. a kind of encephalic temperature measuring device characterized by comprising
Temp probe module, it is interior to be equipped with thermistor, for measuring encephalic temperature；
Reference circuit module, it is interior to be equipped with reference resistance, for carrying out initial alignment to the thermistor；
Thermistor resistance value-temperature enquiry module, for obtaining the thermistor initial electricity corresponding in any temperature
Resistance value and characteristic value；
Measuring circuit module, for measuring the thermistor in any temperature, the actual resistance of the thermistor and
The resistance value of reference resistance；
Micro-control unit MCU module is analyzed for the measurement result to the measuring circuit module；
Storage and display module, are stored and are shown for the measurement result to the measuring circuit module.
7. a kind of encephalic temperature measuring device as claimed in claim 6, which is characterized in that the measuring circuit module includes:
Constant current source unit, for loading constant electric current to the thermistor and the reference resistance；
Analog switch unit, the electric current for switching the constant current source unit load target；
Voltage measurement unit, for measuring the voltage of the thermistor and the reference resistance.
8. a kind of encephalic temperature measuring device as claimed in claim 6, which is characterized in that be set in the reference circuit module
In the temp probe module or it is separately provided.
9. a kind of computer installation, which is characterized in that including processor, the processor is based on executing and storing in memory
Calculation machine program realizes the method such as claim 1-5 any one.
10. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that processor is for executing
The computer program stored in storage medium realizes the method as described in claim 1-5 any one.
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| CN201910110525.3A CN109620172A (en) | 2019-01-30 | 2019-01-30 | A kind of measurement of encephalic temperature, calculation method and measuring device |
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| CN201910110525.3A CN109620172A (en) | 2019-01-30 | 2019-01-30 | A kind of measurement of encephalic temperature, calculation method and measuring device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113588110A (en) * | 2021-08-02 | 2021-11-02 | 上海东软载波微电子有限公司 | Correction method and device of temperature measuring equipment |
| CN114251813A (en) * | 2021-12-21 | 2022-03-29 | 石家庄科林电气股份有限公司 | Control method of ground source heat pump central air-conditioning system |
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| CN2747562Y (en) * | 2004-07-21 | 2005-12-21 | 中国科学院广州电子技术研究所 | Temperature-humidity polling measurer |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113588110A (en) * | 2021-08-02 | 2021-11-02 | 上海东软载波微电子有限公司 | Correction method and device of temperature measuring equipment |
| CN114251813A (en) * | 2021-12-21 | 2022-03-29 | 石家庄科林电气股份有限公司 | Control method of ground source heat pump central air-conditioning system |
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