CN109508266B - Method for suppressing EMI interference - Google Patents
Method for suppressing EMI interference Download PDFInfo
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- CN109508266B CN109508266B CN201811314492.6A CN201811314492A CN109508266B CN 109508266 B CN109508266 B CN 109508266B CN 201811314492 A CN201811314492 A CN 201811314492A CN 109508266 B CN109508266 B CN 109508266B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
- G06K19/00—Record carriers for use with machines and with at least a part designed to carry digital markings
- G06K19/06—Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code
- G06K19/067—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components
- G06K19/07—Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards also with resonating or responding marks without active components with integrated circuit chips
- G06K19/073—Special arrangements for circuits, e.g. for protecting identification code in memory
- G06K19/07309—Means for preventing undesired reading or writing from or onto record carriers
- G06K19/07318—Means for preventing undesired reading or writing from or onto record carriers by hindering electromagnetic reading or writing
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- Computer Hardware Design (AREA)
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- Electromagnetism (AREA)
- Computer Security & Cryptography (AREA)
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- Quality & Reliability (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses a method for inhibiting EMI interference, belonging to the technical field of electronics. The method and the device match the corresponding strategy for inhibiting the EMI interference according to the frequency range corresponding to the frequency when the EMI of the detected chip exceeds the standard by identifying the corresponding frequency when the EMI of the detected chip exceeds the standard, and execute the corresponding operation according to the strategy for inhibiting the EMI interference, thereby achieving the purposes of quickly positioning the fault and inhibiting the EMI interference of the detected chip.
Description
Technical Field
The invention relates to the technical field of electronics, in particular to a method for inhibiting EMI interference.
Background
Electronic products such as smart televisions, set-top boxes, smart speakers and the like need to pass EMI (Electro Magnetic Interference) authentication. At present, the chip integration level is higher and higher, but the EMI interference problem is difficult to deal with. Usually, when the EMI single point exceeds the standard, the problem source can be accurately positioned according to the frequency point exceeding the standard. However, it is difficult to quickly locate the source of the problem when the signal is always in an EMI overproof state in a certain frequency range.
Disclosure of Invention
Aiming at the problem that the existing EMI exceeds the standard, a method for quickly and accurately positioning faults and inhibiting EMI interference is provided.
A method for suppressing EMI interference, providing at least one frequency range, each frequency range corresponding to a strategy for suppressing EMI interference; the method for suppressing EMI interference comprises the following steps:
s1, identifying corresponding frequency when EMI of the tested chip exceeds standard;
and S2, according to the frequency range corresponding to the frequency when the EMI of the chip to be detected exceeds the standard, matching a corresponding strategy for inhibiting the EMI interference to inhibit the EMI interference of the chip to be detected.
Preferably, the at least one frequency range includes:
0MHz to 200MHz, and/or 300MHz to 1 GHz.
Preferably, in step S2, when the frequency of the measured chip EMI exceeds the standard is 0MHz to 200MHz, the strategy for suppressing EMI interference that is matched with the frequency range of 0MHz to 200MHz includes:
A1. replacing the power adapter of the chip to be tested;
A2. judging whether the frequency range of the chip to be tested exceeds the standard within the range of 0MHz-200MHz, and if not, finishing; if yes, go to step A3;
A3. and sleeving a magnetic ring on the power adapter of the chip to be tested.
Preferably, in step S2, when the frequency of the tested chip when EMI exceeds the standard is 300MHz-1GHz, the strategy for suppressing EMI interference matched with the frequency range of 300MHz-1GHz includes:
B1. turning off a power supply in a test environment;
B2. and judging whether the frequency range of the chip to be tested exceeds the standard in the range of 300MHz-1GHz, and if not, ending.
Preferably, the strategy for suppressing EMI interference further comprises:
B3. when the tested chip exceeds the standard in the frequency range of 300MHz-1GHz, sleeving a magnetic ring on the power adapter of the tested chip, or replacing the power adapter of the tested chip;
B4. and judging whether the frequency range of the chip to be tested exceeds the standard in the range of 300MHz-1GHz, and if not, ending.
Preferably, the strategy for suppressing EMI interference further comprises:
B5. when the tested chip is over-standard in the frequency range of 300MHz-1GHz, disconnecting the network line of the tested chip and/or the high-definition multimedia interface line;
B6. and judging whether the frequency range of the chip to be tested exceeds the standard in the range of 300MHz-1GHz, and if not, ending.
Preferably, the strategy for suppressing EMI interference further comprises:
B7. when the tested chip exceeds the standard in the frequency range of 300MHz-1GHz, converting the working mode of the tested chip;
B8. and judging whether the frequency range of the chip to be tested exceeds the standard in the range of 300MHz-1GHz, and if not, ending.
Preferably, the working mode of the chip under test includes: USB mode, and/or card mode, and/or ethernet mode.
Preferably, the strategy for suppressing EMI interference further comprises:
B9. and when the tested chip is out of standard in the frequency range of 300MHz-1GHz, acquiring a target position corresponding to the highest decibel of the central signal of the tested chip, and shielding the target position.
Preferably, the EMI exceeding of the tested chip means that the decibel of the tested chip exceeds the FCC PART 15 test limit standard.
The beneficial effects of the above technical scheme are that:
according to the technical scheme, the corresponding frequency when the EMI of the tested chip exceeds the standard is identified, the corresponding strategy for inhibiting the EMI interference is matched according to the frequency range corresponding to the frequency when the EMI of the tested chip exceeds the standard, and the corresponding operation is executed according to the strategy for inhibiting the EMI interference, so that the aims of quickly positioning the fault and inhibiting the EMI interference of the tested chip are fulfilled.
Drawings
FIG. 1 is a flow chart of one embodiment of a method of suppressing EMI interference in accordance with the present invention;
FIG. 2 is a graph of EMI waveforms over standard for a chip under test at a frequency range of 0MHz to 200 MHz;
FIG. 3 is a diagram of an EMI waveform over which the EMI of a chip under test exceeds the standard in the frequency range of 300MHz-1 GHz;
FIG. 4 is a diagram of an EMI waveform of a chip under test after EMI interference suppression according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict.
The invention is further described with reference to the following drawings and specific examples, which are not intended to be limiting.
As shown in fig. 1, a method for suppressing EMI interference provides at least one frequency range, each of which corresponds to a strategy for suppressing EMI interference; the method for suppressing EMI interference comprises the following steps:
s1, identifying corresponding frequency when EMI of the tested chip exceeds standard;
and S2, according to the frequency range corresponding to the frequency when the EMI of the chip to be detected exceeds the standard, matching a corresponding strategy for inhibiting the EMI interference to inhibit the EMI interference of the chip to be detected.
It should be noted that: the at least one frequency range may include:
0MHz to 200MHz, and/or 300MHz to 1 GHz.
Further, the EMI exceeding of the tested chip means that the decibel of the tested chip exceeds the FCC PART 15 test limit standard.
In the embodiment, the corresponding frequency when the EMI of the tested chip exceeds the standard is identified, the corresponding strategy for inhibiting the EMI interference is matched according to the frequency range corresponding to the frequency when the EMI of the tested chip exceeds the standard, and the corresponding operation is executed according to the strategy for inhibiting the EMI interference, so that the aims of quickly positioning the fault and inhibiting the EMI interference of the tested chip are fulfilled. In a preferred embodiment, in step S2, when the frequency of the measured chip EMI exceeds the standard is 0MHz to 200MHz, the strategy of suppressing EMI interference matched with the frequency range of 0MHz to 200MHz includes:
A1. replacing the power adapter of the chip to be tested;
A2. judging whether the frequency range of the chip to be tested exceeds the standard within the range of 0MHz-200MHz, and if not, finishing; if yes, go to step A3;
A3. and sleeving a magnetic ring on the power adapter of the chip to be tested.
It should be noted that: the power adapter is used for supplying power to the chip to be tested. To prevent EMI interference from being caused by the power adapter, the replacement power adapter may be one that passed the EMI interference test the last time or last several times. By way of example and not limitation, EMI interference may also be suppressed by way of a magnetic ring over the power adapter.
FIG. 2 is a graph showing the EMI exceeding the standard of the tested chip in the frequency range of 0MHz-200MHz, wherein a1 is the waveform curve of the EMI, a2 is the FCC PART-6dB test standard, and a3 is the FCC PART 15B test limit.
In a preferred embodiment, in the step S2, when the frequency when the measured chip EMI exceeds the standard is 300MHz-1GHz, the strategy for suppressing EMI interference matched with the frequency range of 300MHz-1GHz includes:
B1. turning off a power supply in a test environment;
B2. and judging whether the frequency range of the chip to be tested exceeds the standard in the range of 300MHz-1GHz, and if not, ending.
It should be noted that: the power supply turned off in step B1 is to turn off all power supplies except the power supply for normal power-on operation of the chip under test in the test environment, so as to achieve the purpose of ensuring that the test environment is free of interference. FIG. 3 is a graph showing the EMI exceeding the standard of the tested chip in the frequency range of 300MHz-1GHz, in which a1 shows the EMI waveform curve, a2 shows the FCC PART-6dB test standard, and a3 shows the FCC PART 15B test limit. FIG. 4 is a waveform diagram of the EMI of the tested chip after the EMI interference is suppressed by the present invention, in which a1 represents the waveform curve when the signal is normal, a2 represents the FCC PART-6dB test standard value, and a3 represents the FCC PART 15B test limit value.
In a preferred embodiment, the strategy of suppressing EMI interference further comprises:
B3. when the tested chip exceeds the standard in the frequency range of 300MHz-1GHz, sleeving a magnetic ring on the power adapter of the tested chip, or replacing the power adapter of the tested chip;
B4. and judging whether the frequency range of the chip to be tested exceeds the standard in the range of 300MHz-1GHz, and if not, ending.
In this embodiment: the power adapter is used for supplying power to the chip to be tested. To prevent EMI interference from being caused by the power adapter, the replacement power adapter may be one that passed the EMI interference test the last time or last several times. By way of example and not limitation, EMI interference may also be suppressed by way of a magnetic ring over the power adapter.
In a preferred embodiment, the strategy of suppressing EMI interference further comprises:
B5. when the tested chip is over-standard in the frequency range of 300MHz-1GHz, disconnecting the network line of the tested chip and/or a High Definition Multimedia Interface (HDMI for short);
B6. and judging whether the frequency range of the chip to be tested exceeds the standard in the range of 300MHz-1GHz, and if not, ending.
In this embodiment, the network cable, the high definition multimedia interface cable and all other peripheral unnecessary circuits of the chip under test are disconnected to prevent the situation of EMI interference caused by the peripheral circuits.
In a preferred embodiment, the strategy of suppressing EMI interference further comprises:
B7. when the tested chip exceeds the standard in the frequency range of 300MHz-1GHz, converting the working mode of the tested chip;
B8. and judging whether the frequency range of the chip to be tested exceeds the standard in the range of 300MHz-1GHz, and if not, ending.
Further, the working mode of the chip under test comprises: USB mode, and/or Card mode, and/or ethernet mode, and/or eMMC (english-language-named: Embedded Multi Media Card) mode.
In a preferred embodiment, the strategy of suppressing EMI interference further comprises:
B9. and when the tested chip is out of standard in the frequency range of 300MHz-1GHz, acquiring a target position corresponding to the highest decibel of the central signal of the tested chip, and shielding the target position.
In this embodiment, a spectrometer may be used to test the chip to be tested, find a position (i.e., a target position) corresponding to the highest decibel of the central signal of the chip to be tested, and connect the surrounding Ground (GND) with a copper foil to construct a shortest signal loop so as to shield the corresponding interference circuit.
While the invention has been described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the invention.
Claims (3)
1. A method for suppressing EMI interference, wherein at least one frequency range is provided, each frequency range corresponding to a policy for suppressing EMI interference; the method for suppressing EMI interference comprises the following steps:
s1, identifying corresponding frequency when EMI of a chip to be detected exceeds a standard;
s2, according to the frequency range corresponding to the frequency when the EMI of the chip to be tested exceeds the standard, matching a corresponding strategy for inhibiting the EMI interference to inhibit the EMI interference of the chip to be tested;
the at least one frequency range includes:
0MHz to 200MHz, and/or 300MHz to 1 GHz;
in step S2, when the frequency of the measured chip EMI exceeds the standard is 0MHz to 200MHz, the strategy of suppressing EMI interference matched with the frequency range of 0MHz to 200MHz includes:
A1. replacing the power adapter of the chip to be tested;
A2. judging whether the frequency range of the chip to be tested exceeds the standard within the range of 0MHz-200MHz, and if not, finishing; if yes, go to step A3;
A3. sleeving a magnetic ring on the power adapter of the chip to be tested;
in step S2, when the frequency of the tested chip when EMI exceeds the standard is 300MHz-1GHz, the strategy for suppressing EMI interference matched with the frequency range of 300MHz-1GHz includes:
B1. turning off a power supply in a test environment;
B2. judging whether the frequency range of the chip to be tested exceeds the standard in the range of 300MHz-1GHz, and if not, finishing;
the strategy for suppressing EMI interference matching the 300MHz-1GHz frequency range further comprises:
B3. when the tested chip exceeds the standard in the frequency range of 300MHz-1GHz, sleeving a magnetic ring on the power adapter of the tested chip, or replacing the power adapter of the tested chip;
B4. judging whether the frequency range of the chip to be tested exceeds the standard in the range of 300MHz-1GHz, and if not, finishing;
the strategy for suppressing EMI interference matching the 300MHz-1GHz frequency range further comprises:
B5. when the tested chip is over-standard in the frequency range of 300MHz-1GHz, disconnecting the network line of the tested chip and/or the high-definition multimedia interface line;
B6. judging whether the frequency range of the chip to be tested exceeds the standard in the range of 300MHz-1GHz, and if not, finishing;
the strategy for suppressing EMI interference matching the 300MHz-1GHz frequency range further comprises:
B7. when the tested chip exceeds the standard in the frequency range of 300MHz-1GHz, converting the working mode of the tested chip;
B8. judging whether the frequency range of the chip to be tested exceeds the standard in the range of 300MHz-1GHz, and if not, finishing;
the strategy for suppressing EMI interference matching the 300MHz-1GHz frequency range further comprises:
B9. and when the tested chip is out of standard in the frequency range of 300MHz-1GHz, acquiring a target position corresponding to the highest decibel of the central signal of the tested chip, and shielding the target position.
2. The method of suppressing EMI interference of claim 1, wherein the operational mode of the chip under test comprises: USB mode, and/or card mode, and/or ethernet mode.
3. The method of claim 1, wherein the EMI overproof of the dut is that the decibel of the dut exceeds the FCC PART 15 test limit standard.
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