CN109596877A - 一种多功能检测装置 - Google Patents
一种多功能检测装置 Download PDFInfo
- Publication number
- CN109596877A CN109596877A CN201811490997.8A CN201811490997A CN109596877A CN 109596877 A CN109596877 A CN 109596877A CN 201811490997 A CN201811490997 A CN 201811490997A CN 109596877 A CN109596877 A CN 109596877A
- Authority
- CN
- China
- Prior art keywords
- metal portion
- semiconductor portion
- electrode
- detecting device
- current
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 claims abstract description 36
- 239000002184 metal Substances 0.000 claims abstract description 33
- 229910052751 metal Inorganic materials 0.000 claims abstract description 33
- 239000011241 protective layer Substances 0.000 claims description 10
- 238000002955 isolation Methods 0.000 claims description 2
- 239000000463 material Substances 0.000 claims description 2
- 230000001681 protective effect Effects 0.000 claims description 2
- 239000004020 conductor Substances 0.000 claims 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims 1
- 239000010931 gold Substances 0.000 claims 1
- 229910052737 gold Inorganic materials 0.000 claims 1
- 238000001514 detection method Methods 0.000 abstract description 20
- 230000004888 barrier function Effects 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 7
- 238000005036 potential barrier Methods 0.000 description 5
- 230000005611 electricity Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 230000007613 environmental effect Effects 0.000 description 3
- 230000004907 flux Effects 0.000 description 3
- 239000003574 free electron Substances 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000010410 layer Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Abstract
Description
Claims (7)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201811490997.8A CN109596877B (zh) | 2018-12-07 | 2018-12-07 | 一种多功能检测装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201811490997.8A CN109596877B (zh) | 2018-12-07 | 2018-12-07 | 一种多功能检测装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN109596877A true CN109596877A (zh) | 2019-04-09 |
CN109596877B CN109596877B (zh) | 2021-01-12 |
Family
ID=65961400
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201811490997.8A Active CN109596877B (zh) | 2018-12-07 | 2018-12-07 | 一种多功能检测装置 |
Country Status (1)
Country | Link |
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CN (1) | CN109596877B (zh) |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09251040A (ja) * | 1996-03-18 | 1997-09-22 | Aiphone Co Ltd | 電流検出回路 |
JP2000284004A (ja) * | 1999-03-30 | 2000-10-13 | Matsushita Electric Works Ltd | 電流検出装置 |
CN101865871A (zh) * | 2009-08-21 | 2010-10-20 | 兰州大学 | 一种基于肖特基接触iv分析的有机薄膜迁移率测量方法 |
CN104011551A (zh) * | 2011-12-19 | 2014-08-27 | 株式会社电装 | 电流检测电路以及半导体集成电路装置 |
CN105552213A (zh) * | 2015-12-08 | 2016-05-04 | 山东大学 | 一种调控磁电阻比值的方法 |
CN105891693A (zh) * | 2016-04-27 | 2016-08-24 | 江南大学 | 一种通过电流拟合检测GaN基HEMT退化的方法 |
CN107850630A (zh) * | 2015-08-20 | 2018-03-27 | 株式会社自动网络技术研究所 | 电流检测电路 |
CN108206630A (zh) * | 2016-12-19 | 2018-06-26 | 精工爱普生株式会社 | 过电流检测电路、半导体装置以及电源装置 |
-
2018
- 2018-12-07 CN CN201811490997.8A patent/CN109596877B/zh active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09251040A (ja) * | 1996-03-18 | 1997-09-22 | Aiphone Co Ltd | 電流検出回路 |
JP2000284004A (ja) * | 1999-03-30 | 2000-10-13 | Matsushita Electric Works Ltd | 電流検出装置 |
CN101865871A (zh) * | 2009-08-21 | 2010-10-20 | 兰州大学 | 一种基于肖特基接触iv分析的有机薄膜迁移率测量方法 |
CN104011551A (zh) * | 2011-12-19 | 2014-08-27 | 株式会社电装 | 电流检测电路以及半导体集成电路装置 |
CN107850630A (zh) * | 2015-08-20 | 2018-03-27 | 株式会社自动网络技术研究所 | 电流检测电路 |
CN105552213A (zh) * | 2015-12-08 | 2016-05-04 | 山东大学 | 一种调控磁电阻比值的方法 |
CN105891693A (zh) * | 2016-04-27 | 2016-08-24 | 江南大学 | 一种通过电流拟合检测GaN基HEMT退化的方法 |
CN108206630A (zh) * | 2016-12-19 | 2018-06-26 | 精工爱普生株式会社 | 过电流检测电路、半导体装置以及电源装置 |
Non-Patent Citations (1)
Title |
---|
崔益民 等: "肖特基结的制备与势垒测量", 《物理实验》 * |
Also Published As
Publication number | Publication date |
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CN109596877B (zh) | 2021-01-12 |
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Effective date of registration: 20201224 Address after: B101, building B and C, Hongwei Industrial Park, No. 6, liuxiansan Road, Xingdong community, Xin'an street, Bao'an District, Shenzhen, Guangdong 518000 Applicant after: Shenzhen Wote Inspection Group Co.,Ltd. Address before: 528458 Room 501, 4th floor, 118 Wuguishan commercial street, Zhongshan City, Guangdong Province Applicant before: ZHONGSHAN KELITE OPTOELECTRONICS TECHNOLOGY Co.,Ltd. |
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CP03 | Change of name, title or address | ||
CP03 | Change of name, title or address |
Address after: B101, building B and C, Hongwei Industrial Park, No. 6, liuxiansan Road, Xingdong community, Xin'an street, Bao'an District, Shenzhen, Guangdong 518000 Patentee after: Shenzhen Walter Inspection Group Co.,Ltd. Country or region after: China Address before: B101, building B and C, Hongwei Industrial Park, No. 6, liuxiansan Road, Xingdong community, Xin'an street, Bao'an District, Shenzhen, Guangdong 518000 Patentee before: Shenzhen Wote Inspection Group Co.,Ltd. Country or region before: China |