CN109613004A - Defect display methods in a kind of inspection of backlight - Google Patents
Defect display methods in a kind of inspection of backlight Download PDFInfo
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- CN109613004A CN109613004A CN201811524227.0A CN201811524227A CN109613004A CN 109613004 A CN109613004 A CN 109613004A CN 201811524227 A CN201811524227 A CN 201811524227A CN 109613004 A CN109613004 A CN 109613004A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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Abstract
The invention belongs to defect detecting technique field, defect display methods in a kind of backlight inspection is disclosed, comprising the following steps: the defect coordinate information detected according to AOI intercepts first area in BLU map file, obtains the first defect map；First defect map is amplified or enhancing is handled, obtains the second defect map；Second defect map is drawn in the first area of BLU map file, obtains defect display figure.The present invention can greatly alleviate human eye fatigue, improve working efficiency, reduce time cost, can quickly and accurately carry out defect estimation, and then improve the efficiency and accuracy of AOI defect detecting system performance test.
Description
Technical field
The present invention relates to defect display methods in defect detecting technique field more particularly to a kind of inspection of backlight.
Background technique
In BLU (Back Light Unit, backlight assembly) processing procedure, up from mould group frame, reflection can be successively increased
Piece, light guide plate, diffusion sheet, prismatic lens, light guiding film etc., the addition of each layer of sheet material all may cause dirty, foreign matter, folding line, draw
The defects of hurting, and the defect for being located at different layers has that in irregular shape, size is uneven, position is not fixed, contrast is low and not
Consistent characteristic.In AOI (Automatic Optic Inspection, automatic optics inspection) detection process, board detection
Afterwards, the position of defect and feature in eye-observation map file are needed, then goes to search the defect in practical backlight in corresponding position
Information, it will be seen from figure 1 that BLU map file defect contrast is very low, edge blurry is unclear, is visually not easy to recognize, long-term to search for
Visual fatigue is also resulted in, reduces efficiency, while production capacity can be seriously affected.In addition, with the update of processing procedure, it is various can not
The defect of precognition can also be supervened, and conventional map file display defect no longer adapts to AOI testing requirements.It would therefore be desirable to
Seek a kind of more efficient, more stable defect display methods.
Summary of the invention
The embodiment of the present application solves BLU defect in the prior art by providing defect display methods in a kind of inspection of backlight
The lower problem of detection efficiency.
The embodiment of the present application provides defect display methods in a kind of inspection of backlight, comprising the following steps:
The defect coordinate information detected according to AOI intercepts first area in BLU map file, obtains the first defect map；
First defect map is amplified or enhancing is handled, obtains the second defect map；
Second defect map is drawn in the first area of the BLU map file, obtains defect display figure.
Preferably, further comprising the steps of before intercepting first area in BLU map file:
Nine grids line is drawn in the display area of BLU map file.
Preferably, it is specific to intercept first area in BLU map file for the defect coordinate information detected according to AOI
Are as follows: the coordinate central point for obtaining defect expands m pixel from the coordinate central point outward, and interception size is the of 2m*2m
One region.
Preferably, first defect map is amplified or enhancing processing includes:
Defect area is obtained according to first defect map；
The defect area is compared with presetted pixel, if being less than the presetted pixel, to first defect
Figure amplifies processing.
Preferably, the enhanced processing uses bilinear interpolation algorithm.
Preferably, first defect map is amplified or enhancing processing includes:
Defect contrast is obtained according to first defect map；
The defect contrast is compared with preset gray scale difference, if it is poor to be less than the preset gray scale, to described the
One defect map carries out enhancing processing.
Preferably, the enhancing processing is stretched using area grayscale.
One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages:
In the embodiment of the present application, it is small to extract defect in BLU map file for the defect coordinate information detected first according to AOI
Figure, then amplifies the small figure of defect or enhancing is handled, then the small figure of defect reverts in BLU map file by treated, finally
Achieve the purpose that enhancing display, so that help desk personnel more quickly and accurately searches defect characteristic and marking of defects.Energy of the present invention
It is enough greatly to alleviate human eye fatigue, working efficiency is improved, time cost is can reduce, can quickly and accurately carry out defect and comment
Estimate, and then improves the efficiency and accuracy of the performance test of AOI defect detecting system.
Detailed description of the invention
It, below will be to needed in embodiment description in order to illustrate more clearly of the technical solution in the present embodiment
Attached drawing is briefly described, it should be apparent that, the accompanying drawings in the following description is one embodiment of the present of invention, general for this field
For logical technical staff, without creative efforts, it is also possible to obtain other drawings based on these drawings.
Fig. 1 is the defect master drawing of backlight assembly BLU in the prior art；
Fig. 2 is to show figure using the defect after the backlight assembly BLU defect display methods of the prior art；
Fig. 3 is the flow chart of defect display methods in a kind of backlight inspection provided in an embodiment of the present invention；
Fig. 4 is that the nine grids in a kind of backlight inspection provided in an embodiment of the present invention in defect display methods show figure；
Fig. 5 (a) is the signal in a kind of backlight inspection provided in an embodiment of the present invention in defect display methods before defect amplification
Figure；
Fig. 5 (b) is the amplified signal of defect in defect display methods in a kind of backlight inspection provided in an embodiment of the present invention
Figure；
Fig. 6 (a) is the signal in a kind of backlight inspection provided in an embodiment of the present invention in defect display methods before defect enhancing
Figure；
Fig. 6 (b) is the enhanced signal of defect in defect display methods in a kind of backlight inspection provided in an embodiment of the present invention
Figure；
Fig. 7 is the defect display figure used in a kind of backlight inspection provided in an embodiment of the present invention after defect display methods.
Specific embodiment
In order to better understand the above technical scheme, in conjunction with appended figures and specific embodiments to upper
Technical solution is stated to be described in detail.
Existing BLU defect AOI detection system design cycle is generally divided into: upper of personnel, AOI capture detection, personnel sentence again
This 5 processes of defect, flaw labeling, personnel's bottom sheet.In this 5 processes, personnel's fluctuating plate, AOI capture detection and defect mark
The time of note is substantially stationary, will not change too much, but personnel sentence again this link be then limited by defect type, size and
Region, AOI detection can only provide coordinate on the diagram, the actual characteristic of defect must human eye go to observe repeatedly, be limited by backlight
The feature that flaw size is small, contrast is low, eye-observation defect can be very time-consuming, to increase flow time, influences production capacity, such as
Shown in Fig. 2.With the development trend of BLU, more complicated defect is come into being, the probability that various unpredictable defects occur
Greatly increase, human eye search defect can be more difficult, it is necessary to develop a set of new defect display methods deacclimatize it is booming
Industry requirement.
The present embodiment provides defect display methods in a kind of inspection of backlight, as shown in figure 3, specifically includes the following steps:
1) nine grids line is drawn in original image display area, as shown in figure 4, carrying out refinement to region in this way is conducive to personnel more
The region of defect is positioned fastly；
2) defect coordinate information detected according to AOI, expands 30~100 pixels from coordinate central point outward, carries out
Screenshot obtains the small figure of defect；Preferably, expand 50 pixels outward from coordinate central point, the defect of screenshot 100 × 100 is small
Figure；Since 90% or more defect size is 3 × 3~10 × 10, therefore select 100 × 100 ranges when being expanded most suitable；
3) according to information such as the area of defect, contrasts, defect display type is determined, if area is less than presetted pixel (example
Such as 25~35 pixels；In general preferably 30 pixels more meet the cognition of human eye sense organ), then defect is amplified aobvious
Show；If contrast be less than preset gray scale it is poor (such as 5~8 ash scales；Preferably 6 grey scales, in general more meet human eye
Sense organ cognition), then enhancing is carried out to defect and shown；If area and contrast all very littles, are enhanced and are amplified display；If lacking
It is all very big to fall into area and contrast, then such defect needs not continue to carry out enhancing to show that human eye is directly with regard to observable；
Amplification in this method is shown using bilinear interpolation algorithm, for a purpose pixel, coordinate is arranged, by anti-
Ringing the floating-point coordinate that transformation obtains is that (i+u, j+v) (wherein i, j are the integer part of floating-point coordinate, and u, v are floating-point coordinate
Fractional part, be value [0,1) floating number in section), then the value f (i+u, j+v) of this pixel can be by coordinate in original image
(i, j), (i+1, j), (i, j+1), (i+1, j+1), it is corresponding around the values of four pixels determine, it may be assumed that
F (i+u, j+v)=(1-u) (1-v) f (i, j)+(1-u) (v) f (i, j+1)+(u) (1-v) f (i+1, j)+(u) (v)
f(i+1,j+1)
Wherein, f (i, j) indicate source images (i, j) at pixel value, it is other similarly.Bilinear interpolation has speed fast,
High-quality advantage is handled, has good effect to image amplification, the comparison of backlight defect amplification effect can be referring to Fig. 5 (a), Fig. 5
(b), wherein Fig. 5 (a) is the schematic diagram before enhanced processing, and Fig. 5 (b) is the schematic diagram after enhanced processing.
The method that enhancing display in this method is stretched using area grayscale, area grayscale stretches can be by image from single
Tonal range be increased to a more satisfactory gray scale dynamic range, enhancing treatment effect comparison can be referring to Fig. 6 (a), Fig. 6
(b), wherein Fig. 6 (a) is the schematic diagram before enhanced processing, and Fig. 6 (b) is the schematic diagram after enhanced processing.
4) the small figure of enhanced defect repaints in original image, finally obtains one with nine grids defective increasing simultaneously
The picture of potent fruit, as shown in Figure 7；
5) human eye can position rapidly and observe defective locations and feature, to rapidly revert to progress defect mark in backlight
Note.
To sum up, defect display methods cuts out the small figure of defect according to AOI detection defect in backlight inspection provided by the invention,
Amplification appropriate, enhancing are carried out, is then revert on original image, such human eye can be quickly found out defect, and understand defect
Feature carries out flaw labeling to rapidly search actual defects.Using this method, can quickly search defective locations and
Feature saves detection time, greatlys improve detection efficiency and production capacity.
Defect display methods includes at least following technical effect in a kind of backlight inspection provided in an embodiment of the present invention:
1) display is amplified in the enhancing of defect, can more preferable, more clearly display defect feature, be suitable for bright defect, dark
Defect etc.；
2) defect image after eye-observation enhancing display, can be quickly and accurately positioned the feature of defect, greatly alleviate
Human eye fatigue, improves working efficiency；
3) it is suitable for the Performance Evaluation of overwhelming majority AOI detection system, there is quick, stable advantage.
It should be noted last that the above specific embodiment is only used to illustrate the technical scheme of the present invention and not to limit it,
Although being described the invention in detail referring to example, those skilled in the art should understand that, it can be to the present invention
Technical solution be modified or replaced equivalently, without departing from the spirit and scope of the technical solution of the present invention, should all cover
In the scope of the claims of the present invention.
Claims (7)
1. defect display methods in a kind of backlight inspection, which comprises the following steps:
The defect coordinate information detected according to AOI intercepts first area in BLU map file, obtains the first defect map；
First defect map is amplified or enhancing is handled, obtains the second defect map；
Second defect map is drawn in the first area of the BLU map file, obtains defect display figure.
2. defect display methods in backlight inspection according to claim 1, which is characterized in that intercept first in BLU map file
It is further comprising the steps of before region:
Nine grids line is drawn in the display area of BLU map file.
3. defect display methods in backlight inspection according to claim 1, which is characterized in that described to detect to obtain according to AOI
Defect coordinate information, intercept first area in BLU map file specifically: the coordinate central point for obtaining defect, from the coordinate
Central point expands m pixel, the first area that interception size is 2m*2m outward.
4. defect display methods in backlight inspection according to claim 1, which is characterized in that carried out to first defect map
Amplification or enhancing processing include:
Defect area is obtained according to first defect map；
The defect area is compared with presetted pixel, if be less than the presetted pixel, to first defect map into
Row enhanced processing.
5. defect display methods in backlight inspection according to claim 4, which is characterized in that the enhanced processing uses two-wire
Property interpolation algorithm.
6. defect display methods in backlight inspection according to claim 1, which is characterized in that carried out to first defect map
Amplification or enhancing processing include:
Defect contrast is obtained according to first defect map；
The defect contrast is compared with preset gray scale difference, if poor less than the preset gray scale, is lacked to described first
Sunken figure carries out enhancing processing.
7. defect display methods in backlight inspection according to claim 6, which is characterized in that the enhancing processing uses region
Gray scale stretching.
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Cited By (3)
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| CN110220916A (en) * | 2019-05-21 | 2019-09-10 | 武汉精立电子技术有限公司 | A kind of backlight pressing mold defect inspection method and system |
| CN111598856A (en) * | 2020-05-08 | 2020-08-28 | 浙江工商大学 | Chip surface defect automatic detection method and system based on defect-oriented multi-point positioning neural network |
| CN114519714A (en) * | 2022-04-20 | 2022-05-20 | 中导光电设备股份有限公司 | Method and system for judging smudgy defect of display screen |
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| CN111598856A (en) * | 2020-05-08 | 2020-08-28 | 浙江工商大学 | Chip surface defect automatic detection method and system based on defect-oriented multi-point positioning neural network |
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Application publication date: 20190412 |