CN109461469A - A kind of test method and device - Google Patents
A kind of test method and device Download PDFInfo
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- CN109461469A CN109461469A CN201811273707.4A CN201811273707A CN109461469A CN 109461469 A CN109461469 A CN 109461469A CN 201811273707 A CN201811273707 A CN 201811273707A CN 109461469 A CN109461469 A CN 109461469A
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C29/50004—Marginal testing, e.g. race, voltage or current testing of threshold voltage
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
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Abstract
The embodiment of the present application provides a kind of test method and device, it is related to the field of test technology, wherein, the above method is comprised determining that the test point tested using Flash particle as the storage equipment of storage medium, wherein, the test point includes: first kind parameter, the second class parameter for describing test purpose, the value of the first kind parameter and the value of the second class parameter for constructing test environment；Operation indicated by first kind parameter is carried out to the storage equipment according to the value of the first kind parameter, and then constructs the corresponding test environment of the test point；Operation indicated by the second class parameter is carried out to the storage equipment according to the value of the second class parameter；The threshold voltage for reading each storage unit of the storage equipment obtains the test result that the storage equipment is directed to the test point.Using scheme provided by the embodiments of the present application, can be realized to using Flash particle as the test of the storage equipment of storage medium.
Description
Technical field
This application involves the field of test technology, more particularly to a kind of test method and device.
Background technique
With the fast development of hardware technology, the storage equipment using Flash particle as storage medium has been obtained increasingly
It is widely applied.Below to be illustrated for SSD (Solid State Disk, solid state hard disk).
SSD is manufactured hard disk with solid-state electronic storage chip array, is made of control unit and storage medium.SSD
Interface specification and definition, function and application method it is identical with common hard disc, in product shape and size also and commonly
Hard disk is consistent.Currently, SSD has been widely used in military, vehicle-mounted, industry control, video monitoring, network monitoring, the network terminal, electricity
The fields such as power, medical treatment, aviation.As can be seen that the application range of SSD is very extensive, therefore to ensure using during SSD,
Read data are accurate from SSD, carry out stringent test to SSD in process of production.
In view of the foregoing, it is desirable to provide a kind of storage equipment to using Flash particle as storage medium is tested
Method.
Summary of the invention
The embodiment of the present application is designed to provide a kind of test method and device, to realize to being to deposit with Flash particle
The storage equipment of storage media is tested.Specific technical solution is as follows:
In a first aspect, the embodiment of the present application provides a kind of test method, which comprises
It determines to the test point tested using Flash particle as the storage equipment of storage medium, wherein the test point
It include: first kind parameter, the second class parameter for describing test purpose, the first kind parameter for constructing test environment
Value and the second class parameter value；
Operation indicated by the first kind parameter is carried out to the storage equipment according to the value of the first kind parameter,
And then construct the corresponding test environment of the test point；
Operation indicated by the second class parameter is carried out to the storage equipment according to the value of the second class parameter；
The threshold voltage for reading each storage unit in the Flash particle of the storage equipment, obtains the storage equipment
For the test result of the test point.
Second aspect, the embodiment of the present application provide a kind of test device, and described device includes:
Test point determining module, for determining the survey to being tested using Flash particle as the storage equipment of storage medium
Pilot, wherein the test point includes: for constructing the first kind parameter of test environment, second for describing test purpose
The value of class parameter, the value of the first kind parameter and the second class parameter；
First storage equipment operation module carries out institute to the storage equipment for the value according to the first kind parameter
Operation indicated by first kind parameter is stated, and then constructs the corresponding test environment of the test point；
Second storage equipment operation module carries out institute to the storage equipment for the value according to the second class parameter
State operation indicated by the second class parameter；
Voltage read module, for reading the threshold voltage of each storage unit in the Flash particle for storing equipment,
Obtain the test result that the storage equipment is directed to the test point.
The third aspect, the embodiment of the present application provide a kind of electronic equipment, including processor and machine readable storage medium,
The machine readable storage medium is stored with the machine-executable instruction that can be executed by the processor, and the processor is by institute
It states machine-executable instruction to promote: realizing method and step described in the embodiment of the present application.
Fourth aspect, the embodiment of the present application provide a kind of machine readable storage medium, are stored with machine-executable instruction,
When being called and being executed by processor, the machine-executable instruction promotes the processor: realizing described in the embodiment of the present application
Method and step.
As seen from the above, it in scheme provided by the embodiments of the present application, determines to using Flash particle as the storage of storage medium
After the test point that equipment is tested, the is carried out to storage equipment according to the value of the first kind parameter for constructing test environment
Operation indicated by a kind of parameter, the corresponding test environment of building test point, joins according to the second class for describing test purpose
Several values carries out operation indicated by the second class parameter to storage equipment, then reads each in the Flash particle of storage equipment
The threshold voltage of a storage unit, to obtain the test result that storage equipment is directed to test point.As it can be seen that implementing using the application
The scheme that example provides can be realized to using Flash particle as the test of the storage equipment of storage medium.
Detailed description of the invention
In order to illustrate the technical solutions in the embodiments of the present application or in the prior art more clearly, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of application for those of ordinary skill in the art without creative efforts, can be with
It obtains other drawings based on these drawings.
Fig. 1 is the flow diagram of the first test method provided by the embodiments of the present application；
Fig. 2 is the flow diagram of second of test method provided by the embodiments of the present application；
Fig. 3 is the flow diagram of the third test method provided by the embodiments of the present application；
Fig. 4 is the structural schematic diagram of the first test device provided by the embodiments of the present application；
Fig. 5 is the structural schematic diagram of second of test device provided by the embodiments of the present application；
Fig. 6 is the structural schematic diagram of the third test device provided by the embodiments of the present application.
Specific embodiment
Below in conjunction with the attached drawing in the embodiment of the present application, technical solutions in the embodiments of the present application carries out clear, complete
Site preparation description, it is clear that described embodiments are only a part of embodiments of the present application, instead of all the embodiments.It is based on
Embodiment in the application, it is obtained by those of ordinary skill in the art without making creative efforts every other
Embodiment shall fall in the protection scope of this application.
Due to more and more wider as the storage equipment application range of storage medium using Flash particle, need to set above-mentioned storage
Standby to carry out stringent test, the embodiment of the present application provides a kind of test method and device thus.
First the executing subject of each embodiment of the application is introduced below.
The executing subject of each embodiment of the application can be any one electronic equipment, for example, server, desk-top calculating
Machine, notebook computer etc..
When above-mentioned electronic equipment execution scheme provided by the embodiments of the present application tests storage equipment, above-mentioned electronics is set
It is standby to be directly connected to by data line, can also be indirectly connected with by relay devices such as interchangers, the application not to this into
Row limits.
First test method provided by the embodiments of the present application is illustrated below.
Fig. 1 is the flow diagram of the first test method provided by the embodiments of the present application, this method comprises:
S101: it determines to the test point tested using Flash particle as the storage equipment of storage medium.
Wherein, above-mentioned storage equipment can be for using Flash particle as the hard disk of storage medium, for example, SSD etc., can be with
It is using Flash particle as storage card of storage medium etc., the application is defined not to this.
Above-mentioned Flash particle is a kind of memory devices, specifically can be TLC particle, SLC particle, MLC particle etc..
One storage equipment may include at least one Flash particle, and a Flash particle is deposited including at least one
Storage unit.
In addition, above-mentioned test point include: for constructing the first kind parameter of test environment, for describing test purpose
The value of two class parameters, the value of first kind parameter and the second class parameter.
For example, above-mentioned first parameter can be ring locating for PE (Program Erase, erasing) number, above-mentioned storage equipment
The temperature etc. in border, above-mentioned second parameter can be RD (Read Disturb reads interference) number, DR (Data Retention, number
According to holding) duration etc..
Such as, the value of above-mentioned PE number can be with are as follows: 500 times, 1000 times, it is 2000 inferior, store equipment local environment temperature
Temperature value can be with are as follows: 25 degree, 40 degree etc., the value of RD number can be with are as follows: 2000 times, 5000 inferior, the value of DR duration can
With are as follows: 1 day, 1 week, 1 month etc..
Based on the example above, information that a test point includes can be with are as follows:
First parameter includes: PE number, the temperature for storing equipment local environment, wherein the value of PE number is 500, is deposited
The temperature value for storing up equipment local environment temperature is 25 degree；
Second parameter includes: RD number, and the value of RD number is 500 times.
When testing storage equipment, it can be tested by multiple and different test points.
Different test points can be first kind parameter identical with the second class parameter but the value of first kind parameter and/or
The different test point of the value of two class parameters can also be first kind parameter and/or the different test point of the second class parameter.
S102: operation indicated by first kind parameter, and then structure are carried out to storage equipment according to the value of first kind parameter
Build the corresponding test environment of test point.
Since first kind parameter is the parameter for constructing test environment, so according to the value of first kind parameter to storage
After equipment carries out operation indicated by first kind parameter, i.e., successfully construct test environment required by test point.
In addition, when the value according to first kind parameter carries out operation indicated by first kind parameter to storage equipment, because of ginseng
Several particular contents is different, different to the operation that storage equipment is carried out.
For example, the indicated operation of PE number is PE operation when first kind parameter is several PE times, counted in this way according to PE times
When value carries out the indicated operation of PE number to storage equipment, it can be understood as carry out the value time of PE number to storage equipment
PE operation.
First kind parameter is when storing the temperature of equipment local environment, to store behaviour indicated by the temperature of equipment local environment
As change storage equipment local environment temperature, in this way according to storage equipment local environment temperature value to storage equipment into
When operation indicated by the temperature of row storage equipment local environment, it can be understood as change the temperature of storage equipment local environment,
So that the temperature value of environment temperature is consistent with the value of above-mentioned storage equipment local environment temperature, can also make to store equipment in this way
Temperature change to above-mentioned local environment temperature value.
S103: operation indicated by the second class parameter is carried out to storage equipment according to the value of the second class parameter.
Since the second class parameter is the parameter for describing test purpose, so according to the value of the second class parameter to storage
Equipment carries out operation indicated by the second class parameter, that is, has achieved the purpose that test storage equipment.
In addition, when the value according to the second class parameter carries out operation indicated by the second class parameter to storage equipment, because of ginseng
Several particular contents is different, different to the operation that storage equipment is carried out.
For example, the indicated operation of RD number is RD operation when the second class parameter is several RD times, counted in this way according to RD times
When value carries out the indicated operation of RD number to storage equipment, it can be understood as carry out the value time of RD number to storage equipment
RD operation.
When second class parameter is DR duration, operation indicated by DR duration is DR operation, in this way according to the value of DR duration
When carrying out operation indicated by DR duration to storage equipment, it can be understood as the power supply for closing storage equipment carries out storage equipment
The DR of the value of Shi Changwei DR duration is operated.
S104: reading the threshold voltage of each storage unit in the Flash particle of storage equipment, obtains storage equipment and is directed to
The test result of test point.
In one embodiment of the application, electronic equipment reads each storage unit in the Flash particle of storage equipment
When threshold voltage, after electronic equipment threshold value voltage obtains position, data are sent to storage equipment according to identified position
Reading order is spaced after default waiting time and carries out reading data status inquiry from storage equipment, if reading data state table
Reading data success is levied, the read threshold voltages transmitted from storage equipment are obtained.
Specifically, can be read out by minimum unit of block when reading the threshold voltage of each storage unit.
To prevent loss of data, in one embodiment of the application, above-mentioned electronic equipment reads Flash of storage equipment
Grain in each storage unit threshold voltage when, can pre- first to file preset size memory space, then store equipment it is upward
When stating the threshold voltage that electronic equipment has been read, it can be transmitted using the data packet of default size, such as 1kb.This
After the above-mentioned electronic equipment of sample receives the data packet that storage equipment is transmitted back to, stored to the above-mentioned space applied in advance
It is interior.
Based on the above situation, electronic equipment can periodically check whether not fill out if it exists there are unfilled memory space
The memory space filled then illustrates the case where there are loss of data.Again due to every time from storage equipment read threshold voltages when, electronics
Equipment has been determined that threshold voltage obtains position, it may be considered that the memory space of pre- first to file and threshold value are electric every time for electronic equipment
Pressure obtains position, and there are one-to-one relationships, so can determine the threshold voltage lost after determining unfilled memory space
Position in storage equipment, and then data read command can be sent to storage equipment again according to determining position, again
The threshold voltage lost is read from storage equipment.
As seen from the above, it in scheme provided in this embodiment, determines to using Flash particle as the storage equipment of storage medium
After the test point tested, the first kind is carried out to storage equipment according to the value of the first kind parameter for constructing test environment
Operation indicated by parameter, the corresponding test environment of building test point, according to the second class parameter for describing test purpose
Value carries out operation indicated by the second class parameter to storage equipment, then reads each in the Flash particle of storage equipment deposit
The threshold voltage of storage unit, to obtain the test result that storage equipment is directed to test point.As it can be seen that using provided in this embodiment
Scheme can be realized to using Flash particle as the test of the storage equipment of storage medium.
In one embodiment of the application, in the case where first kind parameter includes PE number and first environment temperature,
Above-mentioned S102 carries out operation indicated by first kind parameter, packet to storage equipment according to the value of first kind parameter
It includes:
S102A: the temperature of control storage equipment local environment, so that the temperature value of storage equipment local environment reaches test
The value for the first environment temperature for including in point.
That is, above-mentioned first environment temperature is for indicating: when carrying out PE operation to storage equipment, storing locating for equipment
The temperature of environment.
Since temperature gradually changes, so during the temperature of control storage equipment local environment, Ke Yiding
When detection storage equipment local environment temperature, whether the temperature value confirmly detected reached taking for above-mentioned first environment temperature
Value.
When the temperature value detected reaches the value of first environment temperature, it is believed that environment temperature locating for storage equipment is
Meet test point to the temperature requirement of test environment, subsequent operation can be carried out.
When the temperature value detected does not reach the value of first environment temperature, it is believed that environment temperature locating for storage equipment
Degree has not been met test point to the temperature requirement of test environment, needs further to control the temperature of storage equipment local environment
System.
S102B: control storage equipment carries out PE operation, so that the number for the PE operation that storage equipment carries out reaches test point
In include PE number value, and then construct the corresponding test environment of test point.
In the case where first kind parameter includes PE number and first environment temperature, in another embodiment of the application,
Referring to fig. 2, it provides the flow diagram of second of test method, further includes the second ring in first kind parameter in the present embodiment
In the case that border temperature, the second class parameter include RD number,
Above-mentioned S103 carries out operation indicated by the second class parameter, packet to storage equipment according to the value of the second class parameter
It includes:
S103A: the temperature of control storage equipment local environment, so that the temperature value of storage equipment local environment reaches test
The value for the second environment temperature for including in point.
That is, above-mentioned second environment temperature is for indicating: when carrying out RD operation to storage equipment, storing locating for equipment
The temperature of environment.
Whether reach the first ring with the temperature value that can periodically detect storage equipment local environment referred in aforementioned S102B
The value of border temperature is similar, and whether the temperature value that can also periodically detect storage equipment local environment reaches second environment temperature
Value.Which is not described herein again.
S103B: control storage equipment carries out RD operation, so that the number for the RD operation that storage equipment carries out reaches test point
In include RD number value.
It, can be using difference to guarantee comprehensively to test storage equipment when testing storage equipment
Test point to storage equipment test.And storage equipment is tested in the performance in terms of RD, it can be according to PE number gradually
Increase, the thinking that also gradually increases of RD number is tested, such words, according to PE times it is several gradually increase, RD number gradually
Increase and each different test point is set, is then tested one by one.As the following table 1 shows PE number and RD in each test point
Corresponding relationship between number.Wherein, data 1- data 40 are the test result for each test point.
Table 1
In the case where first kind parameter includes PE number and first environment temperature, in another embodiment of the application,
Referring to Fig. 3, the flow diagram of the third test method is provided, further include third ring in first kind parameter in the present embodiment
In the case that border temperature and the 4th environment temperature, the second class parameter include DR duration,
Above-mentioned S103 carries out operation indicated by the second class parameter, packet to storage equipment according to the value of the second class parameter
It includes:
S103C: the temperature of control storage equipment local environment, so that the temperature value of storage equipment local environment reaches test
The value for the third environment temperature for including in point.
That is, above-mentioned third environment temperature is for indicating: when carrying out DR operation to storage equipment, storing locating for equipment
The temperature of environment.
Whether reach the first ring with the temperature value that can periodically detect storage equipment local environment referred in aforementioned S102B
The value of border temperature is similar, and whether the temperature value that can also periodically detect storage equipment local environment reaches third environment temperature
Value.Which is not described herein again.
S103D: the power supply for closing storage equipment carries out DR operation to storage equipment, until power supply, which closes duration, reaches test
The value for the DR duration for including in point.
On the basis of the above, in embodiment illustrated in fig. 3, above-mentioned S104 reads each in the Flash particle of storage equipment deposit
The threshold voltage of storage unit, comprising:
S104A: the temperature of control storage equipment local environment, so that the temperature value of storage equipment local environment reaches test
The value for the 4th environment temperature for including in point.
That is, above-mentioned 4th environment temperature is for indicating: in test storage equipment during the performance in terms of DR,
When reading the threshold voltage of each storage unit in Flash particle from storage equipment, the temperature of equipment local environment is stored.
The value of above-mentioned 4th environment temperature can be room temperature, for example, 26 degree, 27 degree etc..
S104B: opening the power supply of storage equipment, reads the threshold value of each storage unit in the Flash particle of storage equipment
Voltage obtains the test result that storage equipment is directed to test point.
It, can be using difference to guarantee comprehensively to test to depositing several equipment when testing storage equipment
Test point to storage equipment test.And storage equipment is tested in the performance in terms of DR, it can be according to PE number gradually
Increase, the thinking that also gradually increases of DR duration is tested, in this case, according to PE time it is several gradually increase, DR duration gradually
Increase and each different test point is set, is then tested one by one.
However in the case where PE number is fixed, complete time that storage equipment is needed for the test of all DR durations compared with
It is long, in this case, then in other PE times several lower test completed storage equipment and be directed to all DR durations, test process can be made
It is excessively very long.In order to shorten the testing time, can be using different storage equipment concurrent testings, and then complete to be directed to all surveys
The test of pilot.Pair between PE number in each test point, DR duration and the storage equipment tested for each test point
It should be related to as shown in table 2 below.Wherein, data 1- data 40 are the test result for each test point.
Table 2
In one embodiment of the application, above-mentioned test method can also include: to obtain storage equipment for each test
After the test result of point, obtained test result is analyzed, at least one of following information information is obtained:
With the variation of first kind parameter, the second class parameter, the reading data reference of each storage unit of equipment is stored
The distributed intelligence of voltage；
With the variation of first kind parameter, the second class parameter, the naked error code distribution letter of each storage unit of equipment is stored
Breath.
Wherein, above-mentioned reading data reference voltage from storage equipment it is to be understood that read each storage list when data
The reference voltage of member.
Below by taking TLC particle as an example, the process for the distributed intelligence for obtaining reading data reference voltage is illustrated.
The reference voltage range of each storage unit is -128-127 in TLC particle, total 256 adjusting ranges, and by
Data are indicated using 3bit in TLC particle, so the threshold voltage of storage unit has 8 peak values in TLC particle, it is,
It can be indicated with 8 wave crests, and the corresponding voltage of the intersection point between two neighboring wave can be used as the reading data of storage unit
Reference voltage.Based on the above situation, after obtaining each test result, the data being utilized respectively in each test result are drawn above-mentioned
Then 8 waves obtain reading data reference voltage according to the corresponding voltage of intersection point between adjacent wave, to obtain above-mentioned data
Read the distributed intelligence of reference voltage.
Due to the distributed intelligence by analyze to test result available reading data reference voltage, then using
It can be adjusted according to above-mentioned reading data reference voltage distribution information in the Flash particle of storage equipment during storing equipment
The reading data reference voltage of each storage unit guarantees that the data read out are accurate.
Similarly, the naked error condition of Flash particle in all cases can be known according to above-mentioned naked error code distributed intelligence,
And then tutorial message is provided using storage equipment to be subsequent, for example, Flash particle is used with caution in the case where naked error code is distributed higher situation
Etc..
Since storage equipment may include more than one Flash particle, so, in one embodiment of the application, electronics
When equipment carries out operation indicated by first kind parameter to storage equipment according to the value of first kind parameter, multiple lines can be passed through
Journey sends control command to storage equipment, judges whether to receive the confirmation letter of storage equipment feedback after being then spaced preset duration
Breath starts to carry out indicated by the first kind parameter storage equipment according to the value of first kind parameter if receiving confirmation message
Operation, if not receiving confirmation message, return above by multiple threads to storage equipment send control command the step of,
If not receiving confirmation message yet after so repeating preset times, it can be determined that electronic equipment to the control process of storage equipment
It there is a problem.
Operation phase indicated by first kind parameter is carried out to storage equipment according to the value of first kind parameter with electronic equipment
Similar, electronic equipment can also carry out the second class parameter to storage equipment according to aforesaid way, according to the value of the second class parameter
Indicated operation, I will not elaborate.
Corresponding with above-mentioned test method, the embodiment of the present application also provides a kind of test devices.
Fig. 4 provides a kind of structural schematic diagram of test device, which includes:
Test point determining module 401, for determining to being tested as the storage equipment of storage medium using Flash particle
Test point, wherein the test point include: for constructing the first kind parameter of test environment, for describing test purpose
The value of two class parameters, the value of the first kind parameter and the second class parameter；
First storage equipment operation module 402, for the value according to the first kind parameter to the storage equipment into
Operation indicated by row first kind parameter, and then construct the corresponding test environment of the test point；
Second storage equipment operation module 403, for the value according to the second class parameter to the storage equipment into
Operation indicated by row the second class parameter；
Voltage read module 404, for reading the threshold value electricity of each storage unit in the Flash particle for storing equipment
Pressure obtains the test result that the storage equipment is directed to the test point.
It include wiping the feelings of PE number and first environment temperature in the first kind parameter in one embodiment of the application
Under condition,
The first storage equipment operation module 402, comprising:
First temperature control unit 402A, for controlling the temperature of the storage equipment local environment, so that the storage
The temperature value of equipment local environment reaches the value for the first environment temperature for including in the test point；
PE operating unit 402B carries out PE operation for controlling the storage equipment, so that the storage equipment carried out
The number of PE operation reaches the value for PE number for including in the test point, and then constructs the corresponding test wrapper of the test point
Border.
In one embodiment of the application, referring to Fig. 5, the structural schematic diagram of second of test device is provided, described
First kind parameter further includes second environment temperature, the second class parameter including reading in the case where interfering RD number,
The second storage equipment operation module 403, comprising:
Second temperature control unit 403A, for controlling the temperature of the storage equipment local environment, so that the storage
The temperature value of equipment local environment reaches the value for the second environment temperature for including in the test point；
RD operating unit 403B carries out RD operation for controlling the storage equipment, so that the storage equipment carried out
The number of RD operation reaches the value for RD number for including in the test point.
In one embodiment of the application, referring to Fig. 6, the structural schematic diagram of the third test device is provided, described
First kind parameter further includes third environment temperature and the 4th environment temperature, the second class parameter include that data keep DR duration
In the case of,
The second storage equipment operation module 403, comprising:
Third temperature control unit 403C, for controlling the temperature of the storage equipment local environment, so that the storage
The temperature value of equipment local environment reaches the value for the third environment temperature for including in the test point；
DR operating unit 403D, the power supply for closing the storage equipment carry out DR operation to the storage equipment, directly
The value that duration reaches the DR duration for including in the test point is closed to power supply；
The voltage read module 404, comprising:
4th temperature control unit 404A, for controlling the temperature of the storage equipment local environment, so that the storage
The temperature value of equipment local environment reaches the value for the 4th environment temperature for including in the test point；
Voltage reading unit 404B, for opening the power supply of the storage equipment, Flash for reading the storage equipment
The threshold voltage of each storage unit in grain obtains the test result that the storage equipment is directed to the test point.
In one embodiment of the application, described device further include:
Interpretation of result module, after obtaining the storage equipment for the test result of each test point, to being obtained
Test result is analyzed, and at least one of following information information is obtained:
With the variation of the first kind parameter, the second class parameter, the data of each storage unit of the storage equipment
Read the distributed intelligence of reference voltage；
With the variation of the first kind parameter, the second class parameter, the naked mistake of each storage unit of the storage equipment
Code distributed intelligence.
As seen from the above, in the scheme that above-mentioned each embodiment provides, determination is deposited to using Flash particle as storage medium
After the test point that storage equipment is tested, storage equipment is carried out according to the value of the first kind parameter for constructing test environment
Operation indicated by first kind parameter, the corresponding test environment of building test point, according to the second class for describing test purpose
The value of parameter carries out operation indicated by the second class parameter to storage equipment, in the Flash particle for then reading storage equipment
The threshold voltage of each storage unit, to obtain the test result that storage equipment is directed to test point.As it can be seen that using above-mentioned each
The scheme that embodiment provides can be realized to using Flash particle as the test of the storage equipment of storage medium.
Corresponding with above-mentioned test method, the embodiment of the present application also provides a kind of electronic equipment, comprising: processor and machine
Device readable storage medium storing program for executing, the machine readable storage medium are stored with the executable finger of the machine that can be executed by the processor
It enables, the processor is promoted by the machine-executable instruction: realizing test method step described in the embodiment of the present application.
In one embodiment of the application, a kind of test method is provided, comprising:
It determines to the test point tested using Flash particle as the storage equipment of storage medium, wherein the test point
It include: first kind parameter, the second class parameter for describing test purpose, the first kind parameter for constructing test environment
Value and the second class parameter value；
Operation indicated by first kind parameter is carried out to the storage equipment according to the value of the first kind parameter, in turn
Construct the corresponding test environment of the test point；
Operation indicated by the second class parameter is carried out to the storage equipment according to the value of the second class parameter；
The threshold voltage for reading each storage unit in the Flash particle of the storage equipment, obtains the storage equipment
For the test result of the test point.
It should be noted that other implementations for the test method that above-mentioned processor is promoted to realize by machine-executable instruction
Example, identical as the embodiment that preceding method embodiment part refers to, which is not described herein again.
Above-mentioned machine readable storage medium may include random access memory (Random Access Memory, RAM),
It also may include nonvolatile memory (Non-Volatile Memory, NVM), for example, at least a magnetic disk storage.It is optional
, above-mentioned machine readable storage medium can also be that at least one is located remotely from the storage device of aforementioned processor.
Above-mentioned processor can be general processor, including central processing unit (Central Processing Unit,
CPU), network processing unit (Network Processor, NP) etc.；It can also be digital signal processor (Digital Signal
Processing, DSP), it is specific integrated circuit (Application Specific Integrated Circuit, ASIC), existing
It is field programmable gate array (Field-Programmable Gate Array, FPGA) or other programmable logic device, discrete
Door or transistor logic, discrete hardware components.
As seen from the above, electronic equipment determination provided in this embodiment is set to by the storage of storage medium of Flash particle
After the standby test point tested, first is carried out to storage equipment according to the value of the first kind parameter for constructing test environment
Operation indicated by class parameter, the corresponding test environment of building test point, according to the second class parameter for describing test purpose
Value to storage equipment carry out the second class parameter indicated by operation, then read storage equipment Flash particle in it is each
The threshold voltage of storage unit, to obtain the test result that storage equipment is directed to test point.As it can be seen that using the present embodiment provides
Scheme can be realized to using Flash particle as the test of the storage equipment of storage medium.
Corresponding with above-mentioned test method, the embodiment of the present application also provides a kind of machine readable storage mediums, are stored with
Machine-executable instruction, when being called and being executed by processor, the machine-executable instruction promotes the processor: realizing
Test method step described in the embodiment of the present application.
In one embodiment of the application, a kind of test method is provided, comprising:
It determines to the test point tested using Flash particle as the storage equipment of storage medium, wherein the test point
It include: first kind parameter, the second class parameter for describing test purpose, the first kind parameter for constructing test environment
Value and the second class parameter value；
Operation indicated by first kind parameter is carried out to the storage equipment according to the value of the first kind parameter, in turn
Construct the corresponding test environment of the test point；
Operation indicated by the second class parameter is carried out to the storage equipment according to the value of the second class parameter；
The threshold voltage for reading each storage unit in the Flash particle of the storage equipment, obtains the storage equipment
For the test result of the test point.
Need to illustrate when, the executable other embodiments for executing the test method for promoting processor to realize of above-mentioned machine,
Identical as the embodiment that preceding method embodiment part refers to, which is not described herein again.
As seen from the above, the machine-executable instruction stored in machine readable storage medium provided in this embodiment is executed,
After determining to the test point tested using Flash particle as the storage equipment of storage medium, according to for constructing test environment
The value of the first kind parameter operation indicated by first kind parameter, the corresponding test wrapper of building test point are carried out to storage equipment
Border carries out behaviour indicated by the second class parameter to storage equipment according to the value of the second class parameter for describing test purpose
Make, then read the threshold voltage of each storage unit in the Flash particle of storage equipment, is surveyed to obtain storage equipment and be directed to
The test result of pilot.It is deposited as it can be seen that can be realized using scheme provided in this embodiment to using Flash particle as storage medium
Store up the test of equipment.
It should be noted that, in this document, relational terms such as first and second and the like are used merely to a reality
Body or operation are distinguished with another entity or operation, are deposited without necessarily requiring or implying between these entities or operation
In any actual relationship or order or sequence.Moreover, the terms "include", "comprise" or its any other variant are intended to
Non-exclusive inclusion, so that the process, method, article or equipment including a series of elements is not only wanted including those
Element, but also including other elements that are not explicitly listed, or further include for this process, method, article or equipment
Intrinsic element.In the absence of more restrictions, the element limited by sentence "including a ...", it is not excluded that
There is also other identical elements in process, method, article or equipment including the element.
Each embodiment in this specification is all made of relevant mode and describes, same and similar portion between each embodiment
Dividing may refer to each other, and each embodiment focuses on the differences from other embodiments.Especially for device,
For electronic equipment and machine readable storage medium embodiment, since it is substantially similar to the method embodiment, so the ratio of description
Relatively simple, the relevent part can refer to the partial explaination of embodiments of method.
The foregoing is merely the preferred embodiments of the application, are not intended to limit the protection scope of the application.It is all
Any modification, equivalent replacement, improvement and so within spirit herein and principle are all contained in the protection scope of the application
It is interior.
Claims (12)
1. a kind of test method, which is characterized in that the described method includes:
It determines to the test point tested using Flash particle as the storage equipment of storage medium, wherein the test point packet
It includes: for constructing the test first kind parameter of environment, the second class parameter for describing test purpose, the first kind parameter
The value of value and the second class parameter；
Operation indicated by the first kind parameter is carried out to the storage equipment according to the value of the first kind parameter, in turn
Construct the corresponding test environment of the test point；
Operation indicated by the second class parameter is carried out to the storage equipment according to the value of the second class parameter；
The threshold voltage for reading each storage unit in the Flash particle of the storage equipment, obtains the storage equipment and is directed to
The test result of the test point.
2. the method according to claim 1, wherein including PE number of erasing and first in the first kind parameter
In the case where environment temperature,
The value according to the first kind parameter carries out operation indicated by the first kind parameter to the storage equipment,
Include:
The temperature of the storage equipment local environment is controlled, so that the temperature value of the storage equipment local environment reaches the survey
The value for the first environment temperature for including in pilot；
It controls the storage equipment and carries out PE operation, so that the number for the PE operation that the storage equipment carries out reaches the test
The value for PE number for including in point.
3. according to the method described in claim 2, it is characterized in that, the first kind parameter further include second environment temperature,
In the case that the second class parameter includes reading RD number of interference,
The value according to the second class parameter carries out operation indicated by the second class parameter, packet to the storage equipment
It includes:
The temperature of the storage equipment local environment is controlled, so that the temperature value of the storage equipment local environment reaches the survey
The value for the second environment temperature for including in pilot；
It controls the storage equipment and carries out RD operation, so that the number for the RD operation that the storage equipment carries out reaches the test
The value for RD number for including in point.
4. according to the method described in claim 2, it is characterized in that, the first kind parameter further include third environment temperature and
In the case that 4th environment temperature, the second class parameter include data holding DR duration,
The value according to the second class parameter carries out operation indicated by the second class parameter to the storage equipment,
Include:
The temperature of the storage equipment local environment is controlled, so that the temperature value of the storage equipment local environment reaches the survey
The value for the third environment temperature for including in pilot；
The power supply for closing the storage equipment carries out DR operation to the storage equipment, until power supply, which closes duration, reaches the survey
The value for the DR duration for including in pilot；
The threshold voltage of each storage unit in the Flash particle for reading the storage equipment, comprising:
The temperature of the storage equipment local environment is controlled, so that the temperature value of the storage equipment local environment reaches the survey
The value for the 4th environment temperature for including in pilot；
The power supply for opening the storage equipment reads the threshold value electricity of each storage unit in the Flash particle of the storage equipment
Pressure.
5. method according to any of claims 1-4, which is characterized in that the method also includes:
After the storage equipment is obtained for the test result of each test point, obtained test result is analyzed, is obtained
At least one of following information information:
With the variation of the first kind parameter, the second class parameter, the reading data of each storage unit of the storage equipment
The distributed intelligence of reference voltage；
With the variation of the first kind parameter, the second class parameter, the naked error code point of each storage unit of the storage equipment
Cloth information.
6. a kind of test device, which is characterized in that described device includes:
Test point determining module, for determining to the test point tested using Flash particle as the storage equipment of storage medium,
Wherein, the test point includes: the second class ginseng for constructing the first kind parameter of test environment, for describing test purpose
The value of the value of several, the described first kind parameter and the second class parameter；
First storage equipment operation module, for the value according to the first kind parameter to storage equipment progress described the
Operation indicated by a kind of parameter, and then construct the corresponding test environment of the test point；
Second storage equipment operation module, for the value according to the second class parameter to storage equipment progress described the
Operation indicated by two class parameters；
Voltage read module is obtained for reading the threshold voltage of each storage unit in the Flash particle for storing equipment
The storage equipment is directed to the test result of the test point.
7. device according to claim 6, which is characterized in that include PE number of erasing and first in the first kind parameter
In the case where environment temperature,
The first storage equipment operation module, comprising:
First temperature control unit, for controlling the temperature of the storage equipment local environment, so that locating for the storage equipment
The temperature value of environment reaches the value for the first environment temperature for including in the test point；
PE operating unit carries out PE operation for controlling the storage equipment, so that the PE operation that the storage equipment carries out
Number reaches the value for PE number for including in the test point, and then constructs the corresponding test environment of the test point.
8. device according to claim 7, which is characterized in that the first kind parameter further include second environment temperature,
In the case that the second class parameter includes reading RD number of interference,
The second storage equipment operation module, comprising:
Second temperature control unit, for controlling the temperature of the storage equipment local environment, so that locating for the storage equipment
The temperature value of environment reaches the value for the second environment temperature for including in the test point；
RD operating unit carries out RD operation for controlling the storage equipment, so that the RD operation that the storage equipment carries out
Number reaches the value for RD number for including in the test point.
9. device according to claim 7, which is characterized in that the first kind parameter further include third environment temperature and
In the case that 4th environment temperature, the second class parameter include data holding DR duration,
The second storage equipment operation module, comprising:
Third temperature control unit, for controlling the temperature of the storage equipment local environment, so that locating for the storage equipment
The temperature value of environment reaches the value for the third environment temperature for including in the test point；
DR operating unit, the power supply for closing the storage equipment carries out DR operation to the storage equipment, until power supply closes
Close duration and reach the value for the DR duration for including in the test point；
The voltage read module, comprising:
4th temperature control unit, for controlling the temperature of the storage equipment local environment, so that locating for the storage equipment
The temperature value of environment reaches the value for the 4th environment temperature for including in the test point；
Voltage reading unit is read each in the Flash particle of the storage equipment for opening the power supply of the storage equipment
The threshold voltage of storage unit obtains the test result that the storage equipment is directed to the test point.
10. the device according to any one of claim 6-9, which is characterized in that described device further include:
Interpretation of result module, after obtaining the storage equipment for the test result of each test point, to being tested
As a result it is analyzed, obtains at least one of following information information:
With the variation of the first kind parameter, the second class parameter, the reading data of each storage unit of the storage equipment
The distributed intelligence of reference voltage；
With the variation of the first kind parameter, the second class parameter, the naked error code point of each storage unit of the storage equipment
Cloth information.
11. a kind of electronic equipment, which is characterized in that including processor and machine readable storage medium, the machine readable storage
Media storage has the machine-executable instruction that can be executed by the processor, and the processor is by the machine-executable instruction
Promote: realizing any method and step of claim 1-5.
12. a kind of machine readable storage medium, which is characterized in that be stored with machine-executable instruction, by processor call and
When execution, the machine-executable instruction promotes the processor: realizing any method and step of claim 1-5.
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