CN109581186A - Single particle effect test method, device, system and the electronic equipment of Vision information processing circuit - Google Patents
Single particle effect test method, device, system and the electronic equipment of Vision information processing circuit Download PDFInfo
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Abstract
The invention discloses single particle effect test method, device, system and the electronic equipments of a kind of Vision information processing circuit, belong to device detection technical field.The method includes before each functional module of control Vision information processing circuit is successively run, and a functional module is run under control, first judging whether current functional module function is normal when irradiation；If so, storing the real processing results of current functional module into memory module, and control next functional module operation；If it is not, then recording a capability error, and returns to initial step and restart to run each functional module；After the completion of each functional module is run, the real processing results of each functional module and standard processing result are compared, determine the single-particle inversion error number of each functional module；According to capability error number and single-particle inversion error number, simple grain sub-error section and the error rate of Vision information processing circuit are determined.The present invention can provide the single-particle inversion sensibility of each functional module, covering is comprehensive.
Description
Technical field
The present invention relates to single particle effect test method, device, system and the electronics of a kind of Vision information processing circuit to set
It is standby, belong to device detection technical field.
Background technique
Nowadays, with the reduction of semiconductor device technology size, single particle effect is more and more significant, seriously affects space
The safety of task.Therefore, must to carry out single particle effect to it before semiconductor devices is applied to space tasks sensitive
The assessment of property.
It, first will by FPGA at present when carrying out single particle effect test to a complicated Vision information processing circuit
Control signal and input stimulus are supplied to circuit under test chip, carry out data processing by circuit under test chip, and by processing result
Host computer is acquired and be sent to, simple grain sub-error section and mistake are determined according to the final output correctness of chip to be measured
Accidentally rate, by simple grain sub-error section and error rate Lai characterized integrated circuit single particle effect sensibility.
Extensive Vision information processing circuit includes different functional module, and the single particle effect of different function module is sensitive
Property it is different, the above method can not count the single particle effect of different function module.
Summary of the invention
To solve problems of the prior art, the present invention provides a kind of single-particle of Vision information processing circuit effects
Test method, device, system and electronic equipment are answered, by the list for counting each functional module in Vision information processing circuit respectively
Particle overturns sensibility, quick come the single particle effect of characterized entire circuit with the single-particle inversion sensibility of each functional module
Feel characteristic, there is single particle effect to cover comprehensive feature.
Technical solution of the invention the following steps are included:
A kind of single particle effect test method of Vision information processing circuit, comprising:
When default radiation parameter starts, each functional module for controlling the Vision information processing circuit is successively run, and
Under control before a functional module operation, first judge whether presently described functional module function is normal；
If so, storing the real processing results of presently described functional module into memory module, and control next institute
State functional module operation；
If it is not, then recording a capability error, and returns to initial step and restart to run each functional module；
After the completion of each functional module is run, the real processing results of each functional module and standard are handled
As a result it compares, determines the single-particle inversion error number of each functional module；
According to the capability error number and the single-particle inversion error number, the list of the Vision information processing circuit is determined
Particle mistake section and error rate.
In an alternative embodiment, each functional module of the control Vision information processing circuit is successively run, and is wrapped
It includes:
External drive data are sent to first functional module, make first functional module according to the external drive
Data carry out operation, obtain the real processing results of first functional module；
It successively controls the subsequent functional module and carries out operation according to the real processing results of the previous functional module, obtain
To the real processing results of the follow-up function module.
It is described to judge whether presently described functional module function is normal in an alternative embodiment, comprising:
Judge whether presently described functional module obtains real processing results in preset duration, if then determining function just
Often, if otherwise determining, function is abnormal.
In an alternative embodiment, by internal processor control each functional module of the Vision information processing circuit according to
Secondary operation.
In an alternative embodiment, after the completion of each each functional module is successively run, further includes:
Judge whether the internal processor function is normal, if otherwise recording a capability error.
In an alternative embodiment, whether response is had according to the internal processor, judges the internal processor function
It is whether normal.
In an alternative embodiment, the real processing results by presently described functional module are stored into memory module
Before, further includes:
Judge whether the external interface unit of presently described functional module is normal, if otherwise recording a capability error.
In an alternative embodiment, whether just the external interface unit of the functional module is judged by time-out check method
Often.
A kind of single particle effect test device of Vision information processing circuit, comprising:
Module is run, for controlling each function mould of the Vision information processing circuit when default radiation parameter starts
Block is successively run, and first judges whether presently described functional module function is normal before a functional module operation under control；
Module is continued to run, for if so, by real processing results storage to the storage mould of presently described functional module
In block, and control next functional module operation；
Error logging module is used for if it is not, then recording a capability error, and return to initial step and restart to run institute
State each functional module；
Comparison module is used for after the completion of each functional module is run, by the actual treatment of each functional module
As a result it is compared with standard processing result, determines the single-particle inversion error number of each functional module；
Determining module, for determining the vision letter according to the capability error number and the single-particle inversion error number
Cease simple grain sub-error section and the error rate of processing circuit.
In an alternative embodiment, the operation module is used for:
External drive data are sent to first functional module, make first functional module according to the external drive
Data carry out operation, obtain the real processing results of first functional module；
It successively controls the subsequent functional module and carries out operation according to the real processing results of the previous functional module, obtain
To the real processing results of the follow-up function module.
In an alternative embodiment, the operation module is used for:
Judge whether presently described functional module obtains real processing results in preset duration, if then determining function just
Often, if otherwise determining, function is abnormal.
In an alternative embodiment, by internal processor control each functional module of the Vision information processing circuit according to
Secondary operation.
In an alternative embodiment, the single particle effect test device of the Vision information processing circuit, further includes position
In the first judgment module of upper computer end, it is used for:
After the completion of each each functional module is successively run, judge whether the internal processor function is normal；Accordingly
Ground, if the error logging module is also used to otherwise record a capability error.
In an alternative embodiment, the judgment module judges institute for whether having accordingly according to the internal processor
Whether normal state internal processor function.
In an alternative embodiment, the single particle effect test device of the Vision information processing circuit further includes
Two judgment modules, for before by the storage of the real processing results of presently described functional module into memory module, judgement to be worked as
Whether the external interface unit of the preceding functional module is normal, if otherwise recording a capability error.
In an alternative embodiment, second judgment module, for judging the function mould by time-out check method
Whether the external interface unit of block is normal.
A kind of single particle effect test macro of Vision information processing circuit, irradiation system and above-mentioned Vision information processing electricity
The single particle effect test device on road, the irradiation system is for providing default radiation parameter.
A kind of electronic equipment, including memory and processor；
The memory is for storing one or more computer instruction；
The processor is for executing one or more computer instruction, to be used for:
When default radiation parameter starts, each functional module for controlling the Vision information processing circuit is successively run, and
Under control before a functional module operation, first judge whether presently described functional module function is normal；
If so, storing the real processing results of presently described functional module into memory module, and control next institute
State functional module operation；
If it is not, then recording a capability error, and returns to initial step and restart to run each functional module；
After the completion of each functional module is run, the real processing results of each functional module and standard are handled
As a result it compares, determines the single-particle inversion error number of each functional module；
According to the capability error number and the single-particle inversion error number, the list of the Vision information processing circuit is determined
Particle mistake section and error rate.
Compared with the prior art, the invention has the advantages that:
1, the single particle effect test method of Vision information processing circuit provided in an embodiment of the present invention, by counting respectively
The single-particle inversion sensibility of each functional module in Vision information processing circuit, it is sensitive with the single-particle inversion of each functional module
Property carry out the single particle effect sensitivity characteristic of characterized entire circuit, there is single particle effect to cover comprehensive feature；
2, single particle effect test method has accurately grasped the single particle effect sensibility of different function module in the present invention,
Important references are provided for radiation tolerance design.
Detailed description of the invention
Fig. 1 is a kind of Vision information processing circuit single particle effect testing method process provided in an embodiment of the present invention
Figure；
Fig. 2 is a kind of Vision information processing circuit function block diagram provided in an embodiment of the present invention；
Fig. 3 is a kind of Vision information processing circuit single particle effect experiment test device signal provided in an embodiment of the present invention
Figure；
Fig. 4 is a kind of Vision information processing circuit single particle effect experimental test dress that a specific embodiment of the invention provides
Set schematic diagram.
Specific embodiment
Below in conjunction with the drawings and specific embodiments, specific embodiments of the present invention will be described in further detail.
Referring to Fig. 1, the embodiment of the invention provides a kind of single particle effect test method of Vision information processing circuit, packets
Include following steps:
Step 101: after Vision information processing circuit powers on, data and algorithm being carried out to the Vision information processing circuit
Initialize installation；
Specifically, in the embodiment of the present invention, Vision information processing circuit board to be measured is given respectively by external power supply module
Other chips of kernel, I/O port and circuit board are independently-powered；
Specifically, the Initialize installation of data described in the embodiment of the present invention and algorithm include will be at the visual information
Manage each functional module to be tested in circuit image data to be used, director data and/or configuration information etc. is disposable
It is cached to the corresponding position of Vision information processing circuit memory module, waits beginning to be irradiated；
Step 102: when default radiation parameter starts, controlling each functional module of the Vision information processing circuit successively
Operation, and first judge whether presently described functional module function is normal before a functional module operation under control；
If so, carrying out:
Step 103: the real processing results of presently described functional module being stored into the memory module, and under control
The one functional module operation；
If it is not, then carrying out:
Step 103 ': capability error of record, and return step 101 restarts to run each functional module.
Step 104: after the completion of each functional module is run, by the real processing results of each functional module with
Standard processing result compares, and determines the single-particle inversion error number of each functional module；
Step 105: according to capability error number and the single-particle inversion error number, determining the Vision information processing circuit
Simple grain sub-error section and error rate.
Specifically, simple grain sub-error section is the sum of capability error number and the single-particle inversion error number and irradiation
The ratio of fluence 1E7.
The single particle effect test method of Vision information processing circuit provided in an embodiment of the present invention, by counting view respectively
The single-particle inversion sensibility for feeling each functional module in information-processing circuit, with the single-particle inversion sensibility of each functional module
Carry out the single particle effect sensitivity characteristic of characterized entire circuit, there is single particle effect to cover comprehensive feature.
In an alternative embodiment, each functional module of the control Vision information processing circuit described in step 102 according to
Secondary operation, comprising:
External drive data are sent to the first functional module, make first functional module according to the external drive data
Operation is carried out, the real processing results of first functional module are obtained, controls the second functional module according to first function
The real processing results of module carry out operation, the real processing results of second functional module are obtained, so that third function mould
Root tuber carries out operation according to the actual treatment data of second functional module, and so on, until each functional module is all run
It finishes.
In an alternative embodiment, store the real processing results to memory corresponding sub-region.Specifically, described
Subregion and the functional module correspond.
In an alternative embodiment, judge whether presently described functional module function is normal described in step 102, comprising:
Judge whether presently described functional module obtains real processing results in preset duration, if then determining function just
Often, if otherwise determining, function is abnormal.
In an alternative embodiment, internal processor controls each function of the Vision information processing circuit in step 102
Module is successively run, then in step 104 after the completion of each functional module is run,
Judge whether the internal processor function is normal, if otherwise recording a capability error.
Specifically it can confirm whether internal processor has timing response to be verified according to host computer, if internal processor resets
Signal or external signal port can not normal configuration be setting value, then record a capability error.
In an alternative embodiment, the real processing results storage of presently described functional module is arrived described in step 103
Before in the memory module, further includes:
Judge whether the external interface unit of presently described functional module is normal, if otherwise recording a capability error；
It specifically can be used whether just the time-out check mechanism such as relatively judge the external interface unit of presently described functional module
Often.
Referring to Fig. 3, the embodiment of the invention also provides a kind of single particle effect test device of Vision information processing circuit,
Include:
Module 10 is run, for controlling each function of the Vision information processing circuit when default radiation parameter starts
Module is successively run, and whether just first judges presently described functional module function before a functional module operation under control
Often；
Module 20 is continued to run, for if so, by the real processing results storage to storage of presently described functional module
In module, and control next functional module operation；
Error logging module 30 is used for if it is not, then recording a capability error, and return to initial step and restart to run
Each functional module；
Comparison module 40 is used for after the completion of each functional module is run, by the practical place of each functional module
Reason result is compared with standard processing result, determines the single-particle inversion error number of each functional module；
Determining module 50, for determining the vision according to the capability error number and the single-particle inversion error number
The simple grain sub-error section of information-processing circuit and error rate.
In an alternative embodiment, the operation module is used for:
External drive data are sent to first functional module, make first functional module according to the external drive
Data carry out operation, obtain the real processing results of first functional module；
It successively controls the subsequent functional module and carries out operation according to the real processing results of the previous functional module, obtain
To the real processing results of the follow-up function module.
In an alternative embodiment, the operation module is used for:
Judge whether presently described functional module obtains real processing results in preset duration, if then determining function just
Often, if otherwise determining, function is abnormal.
In an alternative embodiment, by internal processor control each functional module of the Vision information processing circuit according to
Secondary operation.
In an alternative embodiment, the single particle effect test device of the Vision information processing circuit, further includes position
In the first judgment module of upper computer end, it is used for:
After the completion of each each functional module is successively run, judge whether the internal processor function is normal；Accordingly
Ground, if the error logging module is also used to otherwise record a capability error.
In an alternative embodiment, the judgment module judges institute for whether having accordingly according to the internal processor
Whether normal state internal processor function.
In an alternative embodiment, the single particle effect test device of the Vision information processing circuit further includes
Two judgment modules, for before by the storage of the real processing results of presently described functional module into memory module, judgement to be worked as
Whether the external interface unit of the preceding functional module is normal, if otherwise recording a capability error.
In an alternative embodiment, second judgment module, for judging the function mould by time-out check method
Whether the external interface unit of block is normal.
A kind of single particle effect test macro of Vision information processing circuit, irradiation system and above-mentioned Vision information processing electricity
The single particle effect test device on road, the irradiation system is for providing default radiation parameter.
A kind of electronic equipment, including memory and processor；
The memory is for storing one or more computer instruction；
The processor is for executing one or more computer instruction, to be used for:
When default radiation parameter starts, each functional module for controlling the Vision information processing circuit is successively run, and
Under control before a functional module operation, first judge whether presently described functional module function is normal；
If so, storing the real processing results of presently described functional module into memory module, and control next institute
State functional module operation；
If it is not, then recording a capability error, and returns to initial step and restart to run each functional module；
After the completion of each functional module is run, the real processing results of each functional module and standard are handled
As a result it compares, determines the single-particle inversion error number of each functional module；
According to the capability error number and the single-particle inversion error number, the list of the Vision information processing circuit is determined
Particle mistake section and error rate.
The following are a specific embodiments of the invention:
Present embodiments provide a kind of single particle effect test method of Vision information processing circuit, referring to fig. 2, the view
Feel information-processing circuit include restructural vision front processor module, restructural Binary Operation module, area information extraction module,
Floating-point matrix processor module, image interframe computing module and internal processor module, referring to fig. 4, the test method includes
Following steps:
Step 1: after Vision information processing circuit powers on, internal processor described in PC control is to the visual information
The memory module of processing circuit carries out the Initialize installation of data and algorithm；
Specifically, the Initialize installation of data and algorithm includes:
Sampling, the manual threshold modal of configuration and parameter, image procossing knot are subtracted for restructural vision front processor module
The setting of fruit storage address (first position)；Noise filtering template, image operation for restructural Binary Operation module, two-value
The setting of morphology operations, pending data address (second position) and result storage address (the third place)；To area information
The connection model of extraction module, the image address (the 4th position) of information to be extracted and information result storage address (the 5th
Set) setting；Instruction and data address (the 6th position) for floating-point matrix processor module, start matrix disposal unit,
By the setting of result storage address (the 7th position)；For the interframe operation sample rate of image interframe computing module, pending frame
Between operation image address data memory (8 positions), frame difference blinkpunkt boundary sizes, interframe operation result storage address the (the 9th
Position) setting.
Step 2: when default radiation parameter starts, host computer obtains 3,000,000 by internal processor from memory module
Pixel, the color image data that frequency is 33MHZ, are inputted by the external image source interface of restructural vision front processor module
The restructural vision front processor module carries out image pre-treatment, then will treated data (the first real processing results)
As a result it stores the first position to memory module and host computer unit is sent by serial ports by the first real processing results and compare,
Count single-particle inversion quantity；
After the completion of restructural vision front processor module arithmetic, noise filter is obtained from the second position by internal processor
Removing template, image operation, binary morphology operation, pending data and from read in memory module first position first it is practical from
Reason is as a result, carry out operation by restructural Binary Operation module, and then by treated, data (the second real processing results) are tied
Fruit stores the third place to memory module and sends host computer unit by serial ports for the second real processing results and compares, system
Count single-particle inversion quantity；
After the completion of restructural Binary Operation module arithmetic, figure of the internal processor from the 4th position acquisition information to be extracted
Picture simultaneously reads the second real processing results from memory module the third place, carries out operation then by area information extraction module
Will the storage of treated data (third real processing results) result to memory module the 5th position and by third actual treatment
As a result host computer unit is sent to by serial ports to compare, count single-particle inversion quantity；
After the completion of area information processing module operation, internal processor reads pending instruction sum number from the 6th position
According to and from read third real processing results in the 5th position of memory module, it is right that operation is carried out by floating-point matrix processor module
Afterwards will the storage of treated data (the 4th real processing results) result to memory module the 7th position and will the 4th it is practical at
Reason result is sent to host computer unit by serial ports and compares, and counts single-particle inversion quantity；
After the completion of floating-point matrix processor module operation, internal processor reads pending interframe operation from 8 positions
Image data simultaneously reads the 4th real processing results from the 7th position of memory module, is transported by image interframe computing module
Calculate, then will the storage of treated data (the 5th real processing results) result to memory module the 9th position and by the 5th it is real
Border processing result is sent to host computer unit by serial ports and compares, and counts single-particle inversion quantity；For above five function moulds
Block needs to judge whether presently described functional module obtains reality in preset duration every time after the completion of each functional module operation
Processing result, if then determining that function is normal, if otherwise determining, function is abnormal；Meanwhile to judge presently described functional module
External interface unit it is whether normal, if otherwise record a capability error；When current functional module is normal by current function
The real processing results of module are stored into memory module, and control next functional module operation；If current functional module is not just
A capability error is often also recorded, and return step 1 restarts to run each functional module.
The starting and configuration of above-mentioned five functional modules, which are all controlled by internal processor, to be completed, for the resume module of hardware
Complete as a result, internal processor can be read out as needed, corresponding operation is carried out, when internal processor module has been run
Cheng Hou judges whether the internal processor function is normal, specifically can confirm whether internal processor has timing according to host computer
Response is verified, if internal processor reset signal or external signal port can not normal configuration be setting value, record one
Subfunction mistake.
Step 3: after the completion of each functional module is run, by the real processing results and mark of each functional module
Quasi- processing result compares, and determines the single-particle inversion error number of each functional module；
Step 4: capability error number being added to obtain the single-particle of Vision information processing circuit with single-particle inversion error number
Error number obtains simple grain sub-error section and the mistake of Vision information processing circuit according to the ratio of single-particle error number and 1E7
Rate.
Specifically, above process slave computer (microcontroller) by serial ports respectively with host computer and Vision information processing circuit
It is connected, is responsible for receiving data and instruction from host computer, internal processor carries out erasable operation, control to FLASH (memory module)
The timing and other configurations information of Vision information processing circuit, so that instruction is transferred to Vision information processing circuit；Vision letter
The input of processing circuit is ceased from external drive, and external drive is 3,000,000 pixels, and frequency is the image source of 33MHZ.Vision letter
Breath processing circuit is passed through data after internal processor to host computer by serial ports after being handled image by memory module
Printing.Host computer passes through the information being collected into, and analysis obtains the single-particle inversion situation of functional module, judges Vision information processing
The single particle effect sensibility of circuit.
The present embodiment has formulated single particle effect for several functional modules of this complicated Vision information processing circuit respectively
Test method and function interrupt criterion.The test macro integrated level is higher, on software, has operating in a key
The related work of single particle effect test is completed, this pilot system not only can flexibly start, suspend, termination test, may be used also
To show current status, readback error number, interruption times, and data can be saved, automatically generate test data sheet file.The survey
Test system relatively before test macro save test period, more intelligence and perfect and to avoid operation error bring some
Loss.
The above, a specific embodiment only of the invention, but scope of protection of the present invention is not limited thereto, appoints
In the technical scope disclosed by the present invention, any changes or substitutions that can be easily thought of, all by what those familiar with the art
It is covered by the protection scope of the present invention.
Unspecified part of the present invention belongs to common sense well known to those skilled in the art.
Claims (18)
1. a kind of single particle effect test method of Vision information processing circuit characterized by comprising
When default radiation parameter starts, each functional module for controlling the Vision information processing circuit is successively run, and is being controlled
Before making next functional module operation, first judge whether presently described functional module function is normal；
If so, storing the real processing results of presently described functional module into memory module, and control next function
It can module operation；
If it is not, then recording a capability error, and returns to initial step and restart to run each functional module；
After the completion of each functional module is run, by the real processing results of each functional module and standard processing result
It compares, determines the single-particle inversion error number of each functional module；
According to the capability error number and the single-particle inversion error number, the single-particle of the Vision information processing circuit is determined
Mistake section and error rate.
2. the single particle effect test method of Vision information processing circuit according to claim 1, which is characterized in that described
Each functional module for controlling the Vision information processing circuit is successively run, comprising:
External drive data are sent to first functional module, make first functional module according to the external drive data
Operation is carried out, the real processing results of first functional module are obtained；
It successively controls the subsequent functional module and carries out operation according to the real processing results of the previous functional module, after obtaining
Continue the real processing results of the functional module.
3. the single particle effect test method of Vision information processing circuit according to claim 1, which is characterized in that described
Judge whether presently described functional module function is normal, comprising:
Judge whether presently described functional module obtains real processing results in preset duration, if then determining that function is normal,
If not, it is determined that function is abnormal.
4. the single particle effect test method of Vision information processing circuit according to claim 1, which is characterized in that pass through
Each functional module that internal processor controls the Vision information processing circuit is successively run.
5. the single particle effect test method of Vision information processing circuit according to claim 4, which is characterized in that described
After the completion of each functional module is successively run, further includes:
Judge whether the internal processor function is normal, if it is not, then recording a capability error.
6. the single particle effect test method of Vision information processing circuit according to claim 5, which is characterized in that according to
Whether the internal processor has response, judges whether the internal processor function is normal.
7. the single particle effect test method of Vision information processing circuit according to claim 1, which is characterized in that described
Before the real processing results of presently described functional module are stored into memory module, further includes:
Judge whether the external interface unit of presently described functional module is normal, if it is not, then recording a capability error.
8. the single particle effect test method of Vision information processing circuit according to claim 7, which is characterized in that pass through
Time-out check method judges whether the external interface unit of the functional module is normal.
9. a kind of single particle effect test device of Vision information processing circuit characterized by comprising
Run module, for when default radiation parameter starts, control each functional module of the Vision information processing circuit according to
Secondary operation, and first judge whether presently described functional module function is normal before a functional module operation under control；
Module is continued to run, for if so, storing the real processing results of presently described functional module into memory module,
And control next functional module operation；
Error logging module is used for if it is not, then record a capability error, and return initial step restart to run it is described each
Functional module；
Comparison module is used for after the completion of each functional module is run, by the real processing results of each functional module
It is compared with standard processing result, determines the single-particle inversion error number of each functional module；
Determining module, for determining at the visual information according to the capability error number and the single-particle inversion error number
Manage simple grain sub-error section and the error rate of circuit.
10. the single particle effect test device of Vision information processing circuit according to claim 9, which is characterized in that institute
Operation module is stated, is used for:
External drive data are sent to first functional module, make first functional module according to the external drive data
Operation is carried out, the real processing results of first functional module are obtained；
It successively controls the subsequent functional module and carries out operation according to the real processing results of the previous functional module, obtain institute
State the real processing results of follow-up function module.
11. the single particle effect test device of Vision information processing circuit according to claim 9, which is characterized in that institute
Operation module is stated to be used for:
Judge whether presently described functional module obtains real processing results in preset duration, if then determining that function is normal,
If otherwise determining, function is abnormal.
12. the single particle effect test device of Vision information processing circuit according to claim 9, which is characterized in that logical
It crosses internal processor and controls each functional module of the Vision information processing circuit and successively run.
13. the single particle effect test device of Vision information processing circuit according to claim 12, which is characterized in that also
First judgment module including being located at upper computer end, is used for:
After the completion of each each functional module is successively run, judge whether the internal processor function is normal；Correspondingly, institute
If stating error logging module to be also used to otherwise record a capability error.
14. the single particle effect test device of Vision information processing circuit according to claim 13, which is characterized in that institute
Judgment module is stated for whether having response according to the internal processor, judges whether the internal processor function is normal.
15. the single particle effect test device of Vision information processing circuit according to claim 9, which is characterized in that also
Including the second judgment module, for before by the storage of the real processing results of presently described functional module into memory module,
Judge whether the external interface unit of presently described functional module is normal, if otherwise recording a capability error.
16. the single particle effect test device of Vision information processing circuit according to claim 15, which is characterized in that institute
The second judgment module is stated, whether the external interface unit for judging the functional module by time-out check method is normal.
17. a kind of single particle effect test macro of Vision information processing circuit, which is characterized in that irradiation system and claim
The single particle effect test device of any one of 9~16 Vision information processing circuits provided, the irradiation system are pre- for providing
If radiation parameter.
18. a kind of electronic equipment, which is characterized in that including memory and processor；
The memory is for storing one or more computer instruction；
The processor is for executing one or more computer instruction, to be used for:
When default radiation parameter starts, each functional module for controlling the Vision information processing circuit is successively run, and is being controlled
Before making next functional module operation, first judge whether presently described functional module function is normal；
If so, storing the real processing results of presently described functional module into memory module, and control next function
It can module operation；
If it is not, then recording a capability error, and returns to initial step and restart to run each functional module；
After the completion of each functional module is run, by the real processing results of each functional module and standard processing result
It compares, determines the single-particle inversion error number of each functional module；
According to the capability error number and the single-particle inversion error number, the single-particle of the Vision information processing circuit is determined
Mistake section and error rate.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110988969A (en) * | 2019-11-07 | 2020-04-10 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Atmospheric neutron radiation test method, system and device |
| CN112798943A (en) * | 2021-01-16 | 2021-05-14 | 西安电子科技大学 | Real-time FPGA error detection method based on standard input and output verification |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103001636A (en) * | 2012-12-11 | 2013-03-27 | 北京时代民芯科技有限公司 | Single event effect detection method of folding interpolating-type analog-digital conversion device |
| CN103076557A (en) * | 2012-11-30 | 2013-05-01 | 北京时代民芯科技有限公司 | Testing method of single event functional interruption of Spacewire circuit |
| CN103440185A (en) * | 2013-07-22 | 2013-12-11 | 西安空间无线电技术研究所 | Digital signal processing (DSP) device single particle turning effect testing method |
| CN103675546A (en) * | 2013-12-11 | 2014-03-26 | 北京时代民芯科技有限公司 | Single event effect detecting device of image sensor |
| CN103744014A (en) * | 2013-12-24 | 2014-04-23 | 北京微电子技术研究所 | SRAM type FPGA single particle irradiation test system and method |
| US20180149695A1 (en) * | 2015-05-21 | 2018-05-31 | Hitachi, Ltd. | Soft error rate calculation device and calculation method for semiconductor large scale integration (lsi) |
-
2018
- 2018-11-19 CN CN201811378257.5A patent/CN109581186B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103076557A (en) * | 2012-11-30 | 2013-05-01 | 北京时代民芯科技有限公司 | Testing method of single event functional interruption of Spacewire circuit |
| CN103001636A (en) * | 2012-12-11 | 2013-03-27 | 北京时代民芯科技有限公司 | Single event effect detection method of folding interpolating-type analog-digital conversion device |
| CN103440185A (en) * | 2013-07-22 | 2013-12-11 | 西安空间无线电技术研究所 | Digital signal processing (DSP) device single particle turning effect testing method |
| CN103675546A (en) * | 2013-12-11 | 2014-03-26 | 北京时代民芯科技有限公司 | Single event effect detecting device of image sensor |
| CN103744014A (en) * | 2013-12-24 | 2014-04-23 | 北京微电子技术研究所 | SRAM type FPGA single particle irradiation test system and method |
| US20180149695A1 (en) * | 2015-05-21 | 2018-05-31 | Hitachi, Ltd. | Soft error rate calculation device and calculation method for semiconductor large scale integration (lsi) |
Non-Patent Citations (1)
| Title |
|---|
| 王忠明: ""SRAM型FPGA的单粒子效应评估技术研究"", 《中国博士学位论文全文数据库·信息科技辑》 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110988969A (en) * | 2019-11-07 | 2020-04-10 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Atmospheric neutron radiation test method, system and device |
| CN112798943A (en) * | 2021-01-16 | 2021-05-14 | 西安电子科技大学 | Real-time FPGA error detection method based on standard input and output verification |
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