CN109596860B - Accelerometer fault diagnosis method, device, circuit and computer equipment - Google Patents
Accelerometer fault diagnosis method, device, circuit and computer equipment Download PDFInfo
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- CN109596860B CN109596860B CN201811306136.XA CN201811306136A CN109596860B CN 109596860 B CN109596860 B CN 109596860B CN 201811306136 A CN201811306136 A CN 201811306136A CN 109596860 B CN109596860 B CN 109596860B
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Abstract
The application relates to an accelerometer fault diagnosis method, an accelerometer fault diagnosis device, an accelerometer fault diagnosis circuit and computer equipment. The method comprises the following steps: acquiring a first voltage signal, a second voltage signal and a current signal; the first voltage signal is a voltage signal output by a C/V conversion circuit in the accelerometer detection circuit; the second voltage signal is a voltage signal output by the accelerometer; the current signal is a current signal on the accelerometer detection circuit; acquiring the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current; the first saturation voltage is the maximum voltage output by the C/V conversion circuit; the second saturation voltage is the maximum voltage output by the accelerometer; the standard current is the current on the accelerometer detection circuit when the accelerometer is normal, so that the fault type of the accelerometer can be judged according to the acquired signal, and the working state of the accelerometer can be monitored more comprehensively.
Description
Technical Field
The present application relates to the field of accelerometer technologies, and in particular, to an accelerometer fault diagnosis method, apparatus, circuit, and computer device.
Background
A MEMS (Micro-Electro-Mechanical System) accelerometer is an accelerometer manufactured using MEMS processing technology, and is an inertial sensor capable of measuring acceleration of an object. Due to the adoption of the MEMS technology, the size of the MEMS accelerometer is greatly reduced compared with the traditional accelerometer, and in addition, the MEMS accelerometer has the characteristics of low power consumption, low cost, easy integration and the like, so that the MEMS accelerometer is widely applied to various fields such as consumer electronics, automotive electronics, industrial control, aerospace, national defense and military and the like.
The closed-loop capacitive accelerometer has the characteristics of high sensitivity and small temperature change, adopts an electrostatic servo feedback system, balances the inertial force of the external acceleration acting on the movable structure through electrostatic force, further maintains the movable structure in a static state, and has the characteristic of high precision.
The closed-loop capacitive accelerometer is used as a sensor, which is easy to cause faults, such as system oscillation, mechanical beam breakage, particle blockage and the like, under the action of environmental stresses such as temperature, humidity, vibration, impact and the like, and in the process of developing and applying products, the faults needing to be screened and processed occur need to be screened, but in the implementation process, the inventor finds that at least the following problems exist in the traditional technology: the traditional technology can not identify the type of the fault when the accelerometer has the fault, so that the state of the accelerometer can not be accurately identified and corresponding improvement can not be carried out.
Disclosure of Invention
In view of the above, it is necessary to provide an accelerometer fault diagnosis method, apparatus, circuit and computer device.
In order to achieve the above object, in one aspect, an embodiment of the present application provides an accelerometer fault diagnosis method, including the following steps:
acquiring a first voltage signal, a second voltage signal and a current signal; the first voltage signal is a voltage signal output by a C/V conversion circuit in the accelerometer detection circuit; the second voltage signal is a voltage signal output by the accelerometer; the current signal is a current signal on the accelerometer detection circuit;
acquiring the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current; the first saturation voltage is the maximum voltage output by the C/V conversion circuit; the second saturation voltage is the maximum voltage output by the accelerometer; the standard current is the current on the accelerometer detection circuit when the accelerometer is normal.
In one embodiment, the fault type includes any one or any combination of the following faults: accelerometer detection circuit damage, accelerometer system oscillation, accelerometer over-range, accelerometer particle jamming, accelerometer structure adhesion, and accelerometer mechanical beam breakage.
In one embodiment, the step of obtaining the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current comprises:
and when the current signal is greater than the standard current of the preset multiple, determining that the fault type is the damage of the accelerometer detection circuit.
In one embodiment, the step of obtaining the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current comprises:
and when the current signal is greater than the standard current and less than the standard current of a preset multiple, the first voltage signal continuously changes within the range of being greater than zero and less than or equal to the first saturation voltage, and the second voltage signal continuously changes within the range of being greater than zero and less than or equal to the second saturation voltage, determining that the fault type is accelerometer system oscillation.
In one embodiment, the step of obtaining the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current comprises:
when the first voltage signal is equal to a first saturation voltage, the second voltage signal is equal to a second saturation voltage, and the duration of the first voltage signal and the duration of the second voltage signal are less than a preset duration, determining that the fault type is that the accelerometer exceeds the measuring range;
and when the first voltage signal is equal to the first saturation voltage, the duration of the first voltage signal exceeds a preset duration, and the second voltage signal is greater than zero and less than the second saturation voltage, determining that the fault type is accelerometer particle jamming.
In one embodiment, the step of obtaining the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current comprises:
when the first voltage signal is equal to the first saturation voltage, the duration of the first voltage signal exceeds the preset duration, the second voltage signal is equal to the second saturation voltage, and the current signal is greater than the standard current, determining that the fault type is accelerometer structure adhesion;
and when the first voltage signal is equal to the first saturation voltage, the second voltage signal is equal to the second saturation voltage, the current signal is equal to the standard current, and the duration of the first voltage signal and the duration of the second voltage signal exceed the preset duration, determining that the fault type is the accelerometer mechanical beam breakage.
On the other hand, the embodiment of the present application further provides an accelerometer fault diagnosis device, including:
the signal acquisition module is used for acquiring a first voltage signal, a second voltage signal and a current signal; the first voltage signal is a voltage signal output by a C/V conversion circuit in the accelerometer detection circuit; the second voltage signal is a voltage signal output by the accelerometer; the current signal is a current signal on the accelerometer detection circuit;
the fault type acquisition module is used for acquiring the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current; the first saturation voltage is the maximum voltage output by the C/V conversion circuit; the second saturation voltage is the maximum voltage output by the accelerometer; the standard current is the current on the accelerometer detection circuit when the accelerometer is normal.
In another aspect, an embodiment of the present application further provides a computer device, which includes a memory and a processor, where the memory stores a computer program, and the processor implements the steps of the method when executing the computer program.
On the other hand, the embodiment of the application also provides an accelerometer fault diagnosis circuit, which comprises an instrument amplifier, a signal acquisition circuit and a processor;
the input end of the instrument amplifier is connected between a power supply for supplying power to the accelerometer and the accelerometer, and the output end of the instrument amplifier is connected with the first input end of the signal acquisition circuit;
the second input end of the signal acquisition circuit is connected with the output end of the C/V conversion circuit of the accelerometer detection circuit, the third input end of the signal acquisition circuit is connected with the output end of the gain adjustment circuit of the accelerometer detection circuit, and the output end of the signal acquisition circuit is connected with the processor;
the signal acquisition circuit is used for acquiring a first voltage signal, a second voltage signal and a current signal;
the processor is used for realizing the accelerometer fault diagnosis method.
In one embodiment, the signal acquisition circuit comprises a first A/D acquisition circuit, a second A/D acquisition circuit and a third A/D acquisition circuit;
the input end of the instrumentation amplifier comprises a resistor; the resistor is connected between the power supply and the accelerometer;
the input end of the first A/D acquisition circuit is connected with the output end of the instrument amplifier, and the output end of the first A/D acquisition circuit is connected with the processor;
the input end of the second A/D acquisition circuit is connected with the output end of the C/V conversion circuit, and the output end of the second A/D acquisition circuit is connected with the processor;
the input end of the third A/D acquisition circuit is connected with the output end of the gain adjustment circuit, and the output end of the third A/D acquisition circuit is connected with the processor;
the first A/D acquisition circuit is used for acquiring a current signal; the second A/D acquisition circuit is used for acquiring a second voltage signal; the third A/D acquisition circuit is used for acquiring the first voltage signal.
One of the above technical solutions has the following advantages and beneficial effects:
obtaining a first voltage signal, a second voltage signal and a current signal; acquiring the fault type of the accelerometer according to a first voltage signal, a second voltage signal, a current signal, a first saturation voltage, a second saturation voltage and a standard current, wherein the first voltage signal is a voltage signal output by a C/V conversion circuit in the accelerometer detection circuit; the second voltage signal is a voltage signal output by the accelerometer; the first saturation voltage is the maximum voltage output by the C/V conversion circuit; the second saturation voltage is the maximum voltage output by the accelerometer; the standard current is the current of the accelerometer detection circuit during normal operation, so that the fault type of the accelerometer can be judged according to the first voltage signal, the second voltage signal and the current signal, the working state of the accelerometer can be monitored more comprehensively, the fault diagnosis capability is improved, in addition, corresponding remedial measures can be taken according to the fault type, and an improvement scheme is provided for the accelerometer through counting the fault type.
Drawings
FIG. 1 is a schematic flow chart illustrating an accelerometer fault diagnosis method according to an embodiment of the present disclosure;
FIG. 2 is a schematic diagram of a closed-loop capacitive MEMS accelerometer according to one embodiment;
FIG. 3 is a block diagram of an accelerometer fault diagnosis apparatus according to an embodiment of the present invention;
FIG. 4 is a block diagram of an embodiment of a fault diagnosis circuit for an accelerometer of the present application;
FIG. 5 is a block diagram of a signal acquisition circuit in one embodiment;
FIG. 6 is a diagram illustrating an internal structure of a computer device according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
In a specific application scenario of the accelerometer fault diagnosis method, device, circuit and computer equipment of the present application:
the conventional technology proposes to determine whether the accelerometer is normal according to the output or working current of the accelerometer, for example, the acceleration output in a flat state should be about 0g (g is gravity acceleration) or 1g, and if the normal working current should be 1mA (milliampere), the accelerometer is considered to be not working normally beyond these values, but there are the following drawbacks: for example, the output of the accelerometer in the operating state is a saturation value within a certain period of time, and at this time, it cannot be simply determined according to the output value whether the accelerometer has a fault or because the externally input acceleration exceeds the range of the accelerometer, and for example, the accelerometer in the operating state outputs a periodic signal, and it cannot be determined whether the fault of the accelerometer caused by the instability of the system or the externally input acceleration itself is a periodic signal. Therefore, the method can only carry out fault diagnosis on the state of the accelerometer roughly and simply, can not diagnose the fault accurately and comprehensively, and can not identify the fault type.
For another example, the conventional technology indicates that the accelerometer has a power-on self-test function, and performs a fault self-test function on the accelerometer before use, that is, after power-on, a self-test excitation voltage is applied to the sensitive structure to detect a corresponding output quantity to determine whether the sensitive structure of the accelerometer is normal, and a fault error report can be performed on the accelerometer, for example, an excitation voltage of 1V (volt) is applied, and the corresponding output should be 0.2V, so that whether the dynamic characteristic of the sensitive structure is normal can be quantitatively detected. However, this solution has the following drawbacks: the self-checking of the fault of the accelerometer is only completed before the accelerometer is used, the fault monitoring of the accelerometer cannot be completed in real time on line, and the fault type of the accelerometer cannot be identified.
In order to solve the problem that the type of a fault cannot be identified when the accelerometer has a fault in the conventional technology, so that the accelerometer cannot be improved correspondingly, in one embodiment, as shown in fig. 1, a method for diagnosing the fault of the accelerometer is provided, which includes the following steps:
step S110, acquiring a first voltage signal, a second voltage signal and a current signal; the first voltage signal is a voltage signal output by a C/V conversion circuit in the accelerometer detection circuit; the second voltage signal is a voltage signal output by the accelerometer; the current signal is a current signal on the accelerometer detection circuit.
Wherein, the accelerometer described in the present application isA closed-loop capacitive MEMS accelerometer, as shown in fig. 2, shows a structure diagram of a closed-loop capacitive MEMS accelerometer, which mainly includes two parts, one part is a sensing structure 11, and the other part is an accelerometer detection circuit 13, wherein a capacitive plate of the sensing structure is composed of an upper fixed plate, a movable mass block and a lower fixed plate, the upper fixed plate and the lower fixed plate are fixed, and the movable mass block is connected with a fixed anchor through a mechanical beam. The movable mass block of the sensitive structure is displaced under the action of the inertia force of the external acceleration to cause the change of a differential capacitor between the movable mass block and an upper fixed polar plate and between the movable mass block and a lower fixed polar plate, a C/V (capacitance/voltage) conversion circuit detects the change of the differential capacitor of the sensitive structure and converts the change into voltage to be output, and the voltage output by the C/V conversion circuit is a first voltage signal VS。
The accelerometer detection circuit 11 comprises a C/V conversion circuit 111, a PID controller 113, a gain adjustment circuit 115, a force feedback circuit 117, an A/D acquisition circuit 119 and a processing circuit 121;
the input end of the C/V conversion circuit 111 is connected with the sensitive structure 13, and the output end is connected with the gain adjusting circuit 115 through the PID controller 113; gain adjustment circuit 115 is connected to sensitive structure 13 through force feedback circuit 117;
the input end of the A/D acquisition circuit 119 is connected with the output end of the gain adjustment circuit 115, and the output end of the A/D acquisition circuit 119 is connected with the processing circuit.
A PID (proportional-integral-derivative) controller receives and processes the first voltage signal, and outputs a second voltage signal V through a gain adjusting circuitoutThe second voltage signal is the voltage output by the sensitive structure under the inertia of the external acceleration, the second voltage signal is collected by the A/D collecting circuit and then transmitted to the processor, and the processor processes the second voltage signal to output the acceleration value. The force feedback circuit applies corresponding voltage V to the sensitive structure according to the second voltage signalfbAnd the movable mass block of the sensitive structure is restored to the initial position, and the difference value of the differential capacitance of the sensitive structure is ensured to be zero.
The current signal is the current on the accelerometer detection circuit.
Step S120, acquiring the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current; the first saturation voltage is the maximum voltage output by the C/V conversion circuit; the second saturation voltage is the maximum voltage output by the accelerometer; the standard current is the current on the accelerometer detection circuit when the accelerometer is normal.
The first saturation voltage is the maximum voltage output by the C/V conversion circuit.
The second saturation voltage is the maximum voltage output by the accelerometer, namely the maximum voltage output by the PID controller through the gain adjusting circuit.
The standard current is the current on the accelerometer detection circuit in the case of a normal accelerometer.
When different working states or different faults occur in the sensitive structure, the characteristics presented by the first voltage signal, the second voltage signal and the current signal are different, and the specific fault can be judged according to the characteristics presented by the signals. After the fault type is determined, corresponding measures can be taken according to the fault type, such as powering on again, starting a corresponding fault recovery function, and the like.
In a specific embodiment, the fault type includes any one or any combination of the following faults: accelerometer detection circuit damage, accelerometer system oscillation, accelerometer over-range, accelerometer particle jamming, accelerometer structure adhesion, and accelerometer mechanical beam breakage.
In each embodiment of the accelerometer fault diagnosis method, a first voltage signal, a second voltage signal and a current signal are obtained; acquiring the fault type of the accelerometer according to a first voltage signal, a second voltage signal, a current signal, a first saturation voltage, a second saturation voltage and a standard current, wherein the first voltage signal is a voltage signal output by a C/V conversion circuit in the accelerometer detection circuit; the second voltage signal is a voltage signal output by the accelerometer; the first saturation voltage is the maximum voltage output by the C/V conversion circuit; the second saturation voltage is the maximum voltage output by the accelerometer; the standard current is the current of the accelerometer detection circuit during normal operation, so that the fault type of the accelerometer can be judged according to the first voltage signal, the second voltage signal and the current signal, the working state of the accelerometer can be monitored more comprehensively, the fault diagnosis capability is improved, in addition, corresponding remedial measures can be taken according to the fault type, and an improvement scheme is provided for the accelerometer through counting the fault type.
In one embodiment, the step of obtaining the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current comprises:
and when the current signal is greater than the standard current of the preset multiple, determining that the fault type is the damage of the accelerometer detection circuit.
It should be noted that the preset multiple may be determined according to actual requirements, and when the current signal is abnormally large, it is determined that the accelerometer detection circuit is damaged, and in this state, the first voltage signal and the second voltage signal are not acquired.
The first voltage signal is represented as V1The second voltage signal is represented as V2The current signal is represented as I and the first saturation voltage is represented as Vsat1The second saturation voltage is represented as Vsat2The standard current is represented as InI.e. I>N*InOr as I > InAnd confirming that the fault type is accelerometer detection circuit damage.
Or, the step of acquiring the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current comprises:
and when the current signal is larger than the standard current and smaller than the standard current of a preset multiple, the first voltage signal continuously changes within the range of being larger than zero and smaller than or equal to the first saturation voltage, and the second voltage signal continuously changes within the range of being larger than zero and smaller than or equal to the second saturation voltage, determining that the fault type is the oscillation of the accelerometer system, and determining that the fault type is the oscillation of the accelerometer system.
It should be noted that, when the first voltage signal changes between the zero value and the first saturation voltage, the second voltage signal changes between the zero value and the second saturation voltage, and the current signal is greater than the standard current and less than the standard current of the preset multiple (i.e. the current signal may be slightly greater than the standard current), i.e. In＜I＜N*InOr that I is slightly larger than In、0＜V1＜Vsat1、0＜V2＜Vsat2And confirming that the accelerometer has a fault of the oscillation of the accelerometer system. The accelerometer system oscillation refers to the oscillation of the movable mass block caused by instability of a closed-loop system caused by the accelerometer under the action of the external environment.
Or, the step of acquiring the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current comprises:
when the first voltage signal is equal to a first saturation voltage, the second voltage signal is equal to a second saturation voltage, and the duration of the first voltage signal and the duration of the second voltage signal are less than a preset duration, determining that the fault type is that the accelerometer exceeds the measuring range;
and when the first voltage signal is equal to the first saturation voltage, the duration of the first voltage signal exceeds a preset duration, and the second voltage signal is greater than zero and less than the second saturation voltage, determining that the fault type is accelerometer particle jamming.
It should be noted that when the first voltage signal is equal to the first saturation voltage, the second voltage signal is equal to the second saturation voltage, and the duration of the two signals is within a preset duration, i.e., V1＝Vsat1，
V2＝Vsat2，
Confirming that the accelerometer has an over-range fault, wherein the preset durationThe accelerometer over-range refers to the measured acceleration exceeding the range of the accelerometer, which can be determined according to actual conditions. Wherein the content of the first and second substances,
representing the duration of the first voltage signal,
the duration of the second voltage signal, T, represents a preset duration.
When the first voltage signal is always equal to the first saturation voltage, the second voltage signal has a constant value between zero and the second saturation voltage, i.e., V1＝Vsat1，0＜V2＜Vsat2And confirming that the accelerometer has a fault that particles of the accelerometer are blocked or a movable mass block of a sensitive structure is blocked and cannot move.
Or, the step of acquiring the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current comprises:
when the first voltage signal is equal to the first saturation voltage, the duration of the first voltage signal exceeds the preset duration, the second voltage signal is equal to the second saturation voltage, and the current signal is greater than the standard current, determining that the fault type is accelerometer structure adhesion;
and when the first voltage signal is equal to the first saturation voltage, the second voltage signal is equal to the second saturation voltage, the current signal is equal to the standard current, and the duration of the first voltage signal and the duration of the second voltage signal exceed the preset duration, determining that the fault type is the accelerometer mechanical beam breakage.
It should be noted that, when the first voltage signal is equal to the first saturation voltage for a long time (i.e. longer than the preset time), the second voltage signal is equal to the second saturation voltage, and the current signal is greater than the standard current, i.e. V1＝Vsat1，
V2＝Vsat2、I>InAnd when the accelerometer is in a failure of adhesion of the accelerometer structure, the adhesion of the accelerometer structure refers to the adhesion of a movable mass block of the sensitive structure and the upper fixed polar plate or the lower fixed polar plate.
When the first voltage signal is equal to the first saturation voltage for a long time, the second voltage signal is equal to the second saturation voltage for a long time, and the current signal is equal to the standard current, i.e., V1＝Vsat1，
V2＝Vsat2，
I＝InAnd confirming that the accelerometer has mechanical beam fracture. Accelerometer mechanical beam breakage means that the mechanical beam used to fixedly connect the movable mass breaks.
In each embodiment of the accelerometer fault diagnosis method, the fault types are divided into accelerometer detection circuit damage, accelerometer system oscillation, accelerometer over-range, accelerometer particle blockage, accelerometer structure adhesion and accelerometer mechanical beam fracture according to the characteristics of the first voltage signal, the second voltage signal and the current signal, so that fault positioning can be performed more accurately, more targeted measures can be taken for the accelerometer, and the reliability of the accelerometer can be comprehensively evaluated.
It should be understood that, although the steps in the flowchart of fig. 1 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least a portion of the steps in fig. 1 may include multiple sub-steps or multiple stages that are not necessarily performed at the same time, but may be performed at different times, and the order of performance of the sub-steps or stages is not necessarily sequential, but may be performed in turn or alternately with other steps or at least a portion of the sub-steps or stages of other steps.
In one embodiment, as shown in fig. 3, there is provided an accelerometer fault diagnosis apparatus including:
a signal obtaining module 310, configured to obtain a first voltage signal, a second voltage signal, and a current signal; the first voltage signal is a voltage signal output by a C/V conversion circuit in the accelerometer detection circuit; the second voltage signal is a voltage signal output by the accelerometer; the current signal is a current signal on the accelerometer detection circuit;
the fault type acquiring module 320 is configured to acquire a fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage, and the standard current; the first saturation voltage is the maximum voltage output by the C/V conversion circuit; the second saturation voltage is the maximum voltage output by the accelerometer; the standard current is the current on the accelerometer detection circuit when the accelerometer is normal.
For specific limitations of the accelerometer fault diagnosis device, reference may be made to the above limitations of the accelerometer fault diagnosis method, which are not described herein again. The modules in the accelerometer fault diagnosis device can be wholly or partially realized by software, hardware and a combination thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
In one embodiment, as shown in fig. 4, there is provided an accelerometer fault diagnosis circuit comprising a signal acquisition circuit 41, a processor 43, and an instrumentation amplifier 45;
the input end of the instrument amplifier 45 is connected between a power supply 15 for supplying power to the accelerometer and the accelerometer 10, and the output end of the instrument amplifier 45 is connected with the first input end of the signal acquisition circuit 41;
a second input end of the signal acquisition circuit 41 is connected with an output end of the C/V conversion circuit 111 of the accelerometer detection circuit 11, a third input end of the signal acquisition circuit 41 is connected with an output end of the gain adjustment circuit 115 of the accelerometer detection circuit 11, and an output end of the signal acquisition circuit 41 is connected with the processor 43;
the signal acquisition circuit 41 is configured to acquire a first voltage signal, a second voltage signal, and a current signal;
Further, as shown in fig. 5, the signal acquisition circuit 11 includes a first a/D acquisition circuit 411, a second a/D acquisition circuit 413, and a third a/D acquisition circuit 415;
the input of instrumentation amplifier 45 includes a resistor 451; the resistor 451 is connected between the power supply 15 and the accelerometer 10;
the input end of the first A/D acquisition circuit 411 is connected with the output end of the instrumentation amplifier 45, and the output end is connected with the processor 43;
the input end of the second A/D acquisition circuit 413 is connected with the output end of the C/V conversion circuit 111, and the output end is connected with the processor 43;
the input end of the third a/D acquisition circuit 415 is connected to the output end of the gain adjustment circuit 115, and the output end is connected to the processor 43;
the first a/D acquisition circuit 411 is used to acquire a current signal; the second a/D acquisition circuit 413 is configured to acquire a second voltage signal; the third a/D acquisition circuit 415 is configured to acquire the first voltage signal.
It should be noted that, in the case where the accelerometer is normal, the processor normally outputs the acceleration value measured by the accelerometer. The instrument amplifier collects a voltage signal at the output end of the power supply, converts the current of the accelerometer into voltage and transmits the voltage to the first A/D acquisition circuit, and the first A/D acquisition circuit converts the received voltage into a current signal. Specifically, the instrument amplifier collects the voltage difference between two ends of the resistor, converts the current of the accelerometer into voltage and transmits the voltage to the first A/D collection circuit.
In each embodiment of the accelerometer fault diagnosis circuit, the circuit can monitor the working state and the fault condition of the accelerometer on line in real time, the fault type can be identified when the accelerometer breaks down, and the acceleration value can be normally output when the accelerometer is normal, so that the accelerometer is timely maintained according to the working state and the fault condition, the reliability of the accelerometer is improved, and the service life of the accelerometer is prolonged.
In one embodiment, a computer device is provided, which may be a server, the internal structure of which may be as shown in fig. 5. The computer device includes a processor, a memory, a network interface, and a database connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The database of the computer device is used for storing the data involved in the accelerometer fault diagnosis method. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program is executed by a processor to implement an accelerometer fault diagnosis method.
Those skilled in the art will appreciate that the architecture shown in fig. 5 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
In one embodiment, a computer device is provided, comprising a memory and a processor, the memory having a computer program stored therein, the processor implementing the following steps when executing the computer program:
acquiring a first voltage signal, a second voltage signal and a current signal; the first voltage signal is a voltage signal output by a C/V conversion circuit in the accelerometer detection circuit; the second voltage signal is a voltage signal output by the accelerometer; the current signal is a current signal on the accelerometer detection circuit;
acquiring the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current; the first saturation voltage is the maximum voltage output by the C/V conversion circuit; the second saturation voltage is the maximum voltage output by the accelerometer; the standard current is the current on the accelerometer detection circuit when the accelerometer is normal.
In one embodiment, a computer-readable storage medium is provided, having a computer program stored thereon, which when executed by a processor, performs the steps of:
acquiring a first voltage signal, a second voltage signal and a current signal; the first voltage signal is a voltage signal output by a C/V conversion circuit in the accelerometer detection circuit; the second voltage signal is a voltage signal output by the accelerometer; the current signal is a current signal on the accelerometer detection circuit;
acquiring the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current; the first saturation voltage is the maximum voltage output by the C/V conversion circuit; the second saturation voltage is the maximum voltage output by the accelerometer; the standard current is the current on the accelerometer detection circuit when the accelerometer is normal.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the embodiments provided herein may include non-volatile and/or volatile memory, among others. Non-volatile memory can include read-only memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDRSDRAM), Enhanced SDRAM (ESDRAM), Synchronous Link DRAM (SLDRAM), Rambus Direct RAM (RDRAM), direct bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the claims. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. An accelerometer fault diagnosis method, comprising the steps of:
acquiring a first voltage signal, a second voltage signal and a current signal; the first voltage signal is a voltage signal output by a C/V conversion circuit in the accelerometer detection circuit; the second voltage signal is a voltage signal output by the accelerometer; the current signal is a current signal on the accelerometer detection circuit;
acquiring the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current; the first saturation voltage is the maximum voltage output by the C/V conversion circuit; the second saturation voltage is the maximum voltage output by the accelerometer; the standard current is the current on the accelerometer detection circuit when the accelerometer is normal;
the step of obtaining the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current comprises:
when the current signal is larger than the standard current and smaller than a preset multiple of the standard current, the first voltage signal continuously changes within a range larger than zero and smaller than or equal to the first saturation voltage, and the second voltage signal continuously changes within a range larger than zero and smaller than or equal to the second saturation voltage, determining that the fault type is accelerometer system oscillation;
alternatively, the first and second electrodes may be,
when the first voltage signal is equal to the first saturation voltage, the second voltage signal is equal to the second saturation voltage, and the duration of the first voltage signal and the duration of the second voltage signal are less than a preset duration, determining that the fault type is that the accelerometer exceeds the range;
when the first voltage signal is equal to the first saturation voltage, the duration of the first voltage signal exceeds the preset duration, and the second voltage signal is greater than zero and less than the second saturation voltage, determining that the fault type is accelerometer particle jamming;
alternatively, the first and second electrodes may be,
when the first voltage signal is equal to the first saturation voltage, the duration of the first voltage signal exceeds a preset duration, the second voltage signal is equal to the second saturation voltage, and the current signal is greater than the standard current, confirming that the fault type is accelerometer structure adhesion;
and when the first voltage signal is equal to the first saturation voltage, the second voltage signal is equal to the second saturation voltage, the current signal is equal to the standard current, and the duration of the first voltage signal and the duration of the second voltage signal exceed the preset duration, determining that the fault type is accelerometer mechanical beam breakage.
2. The accelerometer fault diagnostic method of claim 1,
the fault type comprises any one or any combination of the following faults: accelerometer detection circuit damage, accelerometer system oscillation, accelerometer over-range, accelerometer particle jamming, accelerometer structure adhesion, and accelerometer mechanical beam breakage.
3. The accelerometer fault diagnostic method of claim 1 or 2,
the step of obtaining the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current further includes:
and when the current signal is larger than the standard current of a preset multiple, determining that the fault type is accelerometer detection circuit damage.
4. The accelerometer fault diagnosis method according to claim 1 or 2, wherein after acquiring the fault type of the accelerometer, corresponding measures are taken according to the fault type of the accelerometer.
5. An accelerometer fault diagnostic device, comprising:
the signal acquisition module is used for acquiring a first voltage signal, a second voltage signal and a current signal; the first voltage signal is a voltage signal output by a C/V conversion circuit in the accelerometer detection circuit; the second voltage signal is a voltage signal output by the accelerometer; the current signal is a current signal on the accelerometer detection circuit;
the fault type acquisition module is used for acquiring the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current; the first saturation voltage is the maximum voltage output by the C/V conversion circuit; the second saturation voltage is the maximum voltage output by the accelerometer; the standard current is the current on the accelerometer detection circuit when the accelerometer is normal;
the step of obtaining the fault type of the accelerometer according to the first voltage signal, the second voltage signal, the current signal, the first saturation voltage, the second saturation voltage and the standard current comprises:
when the current signal is larger than the standard current and smaller than a preset multiple of the standard current, the first voltage signal continuously changes within a range larger than zero and smaller than or equal to the first saturation voltage, and the second voltage signal continuously changes within a range larger than zero and smaller than or equal to the second saturation voltage, determining that the fault type is accelerometer system oscillation;
alternatively, the first and second electrodes may be,
when the first voltage signal is equal to the first saturation voltage, the second voltage signal is equal to the second saturation voltage, and the duration of the first voltage signal and the duration of the second voltage signal are less than a preset duration, determining that the fault type is that the accelerometer exceeds the range;
when the first voltage signal is equal to the first saturation voltage, the duration of the first voltage signal exceeds the preset duration, and the second voltage signal is greater than zero and less than the second saturation voltage, determining that the fault type is accelerometer particle jamming;
alternatively, the first and second electrodes may be,
when the first voltage signal is equal to the first saturation voltage, the duration of the first voltage signal exceeds a preset duration, the second voltage signal is equal to the second saturation voltage, and the current signal is greater than the standard current, confirming that the fault type is accelerometer structure adhesion;
and when the first voltage signal is equal to the first saturation voltage, the second voltage signal is equal to the second saturation voltage, the current signal is equal to the standard current, and the duration of the first voltage signal and the duration of the second voltage signal exceed the preset duration, determining that the fault type is accelerometer mechanical beam breakage.
6. A computer device comprising a memory and a processor, the memory storing a computer program, characterized in that the processor realizes the steps of the method of any one of claims 1 to 3 when executing the computer program.
7. The accelerometer fault diagnosis circuit is characterized by comprising an instrument amplifier, a signal acquisition circuit and a processor;
the input end of the instrument amplifier is connected between a power supply for supplying power to the accelerometer and the accelerometer, and the output end of the instrument amplifier is connected with the first input end of the signal acquisition circuit;
the second input end of the signal acquisition circuit is connected with the output end of the C/V conversion circuit of the accelerometer detection circuit, the third input end of the signal acquisition circuit is connected with the output end of the gain adjustment circuit of the accelerometer detection circuit, and the output end of the signal acquisition circuit is connected with the processor;
the signal acquisition circuit is used for acquiring the first voltage signal, the second voltage signal and the current signal;
the processor is used for implementing the accelerometer fault diagnosis method of any one of claims 1 to 3.
8. The accelerometer fault diagnostic circuit of claim 7, wherein the signal acquisition circuit comprises a first a/D acquisition circuit, a second a/D acquisition circuit, and a third a/D acquisition circuit;
the input end of the instrumentation amplifier comprises a resistor; the resistor is connected between the power supply and the accelerometer;
the input end of the first A/D acquisition circuit is connected with the output end of the instrument amplifier, and the output end of the first A/D acquisition circuit is connected with the processor;
the input end of the second A/D acquisition circuit is connected with the output end of the C/V conversion circuit, and the output end of the second A/D acquisition circuit is connected with the processor;
the input end of the third A/D acquisition circuit is connected with the output end of the gain adjustment circuit, and the output end of the third A/D acquisition circuit is connected with the processor;
the first A/D acquisition circuit is used for acquiring the current signal; the second A/D acquisition circuit is used for acquiring the second voltage signal; the third A/D acquisition circuit is used for acquiring the first voltage signal.
9. The accelerometer fault diagnostic circuit of claim 7 or 8, wherein the accelerometer is a closed-loop capacitive MEMS accelerometer.
10. A computer-readable storage medium, having stored thereon a computer program which, when executed by a processor, implements the accelerometer fault diagnosis method of any of claims 1 to 3.
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| CN110514870A (en) * | 2019-08-13 | 2019-11-29 | 中国航空工业集团公司西安飞行自动控制研究所 | A kind of silicon pendulum accelerometer signal conditioning device and system |
| CN111721970B (en) * | 2020-06-16 | 2022-03-18 | 维沃移动通信有限公司 | Capacitive acceleration sensor, control method and control device thereof, and electronic equipment |
| CN112284512A (en) * | 2020-10-16 | 2021-01-29 | 陕西宝鸡第二发电有限责任公司 | Capacitive vibration sensor and power plant fan diagnosis system and method |
| CN112327005B (en) * | 2020-11-06 | 2022-08-30 | 上海寰宇乾堃航天科技有限公司 | Health monitoring device for quartz accelerometer |
| CN112858722A (en) * | 2021-01-08 | 2021-05-28 | 中国船舶重工集团公司第七0七研究所 | Saturation fault screening device of flexible accelerometer |
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