CN109612592A - A method of utilizing Polarization Modulation defocus intensity detection topological charge - Google Patents
A method of utilizing Polarization Modulation defocus intensity detection topological charge Download PDFInfo
- Publication number
- CN109612592A CN109612592A CN201811536372.0A CN201811536372A CN109612592A CN 109612592 A CN109612592 A CN 109612592A CN 201811536372 A CN201811536372 A CN 201811536372A CN 109612592 A CN109612592 A CN 109612592A
- Authority
- CN
- China
- Prior art keywords
- polarization
- topological charge
- vortex
- light beam
- polarization modulation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000010287 polarization Effects 0.000 title claims abstract description 81
- 238000001514 detection method Methods 0.000 title claims abstract description 36
- 238000000034 method Methods 0.000 title claims abstract description 20
- 239000007787 solid Substances 0.000 claims abstract description 13
- 239000013598 vector Substances 0.000 claims description 9
- 238000003384 imaging method Methods 0.000 abstract description 2
- 238000009826 distribution Methods 0.000 description 13
- 230000005684 electric field Effects 0.000 description 11
- 230000003287 optical effect Effects 0.000 description 7
- 230000008859 change Effects 0.000 description 4
- 238000011160 research Methods 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 210000001747 pupil Anatomy 0.000 description 2
- NCGICGYLBXGBGN-UHFFFAOYSA-N 3-morpholin-4-yl-1-oxa-3-azonia-2-azanidacyclopent-3-en-5-imine;hydrochloride Chemical compound Cl.[N-]1OC(=N)C=[N+]1N1CCOCC1 NCGICGYLBXGBGN-UHFFFAOYSA-N 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000002050 diffraction method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000010606 normalization Methods 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The present invention discloses a kind of method using Polarization Modulation defocus intensity detection topological charge, and vortex beams to be measured first pass around Polarization Modulation system, it is modulated after vortex beams to be measured focus on its focus area by high numerical aperture lens；The hot spot of focus is by 4-f system imaging in CCD detection faces；It is gradually increased the polarization order P of Polarization Modulation system, when the topological charge l of vortex beams to be measured is equal with the polarization absolute value of order P numerical value in Polarization Modulation system, minimum solid shape is presented in the hot spot observed in CCD detection faces, to know the size of topological charge l；The hand of spiral of hot spot obtains the direction of vortex beams topological charge l to be measured in observation CCD detection faces, and the present invention can be realized the topological charge detection of random polarization vortex beams.
Description
Technical Field
The invention belongs to the technical field of vortex optics and quantum optics, and particularly relates to a method for detecting topological charge by utilizing polarization modulation defocusing intensity.
Background
Vortex rotation (Optical Vortices) has an exp (il phi) phase term (where phi is the tangential angle and l is the topological charge, which can take any integer) whose phase is not uniformly distributed in the cross section of the beam. Research shows that the angular momentum characteristic of the vortex beam is related to the vortex phase term, wherein the topological charge l can be any integer. Therefore, the angular momentum beams carrying different topological charges form an infinite orthogonal orbital angular momentum state space, so that the optical fiber communication device has the communication potential of a large-capacity channel. Because of its unique angular momentum properties, vortex beams have been successfully applied in various fields such as quantum information, plasmons, information storage, and the like. Nowadays, the orbital angular momentum of vortex rotation has become a research hotspot in this field. Therefore, the topological charge of the vortex light beam is detected, so that the orbital angular momentum state of the light beam is determined, and the method has extremely important value for researching vortex light angular momentum information.
The conventional topological charge detection methods can be roughly classified into interference-based and diffraction intensity-based detection methods. First, some researchers proposed an interferometer method capable of separating a plurality of orbital angular momentum states (j.leach.phys.rev.lett.,88(25):257901,2002), but it was difficult to implement the method, which is a two-path interference method. In subsequent studies, more and more vortex optical topological number measurement methods are emerging, such as: the circular aperture method, which determines the topological number of vortex light by observing the number of diffraction bright rings, cannot detect the direction of topological charge and has limited detection capability (opt. lett.,34(23):3686-3688, 2009); the annular aperture off-axis diffraction method detects topological charge by vortex singular point splitting caused by off-axis annular aperture diffraction, but the diffraction pattern phenomenon is extremely insignificant (Opt. Lett.42(7): 1373-. Therefore, the existing vortex light beam detection method has the problems of complicated detection device, complex diffraction intensity pattern, weak detection capability, incapability of real-time controllability and the like.
Disclosure of Invention
In view of this, the invention provides a method for detecting topological charge by using polarization modulation defocusing intensity, which can realize the topological charge detection of any polarization vortex beam.
The technical scheme for realizing the invention is as follows:
a method for detecting topological charge by utilizing polarization modulation defocusing intensity comprises the following steps: the vortex light beam to be measured firstly passes through a polarization modulation system, and the polarization vector of the polarization modulation system is as follows:
wherein,andrespectively representing unit vectors along the directions of an x axis and a y axis on the cross section of the vortex light beam to be detected, wherein p is a polarization order, and r and phi respectively represent the radial coordinate and the tangential coordinate of a certain point of the cross section of the light beam; the modulated vortex light beam to be detected is focused to a focal region of the vortex light beam through a high numerical aperture lens; the light spot of the focus is imaged on a CCD detection surface through a 4-f system; gradually increasing the polarization order P of the polarization modulation system, and when the topological charge l of the vortex light beam to be detected is equal to the absolute value of the polarization order P value on the polarization modulation system, the light spot observed on the CCD detection surface is in a minimum solid shape, so that the size of the topological charge l can be known; and observing the spiral direction of the light spot on the CCD detection surface to obtain the direction of the topological charge l of the vortex light beam to be detected.
Further, the 4-f system has a magnification of not less than 200 times.
Has the advantages that:
the invention provides a novel topological charge detection method, which has important application in the fields of optical measurement, light angular momentum information analysis and the like.
Secondly, the invention researches the influence of interaction of vortex phase and polarization on a tightly focused electric field, promotes the exploration of vortex optical physical essence and promotes the application of the vortex optical physical essence in various fields.
Thirdly, the invention can realize the simultaneous detection of the size and the direction of the topological charge, and can obtain all the information of the vortex optical topological charge only by observing the shape of the light spot. The detection method has the advantages of clear physical principle, real-time controllability, simple diffraction intensity pattern and capability of realizing detection of any vortex light beam topological charge.
Drawings
FIG. 1 is a schematic view of the vortex beam detection apparatus of the present invention.
FIG. 2 is a schematic diagram of a polarization rotation system.
FIG. 3 is an intensity distribution at the out-of-focus plane for two vortex beams of topologically opposite charge under different polarization modulations.
FIG. 4 is an intensity distribution at the out-of-focus plane for a vortex beam with a topological charge l-3 under different polarization modulations.
FIG. 5 is an intensity distribution at the out-of-focus plane for a vortex beam with topological charge l-3 under different polarization modulations.
Detailed Description
The invention is described in detail below by way of example with reference to the accompanying drawings.
The invention provides a method for detecting topological charge by utilizing polarization modulation defocusing intensity, which comprises the following steps of: the vortex light beam to be measured firstly passes through a polarization modulation system, and the polarization vector of the polarization modulation system is as follows:
wherein,andrespectively representing unit vectors along the directions of an x axis and a y axis on the cross section of the vortex light beam to be measured, wherein p is a polarization tangential parameter (also called as a polarization order), which determines the direction of a polarization state at a certain point of the cross section of the light beam and represents the corresponding polarization state along with the polarization stateWhen the tangential angle rotates from 0 to 2 pi, the polarization state direction rotates by an angle p phi, and r and phi respectively represent the radial coordinate and the tangential coordinate of a certain point of the cross section of the light beam; the modulated vortex light beam to be detected is focused to a focal region of the vortex light beam through a high numerical aperture lens; the light spot of the focus is imaged on a CCD detection surface through a 4-f system with the magnification of not less than 200 times; gradually increasing the polarization order P of the polarization modulation system, and when the topological charge l of the vortex light beam to be detected is equal to the absolute value of the polarization order P value on the polarization modulation system, the light spot observed on the CCD detection surface is in a minimum solid shape, so that the size of the topological charge l can be known; and observing the spiral direction of the light spot on the CCD detection surface to obtain the direction of the topological charge l of the vortex light beam to be detected.
Fig. 1 includes a polarization conversion system, a tight focus system, and a high magnification imaging system. P denotes a polarizer, QW denotes a quarter wave plate, SLM denotes a liquid crystal Spatial Light Modulator (SLM), L1 and L2 denote high numerical aperture lenses, and CCD denotes an electron coupled detector; VB denotes the vortex beam to be measured and FP denotes the focal plane of the high numerical aperture lens.
In this embodiment, the polarization modulation system in the method of the present invention is implemented by using a polarization rotation system as shown in fig. 2, and the system is composed of a polarizer, a transmissive nematic spatial light modulator and a λ/4 wave plate. The slow axis orientation of the polaroid is along the horizontal direction, the included angle between the slow axis direction of the spatial light modulator and the x axis is 45 degrees, and the slow axis orientation of the lambda/4 wave plate is along the vertical direction. To achieve the required polarization modulation, it is only necessary to load a specific phase delay on each pixel of the SLM. At this point, each pixel on the SLM can be viewed as a waveplate with a different phase retardation. Thus, the jones matrix for the entire polarization modulation system can be expressed as:
where i denotes an imaginary number and ψ is the amount of phase delay loaded onto each pixel of the SLM, the direction of the local polarization state at the corresponding position of each pixel can be rotated by ψ/2. By applying different voltages to each pixel on the spatial light modulator, each pixel of the spatial light modulator can generate psi/2 phase delay amount, so that the rotation of the polarization vector psi/2 of the incident light can be realized.
The corresponding polarization state in equation (1) can be expressed in theory as a superposition of two orthogonal circularly polarized vortex beams carrying opposite:
when the vortex light beam to be detected is modulated by the polarization conversion system, the electric field at the pupil plane of the objective lensCan be expressed as:
as shown in the formula (4), when the topological charge l of the incident light and the polarization modulation tangent parameter p satisfy the relationship that l-p is 0 or l-p is 0, one of the two vortex electric fields corresponding to the formula (4) appears a plane wave front. The occurrence of the plane wavefront finally causes the total intensity distribution of the electric field of the focusing surface of the plane wavefront to show solid light spots, otherwise, the solid light spots are hollow light spots, and the method is also the physical basis of the polarization modulation focusing intensity detection method. Through the analysis, the theoretical feasibility of the detection method provided by the invention is verified. Meanwhile, the detection method can distinguish topological loads of any size. However, the two polarized electric fields of equation (4) carry wavefronts exp [ i (l-p) φ ] and exp [ i (l + p) φ ], respectively, which also means that the detection technique cannot resolve the direction of the vortex optical topological charge.
Finally, after the modulated electric field is focused by the high numerical aperture lens, according to the vector diffraction theory, the electric field distribution of the area near the focus can be obtained as follows:
where C is an intensity normalization constant, λ represents the wavelength of incident light, α ═ sin-1(NA/nr) Is the maximum angle determined by the numerical aperture NA of the objective lens, where nrIs the refractive index of the medium; wave vector k in vacuum is 2 pi/lambda; a (θ) is a pupil function related to the shape of the incident beam;the coordinates of the observation point of the focal area are shown, wherein the focal plane corresponding position z is 0 plane. From the equations (5), (6) and (7), it can be seen that at least the Besell function in the focusing electric field expression is a 0 th order Besell function in order to make the intensity distribution at the focal plane in the shape of a solid spot. We analyze the transverse electric field components corresponding to equations (5) and (6), where cos is2(theta/2) modulated Jm-lThe term dominates the lateral component of the tightly focused electric field. When the topological charge l of the beam to be detected matches the polarization tangential parameter p, the portion becomes the J of the plane wave0The electric field strength at its focal plane appears as a solid spot. In addition, when the topological charge and the polarization tangential parameter satisfy m ═ l +1, the longitudinal component also appears J0An item. In other cases, the intensity distribution at the focal plane is a hollow annular intensity distribution. Thus, the intensity distribution of the incident vortex beam at its focal plane exhibits different intensity distributions for different polarization tangential parameters. By means of the phase delay loaded on the spatial light modulator, the polarization tangential parameter is gradually changed from 1, and the intensity at the focal plane is continuously changed. When a solid light spot appears in the focusing intensity, the polarization order on the corresponding polarization modulation deviceMatching the topological charge of the incident beam. Thus, the tightly focused intensity of the polarization modulation can be used to resolve the vortex beam topological charge.
To further enhance the detection technique, we analyze theoretical equations (5), (6) and (7), and under certain conditions of the system, the value of z can be changed so that the index of e is not 0. In addition, the wave front of the vortex beam is rotated during propagation, which also causes the intensity to change. Therefore, the defocusing phase is introduced, so that a method for distinguishing the vortex phase direction is obtained, and the detection technology is more favorably applied to practical application.
Simulation demonstration of the detection method of the invention: the spiral structure of the defocusing intensity increases and decreases along with the defocusing amount, the spiral stripes are more obvious, and the position 600nm away from the focal plane is selected as a detection plane. First, the defocus intensity at different polarization modulations is compared to the vortex beam carrying the opposite topological charge, as shown in FIG. 3. At the off-focus position, the spiral stripe of the intensity outer edge of the vortex beam with topological charge l being 4 increases along with the change of the polarization tangential parameter, and the rotation direction of the spiral stripe is clockwise. When the topological charge l is p, the intensity in fig. 3(c) is a solid small spot surrounded by a spiral stripe. The vortex beam with topological charge of-4 follows the above rule with the change of polarization, except that the rotation direction of the intensity of the spiral structure is anticlockwise.
According to the scheme principle, the effectiveness of the out-of-focus intensity detection method can be verified, and meanwhile, the using steps of the method are displayed. Vortex beams with opposite topological charges are distinguished by using a defocusing intensity method, and the defocusing intensity distribution of the vortex beams is observed along with the change of polarization tangential parameters on the spatial light modulator, so that the size and the direction of the topological charges of incident beams can be rapidly and accurately distinguished. Fig. 4 shows the defocus intensity of the vortex beam with topological charge l-3 under different polarization modulations. With the increase of the polarization tangential parameter, the spiral stripes of the defocusing intensity at the position of 600nm gradually increase, and the number of the spiral stripes satisfies 2 (p-1); the spiral direction of the spiral intensity is clockwise and is the same as the topological charge direction of the vortex light to be detected. When l ═ p, the defocus intensity appears as the smallest solid spot in fig. 4(c), where the magnitude of the topological charge corresponds to the polarization tangential parameter loaded on the spatial light modulator. The size of the topological load of the incident beam is obtained by observing the distribution of the minimum light spot on the defocusing surface; the direction of the topological charge is determined by the rotation direction of the spiral strength, and the clockwise direction corresponds to the positive direction.
For comparison, the defocus intensity of a vortex beam carrying a topological charge of-3 under the same modulation is discussed next to verify the effectiveness of this technique. FIG. 5 shows the defocus intensity distribution of a vortex beam with topological charge of-3 under different polarization modulations. As can be seen from the figure, as the polarization tangential parameter increases, the defocused intensity shape changes, and the number of spiral stripes satisfies 2(p-1) with the polarization parameter p. Meanwhile, if and only if the topological charge matches the polarization tangential parameter, the defocus intensity appears as a solid small spot, as shown in fig. 5 (c). The rotation direction of each intensity in the figure is along the counterclockwise direction, and is the same as the rotation direction of the vortex phase of the incident light, and corresponds to the topological charge of a negative number. Therefore, the intensity pattern of the out-of-focus plane changes as the polarization parameter pre-loaded on the spatial light modulator increases from 1. When the minimum solid light spot appears, the size of the polarization parameter on the spatial light modulator is the size of the topological charge, and the rotating direction of the defocusing intensity spiral structure is the direction of the topological charge.
In summary, the above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (2)
1. A method for detecting topological charge by utilizing polarization modulation defocusing intensity is characterized by comprising the following steps: the vortex light beam to be measured firstly passes through a polarization modulation system, and the polarization vector of the polarization modulation system is as follows:wherein,andrespectively representing unit vectors along the directions of an x axis and a y axis on the cross section of the vortex light beam to be detected, wherein p is a polarization order, and r and phi respectively represent the radial coordinate and the tangential coordinate of a certain point of the cross section of the light beam; the modulated vortex light beam to be detected is focused to a focal region of the vortex light beam through a high numerical aperture lens; the light spot of the focus is imaged on a CCD detection surface through a 4-f system; gradually increasing the polarization order P of the polarization modulation system, and when the topological charge l of the vortex light beam to be detected is equal to the absolute value of the polarization order P value on the polarization modulation system, the light spot observed on the CCD detection surface is in a minimum solid shape, so that the size of the topological charge l can be known; and observing the spiral direction of the light spot on the CCD detection surface to obtain the direction of the topological charge l of the vortex light beam to be detected.
2. The method for detecting topological charge using polarization modulated defocus intensity as claimed in claim 1, wherein the 4-f system has a magnification of not less than 200 times.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811536372.0A CN109612592A (en) | 2018-12-14 | 2018-12-14 | A method of utilizing Polarization Modulation defocus intensity detection topological charge |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811536372.0A CN109612592A (en) | 2018-12-14 | 2018-12-14 | A method of utilizing Polarization Modulation defocus intensity detection topological charge |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109612592A true CN109612592A (en) | 2019-04-12 |
Family
ID=66010117
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811536372.0A Pending CN109612592A (en) | 2018-12-14 | 2018-12-14 | A method of utilizing Polarization Modulation defocus intensity detection topological charge |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109612592A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111221132A (en) * | 2019-11-20 | 2020-06-02 | 中国科学院光电技术研究所 | Method and device for measuring vortex beam topological charge number by fan-shaped sub-aperture micro-lens array |
| CN111579100A (en) * | 2020-05-26 | 2020-08-25 | 河海大学常州校区 | Device and method for detecting topological charge number by using visual M-line method |
| CN112711130A (en) * | 2020-10-31 | 2021-04-27 | 浙江大学 | Phase modulation fluorescence differential microscopic imaging method and device based on electro-optic modulation technology |
| CN113063506A (en) * | 2021-03-18 | 2021-07-02 | 电子科技大学 | Optical vortex topological charge near-field detection structure and method of symmetrical porous structure |
| CN113885217A (en) * | 2021-11-15 | 2022-01-04 | 北京理工大学 | Generalized vortex light beam design method and preparation method |
| CN114019690A (en) * | 2021-11-04 | 2022-02-08 | 浙江大学 | Optical system for generating optical vortex array of arbitrary order and optical lattice with defect limitation |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2017210679A1 (en) * | 2016-06-03 | 2017-12-07 | Trustees Of Boston University | Optical imaging system employing vortex fiber for multiple-mode illumination |
| CN107894288A (en) * | 2017-06-21 | 2018-04-10 | 苏州大学 | The measuring method and system of vortex beams topological charge under the conditions of partially coherent light |
-
2018
- 2018-12-14 CN CN201811536372.0A patent/CN109612592A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2017210679A1 (en) * | 2016-06-03 | 2017-12-07 | Trustees Of Boston University | Optical imaging system employing vortex fiber for multiple-mode illumination |
| CN107894288A (en) * | 2017-06-21 | 2018-04-10 | 苏州大学 | The measuring method and system of vortex beams topological charge under the conditions of partially coherent light |
Non-Patent Citations (1)
| Title |
|---|
| XUEBING DAI ET AL.: "Determining the charge of vortex beams by focused intensity after polarization modulation", 《IEEE PHOTONICS TECHNOLOGY LETTERS》 * |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111221132A (en) * | 2019-11-20 | 2020-06-02 | 中国科学院光电技术研究所 | Method and device for measuring vortex beam topological charge number by fan-shaped sub-aperture micro-lens array |
| CN111579100A (en) * | 2020-05-26 | 2020-08-25 | 河海大学常州校区 | Device and method for detecting topological charge number by using visual M-line method |
| CN111579100B (en) * | 2020-05-26 | 2021-04-16 | 河海大学常州校区 | Device and method for detecting topological charge number by using visual M-line method |
| CN112711130A (en) * | 2020-10-31 | 2021-04-27 | 浙江大学 | Phase modulation fluorescence differential microscopic imaging method and device based on electro-optic modulation technology |
| CN113063506A (en) * | 2021-03-18 | 2021-07-02 | 电子科技大学 | Optical vortex topological charge near-field detection structure and method of symmetrical porous structure |
| CN113063506B (en) * | 2021-03-18 | 2022-08-02 | 电子科技大学 | Optical vortex topological charge near-field detection structure and method of symmetrical porous structure |
| CN114019690A (en) * | 2021-11-04 | 2022-02-08 | 浙江大学 | Optical system for generating optical vortex array of arbitrary order and optical lattice with defect limitation |
| CN114019690B (en) * | 2021-11-04 | 2022-08-05 | 浙江大学 | Optical system for generating optical vortex array of arbitrary order and optical lattice with defect limitation |
| US11625001B1 (en) | 2021-11-04 | 2023-04-11 | Zhejiang University | Optical system for generating arbitrary-order optical vortex arrays and finite optical lattices with defects |
| CN113885217A (en) * | 2021-11-15 | 2022-01-04 | 北京理工大学 | Generalized vortex light beam design method and preparation method |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109612592A (en) | A method of utilizing Polarization Modulation defocus intensity detection topological charge | |
| Huo et al. | Photonic spin-multiplexing metasurface for switchable spiral phase contrast imaging | |
| Bowman et al. | An SLM-based Shack–Hartmann wavefront sensor for aberration correction in optical tweezers | |
| Bouchet et al. | Maximum information states for coherent scattering measurements | |
| US10180564B2 (en) | Methods and systems for transport-of-intensity imaging | |
| Shiloh et al. | Unveiling the orbital angular momentum and acceleration of electron beams | |
| CN103424861A (en) | Super-resolution confocal microimaging method and device based on column polarization vortex beam | |
| CN105929560A (en) | Broadband far-field super-resolution imaging device | |
| Popiołek-Masajada et al. | Optical vortex scanning in an aperture limited system | |
| US10663289B2 (en) | Method and apparatus for detecting concave cylinder and cylindrical diverging lens | |
| CN112326024B (en) | Device and method for simultaneously measuring topological load size and positive and negative of vortex light beam | |
| CN110531530A (en) | A kind of quick calculation method for realizing partially coherent light tightly focused | |
| CN109283673A (en) | It is a kind of to realize the three-dimensional controllable device and method of optics coke field spin direction | |
| CN111221122B (en) | Design method of super-resolution telescopic imaging system with larger field intensity tolerance | |
| CN109029745B (en) | Double-ear circular diffraction diaphragm and vortex optical topological charge number detection system and detection method | |
| Mohagheghian et al. | Switching the sign of the topological charge of vortex beams via changing the fork grating resolution | |
| CN114485967A (en) | Method and device for measuring vortex light beam topological load under condition of extremely low coherence | |
| Sun et al. | Fluorescence interference structured illumination microscopy for 3D morphology imaging with high axial resolution | |
| Legrand et al. | Three-dimensional imaging of single atoms in an optical lattice via helical point-spread-function engineering | |
| CN111412983B (en) | Method and system for measuring size, positive and negative of topological charge of partially coherent vortex light beam | |
| Cornejo-Rodriguez et al. | Wavefront slope measurements in optical testing | |
| Gao et al. | Focal shift of cylindrical vector axisymmetric Bessel-modulated Gaussian beam with radial variance phase wavefront | |
| Benton et al. | Coherence imaging for laser detection | |
| Li et al. | Nano-displacement measurement based on virtual pinhole confocal method | |
| Płócienniczak et al. | High order vortex beam in the optical vortex microscope |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20190412 |