CN109325375A - A kind of contactless smart card card-reading terminal and its working method - Google Patents

A kind of contactless smart card card-reading terminal and its working method Download PDF

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Publication number
CN109325375A
CN109325375A CN201811150685.2A CN201811150685A CN109325375A CN 109325375 A CN109325375 A CN 109325375A CN 201811150685 A CN201811150685 A CN 201811150685A CN 109325375 A CN109325375 A CN 109325375A
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China
Prior art keywords
field strength
test field
card
test
reading terminal
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CN201811150685.2A
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陆舟
于华章
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Feitian Technologies Co Ltd
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Feitian Technologies Co Ltd
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Priority to CN201811150685.2A priority Critical patent/CN109325375A/en
Publication of CN109325375A publication Critical patent/CN109325375A/en
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
    • G06K7/0008—General problems related to the reading of electronic memory record carriers, independent of its reading method, e.g. power transfer
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06K—GRAPHICAL DATA READING; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS
    • G06K7/00—Methods or arrangements for sensing record carriers, e.g. for reading patterns
    • G06K7/08—Methods or arrangements for sensing record carriers, e.g. for reading patterns by means detecting the change of an electrostatic or magnetic field, e.g. by detecting change of capacitance between electrodes

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  • Engineering & Computer Science (AREA)
  • Artificial Intelligence (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Credit Cards Or The Like (AREA)

Abstract

The invention discloses a kind of contactless smart card card-reading terminal and its working methods, are related to electronics field.The described method includes: card-reading terminal carries out field strength measurement by configuring the combination of capacitance group, records all combinations by configuring capacitance group and carry out the test field strength and Configuration Values corresponding with obtained all test field strength difference that field strength measurement obtains；Full test field strength is selected from all test field strength；The card-reading terminal saves the combination of Configuration Values corresponding with the full test field strength or configuration capacitance group corresponding with the full test field strength.Technical solution of the present invention avoids the device error due to hardware and leads to the reduction of card reading performance, improves the card reading performance of contactless smart card card-reading terminal.

Description

A kind of contactless smart card card-reading terminal and its working method
Technical field
The present invention relates to electronics field more particularly to a kind of contactless smart card card-reading terminals and its working method.
Background technique
In the production of existing contactless smart card card-reading terminal, antenna match has important meaning, and antenna match refers to Antenna generates resonance, i.e., the imaginary part of the input impedance in a certain band limits in the circuit being made of resistance, inductance and capacitor It being adjusted near 0 or 0, makes circuit that real impedance be presented, the impedance magnitude of circuit is minimum at this time, when voltage is fixed, electric current Maximum, antenna measurement field strength reach maximum, keep the card reading performance of contactless smart card card-reading terminal best, so detection antenna Whether matching be non-contact smart card reader terminal performance production detection in a very important link.
Currently, the manufacturer of contactless smart card card-reading terminal usually realizes antenna circuit by the matching of hardware Matching, but mass production is unable to control in the circuit being made of resistance, inductance and capacitor because of resonance caused by device error The offset of point, test field strength when contactless smart card card-reading terminal card reading have no idea to reach maximum, and contactless smart card is read Card terminal makes the card reading reduced performance of contactless smart card card-reading terminal there are the deviation of card reading test field strength, cannot be good Complete card reading work.
Summary of the invention
The purpose of the invention is to overcome the deficiencies of the prior art and provide a kind of contactless smart card card-reading terminal and its Working method.
The present invention provides a kind of working methods of contactless smart card card-reading terminal, comprising the following steps:
Step S1: card-reading terminal carries out field strength measurement by configuring the combination of capacitance group, records all by configuring capacitor The combination of group carries out the test field strength and Configuration Values corresponding with obtained all test field strength difference that field strength measurement obtains；
Step S2: the card-reading terminal selects full test field strength from all test field strength；
Step S3: the card-reading terminal save Configuration Values corresponding with the full test field strength or configure with it is described The combination of the corresponding capacitance group of full test field strength.
Invention further provides a kind of working method of contactless smart card card-reading terminal, capacitance group in the method Capacitance successively increases, and the described method comprises the following steps:
Step G1: the card-reading terminal configures the combination of capacitance group according to the capacitance of capacitance group, according to the group of capacitance group The configuration sequence of conjunction successively carries out field strength measurement until finding out full test field strength, when the combination of capacitance group is in configuration sequence At first, the full test field strength is that the test field strength of field strength is tested more than or equal to the latter, executes step G2；Work as electricity The combination of appearance group be not first in configuration sequence and the last one when, the full test field strength is more than or equal to previous A test field strength and the test field strength for being greater than or equal to the latter test field strength, execute step G2；When the combination of capacitance group is to match When setting the last one in sequence, the full test field strength is to hold more than or equal to the test field strength of previous test field strength Row step G2；
Step G2: the card-reading terminal save Configuration Values corresponding with the full test field strength or configure with it is described The combination of the corresponding capacitance group of full test field strength.
Invention further provides a kind of contactless smart card card-reading terminals, comprising: input circuit, output circuit, power supply electricity Road, MCU, field strength measurement circuit；It further include adjustment condenser network, the adjustment condenser network includes at least a capacitance group；
The input circuit is connect with the power supply circuit and the MCU；
The output circuit is connect with the power supply circuit and the MCU；
The power supply circuit connects with the input circuit, the output circuit, the MCU, the field strength measurement circuit It connects；
The MCU connects with the input circuit, the output circuit, the power supply circuit and the field strength measurement circuit It connects；
The field strength measurement circuit is connect with the power supply circuit, the MCU and the adjustment condenser network；
The adjustment condenser network, with the field strength measurement circuit connection.
Compared with prior art, the present invention having the advantage that the present invention by constantly adjusting each contactless smart card Capacitor inside card-reading terminal and the card reading test field strength for adjusting contactless smart card card-reading terminal, the card reading after detection adjustment Field strength is tested, so that card reading test field strength is gradually tended to be maximum, to improve the card reading performance of contactless smart card card-reading terminal, makes Card reading performance reaches optimum state, and contactless smart card card-reading terminal antenna hardware Circuit Matching in production detection is greatly decreased The fraction defective of aspect, improves non-contact intelligence at the case where avoiding the occurrence of card reading reduced performance caused by the device error because of hardware The card reading performance of energy card card-reading terminal.
Detailed description of the invention
Fig. 1 is a kind of flow chart of the working method for contactless smart card card-reading terminal that the embodiment of the present invention one provides；
Fig. 2 is a kind of flow chart of the working method for contactless smart card card-reading terminal that the embodiment of the present invention three provides；
Fig. 3 is a kind of block diagram for contactless smart card card-reading terminal that the embodiment of the present invention five provides.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete Site preparation description, it is clear that described embodiments are only a part of the embodiments of the present invention, instead of all the embodiments.It is based on Embodiment in the present invention, those skilled in the art's every other implementation obtained without making creative work Example, shall fall within the protection scope of the present invention.
Embodiment one
The embodiment of the present invention one provides a kind of working method of contactless smart card card-reading terminal, as shown in Figure 1, include with Lower step: step 101: card-reading terminal carries out field strength measurement by configuring the combination of capacitance group, records all by configuring capacitor The combination of group carries out the test field strength and Configuration Values corresponding with obtained all test field strength difference that field strength measurement obtains；From Full test field strength is selected in all test field strength；
Step 102: card-reading terminal saves Configuration Values corresponding with full test field strength or configuration and full test field The combination of strong corresponding capacitance group.
Optionally, in step 101, the combination of capacitance group is configured, specifically: card-reading terminal controls capacitance group according to Configuration Values Combined connection and disconnection；
In step 102, configure the combination of corresponding with full test field strength capacitance group, specifically: card-reading terminal according to The combined connection and disconnection of Configuration Values control capacitance group corresponding with full test field strength.
Further, card-reading terminal only includes first capacitor group；
Step 101 specifically includes:
Step A1: card-reading terminal controls the disconnection of first capacitor group, carries out field strength measurement and obtains the 0th test field strength, record 0th test field strength and the Configuration Values for testing corresponding pair of field strength to the 0th；
Step A2: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the first test field strength, records First test field strength and the Configuration Values for testing corresponding pair of field strength to first；
Step A3: card-reading terminal compares the size of the 0th test field strength and the first test field strength, when the first checkout area is powerful When the 0th test field strength, the first test field strength is full test field strength, executes step 102；When the 0th checkout area it is powerful in or When person is equal to the first test field strength, the 0th test field strength is full test field strength, executes step 102.
Further, card-reading terminal includes first capacitor group and the second capacitance group；
Step 101 specifically includes the following steps:
Step B1: card-reading terminal controls the disconnection of first capacitor group and the second capacitance group, carries out field strength measurement and obtains the 0th Test field strength, the Configuration Values that record the 0th tests field strength and tests corresponding pair of field strength to the 0th；
Step B2: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the first test field strength, records First test field strength and the Configuration Values for testing corresponding pair of field strength to first；
Step B3: the disconnection of card-reading terminal control first capacitor group is connected to the second capacitance group, is carried out field strength measurement and is obtained To the second test field strength, the Configuration Values that record second tests field strength and tests corresponding pair of field strength to second；
Step B4: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains third test field strength, record Third tests field strength and tests corresponding pair of field strength of Configuration Values to third；
Step B5: card-reading terminal compares the 0th test field strength, the first test field strength, the second test field strength and third checkout area Strong size selects maximum survey from the 0th test field strength, the first test field strength, the second test field strength and third test field strength Examination hall is strong, executes step 102.
Further, card-reading terminal includes first capacitor group, the second capacitance group and third capacitance group；
Step 101 specifically includes the following steps:
Step C1: card-reading terminal controls the disconnection of first capacitor group, the second capacitance group and third capacitance group, carries out field strength survey Examination obtains the 0th test field strength, the Configuration Values that record the 0th tests field strength and tests corresponding pair of field strength to the 0th；
Step C2: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the first test field strength, records First test field strength and the Configuration Values for testing corresponding pair of field strength to first；
Step C3: the disconnection of card-reading terminal control first capacitor group is connected to the second capacitance group, is carried out field strength measurement and is obtained To the second test field strength, the Configuration Values that record second tests field strength and tests corresponding pair of field strength to second；
Step C4: card-reading terminal controls the disconnection of the second capacitance group and being connected to for third capacitance group, carries out field strength measurement and obtains Field strength, record third test field strength and the Configuration Values to corresponding pair of field strength of third test are tested to third；
Step C5: the disconnection of card-reading terminal control third capacitance group, first capacitor group are connected to the second capacitance group, are carried out Field strength measurement obtains the 4th test field strength, the Configuration Values that record the 4th tests field strength and tests corresponding pair of field strength to the 4th；
Step C6: card-reading terminal controls the disconnection of the second capacitance group and being connected to for third capacitance group, carries out field strength measurement and obtains To the 5th test field strength, the Configuration Values that record the 5th tests field strength and tests corresponding pair of field strength to the 5th；
Step C7: the disconnection of card-reading terminal control first capacitor group is connected to the second capacitance group, is carried out field strength measurement and is obtained To the 6th test field strength, the Configuration Values that record the 6th tests field strength and tests corresponding pair of field strength to the 6th；
Step C8: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the 7th test field strength, record 7th test field strength and the Configuration Values for testing corresponding pair of field strength to the 7th；
Step C9: card-reading terminal compares the 0th test field strength, the first test field strength, the second test field strength, third checkout area By force, the 4th test field strength, the 5th test field strength, the 6th test field strength and the 7th test field strength size, from the 0th test field strength, First test field strength, the second test field strength, third test field strength, the 4th test field strength, the 5th test field strength, the 6th test field strength Full test field strength is selected in the 7th test field strength, executes step 102.
Further, card-reading terminal includes first capacitor group, the second capacitance group, third capacitance group and the 4th capacitance group；
Step 101 specifically includes the following steps:
Step D1: card-reading terminal controls the disconnected of first capacitor group, the second capacitance group, third capacitance group and the 4th capacitance group It opens, carries out field strength measurement and obtain the 0th test field strength, the configuration that record the 0th tests field strength and tests corresponding pair of field strength to the 0th Value；
Step D2: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the first test field strength, records First test field strength and the Configuration Values for testing corresponding pair of field strength to first；
Step D3: the disconnection of card-reading terminal control first capacitor group is connected to the second capacitance group, is carried out field strength measurement and is obtained To the second test field strength, the Configuration Values that record second tests field strength and tests corresponding pair of field strength to second；
Step D4: card-reading terminal controls the disconnection of the second capacitance group and being connected to for third capacitance group, carries out field strength measurement and obtains Field strength, record third test field strength and the Configuration Values to corresponding pair of field strength of third test are tested to third；
Step D5: the disconnection of card-reading terminal control third capacitance group is connected to the 4th capacitance group, is carried out field strength measurement and is obtained To the 4th test field strength, the Configuration Values that record the 4th tests field strength and tests corresponding pair of field strength to the 4th；
Step D6: card-reading terminal controls the disconnection of the 4th capacitance group, the first adjustment capacitor is connected to second adjustment capacitor, It carries out field strength measurement and obtains the 5th test field strength, the Configuration Values that record the 5th tests field strength and tests corresponding pair of field strength to the 5th；
Step D7: card-reading terminal controls the disconnection of the second capacitance group and being connected to for third capacitance group, carries out field strength measurement and obtains To the 6th test field strength, the Configuration Values that record the 6th tests field strength and tests corresponding pair of field strength to the 6th；
Step D8: the disconnection of card-reading terminal control third capacitance group is connected to the 4th capacitance group, is carried out field strength measurement and is obtained To the 7th test field strength, the Configuration Values that record the 7th tests field strength and tests corresponding pair of field strength to the 7th；
Step D9: card-reading terminal controls the disconnection of first capacitor group and the 4th capacitance group, the second capacitance group and third capacitor Group connection, carry out field strength measurement obtain the 8th test field strength, record the 8th test field strength and to the 8th test field strength it is corresponding right Configuration Values；
Step D10: the disconnection of card-reading terminal control third capacitance group is connected to the 4th capacitance group, is carried out field strength measurement and is obtained To the 9th test field strength, the Configuration Values that record the 9th tests field strength and tests corresponding pair of field strength to the 9th；
Step D11: card-reading terminal controls the disconnection of the second capacitance group and being connected to for third capacitance group, carries out field strength measurement and obtains To the tenth test field strength, the Configuration Values that record the tenth tests field strength and tests corresponding pair of field strength to the tenth；
Step D12: card-reading terminal controls the disconnection of the 4th capacitance group, and first capacitor group is connected to the second capacitance group, into Row field strength measurement obtains the 11st test field strength, the configuration that record the 11st tests field strength and tests corresponding pair of field strength to the 11st Value；
Step D13: the disconnection of card-reading terminal control third capacitance group is connected to the 4th capacitance group, is carried out field strength measurement and is obtained To the 12nd test field strength, the Configuration Values that record the 12nd tests field strength and tests corresponding pair of field strength to the 12nd；
Step D14: card-reading terminal controls the disconnection of third capacitance group, and the connection of third capacitance group carries out field strength measurement and obtains To the 13rd test field strength, the Configuration Values that record the 13rd tests field strength and tests corresponding pair of field strength to the 13rd；
Step D15: the connection of card-reading terminal first capacitor group carries out field strength measurement and obtains the 14th test field strength, record 14th test field strength and the Configuration Values for testing corresponding pair of field strength to the 14th；
Step D16: card-reading terminal compares the size of the 0th test field strength to the 14th test field strength, from the 0th test field strength Full test field strength is selected into the 14th test field strength, executes step 102.
Compared with prior art, the present invention having the advantage that the present invention by constantly adjusting each contactless smart card Capacitor inside card-reading terminal and the card reading test field strength for adjusting contactless smart card card-reading terminal, the card reading after detection adjustment Field strength is tested, so that card reading test field strength is gradually tended to be maximum, to improve the card reading performance of contactless smart card card-reading terminal, makes Card reading performance reaches optimum state, and contactless smart card card-reading terminal antenna hardware Circuit Matching in production detection is greatly decreased The fraction defective of aspect, improves non-contact at the case where avoiding the occurrence of the reduction of card reading performance caused by the device error because of hardware The card reading performance of smart card reader terminal.
Embodiment two
Second embodiment of the present invention provides a kind of working method of contactless smart card card-reading terminal, capacitance group in method Capacitance successively increases, and the described method comprises the following steps:
Step 201: card-reading terminal configures the combination of capacitance group according to the capacitance of capacitance group, according to the combination of capacitance group Configuration sequence successively carries out field strength measurement until finding out full test field strength, when the combination of capacitance group is first in configuration sequence When a, full test field strength is that the test field strength of field strength is tested more than or equal to the latter, executes step 202；When capacitance group Combination be not first in configuration sequence and the last one when, full test field strength is more than or equal to previous test field strength And it is greater than or equal to the test field strength of the latter test field strength, execute step 202；When the combination of capacitance group is in configuration sequence The last one when, full test field strength be more than or equal to it is previous test field strength test field strength, execute step 202；
Step 202: card-reading terminal saves Configuration Values corresponding with full test field strength or configuration and full test field The combination of strong corresponding capacitance group.
Optionally, in step 201, the combination of capacitance group is configured, specifically: card-reading terminal controls capacitance group according to Configuration Values Combined connection and disconnection；
In step 202, configure the combination of corresponding with full test field strength capacitance group, specifically: card-reading terminal according to The combined connection and disconnection of Configuration Values control capacitance group corresponding with full test field strength.
Further, card-reading terminal includes first capacitor group and the second capacitance group；The capacitance of second capacitance group be greater than or Equal to the capacitance of first capacitor group；
201 specifically:
Step M1: card-reading terminal controls the disconnection of first capacitor group and the second capacitance group, carries out field strength measurement and obtains the 0th Test field strength；
Step M2: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the first test field strength, judges Whether the first test field strength is greater than the 0th test field strength, is to then follow the steps M3；Otherwise the 0th test field strength is full test field By force, step 202 is executed；
Step M3: the disconnection of card-reading terminal control first capacitor group is connected to the second capacitance group, is carried out field strength measurement and is obtained To the second test field strength, judge whether the second test field strength is greater than the first test field strength, is to then follow the steps M4；Otherwise it first surveys Examination hall is full test field strength by force, executes step 202；
Step M4: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains third test field strength, judgement Whether third test field strength is greater than the second test field strength, is that then third test field strength is full test field strength, executes step 202； Otherwise the second test field strength is full test field strength, executes step 202.
Further, card-reading terminal includes first capacitor group, the second capacitance group and third capacitance group；The electricity of second capacitance group Capacitance is greater than or equal to the capacitance of the second capacitance group, and the capacitance of third capacitance group is greater than or equal to the capacitor of the second capacitance group Value；
201 specifically:
Step E1: card-reading terminal controls the disconnection of first capacitor group, the second capacitance group and third capacitance group, carries out field strength survey Examination obtains the 0th test field strength；
Step E2: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the first test field strength, judges Whether the first test field strength is greater than the 0th test field strength, is to then follow the steps E3, and otherwise the 0th test field strength is full test field By force, step 202 is executed；
Step E3: the disconnection of card-reading terminal control first capacitor group is connected to the second capacitance group, is carried out field strength measurement and is obtained To the second test field strength, judge whether the second test field strength is greater than the first test field strength, be to then follow the steps E4, otherwise first surveys Examination hall is full test field strength by force, executes step 202；
Step E4: card-reading terminal controls the disconnection of the second capacitance group and being connected to for third capacitance group, carries out field strength measurement and obtains Field strength is tested to third, judges whether third test field strength is greater than the second test field strength, is to then follow the steps E5, otherwise the 2nd 0 Test field strength is full test field strength, executes step 202；
Step E5: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the 4th test field strength, judgement Whether the 4th test field strength is greater than third test field strength, is to then follow the steps E6, and otherwise third test field strength is full test field By force, step 202 is executed；
Step E6: the disconnection of card-reading terminal control first capacitor group is connected to the second capacitance group, is carried out field strength measurement and is obtained To the 5th test field strength, judge whether the 5th test field strength is greater than the 4th test field strength, be to then follow the steps E7, otherwise the 4th surveys Examination hall is full test field strength by force, executes step 202；
Step E7: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the 6th test field strength, judgement Whether the 6th test field strength is greater than the 5th test field strength, is that then the 6th test field strength is full test field strength, executes step 202, Otherwise the 5th test field strength is full test field strength, executes step 202.
Further, card-reading terminal includes first capacitor group, the second capacitance group, third capacitance group and the 4th capacitance group；The The capacitance of two capacitance groups is greater than or equal to the capacitance of the second capacitance group, and the capacitance of third capacitance group is greater than or equal to second The capacitance of capacitance group, the capacitance of the 4th capacitance group are greater than or equal to the capacitance of third capacitance group；
Step 201 specifically includes the following steps:
Step F1: card-reading terminal controls the disconnected of first capacitor group, the second capacitance group, third capacitance group and the 4th capacitance group It opens, carries out field strength measurement and obtain the 0th test field strength；
Step F2: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the first test field strength, judges Whether the first test field strength is greater than the 0th test field strength, is to then follow the steps F3, and otherwise the 0th test field strength is full test field By force, step 202 is executed；
Step F3: the disconnection of card-reading terminal control first capacitor group is connected to the second capacitance group, is carried out field strength measurement and is obtained To the second test field strength, judge whether the second test field strength is greater than the first test field strength, be to then follow the steps F4, otherwise first surveys Examination hall is full test field strength by force, executes step 202；
Step F4: card-reading terminal controls the disconnection of the second capacitance group and being connected to for third capacitance group, carries out field strength measurement and obtains Field strength is tested to third, judges whether third test field strength is greater than the second test field strength, is to then follow the steps F5, otherwise the 2nd 0 Test field strength is full test field strength, executes step 202；
Step F5: the disconnection of card-reading terminal control third capacitance group is connected to the 4th capacitance group, is carried out field strength measurement and is obtained To the 4th test field strength, judge whether the 4th test field strength is greater than third test field strength, is to then follow the steps F6, otherwise third is surveyed Examination hall is full test field strength by force, executes step 202；
Step F6: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the 5th test field strength, judgement Whether the 5th test field strength is greater than the 4th test field strength, is to then follow the steps F7, and otherwise the 4th test field strength is full test field By force, step 202 is executed；
Step F7: the disconnection of card-reading terminal control first capacitor group is connected to the second capacitance group, is carried out field strength measurement and is obtained To the 6th test field strength, judge whether the 6th test field strength is greater than the 5th test field strength, be to then follow the steps F8, otherwise the 5th surveys Examination hall is full test field strength by force, executes step 202；
Step F8: card-reading terminal controls the disconnection of the second capacitance group and being connected to for third capacitance group, carries out field strength measurement and obtains To the 7th test field strength, judge whether the 7th test field strength is greater than the 5th test field strength, be to then follow the steps F9, otherwise the 6th surveys Examination hall is full test field strength by force, executes step 202；
Step F9: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the 8th test field strength, judgement Whether the 8th test field strength is greater than the 7th test field strength, is to then follow the steps F10, and otherwise the 7th test field strength is full test field By force, step 202 is executed；
Step F10: the disconnection of card-reading terminal control first capacitor group is connected to the second capacitance group, is carried out field strength measurement and is obtained To the 9th test field strength, judge whether the 9th test field strength is greater than the 8th and tests field strength, is to then follow the steps F11, otherwise the 8th Test field strength is full test field strength, executes step 202；
Step F11: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the tenth test field strength, sentences Whether disconnected tenth test field strength is greater than the 9th test field strength, is that then the tenth test field strength is full test field strength, executes step 202；Otherwise the 9th test field strength is full test field strength, executes step 202.
Compared with prior art, the present invention having the advantage that the present invention by constantly adjusting each contactless smart card The card reading of the internal capacitance adjustment contactless smart card card-reading terminal of card-reading terminal tests field strength, and the card reading after detection adjustment is surveyed Examination hall is strong, so that card reading test field strength is gradually tended to be maximum, to improve the card reading performance of contactless smart card card-reading terminal, makes to read Card performance reaches optimum state, and contactless smart card card-reading terminal antenna hardware Circuit Matching side in production detection is greatly decreased The fraction defective in face avoids the reduction of card reading performance caused by the device error of hardware, improves contactless smart card card-reading terminal Card reading performance.
Embodiment three
The embodiment of the present invention three provides a kind of working method of contactless smart card card-reading terminal, as described in Figure 2, connects non- Increase multiple capacitance groups in touching smart card reader terminal, changes the big of the total capacitance in card-reading terminal circuit by capacitance group It is small, gradually make the card reading performance of contactless smart card card-reading terminal reach best；When detection obtains optimal test field strength and complete When at test, Configuration Values are for recording the capacitance group corresponding with optimal test field strength measured, and card-reading terminal is according to measuring The corresponding Configuration Values of corresponding with optimal test field strength capacitance group, according to controlling, Configuration Values corresponding with optimal field strength are opposite The combined connection and disconnection for the capacitance group answered, so that the card reading performance of card-reading terminal reaches best；Or wait until card-reading terminal When need to carry out card reading again and be initialized, capacitance group corresponding with the Configuration Values saved is directly opened, so that card reading is whole The card reading performance at end reaches best；
In the present embodiment, increase by four capacitance groups, i.e. first capacitor group, the second capacitance group, third capacitance group and the 4th electricity The capacitance of appearance group, capacitance group successively becomes larger；As shown in Fig. 2, the described method comprises the following steps:
Step 301: card-reading terminal controls the disconnection of four capacitance groups, carries out field strength measurement and obtains the 0th test field strength；
Step 302: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the first test field strength；Sentence Whether disconnected first test field strength is greater than the 0th test field strength, is to then follow the steps 303；Otherwise the 0th test field strength is full test Field strength saves Configuration Values corresponding with the 0th test field strength, completes field strength measurement；
Step 303: the disconnection of card-reading terminal control first capacitor group is connected to the second capacitance group, is carried out field strength measurement and is obtained To the second test field strength；Judge whether the second test field strength is greater than the first test field strength, is to then follow the steps 304；Otherwise first Test field strength is full test field strength, saves Configuration Values corresponding with the first test field strength, completes field strength measurement；
Step 304: card-reading terminal controls the disconnection of the second capacitance group and being connected to for third capacitance group, carries out field strength measurement and obtains Field strength is tested to third；Judge whether third test field strength is greater than the second test field strength, is to then follow the steps 305；Otherwise second Test field strength is full test field strength, saves Configuration Values corresponding with the second test field strength, completes field strength measurement；
Step 305: the disconnection of card-reading terminal control third capacitance group is connected to the 4th capacitance group, is carried out field strength measurement and is obtained To the 4th test field strength；Judge whether the 4th test field strength is greater than third test field strength, is to then follow the steps 306；Otherwise third Test field strength is full test field strength, saves Configuration Values corresponding with third test field strength, completes field strength measurement；
Step 306: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the 5th test field strength；Sentence Whether disconnected 5th test field strength is greater than the 4th test field strength of preservation, is to then follow the steps 307；Otherwise the 4th test field strength is most Big test field strength saves Configuration Values corresponding with the 4th test field strength, completes field strength measurement；
Step 307: the disconnection of card-reading terminal control first capacitor group is connected to the second capacitance group, is carried out field strength measurement and is obtained To the 6th test field strength；Judge whether the 6th test field strength is greater than the 5th test field strength, is to then follow the steps 308；Otherwise the 5th Test field strength is full test field strength, saves Configuration Values corresponding with the 5th test field strength, completes field strength measurement；
Step 308: card-reading terminal controls the disconnection of the second capacitance group and being connected to for third capacitance group, carries out field strength measurement and obtains To the 7th test field strength；Judge whether the 7th test field strength is greater than the 6th test field strength, is to then follow the steps 309；Otherwise the 6th Test field strength is full test field strength, saves Configuration Values corresponding with the 6th test field strength, completes field strength measurement；
Step 309: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the 8th test field strength；Sentence Whether disconnected 8th test field strength is greater than the 7th test field strength, is to then follow the steps 310；Otherwise the 7th test field strength is full test Field strength saves Configuration Values corresponding with the 7th test field strength, completes field strength measurement；
Step 310: the disconnection of card-reading terminal control first capacitor group is connected to the second capacitance group, is carried out field strength measurement and is obtained To the 9th test field strength；Judge whether the 9th test field strength is greater than the 8th test field strength, is to then follow the steps 311；Otherwise the 8th Test field strength is full test field strength, saves Configuration Values corresponding with the 8th test field strength, completes field strength measurement；
Step 311: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the tenth test field strength；Sentence Whether disconnected the tenth obtained test field strength is greater than the 9th test field strength of preservation, is that then the tenth test field strength is full test field By force, Configuration Values corresponding with the tenth test field strength are saved, field strength measurement is completed；Otherwise the 9th test field strength is full test field By force, Configuration Values corresponding with the 9th test field strength are saved, field strength measurement is completed；
Method in the present embodiment can be carried out when producing card-reading terminal, directly be carried out when actually using card-reading terminal Initialization, according to the Configuration Values of preservation control the corresponding capacitance group of corresponding with optimal field strength Configuration Values combined connection and It disconnects, so that the card reading performance of card-reading terminal reaches best；
Method in the present embodiment can carry out in actual use, survey when actually using card-reading terminal with according to maximum Corresponding Configuration Values control the combined connection of the corresponding capacitance group of corresponding with full test field strength Configuration Values by force in examination hall And disconnection；At this time the Configuration Values in step do not have to save, directly according to Configuration Values corresponding with full test field strength control with The combined connection and disconnection of the corresponding capacitance group of Configuration Values.
Compared with prior art, the present invention having the advantage that the present invention by constantly adjusting each contactless smart card The card reading of the internal capacitance adjustment contactless smart card card-reading terminal of card-reading terminal tests field strength, and the card reading after detection adjustment is surveyed Examination hall is strong, so that card reading test field strength is gradually tended to be maximum, to improve the card reading performance of contactless smart card card-reading terminal, makes to read Card performance reaches optimum state, and contactless smart card card-reading terminal antenna hardware Circuit Matching side in production detection is greatly decreased The fraction defective in face avoids the reduction of card reading performance caused by the device error of hardware, improves contactless smart card card-reading terminal Card reading performance.
Example IV
The embodiment of the present invention four provides a kind of working method of contactless smart card card-reading terminal, increases multiple groups capacitance group, The size of every group of adjustment capacitor does not have permanent order, changes the big of the total capacitance in card-reading terminal circuit by adjusting capacitor It is small, so that the card reading performance of non-contact card card-reading terminal reaches most preferably, when detection obtains optimal test field strength and completes test, Configuration Values are used to record the capacitance group corresponding with test field strength measured, and card-reading terminal saves corresponding with optimal test field strength Configuration Values, until card-reading terminal need to carry out card reading again and be initialized, open and save with optimal test field strength The corresponding capacitance group of corresponding Configuration Values, so that the card reading performance of card-reading terminal reaches best；
In the present embodiment, increase n group capacitance group, i.e. first capacitor group, second the n-th capacitance group of capacitance group ...；When n is determined When, one shares 2nThe combination of a capacitance group；Configuration Values are mutually corresponded with the resulting test field intensity value of field strength measurement is carried out；This reality Apply a method the following steps are included:
Step 401: card-reading terminal is initialized；
Step 402: card-reading terminal passes through control 2nThe combined connection of a capacitance group carries out field strength measurement with disconnection and selects Full test field strength is selected out, and records the combined Configuration Values of capacitance group corresponding with full test field strength；
For example, in the present embodiment, when n=1, step 402 specifically:
Step a0: card-reading terminal controls the disconnection of first capacitor group, carries out field strength measurement and obtains the 0th test field strength, record 0th test field strength and zero configuration value corresponding with the 0th test field strength；
Step a1: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the first test field strength, records First test field strength and the first Configuration Values corresponding with the first test field strength；
Step a2: card-reading terminal compares the first test field strength and the 0th test field strength, therefrom selects full test field strength, Save the Configuration Values with the full test field strength corresponding record of selection；
Optionally, step a2 specifically: card-reading terminal judges whether the first test field strength is greater than the 0th test field strength, is then Step p1 is executed, it is no to then follow the steps p2；
Step p1: card-reading terminal saves the first Configuration Values with the first test field strength corresponding record；
Step p2: card-reading terminal saves the zero configuration value with the 0th test field strength corresponding record.
For example, in the present embodiment, when n=3, step 402 specifically:
Step b0: card-reading terminal controls the disconnection of first capacitor group, the second capacitance group and third capacitance group, carries out field strength survey Examination obtains the 0th test field strength, the 0th test field strength of record and zero configuration value corresponding with the 0th test field strength；
Step b1: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the first test field strength, records First test field strength and the first Configuration Values corresponding with the first test field strength；
Step b2: the disconnection of card-reading terminal control first capacitor group is connected to the second capacitance group of control, carries out field strength survey Examination obtains the second test field strength, record the second Configuration Values corresponding with the second test field strength；
Step b3: card-reading terminal controls the disconnection of the second capacitance group, controls the connection of third capacitance group, carries out field strength measurement Obtain third test field strength, record third Configuration Values corresponding with third test field strength；
Step b4: card-reading terminal controls the disconnection of third capacitance group, controls the company of the first adjustment capacitor and first capacitor group It is logical, it carries out field strength measurement and obtains the 4th test field strength, record the 4th Configuration Values corresponding with the 4th test field strength；
Step b5: card-reading terminal controls the disconnection of the second capacitance group, controls the connection of third capacitance group, carries out field strength measurement Obtain the 5th test field strength, record the 5th Configuration Values corresponding with the 5th test field strength；
Step b6: card-reading terminal controls the disconnection of first capacitor group, controls the connection of the second capacitance group, carries out field strength measurement Obtain the 6th test field strength, record the 6th Configuration Values corresponding with the 6th test field strength；
Step b7: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the 7th test field strength, record The 7th Configuration Values corresponding with the 7th test field strength；
Step b8: card-reading terminal compares the 0th test field strength to the 7th test field strength, therefrom selects full test field strength, Save the Configuration Values with the full test field strength corresponding record of selection；
For example, in the present embodiment, when n=5, step 402 specifically:
Step c0: card-reading terminal controls the disconnection of first capacitor group to the 5th capacitance group, carries out field strength measurement and obtains the 0th Test field strength, the 0th test field strength of record and zero configuration value corresponding with the 0th test field strength；
Step c1: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the first test field strength, records First test field strength and the first Configuration Values corresponding with the first test field strength；
Step c2: card-reading terminal controls the disconnection of first capacitor group, controls the connection of the second capacitance group, carries out field strength measurement Obtain the second test field strength, record the second Configuration Values corresponding with the second test field strength；
Step c3: card-reading terminal controls the disconnection of the second capacitance group, controls the connection of third capacitance group, carries out field strength measurement Obtain third test field strength, record third Configuration Values corresponding with third test field strength；
Step c4: card-reading terminal controls the disconnection of third capacitance group, controls the connection of the 4th capacitance group, carries out field strength measurement Obtain the 4th test field strength, record the 4th Configuration Values corresponding with the 4th test field strength；
Step c5: card-reading terminal controls the disconnection of the 4th capacitance group, and the connection of the 5th capacitance group of connection of control carries out field Strong test obtains the 5th test field strength, record the 5th Configuration Values corresponding with the 5th test field strength；
Step c6: card-reading terminal controls the disconnection of the 5th capacitance group, controls the company of the first adjustment capacitor and the second capacitance group It is logical, it carries out field strength measurement and obtains the 6th test field strength, record the 6th Configuration Values corresponding with the 6th test field strength；
Step c7: card-reading terminal controls the disconnection of the second capacitance group, controls the connection of third capacitance group, carries out field strength measurement Obtain the 7th test field strength, record the 7th Configuration Values corresponding with the 7th test field strength；
Step c8: card-reading terminal controls the disconnection of third capacitance group, controls the connection of the 4th capacitance group, carries out field strength measurement Obtain the 8th test field strength, record the 8th Configuration Values corresponding with the 8th test field strength；
Step c9: card-reading terminal controls the disconnection of the 4th capacitance group, controls the connection of the 5th capacitance group, carries out field strength measurement Obtain the 9th test field strength, record the 9th Configuration Values corresponding with the 9th test field strength；
Step c10: card-reading terminal controls the disconnection of first capacitor group and the 5th capacitance group, controls the second capacitance group and third The connection of capacitance group carries out field strength measurement and obtains the tenth test field strength, record the tenth configuration corresponding with the tenth test field strength Value；
Step c11: card-reading terminal controls the disconnection of third capacitance group, controls the connection of the 4th capacitance group, carries out field strength survey Examination obtains the 11st test field strength, record the 11st Configuration Values corresponding with the 11st test field strength；
Step c12: card-reading terminal controls the disconnection of the 4th capacitance group, controls the connection of the 5th capacitance group, carries out field strength survey Examination obtains the 12nd test field strength, record the 12nd Configuration Values corresponding with the 12nd test field strength；
Step c13: card-reading terminal controls the disconnection of the second capacitance group and the 5th capacitance group, controls third capacitance group and the 4th The connection of capacitance group carries out field strength measurement and obtains the 13rd test field strength, and record tests field strength the corresponding tenth with the 13rd Three Configuration Values；
Step c14: card-reading terminal controls the disconnection of the 4th capacitance group, controls the connection of the 5th capacitance group, carries out field strength survey Examination obtains the 14th test field strength, record the 14th Configuration Values corresponding with the 14th test field strength；
Step c15: card-reading terminal controls the disconnection of third capacitance group, controls the connection of the 4th capacitance group, carries out field strength survey Examination obtains the 15th test field strength, record the 15th Configuration Values corresponding with the 15th test field strength；
Step c16: card-reading terminal controls the disconnection of the 4th capacitance group and the 5th capacitance group, controls first capacitor group, second Capacitance group is connected to third capacitance group, is carried out field strength measurement and is obtained the 16th test field strength, record and the 16th test field strength Corresponding 16th Configuration Values；
Step c17: card-reading terminal controls the disconnection of third capacitance group, controls the connection of the 4th capacitance group, carries out field strength survey Examination obtains the 17th test field strength, record the 17th Configuration Values corresponding with the 17th test field strength；
Step c18: card-reading terminal controls the disconnection of the 4th capacitance group, controls the connection of the 5th capacitance group, carries out field strength survey Examination obtains the 18th test field strength, record the 18th Configuration Values corresponding with the 18th test field strength；
Step c19: card-reading terminal controls the disconnection of the second capacitance group and the 5th capacitance group, controls third capacitance group and the 4th The connection of capacitance group carries out field strength measurement and obtains the 19th test field strength, and record tests field strength the corresponding tenth with the 19th Nine Configuration Values；
Step c20: card-reading terminal controls the disconnection of the 4th capacitance group, controls the connection of the 5th capacitance group, carries out field strength survey Examination obtains the 20th test field strength, record the 20th Configuration Values corresponding with the 20th test field strength；
Step c21: card-reading terminal controls the disconnection of third capacitance group, controls the connection of the 4th capacitance group, carries out field strength survey Examination obtains the 21st test field strength, record the 21st Configuration Values corresponding with the 21st test field strength；
Step c22: card-reading terminal controls the disconnection of first capacitor group and the 5th capacitance group, controls the second capacitance group and third The connection of capacitance group carries out field strength measurement and obtains the 22nd test field strength, and record is corresponding with the 22nd test field strength 22nd Configuration Values；
Step c23: card-reading terminal controls the disconnection of the 4th capacitance group, controls the connection of the 5th capacitance group, carries out field strength survey Examination obtains the 23rd test field strength, record the 23rd Configuration Values corresponding with the 23rd test field strength；
Step c24: card-reading terminal controls the disconnection of third capacitance group, controls the connection of the 4th capacitance group, carries out field strength survey Examination obtains the 24th test field strength, record the 24th Configuration Values corresponding with the 24th test field strength；
Step c25: card-reading terminal controls the disconnection of the second capacitance group, controls the connection of third capacitance group, carries out field strength survey Examination obtains the 25th test field strength, record the 25th Configuration Values corresponding with the 25th test field strength；
Step c26: card-reading terminal controls the disconnection of the 5th capacitance group, controls the company of first capacitor group and the second capacitance group It is logical, it carries out field strength measurement and obtains the 26th test field strength, record is matched with the 26th test field strength the corresponding 26th Set value；
Step c27: card-reading terminal controls the disconnection of the 4th capacitance group, controls the connection of the 5th capacitance group, carries out field strength survey Examination obtains the 27th test field strength, record the 27th Configuration Values corresponding with the 27th test field strength；
Step c28: card-reading terminal controls the disconnection of third capacitance group, controls the connection of the 4th capacitance group, carries out field strength survey Examination obtains the 28th test field strength, record the 28th Configuration Values corresponding with the 28th test field strength；
Step c29: card-reading terminal controls the disconnection of the second capacitance group, controls the connection of third capacitance group, carries out field strength survey Examination obtains the 29th test field strength, record the 29th Configuration Values corresponding with the 29th test field strength；
Step c30: card-reading terminal controls the disconnection of first capacitor group, controls the connection of the second capacitance group, carries out field strength survey Examination obtains the 30th test field strength, record the 30th Configuration Values corresponding with the 30th test field strength；
Step c31: card-reading terminal controls the connection of first capacitor group, carries out field strength measurement and obtains the 31st checkout area By force, record the 31st Configuration Values corresponding with the 31st test field strength；
Step c32: card-reading terminal compares the size of the 0th test field strength to the 31st test field strength, therefrom selects most Big test field strength, saves the Configuration Values with the full test field strength corresponding record of selection；
Method in the present embodiment can be carried out when producing card-reading terminal, directly be carried out when actually using card-reading terminal Initialization, the combined connection and disconnection of the corresponding capacitance group of control Configuration Values corresponding with full test field strength, so that reading The card reading performance of card terminal reaches best；
Method in the present embodiment can carry out in actual use, survey when actually using card-reading terminal with according to maximum Corresponding Configuration Values control the combined connection of the corresponding capacitance group of corresponding with full test field strength Configuration Values by force in examination hall And disconnection；At this time the Configuration Values in step do not have to save, directly according to Configuration Values corresponding with full test field strength control with The combined connection and disconnection of the corresponding capacitance group of Configuration Values.
Whether the tenth test field strength that card-reading terminal judges is greater than the 9th test field strength of preservation, is to complete field strength Test, the combined connection and disconnection of the corresponding capacitance group of control Configuration Values corresponding with the tenth test field strength；Otherwise complete At field strength measurement, the combined connection and disconnection of the corresponding capacitance group of control Configuration Values corresponding with the 9th test field strength.
Compared with prior art, the present invention having the advantage that the present invention by constantly adjusting each contactless smart card The card reading of the internal capacitance adjustment contactless smart card card-reading terminal of card-reading terminal tests field strength, and the card reading after detection adjustment is surveyed Examination hall is strong, so that card reading test field strength is gradually tended to be maximum, to improve the card reading performance of contactless smart card card-reading terminal, makes to read Card performance reaches optimum state, and contactless smart card card-reading terminal antenna hardware Circuit Matching side in production detection is greatly decreased The fraction defective in face avoids the reduction of card reading performance caused by the device error of hardware, improves contactless smart card card-reading terminal Card reading performance.
Embodiment five
The embodiment of the present invention five provides a kind of contactless smart card card-reading terminal, as shown in figure 3, include input circuit 501, Output circuit 502, power supply circuit 503, MCU504, field strength measurement circuit 505, further, in this embodiment, it further include adjustment Condenser network 506, adjustment condenser network 506 include at least a capacitance group；
Input circuit 501 is connect with power supply circuit 503 and MCU504；
Further, in this embodiment input circuit 501 includes a key；
Output circuit 502 is connect with power supply circuit 503 and MCU504；
Further, in this embodiment output circuit 502 includes a display screen；
Power supply circuit 503 is connect with input circuit 501, output circuit 502, MCU504, field strength measurement circuit 505；
MCU504 is connect with input circuit 501, output circuit 502, power supply circuit 503 and field strength measurement circuit 505；
Field strength measurement circuit 505 is connect with power supply circuit 503, MCU504 and adjustment condenser network 506；
Condenser network 506 is adjusted, is connect with field strength measurement circuit 505；
In the present embodiment, micro-control unit (Microcontroller Unit；MCU), also known as one chip microcomputer (Single Chip Microcomputer) or single-chip microcontroller are central processing unit (Central Process Unit； CPU frequency) and specification do appropriate reduction, and by perimeter interfaces or even the LCD such as memory (memory) and counter (Timer) Driving circuit all integrates the computer for forming chip-scale on a single chip, does various combination control for different applications.
Compared with prior art, the present invention having the advantage that the present invention by constantly adjusting each contactless smart card The card reading of the internal capacitance adjustment contactless smart card card-reading terminal of card-reading terminal tests field strength, and the card reading after detection adjustment is surveyed Examination hall is strong, so that card reading test field strength is gradually tended to be maximum, to improve the card reading performance of contactless smart card card-reading terminal, makes to read Card performance reaches optimum state, and contactless smart card card-reading terminal antenna hardware Circuit Matching side in production detection is greatly decreased The fraction defective in face avoids the reduction of card reading performance caused by the device error of hardware, improves contactless smart card card-reading terminal Card reading performance.
The foregoing is only a preferred embodiment of the present invention, but scope of protection of the present invention is not limited thereto, Anyone skilled in the art is in technical scope disclosed by the invention, and any changes or substitutions that can be easily thought of, It should be covered by the protection scope of the present invention.Therefore, protection scope of the present invention should be with scope of protection of the claims Subject to.

Claims (14)

1. a kind of working method of contactless smart card card-reading terminal, which comprises the following steps:
Step S1: card-reading terminal carries out field strength measurement by configuring the combination of capacitance group, records all by configuring capacitance group Combination carries out the test field strength and Configuration Values corresponding with obtained all test field strength difference that field strength measurement obtains；From all Full test field strength is selected in test field strength；
Step S2: the card-reading terminal saves Configuration Values corresponding with the full test field strength or configuration and the maximum Test the combination of the corresponding capacitance group of field strength.
2. the method as described in claim 1, which is characterized in that in the step S1, the combination of the configuration capacitance group, specifically Are as follows: the card-reading terminal controls the combined connection and disconnection of capacitance group according to Configuration Values；
In the step S2, the combination for configuring capacitance group corresponding with the full test field strength, specifically: the reading Card terminal controls the combined connection and disconnection of capacitance group according to Configuration Values corresponding with the full test field strength.
3. method according to claim 2, which is characterized in that the card-reading terminal only includes first capacitor group；
The step S1 is specifically included:
Step A1: the disconnection of the card-reading terminal control first capacitor group carries out field strength measurement and obtains the 0th test field strength, record The 0th test field strength and the Configuration Values for testing corresponding pair of field strength to the described 0th；
Step A2: the card-reading terminal controls the connection of the first capacitor group, carries out field strength measurement and obtains the first test field strength, The Configuration Values for recording the first test field strength and testing corresponding pair of field strength to described first；
Step A3: the size of the card-reading terminal the 0th test field strength and the first test field strength, when described the One checkout area is powerful when the 0th test field strength, and the first test field strength is full test field strength, executes step S2；When When 0th checkout area is more than or equal to by force the first test field strength, the 0th test field strength is full test field By force, step S2 is executed.
4. method according to claim 2, which is characterized in that the card-reading terminal includes first capacitor group and the second capacitor Group；
The step S1 specifically includes the following steps:
Step B1: the card-reading terminal controls the disconnection of the first capacitor group and second capacitance group, carries out field strength measurement The 0th test field strength is obtained, the Configuration Values for recording the 0th test field strength and testing corresponding pair of field strength to the described 0th；
Step B2: the card-reading terminal controls the connection of the first capacitor group, carries out field strength measurement and obtains the first test field strength, The Configuration Values for recording the first test field strength and testing corresponding pair of field strength to described first；
Step B3: the card-reading terminal controls the disconnection of the first capacitor group and being connected to for second capacitance group, carries out field Strong test obtains the second test field strength, the configuration for recording the second test field strength and testing corresponding pair of field strength to described second Value；
Step B4: the card-reading terminal controls the connection of the first capacitor group, carries out field strength measurement and obtains third test field strength, Record the third test field strength and the Configuration Values to corresponding pair of field strength of third test；
Step B5: the card-reading terminal the more described 0th tests field strength, the first test field strength, the second test field strength With the size of third test field strength, field strength is tested from the 0th test field strength, the first test field strength, described second Full test field strength is selected in third test field strength, executes step S2.
5. method according to claim 2, which is characterized in that the card-reading terminal includes first capacitor group, the second capacitance group With third capacitance group；
The step S1 specifically includes the following steps:
Step C1: the card-reading terminal controls the disconnected of the first capacitor group, second capacitance group and the third capacitance group It opens, carries out field strength measurement and obtain the 0th test field strength, record the 0th test field strength and test field strength to the described 0th and is corresponding Pair Configuration Values；
Step C2: the card-reading terminal controls the connection of the first capacitor group, carries out field strength measurement and obtains the first test field strength, The Configuration Values for recording the first test field strength and testing corresponding pair of field strength to described first；
Step C3: the card-reading terminal controls the disconnection of the first capacitor group and being connected to for second capacitance group, carries out field Strong test obtains the second test field strength, the configuration for recording the second test field strength and testing corresponding pair of field strength to described second Value；
Step C4: the card-reading terminal controls the disconnection of second capacitance group and being connected to for the third capacitance group, carries out field Strong test obtains the third test field strength, records the third test field strength and corresponding to third test field strength to matching Set value；
Step C5: the card-reading terminal controls disconnection, the first capacitor group and second capacitor of the third capacitance group Group connection, carry out field strength measurement obtain the 4th test field strength, record it is described 4th test field strength and with the 4th checkout area The Configuration Values of strong mutually reply；
Step C6: the card-reading terminal controls the disconnection of second capacitance group and being connected to for the third capacitance group, carries out field Strong test obtains the 5th test field strength, the configuration for recording the 5th test field strength and testing corresponding pair of field strength to the described 5th Value；
Step C7: the card-reading terminal controls the disconnection of the first capacitor group and being connected to for second capacitance group, carries out field Strong test obtains the 6th test field strength, the configuration for recording the 6th test field strength and testing corresponding pair of field strength to the described 6th Value；
Step C8: the card-reading terminal controls the connection of the first capacitor group, carries out field strength measurement and obtains the 7th test field strength, The Configuration Values for recording the 7th test field strength and testing corresponding pair of field strength to the described 7th；
Step C9: the card-reading terminal the more described 0th tests field strength, the first test field strength, second checkout area By force, third test field strength, the 4th test field strength, the 5th test field strength, the 6th test field strength and described The size of 7th test field strength, from the 0th test field strength, the first test field strength, the second test field strength, described Third tests field strength, the 4th test field strength, the 5th test field strength, the 6th test field strength and the 7th test Full test field strength is selected in field strength, executes step S2.
6. method according to claim 2, which is characterized in that the card-reading terminal include first capacitor group, the second capacitance group, Third capacitance group and the 4th capacitance group；
The step S1 specifically includes the following steps:
Step D1: the card-reading terminal controls the first capacitor group, second capacitance group, the third capacitance group and described The disconnection of 4th capacitance group carries out field strength measurement and obtains the 0th test field strength, records the 0th test field strength and with described the The Configuration Values of zero corresponding pair of field strength of test；
Step D2: the card-reading terminal controls the connection of the first capacitor group, carries out field strength measurement and obtains the first test field strength, The Configuration Values for recording the first test field strength and testing corresponding pair of field strength to described first；
Step D3: the card-reading terminal controls the disconnection of the first capacitor group and being connected to for second capacitance group, carries out field Strong test obtains the second test field strength, the configuration for recording the second test field strength and testing corresponding pair of field strength to described second Value；
Step D4: the card-reading terminal controls the disconnection of second capacitance group and being connected to for the third capacitance group, carries out field Strong test obtains third test field strength, records the third test field strength and the configuration to corresponding pair of field strength of third test Value；
Step D5: the card-reading terminal controls the disconnection of the third capacitance group and being connected to for the 4th capacitance group, carries out field Strong test obtains the 4th test field strength, the configuration for recording the 4th test field strength and testing corresponding pair of field strength to the described 4th Value；
Step D6: the card-reading terminal controls the disconnection of the 4th capacitance group, the first adjustment capacitor and described second is adjusted The connection of whole capacitor carries out field strength measurement and obtains the 5th test field strength, records the 5th test field strength and surveys with the described 5th The Configuration Values that examination hall is mutually coped with by force；
Step D7: the card-reading terminal controls the disconnection of second capacitance group and being connected to for the third capacitance group, carries out field Strong test obtains the 6th test field strength, the configuration for recording the 6th test field strength and testing corresponding pair of field strength to the described 6th Value；
Step D8: the card-reading terminal controls the disconnection of the third capacitance group and being connected to for the 4th capacitance group, carries out field Strong test obtains the 7th test field strength, the configuration for recording the 7th test field strength and testing corresponding pair of field strength to the described 7th Value；
Step D9: the card-reading terminal controls the disconnection of the first capacitor group and the 4th capacitance group, second capacitor Group and the third capacitance group are connected to, and are carried out field strength measurement and are obtained the 8th test field strength, record the 8th test field strength with To the Configuration Values of the 8th corresponding pair of field strength of the test；
Step D10: the card-reading terminal controls the disconnection of the third capacitance group and being connected to for the 4th capacitance group, carries out field Strong test obtains the 9th test field strength, the configuration for recording the 9th test field strength and testing corresponding pair of field strength to the described 9th Value；
Step D11: the card-reading terminal controls the disconnection of second capacitance group and being connected to for the third capacitance group, carries out field Strong test obtains the tenth test field strength, the configuration for recording the tenth test field strength and testing corresponding pair of field strength to the described tenth Value；
Step D12: the card-reading terminal controls the disconnection of the 4th capacitance group, the first capacitor group and second capacitor The connection of group carries out field strength measurement and obtains the 11st test field strength, records the 11st test field strength and with the described 11st The Configuration Values of corresponding pair of field strength of test；
Step D13: the card-reading terminal controls the disconnection of the third capacitance group and being connected to for the 4th capacitance group, carries out field Strong test obtains the 12nd test field strength, records the 12nd test field strength and tests corresponding pair of field strength to the described 12nd Configuration Values；
Step D14: the card-reading terminal controls the disconnection of the third capacitance group, and the connection of the third capacitance group carries out field Strong test obtains the 13rd test field strength, records the 13rd test field strength and tests corresponding pair of field strength to the described 13rd Configuration Values；
Step D15: the connection of first capacitor group described in the card-reading terminal carries out field strength measurement and obtains the 14th test field strength, The Configuration Values for recording the 14th test field strength and testing corresponding pair of field strength to the described 14th；
Step D16: the size of the card-reading terminal the 0th test field strength to the 14th test field strength, from described 0th test field strength selects full test field strength into the 14th test field strength, executes step S2.
7. a kind of working method of contactless smart card card-reading terminal, which is characterized in that the capacitor of the capacitance group in the method Value successively increases, and the described method comprises the following steps:
Step G1: the card-reading terminal configures the combination of capacitance group according to the capacitance of capacitance group, according to the combination of capacitance group Configuration sequence successively carries out field strength measurement until finding out full test field strength, when the combination of capacitance group is first in configuration sequence When a, the full test field strength is that the test field strength of field strength is tested more than or equal to the latter, executes step G2；Work as capacitance group Combination be not first in configuration sequence and the last one when, the full test field strength is more than or equal to previous survey Examination hall is strong and is greater than or equal to the test field strength of the latter test field strength, executes step G2；When the combination of capacitance group is that configuration is suitable When the last one in sequence, the full test field strength is to execute step more than or equal to the test field strength of previous test field strength Rapid G2；
Step G2: the card-reading terminal saves Configuration Values corresponding with the full test field strength or configuration and the maximum Test the combination of the corresponding capacitance group of field strength.
8. the method as described in claim 1, which is characterized in that in the step G1, the combination of the configuration capacitance group, specifically Are as follows: the card-reading terminal controls the combined connection and disconnection of capacitance group according to Configuration Values；
In the step G2, the combination for configuring capacitance group corresponding with the full test field strength, specifically: the reading Card terminal controls the combined connection and disconnection of capacitance group according to Configuration Values corresponding with the full test field strength.
9. method according to claim 8, which is characterized in that the card-reading terminal includes first capacitor group and the second capacitor Group；The capacitance of second capacitance group is greater than or equal to the capacitance of the first capacitor group；
The G1 specifically:
Step M1: the card-reading terminal controls the disconnection of the first capacitor group and second capacitance group, carries out field strength measurement Obtain the 0th test field strength；
Step M2: the card-reading terminal controls the connection of the first capacitor group, carries out field strength measurement and obtains the first test field strength, Judge whether the first test field strength is greater than the 0th test field strength, is to then follow the steps M3；Otherwise the 0th test Field strength is full test field strength, executes step G2；
Step M3: the card-reading terminal controls the disconnection of the first capacitor group and being connected to for second capacitance group, carries out field Strong test obtains the second test field strength, judges whether the second test field strength is greater than the first test field strength, is to execute Step M4；Otherwise the first test field strength is full test field strength, executes step G2；
Step M4: the card-reading terminal controls the connection of the first capacitor group, carries out field strength measurement and obtains third test field strength, Judge whether the third test field strength is greater than the second test field strength, be that then third test field strength is full test field strength, Execute step G2；Otherwise the second test field strength is full test field strength, executes step G2.
10. method according to claim 8, which is characterized in that the card-reading terminal includes first capacitor group, the second capacitance group With third capacitance group；The capacitance of second capacitance group is greater than or equal to the capacitance of second capacitance group, the third The capacitance of capacitance group is greater than or equal to the capacitance of second capacitance group；
The G1 specifically:
Step E1: the card-reading terminal controls the disconnected of the first capacitor group, second capacitance group and the third capacitance group It opens, carries out field strength measurement and obtain the 0th test field strength；
Step E2: the card-reading terminal controls the connection of the first capacitor group, carries out field strength measurement and obtains the first test field strength, Judge whether the first test field strength is greater than the 0th test field strength, be to then follow the steps E3, otherwise the 0th test Field strength is full test field strength, executes step G2；
Step E3: the card-reading terminal controls the disconnection of the first capacitor group and being connected to for second capacitance group, carries out field Strong test obtains the second test field strength, judges whether the second test field strength is greater than the first test field strength, is to execute Step E4, otherwise the first test field strength is full test field strength, executes step G2；
Step E4: the card-reading terminal controls the disconnection of second capacitance group and being connected to for the third capacitance group, carries out field Strong test obtains the third test field strength, judges whether the third test field strength is greater than the second test field strength, is then Step E5 is executed, otherwise the 2nd 0 test field strength is full test field strength, executes step G2；
Step E5: the card-reading terminal controls the connection of the first capacitor group, carries out field strength measurement and obtains the 4th test field strength, Judge whether the 4th test field strength is greater than the third test field strength, be to then follow the steps E6, otherwise the third test Field strength is full test field strength, executes step G2；
Step E6: the card-reading terminal controls the disconnection of the first capacitor group and being connected to for second capacitance group, carries out field Strong test obtains the 5th test field strength, judges whether the 5th test field strength is greater than the 4th test field strength, is to execute Step E7, otherwise the 4th test field strength is full test field strength, executes step G2；
Step E7: the card-reading terminal controls the connection of the first capacitor group, carries out field strength measurement and obtains the 6th test field strength, Judge whether the 6th test field strength is greater than the 5th test field strength, be that then the 6th test field strength is full test field strength, Step G2 is executed, otherwise the 5th test field strength is full test field strength, executes step G2.
11. method according to claim 8, which is characterized in that the card-reading terminal includes first capacitor group, the second capacitor Group, third capacitance group and the 4th capacitance group；The capacitance of second capacitance group is greater than or equal to the electricity of second capacitance group Capacitance, the capacitance of the third capacitance group are greater than or equal to the capacitance of second capacitance group, the 4th capacitance group Capacitance is greater than or equal to the capacitance of the third capacitance group；
The step G1 specifically includes the following steps:
Step F1: the card-reading terminal controls the first capacitor group, second capacitance group, the third capacitance group and described The disconnection of 4th capacitance group carries out field strength measurement and obtains the 0th test field strength；
Step F2: the card-reading terminal controls the connection of the first capacitor group, carries out field strength measurement and obtains the first test field strength, Judge whether the first test field strength is greater than the 0th test field strength, be to then follow the steps F3, otherwise the 0th test Field strength is full test field strength, executes step G2；
Step F3: the card-reading terminal controls the disconnection of the first capacitor group and being connected to for second capacitance group, carries out field Strong test obtains the second test field strength, judges whether the second test field strength is greater than the first test field strength, is to execute Step F4, otherwise the first test field strength is full test field strength, executes step G2；
Step F4: the card-reading terminal controls the disconnection of second capacitance group and being connected to for the third capacitance group, carries out field Strong test obtains third test field strength, judges whether the third test field strength is greater than the second test field strength, is to execute Step F5, otherwise the 2nd 0 test field strength is full test field strength, executes step G2；
Step F5: the card-reading terminal controls the disconnection of the third capacitance group and being connected to for the 4th capacitance group, carries out field Strong test obtains the 4th test field strength, judges whether the 4th test field strength is greater than the third test field strength, is to execute Step F6, otherwise the third test field strength is full test field strength, executes step G2；
Step F6: the card-reading terminal controls the connection of the first capacitor group, carries out field strength measurement and obtains the 5th test field strength, Judge whether the 5th test field strength is greater than the 4th test field strength, be to then follow the steps F7, otherwise the 4th test Field strength is full test field strength, executes step G2；
Step F7: the card-reading terminal controls the disconnection of the first capacitor group and being connected to for second capacitance group, carries out field Strong test obtains the 6th test field strength, judges whether the 6th test field strength is greater than the 5th test field strength, is to execute Step F8, otherwise the 5th test field strength is full test field strength, executes step G2；
Step F8: the card-reading terminal controls the disconnection of second capacitance group and being connected to for the third capacitance group, carries out field Strong test obtains the 7th test field strength, judges whether the 7th test field strength is greater than the 5th test field strength, is to execute Step F9, otherwise the 6th test field strength is full test field strength, executes step G2；
Step F9: the card-reading terminal controls the connection of the first capacitor group, carries out field strength measurement and obtains the 8th test field strength, Judge whether the 8th test field strength is greater than the 7th test field strength, be to then follow the steps F10, otherwise the 7th test Field strength is full test field strength, executes step G2；
Step F10: the card-reading terminal controls the disconnection of the first capacitor group and being connected to for second capacitance group, carries out field Strong test obtains the 9th test field strength, judges whether the 9th test field strength is greater than the 8th test field strength, is to execute Step F11, otherwise the 8th test field strength is full test field strength, executes step G2；
Step F11: the card-reading terminal controls the connection of the first capacitor group, carries out field strength measurement and obtains the tenth checkout area By force, judge whether the tenth test field strength is greater than the 9th test field strength, be that then the tenth test field strength is surveyed to be maximum Examination hall is strong, executes step G2；Otherwise the 9th test field strength is full test field strength, executes step G2.
12. a kind of contactless smart card card-reading terminal, including input circuit, output circuit, power supply circuit, MCU, field strength measurement electricity Road, which is characterized in that further include adjustment condenser network, the adjustment condenser network includes at least a capacitance group；
The input circuit is connect with the power supply circuit and the MCU；
The output circuit is connect with the power supply circuit and the MCU；
The power supply circuit, with the input circuit, the output circuit, the MCU, the field strength measurement circuit connection；
The MCU, with the input circuit, the output circuit, the power supply circuit and the field strength measurement circuit connection；
The field strength measurement circuit is connect with the power supply circuit, the MCU and the adjustment condenser network；
The adjustment condenser network, with the field strength measurement circuit connection.
13. contactless smart card card-reading terminal as claimed in claim 12, which is characterized in that the input circuit includes one Key.
14. contactless smart card card-reading terminal as claimed in claim 12, which is characterized in that the output circuit includes one Display screen.
CN201811150685.2A 2018-09-29 2018-09-29 A kind of contactless smart card card-reading terminal and its working method Pending CN109325375A (en)

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Application Number Priority Date Filing Date Title
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KR20170123744A (en) * 2016-04-29 2017-11-09 브릴리언츠 주식회사 Smart multi card with plural track
CN107748909A (en) * 2017-11-07 2018-03-02 北京中电华大电子设计有限责任公司 The adaptive method of power consumption and circuit in a kind of contact type intelligent card chip
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102213750A (en) * 2011-03-03 2011-10-12 叶永嘉 Testing method and system for performance of RFID (Radio Frequency Identification Device) reader antenna
CN102184442A (en) * 2011-04-26 2011-09-14 胡建国 Circuit simulation model for radio frequency identification system
CN103488963A (en) * 2013-09-09 2014-01-01 飞天诚信科技股份有限公司 Method and device for analyzing magnetic card signals
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