CN109327013A - A kind of series resonance test overtemperature protection system - Google Patents

A kind of series resonance test overtemperature protection system Download PDF

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Publication number
CN109327013A
CN109327013A CN201811337392.5A CN201811337392A CN109327013A CN 109327013 A CN109327013 A CN 109327013A CN 201811337392 A CN201811337392 A CN 201811337392A CN 109327013 A CN109327013 A CN 109327013A
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CN
China
Prior art keywords
foot
thermometric
resistance
judges
module
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201811337392.5A
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Chinese (zh)
Inventor
樊斌
李秉研
孙逸文
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Suzhou University of Science and Technology
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Suzhou University of Science and Technology
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Priority to CN201811337392.5A priority Critical patent/CN109327013A/en
Publication of CN109327013A publication Critical patent/CN109327013A/en
Pending legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02HEMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS
    • H02H5/00Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection
    • H02H5/04Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal non-electric working conditions with or without subsequent reconnection responsive to abnormal temperature

Abstract

The present invention relates to a kind of series resonance test overtemperature protection systems, it is used to match with series resonant testing equipment, the series resonant testing equipment includes exchange input, with the rectification module for exchanging input and being connected, the inversion control being connected with the rectification module, the IGBT module being connected with the inversion control, the resonance step-up being connected with the IGBT module, the high-pressure sampling being connected with the resonance step-up, the single-chip microcontroller being connected with the high-pressure sampling, the Regulation Control being connected with the single-chip microcontroller, the Regulation Control connection rectification module;What is be connected with the single-chip microcontroller judges that 1, thermometric judges 2 there are also thermometric; the thermometric judges the 1 connection rectification module; the thermometric judges the 2 connections IGBT module; once the rectification module or IGBT module temperature overheating; single-chip microcontroller then passes through Regulation Control and closes rectification module; to protection test equipment, the loss of field test is avoided.

Description

A kind of series resonance test overtemperature protection system
Technical field
The present invention relates to automation control and high-voltage testing equipment fields, and in particular to a kind of series resonance test overheat guarantor Protection unit.
Background technique
Series resonance test is that the test item of capacitive properties and reactor are constituted series resonance connection type, for measuring Resonance potential on test item.Series resonance test is a kind of means that electric power preventive trial is used for insulating properties test, For series resonance since capacity of experiment is big, voltage height shows superiority in a large amount of field tests of power industry, has obtained extensively Application.
Series resonance high-voltage test equipment is the ac voltage signal that will be inputted, through over commutation, high power contravariant, resonance liter The links such as pressure, simple alternating current high pressure needed for test product pressure test to be measured is obtained on resonant frequency point control electricity by pressure stabilizing Road makes the output high-voltage-stable, and is kept for a period of time, to test by the pressure-resistant performance of test specimen.
Since high-potting voltage is high, capacity is big, the consumption power that testing equipment is born is big, once series resonance test Main component in equipment because electric current is big, temperature is high and burns out, bring to the field test of entire high pressure by meeting destructive test equipment Very big loss.
Summary of the invention
One kind is provided the invention aims to overcome the deficiencies in the prior art can be in series resonance test, equipment Main component due to electric current is big and while overheating, issues alarm, termination test, while allowing single-chip microcontroller to judge thermal part, and be prompted to User.
In order to achieve the above objectives, the technical solution adopted by the present invention is that: it is used to match with series resonant testing equipment, The high-pressure series Resonance Voltage Withstand Test equipment include exchange input, with it is described exchange input the rectification module being connected, The inversion control that is connected with the rectification module, the IGBT module being connected with the inversion control, with it is described Resonance step-up that IGBT module is connected, the high-pressure sampling being connected with the resonance step-up, with the high-pressure sampling phase The single-chip microcontroller of connection, the Regulation Control being connected with the single-chip microcontroller, the Regulation Control connection rectification module;
The also thermometric being connected with the single-chip microcontroller judges that 1, thermometric judges 2, and the thermometric judges described in 1 connection Rectification module, the thermometric judges the 2 connections IGBT module.
Optimally, the thermometric judges that 1, thermometric judges 2, and the judgement of the two thermometrics judges electricity using identical thermometric Road, respective output potential end are respectively connected to the single-chip microcontroller, the thermometric decision circuitry by operational amplifier U1, U2, U3 and its peripheral circuit composition, the 8th foot of interim described U1, U2, U3 connect positive supply, the 4th foot connects negative supply, the 3rd foot of U1 with It is bridged between positive supply and bridges flying capcitor between resistance R9, the positive supply and ground between the 3rd foot and ground of resistance R8, U1 Flying capcitor C2 between the 2nd foot and ground of C1, U1;
The 1st foot of integrated circuit U2 meets bridging thermistor R between the 2nd foot of U1, the 2nd foot of U2 and 1 footT, the 3rd foot of U2 and ground Span connecting resistance R7, potentiometer R5 connects the 1st foot of U3, R5 series resistance R6 connects the 2nd foot of U2, bridges resistance between the 2nd foot of U3 and 1 foot Resistance R4 is bridged between the 3rd foot of R3, U3 and ground, resistance R1 mono- is terminated and bridged zener diode between the positive supply other end and ground Dz, resistance R1 series resistance R2 connects the 2nd foot of U3 simultaneously.
Due to the adoption of the above technical scheme, beneficial effects of the present invention: rectification mould once described in series resonance test Block or IGBT module are overheated because electric current is too big, and thermometric decision circuitry of the present invention can provide a signal in time, cutting High pressure, while single-chip microcontroller being notified to cross thermal part, facilitate system hardware to handle in time, protection test equipment, with exempt from customs examination high pressure scene Test tape loses.
Detailed description of the invention
Attached drawing 1 is that a kind of series resonance test overtemperature protection system each section of the present invention connects block diagram;
Attached drawing 2 is thermometric decision circuitry schematic diagram of the present invention.
Specific embodiment
Detailed introduction is done to technical solution of the present invention below in conjunction with specific embodiment:
Fig. 1 is that a kind of series resonance test overtemperature protection system each section of the present invention connects block diagram.Wherein exchange input 1 is defeated Lie prostrate AC signal out for 50Hz220, which is rectified into direct current signal by rectification module 2, the amplitude of the direct current signal by The output voltage signal of Regulation Control 8 controls, and inversion control 3 controls IGBT according to the direct current signal that the rectification module 2 is sent Module 4 generates high-power square wave AC signal, which is being tested through further boosting through resonance step-up circuit 5 High voltage output is obtained on product, which is divided through high-pressure sampling 6, analog-to-digital conversion, and high-voltage digital signal is transmitted to list Piece machine 11 is used for high-tension measurement.
Thermometric judges that 1, thermometric judges that 2 are made of thermometric decision circuitry respectively, and the thermometric judges the electricity of the temperature-sensitive in 1 circuit Resistance is attached on the rectification module 2, and the thermometric judges that the thermistor in 2 circuits is attached in the IGBT module 4, the two Thermometric decision circuitry is respective to export the input and output mouth line for connecing the single-chip microcontroller 11 respectively, the two mouth lines are in no temperature report It is low level when alert, once there is one high level occur, single-chip microcontroller 11 closes rectification module 2 by Regulation Control 10, simultaneously Prompt is provided, is that module temperature overheat, there is a problem.
Attached drawing 2 is thermometric decision circuitry schematic diagram of the present invention, which consists of two parts: temperature measuring circuit and voltage Comparison circuit.Temperature measuring circuit is made of operational integrated circuit U2, U3 and its peripheral circuit;Voltage comparator circuit is by operation collection It is formed at circuit U 1 and peripheral circuit, tri- the 8th feet of operational integrated circuit of U1, U2, U3 connect+15V power supply, the 4th foot connects -15V electricity Source.
U2, U3 and its peripheral circuit form temperature measuring circuit, and U2, U3 are connected into reverse phase scaling circuit, the periphery U3 Circuit element has resistance R1, R2, R3, R4, zener diode Dz, wherein the R1 and composition voltage regulator circuit, what is obtained stablizes electricity Pressure is added to the 2nd foot of inverting input terminal of operational integrated circuit U3 through resistance R3, and the 1st foot after amplification in U3 obtains stable Output voltage, the voltage are transferred to the 2nd foot of inverting input terminal of U2 through R5, R6, and U2 peripheral circuit element has R5, R6, R7, RT, Wherein RTIt is thermistor, is the temperature-sensing element of the rectification module and IGBT module, the voltage and R exported from the 1st foot of U2T's Resistance value is directly proportional.
U1 and peripheral circuit element R8, R9, C1, C2 form voltage comparator circuit, wherein middle resistance R8, R9 composition partial pressure electricity Road adjusts the ratio of resistance R8, R9, can obtain steady dc voltage in the 3rd foot of operational integrated circuit U1, the 2nd foot of U1 and The current potential of 3rd foot is compared, and comparison result is exported from the 1st foot, if the 3rd foot current potential is greater than the 2nd foot current potential, the output of the 1st foot Positive high level, if the 2nd foot current potential is greater than the 1st foot current potential, the 1st foot exports potential end and exports low level.
When series resonance test, if temperature is normal in the rectification module and IGBT module, the 3rd U1 in voltage comparator circuit Foot current potential is lower than the 2nd foot current potential, thermistor RTIt is the resistance of negative temperature coefficient, it is smaller that temperature gets over high resistance, therefore the 1st foot of U2 Output voltage also becomes smaller, once temperature is higher than setting value, the output voltage of the 1st foot of U2 is less than the reference voltage of the 3rd foot of U1, U1 the 1 foot output potential end becomes high level.
The above embodiments merely illustrate the technical concept and features of the present invention, and its object is to allow person skilled in the art Scholar cans understand the content of the present invention and implement it accordingly, and it is not intended to limit the scope of the present invention.It is all according to the present invention Equivalent change or modification made by Spirit Essence, should be covered by the protection scope of the present invention.

Claims (2)

1. a kind of series resonance test overtemperature protection system is used to match with high-pressure series Resonance Voltage Withstand Test equipment, institute The high-pressure series Resonance Voltage Withstand Test equipment stated include exchange input, with it is described exchange input the rectification module being connected and Inversion control that the rectification module is connected, the IGBT module being connected with the inversion control, with the IGBT Resonance step-up that module is connected, the high-pressure sampling being connected with the resonance step-up are connected with the high-pressure sampling Single-chip microcontroller, the Regulation Control that is connected with the single-chip microcontroller, the Regulation Control connection rectification module;
The also thermometric being connected with the single-chip microcontroller judges that 1, thermometric judges 2, and the thermometric judges whole described in 1 connection Flow module, the thermometric judge the 2 connections IGBT module.
2. a kind of series resonance test overtemperature protection system according to claim 1, it is characterised in that: the thermometric is sentenced Disconnected 1, thermometric judges 2, and the judgement of the two thermometrics uses identical thermometric decision circuitry, and respective output potential end is respectively connected to The single-chip microcontroller, the thermometric decision circuitry are made of operational amplifier U1, U2, U3 and its peripheral circuit, interim described The 8th foot of U1, U2, U3 connect positive supply, the 4th foot connects negative supply, and the 3rd foot of resistance R8, U1 are bridged between the 3rd foot of U1 and positive supply Flying capcitor C2 between the 2nd foot and ground of flying capcitor C1, U1 is bridged between resistance R9, the positive supply and ground between ground;
The 1st foot of integrated circuit U2 meets bridging thermistor R between the 2nd foot of U1, the 2nd foot of U2 and 1 footT, U2 the 3rd foot and ground span Connecting resistance R7, potentiometer R5 connect the 1st foot of U3, R5 series resistance R6 connects the 2nd foot of U2, between the 2nd foot of U3 and 1 foot bridge resistance R3, Bridge resistance R4 between the 3rd foot of U3 and ground, resistance R1 mono- is terminated and bridged zener diode Dz, same between the positive supply other end and ground When resistance R1 series resistance R2 connect the 2nd foot of U3.
CN201811337392.5A 2018-11-05 2018-11-05 A kind of series resonance test overtemperature protection system Pending CN109327013A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201811337392.5A CN109327013A (en) 2018-11-05 2018-11-05 A kind of series resonance test overtemperature protection system

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Application Number Priority Date Filing Date Title
CN201811337392.5A CN109327013A (en) 2018-11-05 2018-11-05 A kind of series resonance test overtemperature protection system

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CN109327013A true CN109327013A (en) 2019-02-12

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Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05121952A (en) * 1991-10-29 1993-05-18 Nec Corp Nonlinear temperature compensation circuit
JPH06216688A (en) * 1993-01-13 1994-08-05 Mitsubishi Electric Corp Constant impedance voltage controlled variable attenuator
JPH08292107A (en) * 1995-04-21 1996-11-05 Zexel Corp Selection method of thermistor element in temperature detector, and the temperature detector
CN1651863A (en) * 2004-11-24 2005-08-10 吉林大学 System for automatically leading vehicle wireless positioning, navigating and controlling
CN201181428Y (en) * 2008-03-05 2009-01-14 苏州市华电电气技术有限公司 High voltage output control device used for series resonance pressure test
CN103337836A (en) * 2013-07-24 2013-10-02 国家电网公司 High-power IGBT (Insulated Gate Bipolar Transistor) temperature acquisition protection circuit
US20140334521A1 (en) * 2011-12-26 2014-11-13 Zhejiang University Coupling-based non-contact type temperature measurement system and measurement method thereof
CN104360697A (en) * 2014-09-24 2015-02-18 河北工业大学 Power-temperature control and detection device for IGBT (insulated gate bipolar transistor) modules of three-phase inverter system
JP2016189654A (en) * 2015-03-30 2016-11-04 サンケン電気株式会社 Current resonant converter
CN206164394U (en) * 2016-10-12 2017-05-10 苏州科技大学 Multistage voltage -multiplying low ripple high voltage DC generating device
WO2017143623A1 (en) * 2016-02-23 2017-08-31 广州时艺音响科技有限公司 Control device for direct-current output potential of power amplifier
CN206573232U (en) * 2017-02-08 2017-10-20 广州汽车集团股份有限公司 Thermistor temperature detecting circuit
CN206948203U (en) * 2017-04-14 2018-01-30 金华市中荷环保科技有限公司 Voltage adaptive controlling frequency conversion high-voltage DC power supply
CN108427022A (en) * 2018-04-20 2018-08-21 苏州科技大学 The detuning protective device of high-pressure series Resonance Voltage Withstand Test
CN208986592U (en) * 2018-11-05 2019-06-14 苏州科技大学 A kind of series resonance test overtemperature protection system

Patent Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05121952A (en) * 1991-10-29 1993-05-18 Nec Corp Nonlinear temperature compensation circuit
JPH06216688A (en) * 1993-01-13 1994-08-05 Mitsubishi Electric Corp Constant impedance voltage controlled variable attenuator
JPH08292107A (en) * 1995-04-21 1996-11-05 Zexel Corp Selection method of thermistor element in temperature detector, and the temperature detector
CN1651863A (en) * 2004-11-24 2005-08-10 吉林大学 System for automatically leading vehicle wireless positioning, navigating and controlling
CN201181428Y (en) * 2008-03-05 2009-01-14 苏州市华电电气技术有限公司 High voltage output control device used for series resonance pressure test
US20140334521A1 (en) * 2011-12-26 2014-11-13 Zhejiang University Coupling-based non-contact type temperature measurement system and measurement method thereof
CN103337836A (en) * 2013-07-24 2013-10-02 国家电网公司 High-power IGBT (Insulated Gate Bipolar Transistor) temperature acquisition protection circuit
CN104360697A (en) * 2014-09-24 2015-02-18 河北工业大学 Power-temperature control and detection device for IGBT (insulated gate bipolar transistor) modules of three-phase inverter system
JP2016189654A (en) * 2015-03-30 2016-11-04 サンケン電気株式会社 Current resonant converter
WO2017143623A1 (en) * 2016-02-23 2017-08-31 广州时艺音响科技有限公司 Control device for direct-current output potential of power amplifier
CN206164394U (en) * 2016-10-12 2017-05-10 苏州科技大学 Multistage voltage -multiplying low ripple high voltage DC generating device
CN206573232U (en) * 2017-02-08 2017-10-20 广州汽车集团股份有限公司 Thermistor temperature detecting circuit
CN206948203U (en) * 2017-04-14 2018-01-30 金华市中荷环保科技有限公司 Voltage adaptive controlling frequency conversion high-voltage DC power supply
CN108427022A (en) * 2018-04-20 2018-08-21 苏州科技大学 The detuning protective device of high-pressure series Resonance Voltage Withstand Test
CN208986592U (en) * 2018-11-05 2019-06-14 苏州科技大学 A kind of series resonance test overtemperature protection system

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