CN109612591B - Single pulse ionization very short time self-measuring scheme - Google Patents
Single pulse ionization very short time self-measuring scheme Download PDFInfo
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- CN109612591B CN109612591B CN201811516157.4A CN201811516157A CN109612591B CN 109612591 B CN109612591 B CN 109612591B CN 201811516157 A CN201811516157 A CN 201811516157A CN 109612591 B CN109612591 B CN 109612591B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
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Abstract
The invention discloses a scheme for self-measuring single-pulse ionization in a very short time. The invention uses a high-power laser to control the magnitude of the carrier envelope phase of a monochromatic field to obtain different electron momentum spectrums of multiphoton ionization, and then arranges the electron energy from low to high and has the same energyThe electrons interfere with each other, ATI of each order is separated separately, ATI is fitted separately to obtain the phase of fitting function
Phase of phase
Converted to an amount of time in attosecond units, and a single pulse ionization was measured for a very short time. The application of this technology to atomic, molecular, nano-structured and solid surfaces allows the detection of the very short time of some ultrafast processes. In addition, the kinetic behavior of electrons in atomic molecules or condensed substances can be studied for a very short time.
Description
Technical Field
The invention relates to a method for measuring time delay, in particular to a single-pulse ionization extremely short time self-measurement scheme.
Background
Many ultrafast processes exist in nature, for example: tracing the electron over time in the experiment, observing the formation and breaking of chemical bonds during chemical reactions, or observing how electrons ionize out of atoms or molecules, etc. To study the kinetic behavior of electrons in atomic molecules or condensed substances, laser pulses with sub-femtosecond order, even attosecond temporal accuracy, are required. However, because the carrier envelope phase is not easy to control and the laser intensity is uncertain, at present, infrared laser pulses with the pulse width of only a few optical periods and hundred attosecond extreme ultraviolet laser pulses (XUV) can be generated, and attosecond pulses generated by the extreme ultraviolet laser pulses can only measure the single photon ionization process, and the laser needs to superpose a plurality of frequencies. In theory, the design realizes the separation of different light emission paths in the multi-photon ionization process by using a monochromatic field through a semi-classical statistical method, and provides another method capable of measuring time delay.
In conclusion, the invention designs a single-pulse ionization very short-time self-measurement scheme.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide a single-pulse ionization extremely short time self-measurement scheme, which utilizes a high-power laser to obtain an electron momentum spectrum, extracts the time quantum in attosecond unit from the momentum spectrum, and applies the technology to atoms, molecules, nano structures and solid surfaces to detect the extremely short time of some ultrafast processes. In addition, the kinetic behavior of electrons in atomic molecules or condensed substances can be studied for a very short time.
In order to achieve the purpose, the invention is realized by the following technical scheme: single pulse ionization extremely short time is from measuring device, including the laser instrument, the upper end detector, lower extreme detector and target atom room, the laser instrument right side is provided with the target atom room that holds the experimental material atom, after the laser instrument opens stably, the target atom room is once ejected out with single atom through the nozzle, a bundle of ultrashort laser pulse is beaten out to the laser instrument on the left side, under laser pulse's effect, the atom is ionized into electron and ion, under the effect of magnetic field in the device, electron upward movement, ion downward movement, reach after a period of distance between detector and the lower detector, speed Px and Pz when the electron arrival can be surveyed out to the detector, then make the electron momentum spectrum according to Px and Pz's size.
The electric field excited by the laser field of the laser is in the form:
E0representing the intensity of the laser field, ω the frequency of the laser field,
representing the carrier envelope phase of the laser field.
The single pulse ionization very short time self-measuring method comprises the following steps:
1. each tensile momentum spectrum in the plurality of momentum spectrums is formed by electron wave packet interference, each single electron has energy obtained by detection of a detector at last, electrons in the same carrier envelope phase are judged, the electron energy is arranged from low to high, the electrons with the same energy are interfered together, and finally, the calculation result data of each group of carrier envelope phases are processed in such a way, so that an electron momentum spectrogram with the horizontal axis representing the carrier envelope phase of an electric field and the vertical axis representing the electron end energy can be obtained;
2. and separating ATI and sideband of each order separately, and fitting ATI and sideband separately. The fitted function is a sine or cosine function
As a result of the fitting, the phase of the fitting function can be obtained
Fitting phase of each order ATI or sideband
The time delay map is obtained by converting the amount of time in attosecond units into the amount of time for each ATI or sideband, and plotting the amount of time in the same map with the abscissa representing the end energy of the electron and the ordinate representing the delay time.
The invention has the beneficial effects that: the high-power laser is used for obtaining an electron momentum spectrum, the time quantum with attosecond as a unit is extracted from the momentum spectrum, and the technology is applied to atoms, molecules, nano structures and solid surfaces to detect the extremely short time of some ultrafast processes. In addition, the kinetic behavior of electrons in atomic molecules or condensed substances can be studied for a very short time.
Drawings
The invention is described in detail below with reference to the drawings and the detailed description;
FIG. 1 is a schematic view of an experimental apparatus according to the present invention;
FIG. 2 is an electron momentum spectrum of the present invention;
fig. 3 is a time delay diagram of the present invention.
Detailed Description
In order to make the technical means, the creation characteristics, the achievement purposes and the effects of the invention easy to understand, the invention is further described with the specific embodiments.
Referring to fig. 1 to 3, the following technical solutions are adopted in the present embodiment: single pulse ionization extremely short time is from measuring device, including laser instrument (laser power is at the taiwa magnitude) 1, upper end detector 2, lower extreme detector 3 and target atom room 4, laser instrument 1 right side is provided with holds experimental material atom's target atom room 4, after the laser instrument opens stably, target atom room 4 jets out single atom at every turn through the nozzle, laser instrument 1 on the left side beats out a bundle of ultrashort laser pulse, under the effect of laser pulse, the atom is ionized into electron and ion, under the effect of magnetic field in the device, electron upward movement, ion downward movement, after a period of distance after arriving between detector 2 and lower detector 3, the detector can detect speed Px and Pz when electron arrived, then make the electron momentum spectrum according to the size of Px and Pz.
The form of the electric field excited by the laser field in the experiment is:
E0representing the intensity of the laser field, ω the frequency of the laser field,
representing the carrier envelope phase of the laser field. For example, a laser of 800nm generates a 2.7 femtosecond pulse, and the calculation formula is as follows: and T is lambda/c, wherein lambda is the wavelength and c is the speed of light. In the experiment, other parameters are kept the same, different momentum spectrums can be obtained only by controlling the size of the carrier envelope phase of the electric field (the method for changing the carrier envelope phase is completed by using an optical wave plate), and 20 groups of different momentum spectrums can be obtained by changing the carrier envelope phase from 0 to 2 pi once every 0.1 pi. The momentum spectra with the carrier envelope phases of 0, 0.52 pi and 0.96 pi are selected in fig. 2, and it can be seen that the momentum spectra corresponding to different carrier envelope phases have obvious asymmetry.
And processing the obtained 20 groups of momentum spectrum data, wherein the purpose of processing is to combine the 20 groups of momentum spectra into an energy-carrier envelope phase diagram according to the carrier envelope phase and the last energy of the electrons, wherein the horizontal axis represents the corresponding carrier envelope phase, the vertical axis represents the last energy of the electrons, and the color of the diagram represents the electron ionization probability.
The processing method of the whole process is as follows: each of the 20 momentum spectra is formed by electron wave packet interference, each single electron has an energy (obtained by detection of a detector) at last, electrons in the same carrier envelope phase are judged, the electron energy is arranged from low to high, electrons with the same energy interfere together, and finally, the calculation result data of each group of carrier envelope phases are processed in such a way, so that an energy graph (shown in figure 2) with the horizontal axis representing the carrier envelope phase of the electric field and the vertical axis representing the electron energy at last can be obtained.
In fig. 2, which is derived from the experimental data processing, a bright stripe of one bar can be clearly seen, representing ATI and sideband, respectively. ATI at each stage was isolated separately and fitted separately to ATI. The fitted function is a sine or cosine function
As a result of the fitting, the phase of the fitting function can be obtained
Fitting phase of each order ATI
Converted to an amount of time in attosecond units. The conversion method is that the time quantity is obtained by dividing the phase obtained by fitting by the frequency, and the specific equation is shown as the equation (1).
The time delay profile shown in fig. 3 is obtained by plotting the amount of time of each ATI step on the same graph, the abscissa of the graph representing the end energy of the electrons and the ordinate representing the delay time.
The foregoing shows and describes the general principles and broad features of the present invention and advantages thereof. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are described in the specification and illustrated only to illustrate the principle of the present invention, but that various changes and modifications may be made therein without departing from the spirit and scope of the present invention, which fall within the scope of the invention as claimed. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (2)
1. The single-pulse ionization extremely short time self-measuring device is characterized by comprising a laser (1), an upper end detector (2), a lower end detector (3) and a target atom chamber (4), wherein the right side of the laser (1) is provided with the target atom chamber (4) for containing atoms of experimental materials, after the laser is started stably, the target atom chamber (4) sprays out single atoms each time through a nozzle, the laser (1) on the left side shoots out a beam of ultrashort laser pulse, under the action of laser pulse, the atoms are ionized into electrons and ions, and under the action of magnetic field in the equipment, the electrons move upwards and the ions move downwards, after a certain distance, the electron reaches between the upper end detector (2) and the lower end detector (3), the upper end detector (2) and the lower end detector (3) can detect the speeds Px and Pz when the electrons reach, and then an electron momentum spectrum is made according to the magnitudes of Px and Pz;
the measuring method of the single-pulse ionization very short-time self-measuring device comprises the following steps:
(1) each individual electron has energy detected by a detector, the electrons in the same carrier envelope phase are judged, the electron energy is arranged from low to high, the electrons with the same energy are interfered together, and finally the calculation result data of each group of carrier envelope phases are processed in such a way, so that an energy graph with the horizontal axis representing the carrier envelope phase of the electric field and the vertical axis representing the final energy of the electrons can be obtained;
(2) separating ATI and sideband of each step separately, fitting ATI and sideband separately; the fitted function is a sine or cosine function
As a result of the fitting, the phase of the fitting function can be obtained
Fitting phase of each order ATI or sideband
The time delay map is obtained by converting the amount of time in attosecond units into the amount of time for each ATI or sideband, and plotting the amount of time in the same map with the abscissa representing the end energy of the electron and the ordinate representing the delay time.
2. Single pulse ionization very short time self-measuring device according to claim 1, characterized in that the electric field excited by the laser field of the laser (1) is in the form of:
E0representing the intensity of the laser field, ω the frequency of the laser field,
representing the carrier envelope phase of the laser field.
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| CN101592525B (en) * | 2009-07-03 | 2011-04-06 | 大恒新纪元科技股份有限公司北京光电技术研究所 | Method for measuring phase delay devices with different wavelengths |
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