CN109490197A - Circular specimen cross cut test device - Google Patents

Circular specimen cross cut test device Download PDF

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Publication number
CN109490197A
CN109490197A CN201811590999.4A CN201811590999A CN109490197A CN 109490197 A CN109490197 A CN 109490197A CN 201811590999 A CN201811590999 A CN 201811590999A CN 109490197 A CN109490197 A CN 109490197A
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China
Prior art keywords
circular specimen
cross cut
scriber
cut test
hua
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CN201811590999.4A
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Chinese (zh)
Inventor
夏雨
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UNITED TESTING SERVICES (JIANGSU) Co Ltd
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UNITED TESTING SERVICES (JIANGSU) Co Ltd
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Priority to CN201811590999.4A priority Critical patent/CN109490197A/en
Publication of CN109490197A publication Critical patent/CN109490197A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N19/00Investigating materials by mechanical methods
    • G01N19/04Measuring adhesive force between materials, e.g. of sealing tape, of coating

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

The present invention provides a kind of circular specimen cross cut test devices, it include: the fixed mechanism of rotatable circular specimen, it is characterized in that, guiding mechanism is set on the outside of the fixed mechanism, the Hua Ge mechanism that setting is slided along the guide direction of guiding mechanism on the guiding mechanism.The device can be applicable in the circular specimen of different-diameter, it is ensured that test the scratch depth of cross cut test uniformly and can be controlled, scratch spacing accuracy is accurate, can save the working time for high-volume sample, improves working efficiency.

Description

Circular specimen cross cut test device
Technical field
The present invention relates to the cross cut test technical fields of circular specimen, draw lattice examination in particular to a kind of circular specimen Experiment device.
Background technique
Cross-hatching, which refers to, to be detached from from ground to evaluate coating when being penetrated with cartesian mesh pattern cut coating to ground A kind of test method of resistance.Film to ground, which is cut, using cutting tool forms different shape (grid-shaped or X-shape) stroke Trace, then torn after being adhered to adhesive tape, it checks the peeling conditions of coating, is then graded for it to the adhesion condition of film " cross-hatching ".Paint film lattice drawing instrument carries out a variety of different scratch resistances and the wound test of anti-quarter with coating surface for painting, to measure oil The adhesion performance of paint and coating.Paint film lattice drawing instrument be mainly used for laboratory and it is various under the conditions of construction site organic coating draw The measurement of lattice method adhesive force.The paint film lattice drawing instrument being commonly used is mostly handle type design, and existing paint film lattice drawing instrument exists such as Lower deficiency: it firstly, drawing lattice instrument cutter head by the phenomenon that handle degree is influenced, is easy to produce discontinuity is held, influences to adhere to The effect of power test;Secondly, the knife edge part of existing paint film lattice drawing instrument is easily worn, service life is shorter;Moreover, cutter head cost Height, it is at high cost needed for replacement.
According to the code test criterion of ASTM/D3359 tape method testing coating adhesive force, ENISO2409 coating-coated mesh Lattice cutting test, VDA621-411 paint adhesion, GB/T9286-1998 paint and varnish paint film cross cut test these mark Standard, current paint film lattice drawing instrument are primarily adapted for use in the cross cut test of planar sample, can not carry out the cross cut test of circular specimen.Just Because the device of cross cut test can only carry out on plane sample in the prior art, circular specimen can not be carried out to draw lattice, it can only Lattice are drawn manually, and the scratch depth of cross cut test is uneven, scratch spacing accuracy inaccuracy, batch samples need to be tested When the working time it is longer, working efficiency is low, the present invention therefore.
Summary of the invention
The present invention is intended to provide a kind of circular specimen cross cut test device, to solve the problems of the prior art.
To achieve the goals above, according to an aspect of the invention, there is provided a kind of circular specimen cross cut test device, Fixed mechanism including rotatable circular specimen, which is characterized in that guiding mechanism, the guiding are set on the outside of the fixed mechanism The Hua Ge mechanism slided along the guide direction of guiding mechanism is set in mechanism.
The fixed mechanism of the fixed circular specimen of the present invention can rotate to any angle, can satisfy the song of circular specimen Face feature and stroke lattice requirement, as long as Hua Ge mechanism is abutted with circular specimen according to test request, rotation fixed mechanism be can be realized The circumference of circular specimen draws lattice;And in another dimension, lattice are drawn by guiding mechanism guiding by Hua Ge mechanism, are thus able to satisfy paint The hundred lattice requirement of film.
Further technical solution is that the fixed mechanism includes horizonal base plate, on the horizonal base plate fixed setting with Index dial is arranged in the fixed plate in horizonal base plate vertical fixed plate, and the index dial is provided with for fixing circular specimen Clamping part, the indexing positioning region for determining index dial rotation angle and for driving clamping part to clamp or unclamp round examination The driving section of sample.
Circular specimen of the invention is to be clamped using index dial, index positioning and rotation, and index dial is by workpiece clamp It holds on chuck or two top, and makes the machine tool accessories of its rotation, indexing and positioning.It can be divided by its transmission, indexing form Worm gear pair index dial, scale index dial, porose disc index dial, slotted disk index dial, end-toothed disc scale division disk and other index dials (including electricity Feel index dial and grating index dial).Omnipotent index dial, half omnipotent index dial, equation graduation disk can be divided by its function.By its knot Configuration formula has vertical sleeping index dial, the index dial that can incline, overarm index dial again.
Further technical solution is that the guiding mechanism includes the line slide rail being arranged on horizonal base plate, described straight The setting of line sliding rail lower end is for marking the graduation mark drawing case and setting;The Hua Ge mechanism is arranged on line slide rail, and along straight line The guide direction of sliding rail is slided.
Further technical solution is that the Hua Ge mechanism includes the locking pedestal of flexible scriber and the flexible scriber of placement, The scriber through-hole for placing flexible scriber is opened up on the locking pedestal, and locking knob is set on the outside of the scriber through-hole.
Further technical solution is that the locking pedestal lower end is provided with the scriber pointer close to graduation mark, when a stroke lattice When mechanism is slided along the guide direction of line slide rail, the initial position of the scriber pointer instruction Hua Ge mechanism level sliding The ultimate position and.
Circular specimen cross cut test device of the present invention can carry out circular specimen draw lattice, can be adapted for bike rack and The cross cut test of the components such as automobile support and other field.Circular specimen cross cut test device of the present invention can be to circular specimen Carry out cross cut test, and cross cut test scratch depth uniformly and can be controlled, scratch spacing accuracy is accurate, for big Sample batches can save the working time, improve working efficiency.
When circular specimen cross cut test device of the present invention carries out cross cut test for the circular specimen of different-diameter, this is used Device, it is ensured that test the scratch depth of cross cut test uniformly and can be controlled, scratch spacing accuracy is accurate, for big Sample batches can save the working time, improve working efficiency.
Detailed description of the invention
The Figure of description for constituting a part of the invention is used to provide further understanding of the present invention, and of the invention shows Examples and descriptions thereof are used to explain the present invention for meaning property, does not constitute improper limitations of the present invention.In the accompanying drawings:
Fig. 1 shows the structural representation for the circular specimen cross cut test device that a kind of exemplary embodiment of the present invention proposes Figure.
Fig. 2 shows a kind of another structural representations of circular specimen cross cut test device that exemplary embodiment proposes of the invention Figure.
Specific embodiment
It is noted that following detailed description is all illustrative, it is intended to provide further instruction to the present invention.Unless another It indicates, all technical and scientific terms used herein has usual with general technical staff of the technical field of the invention The identical meanings of understanding.
It should be noted that term used herein above is merely to describe specific embodiment, and be not intended to restricted root According to exemplary embodiments of the present invention.As used herein, unless the context clearly indicates otherwise, otherwise singular Also it is intended to include plural form, additionally, it should be understood that, when in the present specification using term "comprising" and/or " packet Include " when, indicate existing characteristics, step, operation, device, component and/or their combination.
It should be noted that description and claims of this specification and term " first " in above-mentioned attached drawing, " Two " etc. be to be used to distinguish similar objects, without being used to describe a particular order or precedence order.It should be understood that using in this way Data be interchangeable under appropriate circumstances, so that embodiments of the present invention described herein for example can be in addition to herein Sequence other than those of diagram or description is implemented.In addition, term " includes " and " having " and their any deformation, it is intended that Be to cover it is non-exclusive include, for example, containing the process, method, system, product or equipment of a series of steps or units not Those of be necessarily limited to be clearly listed step or unit, but may include be not clearly listed or for these processes, side The intrinsic other step or units of method, product or equipment.
For ease of description, spatially relative term can be used herein, as " ... on ", " ... top ", " ... upper surface ", " above " etc., for describing such as a component shown in the figure or module or feature and other The spatial relation of component or module or feature.It should be understood that spatially relative term be intended to comprising in addition to component or Different direction in use or operation except orientation of person's module described in figure.For example, if component in attached drawing Perhaps module is squeezed, be described as " above other component or module or construction " or " in other component or module or On construction " component or module after will be positioned as " below other component or module or construction " or " at other Under component or module or construction ".Thus, exemplary term " ... top " may include " ... top " and " in ... lower section " two kinds of orientation.The component or module can also be positioned with other different modes (to be rotated by 90 ° or in other Orientation), and respective explanations are made to the opposite description in space used herein above.
As background technique is introduced, the device of prior art cross cut test can only carry out on plane sample, can not Circular specimen is carried out to draw lattice, lattice can only be drawn manually, and the scratch depth of cross cut test is uneven, scratch spacing accuracy is inaccurate Really, the working time is longer when batch samples need to be tested, and working efficiency is low, and the present invention provides a kind of circular specimens to draw lattice Experimental rig solves these problems in the prior art.
A specific embodiment of the invention provides a kind of circular specimen cross cut test device, comprising: rotatable round examination The fixed mechanism of sample, which is characterized in that guiding mechanism is set on the outside of the fixed mechanism, and setting is along guiding on the guiding mechanism The Hua Ge mechanism that the guide direction of mechanism is slided.
The working principle of the invention is:
The fixed mechanism of rotatable circular specimen rotates circular specimen, and circular specimen is abutted with Hua Ge mechanism, round in this way Sample cross cut test device can carry out annular to circular specimen and draw lattice, and on the other hand, Hua Ge mechanism carries out on guiding mechanism Level sliding, the cooperation of such guiding mechanism and Hua Ge mechanism, circular specimen cross cut test device may be implemented in horizontal direction Draw lattice, and cross cut test scratch depth uniformly and can be controlled, scratch spacing accuracy is accurate, for high-volume try Sample can save the working time, improve working efficiency.
Fixed mechanism of the invention selectes index dial, and for example interior pawl of index dial clamping part can be adjusted by driving section, energy Adapt to the hundred lattice test of the circular specimen of various specifications;Hua Ge mechanism is moved by guiding mechanism such as line slide rail to be slided, and is realized and circle The scribing line function of the axis parallel direction of shape sample;From another angle, by rotation-indexing table, flexible scriber realization circumference is controlled The scribing line function in direction;Circular specimen thus may be implemented draws lattice (test of hundred lattice).
Fixed mechanism selectes index dial, and the fixed angle of the selected rotation in positioning region, control can also be indexed by index dial With the spacing of the scribing line adjacent scribe of the axis parallel direction of circular specimen;It, can by the cooperation of Hua Ge mechanism and guiding mechanism To control the spacing with the scribing line adjacent scribe of the circumferencial direction of circular specimen, and flexible scriber and circle test bay away from adjustment The scratch depth of adjustable difference film thickness.
When circular specimen cross cut test device can carry out cross cut test for the circular specimen of different-diameter in this way, use The device, it is ensured that it tests the scratch depth of cross cut test uniformly and can be controlled, scratch spacing accuracy is accurate, for High-volume sample can save the working time, improve working efficiency.
Embodiment
As depicted in figs. 1 and 2, the circular specimen cross cut test device, the fixed mechanism including rotatable circular specimen 10, Guiding mechanism 4 is set on the outside of the fixed mechanism, and setting is slided along the guide direction of guiding mechanism on the guiding mechanism Hua Ge mechanism 5.
The fixed mechanism includes horizonal base plate 1, and the fixation vertical with horizonal base plate is fixedly installed on the horizonal base plate Plate 2, is arranged index dial 3 in the fixed plate, and the index dial is provided with clamping part 31 for fixing circular specimen, for true Calibration spiral gyration indexing positioning region 32 and for drive clamping part clamp or unclamp circular specimen driving section.
The guiding mechanism includes the line slide rail 41 being arranged on horizonal base plate, and the line slide rail lower end setting is used for Label draws the graduation mark 42 that case is set;The Hua Ge mechanism is arranged on line slide rail, and along the guide direction of line slide rail into Row sliding.
The Hua Ge mechanism includes flexible scriber 51 and the locking pedestal 52 for placing flexible scriber, is opened on the locking pedestal If the scriber through-hole 53 for placing flexible scriber, locking knob is set on the outside of the scriber through-hole.The locking pedestal lower end It is provided with the scriber pointer 54 close to graduation mark, when Hua Ge mechanism is slided along the guide direction of line slide rail, described stroke Needle pointer indicates the initial position and ultimate position of Hua Ge mechanism level sliding.
Clamping part is pawl in index dial, can be adjusted, be adapted to various by driving section at a distance from indexing disk center Hundred lattice of the circular specimen of specification are tested;It is abutted by rotation-indexing table, the flexible scriber of control with circular specimen, realizes circumference side To scribing line function;And by the Hua Ge mechanism on mobile line slide rail, realize stroke with the axis parallel direction of circular specimen Line function.
The indexing positioning region of fixed mechanism controls side parallel with the axis of circular specimen by indexing disc spins fixed angle To adjacent scribe spacing;And adjust pressure, the angle adjustable difference paint film of Hua Ge mechanism flexible scriber and circular specimen The scratch depth of thickness.
The calculation formula of specific scratch spacing is as follows:
L=n × π × r/180=α × r;
Wherein l indicates scratch spacing, and n is central angle;π is pi, and r is the radius of circular specimen;α is central angle radian Number.I.e. in the circle that radius is r because 360 ° of central angle pair arc length be equal to circumference C=2 × π × r, n ° Central angle pair arc length be l=n ° × 2 × π × r/360 °=n × π × r ÷ 180.
When specifically being tested, first then pawl in adjusting index dial, the round test sample of installation use pawl in index dial Clamping clamps;Then flexible scriber is adjusted at a distance from test sample, is adjusted flexible scriber and is adjusted at a distance from test sample The scratch depth of different film thickness.
Then axial scribing line is completed, by the skidding distance of mobile line slide rail Shang Hua lattice mechanism, completes first axial direction Scribing line;The spacing (l=n ° of x2 π r/360 °) axially crossed is controlled by rotation-indexing table angle, is determined after rotating to next angle Lattice are completed Article 2 and are axially crossed by the skidding distance of mobile line slide rail Shang Hua lattice mechanism;And so on, complete test It is required that axial scribing line.
Finally complete circumference scribing line.Hua Ge mechanism is fixed on the line slide rail of guiding mechanism, it can be by locking machine The similar mechanism such as structure is locked, and completing the scribing line of circumferencial direction by rotation-indexing table, the flexible scriber of control is first Circumference scribing line.Then locking mechanism is unclamped, mobile Hua Ge mechanism draws case to second circumference and sets, locks Hua Ge mechanism, pass through Rotation-indexing table controls scribing line, that is, Article 2 circumference scribing line that flexible scriber completes circumferencial direction.And so on, it completes test and wants The circumference scribing line asked.
After the completion of scribing line axial in this way and circumference scribing line all, cross cut test is completed.In the present embodiment in Hua Ge mechanism Flexible scriber can be one, be also possible to a row, and scribing line axial in this way and circumference scribing line, can be disposable without individually drawing lattice At several axially scribing line or scribing line of several circumference.
Cross cut test device of the invention can carry out cross cut test, and the scratch depth of cross cut test to circular specimen It uniformly and can be controlled, scratch spacing accuracy is accurate, can save the working time for high-volume sample, improves work effect Rate.Pawl is adapted to the circular specimen of different-diameter in index dial, this sample device is adapted to the circular specimen of different-diameter Cross cut test is carried out, the device is used, it is ensured that tests the scratch depth of cross cut test uniformly and can be controlled, scratch Spacing accuracy is accurate, can save the working time for high-volume sample, improves working efficiency.
The foregoing is only a preferred embodiment of the present invention, is not intended to restrict the invention, for the skill of this field For art personnel, the invention may be variously modified and varied.All within the spirits and principles of the present invention, made any to repair Change, equivalent replacement, improvement etc., should all be included in the protection scope of the present invention.

Claims (5)

1. a kind of circular specimen cross cut test device, the fixed mechanism including rotatable circular specimen, which is characterized in that described solid Determine that guiding mechanism is arranged on the outside of mechanism, setting draws lattice machine along what the guide direction of guiding mechanism was slided on the guiding mechanism Structure.
2. circular specimen cross cut test device according to claim 1, which is characterized in that
The fixed mechanism includes horizonal base plate, and the fixed plate vertical with horizonal base plate, institute are fixedly installed on the horizonal base plate It states and index dial is set in fixed plate, the index dial is provided with clamping part for fixing circular specimen, for determining index dial Rotate the indexing positioning region of angle and for driving clamping part to clamp or unclamp the driving section of circular specimen.
3. circular specimen cross cut test device according to claim 2, which is characterized in that
The guiding mechanism includes the line slide rail being arranged on horizonal base plate, and the line slide rail lower end setting is drawn for marking The graduation mark that case is set;The Hua Ge mechanism setting is slided on line slide rail, and along the guide direction of line slide rail.
4. circular specimen cross cut test device according to claim 3, which is characterized in that
The Hua Ge mechanism includes flexible scriber and the locking pedestal for placing flexible scriber, is opened up on the locking pedestal for pacifying The scriber through-hole of contracting scriber is extended, locking knob is set on the outside of the scriber through-hole.
5. circular specimen cross cut test device according to claim 4, which is characterized in that
The locking pedestal lower end is provided with the scriber pointer close to graduation mark, when Hua Ge mechanism is along the guide direction of line slide rail When being slided, the initial position and ultimate position of the scriber pointer instruction Hua Ge mechanism level sliding.
CN201811590999.4A 2018-12-25 2018-12-25 Circular specimen cross cut test device Pending CN109490197A (en)

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Application Number Priority Date Filing Date Title
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111122432A (en) * 2019-12-30 2020-05-08 苏州苏勃检测技术服务有限公司 Detection method suitable for adhesive force of paint film of automobile part
CN112730233A (en) * 2020-12-29 2021-04-30 南京林业大学 A paint film row check device for rattan material
CN118310955A (en) * 2024-06-11 2024-07-09 南京南大工程检测有限公司 Paint film adhesive force tester

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CN105628606A (en) * 2014-11-05 2016-06-01 武汉联航机电有限公司 Transmission shaft sprayed powder viscosity test carving device
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CN107907398A (en) * 2017-11-15 2018-04-13 北京工业大学 A kind of leveling method for being used for permanent depth nano impress experiment
CN207952767U (en) * 2017-11-14 2018-10-12 河南勤工机器人有限公司 Full-automatic round tube cut peeler
CN208270289U (en) * 2018-05-03 2018-12-21 中国商用飞机有限责任公司 Scratch introduction device for a structured surface
CN209784156U (en) * 2018-12-25 2019-12-13 江苏省优联检测技术服务有限公司 Round sample lattice drawing test device

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CN103018093A (en) * 2012-11-29 2013-04-03 无锡众望四维科技有限公司 Scratch-resistant testing device for printed circuit board coating
CN104344979A (en) * 2013-07-26 2015-02-11 中国科学院金属研究所 Device and method for making scratches on tubular alloy surface
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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111122432A (en) * 2019-12-30 2020-05-08 苏州苏勃检测技术服务有限公司 Detection method suitable for adhesive force of paint film of automobile part
CN112730233A (en) * 2020-12-29 2021-04-30 南京林业大学 A paint film row check device for rattan material
CN112730233B (en) * 2020-12-29 2022-03-01 南京林业大学 A paint film row check device for rattan material
CN118310955A (en) * 2024-06-11 2024-07-09 南京南大工程检测有限公司 Paint film adhesive force tester

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Application publication date: 20190319