CN109490754A - A kind of circuit board parallel test system - Google Patents
A kind of circuit board parallel test system Download PDFInfo
- Publication number
- CN109490754A CN109490754A CN201811411494.7A CN201811411494A CN109490754A CN 109490754 A CN109490754 A CN 109490754A CN 201811411494 A CN201811411494 A CN 201811411494A CN 109490754 A CN109490754 A CN 109490754A
- Authority
- CN
- China
- Prior art keywords
- circuit board
- card slot
- type card
- main body
- pedestal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses a kind of circuit board parallel test systems, including cabinet and circuit board positioning mechanism, pedestal is fixedly installed with below the cabinet, the pedestal is internally provided with cavity, strip hole is offered in the middle part of the front surface of the pedestal, at least five circuits detection main body has been mounted side by side in the inside of the cabinet, the side of the circuit detection main body is provided with probe, the circuit board positioning mechanism includes upper c-type card slot, lower c-type card slot and small sliding slot, the position that close over is leaned between adjacent two circuits detection main body is arranged in the upper c-type card slot, the position between adjacent two circuits detection main body close to lower section is arranged in the lower c-type card slot, the present invention can be parallel with multiple circuit boards, it is tested simultaneously, space is utilized to greatest extent, also avoid needing test bring trouble one by one, And the occupied area of the present apparatus is small, and ground space is saved in greatly detection workshop.
Description
Technical field
The present invention relates to circuit board technology field, specially a kind of circuit board parallel test system.
Background technique
In circuit board assembly line, test is a weakest link of the degree of automation, for circuit board
All it is to complete on transfer matic from brush tin blueness to Reflow Soldering for assembly, testing process has been had only, during automation
Only, at present in most of producing line, test is completed by hand by operator；
It is detected using the probe above jig, such detection device is merely able to one circuit board of detection every time, and one sets
It is standby to need people's manipulation, and occupation area of equipment is big.
Summary of the invention
The purpose of the present invention is to provide a kind of circuit board parallel test systems, it is intended to improve occupation area of equipment and
The low problem of testing efficiency.
The present invention is implemented as follows:
A kind of circuit board parallel test system, including cabinet and circuit board positioning mechanism are fixedly installed with below the cabinet
Pedestal, the pedestal are internally provided with cavity, offer strip hole, the inside of the cabinet in the middle part of the front surface of the pedestal
At least five circuits detection main body is mounted side by side, the side of the circuit detection main body is provided with probe, and the circuit board is fixed
Position mechanism includes upper c-type card slot, lower c-type card slot and small sliding slot, and adjacent two circuits detection is arranged in the upper c-type card slot
The position of close over is leaned between main body, the lower c-type card slot is arranged between adjacent two circuits detection main body close to lower section
Position, the upper c-type card slot and lower c-type card slot are opened far from connecting rod, the small sliding slot is fixedly connected between the side of probe
It is located at the upper surface of pedestal, and small sliding slot is located between adjacent two circuits detection main body, the lower surface of the lower c-type card slot
Middle part is fixed with small slide block, and the lower end of the small slide block passes through small sliding slot, and fixed peace between the lower end of at least five small slide blocks
Equipped with big sliding block, and big sliding block is located at the bottom inner surface of cavity.
Further, the side of the cabinet is provided with switch button, and the outer surface of switch button is provided with rubber layer.
Further, test is installed not by alarm in the front surface of the cabinet, and test does not pass through alarm
Number and circuit the detection number of main body it is identical.
Further, it is corresponding not detect the position of main body with circuit by the position of alarm for the test.
Further, connecting column, and the one end of connecting column far from big sliding block are installed in the middle part of the front surface of the big sliding block
Across strip hole.
Further, one end that the connecting column passes through strip hole is equipped with handle, and the outer surface of handle is provided with rubber
Glue-line.
Compared with prior art, it the beneficial effects of the present invention are: the 1, present invention can be parallel with multiple circuit boards, carries out simultaneously
Test, is utilized space to greatest extent, also avoids needing test bring trouble one by one, and testing efficiency is high, and
And the occupied area of the present apparatus is small, ground space is saved in greatly detection workshop；
2, provided with the C-shaped channel that can be moved, allow circuit board feeding first in C-shaped channel, then carry out again and probe
Contact, so that test is accurate.
Detailed description of the invention
It, below will be to use required in embodiment in order to illustrate more clearly of the technical solution of embodiment of the present invention
Attached drawing be briefly described, it should be understood that the following drawings illustrates only certain embodiments of the present invention, therefore is not to be seen as
It is the restriction to range, it for those of ordinary skill in the art, without creative efforts, can be with root
Other relevant attached drawings are obtained according to these attached drawings.
Fig. 1 is schematic diagram of internal structure of the invention；
Fig. 2 is main view of the invention；
Fig. 3 is the exploded view of circuit board positioning mechanism of the present invention.
In figure: 1, cabinet；2, switch button；3, test does not pass through alarm；4, circuit board positioning mechanism；41, upper c-type card
Slot；42, connecting rod；43, lower c-type card slot；44, small slide block；45, big sliding block；46, handle；47, small sliding slot；48, connecting column；5, it visits
Needle；6, circuit detects main body；7, pedestal；71, cavity；72, strip hole.
Specific embodiment
To keep the purposes, technical schemes and advantages of embodiment of the present invention clearer, implement below in conjunction with the present invention
The technical solution in embodiment of the present invention is clearly and completely described in attached drawing in mode, it is clear that described reality
The mode of applying is some embodiments of the invention, rather than whole embodiments.Based on the embodiment in the present invention, ability
Domain those of ordinary skill every other embodiment obtained without creative efforts, belongs to the present invention
The range of protection.Therefore, the detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit below and is wanted
The scope of the present invention of protection is sought, but is merely representative of selected embodiment of the invention.Based on the embodiment in the present invention,
Every other embodiment obtained by those of ordinary skill in the art without making creative efforts belongs to this
Invent the range of protection.
In the description of the present invention, it is to be understood that, term " center ", " longitudinal direction ", " transverse direction ", " length ", " width ",
" thickness ", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outside", " up time
The orientation or positional relationship of the instructions such as needle ", " counterclockwise " is to be based on the orientation or positional relationship shown in the drawings, and is merely for convenience of
The description present invention and simplified description, rather than the equipment of indication or suggestion meaning or element must have a particular orientation, with spy
Fixed orientation construction and operation, therefore be not considered as limiting the invention.
In addition, term " first ", " second " are used for descriptive purposes only and cannot be understood as indicating or suggesting relative importance
Or implicitly indicate the quantity of indicated technical characteristic.Define " first " as a result, the feature of " second " can be expressed or
Implicitly include one or more of the features.In the description of the present invention, the meaning of " plurality " is two or more,
Unless otherwise specifically defined.
In the present invention unless specifically defined or limited otherwise, term " installation ", " connected ", " connection ", " fixation " etc.
Term shall be understood in a broad sense, for example, it may be being fixedly connected, may be a detachable connection, or integral；It can be mechanical connect
It connects, is also possible to be electrically connected；It can be directly connected, can also can be in two elements indirectly connected through an intermediary
The interaction relationship of the connection in portion or two elements.It for the ordinary skill in the art, can be according to specific feelings
Condition understands the concrete meaning of above-mentioned term in the present invention.
In the present invention unless specifically defined or limited otherwise, fisrt feature second feature "upper" or "lower"
It may include that the first and second features directly contact, also may include that the first and second features are not direct contacts but pass through it
Between other characterisation contact.Moreover, fisrt feature includes the first spy above the second feature " above ", " above " and " above "
Sign is right above second feature and oblique upper, or is merely representative of first feature horizontal height higher than second feature.Fisrt feature exists
Second feature " under ", " lower section " and " following " include that fisrt feature is directly below and diagonally below the second feature, or is merely representative of
First feature horizontal height is less than second feature.
Embodiment 1, shown in referring to Fig.1,2 and 3, a kind of circuit board parallel test system, including cabinet 1 and circuit board positioning
Mechanism 4, the side of cabinet 1 are provided with switch button 2, and whether switch button 2 carries out energization inspection for control circuit detection main body 6
It surveys, and the outer surface of switch button 2 is provided with rubber layer, the lower section of cabinet 1 is fixedly installed with pedestal 7, the inside setting of pedestal 7
There is cavity 71, cavity 71 offers strip hole 72 in the middle part of the front surface of pedestal 7, strip hole 72 is used for for accommodating big sliding block 45
Connecting column 48 is accommodated, at least five circuits detection main body 6 has been mounted side by side in the inside of cabinet 1, and circuit detection main body 6 plays detection
The side of dissection, circuit detection main body 6 is provided with probe 5, and probe 5 is directly contacted with circuit board, plays the role of detection, electricity
Road board positioning mechanism 4 includes upper c-type card slot 41, lower c-type card slot 43 and small sliding slot 47, and being arranged in for upper c-type card slot 41 is adjacent
The position of close over is leaned between two circuit detection main bodys 6, adjacent two circuits detection main body 6 is arranged in lower c-type card slot 43
Between close to the position of lower section, c-type card slot 41 and lower c-type card slot 43 are positioned, upper C for blocking circuit board to circuit board
Connecting rod 42 is fixedly connected between type card slot 41 and lower 43 side far from probe 5 of c-type card slot, connecting rod 42 is for connecting c-type
Card slot 41 and lower c-type card slot 43, so that upper c-type card slot 41 is integrated with lower c-type card slot 43, small sliding slot 47 is provided with pedestal 7
Upper surface, small sliding slot 47 is for accommodating small slide block 44, and small sliding slot 47 is located between adjacent two circuits detection main body 6, lower C
It is fixed with small slide block 44 in the middle part of the lower surface of type card slot 43, small slide block 44 can drive c-type card slot in small 47 internal motion of sliding slot
To drive circuit board motion, the lower end of small slide block 44 passes through small sliding slot 47 for movement, and the lower end of at least five small slide blocks 44 it
Between be fixedly installed with big sliding block 45, big sliding block 45 is for connecting each small slide block 44, and big sliding block 45 is located at the inside of cavity 71
Lower surface, the front surface middle part of big sliding block 45 is equipped with connecting column 48, and connecting column 48 passes through length far from one end of big sliding block 45
Hole 72, one end that connecting column 48 passes through strip hole 72 are equipped with handle 46, push handle 46 that can make big cunning by left and right
Block 45 realizes the movement of each small slide block 44 in 71 internal motion of cavity, and the outer surface of handle 46 is provided with rubber layer, cabinet
Test is installed not by alarm 3 in 1 front surface, and tests and main body 6 is not detected by the number of alarm 3 and circuit
Number is identical, and test is not corresponding with the circuit detection position of main body 6 by the position of alarm 3, when circuit board is unqualified, surveys
Examination by alarm sounding, does not remind people's circuit board unqualified.
Working principle: by pushing handle 46, so that handle 46 moves downward, so that handle 46 drives big sliding block 45 to the left
Movement, big sliding block 45 drives c-type card slot to move downward by driving small slide block 44 to move downward, so that lower c-type card slot
43 is whole far from probe 5 with upper c-type card slot, at this time by the inside of each circuit board insertion c-type card slot for needing to detect, then passes through
Handle 46 is pushed to the right, so that c-type card slot drives circuit board to move right, until circuit board contacts probe 5, presses lower switch at this time
Button 2, so that circuit detection main body 6 works, probe 5 can be detected at this time, when detecting against regulation, corresponding electricity
Detection above the plate of road does not pass through 3 sounding of alarm, reminds people's circuit board unqualified.
The device obtained by above-mentioned design has been able to satisfy the use of circuit parallel test macro substantially, but in line with further
The objective of its function is improved, designer has carried out further improvement to the device.
The foregoing is merely the preferred embodiment of the present invention, are not intended to restrict the invention, for this field
For technical staff, the invention may be variously modified and varied.All within the spirits and principles of the present invention, made any
Modification, equivalent replacement, improvement etc., should all be included in the protection scope of the present invention.
Claims (6)
1. a kind of circuit board parallel test system, including cabinet (1) and circuit board positioning mechanism (4), it is characterised in that: the machine
It is fixedly installed with below case (1) pedestal (7), the pedestal (7) is internally provided with cavity (71), before the pedestal (7)
Surface middle part offers strip hole (72), and at least five circuits detection main body (6) has been mounted side by side in the inside of the cabinet (1),
The side of circuit detection main body (6) is provided with probe (5), and the circuit board positioning mechanism (4) includes upper c-type card slot
(41), adjacent two circuits detection master is arranged in lower c-type card slot (43) and small sliding slot (47), the upper c-type card slot (41)
The position of close over is leaned between body (6), the lower c-type card slot (43) is arranged between adjacent two circuits detection main body (6)
Close to the position of lower section, it is fixedly connected between the upper c-type card slot (41) and the side of lower c-type card slot (43) separate probe (5)
Have connecting rod (42), the small sliding slot (47) is provided with the upper surface of pedestal (7), and small sliding slot (47) is located at two adjacent circuits
It detects between main body (6), is fixed with small slide block (44) in the middle part of the lower surface of the lower c-type card slot (43), the small slide block (44)
Lower end pass through small sliding slot (47), and big sliding block (45) are fixedly installed between the lower end of at least five small slide blocks (44), and big
Sliding block (45) is located at the bottom inner surface of cavity (71).
2. a kind of circuit board parallel test system according to claim 1, which is characterized in that the side of the cabinet (1)
It is provided with switch button (2), and the outer surface of switch button (2) is provided with rubber layer.
3. a kind of circuit board parallel test system according to claim 1, which is characterized in that the preceding table of the cabinet (1)
Test is installed not by alarm (3) on face, and tests not number and the circuit detection main body (6) by alarm (3)
Number is identical.
4. a kind of circuit board parallel test system according to claim 3, which is characterized in that the test does not pass through alarm
The position of device (3) is corresponding with the circuit detection position of main body (6).
5. a kind of circuit board parallel test system according to claim 1, which is characterized in that before the big sliding block (45)
Surface middle part is equipped with connecting column (48), and connecting column (48) passes through strip hole (72) far from the one end of big sliding block (45).
6. a kind of circuit board parallel test system according to claim 5, which is characterized in that the connecting column (48) passes through
One end of strip hole (72) is equipped with handle (46), and the outer surface of handle (46) is provided with rubber layer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811411494.7A CN109490754B (en) | 2018-11-24 | 2018-11-24 | Circuit board parallel test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811411494.7A CN109490754B (en) | 2018-11-24 | 2018-11-24 | Circuit board parallel test system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109490754A true CN109490754A (en) | 2019-03-19 |
| CN109490754B CN109490754B (en) | 2021-03-09 |
Family
ID=65697803
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811411494.7A Active CN109490754B (en) | 2018-11-24 | 2018-11-24 | Circuit board parallel test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109490754B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110211359A (en) * | 2019-06-28 | 2019-09-06 | 宁波三星医疗电气股份有限公司 | A kind of mould group terminal |
Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1983990A (en) * | 2006-05-11 | 2007-06-20 | 华为技术有限公司 | Parallel testing method and system |
| CN201035105Y (en) * | 2007-04-05 | 2008-03-12 | 深圳欣康基因数码科技有限公司 | Chip sampling device and chip reading device using the same |
| US7472321B2 (en) * | 2004-07-15 | 2008-12-30 | Samsung Electronics Co., Ltd. | Test apparatus for mixed-signal semiconductor device |
| CN101689522A (en) * | 2007-06-29 | 2010-03-31 | 爱德万测试株式会社 | Testing apparatus |
| US20120187973A1 (en) * | 2010-05-20 | 2012-07-26 | Advantest Corporation | Test apparatus |
| CN102998613A (en) * | 2012-11-26 | 2013-03-27 | 李文海 | Test system and method capable of realizing parallel testing of circuit board |
| CN103091623A (en) * | 2013-01-18 | 2013-05-08 | 宁波三星电气股份有限公司 | Final circular test (FCT) multi-station test machine |
| CN103412250A (en) * | 2013-07-24 | 2013-11-27 | 昆山迈致治具科技有限公司 | PCB limiting and testing fixture |
| US20140070828A1 (en) * | 2012-09-10 | 2014-03-13 | John W. Andberg | Method and apparatus for massively parallel multi-wafer test |
| CN203929806U (en) * | 2014-06-20 | 2014-11-05 | 浙江智联电子有限公司 | Multistation circuit board test casing |
| CN104678276A (en) * | 2013-11-28 | 2015-06-03 | 英业达科技有限公司 | Modularized chip multiple-pin simultaneous test system and method thereof |
| CN205484697U (en) * | 2016-03-08 | 2016-08-17 | 烽火通信科技股份有限公司 | A test box for test circuit board |
| CN207895035U (en) * | 2017-12-28 | 2018-09-21 | 重庆市中光电显示技术有限公司 | The two-sided rapid detection tool of circuit board |
-
2018
- 2018-11-24 CN CN201811411494.7A patent/CN109490754B/en active Active
Patent Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7472321B2 (en) * | 2004-07-15 | 2008-12-30 | Samsung Electronics Co., Ltd. | Test apparatus for mixed-signal semiconductor device |
| CN1983990A (en) * | 2006-05-11 | 2007-06-20 | 华为技术有限公司 | Parallel testing method and system |
| CN201035105Y (en) * | 2007-04-05 | 2008-03-12 | 深圳欣康基因数码科技有限公司 | Chip sampling device and chip reading device using the same |
| CN101689522A (en) * | 2007-06-29 | 2010-03-31 | 爱德万测试株式会社 | Testing apparatus |
| US20120187973A1 (en) * | 2010-05-20 | 2012-07-26 | Advantest Corporation | Test apparatus |
| US20140070828A1 (en) * | 2012-09-10 | 2014-03-13 | John W. Andberg | Method and apparatus for massively parallel multi-wafer test |
| CN102998613A (en) * | 2012-11-26 | 2013-03-27 | 李文海 | Test system and method capable of realizing parallel testing of circuit board |
| CN103091623A (en) * | 2013-01-18 | 2013-05-08 | 宁波三星电气股份有限公司 | Final circular test (FCT) multi-station test machine |
| CN103412250A (en) * | 2013-07-24 | 2013-11-27 | 昆山迈致治具科技有限公司 | PCB limiting and testing fixture |
| CN104678276A (en) * | 2013-11-28 | 2015-06-03 | 英业达科技有限公司 | Modularized chip multiple-pin simultaneous test system and method thereof |
| CN203929806U (en) * | 2014-06-20 | 2014-11-05 | 浙江智联电子有限公司 | Multistation circuit board test casing |
| CN205484697U (en) * | 2016-03-08 | 2016-08-17 | 烽火通信科技股份有限公司 | A test box for test circuit board |
| CN207895035U (en) * | 2017-12-28 | 2018-09-21 | 重庆市中光电显示技术有限公司 | The two-sided rapid detection tool of circuit board |
Non-Patent Citations (1)
| Title |
|---|
| 王怡苹 等: "并行自动测试系统中测试资源控制方法研究", 《计算机测量与控制》 * |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110211359A (en) * | 2019-06-28 | 2019-09-06 | 宁波三星医疗电气股份有限公司 | A kind of mould group terminal |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109490754B (en) | 2021-03-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101587149B (en) | Impedance test device | |
| JP4679244B2 (en) | Contact terminal for measurement, measurement device, probe card set, and wafer prober device | |
| US20160349037A1 (en) | Target Material Thickness Measuring Apparatus | |
| JP5033634B2 (en) | Electrical connection device | |
| US20090251161A1 (en) | Module for Test Device for Testing Circuit Boards | |
| WO2023092674A1 (en) | Testing device | |
| JP2008309786A (en) | Probe, probe assembly, and probe card including same | |
| CN110031748A (en) | Integrated circuit component test device and test method | |
| CN109490754A (en) | A kind of circuit board parallel test system | |
| CN108534667B (en) | Multi-point triggered flatness error detection device | |
| CN206515413U (en) | A kind of FPC wireline tests switching device | |
| US2476943A (en) | Electrical apparatus for measuring metal thicknesses | |
| CN108601561B (en) | Test paper strip discharging device for blood glucose meter | |
| CN208506083U (en) | Three Degree Of Freedom detection device | |
| WO1999034228A1 (en) | Kelvin contact-type testing device | |
| CN210464653U (en) | Durability detection device of high stability electronic scale keyboard | |
| CN103412173A (en) | Mobile phone PCB voltage testing jig | |
| JP2014202907A (en) | Planar display device and inspection method of the same | |
| KR200457028Y1 (en) | Probe apparatus | |
| CN113093417B (en) | Measuring device | |
| US7902850B2 (en) | Versatile materials probe | |
| US7924030B2 (en) | Test pattern for analyzing capacitance of interconnection line | |
| CN101241160B (en) | Electronic components test seat detection device and its detection method | |
| CN106575186A (en) | Capacitive touch sensor and method | |
| CN208537653U (en) | Touch screen automatic test equipment |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP02 | Change in the address of a patent holder |
Address after: 215000 1 / F, building 3, No.8, Yangyun Road, Suzhou Industrial Park, Jiangsu Province Patentee after: SUZHOU EXCELTECH ELECTRONICS Co.,Ltd. Address before: 215000 13 Shuxiang Road, Yuanhe street, Xiangcheng District, Suzhou City, Jiangsu Province Patentee before: SUZHOU EXCELTECH ELECTRONICS Co.,Ltd. |
|
| CP02 | Change in the address of a patent holder |